Hajdin Ceric was born in Sarajevo, Bosnia and Herzegovina, in 1970. He studied electrical engineering at the Electrotechnical Faculty of the University of Sarajevo and the Technische Universität Wien, where he received the degree of Diplomingenieur in 2000. In 2005 he received his PhD in technical sciences and in 2015 his venia docendi (habilitation) in microelectronics from the Technische Universität Wien. He is currently an Associate Professor at the Institute for Microelectronics. His research interests include finite element method modeling and simulation in microelectronics, application of machine learning in computer numerics, atomistic modeling in material science, electromigration in metals, and mechanical reliability of metals and semiconductors. In 2010 he was appointed the head of the Christian Doppler Laboratory for Reliability Issues in Microelectronics with two participating industrial partners: ams AG and Infineon Technologies Austria AG. Dr. Ceric participated in several European Community and FFG projects. In his research, Dr. Ceric has been closely cooperating with a company SOITEC, France, and research center imec, Belgium. He is a reviewer for several American Institute of Physics, Elsevier, and IEEE journals.

Research Topics:

Interconnect Reliability
Mechanics of Microelectronics
Atomistic Modeling
Process Simulation