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Publication list for members of
E360 - Institute for Microelectronics
as any persons named in the publication record
2089 records
| 2089. | F. Rodrigues, L.F. Aguinsky, A. Hössinger, J. Weinbub: "3D Feature-Scale Modeling of Highly Selective Fluorocarbon Plasma Etching"; Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD 2022), Granada, Spain; 06.09.2022 - 08.09.2022; in "SISPAD 2022: International Conference on Simulation of Semiconductor Processes and Devices - Conference Abstract Booklet", (2022), 32 - 33. BibTeX |
| 2088. | L. Filipovic: "A Broadly-Applicable Ensemble Monte Carlo Framework"; Talk: Workshop Monte Carlo Simulation: Beyond Moore's LAW, International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Spain; (invited) 05.09.2022. BibTeX |
| 2087. | L. Cvitkovich, D. Waldhör, A.-M. El-Sayed, M. Jech, C. Wilhelmer, T. Grasser: "Ab-Initio Modeling of the Initial Stages of Si(100) Thermal Oxidation"; Poster: Psi-K Conference (Psi-K) 2022, Lausanne, Schwitzerland; 22.08.2022 - 25.08.2022; in "PSI-K 2022: abstracts book", (2022), 209. BibTeX |
| 2086. | C. Wilhelmer, D. Waldhör, M. Jech, A.-M. El-Sayed, L. Cvitkovich, M. Waltl, T. Grasser: "Ab-Initio Study of Multi-State Defects in Amorphous SiO2"; Talk: Psi-K Conference (Psi-K) 2022, Lausanne, Schwitzerland; 22.08.2022 - 25.08.2022; in "PSI-K 2022: abstracts book", (2022), 264. BibTeX |
| 2085. | S. Selberherr, V. Sverdlov: "About Electron Transport and Spin Control in Semiconductor Devices"; Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD 2022), Granada, Spain; (invited) 06.09.2022 - 08.09.2022; in "SISPAD 2022: International Conference on Simulation of Semiconductor Processes and Devices - Conference Abstract Booklet", (2022), 1 - 4. BibTeX |
| 2084. | R. Orio, J. Ender, W. Goes, S. Fiorentini, S. Selberherr, V. Sverdlov: "About the Switching Energy of a Magnetic Tunnel Junction determined by Spin-Orbit Torque and Voltage-Controlled Magnetic Anisotropy"; Talk: 2022 IEEE Latin American Electron Devices Conference (LAEDC), Puebla, Mexico; 04.06.2022 - 06.06.2022; in "2022 IEEE Latin American Electron Devices Conference (LAEDC)", (2022), ISBN: 978-1-6654-9768-8, 1 - 4 doi:10.1109/LAEDC54796.2022.9908222. BibTeX |
| 2083. | C. Lenz, P. Manstetten, A. Hössinger, J. Weinbub: "Automatic Grid Refinement for Thin Material Layer Etching in Process TCAD Simulations"; Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD 2022), Granada, Spain; 06.09.2022 - 08.09.2022; in "SISPAD 2022: International Conference on Simulation of Semiconductor Processes and Devices - Conference Abstract Booklet", (2022), 11 - 12. BibTeX |
| 2082. | D. Milardovich, D. Waldhör, M. Jech, A.-M. El-Sayed, T. Grasser: "Building Robust Machine Learning Force Fields by Composite Gaussian Approximation Potentials"; Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD 2022), Granada, Spain; 06.09.2022 - 08.09.2022; in "SISPAD 2022: International Conference on Simulation of Semiconductor Processes and Devices - Conference Abstract Booklet", (2022), 61 - 62. BibTeX |
| 2081. | Yu. Illarionov, B. Uzlu, T. Knobloch, A. Banshchikov, V. Sverdlov, M. Vexler, N. S. Sokolov, M. Waltl, Z. Wang, D. Neumaier, M. Lemme, T. Grasser: "CVD-GFETs with Record-small Hysteresis Owing to 2nm Epitaxial CaF2 Insulators"; Talk: Device Research Conference (DRC), Columbus, OH; 26.06.2022 - 29.06.2022; in "Proceedings of the Device Research Conference (DRC)", (2022), ISBN: 978-1-6654-9883-8, 121 - 122. BibTeX |
| 2080. | S. Fiorentini, J. Ender, R. Orio, S. Selberherr, W. Goes, V. Sverdlov: "Comprehensive Evaluation of Torques in Ultra Scaled MRAM Devices"; Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD 2022), Granada, Spain; 06.09.2022 - 08.09.2022; in "SISPAD 2022: International Conference on Simulation of Semiconductor Processes and Devices - Conference Abstract Booklet", (2022), 11 - 12. BibTeX |
| 2079. | L. Filipovic, O. Baumgartner, J. Piso, J. Bobinac, T. Reiter, G. Strof, G. Rzepa, Z. Stanojevic, M. Karner: "DTCO Flow for Air Spacer Generation and its Impact on Power and Performance at N7"; Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD 2022), Granada, Spain; 06.09.2022 - 08.09.2022; in "SISPAD 2022: International Conference on Simulation of Semiconductor Processes and Devices - Conference Abstract Booklet", (2022), 34 - 35. BibTeX |
| 2078. | S. Fiorentini, W.J. Loch, M. Bendra, N. Jørstad, J. Ender, R. Orio, T. Hadámek, W. Goes, V. Sverdlov, S. Selberherr: "Design Analysis of Ultra-Scaled MRAM Cells"; Talk: 2022 IEEE 16th International Conference on Solid-State and Integrated Circuit Technology, Nanjing, China; (invited) 25.10.2022 - 28.10.2022; in "Proceedings of 2022 IEEE 16th International Conference on Solid-State & Integrated Circuit Technology (ICSICT)", (2022), ISBN: 978-1-6654-6905-0, . BibTeX |
| 2077. | A. Saleh, H. Zahedmanesh, H. Ceric, K. Croes, I. De Wolf: "Dynamics of Electromigration Voids in Cu Interconnects: Investigation Using a Physics-Based Model Augmented by Neural Networks"; Talk: IEEE International Interconnect Technology Conference (IITC), San Jose, USA; 27.06.2022 - 30.06.2022; in "2022 IEEE International Interconnect Technology Conference (IITC)", (2022), ISBN: 978-1-6654-8646-0, 22 - 27 doi:10.1109/IITC52079.2022.9881303. BibTeX |
| 2076. | V. Sverdlov, H. Seiler, A.-M. El-Sayed, Yu. Illarionov, H. Kosina, S. Selberherr: "Edge Modes in Narrow Nanoribbons of Transition Metal Dichalcogenides in a Topological 1T"; Talk: International Conference on Physics and its Application, San Francisco, USA; (invited) 18.07.2022 - 21.07.2022; in "International Conference on Physics and its Application 2022", (2022), 36 - 37. BibTeX |
| 2075. | M. Ballicchia, M. Nedjalkov, J. Weinbub: "Electromagnetic Control of Electron Interference"; Poster: CECAM Flagship Workshop on Quantum Transport Methods and Algorithms: From Particles to Waves Approaches, Zurich; 06.07.2022 - 08.07.2022; in "Book of Abstracts of the CECAM Flagship Workshop on Quantum Transport Methods and Algorithms: From Particles to Waves Approaches", (2022), 15. BibTeX |
| 2074. | H. Ceric, R. Orio, S. Selberherr: "Electromigration Degradation of Gold Interconnects: A Statistical Study"; Talk: IEEE International Interconnect Technology Conference (IITC), San Jose, California,; 27.06.2022 - 30.06.2022; in "2022 IEEE International Interconnect Technology Conference (IITC)", (2022), 102 - 104 doi:10.1109/IITC52079.2022.9881313. BibTeX |
| 2073. | V. Sverdlov, M. Bendra, S. Fiorentini, J. Ender, R. Orio, T. Hadámek, W.J. Loch, N. Jørstad, W. Goes, S. Selberherr: "Emerging Devices for Digital Spintronics"; 2nd Global Conference & Expo on Nanotechnology & Nanoscience, online; (invited) 25.05.2022 - 26.05.2022; in "2nd Global Conference & Expo on Nanotechnology & Nanoscience", (2022), 32 - 33. BibTeX |
| 2072. | T. Knobloch: "Enhancing the Reliability of 2D Nanoelectronics Guided by Physical Modeling"; Talk: Workshop Monte Carlo Simulation: Beyond Moore's LAW, International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Spain; 05.09.2022. BibTeX |
