Papers in Conference Proceedings Papers in Journals and Books Edited Books Doctoral Theses Master's Theses Bachelor's Theses	Publications Link to the publication database of the Vienna University of Technology Papers in Conference Proceedings [V62] H. Ceric, R. Orio, J. Cervenka, S. Selberherr: "TCAD Solutions for Submicron Copper Interconnect"; Talk: International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), Singapore; 07-07-2008 - 07-11-2008; in: "Proceedings 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits", (2008), ISBN: 978-1-4244-2039-1; 78 - 81. [V61] W. Gös, M. Karner, V. Sverdlov, T. Grasser: "A Rigorous Model for Trapping and Detrapping in Thin Gate Dielectrics"; Talk: International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), Singapore; 07-07-2008 - 07-11-2008; in: "Proceedings 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits", (2008), ISBN: 978-1-4244-2039-1; 249 - 254. [V60] M. Pourfath, V. Sverdlov, H. Kosina: "On the Role of Off-Diagonal Dephasing in Carbon Nanotube Based Photo-Detectors"; Talk: 1st FoNE Conference Nanoelectronics 2008, Taormina, Italy; 06-29-2008 - 07-03-2008; in: "1st Fone Conference Nanoelectronics 2008", (2008), 41. [V59] S. Tyaginov, M. Vexler, A. El Hdiy, K. Gacem, V Zaporojtchenko: "Electrical Methods for Estimating the Correlation Length of Insulator Thickness Fluctuations in MIS Tunnel Structures"; Poster: Workshop on Dielectrics in Microelectronics (WODIM), Berlin; 06-23-2008 - 06-25-2008; in: "15st Workshop on Dielectrics in Microelectronics", (2008), 227 - 228. [V58] P. Schwaha, F. Stimpfl, R. Heinzl, S. Selberherr: "A Parallel Delaunay and Advancing Front Mesh Generation Approach"; Talk: Intl. Conf. on Numerical Geometry, Grid Generation and Scientific Computing (Numgrid), Moscow; 06-10-2008 - 06-13-2008; in: "Proceedings Intl. Conf. on Numerical Geometry, Grid Generation and Scientific Computing", (2008). [V57] F. Stimpfl, R. Heinzl, P. Schwaha, S. Selberherr: "A Delaunay Mesh Generation Approach without the Use of Convex Hulls"; Talk: Intl. Conf. on Numerical Geometry, Grid Generation and Scientific Computing (Numgrid), Moscow; 06-10-2008 - 06-13-2008; in: "Proceedings Intl. Conf.on Numerical Geometry, Grid Generation and Scientific Computing", (2008). [V56] R. Heinzl, P. Schwaha, F. Stimpfl, S. Selberherr: "A Parallel Generic Scientific Simulation Environment"; Talk: Workshop on State-of-the-Art in Scientific and Parallel Computing (PARA), Trondheim; 05-13-2008 - 05-16-2008; in: "Proceedings Intl. Workshop on State-of-the-Art in Scientific and Parallel Computing", (2008). [V55] P. Schwaha, R. Heinzl, F. Stimpfl, S. Selberherr: "Synergies in Scientific Computing by Combining Multi-Paradigmatic Languages"; Talk: Workshop on State-of-the-Art in Scientific and Parallel Computing (PARA), Trondheim; 05-13-2008 - 05-16-2008; in: "Proceedings Intl. Workshop on State-of-the-Art in Scientific and Parallel Computing", (2008). [V54] F. Stimpfl, R. Heinzl, P. Schwaha, S. Selberherr: "High Performance Parallel Mesh Generation and Adaptation"; Talk: Workshop on State-of-the-Art in Scientific and Parallel Computing (PARA), Trondheim; 05-13-2008 - 05-16-2008; in: "Proceedings Intl. Workshop on State-of-the-Art in Scientific and Parallel Computing", (2008). [V53] H. Ceric, R. Orio, S. Selberherr: "Comprehensive Modeling of Electromigration Induced Interconnect Degradation Mechanisms"; Talk: International Conference on Microelectronics (MIEL), Nis; 05-11-2008 - 05-14-2008; in: "Proceedings 26th International Conference on Microelectronics", (2008), ISBN: 978-1-4244-1881-7; 69 - 76. [V52] V. Sverdlov, S. Selberherr: "Strain-Controlled Valley Splitting in Si-SiGe Heterostructures"; Talk: International SiGe Technology and Device Meeting (ISTDM), Hsinchu; 05-11-2008 - 05-14-2008; in: "Abstract Book", (2008). [V51] M. Pourfath, S. Selberherr: "Current Transport in Carbon Nanotube Transistors"; Talk: International Caracas Conference on Devices, Circuits and Systems (ICCDCS), Cancun (invited); 04-28-2008 - 04-30-2008; in: "Proceedings of the 7th International Caribbean Conference on Devices, Circuits and Systems", (2008), ISBN: 978-1-4244-1957-9. [V50] M. Karner, O. Baumgartner, M. Pourfath, M. Vasicek, H. Kosina: "Investigation of a MOSCAP Using NEGF"; Talk: International Semiconductor Device Research Symposium (ISDRS), Maryland; 12-12-2007 - 12-14-2007; in: "2007 International Semiconductor Device Research Symposium", (2007), ISBN: 978-1-4244-1892-3; 2 pages. [V49] R. Orio, H. Ceric, S. Selberherr: "Strain-Induced Anisotropy of Electromigration in Copper Interconnect"; Talk: International Semiconductor Device Research Symposium (ISDRS), Maryland; 12-12-2007 - 12-14-2007; in: "2007 International Semiconductor Device Research Symposium", (2007), ISBN: 978-1-4244-1892-3; 2 pages. [V48] V. Sverdlov, G. Karlowatz, S. Dhar, H. Kosina, S. Selberherr: "Two-Band k⋅p Model for the Conduction Band in Silicon: Impact of Strain and Confinement on Band Structure and Mobility"; Talk: International Semiconductor Device Research Symposium (ISDRS), Maryland; 12-12-2007 - 12-14-2007; in: "2007 International Semiconductor Device Research Symposium", (2007), ISBN: 978-1-4244-1892-3; 2 pages. [V47] M. Vasicek, J. Cervenka, M. Wagner, M. Karner, T. Grasser: "A 2D-Non-Parabolic Six Moments Model"; Talk: International Semiconductor Device Research Symposium (ISDRS), Maryland; 12-12-2007 - 12-14-2007; in: "2007 International Semiconductor Device Research Symposium", (2007), ISBN: 978-1-4244-1892-3; 2 pages. [V46] S. Vitanov, V. Palankovski: "Normally-Off AlGaN/GaN HEMTs with InGaN Cap Layer: A Theoretical Study"; Poster: International Semiconductor Device Research Symposium (ISDRS), Maryland; 12-12-2007 - 12-14-2007; in: "2007 International Semiconductor Device Research Symposium", (2007), ISBN: 978-1-4244-1892-3; 2 pages. [V45] T. Grasser, B. Kaczer, P. Hehenberger, W. Goes, R. Connor, H. Reisinger, W. Gustin, C. Schlünder: "Simultaneous Extraction of Recoverable and Permanent Components Contributing to Bias-Temperature Instability"; Talk: International Electron Devices Meeting (IEDM), Washington, DC; 12-10-2007 - 12-12-2007; in: "International Electron Devices Meeting 2007", (2007), ISBN: 1-4244-1508-x; 801 - 804. [V44] M. Pourfath, H. Kosina, S. Selberherr: "The Effect of Inelastic Phonon Scattering on Carbon Nanotube-Based Transistor Performance"; Talk: International Symposium on Advanced Nanodevices and Nanotechnology (ISANN2007), Waikaloa, Hawaii; 12-02-2007 - 12-07-2007; in: "International Symposium on Advanced Nanodevices and Nanotechnology", (2007), 37 - 38. [V43] R. Heinzl, G. Mach, P. Schwaha, S. Selberherr: "Labtool - A Managing Software for Computer Courses"; Talk: The European Simulation and Modelling Conference (ESM), Malta; 10-24-2007 - 10-27-2007; in: "Proceedings European Simulation and Modeling Conference", (2007), ISBN: 978-90-77381-36-6; 488 - 492. [V42] R. Heinzl, G. Mach, P. Schwaha, S. Selberherr: "A Performance Test Platform"; Talk: The European Simulation and Modelling Conference (ESM), Malta; 10-22-2007 - 10-24-2007; in: "Proceedings European Simulation and Modeling Conference", (2007), ISBN: 978-90-77381-36-6; 483 - 487. [V41] P. Schwaha, R. Heinzl, G. Mach, C. Pogoreutz, S. Fister, S. Selberherr: "Electro-Biological Simulation using a Web Front-End"; Talk: The European Simulation and Modelling Conference (ESM), Malta; 10-22-2007 - 10-24-2007; in: "Proceedings European Simulation and Modeling Conference", (2007), ISBN: 978-90-77381-36-6; 493 - 495. [V40] F. Stimpfl, R. Heinzl, P. Schwaha, S. Selberherr: "A Multi-Mode Mesh Generation Approach for Scientific Computing"; Talk: The European Simulation and Modelling Conference (ESM), Malta; 10-22-2007 - 10-24-2007; in: "Proceedings European Simulation and Modeling Conference", (2007), ISBN: 978-90-77381-36-6; 506 - 513. [V39] V. Sverdlov, G. Karlowatz, H. Kosina, S. Selberherr: "Two-Band k⋅p Model for the Conduction Band in Silicon"; Talk: The European Simulation and Modelling Conference (ESM), Malta; 10-22-2007 - 10-24-2007; in: "Proceedings European Simulation and Modeling Conference", (2007), ISBN: 978-90-77381-36-6; 220 - 224. [V38] W. Goes, T. Grasser: "Charging and Discharging of Oxide Defects in Reliability Issues"; Talk: IEEE International Reliability Workshop (IIRW), Fallen Leaf Lake; 10-15-2007 - 10-18-2007; in: "2007 IEEE International Integrated Reliability Workshop Final Report", (2007), ISBN: 1-4244-1171-8; 27 - 32. [V37] T. Grasser, P.