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Contributions to Books

191.   Cervenka, J., Kosik, R., Vasicek, M.-T., Gritsch, M., Selberherr, S., Grasser, T. (2023).
Macroscopic Transport Models for Classical Device Simulation.
In M. Rudan, R. Brunetti, S. Reggiani (Eds.), Springer Handbook of Semiconductor Devices (pp. 1335–1381). Springer. https://doi.org/10.1007/978-3-030-79827-7_37 (reposiTUm)

190.   Selberherr, S., Sverdlov, V. (2023).
Technology Computer-Aided Design: A Key Component of Microelectronics’ Development.
In A. Nathan, S. K. Saha, R. M. Todi (Eds.), 75th Anniversary of the Transistor (pp. 337–347). Wiley. https://doi.org/10.1002/9781394202478.ch28 (reposiTUm)

189.  Waltl, M., Hernandez, Y., Schleich, C., Waschneck, K., Stampfer, B., Reisinger, H., Grasser, T.:
"Performance Analysis of 4H-SiC Pseudo-D CMOS Inverter Circuits Employing Physical Charge Trapping Models";
in: "Silicon Carbide and Related Materials 2021", J. Michaud, L. Phung, D. Alquier, D. Planson (Hrg.); Trans Tech Publications Ltd , Switzerland, 2022, ISBN: 9783035727609, S. 688 - 695. https://doi.org/10.1002/adma.202201082

188.   Sverdlov, V., Selberherr, S. (2022).
Spin-Based Devices for Digital Applications.
In M. Rudan, R. Brunetti, S. Reggiani (Eds.), Springer Handbook of Semiconductor Devices (pp. 1123–1166). Springer International Publishing. https://doi.org/10.1007/978-3-030-79827-7_31 (reposiTUm)

187.  Lenz, C., Scharinger, A., Manstetten, P., Hössinger, A., Weinbub, J.:
"A Novel Surface Mesh Simplification Method for Flux-Dependent Topography Simulations of Semiconductor Fabrication Processes";
in: "Scientific Computing in Electrical Engineering", M. van Beurden, N. Budko, W. Schilders (Hrg.); Springer, 2021, ISBN: 978-3-030-84238-3, S. 73 - 81. https://doi.org/10.1007/978-3-030-84238-3_8

186.  Sverdlov, V., Seiler, H., El-Sayed, A.-M., Kosina, H.:
"Conductance due to the Edge Modes in Nanoribbons of 2D Materials in a Topological Phase";
in: "Proceedings of the 2021 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)", B. Cretu (Hrg.); IEEE, 2021, ISBN: 978-1-6654-3745-5, S. 1 - 4. https://doi.org/10.1109/EuroSOI-ULIS53016.2021.9560173

185.  Lenz, C., Toifl, A., Hössinger, A., Weinbub, J.:
"Curvature Based Feature Detection for Hierarchical Grid Refinement in TCAD Topography Simulations";
in: "Proceedings of the 2021 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)", B. Cretu (Hrg.); IEEE, 2021, S. 1 - 4. https://doi.org/10.1109/EuroSOI-ULIS53016.2021.9560690

184.  Filipovic, L., Selberherr, S.:
"Electro-Thermo-Mechanical Simulation of Semiconductor Metal Oxide Gas Sensors";
in: "Prime Archives in Material Science", 3; M. Khan (Hrg.); Vide Leaf, 2021, (eingeladen), ISBN: 978-81-953047-9-0, S. 1 - 38.

183.  Aguinsky, L.F., Wachter, G., Rodrigues, F., Scharinger, A., Toifl, A., Trupke, M., Schmid, U., Hössinger, A., Weinbub, J.:
"Feature-Scale Modeling of Low-Bias SF6 Plasma Etching of Si";
in: "Proceedings of the 2021 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)", B. Cretu (Hrg.); IEEE, 2021, S. 1 - 4. https://doi.org/10.1109/EuroSOI-ULIS53016.2021.9560685

182.  El-Sayed, A.-M., Seiler, H., Kosina, H., Jech, M., Waldhör, D., Sverdlov, V.:
"First Principles Evaluation of Topologically Protected Edge States in MoS$_{2}$ 1T′ Nanoribbons with Realistic Terminations";
in: "Proceedings of the 2021 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)", B. Cretu (Hrg.); IEEE, 2021, ISBN: 978-1-6654-3745-5, S. 1 - 4. https://doi.org/10.1109/EuroSOI-ULIS53016.2021.9560183

181.  Reiter, T., Klemenschits, X., Filipovic, L.:
"Impact of High-Aspect-Ratio Etching Damage on Selective Epitaxial Silicon Growth in 3D NAND Flash Memory";
in: "Proceedings of the 2021 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)", B. Cretu (Hrg.); IEEE, 2021, ISBN: 978-1-6654-3745-5, S. 1 - 4. https://doi.org/10.1109/EuroSOI-ULIS53016.2021.9560693

180.  Ceric, H., Zahedmanesh, H., Lacerda de Orio, R., Selberherr, S.:
"Models and Techniques for Reliability Studies of Nano-Scaled Interconnects";
in: "Advances in Measurements and Instrumentation: Reviews", 3; S. Yurish (Hrg.); International Frequency Sensor Association (IFSA) Publishing, 2021, ISBN: 978-84-09-33338-7, S. 93 - 111.

179.  Benam, M., Wołoszyn, M., Selberherr, S.:
"Self-Consistent Monte Carlo Solution of Wigner and Poisson Equations Using an Efficient Multigrid Approach";
in: "Advanced Computing in Industrial Mathematics, Studies in Computational Intelligence", 961; I. Georgiev, H. Kostadinov, E. Lilkova (Hrg.); Springer, 2021, ISBN: 978-3-030-71615-8, S. 60 - 67. https://doi.org/10.1007/978-3-030-71616-5_7

178.  Hadámek, T., Bendra, M., Fiorentini, S., Ender, J., Orio, R., Goes, W., Selberherr, S., Sverdlov, V.:
"Temperature Increase in MRAM at Writing: A Finite Element Approach";
in: "Proceedings of the 2021 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)", B. Cretu (Hrg.); IEEE, 2021, ISBN: 978-1-6654-3746-2, S. 1 - 4. https://doi.org/10.1109/EuroSOI-ULIS53016.2021.9560669

177.  Sverdlov, V., Selberherr, S.:
"A Monte Carlo Evaluation of the Current and Low Frequency Current Noise at Spin-Dependent Hopping";
in: "Large-Scale Scientific Computing, Lecture Notes in Computer Science", 11958; I. Lirkov, S. Margenov (Hrg.); Springer International Publishing, 2020, ISBN: 978-3-030-41031-5, S. 446 - 453. https://doi.org/10.1007/978-3-030-41032-2_51

176.  Kosik, R., Cervenka, J., Thesberg, M., Kosina, H.:
"A Revised Wigner Function Approach for Stationary Quantum Transport";
in: "Large-Scale Scientific Computing, Lecture Notes in Computer Science", 11958; I. Lirkov, S. Margenov (Hrg.); Springer International Publishing, 2020, ISBN: 978-3-030-41031-5, S. 403 - 410. https://doi.org/10.1007/978-3-030-41032-2_46

175.  Stampfer, B., Grill, A., Waltl, M.:
"Advanced Electrical Characterization of Single Oxide Defects Utilizing Noise Signals";
in: "Noise in Nanoscale Semiconductor Devices", T. Grasser (Hrg.); Springer International Publishing, 2020, ISBN: 978-3-030-37499-0, S. 229 - 257. https://doi.org/10.1007/978-3-030-37500-3_7

174.  Waldhör, D., El-Sayed, A.-M., Wimmer, Y., Waltl, M., Grasser, T.:
"Atomistic Modeling of Oxide Defects";
in: "Noise in Nanoscale Semiconductor Devices", T. Grasser (Hrg.); Springer International Publishing, 2020, ISBN: 978-3-030-37499-0, S. 609 - 648. https://doi.org/10.1007/978-3-030-37500-3_18

173.  Fiorentini, S., Ender, J., Selberherr, S., Orio, R., Goes, W., Sverdlov, V.:
"Comprehensive Modeling of Coupled Spin and Charge Transport through Magnetic Tunnel Junctions";
in: "Proceedings of the 2020 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)", B. Cretu (Hrg.); IEEE, 2020, ISBN: 978-1-7281-8765-5, S. 1 - 4. https://doi.org/10.1109/EUROSOI-ULIS49407.2020.9365497

172.  Coppeta, R., Lahlalia, A., Kozic, D., Hammer, R., Riedler, J., Toschkoff, G., Singulani, A.P., Ali, Z., Sagmeister, M., Carniello, S., Selberherr, S., Filipovic, L.:
"Electro-Thermal-Mechanical Modeling of Gas Sensor Hotplates";
in: "Sensor Systems Simulations", W. van Driel, O. Pyper, C. Schumann (Hrg.); Springer International Publishing, 2020, ISBN: 978-3-030-16577-2, S. 17 - 72. https://doi.org/10.1007/978-3-030-16577-2_2

171.  Fiorentini, S., Orio, R., Selberherr, S., Ender, J., Gös, W., Sverdlov, V.:
"Influence of Current Redistribution in Switching Models for Perpendicular STT-MRAM";
in: "Advanced CMOS-Compatible Semiconductor Devices 19, Vol. 97, No. 5", J. A. Martino, B.-Y. Nguyen, F. Gamiz, H. Ishii, J.-P. Raskin, S. Selberherr, E. Simoen (Hrg.); herausgegeben von: The Electrochemical Society; ECS Transactions, 2020, ISBN: 978-1-62332-604-3, S. 159 - 164. https://doi.org/10.1149/09705.0159ecst

170.  Indalecio, G., Kosina, H.:
"Monte Carlo Simulation of Electron-Electron Interactions in Bulk Silicon";
in: "Scientific Computing in Electrical Engineering, Mathematics in Industry", 32; G. Nicosia, V. Romano (Hrg.); Springer International Publishing, 2020, ISBN: 978-3-030-44100-5, S. 125 - 131. https://doi.org/10.1007/978-3-030-44101-2_12

169.  Quell, M., Diamantopoulos, G., Hössinger, A., Selberherr, S., Weinbub, J.:
"Parallel Correction for Hierarchical Re-Distancing Using the Fast Marching Method";
in: "Advances in High Performance Computing, Studies in Computational Intelligence", 902; I. Dimov, S. Fidanova (Hrg.); Springer International Publishing, 2020, ISBN: 978-3-030-55347-0, S. 438 - 451. https://doi.org/10.1007/978-3-030-55347-0_37

168.  Quell, M., Manstetten, P., Hössinger, A., Selberherr, S., Weinbub, J.:
"Parallelized Construction of Extension Velocities for the Level-Set Method";
in: "Parallel Processing and Applied Mathematics, Lecture Notes in Computer Science", 12043; R. Wyrzykowski, E. Deelman, J. Dongarra, K. Karczewski (Hrg.); Springer International Publishing, 2020, ISBN: 978-3-030-43229-4, S. 348 - 358. https://doi.org/10.1007/978-3-030-43229-4_30

