Michael Waltl | Single-Defect Spectroscopy in Semiconductor Devices
Christian Doppler Laboratory at the Institue for Microelectronics
On August, 30th our team member Christian Schleich defended his PhD thesis. Christian’s PhD work focused on characterization and modelling of reliability phenomena in SiC power MOSFETs. As he decided to continue his career in industry we congratulate and wish him all the best for the future!
Special thanks go to the her supervisors Prof. Dr. Tibor Grasser, and Ass.Prof. Dr. Michael Waltl.
Congratulations, Christian!
On August, 25th our team member Jakob Michl defended his PhD thesis “Charge Trapping and Variability in CMOS Technologies at Cryogenic Temperatures” with distinction. As he decided to continue his career in industry we congratulate and wish him all the best for the future!
Special thanks go to the her supervisors Prof. Dr. Tibor Grasser, and Ass.Prof. Dr. Michael Waltl.
Congratulations, Jakob!
On February, 17th our team member Barbara Waschiczek defended her bachelor thesis “Entwicklung eines Steuerungsmoduls mit Touchscreen für Messgeräte unter Einsatz der Grafikbibliothek LVGL” with distinction.
Special thanks go to the her supervisors Dr. Bernhard Stampfer, Prof. Dr. Tibor Grasser, and Ass.Prof. Dr. Michael Waltl.
Congratulations, Barbara!
The Institute of Electrical and Electronics Engineers (IEEE) has elevated our colleague Michael to Senior Member. The IEEE is the world’s largest association of technical professionals focused on technical advancement of electrical and electronic engineering, computer engineering, telecommunications, and allied disciplines. IEEE Senior Members must show experience reflecting professional maturity, have been in professional practice for at least ten years, and display significant performance over a period of at least five years in professional practice. Further information: www.ieee.org
Congratulations Michael!
On Nov. 19th 2021 our colleague Matthias Kratzmann successfully defended his master thesis. Matthias was working on the “Development of a CV Measurement Module for Defect Spectroscopy of MOS Transistors” and has been supervised by Michael Waltl and Tibor Grasser.
Congratulations Matthias.
On October, 22nd our colleague Tobias Zinsler defended his Bachelor thesis “Analyse von Stufenhöhen in der Schwellspannung bei SiON n-MOSFETs mit Hilfe des Python-TDDS Programm” with distinction.
Special thanks go to his supervisors Theresia Knobloch, Konstantinos Tselios, Tibor Grasser and Michael Waltl.
Congratulations, Tobias!
Petra Kamptner-Jonas started on April 1st as an administrative assistant in the SDS team. Petra has over 30 years of experience in the private sector of which almost 20 years she was in a leading position.
Welcome to our team, Petra!
On December, 4th our colleague Bernhard Stampfer defended his PhD thesis “Advanced Electrical Characterization of Charge Trapping in MOS Transistors” with distinction. Bernhard has decided to remain at the Institute for Microelectronics and in the SDS team as a post-doctoral researcher and his work will continue to focus on characterization of defects in semiconductor devices.
Special thanks go to the defense committee chaired by Univ.Prof. Dr. Karl Unterrainer TU Wien, Austria, his supervisor Univ.Prof. Dr. Tibor Grasser TU Wien, Austria and the assessors and examiners: Dr. Montserrat Nafria Maqueda, Universitat Autonoma Barcelona Spain and Dr. Francesco Maria Puglisi, University of Modena and Reggio Emilia, Italy.
Congratulations, Bernhard!
We’re proud to announce that our colleague Theresia won the Best Student Paper Award at the DRC 2020 (Device Research Conference) for her paper “Analysis of single electron traps in nano-scaled MoS2 FETs at cryogenic temperatures”. This paper was written in collaboration with the SDS team.
Our review paper entitled “Reliability of Minaturized Transistors from the Perspective of Single-Defects” has been accepted for publication in Micromachines Journal.