-J. Wagner, P. Hehenberger, W. Goes, B. Kaczer: "A Rigorous Study of Measurement Techniques for Negative Bias Temperature Instability"; Talk: IEEE International Reliability Workshop (IIRW), Fallen Leaf Lake; 10-15-2007 - 10-18-2007; in: "2007 IEEE International Integrated Reliability Workshop Final Report", (2007), ISBN: 1-4244-1171-8; 6 - 11. [V36] S. Vitanov, V. Palankovski, S. Murad, T. Rödle, R. Quay, S. Selberherr: "Predictive Simulation of AlGaN/GaN HEMTs"; Talk: IEEE Compound Semiconductor IC Symposium (CSICS), Portland; 10-14-2007 - 10-17-2007; in: "IEEE Compound Semiconductor Integrated Circuit Symposium Technical Digest 2007", (2007), ISBN: 1-4244-1022-3; 131 - 134. [V35] M. Nedjalkov, D. Vasileska: "Semi-Discrete 2D Wigner-Particle Approach"; Poster: International Workshop on Computational Electronics (IWCE), Amherst; 10-08-2007 - 10-10-2007; in: "12th International Workshop on Computational Electronics", (2007), 122 - 123. [V34] R. Orio, H. Ceric, S. Selberherr: "Effect of Strains on Anisotropic Material Transport in Copper Interconnect Structures under Electromigration Stress"; Poster: International Workshop on Computational Electronics (IWCE), Amherst; 10-08-2007 - 10-10-2007; in: "12th International Workshop on Computational Electronics", (2007), 62 - 63. [V33] V. Sverdlov, H. Kosina: "Electron Subband Dispersions in Ultra-Thin Silicon Films from a Two-Band k⋅p Theory"; Poster: International Workshop on Computational Electronics (IWCE), Amherst; 10-08-2007 - 10-10-2007; in: "12th International Workshop on Computational Electronics", (2007), 92 - 93. [V32] M. Vasicek, J. Cervenka, M. Karner, M. Wagner, T. Grasser: "Parameter Modeling for Higher-Order Transport Models in UTB SOI MOSFETs"; Poster: International Workshop on Computational Electronics (IWCE), Amherst; 10-08-2007 - 10-10-2007; in: "12th International Workshop on Computational Electronics", (2007), 96 - 97. [V31] V. Sverdlov, H. Kosina, S. Selberherr: "Comparative Analysis of Pseudo-Potential and Tight-Binding Band Structure Calculations with an Analytical Two-Band k⋅p Model: Conduction Band of Silicon"; Talk: International Conference Micro- and Nanoelectronics (ICMNE), Moscow-Zvenigorod; 10-01-2007 - 10-05-2007; in: "International Conference "Micro and Nanoelectronics - 2007" Book of Abstracts", (2007). [V30] H. Ceric, A. Nentchev, E. Langer, S. Selberherr: "Intrinsic Stress Build-Up During Volmer-Weber Crystal Growth"; Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Wien; 09-25-2007 - 09-27-2007; in: "International Conference on Simulation of Semiconductor Processes and Devices 2007", T. Grasser, S. Selberherr (ed.); Springer-Verlag Wien New York, 12 (2007), ISBN: 978-3-211-72860-4; 37 - 40. [V29] J. Cervenka, H. Ceric, O. Ertl, S. Selberherr: "Three-Dimensional Sacrificial Etching"; Poster: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Wien; 09-25-2007 - 09-27-2007; in: "International Conference on Simulation of Semiconductor Processes and Devices 2007", T. Grasser, S. Selberherr (ed.); Springer-Verlag Wien New York, 12 (2007), ISBN: 978-3-211-72860-4; 433 - 436. [V28] O. Ertl, C. Heitzinger, S. Selberherr: "Efficient Coupling of Monte Carlo and Level Set Methods for Topography Simulation"; Poster: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Wien; 09-25-2007 - 09-27-2007; in: "International Conference on Simulation of Semiconductor Processes and Devices 2007", T. Grasser, S. Selberherr (ed.); Springer-Verlag Wien New York, 12 (2007), ISBN: 978-3-211-72860-4; 417 - 420. [V27] W. Goes, T. Grasser: "First-Principles Investigation on Oxide Trapping"; Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Wien; 09-25-2007 - 09-27-2007; in: "International Conference on Simulation of Semiconductor Processes and Devices 2007", T. Grasser, S. Selberherr (ed.); Springer-Verlag Wien New York, 12 (2007), ISBN: 978-3-211-72860-4; 157 - 160. [V26] H. Kosina, O. Triebl, T. Grasser: "Box Method for the Convection-Diffusion Equation Based on Exponential Shape Functions"; Poster: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Wien; 09-25-2007 - 09-27-2007; in: "International Conference on Simulation of Semiconductor