167.  Orio, R., Ender, J., Fiorentini, S., Goes, W., Selberherr, S., Sverdlov, V.:
"Reduced Current Spin-Orbit Torque Switching of a Perpendicularly Magnetized Free Layer";
in: "Proceedings of the 2020 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)", B. Cretu (Hrg.); IEEE, 2020, ISBN: 978-1-7281-8765-5, S. 1 - 4. https://doi.org/10.1109/EUROSOI-ULIS49407.2020.9365283

166.  Sverdlov, V., El-Sayed, A.-M., Selberherr, S.:
"Subband Structure and Ballistic Conductance of a Molybdenum Disulfide Nanoribbon in Topological 1T´ Phase: A k·p Study";
in: "Proceedings of the 27st International Conference Mixed Design of Integrated Circuits and Systems", A. Napieralski (Hrg.); IEEE, 2020, ISBN: 978-83-63578-17-6, S. 168 - 171. https://doi.org/10.23919/MIXDES49814.2020.9155676

165.  Sverdlov, V., El-Sayed, A.-M., Selberherr, S., Kosina, H.:
"Topologically Protected and Conventional Subbands in a 1T´-MoS2 Nanoribbon Channel";
in: "Proceedings of the 2020 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)", B. Cretu (Hrg.); IEEE, 2020, ISBN: 978-1-7281-8765-5, S. 1 - 4. https://doi.org/10.1109/EUROSOI-ULIS49407.2020.9365289

164.  Benam, M., Nedjalkov, M., Selberherr, S.:
"A Wigner Potential Decomposition in the Signed-Particle Monte Carlo Approach";
in: "Numerical Methods and Applications, Lecture Notes in Computer Science", 11189; G. Nikolov, N. T. Kolkovska, K. Georgiev (Hrg.); herausgegeben von: Nikolov G., Kolkovska, N., Georgiev, K.; Springer International Publishing, 2019, ISBN: 978-3-030-10692-8, S. 263 - 272. https://doi.org/10.1007/978-3-030-10692-8_29

163.  Gnam, L., Manstetten, P., Hössinger, A., Selberherr, S., Weinbub, J.:
"Accelerating Flux Calculations Using Sparse Sampling";
in: "Miniaturized Transistors", L. Filipovic, T. Grasser (Hrg.); MDPI, 2019, (eingeladen), ISBN: 978-3-03921-010-7, S. 176 - 192. https://doi.org/10.3390/books978-3-03921-011-4

162.  Orio, R., Makarov, A., Selberherr, S., Goes, W., Ender, J., Fiorentini, S., Sverdlov, V.:
"Efficient Magnetic Field-Free Switching of a Symmetric Perpendicular Magnetic Free Layer for Advanced SOT-MRAM";
in: "Proceedings of the 2019 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)", J. Lacord, M. Bawedin (Hrg.); IEEE, 2019, ISBN: 978-1-7281-1658-7, S. 1 - 4. https://doi.org/10.1109/EUROSOI-ULIS45800.2019.9041920

161.  Gnam, L., Selberherr, S., Weinbub, J.:
"Evaluation of Serial and Parallel Shared-Memory Distance-1 Graph Coloring Algorithms";
in: "Numerical Methods and Applications, Lecture Notes in Computer Science", 11189; G. Nikolov, N. T. Kolkovska, K. Georgiev (Hrg.); Springer International Publishing, 2019, ISBN: 978-3-030-10692-8, S. 106 - 114. https://doi.org/10.1007/978-3-030-10692-8_12

160.  Klemenschits, X., Selberherr, S., Filipovic, L.:
"Modeling of Gate Stack Patterning for Advanced Technology Nodes: A Review";
in: "Miniaturized Transistors", L. Filipovic, T. Grasser (Hrg.); MDPI, 2019, (eingeladen), ISBN: 978-3-03921-010-7, S. 105 - 135. https://doi.org/10.3390/books978-3-03921-011-4

159.  Sadi, T., Medina-Bailón, C., Nedjalkov, M., Lee, J., Badami, O., Berrada, S., Carrillo-Nunez, H., Georgiev, V., Selberherr, S., Asenov, A.:
"Simulation of the Impact of Ionized Impurity Scattering on the Total Mobility in Si Nanowire Transistors";
in: "Nanowire Field-Effect Transistor (FET)", A. García-Loureiro, K. Kalna, N. Seoane (Hrg.); MDPI, Basel, 2019, ISBN: 978-3-03936-208-0, S. 41 - 51. https://doi.org/10.3390/ma12010124

158.  Windbacher, T., Makarov, A., Selberherr, S., Mahmoudi, H., Malm, B.G., Ekström, M., Östling, M.:
"The Exploitation of the Spin-Transfer Torque Effect for CMOS Compatible Beyond Von Neumann Computing";
in: "Energy Efficient Computing & Electronics: Devices to Systems; Devices, Circuits, and Systems Series", S.K. Kurinec, S. Walia (Hrg.); CRC Press, 2019, (eingeladen), ISBN: 978-1-138-71036-8, S. 93 - 156. https://doi.org/10.1201/9781315200705

157.  Shah, A., Moshrefi, A., Waltl, M.:
"Utilizing NBTI for Operation Detection of Integrated Circuits";
in: "VLSI Design and Test, Communications in Computer and Information Science", 1066; A. Sengupta, S. Dasgupta, V. Singh, R. Sharma, S. Vishvakarma (Hrg.); Springer Singapore, 2019, ISBN: 978-981-32-9767-8, S. 190 - 201. https://doi.org/10.1007/978-981-32-9767-8_17

156.  Sverdlov, V., Selberherr, S.:
"Current and Shot Noise at Spin-dependent Hopping in Magnetic Tunnel Junctions";
in: "Proceedings of the 2018 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)", F. Gamiz, V. Sverdlov, C. Sampedro, L. Donetti (Hrg.); IEEE, 2018, ISBN: 978-1-5386-4812-4, S. 33 - 36. https://doi.org/10.1109/ULIS.2018.8354727

155.  Ruscher, S. H., Weinbub, J., Selberherr, S.:
"Evaluating Software Testing Methods in an Active and Assisted Living Context";
in: "Innovative Lösungen für eine alternde Gesellschaft", F. Piazolo, S. Schlögl (Hrg.); Pabst Science Publishers, Lengerich, Germany, 2018, ISBN: 978-3-95853-373-8, S. 68 - 76.

154.  Ghosh, J., Osintsev, D., Sverdlov, V., Ganguly, S.:
"Multilevel Parallelization Approach to Estimate Spin Lifetime in Silicon: Performance Analysis";
in: "Proceedings of the 2018 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)", F. Gamiz, V. Sverdlov, C. Sampedro, L. Donetti (Hrg.); IEEE, 2018, ISBN: 978-1-5386-4812-4, S. 205 - 208. https://doi.org/10.1109/ULIS.2018.8354770

153.  Lorenz, J., Asenov, A., Baer, E., Barraud, S., Millar, C., Nedjalkov, M.:
"Process Variability for Devices at and Beyond the 7nm Node";
in: "Advanced CMOS-Compatible Semiconductor Devices 18, Vol. 85, No. 8", J. A. Martino, J.-P. Raskin, S. Selberherr, H. Ishii, F. Gamiz, B.-Y. Nguyen, A. Yoshino (Hrg.); herausgegeben von: The Electrochemical Society; ECS Transactions, 2018, (eingeladen), ISBN: 978-1-62332-488-9, S. 113 - 124. https://doi.org/10.1149/08508.0151ecst

152.  Manstetten, P., Gnam, L., Hössinger, A., Selberherr, S., Weinbub, J.:
"Sparse Surface Speed Evaluation on a Dynamic Three-Dimensional Surface Using an Iterative Partitioning Scheme";
in: "Computational Science - ICCS 2018, Lecture Notes in Computer Science", 10860; Y. Shi, H. Fu, Y. Tian, V. Krzhizhanovskaya, M. Lees, J. Dongarra, P. Sloot (Hrg.); Springer International Publishing, 2018, ISBN: 978-3-319-93698-7, S. 694 - 707. https://doi.org/10.1007/978-3-319-93698-7_53

151.  Medina-Bailón, C., Sadi, T., Nedjalkov, M., Lee, J., Berrada, S., Carillo-Nunez, H., Georgiev, V., Selberherr, S., Asenov, A.:
"Study of the 1D Scattering Mechanisms´ Impact on the Mobility in Si Nanowire Transistors";
in: "Proceedings of the 2018 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)", F. Gamiz, V. Sverdlov, C. Sampedro, L. Donetti (Hrg.); IEEE, 2018, ISBN: 978-1-5386-4812-4, S. 17 - 20. https://doi.org/10.1109/ULIS.2018.8354723

150.  Sverdlov, V., Makarov, A., Selberherr, S.:
"Switching Current Reduction in Advanced Spin-Orbit Torque MRAM";
in: "Proceedings of the 2018 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)", F. Gamiz, V. Sverdlov, C. Sampedro, L. Donetti (Hrg.); IEEE, 2018, ISBN: 978-1-5386-4812-4, S. 161 - 164. https://doi.org/10.1109/ULIS.2018.8354759

149.  Filipovic, L., Lahlalia, A.:
"System-on-Chip Sensor Integration in Advanced CMOS Technology";
in: "Advanced CMOS-Compatible Semiconductor Devices 18, Vol. 85, No. 8", J. A. Martino, J.-P. Raskin, S. Selberherr, H. Ishii, F. Gamiz, B.-Y. Nguyen, A. Yoshino (Hrg.); herausgegeben von: The Electrochemical Society; ECS Transactions, 2018, (eingeladen), ISBN: 978-1-62332-488-9, S. 151 - 162. https://doi.org/10.1149/08508.0151ecst

148.  Makarov, A., Sverdlov, V., Selberherr, S.:
"Ultra-Fast Switching of a Free Magnetic Layer with Out-of-Plane Magnetization in Spin-Orbit Torque MRAM Cells";
in: "Advanced CMOS-Compatible Semiconductor Devices 18, Vol. 85, No. 8", J. A. Martino, J.-P. Raskin, S. Selberherr, H. Ishii, F. Gamiz, B.-Y. Nguyen, A. Yoshino (Hrg.); herausgegeben von: The Electrochemical Society; ECS Transactions, 2018, ISBN: 978-1-62332-488-9, S. 213 - 218. https://doi.org/10.1149/08508.0213ecst

147.  Klemenschits, X., Selberherr, S., Filipovic, L.:
"Unified Feature Scale Model for Etching in SF6 and Cl Plasma Chemistries";
in: "Proceedings of the 2018 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)", F. Gamiz, V. Sverdlov, C. Sampedro, L. Donetti (Hrg.); IEEE, 2018, ISBN: 978-1-5386-4812-4, S. 177 - 180. https://doi.org/10.1109/ULIS.2018.8354763

