6.6 Fast Ramp versus Fast-VTH   -Method

The previously discussed epsilon criterion in addition to the demonstrated full recovery after each stress pulse enables back extrapolation to the very beginning of the relaxation phase of the fast pulsed ID (VG )  -method. For tstr = 1ms  this method and the fast-VTH   method are compared including different voltages and temperatures. It has to be mentioned that the temperature dependence of VTH,0   was not exactly measured, and hence is missing for the precise ΔVTH   extraction and that in addition mobility changes with temperature have been neglected. However, the results shown in Fig. 6.19 still show good qualitative agreement of both measurement techniques.


PIC


Figure 6.19: Comparison of the fast-VTH   measurement and the fast pulsed ID (VG)  -method both developed by Reisinger [12]. Due to a limited number of available devices it was not possible to perform the same stressing conditions using the two different measurement techniques. However, comparable conditions are plotted in the same color to show the quite good agreement of both techniques.