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    Device Simulation and Transport
    Device Reliability
    Magnetic and Spin Devices
    2D Materials and Devices
    Semiconductor- and 2D-Based Sensors
    Process Simulation and Virtual Fab
    AI for Microelectronics
    Back-End-of-Line Reliability
    Device Characterization
    Atomistic Modeling
    Mechanics of Microelectronics
    Device Simulation and Transport
    Device Reliability
    Magnetic and Spin Devices
    2D Materials and Devices
    Semiconductor- and 2D-Based Sensors
    Process Simulation and Virtual Fab
    AI for Microelectronics
    Back-End-of-Line Reliability
    Device Characterization
    Atomistic Modeling
    Mechanics of Microelectronics

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      Institute for Microelectronics
      Head: Univ.Prof. Dipl.-Ing. Dr.techn. Tibor Grasser
      Deputy Head: Univ.Prof. Dipl.-Ing. Dr.techn. Michael Waltl
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      © E360 - Institute for Microelectronics 2018