146.  Knobloch, T., Rzepa, G., Illarionov, Yu., Waltl, M., K Polyushkin, D., Pospischil, A., Furchi, M. M., Müller, T., Grasser, T.:
"Impact of Gate Dielectrics on the Threshold Voltage in MoS2 Transistors";
in: "Semiconductors, Dielectrics, and Metals for Nanoelectronics 15, Vol.80, No.1", D. Misra, S. De Gendt, M. Houssa, K. Kita, D. Landheer (Hrg.); herausgegeben von: The Electrochemical Society; ECS Transactions, 2017, (eingeladen), ISBN: 978-1-62332-470-4, S. 203 - 217. https://doi.org/10.1149/08001.0203ecst

145.  Windbacher, T., Makarov, A., Sverdlov, V., Selberherr, S.:
"A Universal Nonvolatile Processing Environment";
in: "Future Trends in Microelectronics - Journey into the Unknown", S. Luryi, J. Xu, A. Zaslavsky (Hrg.); John Wiley & Sons, 2016, (eingeladen), ISBN: 978-1-119-06911-9, S. 83 - 91. https://doi.org/10.1002/9781119069225.ch1-6

144.  Gutierrez-Dominguez, E., Gamiz, F., Sverdlov, V., Selberherr, S., Torres-Jacome, A.:
"Device Physics, Modeling, and Technology for Nanoscaled Semiconductor Devices";
in: "Nano-Scaled Semiconductor Technologies: Physics, Modelling, Characterisation, and Societal Impact", 27; E. Gutierrez-Dominguez (Hrg.); Institution of Engineering and Technology, 2016, ISBN: 978-1-84919-930-8, S. 17 - 185. https://doi.org/10.1049/PBCS027E_ch2

143.  Simonka, V., Nawratil, G., Hössinger, A., Weinbub, J., Selberherr, S.:
"Direction Dependent Three-Dimensional Silicon Carbide Oxidation Growth Rate Calculations";
in: "Proceedings of the 2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)", V. Sverdlov, S. Selberherr (Hrg.); IEEE, 2016, ISBN: 978-1-4673-8608-1, S. 226 - 229. https://doi.org/10.1109/ULIS.2016.7440094

142.  Osintsev, D., Sverdlov, V., Selberherr, S.:
"Electron Momentum and Spin Relaxation in Silicon Films";
in: "Progress in Industrial Mathematics at ECMI 2014, Mathematics in Industry", 22; G. Russo, V. Capasso, G. Nicosia, V. Romano (Hrg.); Springer International Publishing, 2016, (eingeladen), ISBN: 978-3-319-23412-0, S. 695 - 700. https://doi.org/10.1007/978-3-319-23413-7_96

141.  Sverdlov, V., Selberherr, S.:
"Influence of Spin Relaxation on Trap-assisted Resonant Tunneling in Ferromagnet-Oxide-Semiconductor Structures";
in: "Proceedings of the 2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)", V. Sverdlov, S. Selberherr (Hrg.); IEEE, 2016, ISBN: 978-1-4673-8608-1, S. 202 - 205. https://doi.org/10.1109/ULIS.2016.7440088

140.  Dimov, I., Nedjalkov, M., Sellier, J. M., Selberherr, S.:
"Neumann Series Analysis of the Wigner Equation Solution";
in: "Progress in Industrial Mathematics at ECMI 2014, Mathematics in Industry", 22; G. Russo, V. Capasso, G. Nicosia, V. Romano (Hrg.); Springer International Publishing, 2016, (eingeladen), ISBN: 978-3-319-23412-0, S. 701 - 707. https://doi.org/10.1007/978-3-319-23413-7_97

139.  Sverdlov, V., Osintsev, D., Selberherr, S.:
"Silicon-on-Insulator for Spintronic Applications: Spin Lifetime and Electric Spin Manipulation";
in: "Nano Devices and Sensors", J. Liou, S.-K. Liaw, Y.-H. Chung (Hrg.); De Gruyter, 2016, (eingeladen), ISBN: 978-1-5015-1050-2, S. 29 - 48. https://doi.org/10.1515/9781501501531-003

138.  Wang, L., Sadi, T., Brown, A., Nedjalkov, M., Alexander, C., Cheng, B., Millar, C., Asenov, A.:
"Simulation Analysis of the Electro-Thermal Performance of SOI FinFETs";
in: "Proceedings of the 2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)", V. Sverdlov, S. Selberherr (Hrg.); IEEE, 2016, ISBN: 978-1-4673-8608-1, S. 56 - 59. https://doi.org/10.1109/ULIS.2016.7440051

137.  Manstetten, P., Filipovic, L., Hössinger, A., Weinbub, J., Selberherr, S.:
"Using One-Dimensional Radiosity to Model Neutral Particle Flux in High Aspect Ratio Holes";
in: "Proceedings of the 2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)", V. Sverdlov, S. Selberherr (Hrg.); IEEE, 2016, ISBN: 978-1-4673-8608-1, S. 120 - 123. https://doi.org/10.1109/ULIS.2016.7440067

136.  Thesberg, M., Pourfath, M., Neophytou, N., Kosina, H.:
"A Non-Equilibrium Green Functions Study of Energy-Filtering Thermoelectrics Including Scattering";
in: "Large-Scale Scientific Computing, Lecture Notes in Computer Science", 9374; I. Lirkov, S. Margenov, J. Wasniewski (Hrg.); Springer International Publishing, 2015, ISBN: 978-3-319-26519-3, S. 301 - 308. https://doi.org/10.1007/978-3-319-26520-9_33

135.  Cervenka, J., Ellinghaus, P., Nedjalkov, M.:
"Deterministic Solution of the Discrete Wigner Equation";
in: "Numerical Methods and Applications, Lecture Notes in Computer Science", 8962; I. Dimov, S. Fidanova, I. Lirkov (Hrg.); Springer International Publishing, 2015, ISBN: 978-3-319-15584-5, S. 149 - 156. https://doi.org/10.1007/978-3-319-15585-2_17

134.  Ghosh, J., Osintsev, D., Sverdlov, V., Weinbub, J., Selberherr, S.:
"Evaluation of Spin Lifetime in Thin-Body FETs: A High Performance Computing Approach";
in: "Large-Scale Scientific Computing, Lecture Notes in Computer Science", 9374; I. Lirkov, S. Margenov, J. Wasniewski (Hrg.); Springer International Publishing, 2015, ISBN: 978-3-319-26519-3, S. 285 - 292. https://doi.org/10.1007/978-3-319-26520-9_31

133.  Rudolf, F., Weinbub, J., Rupp, K., Resutik, P., Morhammer, A., Selberherr, S.:
"Free Open Source Mesh Healing for TCAD Device Simulations";
in: "Large-Scale Scientific Computing, Lecture Notes in Computer Science", 9374; I. Lirkov, S. Margenov, J. Wasniewski (Hrg.); Springer International Publishing, 2015, ISBN: 978-3-319-26519-3, S. 293 - 300. https://doi.org/10.1007/978-3-319-26520-9_32

132.  Grasser, T., Langer, E., Selberherr, S.:
"Institut für Mikroelektronik";
in: "Die Fakultät für Elektrotechnik und Informationstechnik", K. Unterrainer (Hrg.); Böhlau, 2015, ISBN: 978-3-205-20128-1, S. 57 - 62. https://doi.org/10.7767/9783205202240-006

131.  Windbacher, T., Makarov, A., Sverdlov, V., Selberherr, S.:
"Novel Buffered Magnetic Logic Gate Grid";
in: "Silicon Compatible Materials, and Technologies for Advanced Integrated Processes, Circuits and Emerging Applications 5, Vol. 66, No. 4", F. Roozeboom, V. Narayanan, K. Kakushima, P. Timans, E. Gusev, Z. Karim, S. DeGendt (Hrg.); herausgegeben von: The Electrochemical Society; ECS Transactions, 2015, ISBN: 978-1-62332-237-3, S. 295 - 303. https://doi.org/10.1149/06604.0295ecst

130.  Cervenka, J., Ellinghaus, P., Nedjalkov, M., Langer, E.:
"Optimization of the Deterministic Solution of the Discrete Wigner Equation";
in: "Large-Scale Scientific Computing, Lecture Notes in Computer Science", 9374; I. Lirkov, S. Margenov, J. Wasniewski (Hrg.); Springer International Publishing, 2015, ISBN: 978-3-319-26519-3, S. 269 - 276. https://doi.org/10.1007/978-3-319-26520-9_29

129.  Ellinghaus, P., Nedjalkov, M., Selberherr, S.:
"Optimized Particle Regeneration Scheme for the Wigner Monte Carlo Method";
in: "Numerical Methods and Applications, Lecture Notes in Computer Science", 8962; I. Dimov, S. Fidanova, I. Lirkov (Hrg.); Springer International Publishing, 2015, ISBN: 978-3-319-15584-5, S. 27 - 33. https://doi.org/10.1007/978-3-319-15585-2_3

128.  Weinbub, J., Ellinghaus, P., Selberherr, S.:
"Parallelization of the Two-Dimensional Wigner Monte Carlo Method";
in: "Large-Scale Scientific Computing, Lecture Notes in Computer Science", 9374; I. Lirkov, S. Margenov, J. Wasniewski (Hrg.); Springer International Publishing, 2015, ISBN: 978-3-319-26519-3, S. 309 - 316. https://doi.org/10.1007/978-3-319-26520-9_34

127.  Tyaginov, S. E.:
"Physics-Based Modeling of Hot-Carrier Degradation";
in: "Hot Carrier Degradation in Semiconductor Devices", T. Grasser (Hrg.); Springer International Publishing, 2015, ISBN: 978-3-319-08993-5, S. 105 - 150. https://doi.org/10.1007/978-3-319-08994-2_4

126.  Makarov, A., Sverdlov, V., Selberherr, S.:
"Progress in Magnetoresistive Memory: Magnetic Tunnel Junctions with a Composite Free Layer";
in: "Frontiers in Electronics", S. Cristoloveanu, M. Shur (Hrg.); World Scientific Publishing Co., 2015, (eingeladen), ISBN: 978-981-4651-76-9, S. 1 - 15. https://doi.org/10.1142/9789814656917_0001

125.  Kaczer, B., Grasser, T., Franco, J., Toledano-Luque, M., Roussel, Ph. J., Cho, M., Simoen, E., Groeseneken, G.:
"Recent Trends in Bias Temperature Instability";
in: "Circuit Design for Reliability", R. Reis, Y. Cao, G. Wirth (Hrg.); Springer New York, 2015, ISBN: 978-1-4614-4077-2, S. 5 - 19. https://doi.org/10.1007/978-1-4614-4078-9_2

124.  Sverdlov, V., Selberherr, S.:
"Spin-Based CMOS-Compatible Devices";
in: "Large-Scale Scientific Computing, Lecture Notes in Computer Science", 9374; I. Lirkov, S. Margenov, J. Wasniewski (Hrg.); Springer International Publishing, 2015, (eingeladen), ISBN: 978-3-319-26519-3, S. 42 - 49. https://doi.org/10.1007/978-3-319-26520-9_4