| 2071. | T. Knobloch, Yu. Illarionov, T. Grasser: "Enhancing the Stability of 2D Material-Based Transistors via Fermi-Level Tuning"; Talk: Graphene Week 2022, Munich, Germany; (invited) 05.09.2022 - 09.09.2022; in "Abstracts of Graphene Week 2022", (2022), . BibTeX |
| 2070. | T. Knobloch, Yu. Illarionov, T. Grasser: "Finding Suitable Gate Insulators for Reliable 2D FETs"; Talk: International Reliability Physics Symposium (IRPS), Dallas, USA; (invited) 27.03.2022 - 31.03.2022; in "2022 IEEE International Reliability Physics Symposium (IRPS) : proceedings : March 27-31, 2022, Dallas, Texas / IEEE", (2022), ISBN: 978-1-6654-7950-9, 2A.1-1 - 2A.1-10 doi:10.1109/IRPS48227.2022.9764499. BibTeX |
| 2069. | Yu. Illarionov, T. Knobloch, B. Uzlu, N. S. Sokolov, M. Lemme, T. Grasser: "Highly stable GFETs with 2nm crystalline CaF2 insulators"; Talk: 6th International Conference on Physics of 2D materials based electronics and optoelectronics (ICP2DC6, 2022), Yerevan, Armenia; 09.10.2022 - 14.10.2022; . BibTeX |
| 2068. | H. Ceric, R. Orio, S. Selberherr: "Impact of Gold Interconnect Microstructure on Electromigration Failure Time Statistics"; Talk: IEEE European Solid-State Device Research Conference (ESSDERC), Milan, Italy; 20.09.2022 - 22.09.2022; in "Proceedings of the European Solid-State Device Research Conference (ESSDERC)", (2022), ISBN: 978-1-6654-8496-1, 301 - 303. BibTeX |
| 2067. | J. Bobinac, T. Reiter, J. Piso, X. Klemenschits, O. Baumgartner, Z. Stanojevic, G. Strof, M. Karner, L. Filipovic: "Impact of Mask Tapering on SF6/O2 Plasma Etching"; Talk: Fourth International Conference on Microelectronic Devices and Technologies (MicDAT '2022), Corfu, Greece; 21.09.2022 - 23.09.2022; in "Microelectronic Devices and Technologies: Proceedings of the 4rd International Conference on Microelectronic Devices and Technologies (MicDAT '2022)", (2022), ISBN: 978-84-09-43856-3, 90 - 94. BibTeX |
| 2066. | M. Bendra, S. Fiorentini, J. Ender, R. Orio, T. Hadámek, W.J. Loch, N. Jørstad, W. Goes, S. Selberherr: "Interface Effects in Ultra-Scaled MRAM Cells"; Talk: Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Udine, Italy; 18.05.2022 - 20.05.2022; in "Proceedings of the Joint International EuroSOI Workshop and International Conference on Ultimate Integration on Silicon (EuroSOI-ULIS)", (2022), . BibTeX |
| 2065. | D. Milardovich, M. Jech, D. Waldhör, A.-M. El-Sayed, T. Grasser: "Machine Learning Prediction of Defect Structures in Amorphous Silicon Dioxide"; Talk: Psi-K Conference (Psi-K) 2022, Lausanne, Schwitzerland; 22.08.2022 - 25.08.2022; in "PSI-K 2022: abstracts book", (2022), 138. BibTeX |
| 2064. | H. Ceric, R. Orio, S. Selberherr: "Microstructural Impact on Electromigration Reliability of Gold Interconnects"; Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD 2022), Granada, Spain; 06.09.2022 - 08.09.2022; in "SISPAD 2022: International Conference on Simulation of Semiconductor Processes and Devices - Conference Abstract Booklet", (2022), 178 - 179. BibTeX |
| 2063. | V. Sverdlov, M. Bendra, S. Fiorentini, J. Ender, R. Orio, T. Hadámek, W.J. Loch, N. Jørstad, S. Selberherr: "Modeling Advanced Magnetoresistive Memory: A Journey from Finite Element Methods to Machine Learning Approaches"; 2 nd Global Webinar on Nanoscience & Nanotechnology, online; (invited) 14.03.2022 - 15.03.2022; in "2nd Global Webinar on Nanoscience & Nanotechnology", (2022), . BibTeX |
| 2062. | V. Sverdlov, M. Bendra, S. Fiorentini, J. Ender, R. Orio, T. Hadámek, W.J. Loch, N. Jørstad, W. Goes, S. Selberherr: "Modeling Advanced Spintronic Based Magnetoresistive Memory"; Talk: International Conference on Microwave & THz Technologies, Wireless Communications and OptoElectronics (IRPhE 2022), Yerevan, Armenia; (invited) 27.09.2022 - 29.09.2022; in "Book of Abstracts of the International Conference on Microwave & THz Technologies and Optoelectronics (IRPhE)", (2022), . BibTeX |
| 2061. | V. Sverdlov, W. Loch, M. Bendra, S. Fiorentini, J. Ender, R. Orio, T. Hadámek, N. Jorstad, W. Goes, S. Selberherr: "Modeling Approach to Ultra-Scaled MRAM Cells"; Talk: ASETMEET2022 International Meet On Applied Science, Engineering and Technology, Taastrup, Copenhagen; (invited) 23.06.2022 - 25.06.2022; in "Book of Abstracts of the International Meet On Applied Science, Engineering and Technology (ASETMEET)", (2022), 7 - 8. BibTeX |
| 2060. | N. Jørstad, S. Fiorentini, S. Selberherr, W. Goes, V. Sverdlov: "Modeling Interfacial and Bulk Spin-Orbit torques"; Talk: 16th International Conference on Nanostructured Materials, Sevilla, Spain; 06.06.2022 - 10.06.2022; in "Book of Abstracts of the International Conference on Nanostructured Materials (NANO)", (2022), . BibTeX |
| 2059. | L.F. Aguinsky, F. Rodrigues, X. Klemenschits, L. Filipovic, A. Hössinger, J. Weinbub: "Modeling Non-Ideal Conformality during Atomic Layer Deposition in High Aspect Ratio Structures"; Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD 2022), Granada, Spain; 06.09.2022 - 08.09.2022; in "SISPAD 2022: International Conference on Simulation of Semiconductor Processes and Devices - Conference Abstract Booklet", (2022), 40 - 41. BibTeX |
| 2058. | T. Hadámek, W. Goes, S. Selberherr, V. Sverdlov: "Modeling Thermal Effects in STT-MRAM"; Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD 2022), Granada, Spain; 06.09.2022 - 08.09.2022; in "SISPAD 2022: International Conference on Simulation of Semiconductor Processes and Devices - Conference Abstract Booklet", (2022), 11 - 12. BibTeX |
| 2057. | V. Sverdlov: "Modeling Ultra-Scaled Magnetoresistive Memory Cells"; 3rd Global Webinar on Nanoscience & Nanotechnology, online; (invited) 18.07.2022 in "3rd Global Webinar on Nanoscience & Nanotechnology", (2022), . BibTeX |
| 2056. | M. Ballicchia, M. Nedjalkov, J. Weinbub: "Monte Carlo Approach for Solving Integral Equations: From Classical-Boltzmann to Quantum-Wigner Particles"; Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Spain; (invited) 05.09.2022. BibTeX |
| 2055. | J. Weinbub, M. Ballicchia, M. Nedjalkov: "Quantum Transport in Phase Space: Introduction and Applications"; Talk: Summer School on Methods and Models of Kinetic Theory, Pesaro, Italy; (invited) 12.06.2022 - 18.06.2022; . BibTeX |
| 2054. | H. Kosina: "Recent Developments in Semiclassical Transport: Backward Monte Carlo and Electron-Electron Scattering"; Talk: Workshop Monte Carlo Simulation: Beyond Moore's LAW, International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Spain; 05.09.2022. BibTeX |
| 2053. | T. Knobloch, T. Grasser: "Scalable and Reliable Gate Insulators for 2D Material-Based FETs"; Talk: IEEE Latin America Electron Devices Conference (LAEDC), Puebla, Mexico; (invited) 04.07.2022 - 06.07.2022; . BibTeX |
| 2052. | M. Quell, A. Hössinger, J. Weinbub: "Shared-Memory Fast Marching Method for Re-Distancing on Hierarchical Meshes"; Talk: Austrian-Slovenian HPC Meeting (ASHPC), Grundlsee; 31.05.2022 - 02.06.2022; in "Book of Abstracts of the Austrian-Slovenian HPC Meeting (ASHPC)", (2022), ISBN: 978-3-200-08499-5, 1 page(s) doi:10.25365/phaidra.337. BibTeX |
