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Projects
Principal Investigator
'Christian Doppler Labor' for Integrated Devices
Siegfried Selberherr
Advanced Developments for 0.25µm CMOS Technologies
Manufacturable Power MMICs for Microwave Systems Applications
Advanced Developments for 0.25µm CMOS Technologies II
Submicron Silicon Technology Amalgamating and Invigorating Network
Michael Hackel
Process Optimisation in Multiple Dimensions for Semiconductor Technology
Submicron Silicon Technology Amalgamating and Invigorating Network
Advanced Developments for CMOS for 0.25µm and Below
Process Optimisation in Multiple Dimensions for Semiconductor Technology II
Efficient Stochastic Algorithms for Semiconductor Device Modeling
Hans Kosina
Christian Doppler Laboratory for Integrated Devices
Siegfried Selberherr
Meshes and Global Integration for Semiconductor Front-End Simulation
Simulation of Si-Ge Heterojunction Bipolar Transistors
Siegfried Selberherr
Nanotechnology Computer Aided Design
User Group for Process Simulation European Research + Device Simulation
Multi-Level Simulation for Interconnect Characterization and Optimisation
New 25nm Multi-Gate Fully Depleted Silicon Transistors
Mathematical Models for Nanoscale Semiconductor Device Engineering
Clemens Heitzinger
Thematic Network on Silicon on Insulator Technology, Devices and Circuits
Silicon-Based Nanodevices
Process Management and Design System for Microsystem Technologies
Modeling of Nanoelectronic Semiconductor Devices
Hans Kosina
Ion Implantation for SiGe Semiconductor Technology
Andreas Hössinger
Modeling and Simulation of Organic Semiconductors
Hans Kosina
Top Amplifier Research Groups in a European Team
Strategic User Group for European Research on TCAD
Pulling the Limits of NanoCMOS Electronics
Electromigration Simulation
Siegfried Selberherr
Disposable Dot Field Effect Transistor for High Speed Si Integrated Circuits
Device Electronics Based on NanoWires and NanoTubes
Hans Kosina
Higher Order Macroscopic Transport Models
Tibor Grasser
Electron Mobility Enhancement in Strained Silicon
Siegfried Selberherr
Mesh Generation, Error Estimation, and Adaptation
Siegfried Selberherr
Automotive Tested High-Voltage Embedded Non-Volatile Memory Integrated SoC
Christian Doppler Laboratory for Technology CAD in Microelectronics
Tibor Grasser
Advanced Thermoelectric Nanostructures
Hans Kosina
Modeling and Design of Reliable, Process Variation-Aware Nanoelectronic Devices, Circuits and Systems
CAD of Semiconductor Nanodevices
Hans Kosina
Simulation of Advanced Semiconductor Devices
Vassil Palankovski
Chip-On-Chip Technology to Open New Applications
Electrical and Optoelectrical Graphene Devices
Hans Kosina
Wigner-Boltzmann Particle Simulations
Mihail Nedjalkov
Nano-Structured High-Efficiency Thermo-Electric Converters
Microscopic Modeling of the Negative Bias Temperature Instability
Tibor Grasser
Theory and Modelling of IR Optical Devices
Hans Kosina
Next Generation Framework for Quantum Transport Simulation
Hans Kosina
Modelling of the Reliability and Degradation of Next Generation Nanoelectronic Devices
Void Evolution due to Electromigration
Siegfried Selberherr
Nanowire Heterojunction Devices
Hans Kosina
Circuit Stability Under Process Variability and Electro-Thermal-Mechanical Coupling
Modeling Silicon Spintronics
Siegfried Selberherr
Deterministic Solution of the Boltzmann Equation for Device Reliability Investigations
Tibor Grasser
Centre of Excellence for Mathematical Modeling and Advanced Computing
Efficient Thermoelectrics Based on Silicon Nanomeshes
Hans Kosina
Christian Doppler Laboratory for Reliability Issues in Microelectronics
Hajdin Ceric
Modelling Reliability under Variability
Comprehensive Physical Modeling of Hot-Carrier Induced Degradation
Tibor Grasser
Automotive Tested High Voltage and Embedded Non-Volatile Integrated System on Chip Platform Employing 3D Integration
Non-Volatile Magnetic Flip Flop
Siegfried Selberherr
Single-Trap Characterization Methodology for Nanoscale MOSFETs
Tibor Grasser
Modeling of Radiation Effects in Flash Memories
Hans Kosina
Stability Under Process Variability for Advanced Interconnects and Devices Beyond 7nm node
High Performance Quantum Transport Solver Using Modular Supercomputing
Hans Kosina
Reliability of Transition Metal Dichalcogenide Field Effect Transistors
Tibor Grasser
Wigner State Control for Entangled Electronics
Mihail Nedjalkov
3D Solution of the Boltzmann Equation on Supercomputers
Karl Rupp
Innovative Communication Electronics for Aircraft Engines
Michael Waltl
Christian Doppler Laboratory for High Performance TCAD
Josef Weinbub
Innovative Networks for Networked Aircraft Subsystems
Michael Waltl
Process-Aware Structure Emulation for Device-Technology Co-Optimization
Lado Filipovic
Christian Doppler Laboratory for High Performance TCAD
Josef Weinbub
Defect-Based Modeling of SiC Devices
Tibor Grasser
Numerical Constraints for the Wigner and the Sigma Equation
Hans Kosina
Ultimate Scaling and Performance Potential of MoS2 FETs
Tibor Grasser
Modeling Unconventional Nanoscaled Device FABrication
Tibor Grasser
Nanoelectronic Device Simulation
Hans Kosina