65 years of Transistor Scaling: What about the Future? Proceedings Article
In: Proceedings of the 16th Valiev International Conference MICRO- AND NANOELECTRONICS (ICMNE) 2025, pp. 4, 2025.
Conductance of Edge Modes in Nanoribbons of 2D Materials in a Topological Phase Proceedings Article
In: Book of Abstracts of the Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), pp. 52–53, 2021, (poster presentation: Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Caen, France; 2021-09-01 -- 2021-09-03).