| 2051. | W.J. Loch, S. Selberherr, V. Sverdlov: "Simulation of Novel MRAM Devices with Enhanced Performance"; Talk: 16th International Conference on Nanostructured Materials, Sevilla, Spain; 06.06.2022 - 10.06.2022; in "Book of Abstracts of the International Conference on Nanostructured Materials (NANO)", (2022), . BibTeX |
| 2050. | S. Fiorentini, M. Bendra, J. Ender, R. Orio, W. Goes, S. Selberherr, V. Sverdlov: "Spin Torques in ULTRA-Scaled MRAM Devices"; Talk: IEEE European Solid-State Device Research Conference (ESSDERC), Mailand; 20.09.2022 - 22.09.2022; in "Proceedings of the European Solid-State Device Research Conference (ESSDERC)", (2022), ISBN: 978-1-6654-8496-1, 348 - 351. BibTeX |
| 2049. | S. Fiorentini, J. Ender, S. Selberherr, W. Goes, V. Sverdlov: "Spin Transfer Torque Evaluation Based on Coupled Spin and Charge Transport: A Finite Element Method Approach"; Talk: 26th World Multi-Conference on Systemics, Cybernetics and Informatics (WMSCI 2022), online; 12.07.2022 - 15.07.2022; in "The 26th World Multi-Conference on Systemics, Cybernetics and Informatics: WMSCI 2022. Proceedings Volume II", (2022), 20, 4, 40 - 44. BibTeX |
| 2048. | M. Bendra, S. Fiorentini, J. Ender, R. Orio, T. Hadámek, W.J. Loch, N. Jørstad, S. Selberherr, W. Goes, V. Sverdlov: "Spin Transfer Torques in Ultra-Scaled MRAM Cells"; Talk: MIPRO 2022, Opatija, Croatia; 23.05.2022 - 27.05.2022; in "2022 45th Jubilee International Convention on Information, Communication and Electronic Technology (MIPRO)", (2022), ISBN: 978-953-233-103-5, 129 - 132. BibTeX |
| 2047. | L. Gollner, R. Steiner, L. Filipovic: "Study of Phonon-limited Electron Transport in Monolayer MoS2"; Talk: Fourth International Conference on Microelectronic Devices and Technologies (MicDAT '2022), Corfu, Greece; 21.09.2022 - 23.09.2022; in "Microelectronic Devices and Technologies Proceedings of the 4rd International Conference on Microelectronic Devices and Technologies (MicDAT 2022)", (2022), ISBN: 978-84-09-43856-3, 74 - 78. BibTeX |
| 2046. | T. Hadámek, S. Fiorentini, M. Bendra, R. Orio, W.J. Loch, N. Jorstad, S. Selberherr, W. Goes, V. Sverdlov: "Temperature Modeling in STT-MRAM:A Fully Three-Dimensional Finite Element Approach"; Talk: 16th International Conference on Nanostructured Materials, Sevilla, Spain; 06.06.2022 - 10.06.2022; in "Book of Abstracts of the International Conference on Nanostructured Materials (NANO)", (2022), . BibTeX |
| 2045. | M. Jech, T. Grasser, M. Waltl: "The Importance of Secondary Generated Carriers in Modeling of Full Bias Space"; Talk: IEEE Electron Devices Technology and Manufacturing Conference (EDTM), online; 06.03.2022 - 09.03.2022; in "2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)", (2022), 265 - 267 doi:10.1109/EDTM53872.2022.9798262. BibTeX |
| 2044. | Yu. Illarionov, T. Knobloch, M. Waltl, Q. Smets, L. Panarella, B. Kaczer, T. Schram, S. Brems, D. Cott, I. Asselberghs, T. Grasser: "Top Gate Length Dependence of Hysteresis in 300mm FAB MoS2 FETs"; Talk: Graphne 2022, Aachen, Germany; 05.07.2022 - 08.07.2022; . BibTeX |
| 2043. | M. Stephanie, M. Waltl, T. Grasser, B. SchrenkSchrenk: "WDM-Conscious Synaptic Receptor Assisted by SOA+EAM"; Talk: 2022 Optical Fiber Communications Conference and Exhibition (OFC), San Diego, California, USA; 05.03.2022 - 09.03.2022; in "2022 Optical Fiber Communications Conference and Exhibition (OFC)", (2022), . BibTeX |
| 2042. | M. Ballicchia, M. Nedjalkov, J. Weinbub: "Wigner Dynamics of Electron Quantum Superposition States in a Confined and Opened Quantum Dot"; Talk: 22nd IEEE International Conference on Nanotechnology, Palma de Mallorca, Sapin; 04.07.2022 - 08.07.2022; in "2022 IEEE 22nd International Conference on Nanotechnology (NANO)", (2022), 565 - 568 doi:10.1109/NANO54668.2022.9928753. BibTeX |
| 2041. | J. Weinbub: "Wigner Signed Particles for Electron Quantum Optics"; Talk: UW-Madison's Grainger Institute Computing in Engineering Forum, USA; (invited) 20.09.2022 - 21.09.2022; . BibTeX |
| 2040. | J. Weinbub: "Wigner Signed-Particles: Computational Challenges and Simulation Opportunities"; Talk: CECAM Flagship Workshop on Quantum Transport Methods and Algorithms: From Particles to Waves Approaches, Zurich; (invited) 06.07.2022 - 08.07.2022; in "Book of Abstracts of the CECAM Flagship Workshop on Quantum Transport Methods and Algorithms: From Particles to Waves Approaches", (2022), 1 page(s) . BibTeX |
| 2039. | A.-M. El-Sayed, H. Seiler, H. Kosina, S. Selberherr, V. Sverdlov: "Ab-initio Calculations of Edge States in Topological 1T′ MoS2 Nanoribbons"; Talk: 2021 Workshop on Innovative Nanoscale Devices and Systems (WINDS2021), Hawaii, USA; 28.11.2021 - 03.12.2021; in "WINDS Book of Abstracts", (2021), ISBN: 978-3-9504738-3-4, 79 - 80. BibTeX |
| 2038. | J. Ender, S. Fiorentini, R. Orio, T. Hadámek, M. Bendra, W. Goes, S. Selberherr, V. Sverdlov: "Advanced Modeling of Emerging MRAM: From Finite Element Methods to Machine Learning Approaches"; Talk: International Conference Micro- and Nanoelectronics (ICMNE), Moscow-Zvenigorod, Russia; (invited) 04.10.2021 - 08.10.2021; in "Proceedings of the International Conference Micro- and Nanoelectronics (ICMNE)", (2021), ISBN: 978-5-317-06675-8, . BibTeX |
| 2037. | J. Ender, S. Fiorentini, S. Selberherr, W. Goes, V. Sverdlov: "Advanced Modeling of Emerging Nonvolatile Magnetoresistive Devices"; Talk: International Workshop on Computational Nanotechnology (IWCN), Daejeon, Korea (Virtual); (invited) 24.05.2021 - 06.06.2021; in "Book of Abstracts of the International Workshop on Computational Nanotechnology (IWCN)", (2021), ISBN: 978-89-89453-30-7, 45 - 46. BibTeX |
| 2036. | T. Hadámek, S. Selberherr, W. Goes, V. Sverdlov: "Asymmetry of Current-Induced Heating in Magnetic Tunnel Junctions"; Talk: International Workshop on Computational Nanotechnology (IWCN), Daejeon, Korea (Virtual); 24.05.2021 - 06.06.2021; in "Book of Abstracts of the International Workshop on Computational Nanotechnology (IWCN)", (2021), ISBN: 978-89-89453-30-7, 49 - 50. BibTeX |
| 2035. | J. Franco, J. Marneffe, A. Vandooren, Y. Kimura, L. Nyns, Z. Wu, A.-M. El-Sayed, M. Jech, D. Waldhör, D. Claes, H. Arimura, L. Ragnarsson, V. Afanas´Ev, N. Horiguchi, D. Linten, T. Grasser, B. Kaczer: "Atomic Hydrogen Exposure to Enable High-Quality Low-Temperature SiO2 with Excellent pMOS NBTI Reliability Compatible with 3D Sequential Tier Stacking"; Talk: IEEE International Electron Devices Meeting (IEDM), San Francisco, CA, USA; 12.12.2021 - 18.12.2021; in "Proceedings of the IEEE International Electron Devices Meeting (IEDM)", (2021), ISBN: 978-1-7281-8888-1, 31.2.1 - 31.2.4 doi:10.1109/IEDM13553.2020.9372054. BibTeX |
| 2034. | V. Sverdlov, A.-M. El-Sayed, H. Kosina, S. Selberherr: "Ballistic Conductance, k. p Hamiltonian, Nanoribbons, Subbands, Topological Insulators (TIs), Topologically Protected Edge States"; Talk: European Solid-State Device Research Conference (ESSDERC), Grenoble, France; 13.09.2021 - 17.09.2021; in "Proceedings of the European Solid-State Device Research Conference (ESSDERC), TEDbrief Special Edition", (2021), . BibTeX |