123.  Sverdlov, V., Selberherr, S.:
"Spin-Based Silicon and CMOS-Compatible Devices";
in: "Advanced CMOS-Compatible Semiconductor Devices 17, Vol.66, No.5", Y. Omura, J. A. Martino, J.-P. Raskin, S. Selberherr, H. Ishii, F. Gamiz, B.-Y. Nguyen (Hrg.); herausgegeben von: The Electrochemical Society; ECS Transactions, 2015, (eingeladen), ISBN: 978-1-62332-238-0, S. 223 - 231. https://doi.org/10.1149/06605.0223ecst

122.  Mahmoudi, H., Windbacher, T., Sverdlov, V., Selberherr, S.:
"Stateful STT-MRAM-Based Logic for Beyond-Von Neumann Computing";
in: "Stateful STT-MRAM-Based Logic for Beyond-Von Neumann Computing", T. Brozek (Hrg.); herausgegeben von: CRC Press; CRC Press, 2015, ISBN: 978-1-4822-1490-1, S. 221 - 259. https://doi.org/10.1201/b17597

121.  Filipovic, L., Selberherr, S.:
"Stress Considerations in Thin Films for CMOS-Integrated Gas Sensors";
in: "Advanced CMOS-Compatible Semiconductor Devices 17, Vol.66, No.5", Y. Omura, J. A. Martino, J.-P. Raskin, S. Selberherr, H. Ishii, F. Gamiz, B.-Y. Nguyen (Hrg.); herausgegeben von: The Electrochemical Society; ECS Transactions, 2015, ISBN: 978-1-62332-238-0, S. 243 - 250. https://doi.org/10.1149/06605.0243ecst

120.  Ellinghaus, P., Nedjalkov, M., Selberherr, S.:
"The Influence of Electrostatic Lenses on Wave Packet Dynamics";
in: "Large-Scale Scientific Computing, Lecture Notes in Computer Science", 9374; I. Lirkov, S. Margenov, J. Wasniewski (Hrg.); Springer International Publishing, 2015, ISBN: 978-3-319-26519-3, S. 277 - 284. https://doi.org/10.1007/978-3-319-26520-9_30

119.  Bina, M., Rupp, K.:
"The Spherical Harmonics Expansion Method for Assessing Hot Carrier Degradation";
in: "Hot Carrier Degradation in Semiconductor Devices", T. Grasser (Hrg.); Springer International Publishing, 2015, ISBN: 978-3-319-08993-5, S. 197 - 220. https://doi.org/10.1007/978-3-319-08994-2_6

118.  Ghosh, J., Osintsev, D., Sverdlov, V., Selberherr, S.:
"Variation of Spin Lifetime with Spin Injection Orientation in Strained Thin Silicon Films";
in: "Advanced CMOS-Compatible Semiconductor Devices 17, Vol.66, No.5", Y. Omura, J. A. Martino, J.-P. Raskin, S. Selberherr, H. Ishii, F. Gamiz, B.-Y. Nguyen (Hrg.); herausgegeben von: The Electrochemical Society; ECS Transactions, 2015, ISBN: 978-1-62332-238-0, S. 233 - 240. https://doi.org/10.1149/06605.0233ecst

117.  Mahmoudi, H., Windbacher, T., Sverdlov, V., Selberherr, S.:
"Compact Modeling of Memristive IMP Gates for Reliable Stateful Logic Design";
in: "Proceedings of the 21st International Conference Mixed Design of Integrated Circuits and Systems", A. Napieralski (Hrg.); Department of Microelectronics and Computer Science, Lodz University of Technology, Poland, 2014, ISBN: 978-83-63578-04-6, S. 58 - 61.

116.  Makarov, A., Sverdlov, V., Selberherr, S.:
"Composite Magnetic Tunnel Junctions for Fast Memory Devices and Efficient Spin-Torque Nano-Oscillators";
in: "Future Information Engineering", G. Lee (Hrg.); WITPRESS, 2014, ISBN: 978-1-84564-855-8, S. 391 - 398. https://doi.org/10.2495/ICIE130451

115.  Ellinghaus, P., Nedjalkov, M., Selberherr, S.:
"Efficient Calculation of the Two-Dimensional Wigner Potential";
in: "The 17th International Workshop on Computational Electronics (IWCE)", IEEE Xplore, 2014, ISBN: 978-1-4799-5433-9, S. 1 - 3. https://doi.org/10.1109/IWCE.2014.6865812

114.  Windbacher, T., Makarov, A., Mahmoudi, H., Sverdlov, V., Selberherr, S.:
"Frequency Dependence Study of a Bias Field-Free Nano-Scale Oscillator";
in: "The 17th International Workshop on Computational Electronics (IWCE)", IEEE Xplore, 2014, ISBN: 978-1-4799-5433-9, S. 1 - 4. https://doi.org/10.1109/IWCE.2014.6865862

113.  Ellinghaus, P., Nedjalkov, M., Selberherr, S.:
"Implications of the Coherence Length on the Discrete Wigner Potential";
in: "The 17th International Workshop on Computational Electronics (IWCE)", IEEE Xplore, 2014, ISBN: 978-1-4799-5433-9, S. 1 - 3. https://doi.org/10.1109/IWCE.2014.6865852

112.  Sverdlov, V., Mahmoudi, H., Makarov, A., Selberherr, S.:
"Magnetic Tunnel Junctions for Future Memory and Logic-in-Memory Applications";
in: "Proceedings of the 21st International Conference Mixed Design of Integrated Circuits and Systems", A. Napieralski (Hrg.); Department of Microelectronics and Computer Science, Lodz University of Technology, Poland, 2014, ISBN: 978-83-63578-04-6, S. 30 - 33.

111.  Sverdlov, V., Ghosh, J., Osintsev, D., Selberherr, S.:
"Modeling Silicon Spintronics";
in: "Recent Advances in Mathematical Methods in Applied Sciences", Y. Senichenkov, V. Korablev, I. Chernorytski, N. Korovkin, S. Pozdnjkov, K. Ntalianis (Hrg.); Mathematics and Computers in Science and Engineering Series | 32, 2014, ISBN: 978-1-61804-251-4, S. 195 - 198.

110.  Filipovic, L., Selberherr, S., Mutinati, G., Brunet, E., Steinhauer, S., Köck, A., Teva, J., Kraft, J., Siegert, J., Schrank, F., Gspan, C., Grogger, W.:
"Modeling and Analysis of Spray Pyrolysis Deposited SnO2 Films for Gas Sensors";
in: "Transactions on Engineering Technologies", G.-C. Yang, S.-L. Ao, L. Gelman (Hrg.); Springer, 2014, ISBN: 978-94-017-8831-1, S. 295 - 310. https://doi.org/10.1007/978-94-017-8832-8_22

109.  Ghosh, J., Sverdlov, V., Selberherr, S.:
"Spin Diffusion and the Role of Screening Effects in Semiconductors";
in: "The 17th International Workshop on Computational Electronics (IWCE)", IEEE Xplore, 2014, ISBN: 978-1-4799-5433-9, S. 1 - 4. https://doi.org/10.1109/IWCE.2014.6865825

108.  Schwaha, P., Nedjalkov, M., Selberherr, S., Sellier, J. M., Dimov, I., Georgieva, R.:
"Stochastic Formulation of Newton's Acceleration";
in: "Large-Scale Scientific Computing, Lecture Notes in Computer Science", 8353; I. Lirkov, S. Margenov, J. Wasniewski (Hrg.); Springer Berlin Heidelberg, 2014, ISBN: 978-3-662-43879-4, S. 178 - 185. https://doi.org/10.1007/978-3-662-43880-0_19

107.  Sellier, J. M., Nedjalkov, M., Dimov, I., Selberherr, S.:
"The Role of Annihilation in a Wigner Monte Carlo Approach";
in: "Large-Scale Scientific Computing, Lecture Notes in Computer Science", 8353; I. Lirkov, S. Margenov, J. Wasniewski (Hrg.); Springer Berlin Heidelberg, 2014, ISBN: 978-3-662-43879-4, S. 186 - 193. https://doi.org/10.1007/978-3-662-43880-0_20

106.  Osintsev, D., Sverdlov, V., Selberherr, S.:
"Uniaxial Shear Strain as a Mechanism to Increase Spin Lifetime in Thin Film of a SOI-based Silicon Spin FETs";
in: "Functional Nanomaterials and Devices for Electronics, Sensors and Energy Harvesting", A. Nazarov, B. Francis, K. Valeriya, D. Flandre (Hrg.); Springer International Publishing, 2014, ISBN: 978-3-319-08803-7, S. 127 - 149. https://doi.org/10.1007/978-3-319-08804-4_7

105.  Osintsev, D., Sverdlov, V., Neophytou, N., Selberherr, S.:
"Valley Splitting and Spin Lifetime Enhancement in in Strained Thin Silicon Films";
in: "The 17th International Workshop on Computational Electronics (IWCE)", IEEE Xplore, 2014, ISBN: 978-1-4799-5433-9, S. 1 - 4. https://doi.org/10.1109/IWCE.2014.6865824

104.  Weinbub, J., Rupp, K., Selberherr, S.:
"A Flexible Dynamic Data Structure for Scientific Computing";
in: "IAENG Transactions on Engineering Technologies, Lecture Notes in Electrical Engineering", 229; G.-C. Yang, S.-L. Ao, L. Gelman (Hrg.); Springer, 2013, (eingeladen), ISBN: 978-94-007-6189-6, S. 565 - 577. https://doi.org/10.1007/978-94-007-6190-2_43

103.  Weinbub, J., Rupp, K., Selberherr, S.:
"A Lightweight Task Graph Scheduler for Distributed High-Performance Scientific Computing";
in: "Applied Parallel and Scientific Computing, Lecture Notes in Computer Science", 7782; P. Manninen, P. Öster (Hrg.); Springer Berlin Heidelberg, 2013, ISBN: 978-3-642-36802-8, S. 563 - 566. https://doi.org/10.1007/978-3-642-36803-5_47

102.  Gös, W., Schanovsky, F., Grasser, T.:
"Advanced Modeling of Oxide Defects";
in: "Bias Temperature Instability for Devices and Circuits", T. Grasser (Hrg.); Springer New York, 2013, ISBN: 978-1-4614-7909-3, S. 409 - 446. https://doi.org/10.1007/978-1-4614-7909-3_16

101.  Ahmed, S., Nedjalkov, M., Vasileska, D.:
"Comparative Study of Various Self-Consistent Event Biasing Schemes for Monte Carlo Simulations of Nanoscale MOSFETs";
in: "Theory and Applications of Monte Carlo Simulations", V. Chan (Hrg.); Intech Open Access Publisher, 2013, ISBN: 978-953-51-1012-5, S. 109 - 133. https://doi.org/10.5772/53113

100.  Rodriguez, J., Weinbub, J., Pahr, D., Rupp, K., Selberherr, S.:
"Distributed High-Performance Parallel Mesh Generation with ViennaMesh";
in: "Applied Parallel and Scientific Computing, Lecture Notes in Computer Science", 7782; P. Manninen, P. Öster (Hrg.); Springer Berlin Heidelberg, 2013, ISBN: 978-3-642-36802-8, S. 548 - 552. https://doi.org/10.1007/978-3-642-36803-5_44

