We’re proud to announce that Bernhard Stampfer won the Best Student Paper Award at IIRW 2019 (IEEE International Integrated Reliability Workshop) in Lake Tahoe for his paper “Statistical Characterization of BTI and RTN using pMOS Arrays”.
We’re proud to announce that Bernhard Stampfer won the Best Student Paper Award at IIRW 2019 (IEEE International Integrated Reliability Workshop) in Lake Tahoe for his paper “Statistical Characterization of BTI and RTN using pMOS Arrays”.