| 2033. | T. Grasser, B. O´Sullivan, B. Kaczer, J. Franco, B. Stampfer, M. Waltl: "CV Stretch-Out Correction after Bias Temperature Stress: Work-function Dependence of Donor-/Acceptor-like Traps, Fixed Charges, and Fast States"; Talk: IEEE International Reliability Physics Symposium (IRPS), virtual; 21.03.2021 - 24.03.2021; in "Proceedings of the IEEE International Reliability Physics Symposium (IRPS)", (2021), ISBN: 978-1-7281-6893-7, 1 - 6 doi:10.1109/IRPS46558.2021.9405184. BibTeX |
| 2032. | X. Klemenschits, S. Selberherr, L. Filipovic: "Combined Process Simulation and Emulation of an SRAM Cell of the 5nm Technology Node"; Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Dallas, Texas (USA); 27.09.2021 - 29.09.2021; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2021), 23 - 27 doi:10.1109/SISPAD54002.2021.9592605. BibTeX |
| 2031. | V. Sverdlov, H. Seiler, A.-M. El-Sayed, H. Kosina: "Conductance of Edge Modes in Nanoribbons of 2D Materials in a Topological Phase"; Poster: Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Caen, France; 01.09.2021 - 03.09.2021; in "Book of Abstracts of the Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)", (2021), 52 - 53. BibTeX |
| 2030. | Yu. Illarionov, T. Knobloch, T. Grasser: "Crystalline Insulators for Scalable 2D Nanoelectronics"; Talk: International Conference on Insulating Films on Semiconductors (INFOS), Rende (CS), Italy; (invited) 29.06.2021 - 02.07.2021; . BibTeX |
| 2029. | C. Lenz, A. Toifl, A. Hössinger, J. Weinbub: "Curvature-Based Feature Detection for Hierarchical Grid Refinement in Epitaxial Growth Simulations"; Talk: Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Caen, France; 01.09.2021 - 03.09.2021; in "Book of Abstracts of the Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)", (2021), 109 - 110. BibTeX |
| 2028. | S. Fiorentini, M. Bendra, J. Ender, R. Orio, S. Selberherr, W. Goes, V. Sverdlov: "Design Support for Ultra-Scaled MRAM Cells"; Poster: IEEE International Electron Devices Meeting (IEDM), San Francisco, USA; 13.12.2021 - 15.12.2021; in "Proceedings of the IEEE International Electron Devices Meeting (IEDM) Special Poster Session Dedicated to MRAM", (2021), 1 page(s) . BibTeX |
| 2027. | S. Naz, A. Shah, S. Ahmed, G. Patrick, M. Waltl: "Design of Fault-Tolerant and Thermally Stable XOR Gate in Quantum dot Cellular Automata"; Poster: IEEE European Test Symposium (ETS), Bruges, Belgium (Virtual); 24.05.2021 - 28.05.2021; in "Proceedings of the IEEE European Test Symposium (ETS)", (2021), doi:10.1109/ETS50041.2021.9465459. BibTeX |
| 2026. | R. Orio, J. Ender, S. Fiorentini, W. Goes, S. Selberherr, V. Sverdlov: "Deterministic Spin-Orbit Switching Scheme for an Array of Perpendicular MRAM Cells Suitable for Large Scale Integration"; Talk: Trends in Magnetism (TMAG), Cefalù, Italy; 06.09.2021 - 10.09.2021; in "Proceedings of the Trends in Magnetism Conference (TMAG)", (2021), . BibTeX |
| 2025. | N. Jørstad, S. Fiorentini, W. Goes, V. Sverdlov: "Efficient Finite Element Method Approach to Model Spin Orbit Torque MRAM"; Talk: International MOS-AK Workshop, Silicon Valley, USA; 17.12.2021 in "Proceedings of the 14th International MOS-AK Workshop", (2021), 1. BibTeX |
| 2024. | J. Weinbub, M. Ballicchia, M. Nedjalkov, S. Selberherr: "Electromagnetic Coherent Electron Control"; Talk: IEEE Latin America Electron Devices Conference (LAEDC), virtual; (invited) 19.04.2021 - 21.04.2021; in "Proceedings of the IEEE Latin America Electron Devices Conference (LAEDC)", (2021), ISBN: 978-1-6654-1510-1, 1 - 4 doi:10.1109/LAEDC51812.2021.9437949. BibTeX |
| 2023. | J. Weinbub, M. Ballicchia, M. Nedjalkov: "Electron Quantum Optics for Quantum Interference Logic Devices"; Talk: Workshop on Innovative Nanoscale Devices and Systems (WINDS), Hawaii, USA; 28.11.2021 - 03.12.2021; in "WINDS Book of Abstracts", (2021), ISBN: 978-3-9504738-3-4, 58 - 59. BibTeX |
| 2022. | J. Ender, R. Orio, V. Sverdlov: "Enhancing SOT-MRAM Switching Using Machine Learning"; Talk: Silvaco Users Global Event (SURGE), Santa Clara, CA, USA - virtual; (invited) 14.10.2021 in "Proceedings of the Silvaco Users Global Event (SURGE)", (2021), 1. BibTeX |
| 2021. | Yu. Illarionov, A. Banshchikov, N. S. Sokolov, V. V. Fedorov, S. M. Suturin, M. I. Vexler, T. Knobloch, D.K Polyushkin, T. Mueller, T. Grasser: "Epitaxial Fluorides as a Universal Platform for More Moore and More than Moore Electronics Based on 2D Materials"; Talk: Scientific Council Meeting of the Russian Academy of Sciences, Moscow, Russia; (invited) 08.04.2021. BibTeX |
| 2020. | C. Lenz, A. Scharinger, M. Quell, P. Manstetten, A. Hössinger, J. Weinbub: "Evaluating Parallel Feature Detection Methods for Implicit Surfaces"; Talk: Austrian-Slovenian HPC Meeting (ASHPC), Maribor, Slovenia (Virtual); 31.05.2021 - 02.06.2021; in "Book of Abstracts of the Austrian-Slovenian HPC Meeting (ASHPC)", (2021), 31. BibTeX |
| 2019. | J. Michl, A. Grill, D. Waldhör, C. Schleich, T. Knobloch, E. Ioannidis, H. Enichlmair, R. Minixhofer, B. Kaczer, B. Parvais, B. Govoreanu, I. Radu, T. Grasser, M. Waltl: "Evidence of Tunneling Driven Random Telegraph Noise in Cryo-CMOS"; Talk: IEEE International Electron Devices Meeting (IEDM), San Francisco, USA; 11.12.2021 - 15.12.2021; in "2021 IEEE International Electron Devices Meeting (IEDM)", (2021), 31.3.1 - 31.3.3 doi:10.1109/IEDM19574.2021.9720501. BibTeX |
| 2018. | L. Filipovic, X. Klemenschits: "Fast Model for Deposition in Trenches using Geometric Advection"; Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Dallas, Texas (USA); 27.09.2021 - 29.09.2021; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2021), 224 - 228 doi:10.1109/SISPAD54002.2021.9592595. BibTeX |
| 2017. | F. Rodrigues, L.F. Aguinsky, A. Toifl, A. Hössinger, J. Weinbub: "Feature Scale Modeling of Fluorocarbon Plasma Etching for Via Structures including Faceting Phenomena"; Talk: International Workshop on Computational Nanotechnology (IWCN), Daejeon, Korea (Virtual); 24.05.2021 - 06.06.2021; in "Book of Abstracts of the International Workshop on Computational Nanotechnology (IWCN)", (2021), ISBN: 978-89-89453-30-7, 101 - 102. BibTeX |
| 2016. | L.F. Aguinsky, G. Wachter, A. Scharinger, F. Rodrigues, A. Toifl, M. Trupke, U. Schmid, A. Hössinger, J. Weinbub: "Feature-Scale Modeling of Isotropic SF6 Plasma Etching of Si"; Poster: Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Caen, France; 01.09.2021 - 03.09.2021; in "Book of Abstracts of the Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)", (2021), 54 - 55. BibTeX |
| 2015. | M. Bendra, J. Ender, S. Fiorentini, T. Hadámek, R. Orio, W. Goes, S. Selberherr, V. Sverdlov: "Finite Element Method Approach to MRAM Modeling"; Talk: International Convention on Information, Communication and Electronic Technology (MIPRO), Opatija, Croatia; 27.09.2021 - 01.10.2021; in "Proceedings of the International Convention on Information, Communication and Electronic Technology (MIPRO)", (2021), ISBN: 978-953-233-101-1, 70 - 73 doi:10.23919/MIPRO52101.2021.9597194. BibTeX |
