[<]
[^]
[>]
[TOC] Prev: 3.1.3 Benchmark Example
Up: 3 Topography Algorithms
Next: 3.3 Sputter Deposition
3.2 Unidirectional Etching/Deposition
Linear structuring elements are also successfully applied for unidirectional
etching and deposition.
Unidirectional etching is a borderline case of reactive ion etching
where particles have such a high directionality that they arrive only from one
single direction. No lateral etching is assumed. The incidence direction is
checked for visibility and if the actual position is not shadowed a linear
structuring element with the beam direction is applied. Fig. 8 shows
unidirectional etching through a resist mask with a beam tilted by 25
.
Unidirectional etching is also applied for patterning the metal layers
in Fig. 12 through the resist mask generated from the layout.
Figure 8:
Unidirectional etching of silicon
through a resist mask.
 |
[<]
[^]
[>]
[TOC] Prev: 3.1.3 Benchmark Example
Up: 3 Topography Algorithms
Next: 3.3 Sputter Deposition
W. Pyka, R. Martins, and S. Selberherr: Optimized Algorithms for Three-Dimensional Cellular Topography Simulation