2.2 Transfer-Characteristics

When carrying out transfer-characteristics measurements, ID   is measured as a function of V
 G   . Due to their slow response, semiconductor parameter analyzers do not capture the recovery of the device prior to tM   [15], which is schematically depicted by a dashed blue line in Fig. 2.3. Despite their rather slow response (tM = 1ms ...1s  ) parameter analyzers are often used because of their high accuracy.

  2.2.1 Fast Pulsed ID(VG )  -characteristics
  2.2.2 Improved Method of Reisinger