Best Reliability Paper

Best Reliability Paper at IPFA 2021

We’re proud to announce that Johannes Ender won the Best Reliability Paper Award at IPFA 2021 (International Symposium on the Physical and Failure Analysis of Integrated Circuits) for his paper “Reinforcement Learning to Reduce Failures in SOT-MRAM Switching” with co-authors Roberto Orio, Simone Fiorentini, Siegfried Selberherr, Wolfgang Goes, and Viktor Sverdlov. The research was conducted within the scope of the Christian Doppler Laboratory for  Nonvolatile Magnetoresistive Memory and Logic in collaboration with Silvaco, Inc.