99.  Makarov, A., Sverdlov, V., Selberherr, S.:
"Magnetic Tunnel Junctions with a Composite Free Layer: A New Concept for Future Universal Memory";
in: "Future Trends in Microelectronics - Frontiers and Innovations", S. Luryi, J. Xu, A. Zaslavsky (Hrg.); John Wiley & Sons, 2013, (eingeladen), ISBN: 978-1118-44216-6, S. 93 - 101. https://doi.org/10.1002/9781118678107.ch6

98.  Schanovsky, F., Grasser, T.:
"On the Microscopic Limit of the RD Model";
in: "Bias Temperature Instability for Devices and Circuits", T. Grasser (Hrg.); Springer New York, 2013, ISBN: 978-1-4614-7909-3, S. 379 - 408. https://doi.org/10.1007/978-1-4614-7909-3_15

97.  Osintsev, D., Sverdlov, V., Selberherr, S.:
"Spin Lifetime Enhancement by Shear Strain in Thin Silicon-on-Insulator Films";
in: "Advanced Semiconductor-on-Insulator Technology and Related Physics 16, Vol. 53, No. 5", Y. Omura, F. Gamiz, B.-Y. Nguyen, H. Ishii, J. A. Martino, S. Selberherr, J.-P. Raskin (Hrg.); herausgegeben von: The Electrochemical Society; ECS Transactions, 2013, ISBN: 978-1-62332-027-0, S. 203 - 208. https://doi.org/10.1149/05305.0203ecst

96.  Grasser, T.:
"The Capture/Emission Time Map Approach to the Bias Temperature Instability";
in: "Bias Temperature Instability for Devices and Circuits", T. Grasser (Hrg.); Springer New York, 2013, ISBN: 978-1-4614-7909-3, S. 447 - 481. https://doi.org/10.1007/978-1-4614-7909-3_17

95.  Rupp, K., Jüngel, A., Grasser, T.:
"A GPU-Accelerated Parallel Preconditioner for the Solution of the Boltzmann Transport Equation for Semiconductors";
in: "Facing the Multicore - Challenge II, Lecture Notes in Computer Science", 7174; R. Keller, D. Kramer, J.-Ph. Weiss (Hrg.); Springer Berlin Heidelberg, 2012, ISBN: 978-3-642-30396-8, S. 147 - 157. https://doi.org/10.1007/978-3-642-30397-5

94.  Filipovic, L., Selberherr, S.:
"A Monte Carlo Simulator for Non-contact Mode Atomic Force Microscopy";
in: "Large-Scale Scientific Computing, Lecture Notes in Computer Science", 7116; I. Lirkov, S. Margenov, J. Wasniewski (Hrg.); Springer Berlin Heidelberg, 2012, ISBN: 978-3-642-29842-4, S. 447 - 454. https://doi.org/10.1007/978-3-642-29843-1_50

93.  Palankovski, V., Kuzmik, J.:
"A Promising New n++-GaN/InAlN/GaN HEMT Concept for High-Frequency Applications";
in: "Gallium Nitride and Silicon Carbide Power Technologies 2, Vol. 50, No. 3", R. Garg, K. Shenai (Hrg.); herausgegeben von: The Electrochemical Society; ECS Transactions, 2012, ISBN: 978-1-60768-351-3, S. 291 - 296. https://doi.org/10.1149/05003.0291ecst

92.  Filipovic, L., Selberherr, S.:
"A Two-Dimensional Lorentzian Distribution for an Atomic Force Microscopy Simulator";
in: "Monte Carlo Methods and Applications", K. K. Sabelfeld, I. Dimov (Hrg.); De Gruyter, 2012, ISBN: 978-3-11-029347-0, S. 97 - 104. https://doi.org/10.1515/9783110293586.97

91.  Palankovski, V., Donnarumma, G., Kuzmik, J.:
"Degradation Study of Single and Double-Heterojunction InAlN/GaN HEMTs by Two-Dimensional Simulation";
in: "Gallium Nitride and Silicon Carbide Power Technologies 2, Vol. 50, No. 3", R. Garg, K. Shenai (Hrg.); herausgegeben von: The Electrochemical Society; ECS Transactions, 2012, ISBN: 978-1-60768-351-3, S. 223 - 228. https://doi.org/10.1149/05003.0223ecst

90.  Rupp, K., Jüngel, A., Grasser, T.:
"Deterministic Numerical Solution of the Boltzmann Transport Equation";
in: "Progress in Industrial Mathematics at ECMI 2010, Mathematics in Industry", 17; R. Keller, D. Kramer, J.-Ph. Weiss (Hrg.); Springer Berlin Heidelberg, 2012, ISBN: 978-3-642-25099-6, S. 53 - 59. https://doi.org/10.1007/978-3-642-25100-9_7

89.  Osintsev, D., Makarov, A., Sverdlov, V., Selberherr, S.:
"Efficient Simulations of the Transport Properties of Spin Field-Effect Transistors Built on Silicon Fins";
in: "Large-Scale Scientific Computing, Lecture Notes in Computer Science", 7116; I. Lirkov, S. Margenov, J. Wasniewski (Hrg.); Springer Berlin Heidelberg, 2012, ISBN: 978-3-642-29842-4, S. 630 - 637. https://doi.org/10.1007/978-3-642-29843-1_72

88.  Kysenko, V., Rupp, K., Marchenko, O., Selberherr, S., Anisimov, A.:
"GPU-Accelerated Non-negative Matrix Factorization for Text Mining";
in: "Natural Language Processing and Information Systems, Lecture Notes in Computer Science", 7337; G. Bouma, A. Ittoo, E. Metais, H. Wortmann (Hrg.); Springer Berlin Heidelberg, 2012, ISBN: 978-3-642-31177-2, S. 158 - 163. https://doi.org/10.1007/978-3-642-31178-9_15

87.  Rupp, K., Lagger, P., Grasser, T., Jüngel, A.:
"Inclusion of Carrier-Carrier-Scattering Into Arbitrary-Order Spherical Harmonics Expansions of the Boltzmann Transport Equation";
in: "The 15th International Workshop on Computational Electronics", IEEE Xplore, 2012, ISBN: 978-1-4673-0705-5, S. 1 - 4. https://doi.org/10.1109/IWCE.2012.6242856

86.  Makarov, A., Sverdlov, V., Selberherr, S.:
"MTJs with a Composite Free Layer for High-Speed Spin Transfer Torque RAM: Micromagnetic Simulations";
in: "The 15th International Workshop on Computational Electronics (IWCE)", IEEE Xplore, 2012, ISBN: 978-1-4673-0705-5, S. 1 - 4. https://doi.org/10.1109/IWCE.2012.6242842

85.  Schwaha, P., Nedjalkov, M., Selberherr, S., Dimov, I.:
"Monte Carlo Investigations of Electron Decoherence due to Phonons";
in: "Monte Carlo Methods and Applications", K. K. Sabelfeld, I. Dimov (Hrg.); De Gruyter, 2012, ISBN: 978-3-11-029347-0, S. 203 - 211.

84.  Baumgartner, O., Stanojevic, Z., Kosina, H.:
"Monte Carlo Simulation of Electron Transport in Quantum Cascade Lasers";
in: "Monte Carlo Methods and Applications", K. K. Sabelfeld, I. Dimov (Hrg.); De Gruyter, 2012, ISBN: 978-3-11-029347-0, S. 59 - 67.

83.  Makarov, A., Sverdlov, V., Selberherr, S.:
"New Trends in Microelectronics: Towards an Ultimate Memory Concept";
in: "The 8th International Caribbean Conference on Devices, Circuits and Systems", IEEE Xplore, 2012, ISBN: 978-1-4577-1116-9, S. 1 - 4. https://doi.org/10.1109/ICCDCS.2012.6188899

82.  Schwaha, P., Nedjalkov, M., Selberherr, S., Dimov, I.:
"Particle-Grid Techniques for Semiclassical and Quantum Transport Simulations";
in: "The 15th International Workshop on Computational Electronics (IWCE)", IEEE Xplore, 2012, ISBN: 978-1-4673-0705-5, S. 1 - 3. https://doi.org/10.1109/IWCE.2012.6242860

81.  Schwaha, P., Nedjalkov, M., Selberherr, S., Dimov, I.:
"Phonon-Induced Decoherence in Electron Evolution";
in: "Large-Scale Scientific Computing, Lecture Notes in Computer Science", 7116; I. Lirkov, S. Margenov, J. Wasniewski (Hrg.); Springer Berlin Heidelberg, 2012, ISBN: 978-3-642-29842-4, S. 472 - 479. https://doi.org/10.1007/978-3-642-29843-1_53

80.  Starkov, A., Pakhomov, O., Starkov, I., Zaitsev, A., Baranov, I.:
"Principles of Solid-State Cooler on Layered Multiferroics";
in: "5th International Conference on Magnetic Refrigeration at Room Temperature", C. V. Muller (Hrg.); Institut International Du Froid, 2012, ISBN: 978-2-91314-994-6, S. 573 - 581.

79.  Osintsev, D., Baumgartner, O., Stanojevic, Z., Sverdlov, V., Selberherr, S.:
"Reduction of Surface Roughness Induced Spin Relaxation in SOI MOSFETs";
in: "The 15th International Workshop on Computational Electronics (IWCE)", IEEE Xplore, 2012, ISBN: 978-1-4673-0705-5, S. 1 - 4. https://doi.org/10.1109/IWCE.2012.6242850

78.  Nedjalkov, M., Schwaha, P., Selberherr, S., Ferry, D.K., Vasileska, D., Dollfus, P., Querlioz, D.:
"Role of the Physical Scales on the Transport Regime";
in: "The 15th International Workshop on Computational Electronics (IWCE)", IEEE Xplore, 2012, ISBN: 978-1-4673-0705-5, S. 1 - 3. https://doi.org/10.1109/IWCE.2012.6242848

77.  Weinbub, J., Rupp, K., Selberherr, S.:
"Towards Distributed Heterogenous High-Performance Computing with ViennaCL";
in: "Large-Scale Scientific Computing, Lecture Notes in Computer Science", 7116; I. Lirkov, S. Margenov, J. Wasniewski (Hrg.); Springer Berlin Heidelberg, 2012, ISBN: 978-3-642-29842-4, S. 359 - 367. https://doi.org/10.1007/978-3-642-29843-1_41

76.  Weinbub, J., Rupp, K., Filipovic, L., Makarov, A., Selberherr, S.:
"Towards a Free Open Source Process and Device Simulation Framework";
in: "The 15th International Workshop on Computational Electronics (IWCE)", IEEE Xplore, 2012, ISBN: 978-1-4673-0705-5, S. 1 - 4. https://doi.org/10.1109/IWCE.2012.6242867

75.  Mennemann, J.-F., Jüngel, A., Kosina, H.:
"Transient Schrödinger-Poisson simulations of a high-frequency resonant tunneling diode oscillator";
in: "ASC Report 17/2012", herausgegeben von: Institute for Analysis and Scientific Computing; Vienna University of Technology, Wien, 2012, ISBN: 978-3-902627-05-6, S. 1 - 30.

