(image) (image) [Previous] [Next]

The Physics of Non–Equilibrium Reliability Phenomena

List of Acronyms

  • BTI bias temperature instability

  • NBTI negative bias temperature instability

  • PBTI positive bias temperature instability

  • HCD hot–carrier degradation

  • TDDB time dependent dielectric breakdown

  • CMOS complementary metal–oxide–semiconductor

  • VLSI very large–scale integrated

  • NMP nonradiative multiphonon

  • PES potential energy surface

  • PEC potential energy curve

  • RC reaction coordinate

  • MEP minimum energy path

  • MECP minimum energy crossing point

  • NEB nudged elastic band

  • CI–NEB climbing–image nudged elastic band

  • BOA Born–Oppenheimer approximation

  • TST transition state theory

  • TS transitions state

  • FGR Fermi’s Golden Rule

  • FCP Franck–Condon principle

  • LSF lineshape function

  • WKB Wentzel–Kramers–Brillouin

  • TCAD technology computer–aided design

  • MOSFET metal–oxide–semiconductor field–effect transistor

  • VB valence band

  • CB conduction band

  • EDF energy distribution function

  • TDDS time–dependent defect spectroscopy

  • OV oxygen vacancy

  • HB hydrogen bridge

  • HE\(^\prime \) hydroxyl–E\(^\prime \) center

  • FPT first passage time

  • FD Fermi–Dirac

  • BTE Boltzmann transport equation

  • II impact ionization

  • DD drift–diffusion

  • eMSM extended Measure–Stress–Measure

  • DFT density functional theory

  • CDFT constrained density functional theory

  • SP single particle

  • MP multiple particle

  • STM scanning tunneling microscope

  • DB dangling bond

  • ESR electron spin resonance

  • DOS density of states

  • MD molecular dynamics

  • BC bond–center

  • AB antibonding

  • WTMD well–tempered metadynamics

  • CV collective variable

  • FES free energy landscape

  • MO molecular orbital

  • DOF degrees of freedom

  • LUMO lowest unoccupied molecular orbital

  • HOMO highest occupied molecular orbital