We’re proud to announce that Markus Jech won the Best Student Paper Award at IEDM 2019 (IEEE International Electron Devices Meeting) in San Francisco for his paper “First-Principles Parameter-Free Modeling of n- and p-FET Hot-Carrier Degradation”.
We’re proud to announce that Markus Jech won the Best Student Paper Award at IEDM 2019 (IEEE International Electron Devices Meeting) in San Francisco for his paper “First-Principles Parameter-Free Modeling of n- and p-FET Hot-Carrier Degradation”.