We are proud to announce that our paper, „Electrically stimulated optical spectroscopy of interface defects in wide-bandgap field-effect transistors“ has been selected as “Editors’ Choice 2023” by the editorial board and editorial team of Communications Engineering.

In this study, our research focused on detecting and characterizing interfacial point defects that form in a MOSFET between the semiconductor and the insulator. Previous methods for detecting such defects are typically electrical only, but this study shows that field-effect stimulated optical spectroscopy offers new possibilities to study these defects. By analyzing emitted photons from the semiconductor-insulator interface, we can gain greater insight into the behavior and nature of interface defects. This work represents a significant step forward in device characterization.

This work has been performed in cooperation with Infineon Technologies AG, Germany, and contribution from our colleagues Christian Schleich, Aleksandr Vasilev, Dominic Waldhör, Michael Waltl and Tibor Grasser.