Processes and Devices 2007", T. Grasser, S. Selberherr (ed.); Springer-Verlag Wien New York, 12 (2007), ISBN: 978-3-211-72860-4; 317 - 320. [V25] L. Li, G. Meller, H. Kosina: "Charge Injection Model in Organic Light-Emitting Diodes based on a Master Equation"; Poster: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Wien; 09-25-2007 - 09-27-2007; in: "International Conference on Simulation of Semiconductor Processes and Devices 2007", T. Grasser, S. Selberherr (ed.); Springer-Verlag Wien New York, 12 (2007), ISBN: 978-3-211-72860-4; 377 - 380. [V24] G. Meller, L. Li, S. Holzer, H. Kosina: "Dynamic Monte Carlo Simulation of an Amorphous Organic Device"; Poster: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Wien; 09-25-2007 - 09-27-2007; in: "International Conference on Simulation of Semiconductor Processes and Devices 2007", T. Grasser, S. Selberherr (ed.); Springer-Verlag Wien New York, 12 (2007), ISBN: 978-3-211-72860-4; 373 - 376. [V23] A. Nentchev, S. Selberherr: "On the Magnetic Field Extraction for On-Chip Inductance Calculation"; Poster: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Wien; 09-25-2007 - 09-27-2007; in: "International Conference on Simulation of Semiconductor Processes and Devices 2007", T. Grasser, S. Selberherr (ed.); Springer-Verlag Wien New York, 12 (2007), ISBN: 978-3-211-72860-4; 349 - 352. [V22] M. Pourfath, H. Kosina: "The Effect of Optical Phonon Scattering on the On-Current and Gate Delay Time of CNT-FETs"; Poster: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Wien; 09-25-2007 - 09-27-2007; in: "International Conference on Simulation of Semiconductor Processes and Devices 2007", T. Grasser, S. Selberherr (ed.); Springer-Verlag Wien New York, 12 (2007), ISBN: 978-3-211-72860-4; 309 - 312. [V21] V. Sverdlov, G. Karlowatz, E. Ungersböck, H. Kosina: "Influence of Uniaxial [110] Stress on the Silicon Conduction Band Structure: Stress Dependence of the Nonparabolicity Parameter"; Poster: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Wien; 09-25-2007 - 09-27-2007; in: "International Conference on Simulation of Semiconductor Processes and Devices 2007", T. Grasser, S. Selberherr (ed.); Springer-Verlag Wien New York, 12 (2007), ISBN: 978-3-211-72860-4; 329 - 332. [V20] M. Vasicek, M. Karner, E. Ungersböck, M. Wagner, H. Kosina, T. Grasser: "Modeling of Macroscopic Transport Parameters in Inversion Layers"; Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Wien; 09-25-2007 - 09-27-2007; in: "International Conference on Simulation of Semiconductor Processes and Devices 2007", T. Grasser, S. Selberherr (ed.); Springer-Verlag Wien New York, 12 (2007), ISBN: 978-3-211-72860-4; 201 - 204. [V19] S. Vitanov, V. Palankovski, S. Murad, T. Rödle, R. Quay, S. Selberherr: "Hydrodynamic Modeling of AlGaN/GaN HEMTs"; Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Wien; 09-25-2007 - 09-27-2007; in: "International Conference on Simulation of Semiconductor Processes and Devices 2007", T. Grasser, S. Selberherr (ed.); Springer-Verlag Wien New York, 12 (2007), ISBN: 978-3-211-72860-4; 273 - 276. [V18] V. Sverdlov: "Enhancing Performance of Modern MOSFETs: Strain Engineering and Advanced Device Architectures"; Talk: International Conference Frontiers of Josephson Physics and Nanoscience (FJPN07), Palinuro, Italy; 09-23-2007 - 09-28-2007; in: "7th International Conference Frontiers of Josephson Physics and Nanoscience", (2007), 63 - 64. [V17] M. Nedjalkov, D. Vasileska, K. Raleva: "Thermal Relaxation of Non-Equilibrium Electrons in Nanowires"; Talk: Conference of the Society for Electronics, Telecommunications, Automatics, and Informatics (ETAI), Ohrid, Macedonia; 09-19-2007 - 09-21-2007; in: "8th Conference of the Society for Electronics, Telecommunications, Automatics, and Informatics (ETAI)", (2007). [V16] V. Sverdlov, H. Kosina, S. Selberherr: "Conduction Band in Silicon: Numerical Versus Analytical Two-Band k⋅p Model"; Talk: Conference of the Society for Electronics, Telecommunications, Automatics, and Informatics (ETAI), Ohrid, Macedonia; 09-19-2007 - 09-21-2007; in: "8th Conference of the Society for Electronics, Telecommunications, Automatics, and Informatics", (2007), 4 pages. [V15] T. Grasser, B. Kaczer: "Negative