Characterization of electrically active defects at III-N/dielectric interfaces

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Curriculum Vitae

Roberta Stradiotto
Born on April 22, 1987 in San Vito al Tagliamento (PN) $\quad$	Nationality: Italian
Rudolfweg 1, 9524 Villach – Österreich	roberta.stradiotto@gmail.com
+43 677 621 959 37	linkedin.com/in/stradiottoroberta

Education

2013 – 2016	Doctoral program in technical sciences at Vienna University of Technology, Institute for Microelectronics in Vienna, Austria
	Thesis: Characterization of electrically active defects at III–N/dielectric interfaces
	Supervisors: Prof. Tibor Grasser and Dr. Gregor Pobegen
2009 – 2013	M.Sc. in Solid State Physics at University of Trieste, Italy
	Thesis: Experimental characterization of negative bias temperature instability in power MOSFETs
	Supervisors: Prof. Luciano Bosisio and Dr. Gregor Pobegen
	Relevant coursework: Condensed Matter Physics, Spectroscopies, Statistics, Computational Physics
2006 – 2009	B.Sc. in Physics at University of Trieste, Italy
	Thesis: Characterization of the Interaction Potential of Adsorbates on Oriented Monocrystal Surfaces with Scanning Tunneling Microscopy Supervisors: Prof. Giovanni Comelli and Dr. Carlo Dri
	Relevant coursework: Physics of Electronic Devices

Programming and software skills

Programming	Certified LabVIEW Associate Developer (CLAD)
	Python, L^aT_eX, Matlab, Fortran 95
Office Tools	Microsoft Office and Open Office tools
Operating Systems	Windows OS, Linux

Publications

• R. Stradiotto, G. Pobegen and M. Nelhiebel, Impact of copper and aluminum power metallization on the negative bias temperature instability, IEEE International Integrated Reliability Workshop (IIRW), 2012
• R. Stradiotto, G. Pobegen, C. Ostermaier, and T. Grasser, On the fly characterization of charge trapping phenomena at GaN/dielectric and GaN/AlGaN/dielectric interfaces using impedance measurements, IEEE European Solid–State Device Research Conference (ESSDERC), 2015
• R. Stradiotto, G. Pobegen, C. Ostermaier, and T. Grasser, Characterization of charge trapping phenomena at III–N/dielectric interfaces, Solid-State Electronics, vol. 125, pp. 142–153, 2016, extended papers selected from ESSDERC 2015
• R. Stradiotto, G. Pobegen, C. Ostermaier, Michael Waltl, Alexander Grill and T. Grasser, Characterization of Interface Defects with Distributed Activation Energies in GaN–based MIS–HEMTs, submitted to Transactions on Electron Devices (in review)
• 10+ talks and poster presentations in the course of the doctoral program

Language skills

Italian	mother tongue
English	full professional proficiency
German	B1 level

Personal Interests

Austrian alpine club (ÖAV) affiliate	Kendo practitioner
Mountain sports: hiking, climbing	Calligraphy amateur
Team sport player: volleyball, beach–volley, soccer $\qquad$

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