Publications Robert Entner
17 recordsPublications in Scientific Journals
2. | Entner, R., Grasser, T., Triebl, O., Enichlmair, H., Minixhofer, R. (2007). Negative Bias Temperature Instability Modeling for High-Voltage Oxides at Different Stress Temperatures. Microelectronics Reliability, 47(4–5), 697–699. (reposiTUm) | |
1. | Karner, M., Gehring, A., Wagner, M., Entner, R., Holzer, S., Goes, W., Vasicek, M., Grasser, T., Kosina, H., Selberherr, S. (2007). VSP - A Gate Stack Analyzer. Microelectronics Reliability, 47(4–5), 704–708. https://doi.org/10.1016/j.microrel.2007.01.059 (reposiTUm) | |
Talks and Poster Presentations (with Proceedings-Entry)
10. | Entner, R., Grasser, T., Enichlmair, H., Minixhofer, R. (2006). Influence of Interface and Oxide Traps on Negative Bias Temperature Instability. In Abstracts IEEE 2006 Silicon Nanoelectronics Workshop (pp. 163–164), Honolulu. (reposiTUm) | |
9. | Entner, R., Grasser, T., Enichlmair, H., Minixhofer, R. (2006). Investigation of NBTI Recovery During Measurement. In San Francisco 2006 MRS Meeting Abstracts (pp. 110–111), San Francisco. (reposiTUm) | |
8. | Entner, R., Grasser, T., Enichlmair, H., Minixhofer, R. (2006). Negative Bias Temperature Instability Modeling for High-Voltage Oxides at Different Stress Temperatures. In WODIM 2006 14th Workshop on Dielectrics in Microelectronics Workshop Programme and Abstracts (pp. 96–97), Catania. (reposiTUm) | |
7. | T. Grasser, R. Entner, O. Triebl, H. Enichlmair: "TCAD Modeling of Negative Bias Temperature Instability"; Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Monterey, CA, USA; 2006-09-06 - 2006-09-08; in: "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2006), ISBN: 1-4244-0404-5; 330 - 333. https://doi.org/10.1109/SISPAD.2006.282902 | |
6. | Karner, M., Gehring, A., Wagner, M., Entner, R., Holzer, S., Gös, W., Vasicek, M., Grasser, T., Kosina, H., Selberherr, S. (2006). VSP-A Gate Stack Analyzer. In WODIM 2006 14th Workshop on Dielectrics in Microelectronics Workshop Program and Abstracts (pp. 101–102), Catania. (reposiTUm) | |
5. | Entner, R., Gehring, A., Kosina, H., Grasser, T., Selberherr, S. (2005). Impact of Multi-Trap Assisted Tunneling on Gate Leakage of CMOS Memory Devices. In NSTI Nanotech Technical Proceedings (pp. 45–48), Anaheim, Austria. (reposiTUm) | |
4. | Entner, R., Gehring, A., Kosina, H., Grasser, T., Selberherr, S. (2005). Modeling of Tunneling Currents for Highly Degraded CMOS Devices. In 2005 International Conference On Simulation of Semiconductor Processes and Devices, Tokyo, Japan. https://doi.org/10.1109/sispad.2005.201512 (reposiTUm) | |
3. | Holzer, S., Hollauer, C., Ceric, H., Wagner, S., Entner, R., Langer, E., Grasser, T., Selberherr, S. (2005). Three-Dimensional Transient Electro-Thermal Interconnect Simulation for Stress and Electromigration Analysis. In NSTI Nanotech Technical Proceedings (pp. 620–623), Anaheim, Austria. (reposiTUm) | |
2. | R. Entner, A. Gehring, T. Grasser, S. Selberherr: "A Comparison of Quantum Correction Models for the Three-Dimensional Simulation of FinFET Structures"; Poster: International Spring Seminar on Electronics Technology (ISSE), Sofia; 2004-05-13 - 2004-05-16; in: "Proceedings IEEE International Spring Seminar on Electronics Technology 27th ISSE 2004", IEEE, 1 (2004), ISBN: 0-7803-8422-9; 114 - 117. | |
1. | R. Kosik, T. Grasser, R. Entner, K. Dragosits: "On the Highest Order Moment Closure Problem"; Poster: International Spring Seminar on Electronics Technology (ISSE), Sofia; 2004-05-13 - 2004-05-16; in: "Proceedings IEEE International Spring Seminar on Electronics Technology 27th ISSE 2004", IEEE, 1 (2004), ISBN: 0-7803-8422-9; 118 - 120. | |
Doctor's Theses (authored and supervised)
1. | R. Entner: "Modeling and Simulation of Negative Bias Temperature Instability"; Supervisor, Reviewer: T. Grasser, G. Magerl; Institut für Mikroelektronik, 2007; oral examination: 2007-08-13. https://doi.org/10.34726/hss.2007.10123 | |
Diploma and Master Theses (authored and supervised)
1. | Entner, R. (2003). Three-Dimensional Device Simulation With Minimos-Nt Using the Wafer-State-Server Technische Universität Wien. https://resolver.obvsg.at/urn:nbn:at:at-ubtuw:1-12227 (reposiTUm) | |
Scientific Reports
3. | Grasser, T., Gös, W., Triebl, O., Hehenberger, P. P., Wagner, P.-J., Schwaha, P., Heinzl, R., Holzer, S., Entner, R., Wagner, S., Schanovsky, F. (2007). 3 Year Report 2005-2007. (reposiTUm) | |
2. | Entner, R., Heinzl, R., Nentchev, A., Ungersböck, S. E., Wagner, M., Selberherr, S. (2006). VISTA Status Report December 2006. (reposiTUm) | |
1. | Entner, R., Heinzl, R., Hollauer, C., Sheikholeslami, A., Wittmann, R., Selberherr, S. (2005). VISTA Status Report June 2005. (reposiTUm) | |