74.  Karamitaheri, H., Pourfath, M., Faez, R., Kosina, H.:
"An Investigation of the Geometrical Effects on the Thermal Conductivity of Graphene Antidot Lattices";
in: "Dielectrics in Nanosystems -and- Graphene, Ge/III-V, Nanowires and Emerging Materials for Post-CMOS Applications 3", Z. Karim, D. Misra, P. Srinivasan, Y. Obeng, S. De Gendt (Hrg.); ECS Transactions, 2011, ISBN: 978-1-56677-864-0, S. 185 - 192. https://doi.org/10.1149/1.3569910

73.  Windbacher, T., Sverdlov, V., Selberherr, S.:
"Classical Device Modeling";
in: "Nano-Electronic Devices: Semiclassical and Quantum Transport Modeling", D. Vasileska, S.M. Goodnick (Hrg.); Springer New York, 2011, (eingeladen), ISBN: 978-1-4419-8839-3, S. 1 - 96. https://doi.org/10.1007/978-1-4419-8840-9_1

72.  Makarov, A., Sverdlov, V., Selberherr, S.:
"Modeling of the SET and RESET Process in Bipolar Resistive Oxide-Based Memory Using Monte Carlo Simulations";
in: "Numerical Methods and Applications, Lecture Notes in Computer Science", 6046; I. Dimov, S. Dimova, N. T. Kolkovska (Hrg.); Springer Berlin Heidelberg, 2011, ISBN: 978-3-642-18465-9, S. 87 - 94. https://doi.org/10.1007/978-3-642-18466-6_9

71.  Pourfath, M., Kosina, H.:
"Numerical Study of Quantum Transport in Carbon Nanotube-Based Transistors";
in: "Encyclopedia of Nanoscience and Nanotechnology", H. Nalwa (Hrg.); American Scientific Publishers, 2011, ISBN: 1-58883-168-x, S. 541 - 581.

70.  Tyaginov, S. E., Starkov, I., Enichlmair, H., Park, J.M., Jungemann, C., Grasser, T.:
"Physics-Based Hot-Carrier Degradation Models";
in: "Silicon Nitride, Silicon Dioxide, and Emerging Dielectrics 11", R. Sah (Hrg.); ECS Transactions, 2011, ISBN: 978-1-56677-865-7, S. 321 - 352. https://doi.org/10.1149/1.3572292

69.  Osintsev, D., Sverdlov, V., Stanojevic, Z., Makarov, A., Weinbub, J., Selberherr, S.:
"Properties of Silicon Ballistic Spin Fin-Based Field-Effect Transistors";
in: "Advanced Semiconductor-on-Insulator Technology and Related Physics 15, Vol.35, No.5", Y. Omura, H. Ishii, B.-Y. Nguyen, S. Selberherr, F. Gamiz, J. A. Martino, J.-P. Raskin (Hrg.); herausgegeben von: The Electrochemical Society; ECS Transactions, 2011, ISBN: 978-1-56677-866-4, S. 277 - 282. https://doi.org/10.1149/1.3570806

68.  Nedjalkov, M., Selberherr, S., Dimov, I.:
"Stochastic Algorithm for Solving the Wigner-Boltzmann Correction Equation";
in: "Numerical Methods and Applications, Lecture Notes in Computer Science", 6046; I. Dimov, S. Dimova, N. T. Kolkovska (Hrg.); Springer Berlin Heidelberg, 2011, ISBN: 978-3-642-18465-9, S. 95 - 102. https://doi.org/10.1007/978-3-642-18466-6_10

67.  Nedjalkov, M., Querlioz, D., Dollfus, P., Kosina, H.:
"Wigner Function Approach";
in: "Nano-Electronic Devices: Semiclassical and Quantum Transport Modeling", D. Vasileska, S.M. Goodnick (Hrg.); Springer New York, 2011, (eingeladen), ISBN: 978-1-4419-8839-3, S. 289 - 358. https://doi.org/10.1007/978-1-4419-8840-9_5

66.  Windbacher, T., Sverdlov, V., Selberherr, S.:
"Biotin-Streptavidin Sensitive BioFETs and Their Properties";
in: "Biomedical Engineering Systems and Technologies, Communications in Computer and Information Scienc", 52; A. Fred, J. Filipe, H. Gamboa (Hrg.); Springer Berlin Heidelberg, 2010, ISBN: 978-3-642-11720-6, S. 85 - 95. https://doi.org/10.1007/978-3-642-11721-3_6

65.  Gös, W., Schanovsky, F., Hehenberger, Ph., Wagner, P.-J., Grasser, T.:
"Charge Trapping and the Negative Bias Temperature Instability";
in: "Physics and Technology of High-k Materials 8", ECS Transactions, 2010, (eingeladen), ISBN: 978-1-56677-822-0, S. 565 - 589. https://doi.org/10.1149/1.3481647

64.  Cervenka, J., Zoric, A., Gurov, T., Arsov, G.:
"GRINKO - Grid e-Infrastructure and Networking with Kosovo";
in: "JOINT RESEARCH AND TECHNOLOGY DEVELOPMENT Projects 2007-2010", KAIP, 2010, S. 150 - 162.

63.  Rupp, K., Jüngel, A., Grasser, T.:
"Matrix Compression for Spherical Harmonics Expansions of the Boltzmann Transport Equation for Semiconductors";
in: "ASC Report 10/2010", herausgegeben von: Institute for Analysis and Scientific Computing; Vienna University of Technology, Wien, 2010, ISBN: 978-3-902627-03-2, S. 1 - 32.

62.  Vasicek, M., Esseni, D., Fiegna, C., Grasser, T.:
"Modeling and Simulation Approaches for Drain Current Computation";
in: "Nanoscale CMOS: Innovative Materials, Modeling and Characterization", herausgegeben von: F. Balestra; Wiley, London, 2010, (eingeladen), ISBN: 978-1-84821-180-3, S. 259 - 285.

61.  Triebl, O., Grasser, T.:
"Numerical Power/HV Device Modeling";
in: "Power/HV MOS Devices Compact Modeling", W. Grabinski, T. Gneiting (Hrg.); Springer Netherlands, 2010, (eingeladen), ISBN: 978-90-481-3045-0, S. 1 - 32. https://doi.org/10.1007/978-90-481-3046-7_1

60.  Nedjalkov, M., Schwaha, P., Baumgartner, O., Selberherr, S.:
"Particle Model of the Scattering-Induced Wigner Function Correction";
in: "Large-Scale Scientific Computing, Lecture Notes in Computer Science", 5910; I. Lirkov, S. Margenov, J. Wasniewski (Hrg.); Springer Berlin Heidelberg, 2010, ISBN: 978-3-642-12534-8, S. 411 - 418. https://doi.org/10.1007/978-3-642-12535-5_48

59.  Sverdlov, V., Baumgartner, O., Windbacher, T., Selberherr, S.:
"Silicon for Spintronic Applications: Strain-Enhanced Valley Splitting";
in: "Future Trends in Microelectronics", S. Luryi, J. Xu, A. Zaslavsky (Hrg.); John Wiley & Sons, 2010, (eingeladen), ISBN: 978-0-470-55137-0, S. 281 - 291. https://doi.org/10.1002/9780470649343.ch24

58.  Vasicek, M., Sverdlov, V., Cervenka, J., Grasser, T., Kosina, H., Selberherr, S.:
"Transport in Nanostructures: A Comparative Analysis Using Monte Carlo Simulation, the Spherical Harmonic Method, and Higher Moments Models";
in: "Large-Scale Scientific Computing, Lecture Notes in Computer Science", 5910; I. Lirkov, S. Margenov, J. Wasniewski (Hrg.); Springer Berlin Heidelberg, 2010, ISBN: 978-3-642-12534-8, S. 443 - 450. https://doi.org/10.1007/978-3-642-12535-5_52

57.  Heinzl, R., Schwaha, P., Stimpfl, F., Selberherr, S.:
"Concepts for High-Perfomance Scientific Computing";
in: "Software and Data Technologies, Communications in Computer and Information Science", 22; J. Filipe, B. Shishkov, M. Helfert, L. Maciaszek (Hrg.); Springer, 2009, ISBN: 978-3-540-88654-9, S. 89 - 100. https://doi.org/10.1007/978-3-540-88655-6_7

56.  Grasser, T., Gös, W., Kaczer, B.:
"Critical Modeling Issues in Negative Bias Temperature Instability";
in: "215th ECS Meeting", R. Ekwal Sah, J. Zhang, J. Deen, J. Yota, A. Toriumi (Hrg.); ECS Transactions, 2009, (eingeladen), S. 265 - 287. https://doi.org/10.1149/1.3122096

55.  Sverdlov, V., Ungersböck, E., Kosina, H.:
"Monte Carlo Algorithm for Mobility Calculations in Thin Body Field Effect Transistors: Role of Degeneracy and Intersubband Scattering";
in: "Large-Scale Scientific Computing, Lecture Notes in Computer Science", 4818; I. Lirkov, S. Margenov, J. Wasniewski (Hrg.); Springer Berlin Heidelberg, 2008, ISBN: 978-80-86407-12-8, S. 157 - 164. https://doi.org/10.1007/978-3-540-78827-0_16

54.  Palankovski, V., Wagner, M., Heiss, W.:
"Monte Carlo Simulation of Electron Transport in PbTe";
in: "Narrow Gap Semiconductors 2007, Springer Proceedings in Physics", 119; B. Murdin, S. Clowes (Hrg.); Springer Netherlands, 2008, ISBN: 978-1-4020-8424-9, S. 77 - 79. https://doi.org/10.1007/978-1-4020-8425-6_19

53.  Vitanov, S., Palankovski, V.:
"Monte Carlo Study of Transport Properties of InN";
in: "Narrow Gap Semiconductors 2007, Springer Proceedings in Physics", 119; B. Murdin, S. Clowes (Hrg.); Springer Netherlands, 2008, ISBN: 13978-1-4020-8424-9, S. 97 - 100. https://doi.org/10.1007/978-1-4020-8425-6_24

52.  Kosina, H.:
"Nanoelectronic Device Simulation Based on the Wigner Function Formalism";
in: "Physics and Modeling of Tera- and Nano-Devices", World Scientific Publishing Co., Singapore, 2008, ISBN: 978-981-277-904-5, S. 31 - 40.

51.  Grasser, T., Gös, W., Kaczer, B.:
"Towards Engineering Modeling of Negative Bias Temperature Instability";
in: "Defects in Microelectronic Materials and Devices", herausgegeben von: D. Fleetwood, R. Schrimpf, S. Pantelides; Taylor and Francis/CRC Press, 2008, (eingeladen), ISBN: 1420043765, S. 399 - 436.