Bias Temperature Instability: Recoverable versus Permanent Degradation"; Talk: European Solid-State Device Research Conference (ESSDERC), München; 09-11-2007 - 09-13-2007; in: "European Solid-State Device Research Conference", (2007), ISBN: 1-4244-1124-6; 127 - 130. [V14] M. Pourfath, H. Kosina, S. Selberherr: "The Role of Inelastic Electron-Phonon Interaction on the On-Current and Gate Delay Time of CNT-FETs"; Talk: European Solid-State Device Research Conference (ESSDERC), München; 09-11-2007 - 09-13-2007; in: "European Solid-State Device Research Conference", (2007), ISBN: 1-4244-1123-8; 239 - 242. [V13] V. Sverdlov, E. Ungersböck, H. Kosina, S. Selberherr: "Effects of Shear Strain on the Conduction Band in Silicon: An Efficient Two-Band k⋅p Theory"; Talk: European Solid-State Device Research Conference (ESSDERC), München; 09-11-2007 - 09-13-2007; in: "European Solid-State Device Research Conference", (2007), ISBN: 1-4244-1124-6; 386 - 389. [V12] A. Nentchev, S. Selberherr: "Three-Dimensional On-Chip Inductance and Resistance Extraction"; Talk: Sociedade Brasileira da Microeltronica 2007 (SBCCI 2007), Rio de Janeiro; 09-03-2007 - 09-06-2007; in: "20th Symposium on Integrated Circuits and Systems Design", (2007), ISBN: 978-1-59593-910-4; 218 pages. [V11] R. Heinzl, P. Schwaha, S. Selberherr: "Modern Concepts for High-Perfomance Scientific Computing - Library Centric Application Design"; Talk: International Conference on Software and Data Technologies (ICSOFT), Barcelona; 07-22-2007 - 07-25-2007; in: "Proceedings of the 2nd ICSOFT 2007", (2007), ISBN: 978-989-8111-05-0; 100 - 107. [V10] P. Schwaha, M. Schwaha, R. Heinzl, E. Ungersböck, S. Selberherr: "Simulation Methodologies for Scientific Computing - Modern Application Design"; Talk: International Conference on Software and Data Technologies (ICSOFT), Barcelona; 07-22-2007 - 07-25-2007; in: "Proceedings of the 2nd ICSOFT 2007", (2007), ISBN: 978-989-8111-07-4; 270 - 276. [V9] V. Palankovski, M. Wagner, W. Heiss: "Monte Carlo Simulation of Electron Transport in PbTe"; Talk: International Conference on Narrow Gap Semiconductors, Guildford; 07-08-2007 - 07-12-2007; in: "The 13th International Conference on Narrow Gap Semiconductors", (2007), 50. [V8] S. Vitanov, V. Palankovski: "Monte Carlo Study of Transport Properties of InN"; Poster: International Conference on Narrow Gap Semiconductors, Guildford; 07-08-2007 - 07-12-2007; in: "The 13th International Conference on Narrow Gap Semiconductors", (2007), 99. [V7] V. Sverdlov, E. Ungersböck, H. Kosina: "Monte Carlo Algorithm for Mobility Calculations in Thin Body Field Effect Transistors: Role of Degeneracy and Intersubband Scattering"; Talk: International Conference on Large-Scale Scientific Computations (LSSC), Sozopol; 06-05-2007 - 06-09-2007; in: "6th International Conference on Large-Scale Scientific Computations", (2007), 62 - 63. [V6] H. Ceric, S. Selberherr: "Electromigration in Interconnect Structures of Microelectronic Circuits"; Talk: Microelectroncs, Electronics, and Electronic Technologies (MIPRO), Opatija (invited); 05-21-2007 - 05-25-2007; in: "Microelectronics, Electronics, and Electronic Technologies (MEET)", (2007), ISBN: 978-953-233-032-8; 23 - 28. [V5] C. Heitzinger, Ch. Ringhofer, S. Selberherr: "Investigations of the Potential Jump at the Surface of BioFETs Using a Multi-scale Model"; Talk: Meeting of the Electrochemical Society (ECS), Chicago; 05-06-2007 - 05-10-2007; in: "211th ECS Meeting", 0947 (2007), ISSN: 1091-8213. [V4] H. Ceric, E. Langer, S. Selberherr: "Modeling of Residual Stresses in Thin Metal Films"; Poster: International Workshop on Stress-Induced Phenomena in Metallization, Kyoto, Japan; 04-04-2007 - 04-06-2007; in: "9th International Workshop on Stress-Induced Phenomena in Metallization", (2007), 18. [V3] H. Ceric, E. Langer, S. Selberherr: "Three-Phase Model for the Volmer-Weber Crystal Growth"; Talk: Nanostructures and Carrier Interactions (NNCI), Atsugi, Japan; 02-20-2007 - 02-23-2007; in: "Nanostructures and Carrier Interactions", (2007), 127. [V2] V. Sverdlov, E. Ungersböck, H. Kosina: "Influence of Uniaxial [110] Stress on Silicon Band Structure and Electron Low-Field Mobility in Ultra-Thin Body SOIs"; Talk: Workshop of the Thematic Network on Silicon on Insulator Technology, Devices, and Circuits (EUROSOI), Leuven; 01-24-2007 - 01-26-2007; in: "EUROSOI 2007", (2007), 39 - 40. [V1] W. Grabinski, T. Grasser, G. Gildenblat, G.