| 2014. | A.-M. El-Sayed, H. Seiler, H. Kosina, V. Sverdlov: "First Principles Approach to Study Topologically Protected Edge States in 1T′ MoS2 Nanoribbons"; Talk: Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Caen, France; 01.09.2021 - 03.09.2021; in "Book of Abstracts of the Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)", (2021), 113 - 114. BibTeX |
| 2013. | L. Filipovic, S. Selberherr: "Gas Sensing with Two-Dimensional Materials Beyond Graphene"; Talk: International Conference on Microelectronics (MIEL), Nis, Serbia; (invited) 12.09.2021 - 14.09.2021; in "Proceedings of the International Conference on Microelectronics (MIEL)", (2021), ISBN: 978-1-6654-4526-9, 29 - 36 doi:10.1109/MIEL52794.2021.9569088. BibTeX |
| 2012. | T. Hadámek, S. Selberherr, W. Goes, V. Sverdlov: "Heating Asymmetry in Magnetoresistive Random Access Memories"; Talk: World Multi-Conference on Systemics, Cybernetics and Informatics (WMSCI), Orlando, Florida, USA (Virtual); 18.07.2021 - 21.07.2021; in "Proceedings of the World Multi-Conference on Systemics, Cybernetics and Informatics (WMSCI)", (2021), ISBN: 978-1-950492-55-8, 63 - 66. BibTeX |
| 2011. | M. Waltl: "Impact of Defects in Semiconductor Transistors on Devices and Circuits"; Talk: International Meet on Nanotechnology (NANOMEET), Porto, Portugal; (invited) 13.09.2021 - 15.09.2021; in "Proceedings of the International Meet on Nanotechnology (NANOMEET)", (2021), 93. BibTeX |
| 2010. | T. Reiter, X. Klemenschits, L. Filipovic: "Impact of High-Aspect-Ratio Etching Damage on Selective Epitaxial Silicon Growth in 3D NAND Flash Memory"; Poster: Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Caen, France; 01.09.2021 - 03.09.2021; in "Book of Abstracts of the Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)", (2021), 34 - 35. BibTeX |
| 2009. | M. Kampl, H. Kosina, M. Waltl: "Improved Sampling Algorithms for Monte Carlo Device Simulation"; Talk: International Workshop on Computational Nanotechnology (IWCN), Daejeon, Korea (Virtual); 24.05.2021 - 06.06.2021; in "Book of Abstracts of the International Workshop on Computational Nanotechnology (IWCN)", (2021), ISBN: 978-89-89453-30-7, 53 - 54. BibTeX |
| 2008. | J. Ender, R. Orio, S. Fiorentini, S. Selberherr, W. Gös, V. Sverdlov: "Improving Failure Rates in Pulsed SOT-MRAM Switching by Reinforcement Learning"; Talk: European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), Bordeaux, France; 04.10.2021 - 07.10.2021; in "Proceedings of the 32nd European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis", (2021), ISSN: 0026-2714, 1 - 4 doi:10.1016/j.microrel.2021.114231. BibTeX |
| 2007. | J. Franco, J. Marneffe, A. Vandooren, H. Arimura, L. Ragnarsson, D. Claes, E. D. Litta, N. Horiguchi, K. Croes, D. Linten, T. Grasser, B. Kaczer: "Low Temperature Atomic Hydrogen Treatment for Superior NBTI Reliability -- Demonstration and Modeling across SiO2 IL Thicknesses from 1.8 to 0.6 nm for I/O and Core Logic"; Talk: International Symposium on VLSI Technology, Kyoto, Japan; 13.06.2021 - 19.06.2021; in "2021 Symposium on VLSI Technology (VLSIT)", (2021), ISBN: 978-1-6654-1945-1, 1 - 2. BibTeX |
| 2006. | D. Milardovich, M. Jech, D. Waldhör, A.-M. El-Sayed, T. Grasser: "Machine Learning Prediction of Defect Structures in Amorphous Silicon Dioxide"; Talk: European Solid-State Device Research Conference (ESSDERC), Grenoble, France; 13.09.2021 - 22.09.2021; in "Proceedings of the European Solid-State Device Research Conference (ESSDERC)", (2021), ISBN: 978-1-6654-3748-6, 239 - 242 doi:10.1109/ESSDERC53440.2021.9631837. BibTeX |
| 2005. | M. Ballicchia, M. Benam, M. Nedjalkov, S. Selberherr, J. Weinbub: "Modeling Coulomb Interaction with a 'Wigner-Poisson' Coupling Scheme"; Talk: International Wigner Workshop (IW2), Daejeon, Korea (Virtual); 17.05.2021 - 21.05.2021; in "Book of Abstracts of the International Wigner Workshop (IW2)", (2021), ISBN: 978-3-9504738-2-7, 64 - 65. BibTeX |
| 2004. | L. Filipovic: "Modeling and Simulation of ALD in a Level Set Framework"; Talk: EFDS Workshop on Simulation for ALD, virtual; (invited) 25.03.2021 in "Proceedings of the EFDS Workshop on Simulation for ALD", (2021), 9. BibTeX |
| 2003. | J. Weinbub: "Modeling and Simulation of Two-Dimensional Single-Electron Control"; Talk: International Meet on Nanotechnology (NANOMEET), Porto, Portugal; (invited) 13.09.2021 - 15.09.2021; in "Proceedings of the International Meet on Nanotechnology (NANOMEET)", (2021), . BibTeX |
| 2002. | J. Weinbub: "Modeling and Simulation of Two-Dimensional Single-Electron Dynamics"; Talk: Global Summit on Condensed Matter Physics (CONMAT), Valencia, Spain (virtual); (invited) 18.10.2021 - 20.10.2021; in "Proceedings of the Global Summit on Condensed Matter Physics (CONMAT)", (2021), . BibTeX |
| 2001. | L. Cvitkovich, M. Jech, D. Waldhör, A.-M. El-Sayed, C. Wilhelmer, T. Grasser: "Multiscale Modeling Study of Native Oxide Growth on a Si(100) Surface"; Talk: European Solid-State Device Research Conference (ESSDERC), Grenoble, France; 13.09.2021 - 22.09.2021; in "Proceedings of the European Solid-State Device Research Conference (ESSDERC)", (2021), ISBN: 978-1-6654-3748-6, 235 - 238 doi:10.1109/ESSDERC53440.2021.9631790. BibTeX |
| 2000. | J. Franco, H. Arimura, J. Marneffe, A. Vandooren, L. Ragnarsson, Z. Wu, D. Claes, E. D. Litta, N. Horiguchi, K. Croes, D. Linten, T. Grasser, B. Kaczer: "Novel Low Thermal Budget Gate Stack Solutions for BTI Reliability in Future Logic Device Technologies"; Talk: IEEE International Conference on IC Design and Technology (ICICDT), Dresden, Germany; 15.09.2021 - 17.09.2021; in "Proceedings of IEEE International Conference on IC Design and Technology", (2021), ISBN: 978-1-6654-4998-4, 1 - 4 doi:10.1109/ICICDT51558.2021.9626482. BibTeX |
| 1999. | H. Kosina, H. Seiler, V. Sverdlov: "Numerical Calculation of the Transverse Modes in 1T' MoS2 Nanoribbons"; Talk: International Workshop on Computational Nanotechnology (IWCN), Daejeon, Korea (Virtual); 24.05.2021 - 06.06.2021; in "Book of Abstracts of the International Workshop on Computational Nanotechnology (IWCN)", (2021), ISBN: 978-89-89453-30-7, 2 - 3. BibTeX |
| 1998. | R. Kosik, J. Cervenka, H. Kosina: "Open Boundary Conditions for the Wigner and the Characteristic von Neumann Equation"; Talk: International Wigner Workshop (IW2), Daejeon, Korea (Virtual); 17.05.2021 - 21.05.2021; in "Book of Abstracts of the International Wigner Workshop (IW2)", (2021), ISBN: 978-3-9504738-2-7, 42 - 43. BibTeX |
| 1997. | C. Wen, Yu. Illarionov, W. Frammelsberger, T. Knobloch, T. Grasser, M. Lanza: "Outstanding Dielectric Properties of Ultra-thin CaF2 Dielectric Films"; Talk: APS March Meeting, College Park, MD, USA; 15.03.2021 - 19.03.2021; in "Bulletin of the American Physical Society", (2021), . BibTeX |
| 1996. | F. Ribeiro, K. Rupp, T. Grasser: "Parallel Solver Study for Solving the Boltzmann Transport Equation using Spherical Harmonics Expansions on Supercomputers"; Talk: International Workshop on Computational Nanotechnology (IWCN), Daejeon, Korea (Virtual); 24.05.2021 - 06.06.2021; in "Book of Abstracts of the International Workshop on Computational Nanotechnology (IWCN)", (2021), ISBN: 978-89-89453-30-7, 97 - 98. BibTeX |