50.  Nedjalkov, M., Kosina, H., Vasileska, D.:
"Wigner Ensemble Monte Carlo: Challenges of 2D Nano-Device Simulation";
in: "Large-Scale Scientific Computing, Lecture Notes in Computer Science", 4818; I. Lirkov, S. Margenov, J. Wasniewski (Hrg.); Springer Berlin Heidelberg, 2008, ISBN: 978-80-86407-12-8, S. 139 - 147. https://doi.org/10.1007/978-3-540-78827-0_14

49.  Spevak, M., Heinzl, R., Schwaha, P., Selberherr, S.:
"A Computational Framework for Topological Operations";
in: "Applied Parallel Computing, Lecture Notes in Computer Science", 4699; B. Kaagström, E. Elmroth, J. Jackson, J. Wasniewski (Hrg.); Springer Berlin Heidelberg, 2007, ISBN: 978-3-540-75754-2, S. 781 - 790. https://doi.org/10.1007/978-3-540-75755-9_95

48.  Heinzl, R., Spevak, M., Schwaha, P., Selberherr, S.:
"A High Performance Generic Scientific Simulation Environment";
in: "Applied Parallel Computing, Lecture Notes in Computer Science", 4699; B. Kaagström, E. Elmroth, J. Dongarra, J. Wasniewski (Hrg.); Springer Berlin Heidelberg, 2007, ISBN: 978-3-540-75754-2, S. 996 - 1005. https://doi.org/10.1007/978-3-540-75755-9_117

47.  Vitanov, S., Nedjalkov, M., Palankovski, V.:
"A Monte Carlo Model of Piezoelectric Scattering in GaN";
in: "Numerical Methods and Applications, Lecture Notes in Computer Science", 4310; T. Boyanov, S. Dimova, K. Georgiev, G. Nikolov (Hrg.); Springer-Verlag, Berlin-Heidelberg, 2007, ISBN: 978-3-540-70940-4, S. 197 - 204. https://doi.org/10.1007/978-3-540-70942-8_23

46.  Riedling, K., Selberherr, S.:
"A Publication Database for Research Documentation and Performance Evaluation";
in: "Innovations 2007", International Network for Engineering Education and Research (iNEER), Arlington, VA, USA, 2007, ISBN: 978-0-9741252-6-8, S. 365 - 380.

45.  Pourfath, M., Kosina, H., Selberherr, S.:
"Carbon Nanotube Based Transistors: A Computational Study";
in: "28th International Conference on the Physics of Semiconductors", American Institute of Physics, 2007, ISBN: 978-0-7354-0397-0, S. 1041 - 1042. https://doi.org/10.1063/1.2730253

44.  Ungersböck, E., Sverdlov, V., Kosina, H., Selberherr, S.:
"Low-Field Mobility in Strained Silicon Inversion Layers and UTB MOSFETs for Different Substrate Orientations";
in: "28th International Conference on the Physics of Semiconductors", American Institute of Physics, 2007, ISBN: 978-0-7354-0397-0, S. 1389 - 1390. https://doi.org/10.1063/1.2730422

43.  Sverdlov, V., Ungersböck, E., Kosina, H.:
"Mobility Modeling in SOI FETs for Different Substrate Orientations and Strain Conditions";
in: "Nanoscaled Semiconductor-on-Insulator Structures and Devices", S. Hall, A. Nazarov, V. Lysenko (Hrg.); Springer Netherlands, 2007, ISBN: 978-1-4020-6378-7, S. 357 - 362. https://doi.org/10.1007/978-1-4020-6380-0_23

42.  Gurov, T.V., Atanassov, E., Nedjalkov, M., Dimov, I.:
"Modeling of Carrier Transport in Nanowires";
in: "Large-Scale Scientific Computing, Lecture Notes in Computer Science", 4487; I. Lirkov, S. Margenov, J. Wasniewski (Hrg.); Springer Berlin Heidelberg, 2007, ISBN: 978-3-540-72583-1, S. 739 - 746. https://doi.org/10.1007/978-3-540-72584-8_98

41.  Vitanov, S., Palankovski, V., Quay, R., Langer, E.:
"Modeling of Electron Transport in GaN-Based Materials and Devices";
in: "AIP Conference Proceedings, Vol. 893", American Institute of Physics, 2007, ISBN: 978-0-7354-0397-0, S. 1399 - 1400.

40.  Sverdlov, V., Ungersböck, E., Kosina, H.:
"Monte Carlo Algorithm for Mobility Calculations in Thin Body Field Effect Transistors: Role of Degeneracy and Intersubband Scattering";
in: "Large-Scale Scientific Computing, Lecture Notes in Computer Science", 4818; I. Lirkov, S. Margenov, J. Wasniewski (Hrg.); Springer Berlin Heidelberg, 2007, ISBN: 978-3-540-78825-6, S. 157 - 164. https://doi.org/10.1007/978-3-540-78827-0_16

39.  Sverdlov, V., Kosina, H., Grasser, T., Selberherr, S.:
"Self-Consistent Wigner Monte Carlo Simulations of Current in Emerging Nanodevices: Role of Tunneling and Scattering";
in: "28th International Conference on the Physics of Semiconductors", American Institute of Physics, 2007, ISBN: 978-0-7354-0397-0, S. 1395 - 1396. https://doi.org/10.1063/1.2730425

38.  Kaczer, B., Grasser, T., Fernandez, R., Groeseneken, G.:
"Toward Understanding the Wide Distribution of Time Scales in Negative Bias Temperature Instability";
in: "Silicon Nitride, Silicon Dioxide, and Emerging Dielectrics 9", R. Sah, J. Zhang, Y. Kamakura, M. Deen, J. Yota (Hrg.); ECS Transactions, Pennington, 2007, (eingeladen), ISBN: 978-1-56677-552-6, S. 265 - 281. https://doi.org/10.1149/1.2728801

37.  Wittmann, R., Uppal, S., Hössinger, A., Cervenka, J., Selberherr, S.:
"A Study of Boron Implantation into High Ge Content SiGe Alloys";
in: "SiGe and Ge: Materials, Processing, and Devices, Vol. 3, No. 7", D. Harame, J. Boquet, M. Caymax, J. Cressler, H. Iwai, S. Koester, G. Masini, J. Murota, A. Reznicek, K. Rim, B. Tillack, S. Zaima (Hrg.); herausgegeben von: The Electrochemical Society; ECS Transactions, 2006, ISBN: 1-56677-507-8, S. 667 - 676. https://doi.org/10.1149/1.2355862

36.  Karlowatz, G., Ungersböck, E., Wessner, W., Kosina, H., Selberherr, S.:
"Analysis of Hole Transport in Arbitrarily Strained Germanium";
in: "SiGe and Ge: Materials, Processing, and Devices, Vol. 3, No. 7", D. Harame, J. Boquet, M. Caymax, J. Cressler, H. Iwai, S. Koester, G. Masini, J. Murota, A. Reznicek, K. Rim, B. Tillack, S. Zaima (Hrg.); herausgegeben von: The Electrochemical Society; ECS Transactions, 2006, ISBN: 1-56677-507-8, S. 443 - 450. https://doi.org/10.1149/1.2355842

35.  Kosina, H., Selberherr, S.:
"Device Simulation Demands of Upcoming Microelectronics Devices";
in: "Frontiers in Electronics", H. Iwai, Y. Nishida, M. Shur, H. Wong (Hrg.); World Scientific Publishing Co., 2006, ISBN: 978-981-256-884-7, S. 115 - 136. https://doi.org/10.1142/S0129156406003576

34.  Karner, M., Gehring, A., Holzer, S., Kosina, H., Selberherr, S.:
"Efficient Calculation of Lifetime Based Direct Tunneling Through Stacked Dielectrics";
in: "Physics and Technology of High-k Gate Dielectrics III, Vol. 1 No. 5", S. Kar, S. De Gendt, M. Houssa, D. Landheer, D. Misra, W. Tsai (Hrg.); herausgegeben von: The Electrochemical Society; ECS Transactions, 2006, ISBN: 1-56677-444-6, S. 693 - 703. https://doi.org/10.1149/1.2209316

33.  Karner, M., Gehring, A., Holzer, S., Kosina, H.:
"Efficient Calculation of Quasi-bound States for the Simulation of Direct Tunneling";
in: "Large-Scale Scientific Computing, Lecture Notes in Computer Science", 3743; I. Lirkov, S. Margenov, J. Wasniewski (Hrg.); Springer Berlin Heidelberg, 2006, ISBN: 3-540-31994-8, S. 572 - 577. https://doi.org/10.1007/11666806_65

32.  Pourfath, M., Kosina, H.:
"Fast Convergent Schrödinger-Poisson Solver for the Static and Dynamic Analysis of Carbon Nanotube Field Effect Transistors";
in: "Large-Scale Scientific Computing, Lecture Notes in Computer Science", 3743; I. Lirkov, S. Margenov, J. Wasniewski (Hrg.); Springer Berlin Heidelberg, Berlin / Heidelberg, 2006, ISBN: 3-540-31994-8, S. 578 - 585. https://doi.org/10.1007/11666806_66

31.  Nedjalkov, M., Gurov, T.V., Kosina, H., Vasileska, D., Palankovski, V.:
"Femtosecond Evolution of Spatially Inhomogeneous Carrier Excitations Part I: Kinetic Approach";
in: "Large-Scale Scientific Computing, Lecture Notes in Computer Science", 3743; I. Lirkov, S. Margenov, J. Wasniewski (Hrg.); Springer Berlin Heidelberg, 2006, ISBN: 3-540-31994-8, S. 149 - 156. https://doi.org/10.1007/11666806_15

30.  Gurov, T.V., Atanassov, E., Dimov, I., Palankovski, V.:
"Femtosecond Evolution of Spatially Inhomogeneous Carrier Excitations Part II: Stochastic Approach and Grid Implementation";
in: "Large-Scale Scientific Computing, Lecture Notes in Computer Science", 3743; I. Lirkov, S. Margenov, J. Wasniewski (Hrg.); Springer Berlin Heidelberg, 2006, ISBN: 3-540-31994-8, S. 157 - 163. https://doi.org/10.1007/11666806_16

29.  Ungersböck, E., Sverdlov, V., Kosina, H., Selberherr, S.:
"Low-Field Electron Mobility in Stressed UTB SOI MOSFETs for Different Substrate Orientations";
in: "SiGe and Ge: Materials, Processing, and Devices, Vol. 3, No. 7", D. Harame, J. Boquet, M. Caymax, J. Cressler, H. Iwai, S. Koester, G. Masini, J. Murota, A. Reznicek, K. Rim, B. Tillack, S. Zaima (Hrg.); herausgegeben von: The Electrochemical Society; ECS Transactions, 2006, ISBN: 1-56677-507-8, S. 45 - 54. https://doi.org/10.1149/1.2355793

28.  Ceric, H., Heinzl, R., Hollauer, Ch., Grasser, T., Selberherr, S.:
"Microstructure and Stress Aspects of Electromigration Modeling";
in: "Stress-Induced Phenomena in Metallization", American Institute of Physics, Melville, 2006, ISBN: 0-7354-03104, S. 262 - 268.