-J. Smit, M. Bucher, A. Aarts, A. Tajic, Y. S. Chauhan, A. Napieralski, T.A. Fjeldly, B. Iniguez, G. Iannaccone, M. Kayal, W. Posch, G. Wachutka, F. Prégaldiny, CH. Lallement, L. Lemaitre: "MOS-AK: Open Compact Modeling Forum"; Talk: International Workshop on Compact Modeling (IWCM), Pacifico Yokohama, Japan (invited); 01-23-2007; in: "The 4th International Workshop on Compact Modeling", (2007), 1 - 11. Papers in Journals and Books [P42] T. Grasser, W. Goes, B. Kaczer: "Dispersive Transport and Negative Bias Temperature Instability: Boundary Conditions, Initial Conditions, and Transport Models"; IEEE Transactions on Device and Materials Reliability (invited), 8 (2008), 1; 79 - 97. [P41] R. Orio, H. Ceric, S. Selberherr: "Effect of Strains on Anisotropic Material Transport in Copper Interconnect Structures under Electromigration Stress"; Journal of Computational Electronics, 7 (2008). [P40] M. Nedjalkov, H. Kosina, D. Vasileska: "Wigner Ensemble Monte Carlo: Challenges of 2D Nano-Device Simulation"; in: "Lecture Notes in Computer Science Vol. 4818", I. Lirkov, S. Margenov, J. Wasniewski (ed.); Springer-Verlag, Berlin-Heidelberg, 2008, ISBN: 978-80-86407-12-8, 139 - 147. [P39] M. Pourfath, H. Kosina: "Formalism Application of the Non-Equilibrium Green's Function for the Numerical Analysis of Carbon Nanotube FETs"; Journal of Computational and Theoretical Nanoscience, 5 (2008), 1128 - 1137. [P38] V. Palankovski, M. Wagner, W. Heiss: "Monte Carlo Simulation of Electron Transport in PbTe"; in: "Springer Proceedings in Physics, Vol. 119", Springer-Verlag, Wien - New York, 2008, ISBN: 13978-1-4020-8424-9, 77 - 79. [P37] K. Raleva, D. Vasileska, S.M. Goodnick, M. Nedjalkov: "Modeling Thermal Effects in Nanodevices"; IEEE Transactions on Electron Devices, 55 (2008), 6; 1306 - 1316. [P36] V. Sverdlov, E. Ungersböck, H. Kosina, S. Selberherr: "Current Transport Models for Nanoscale Semiconductor Devices"; Materials Science and Engineering R, 58 (2008), 6-7; 228 - 270. [P35] S. Vainshtein, V. Yuferev, V. Palankovski, D. Ong, J. Kostamovaara: "Negative Differential Mobility in GaAs at Ultrahigh Fields: Comparison between an Experiment and Simulations"; Applied Physics Letters, 92 (2008), 062114-1 - 062114-3. [P34] V. Sverdlov, E. Ungersböck, H. Kosina: "Monte Carlo Algorithm for Mobility Calculations in Thin Body Field Effect Transistors: Role of Degeneracy and Intersubband Scattering"; in: "Lecture Notes in Computer Science Vol. 4818", Springer-Verlag, Berlin-Heidelberg, 2008, ISBN: 978-80-86407-12-8, 157 - 164. [P33] M. Vasicek, J. Cervenka, M. Wagner, M. Karner, T. Grasser: "Parameter Modeling for Higher-Order Transport Models in UTB SOI MOSFETs"; Journal of Computational Electronics, 7 (2008). [P32] H. Kosina: "Nanoelectronic Device Simulation Based on the Wigner Function Formalism"; in: "Physics and Modeling of Tera- and Nano-Devices", World Scientific Publishing Co., Singapore, 2008, ISBN: 978-981-277-904-5, 31 - 40. [P31] S. Vitanov, V. Palankovski: "Monte Carlo Study of Electron Transport of InN"; in: "Springer Proceedings in Physics, Vol. 119", Springer-Verlag, Wien - New York, 2008, ISBN: 13978-1-4020-8424-9, 97 - 100. [P30] J. Cervenka, H. Ceric, S. Selberherr: "Three-Dimensional Simulation of Sacrificial Etching"; Microsystem Technologies, 14 (2007), 4-5; 665 - 671. [P29] H. Ceric, S. Selberherr: "Electromigration Modeling for Interconnect Structures in Microelectronics"; in: "Microelectronics Technology and Devices - SBMICRO 2007, Vol. 9 No. 1", issued by: The Electrochemical Society; ECS Transactions, 2007, ISBN: 978-1-56677-565-6, 295 - 304. [P28] R. Entner, T. Grasser, O. Triebl, H. Enichlmair, R. Minixhofer: "Negative Bias Temperature Instability Modeling for High-Voltage Oxides at Different Stress Temperatures"; Microelectronics Reliability, 47 (2007), 4-5; 697 - 699. [P27] T. Grasser, S. Selberherr: "Modeling of Negative Bias Temperature Instability"; Journal of Telecommunications and Information Technology (invited), 7 (2007), 2; 92 - 102. [P26] T.V. Gurov, E. Atanassov, M. Nedjalkov, I. Dimov: "Modeling of Carrier Transport in Nanowires"; in: "Lecture Notes in Computing Sciences Vol. 4487", Springer-Verlag, Berlin-Heidelberg, 2007, 739 - 746. [P25] R. Heinzl, M. Spevak, P. Schwaha, S. Selberherr: "A High Performance Generic Scientific Simulation Environment"; in: "Lecture Notes in Computer Science", issued by: B. Kaagström et al.; Springer, Berlin-Heidelberg, 2007, ISBN: 978-3-540-75754-2, 996 - 1005. [P24] C. Heitzinger, Ch. Ringhofer, S. Selberherr: "Finite Difference Solutions of the Nonlinear Schrödinger Equation and their Conservation of Physical Quantities"; Communications in Mathematical Sciences, 5 (2007), 4; 779 - 788. [P23] M. Pourfath, H. Kosina, S. Selberherr: "Carbon Nanotube Based Transistors: A Computational Study"; in: "28th International Conference on the Physics of Semiconductors", American Institute of Physics, 2007, ISBN: 978-0-7354-0397-0, 1041 - 1042. [P22] K. Riedling, S. Selberherr: "A Publication Database for Research Documentation and Performance Evaluation"; in: "Innovations 2007", International Network for Engineering Education and Research (iNEER), Arlington, VA, USA, 2007, ISBN: 978-0-9741252-6-8, 365 - 380. [P21] M. Spevak, R. Heinzl, P. Schwaha, S. Selberherr: "A Computational Framework for Topological Operations"; in: "Lecture Notes in Computer Science", issued by: B. Kaagström et al; Springer, Berlin-Heidelberg, 2007, ISBN: 978-3-540-75754-2, 781 - 790. [P20] H. Kosina: "Nanoelectronic Device Simulation Based on the Wigner Function Formalism"; International Journal of High Speed Electronics and Systems, 17 (2007), 3; 475 - 484. [P19] H. Kosina, S. Selberherr: "International Workshop on Computational Electronics (Editorial)"; Journal of Computational Electronics, 5 (2007), 283 - 284. [P18] T. Krishnamohan, C. Jungemann, D. Kim, E. Ungersböck, S. Selberherr, A.-T Pham, B. Meinerzhagen, P. Wong, Y. Nishida, K. Saraswat: "High Performance, Uniaxially-Strained, Silicon and Germanium, Double-Gate p-MOSFETs"; Microelectronic Engineering, 84 (2007), 2063 - 2066. [P17] V. Sverdlov, H. Kosina, T. Grasser, S. Selberherr: "Self-Consistent Wigner Monte Carlo Simulations of Current in Emerging Nanodevices: Role of Tunneling and Scattering"; in: "28th International Conference on the Physics of Semiconductors", American Institute of Physics, 2007, ISBN: 978-0-7354-0397-0, 1395 - 1396. [P16] V. Sverdlov, E. Ungersböck, H. Kosina: "Mobility Modeling in SOI FETs for Different Substrate Orientations and Strain Conditions"; in: "NATO Security through Science Series Vol. 2006", Springer-Verlag, Netherlands, 2007, ISBN: 978-1-4020-6378-7, 357 - 362. [P15] L. Li, G. Meller, H. Kosina: "Diffusion-Controlled Charge Injection Model for Organic Light-Emitting Diodes"; Applied Physics Letters, 91 (2007), 17; 1 - 3. [P14] M. Nedjalkov, D. Vasileska, I. Dimov, G. Arsov: "Mixed Initial-Boundary Value Problem in Particle Modeling of Microelectronic Devices"; Monte Carlo Methods and Applications, 13 (2007), 4; 299 - 331. [P13] M. Pourfath, H. Kosina: "The Effect of Phonon Scattering on the Switching Response of Carbon Nanotube Field-Effect Transistors"; Nanotechnology, 18 (2007), 424036 - 424041. [P12] E. Ungersböck, V. Sverdlov, H. Kosina, S. Selberherr: "Low-Field Mobility in Strained Silicon Inversion Layers and UTB MOSFETs for Different Substrate Orientations"; in: "28th International Conference on the Physics of Semiconductors", American Institute of Physics, 2007, ISBN: 978-0-7354-0397-0, 1389 - 1390. [P11] M. Pourfath, H. Kosina, S. Selberherr: "Geometry Optimization for Carbon Nanotube Transistors"; Solid-State Electronics, 51 (2007), 1565 - 1571. [P10] E. Sangiorgi, A. Asenov, H.S. Bennett, R.W. Dutton, D. Esseni, M. Giles, M. Hane, C. Jungemann, K. Nishi, S. Selberherr, S. Takagi: "Foreword Special Issue on Simulation and Modeling of Nanoelectronics Devices"; IEEE Transactions on Electron Devices, 54 (2007), 9; 2072 - 2078. [P9] G. Span, M. Wagner, T. Grasser, L. Holmgren: "Miniaturized TEG with Thermal Generation of Free Carriers"; Physica Status Solidi (RRL), 1 (2007), 6; 241 - 243. [P8] V. Sverdlov, E. Ungersböck, H. Kosina, S. Selberherr: "Volume Inversion Mobility in