Lado Filipovic is an Assistant Professor (tenure-track) of Modeling and Simulation of Integrated Semiconductor Sensors at TU Wien. He obtained his venia docendi (habilitation) in Semiconductor Based Integrated Sensors and his doctoral degree (Dr.techn.) in Microelectronics from TU Wien in 2020 and 2012, respectively. He holds a Master’s degree in Applied Sciences (MASc.) from Carleton University in Ottawa, Canada, which he obtained in 2009. He has served as a reviewer for several DFG (DE) and EPSRC (UK) projects, has edited a book on Miniaturized Transistors, and has reviewed for many leading journals. He is a Senior Member of the IEEE and is an active member of the Technical Program Committee for outstanding IEEE sponsored conferences, such as IEEE Sensors, SISPAD, and IIRW. He has been a Principal Investigator in various research projects funded by, e.g., the EU FP7 and Horizon 2020 programs and the Austrian Research Promotion Agency (FFG). His primary research interest is studying the operation, stability, and reliability of novel semiconductor-based sensors using advanced process and device TCAD approaches. One of his research pillars is combining physical and empirical modeling approaches, specifically in process TCAD. With his team, he is actively investigating metal oxide semiconductors and two-dimensional materials, e.g., graphene, MoS₂, and phosphorene for the detection of environmental pollutants and biomarkers from exhaled breath.