Director

Michael Waltl was born in Oberndorf near Salzburg, Austria. He received the BSc degree in electrical engineering, the degree of Diplomingenieur in microelectronics, and the doctoral degree in technical sciences from TU Wien in 2009, 2011, and 2016, respectively. His scientific focus is on experimental characterization and modeling of reliability issues prevalent in semiconductor devices and devices with more exotic 2D materials. In this field, he primarily studies bias temperature instabilities in modern transistors. He also leads the device characterization laboratory at the institute, where he is in charge of developing electrical measurement methods.

Phone: +43-1-58801-36050

Administration

Diana Pop was born in Brasov, Romania. She received the Bachelor’s degree in applied physics from Transylvania University of Brasov Romania, the Master’s degree in remote engineering, and the master of arts following the IBM study at FH Kärnten, Austria, in 2009, 2011, and 2016 respectively. From 2009 to 2011 Diana was with IEEE Women in Engineering and in 2009 she was a visiting research engineer at the Massachusetts Institute of Technology, USA. Diana is currently employed as a project manager at the Institute for Microelectronics, where she is in charge of the European and nationally funded projects and is part of the administration of the institute. She joined the CDL for Single-Defect Spectroscopy in January 2019 and is responsible for financial and organizational topics.

Petra Kamptner-Jonas was born in Vienna, Austria. She has over 30 years of experience in the private sector of which almost 20 years she was in a leading position. Petra is currently employed as project support at the Institute for Microelectronics. She joined the SDS teams in April 2021 and is supporting the team members with administrative tasks.

Phone: +43-1-58801-36012

Postdoctoral Researchers

Yoanlys Hernandez Barrios received the bachelor’s degree from Exact Sciences Pre-University Vocational Institute, Pinar del Río, Cuba. He studied Biomedical engineering at the “CUJAE” Technical University in La Habana, Cuba. In August 2015, he began his Master studies focusing on Solid State Electronics at the Center for Research and Advanced Studies of the National Polytechnic Institute (CINVESTAV-IPN) in Mexico City. In August 2020, Yoanlys finished his PhD studies at the same research center specializing in characterization, simulation, fabrication and modeling of thin film transistors and circuits based on amorphous metal oxides semiconductors. In March 2021 he joined the Institute for Microelectronics as post-doctoral researcher and will focus on semiconductor devices and circuits reliability. He joined the CDL for Single-Defect Spectroscopy in November 2022 where primarily works on the characterization and modeling of noise in Si transistors.


PhD Students

Paul Stampfer was born in Lienz, Austria in 1995. He studied Technical Physics at the Technical University of Graz, where he received his BSc degree and Diplomingenieur in 2018 and 2020 respectively. In July 2020 he joined the CDL for Single-Defect Spectroscopy as an external PhD student from ams AG. His research will focus on the characterization and modeling of traps in photodiodes.

Konstantinos Tselios was born in Vayia, Greece, in 1994. He received the Diploma of Electrical and Computer Engineering from the University of Patras in 2018. Between 2018 and 2020, he studied at the Physics department of the National Technical University of Athens, where he received a Master’s degree in Microsystems and Nanodevices. In February 2020, Konstantinos joined the Institute for Microelectronics and the CDL for Single-Defect Spectroscopy where he is currently working towards his doctoral degree, focusing on the characterization and modeling of charge trapping in low-noise silicon transistors.

Christoph Wilhelmer was born in 1993 in Lienz, Austria. He received his Bachelor’s degree in Technical Physics from TU Wien after doing an exchange semester at the University of Bath, UK in 2017. Christoph received his Diplom-Ingenieur degree in Technical Physics from TU Wien in 2020 where he carried out his Master’s Thesis in the Quantum Materials group of the Institute of Solid State Physics. In March 2020 Christoph joined the Institute for Microelectronics where he started his PhD and joined the CDL for Single-Defect Spectroscopy in August 2021. He is focusing on DFT simulations considering defect creation mechanisms in oxides used for semiconductor applications.


Undergraduate Students

Maximilian Fleischer is enrolled in the bachelor program of computer engineering at TU Wien. As part of his bachelor’s thesis, he is working on the development of a web interface to control measurement instruments for defect spectroscopy in semiconductor devices.

Peter Gubesch received his Bachelor of Science degree from TU Wien in 2019. Currently, he is enrolled in the master’s program of microelectronics and photonics at TU Wien, Austria. In the CDL for Single-Defect Spectroscopy, he is designing a high-speed data acquisition unit with enhanced measurement resolution for defect spectroscopy measurements.

Jul Habiger is enrolled in the bachelor program of electrical engineering and information technology at TU Wien. As part of his bachelor’s thesis, he is investigating automated cluster detection algorithms based on machine learning methods to precisely evaluate experimental data collected from the characterization of single oxide defects in thin film MOSFETs.

Thomas Rößl received his Bachelor of Science degree from the Faculty for Informatics at the TU Wien. Currently, he is enrolled in the master’s program of software engineering & internet computing at TU Wien, Austria. He is working on the development of advanced programming tools for the efficient teaching of programming concepts.

Matthias Seidl is enrolled in the bachelor program of electrical engineering and information technology at TU Wien, Austria. In the CDL for Single-Defect Spectroscopy, he is working on the advanced characterization of charge trapping in SiC MOSFETs.

Florian Wimmer is enrolled in the bachelor program of electrical engineering and information technology at TU Wien, Austria. In the CDL for Single-Defect Spectroscopy, he is currently working on designing an ultra-low noise power supply for advanced device characterization.
Melanie Wolff is enrolled in the bachelor program of electrical engineering and information technology at TU Wien, Austria. In the CDL for Single-Defect Spectroscopy, she is currently working on creating 3D models of modern transistor structures.

Tobias Zinsler is enrolled in the bachelor program of electrical engineering and information technology at TU Wien. During his bachelor’s thesis, he was working on expanding a measurement data processing program that provides state-of-the-art evaluation methods for the defect spectroscopy of thin-film MOSFETs. As a student employee, Tobias will work at the IuE in the CDL for Single-Defect Spectroscopy team and will continue to optimize data processing algorithms implemented in our software tools.


Technician

Markus Schloffer graduated from the technical high school in Weiz, Styria, where he received his A-Levels diploma. After that, he was with NXP Semiconductor in Graz for more than three years, until he received his Ing. degree. Afterwards he moved to Vienna and worked in the field of PCB design. Since 2018 he is with the Institute for Microelectronics being responsible for hardware design and technology characterization laboratory maintenance. He joined the CDL for Single-Defect Spectroscopy in January 2019 where he supports the experimental activities.

Phone: +43-1-58801-36063