Erasmus Langer
Siegfried Selberherr
 
Elaf Al-Ani
Tesfaye Ayalew
Hajdin Ceric
Martin Della-Mea 
Siddhartha Dhar
Robert Entner 
Andreas Gehring 
Klaus-Tibor Grasser 
René Heinzl 
Clemens Heitzinger
Christian Hollauer
Stefan Holzer
Andreas Hössinger 
Gerhard Karlowatz 
Robert Kosik 
Hans Kosina 
Alexandre Nentchev
Vassil Palankovski
Mahdi Pourfath 
Philipp Schwaha
Alireza Sheikoleslami 
Viktor Sverdlov 
Stephan Enzo Ungersböck 
Stephan Wagner 
Wilfried Wessner
Robert Wittmann 

 

   
 

Philipp Schwaha
Dipl.-Ing.
schwaha(!at)iue.tuwien.ac.at
Biography:
Philipp Schwaha was born in Vienna, Austria, in 1977. He studied electrical engineering at the Technische Universität Wien where he received the degree Diplomingenieur in 2004. He joined the Institute for Microelectronics in June 2004, where he is currently working on his doctoral degree. His research activities include circuit and device simulation, device modeling, and software development.

Higher Order Moment Transport Models with Quantum Corrections

With the continuing reduction of the minimum feature size of semiconductor devices, the models used for simulations of these devices need to be updated and implemented. These updates include quantum corrections as well as models considering moments of higher order. Quantum corrections become increasingly important as the dimensions of the device approach the mean free path length of the electrons within the semiconductor, leading to quantization of the electrons' states. This has a profound influence on the density of states and on thereby the distribution of charge within the device. This is especially true for the lateral direction in the channel region but will also become important in the transversal direction as gate lengths are further reduced. Boltzmann's transport equation, the starting point for the derivation of the drift diffusion transport model, is no longer capable of giving satisfactory results under these conditions. Wigner's equation represents an attempt to cope with the effects encountered in these scaled devices. This method proposes to yield relatively simple macroscopic models capable of describing the electron transport within nanometer scale devices.

Beginning at about three hundred nanometers drift diffusion models predict less current than is actually encountered in devices. Energy transport and hydro-dynamic models continue to provide useful results down to a size of about one hundred nanometers, but then the calculated current starts to deviate from measured data. A model using six moments promises to remain accurate down to at least thirty nanometers.



Mobility distribution in a
simplified 25nm bulk-MOSFET
   
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