27.  Ungersböck, E., Sverdlov, V., Kosina, H., Selberherr, S.:
"Modeling of Advanced Semiconductor Devices";
in: "Microelectronics Technology and Devices - SBMICRO 2006, Vol. 4 No. 1", J. A. Diniz, P. French, N. Morimoto, J. W. Swart, D. De Lima Monteiro (Hrg.); herausgegeben von: The Electrochemical Society; ECS Transactions, 2006, (eingeladen), ISBN: 1-56677-512-4, S. 207 - 216. https://doi.org/10.1149/1.2813493

26.  Karner, M., Holzer, S., Gös, W., Vasicek, M., Wagner, M., Kosina, H., Selberherr, S.:
"Numerical Analysis of Gate Stacks";
in: "Physics and Technology of High-k Gate Dielectrics 4, Vol. 3 No. 3", S. Kar, S. De Gendt, M. Houssa, H. Iwai, D. Landheer, D. Misra (Hrg.); herausgegeben von: The Electrochemical Society; ECS Transactions, 2006, ISBN: 1-56677-503-5, S. 299 - 308. https://doi.org/10.1149/1.2355721

25.  Wagner, M., Span, G., Holzer, S., Palankovski, V., Triebl, O., Grasser, T.:
"Power Output Improvement of Silicon-Germanium Thermoelectric Generators";
in: "SiGe and Ge: Materials, Processing, and Devices, Vol. 3, No. 7", herausgegeben von: The Electrochemical Society; ECS Transactions, 2006, ISBN: 1-56677-507-8, S. 1151 - 1162. https://doi.org/10.1149/1.2355909

24.  Sverdlov, V., Kosina, H., Ringhofer, Ch., Nedjalkov, M., Selberherr, S.:
"Quantum Correction to the Semiclassical Electron-Phonon Scattering Operator";
in: "Large-Scale Scientific Computing, Lecture Notes in Computer Science", 3743; I. Lirkov, S. Margenov, J. Wasniewski (Hrg.); Springer Berlin Heidelberg, 2006, ISBN: 3-540-31994-8, S. 594 - 601. https://doi.org/10.1007/11666806_68

23.  Gehring, A., Selberherr, S.:
"Tunneling Models for Semiconductor Device Simulation";
in: "Handbook of Theoretical and Computational Nanotechnology", herausgegeben von: Forschungszentrum Karlsruhe; American Scientific Publishers, Los Angeles, 2006, ISBN: 1-58883-042-x, S. 469 - 543.

22.  Kosina, H., Nedjalkov, M.:
"Wigner Function-Based Device Modeling";
in: "Handbook of Theoretical and Computational Nanotechnology", herausgegeben von: Forschungszentrum Karlsruhe; American Scientific Publishers, Los Angeles, 2006, ISBN: 1-58883-042-x, S. 731 - 763.

21.  Sverdlov, V., Kinkhabwala, Y., Kaplan, D., Korotkov, A.N., Kosina, H., Selberherr, S.:
"Shot Noise Suppression and Enhancement at 2D Hopping and in Single-Electron Arrays";
in: "Unsolved Problems of Noise and Fluctuations", herausgegeben von: New York; American Institute of Physics, New York, 2005, ISBN: 0-7354-0289-2, S. 177 - 182.

20.  Hollauer, Ch., Ceric, H., Selberherr, S.:
"Three-Dimensional Simulation of Thermal Oxidation and the Influence of Stress";
in: "Physics and Chemistry of SiO2 and the Si-SiO2 Interface-5, Vol. 1 No. 1", herausgegeben von: H.Z. Massoud, J.H. Stathis, T. Hattori, D. Misra, I. Baumvol; ECS Transactions, Pennington, 2005, ISBN: 1-56677-430-6, S. 103 - 113. https://doi.org/10.1149/ma2005-02/19/734

19.  Nedjalkov, M.:
"Wigner Transport in the Presence of Phonons: Particle Models of Electron Kinetics";
in: "From Nanostructures to Nanosensing Applications", 160; A. D´Amico, G. Balestrino, A. Paoletti (Hrg.); herausgegeben von: Societa Italiana Di Fisica; IOS Press, Amsterdam, 2005, (eingeladen), ISBN: 1-58603-527-4, S. 55 - 103. https://doi.org/10.3254/978-1-61499-016-1-55

18.  Wittmann, R., Hössinger, A., Selberherr, S.:
"Calibration for the Monte Carlo Simulation of Ion Implantation in Relaxed SiGe";
in: "SiGe: Materials, Processing, and Devices", herausgegeben von: The Electrochemical Society; ECS Transactions, 2004, ISBN: 1-56677-420-9, S. 181 - 192.

17.  Grasser, T.:
"Closure Relations for Macroscopic Transport Models in Semiconductor Device Simulation";
in: "Recent Research Developments in Applied Physics Vol. 7 - 2004 Part II", herausgegeben von: S.G. Pandalai; Transworld Research Network, 2004, (eingeladen), ISBN: 81-7895-156-8, S. 423 - 446.

16.  Sabelka, R., Harlander, C., Selberherr, S.:
"Interconnects and Propagation of High Frequency Signals";
in: "Predictive Simulation of Semiconductor Processing, Springer Series in Materials Science", 72; J. Dabrowski, E. Weber (Hrg.); Springer Berlin Heidelberg, 2004, ISBN: 3-540-20481-4, S. 357 - 385. https://doi.org/10.1007/978-3-662-09432-7_9

15.  Kosina, H., Nedjalkov, M., Selberherr, S.:
"A Stable Backward Monte Carlo Method for the Solution of the Boltzmann Equation";
in: "Large-Scale Scientific Computing, Lecture Notes in Computer Science", 2907; I. Lirkov, S. Margenov, J. Wasniewski, P. Yalamov (Hrg.); Springer Berlin Heidelberg, 2003, ISBN: 3-540-21090-3, S. 170 - 177. https://doi.org/10.1007/978-3-540-24588-9_18

14.  Nedjalkov, M., Kosina, H., Selberherr, S.:
"A Weight Decomposition Approach to the Sign Problem in Wigner Transport Simulations";
in: "Large-Scale Scientific Computing, Lecture Notes in Computer Science", 2907; I. Lirkov, S. Margenov, J. Wasniewski, P. Yalamov (Hrg.); Springer Berlin Heidelberg, 2003, ISBN: 3-540-21090-3, S. 178 - 184. https://doi.org/10.1007/978-3-540-24588-9_19

13.  Smirnov, S., Kosina, H., Nedjalkov, M., Selberherr, S.:
"A Zero Field Monte Carlo Algorithm Accounting for the Pauli Exclusion Principle";
in: "Large-Scale Scientific Computing, Lecture Notes in Computer Science", 2907; I. Lirkov, S. Margenov, J. Wasniewski, P. Yalamov (Hrg.); Springer Berlin Heidelberg, 2003, ISBN: 3-540-21090-3, S. 185 - 193. https://doi.org/10.1007/978-3-540-24588-9_20

12.  Grasser, T., Kosina, H., Selberherr, S.:
"Hot Carrier Effects within Macroscopic Transport Models";
in: "Advanced Device Modeling and Simulation", T. Grasser (Hrg.); World Scientific Publishing Co., Singapore, 2003, ISBN: 9-812-38607-6, S. 173 - 201.

11.  Kosina, H., Nedjalkov, M.:
"Particle Models for Device Simulation";
in: "Advanced Device Modeling and Simulation", T. Grasser (Hrg.); World Scientific Publishing Co., Singapore, 2003, (eingeladen), ISBN: 9-812-38607-6, S. 27 - 69.

10.  Grasser, T., Selberherr, S.:
"Current Transport Models for Engineering Applications";
in: "Future Trends in Microelectronics", S. Luryi, J. Xu, A. Zaslavsky (Hrg.); John Wiley & Sons, 2002, (eingeladen), ISBN: 0-471-21247-4, S. 87 - 98.

9.  Kosina, H., Nedjalkov, M., Selberherr, S.:
"Monte Carlo Analysis of the Small-Signal Response of Charge Carriers";
in: "Large-Scale Scientific Computing, Lecture Notes in Computer Science", 2179; S. Margenov, J. Wasniewski, P. Yalamov (Hrg.); Springer Berlin Heidelberg, 2001, ISBN: 3-540-43043-1, S. 175 - 182. https://doi.org/10.1007/3-540-45346-6_17

8.  Nedjalkov, M., Gurov, T.V., Kosina, H., Whitlock, P.A.:
"Statistical Algorithms for Simulation of Electron Quantum Kinetics in Semiconductors - Part II";
in: "Large-Scale Scientific Computing, Lecture Notes in Computer Science", 2179; S. Margenov, J. Wasniewski, P. Yalamov (Hrg.); Springer Berlin Heidelberg, 2001, ISBN: 978-3-540-43043-8, S. 183 - 190. https://doi.org/10.1007/3-540-45346-6_18

7.  Langer, E., Selberherr, S.:
"Advanced Models, Applications, and Software Systems for High Performance Computing-Application in Microelectronics";
in: "High Performance Scientific and Engineering Computing, Proceedings of the International FORTWIHR Conference on HPSEC", 8; H.J. Bungartz, F. Durst, C. Zenger (Hrg.); Springer, 1999, (eingeladen), ISBN: 3-540-65730-4, S. 291 - 308. https://doi.org/10.1007/978-3-642-60155-2_25

6.  Wasshuber, C., Kosina, H., Selberherr, S.:
"Single-Electron Memories with Terabit Capacity and Beyond";
in: "Future Trends in Microelectronics", S. Luryi, J. Xu, A. Zaslavsky (Hrg.); John Wiley & Sons, 1999, (eingeladen), ISBN: 0-471-32183-4, S. 313 - 322.

5.  Selberherr, S., Fischer, C., Halama, S., Pichler, C., Rieger, G., Schrom, G., Simlinger, T.:
"Device Structures and Device Simulation Techniques";
in: "Low-Power HF Microelectronics", A.S. Machado (Hrg.); The Institution of Electrical Engineers, 1996, (eingeladen), ISBN: 0-85296-874-4, S. 57 - 83. https://doi.org/10.1049/PBCS008E_ch2

4.  Langer, E., Selberherr, S.:
"Prozeßsimulation: Stand der Technik";
in: "Festkörperprobleme 36", R. Helbig (Hrg.); Vieweg, 1996, (eingeladen), ISBN: 3-528-08043-4, S. 203 - 243.

3.  Kosina, H., Wimmer, K., Fischer, C., Selberherr, S.:
"Simulation of ULSI Processes and Devices";
in: "Computer Aided Innovation of New Materials", M. Doyama et al. (Hrg.); North Holland Publishing Company, 1991, (eingeladen), ISBN: 0-444-88864-0, S. 723 - 728.

2.  Selberherr, S.:
"On Modeling MOS-Devices";
in: "Process and Device Modeling", W.L. Engl (Hrg.); North Holland Publishing Company, 1986, (eingeladen), ISBN: 0-444-87891-2, S. 265 - 299.

1.  Selberherr, S., Schütz, A., Pötzl, H.:
"Two-Dimensional MOS-Transistor Modeling";
in: "Process and Device Simulation for MOS-VLSI Circuits", P. Antognetti, D. Antoniadis, R.W. Dutton, W.G. Oldham (Hrg.); Martinus Nijhoff, 1983, (eingeladen), ISBN: 90-247-2824-x, S. 490 - 581.