SOI MOSFETs for Different Thin Body Orientations"; Solid-State Electronics, 51 (2007), 299 - 305. [P7] S. Vitanov, M. Nedjalkov, V. Palankovski: "A Monte Carlo Model of Piezoelectric Scattering in GaN"; in: "Lecture Notes in Computer Science, Vol. 4310", Springer-Verlag, Berlin-Heidelberg, 2007, ISBN: 978-3-540-70940-4, 197 - 204. [P6] S. Vitanov, V. Palankovski, R. Quay, E. Langer: "Modeling of Electron Transport in GaN-Based Materials and Devices"; in: "AIP Conference Proceedings, Vol. 893", American Institute of Physics, 2007, ISBN: 978-0-7354-0397-0, 1399 - 1400. [P5] O. Triebl, T. Grasser: "Vector Discretization Schemes in Technology CAD Environments"; Romanian Journal of Information Science and Technology, 10 (2007), 2; 167 - 176. [P4] E. Ungersböck, S. Dhar, G. Karlowatz, V. Sverdlov, H. Kosina, S. Selberherr: "The Effect of General Strain on the Band Structure and Electron Mobility of Silicon"; IEEE Transactions on Electron Devices, 54 (2007), 9; 2183 - 2190. [P3] R. Wittmann, S. Selberherr: "A Study of Ion Implantation into Crystalline Germanium"; Solid-State Electronics, 51 (2007), 982 - 988. [P2] G. Meller, L. Li, S. Holzer, H. Kosina: "Simulation of Carrier Injection and Propagation in Molecularly Disordered Systems"; Optical and Quantum Electronics, 38 (2006), 12-14; 993 - 1004. [P1] V. Sverdlov, T. Grasser, H. Kosina, S. Selberherr: "Scattering and Space-Charge Effects in Wigner Monte Carlo Simulations of Single and Double Barrier Devices"; Journal of Computational Electronics, 5 (2006), 447 - 450. Edited Books [E2] T. Grasser, S. Selberherr (ed.): "Simulation of Semiconductor Processes and Devices 2007"; Springer-Verlag, Wien - New York, Wien, 2007, ISBN: 978-3-211-72860-4; 460 pages. [E1] R. Klima, S. Selberherr: "Programmieren in C, 2. Auflage"; Springer-Verlag, Wien - New York, Wien, 2007, ISBN: 978-3-211-72000-4; 366 pages. Doctoral Theses [T10] M. Spevak: "On the Specification and the Assembly of Discretized Differential Equations"; Reviewer: S. Selberherr, D. Praetorius; Institut für Mikroelektronik, 2008. [T9] L. Li: "Charge Transport in Organic Semiconductor Materials and Devices"; Reviewer: H. Kosina, D. Süss; Institut für Mikroelektronik, 2008. [T8] A. Nentchev: "Numerical Analysis and Simulation in Microelectronics by Vector Finite Elements"; Reviewer: S. Selberherr, H. Haas; Institut für Mikroelektronik, 2008. [T7] M. Wagner: "Simulation of Thermoelectric Devices"; Reviewer: T. Grasser, E. Bertagnolli; Institut für Mikroelektronik, 2007. [T6] R. Heinzl: "Concepts for Scientific Computing"; Reviewer: S. Selberherr, W. Purgathofer; Institut für Mikroelektronik, 2007. [T5] S. Dhar: "Analytical Mobility Models for Strained Silicon-Based Devices"; Reviewer: H. Kosina, G. Magerl; Institut für Mikroelektronik, 2007. [T4] R. Entner: "Modeling and Simulation of Negative Bias Temperature Instability"; Reviewer: T. Grasser, G. Magerl; Institut für Mikroelektronik, 2007. [T3] M. Pourfath: "Numeric Study of Quantum Transport in Carbon Nanotube-Based Transistors"; Reviewer: H. Kosina, E. Bertagnolli; Institut für Mikroelektronik, 2007. [T2] S. Holzer: "Optimization for Enhanced Thermal Technology CAD Purposes"; Reviewer: T. Grasser, H. Schichl; Institut für Mikroelektronik, 2007. [T1] H. Kim: "Design, Simulation and Fabrication of Micro/Nano Functional Structures using ION Beams"; Reviewer: G. Hobler, H. Kosina; Institut für Festkörperelektronik, 2007. Master's Theses [D1] F. Schanovsky: "Dispersive Transport Modeling within the Multiple Trapping Framework"; Supervisor: T. Grasser; Institut für Mikroelektronik, 2008; final examination: 03-14-2008. Bachelor's Theses [B4] A. Winkelbauer : "Die diskrete Cosinustransformation"; Institut für Mikroelektronik, 2008. [B3] S. Schöfegger: "Numerische Verfahren zum Lösen der Matrixexponentialfunktion"; Institut für Mikroelektronik, 2008. [B2] T. Bigler: "Simulation der Navier-Stokes-Gleichungen zur Visualisierung von Flüssigkeitsströmungen "; Institut für Mikroelektronik, 2008. [B1] J. Greil: "Numerisches Lösen der 2D-Poisson Gleichung auf einem rechteckigen Gebiet mit Inhomogenitäten mittels Finite Differenzen"; Institut für Mikroelektronik, 2007.
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