Dipl.-Ing. Christian Schleich

Time:Tuesday, August 30^th, 2022, 16:00 p.m. 

Place:Videoconference: https://tuwien.zoom.us/j/98305502170

Title:Modeling of Defect Related Reliability Phenomena in SiC Power-MOSFETs

Doctoral Dissertation Committee:

Committee Chair:

• Univ.-Prof.Dr. Wolfgang Gawlik (TU Wien, Austria)

Supervisor and Examiner:

• Univ.-Prof.Dr. Tibor Grasser (TU Wien, Austria)   

Examiner:

• Prof. Daniel Fleetwood (Vanderbilt School of Engineering, US)
• Prof. Susanna Regianni (Universita di Bologna, Italy)