| 1995. | J. Ender, S. Fiorentini, V. Sverdlov, W. Goes, R. Orio, S. Selberherr: "Reinforcement Learning Approach for Deterministic SOT-MRAM Switching"; Talk: SPIE Spintronics, San Diego, CA, USA - virtual; (invited) 01.08.2021 - 05.08.2021; in "Proceedings of SPIE Spintronics", (2021), 11805-53. BibTeX |
| 1994. | J. Ender, R. Orio, S. Fiorentini, S. Selberherr, W. Goes, V. Sverdlov: "Reinforcement Learning Approach for Sub-Critical Current SOT-MRAM Switching Materials"; Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Dallas, Texas (USA); 27.09.2021 - 29.09.2021; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2021), 150 - 154 doi:10.1109/SISPAD54002.2021.9592561. BibTeX |
| 1993. | J. Ender, R. Orio, S. Fiorentini, S. Selberherr, W. Goes, V. Sverdlov: "Reinforcement Learning to Reduce Failures in SOT-MRAM Switching"; Talk: IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), Singapore; 15.09.2021 - 15.10.2021; in "Proceedings of the IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)", (2021), ISBN: 978-1-6654-3988-6, doi:10.1109/IPFA53173.2021.9617362. BibTeX |
| 1992. | L. Filipovic: "Reliability and Stability of MEMS Microheaters for Gas Sensors"; Talk: IEEE International Integrated Reliability Workshop (IIRW), online; (invited) 04.10.2021 - 28.10.2021; in "2021 IEEE International Integrated Reliability Workshop (IIRW)", (2021), ISBN: 978-1-6654-1794-5, doi:10.1109/IIRW53245.2021.9635162. BibTeX |
| 1991. | J. Weinbub, M. Ballicchia, M. Nedjalkov: "Single Electron Control for Quantum Interference Devices"; Talk: Summer School on Methods and Models of Kinetic Theory - Winter Prelude, Porto Ercole, Italy - virtual; (invited) 08.02.2021 - 10.02.2021; . BibTeX |
| 1990. | S. Fiorentini, J. Ender, R. Orio, S. Selberherr, W. Goes, V. Sverdlov: "Spin Drift-Diffusion Approach for the Computation of Torques in Multi-Layered Structures"; Talk: International Workshop on Computational Nanotechnology (IWCN), Daejeon, Korea (Virtual); 24.05.2021 - 06.06.2021; in "Book of Abstracts of the International Workshop on Computational Nanotechnology (IWCN)", (2021), ISBN: 978-89-89453-30-7, 51 - 52. BibTeX |
| 1989. | S. Fiorentini, J. Ender, R. Orio, S. Selberherr, W. Goes, V. Sverdlov: "Spin and Charge Drift-Diffusion Approach to Torque Computation in Magnetic Tunnel Junctions"; Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Dallas, Texas (USA); 27.09.2021 - 29.09.2021; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2021), 155 - 158 doi:10.1109/SISPAD54002.2021.9592559. BibTeX |
| 1988. | S. Fiorentini, R. Orio, S. Selberherr, J. Ender, W. Goes, V. Sverdlov: "Spin and Charge Drift-Diffusion Approach to Torque Computation in Spintronic Devices"; Talk: 2021 Workshop on Innovative Nanoscale Devices and Systems (WINDS2021), Kona; 28.11.2021 - 03.12.2021; in "WINDS Book of Abstracts", (2021), ISBN: 978-3-9504738-3-4, 12 - 13. BibTeX |
| 1987. | C. Wilhelmer, M. Jech, D. Waldhör, A.-M. El-Sayed, L. Cvitkovich, T. Grasser: "Statistical Ab Initio Analysis of Electron Trapping Oxide Defects in the Si/SiO2 Network"; Talk: European Solid-State Device Research Conference (ESSDERC), Grenoble, France; 13.09.2021 - 22.09.2021; in "Proceedings of the European Solid-State Device Research Conference (ESSDERC)", (2021), ISBN: 978-1-6654-3748-6, 243 - 246 doi:10.1109/ESSDERC53440.2021.9631833. BibTeX |
| 1986. | F. Rodrigues, L.F. Aguinsky, A. Toifl, A. Scharinger, A. Hössinger, J. Weinbub: "Surface Reaction and Topography Modeling of Fluorocarbon Plasma Etching"; Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Dallas, Texas (USA); 27.09.2021 - 29.09.2021; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2021), 229 - 232 doi:10.1109/SISPAD54002.2021.9592583. BibTeX |
| 1985. | T. Hadámek, M. Bendra, S. Fiorentini, J. Ender, R. Orio, W. Goes, S. Selberherr, V. Sverdlov: "Temperature Increase in MRAM at Writing: A Finite Element Approach"; Talk: Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Caen, France; 01.09.2021 - 03.09.2021; in "Book of Abstracts of the Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)", (2021), 133 - 134. BibTeX |
| 1984. | S. Tyaginov, A. Grill, M. Vandemaele, T. Grasser, G. Hellings, A. Makarov, M. Jech, D. Linten, B. Kaczer: "A Compact Physics Analytical Model for Hot-Carrier Degradation"; Talk: IEEE International Reliability Physics Symposium (IRPS), Dallas, TX, USA - virtual; 28.04.2020 in "Proceedings of the IEEE International Reliability Physics Symposium (IRPS)", (2020), ISBN: 978-1-7281-3199-3, 1 - 7 doi:10.1109/IRPS45951.2020.9128327. BibTeX |
| 1983. | C. Lenz, A. Scharinger, A. Hössinger, J. Weinbub: "A Novel Surface Mesh Coarsening Method for Flux-Dependent Topography Simulations of Semiconductor Fabrication Processes"; Talk: International Conferences on Scientific Computing in Electrical Engineering (SCEE), Eindhoven, The Netherlands; 16.02.2020 - 20.02.2020; in "Book of Abstracts of the International Conferences on Scientific Computing in Electrical Engineering (SCEE)", (2020), 99 - 100. BibTeX |
| 1982. | T. Knobloch, J. Michl, D. Waldhör, Yu. Illarionov, B. Stampfer, A. Grill, R. Zhou, P. Wu, M. Waltl, J. Appenzeller, T. Grasser: "Analysis of Single Electron Traps in Nano-scaled MoS2 FETs at Cryogenic Temperatures"; Talk: Device Research Conference (DRC), Columbus, OH, USA - virtual; 21.06.2020 - 24.06.2020; in "Proceedings of the Device Research Conference (DRC)", (2020), 52 - 53. BibTeX |
| 1981. | H. Kosina, H. Seiler, V. Sverdlov: "Analytical Formulae for the Surface Green´s Functions of Graphene and 1T´ MoS2 Nanoribbons"; Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Kobe, Japan - virtual; 23.09.2020 - 06.10.2020; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2020), 185 - 188 doi:10.23919/SISPAD49475.2020.9241650. BibTeX |
| 1980. | Yu. Illarionov, T. Knobloch, K. Smithe, M. Waltl, R. Grady, D. Waldhör, E. Pop, T. Grasser: "Anomalous Instabilities in CVD-MoS2 FETs Suppressed by High-Quality Al2O3 Encapsulation"; Poster: Device Research Conference (DRC), Columbus, OH, USA - virtual; 21.06.2020 - 24.06.2020; in "Proceedings of the Device Research Conference (DRC)", (2020), 150 - 151. BibTeX |
| 1979. | B. Ruch, M. Jech, G. Pobegen, T. Grasser: "Applicability of Shockley-Read-Hall Theory for Interface States"; Talk: IEEE International Electron Devices Meeting (IEDM), San Francisco, CA, USA - virtual; 12.12.2020 - 18.12.2020; in "Proceedings of the IEEE International Electron Devices Meeting (IEDM)", (2020), 449 - 452 doi:10.1109/IEDM13553.2020.9372032. BibTeX |
| 1978. | V. Sverdlov, A.-M. El-Sayed, H. Kosina, S. Selberherr: "Ballistic Conductance in a Topological 1T´-MoS2 Nanoribbon"; Poster: International Symposium on Nanostructures: Physics and Technology (NANO), Minsk, Belarus - virtual; 28.09.2020 - 02.10.2020; in "Proceedings of the International Symposium on Nanostructures: Physics and Technology (NANO)", (2020), ISBN: 978-5-93634-066-6, 200 - 201. BibTeX |
