An example of common recovery traces recorded on a pMOSFET is shown in Figure 10.3.
As long as the DUT contains only single emission events, which is the case for defects with , the TDDS data can be analyzed in a straight-forward manner. However, this is not the case for signals containing single defects producing RTN. As can be seen from Figure 10.3 (middle) the initially used step detection algorithm considers steps in one direction leading to a falsely extracted step height. The BCSUM algorithm detects all steps correctly by using just two