| Agency | Projects | Principal Investigator |
|---|
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'Christian Doppler Labor' for Integrated Devices |
Siegfried Selberherr |
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Advanced Developments for 0.25µm CMOS Technologies |
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Manufacturable Power MMICs for Microwave Systems Applications |
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Advanced Developments for 0.25µm CMOS Technologies II |
|
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Submicron Silicon Technology Amalgamating and Invigorating Network |
Michael Hackel |
|
Process Optimisation in Multiple Dimensions for Semiconductor Technology |
|
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Submicron Silicon Technology Amalgamating and Invigorating Network |
|
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Advanced Developments for CMOS for 0.25µm and Below |
|
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Process Optimisation in Multiple Dimensions for Semiconductor Technology II |
|
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Efficient Stochastic Algorithms for Semiconductor Device Modeling |
Hans Kosina |
|
Christian Doppler Laboratory for Integrated Devices |
Siegfried Selberherr |
 |
Meshes and Global Integration for Semiconductor Front-End Simulation |
|
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Simulation of Si-Ge Heterojunction Bipolar Transistors |
Siegfried Selberherr |
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Nanotechnology Computer Aided Design |
|
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User Group for Process Simulation European Research + Device Simulation |
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Multi-Level Simulation for Interconnect Characterization and Optimisation |
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New 25nm Multi-Gate Fully Depleted Silicon Transistors |
|
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Mathematical Models for Nanoscale Semiconductor Device Engineering |
Clemens Heitzinger |
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Thematic Network on Silicon on Insulator Technology, Devices and Circuits |
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Silicon-Based Nanodevices |
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Process Management and Design System for Microsystem Technologies |
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Modeling of Nanoelectronic Semiconductor Devices |
Hans Kosina |
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Ion Implantation for SiGe Semiconductor Technology |
Andreas Hössinger |
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Modeling and Simulation of Organic Semiconductors |
Hans Kosina |
|
Top Amplifier Research Groups in a European Team |
|
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Strategic User Group for European Research on TCAD |
|
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Pulling the Limits of NanoCMOS Electronics |
|
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Electromigration Simulation |
Siegfried Selberherr |
|
Disposable Dot Field Effect Transistor for High Speed Si Integrated Circuits |
|
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Device Electronics Based on NanoWires and NanoTubes |
Hans Kosina |
|
Higher Order Macroscopic Transport Models |
Tibor Grasser |
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Electron Mobility Enhancement in Strained Silicon |
Siegfried Selberherr |
|
Mesh Generation, Error Estimation, and Adaptation |
Siegfried Selberherr |
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Automotive Tested High-Voltage Embedded Non-Volatile Memory Integrated SoC |
|
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Christian Doppler Laboratory for Technology CAD in Microelectronics |
Tibor Grasser |
 |
Advanced Thermoelectric Nanostructures |
Hans Kosina |
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Modeling and Design of Reliable, Process Variation-Aware Nanoelectronic Devices, Circuits and Systems |
|
|
CAD of Semiconductor Nanodevices |
Hans Kosina |
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Simulation of Advanced Semiconductor Devices |
Vassil Palankovski |
 |
Chip-On-Chip Technology to Open New Applications |
|
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Electrical and Optoelectrical Graphene Devices |
Hans Kosina |
|
Wigner-Boltzmann Particle Simulations |
Mihail Nedjalkov |
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Nano-Structured High-Efficiency Thermo-Electric Converters |
|
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Microscopic Modeling of the Negative Bias Temperature Instability |
Tibor Grasser |
|
Theory and Modelling of IR Optical Devices |
Hans Kosina |
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Next Generation Framework for Quantum Transport Simulation |
Hans Kosina |
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Modelling of the Reliability and Degradation of Next Generation Nanoelectronic Devices |
|
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Void Evolution due to Electromigration |
Siegfried Selberherr |
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Nanowire Heterojunction Devices |
Hans Kosina |
|
Circuit Stability Under Process Variability and Electro-Thermal-Mechanical Coupling |
|
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Modeling Silicon Spintronics |
Siegfried Selberherr |
|
Deterministic Solution of the Boltzmann Equation for Device Reliability Investigations |
Tibor Grasser |
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Centre of Excellence for Mathematical Modeling and Advanced Computing |
|
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Efficient Thermoelectrics Based on Silicon Nanomeshes |
Hans Kosina |
 |
Christian Doppler Laboratory for Reliability Issues in Microelectronics |
Hajdin Ceric |
|
Modelling Reliability under Variability |
|
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Comprehensive Physical Modeling of Hot-Carrier Induced Degradation |
Tibor Grasser |
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Automotive Tested High Voltage and Embedded Non-Volatile Integrated System on Chip Platform Employing 3D Integration |
|
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Non-Volatile Magnetic Flip Flop |
Siegfried Selberherr |
|
Single-Trap Characterization Methodology for Nanoscale MOSFETs |
Tibor Grasser |
|
Modeling of Radiation Effects in Flash Memories |
Hans Kosina |
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Stability Under Process Variability for Advanced Interconnects and Devices Beyond 7nm node |
|
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High Performance Quantum Transport Solver Using Modular Supercomputing |
Hans Kosina |
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Reliability of Transition Metal Dichalcogenide Field Effect Transistors |
Tibor Grasser |
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Wigner State Control for Entangled Electronics |
Mihail Nedjalkov |
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3D Solution of the Boltzmann Equation on Supercomputers |
Karl Rupp |
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Innovative Communication Electronics for Aircraft Engines |
Michael Waltl |
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Christian Doppler Laboratory for High Performance TCAD |
Josef Weinbub |
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Innovative Networks for Networked Aircraft Subsystems |
Michael Waltl |
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Process-Aware Structure Emulation for Device-Technology Co-Optimization |
Lado Filipovic |
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Christian Doppler Laboratory for High Performance TCAD |
Josef Weinbub |
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Defect-Based Modeling of SiC Devices |
Tibor Grasser |
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Numerical Constraints for the Wigner and the Sigma Equation |
Hans Kosina |
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Ultimate Scaling and Performance Potential of MoS2 FETs |
Tibor Grasser |
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Modeling Unconventional Nanoscaled Device FABrication |
Tibor Grasser |
|
Nanoelectronic Device Simulation |
Hans Kosina |