| 1977. | S. Fiorentini, J. Ender, S. Selberherr, R. Orio, W. Goes, V. Sverdlov: "Comprehensive Modeling of Coupled Spin and Charge Transport through Magnetic Tunnel Junctions"; Talk: Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Caen, France - virtual; 31.03.2020 - 02.04.2020; in "Book of Abstracts of the Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)", (2020), 112 - 113. BibTeX |
| 1976. | S. Fiorentini, J. Ender, M. Mohamedou, V. Sverdlov, W. Goes, R. Orio, S. Selberherr: "Comprehensive Modeling of Coupled Spin-Charge Transport and Magnetization Dynamics in STT-MRAM Cells"; Talk: SPIE Spintronics, San Diego, CA, USA - virtual; (invited) 24.08.2020 - 28.08.2020; in "Proceedings of SPIE Spintronics", (2020), 11470-44. BibTeX |
| 1975. | S. Fiorentini, J. Ender, M. Mohamedou, R. Orio, S. Selberherr, W. Goes, V. Sverdlov: "Computation of Torques in Magnetic Tunnel Junctions through Spin and Charge Transport Modeling"; Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Kobe, Japan - virtual; 23.09.2020 - 06.10.2020; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2020), 209 - 212 doi:10.23919/SISPAD49475.2020.9241657. BibTeX |
| 1974. | Yu. Illarionov, A. Banshchikov, T. Knobloch, D.K Polyushkin, S. Wachter, V. V. Fedorov, S. M. Suturin, M. Stöger-Pollach, M. I. Vexler, N. S. Sokolov, T. Grasser: "Crystalline Calcium Fluoride: A Record-Thin Insulator for Nanoscale 2D Electronics"; Talk: Device Research Conference (DRC), Columbus, OH, USA - virtual; 21.06.2020 - 24.06.2020; in "Proceedings of the Device Research Conference (DRC)", (2020), 1 - 2 doi:10.1109/DRC50226.2020.9135160. BibTeX |
| 1973. | M. Waltl: "Defect Spectroscopy in SiC Devices"; Talk: IEEE International Reliability Physics Symposium (IRPS), Dallas, TX, USA - virtual; (invited) 28.04.2020 in "Proceedings of the IEEE International Reliability Physics Symposium (IRPS)", (2020), 1 - 9 doi:10.1109/IRPS45951.2020.9129539. BibTeX |
| 1972. | K. Tselios, B. Stampfer, J. Michl, E. Ioannidis, H. Enichlmair, M. Waltl: "Distribution of Step Heights of Electron and Hole Traps in SiON nMOS Transistors"; Talk: IEEE International Integrated Reliability Workshop (IIRW), South Lake Tahoe, CA, USA - virtual; 04.10.2020 - 08.10.2020; in "Proceedings of the International Integrated Reliability Workshop (IIRW)", (2020), 1 - 6 doi:10.1109/IIRW49815.2020.9312871. BibTeX |
| 1971. | J. Ender, M. Mohamedou, S. Fiorentini, R. Orio, S. Selberherr, W. Goes, V. Sverdlov: "Efficient Demagnetizing Field Calculation for Disconnected Complex Geometries in STT-MRAM Cells"; Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Kobe, Japan - virtual; 23.09.2020 - 06.10.2020; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2020), 213 - 216 doi:10.23919/SISPAD49475.2020.9241662. BibTeX |
| 1970. | L. Filipovic: "Electromigration Model for Platinum Hotplates"; Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Kobe, Japan - virtual; 23.09.2020 - 06.10.2020; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2020), 315 - 318 doi:10.23919/SISPAD49475.2020.9241645. BibTeX |
| 1969. | V. Sverdlov, S. Fiorentini, J. Ender, W. Goes, R. Orio, S. Selberherr: "Emerging CMOS Compatible Magnetic Memories and Logic"; Talk: IEEE Latin America Electron Devices Conference (LAEDC), San Jose, Costa Rica; (invited) 25.02.2020 - 28.02.2020; in "Proceedings of the IEEE Latin America Electron Devices Conference (LAEDC)", (2020), ISBN: 978-1-7281-1044-8, doi:10.1109/LAEDC49063.2020.9073332. BibTeX |
| 1968. | B. Ruch, G. Pobegen, C. Schleich, T. Grasser: "Generation of Hot-Carrier Induced Border and Interface Traps, Investigated by Spectroscopic Charge Pumping"; Talk: IEEE International Reliability Physics Symposium (IRPS), Dallas, TX, USA - virtual; 28.04.2020 in "Proceedings of the IEEE International Reliability Physics Symposium (IRPS)", (2020), ISBN: 978-1-7281-3200-6, 1 - 6 doi:10.1109/IRPS45951.2020.9129513. BibTeX |
| 1967. | A. Scharinger, P. Manstetten, A. Hössinger, J. Weinbub: "Generative Model Based Adaptive Importance Sampling for Flux Calculations in Process TCAD"; Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Kobe, Japan - virtual; 23.09.2020 - 06.10.2020; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2020), 39 - 42 doi:10.23919/SISPAD49475.2020.9241615. BibTeX |
| 1966. | X. Klemenschits, S. Selberherr, L. Filipovic: "Geometric Advection Algorithm for Process Emulation"; Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Kobe, Japan - virtual; 23.09.2020 - 06.10.2020; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2020), 59 - 62 doi:10.23919/SISPAD49475.2020.9241678. BibTeX |
| 1965. | L. Filipovic, S. Selberherr: "Granularity Effects in Electromigration"; Talk: IEEE Latin America Electron Devices Conference (LAEDC), San Jose, Costa Rica; (invited) 25.02.2020 - 28.02.2020; in "Proceedings of the IEEE Latin America Electron Devices Conference (LAEDC)", (2020), ISBN: 978-1-7281-1044-8, doi:10.1109/LAEDC49063.2020.9072963. BibTeX |
| 1964. | S. Fiorentini, R. Orio, S. Selberherr, J. Ender, W. Goes, V. Sverdlov: "Influence of Current Redistribution in Switching Models for Perpendicular STT-MRAM"; Talk: Meeting of the Electrochemical Society (ECS), Montreal, Canada - virtual; 10.05.2020 - 14.05.2020; in "Abstracts of the Meeting of the Electrochemical Society (ECS)", (2020), MA2020-01/1389, doi:10.1149/MA2020-01241389mtgabs. BibTeX |
| 1963. | L. Filipovic, S. Selberherr: "Integration of Gas Sensors with CMOS Technology"; Talk: IEEE Electron Devices Technology and Manufacturing Conference (EDTM), Penang, Malaysia - virtual; (invited) 16.03.2020 - 18.03.2020; in "Proceedings of the IEEE Electron Devices Technology and Manufacturing Conference (EDTM)", (2020), ISBN: 978-1-7281-2539-8, 294 - 297 doi:10.1109/EDTM47692.2020.9117828. BibTeX |
| 1962. | Yu. Illarionov, T. Knobloch, M. Waltl, S. Majumdar, M. Soikkeli, W. Kim, S. Wachter, D.K Polyushkin, S. Arpiainen, M. Prunnila, A. Mueller, T. Grasser: "Low Variability and 1010 On/Off Current Ratio in Flexible MoS2 FETs with Al2O3 Encapsulation Improved by Parylene N"; Talk: Electronic Materials Conference (EMC), Columbus, OH, USA - virtual; 24.06.2020 - 26.06.2020; in "Proceedings of the Electronic Materials Conference (EMC)", (2020), 25. BibTeX |
| 1961. | D. Milardovich, M. Jech, D. Waldhör, M. Waltl, T. Grasser: "Machine Learning Prediction of Formation Energies in a-SiO2"; Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Kobe, Japan - virtual; 23.09.2020 - 06.10.2020; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2020), 339 - 342 doi:10.23919/SISPAD49475.2020.9241609. BibTeX |
| 1960. | V. Sverdlov: "Modeling Spin Transfer Torque Magnetoresistive Memory"; Talk: Silvaco Users Global Event (SURGE), Santa Clara, CA, USA - virtual; (invited) 20.10.2020 in "Proceedings of the Silvaco Users Global Event (SURGE)", (2020), 1. BibTeX |
| 1959. | A. Vasilev, M. Jech, A. Grill, G. Rzepa, C. Schleich, A. Makarov, G. Pobegen, T. Grasser, M. Waltl, S. E. Tyaginov: "Modeling the Hysteresis of Current-Voltage Characteristics in 4H-SiC Transistors"; Talk: IEEE International Integrated Reliability Workshop (IIRW), South Lake Tahoe, CA, USA - virtual; 04.10.2020 - 08.10.2020; in "Proceedings of the International Integrated Reliability Workshop (IIRW)", (2020), 1 - 4 doi:10.1109/IIRW49815.2020.9312864. BibTeX |
