analog-to-digital coverter
anomalous RTN
bootstrapping and cumulative sum
bipolar junction transistor
bias temperature instability
charge coupled device
complementary cumulative density function
cumulative density function
complementary MOS
charge pumping
capacitance-voltage
digital-to-analog coverter
direct-current current-voltage
density functional theory
drain-induced barrier lowering
deep-level transient spectroscopy
device under test
extended MSM
electron paramagnetic resonance
electron spin resonance
field-effect transistor
factorial HMM
gate-induced drain leakage
hot carrier
hidden Markov model
Cinter-integrated circuit
current-voltage
metal-insulator-semiconductor
metal-oxide-semiconductor
molybdenum disulfide
MOS capacitor
MOS field-effect-transistor
measure stress measure
non-radiative multi-phonon
nuclear magnetic resonance
operational amplifier
on-the-fly
probability density function
potential energy surface
power spectral density
random access memory
random telegraph noise
random telegraph signal
stress induced leakage current
secondary ion mass spectroscopy
source measure unit
signal-to-noise ratio
simulation program with integrated circuit emphasis
Shockley–Read–Hall
technology computer-aided design
time-dependent defect spectroscopy
thermal dielectric relaxation current
universal serial bus
Wentzel–Kramers–Brillouin
X-ray photoelectron spectroscopy
