Publications Raffaele Alberto Coppeta
5 records
| 1. | R. Coppeta, D. Holec, H. Ceric, T. Grasser: "Evaluation of Dislocation Energy in Thin Films"; Philosophical Magazine, 95, (2015), 186 - 209 doi:10.1080/14786435.2014.994573. BibTeX |
| 1. | R. Coppeta, A. Lahlalia, D. Kozic, R. Hammer, J. Riedler, G. Toschkoff, A.P. Singulani, Z. Ali, M. Sagmeister, S. Carniello, S. Selberherr, L. Filipovic: "Electro-Thermal-Mechanical Modeling of Gas Sensor Hotplates"; in "Sensor Systems Simulations", W. van Driel, O. Pyper, C. Schumann (ed); Springer International Publishing, 2020, ISBN: 978-3-030-16577-2, 17 - 72 doi:10.1007/978-3-030-16577-2_2. BibTeX |
| 2. | R. Coppeta, H. Ceric, D. Holec, T. Grasser: "Critical thickness for GaN thin film on AlN substrate"; Talk: IEEE International Reliability Workshop (IIRW), South Lake Tahoe, USA; 2013-10-13 - 2013-10-17; in "Final Report of the IEEE International Integrated Reliability Workshop (IIRW)", (2013), ISBN: 978-1-4799-0350-4, 133 - 136. BibTeX |
| 1. | R. Coppeta, H. Ceric, B. Karunamurthy, T. Grasser: "Epitaxial Volmer-Weber Growth Modelling"; Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Glasgow, Scotland, United Kingdom; 2013-09-03 - 2013-09-05; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2013), ISBN: 978-1-4673-5733-3, 45 - 48 doi:10.1109/SISPAD.2013.6650570. BibTeX |
| 1. | R. Coppeta: "Dislocation Modeling in III-Nitrides"; Reviewer: T. Grasser, A. Köck; Institut für Mikroelektronik, 2015, oral examination: 2016-06-15 doi:10.34726/hss.2015.30571. BibTeX |