| 1958. | R. Kosik, J. Cervenka, H. Kosina: "Numerical Solution of the Constrained Wigner Equation"; Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Kobe, Japan - virtual; 23.09.2020 - 06.10.2020; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2020), 189 - 191 doi:10.23919/SISPAD49475.2020.9241624. BibTeX |
| 1957. | A. Kruv, B. Kaczer, A. Grill, M. Gonzalez, J. Franco, D. Linten, W. Goes, T. Grasser, I. De Wolf: "On the Impact of Mechanical Stress on Gate Oxide Trapping"; Talk: IEEE International Reliability Physics Symposium (IRPS), Dallas, TX, USA - virtual; 28.04.2020 - 30.04.2020; in "Proceedings of the IEEE International Reliability Physics Symposium (IRPS)", (2020), 1 - 5 doi:10.1109/IRPS45951.2020.9129541. BibTeX |
| 1956. | S. Fiorentini, R. Orio, S. Selberherr, J. Ender, W. Goes, V. Sverdlov: "Perpendicular STT-MRAM Switching at Fixed Voltage and at Fixed Current"; Talk: IEEE Electron Devices Technology and Manufacturing Conference (EDTM), Penang, Malaysia - virtual; 16.03.2020 - 18.03.2020; in "Proceedings of the IEEE Electron Devices Technology and Manufacturing Conference (EDTM)", (2020), ISBN: 978-1-7281-2539-8, 341 - 344 doi:10.1109/EDTM47692.2020.9117985. BibTeX |
| 1955. | A. Toifl: "Physical Process TCAD: Victory Process´ Crystal Anisotropy Engine"; Talk: Silvaco Users Global Event (SURGE), Santa Clara, CA, USA - virtual; (invited) 20.10.2020 in "Proceedings of the Silvaco Users Global Event (SURGE)", (2020), 1. BibTeX |
| 1954. | J. Michl, A. Grill, D. Claes, G. Rzepa, B. Kaczer, D. Linten, I. Radu, T. Grasser, M. Waltl: "Quantum Mechanical Charge Trap Modeling to Explain BTI at Cryogenic Temperatures"; Talk: IEEE International Reliability Physics Symposium (IRPS), Dallas, TX, USA - virtual; 28.04.2020 - 30.05.2020; in "Proceedings of the IEEE International Reliability Physics Symposium (IRPS)", (2020), ISBN: 978-1-7281-3199-3, 1 - 6 doi:10.1109/IRPS45951.2020.9128349. BibTeX |
| 1953. | R. Orio, J. Ender, S. Fiorentini, W. Goes, S. Selberherr, V. Sverdlov: "Reduced Current Spin-Orbit Torque Switching of a Perpendicularly Magnetized Free Layer"; Talk: Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Caen, France - virtual; 01.09.2020 in "Book of Abstracts of the Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)", (2020), 123 - 124. BibTeX |
| 1952. | A. Grill, E. Bury, J. Michl, S. Tyaginov, D. Linten, T. Grasser, B. Parvais, B. Kaczer, M. Waltl, I. Radu: "Reliability and Variability of Advanced CMOS Devices at Cryogenic Temperatures"; Talk: IEEE International Reliability Physics Symposium (IRPS), Dallas, TX, USA - virtual; 28.04.2020 - 30.04.2020; in "Proceedings of the IEEE International Reliability Physics Symposium (IRPS)", (2020), ISBN: 978-1-7281-3199-3, 1 - 6 doi:10.1109/IRPS45951.2020.9128316. BibTeX |
| 1951. | M. Quell, G. Diamantopoulos, A. Hössinger, J. Weinbub: "Shared-Memory Block-Based Fast Marching Method for Hierarchical Meshes"; Talk: European Seminar on Computing (ESCO), Pilsen, Czech Republic - virtual; 08.06.2020 - 11.06.2020; in "Proceedings of the European Seminar on Computing (ESCO)", (2020), 1 page(s) . BibTeX |
| 1950. | J. Berens, M. Weger, G. Pobegen, T. Aichinger, G. Rescher, C. Schleich, T. Grasser: "Similarities and Differences of BTI in SiC and Si Power MOSFETs"; Talk: IEEE International Reliability Physics Symposium (IRPS), Dallas, TX, USA - virtual; 29.03.2020 - 02.04.2020; in "Proceedings of the IEEE International Reliability Physics Symposium (IRPS)", (2020), ISBN: 978-1-7281-3200-6, 1 - 6 doi:10.1109/IRPS45951.2020.9129259. BibTeX |
| 1949. | M. Ballicchia, M. Nedjalkov, J. Weinbub: "Single Electron Control by a Uniform Magnetic Field in a Focusing Double-Well Potential Structure"; Talk: IEEE International Conference on Nanotechnology (NANO), Montreal, Canada - virtual; 29.07.2020 - 31.07.2020; in "Proceedings of the IEEE International Conference on Nanotechnology (NANO)", (2020), ISBN: 978-1-7281-8264-3, 73 - 76 doi:10.1109/NANO47656.2020.9183565. BibTeX |
| 1948. | M. Waltl: "Spectroscopy of Single Defects in Semiconductor Transistors"; Talk: International Conference on Materials Science and Engineering (MatScience), San Francisco, CA, USA - virtual; (invited) 05.11.2020 - 06.11.2020; in "Book of Abstracts of the International Conference on Materials Science and Engineering (MatScience)", (2020), . BibTeX |
| 1947. | V. Sverdlov, A.-M. El-Sayed, S. Selberherr: "Subband Structure and Ballistic Conductance of a Molybdenum Disulfide Nanoribbon in Topological 1T´ Phase: A k∙p Study"; Talk: International Conference on Mixed Design of Integrated Circuits and Systems (MIXDES), Lodz, Poland - virtual; 25.06.2020 - 27.06.2020; in "Book of Abstracts of the International Conference on Mixed Design of Integrated Circuits and Systems (MIXDES)", (2020), 58. BibTeX |
| 1946. | R. Orio, A. Makarov, W. Goes, J. Ender, S. Fiorentini, S. Selberherr, V. Sverdlov: "Switching of a Perpendicularly Magnetized Free-Layer by Spin-Orbit-Torques with Reduced Currents"; Talk: World Multi-Conference on Systemics, Cybernetics and Informatics (WMSCI), Orlando, FL, USA - virtual; 13.09.2020 - 16.09.2020; in "Proceedings of the World Multi-Conference on Systemics, Cybernetics and Informatics (WMSCI)", (2020), ISBN: 978-1-950492-37-4, 58 - 61. BibTeX |
| 1945. | T. Knobloch, Yu. Illarionov, B. Uzlu, M. Waltl, D. Neumaier, M. Lemme, T. Grasser: "The Impact of the Graphene Work Function on the Stability of Flexible GFETs"; Talk: Electronic Materials Conference (EMC), Columbus, OH, USA - virtual; 24.06.2020 - 26.06.2020; in "Proceedings of the Electronic Materials Conference (EMC)", (2020), . BibTeX |
| 1944. | T. Grasser, B. Kaczer, B. O´Sullivan, G. Rzepa, B. Stampfer, M. Waltl: "The Mysterious Bipolar Bias Temperature Stress from the Perspective of Gate-Sided Hydrogen Release"; Talk: IEEE International Reliability Physics Symposium (IRPS), Dallas, TX, USA - virtual; 28.04.2020 - 30.04.2020; in "Proceedings of the IEEE International Reliability Physics Symposium (IRPS)", (2020), ISBN: 978-1-7281-3200-6, 1 - 6 doi:10.1109/IRPS45951.2020.9129198. BibTeX |
| 1943. | V. Sverdlov, H. Kosina: "Topologically Protected and Conventional Subbands in a 1T´-MoS2 Nanoribbon Channel"; Poster: Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Caen, France - virtual; 01.09.2020 in "Book of Abstracts of the Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)", (2020), 68 - 69. BibTeX |
| 1942. | K. Rupp: "Vendor-Optimized vs. Portable Performance: Approaches to Get Both"; Talk: SIAM Conference on Parallel Processing for Scientific Computing (PP), Seattle, WA, USA; 12.02.2020 - 15.02.2020; . BibTeX |
| 1941. | Yu. Illarionov, T. Knobloch, T. Grasser: "Where Are the Best Insulators for 2D Field-Effect Transistors?"; Talk: Meeting of the Electrochemical Society (ECS), Montreal, Canada - virtual; (invited) 10.05.2020 - 14.05.2020; in "Abstracts of the Meeting of the Electrochemical Society (ECS)", (2020), MA2020-01/844, doi:10.1149/MA2020-0110844mtgabs. BibTeX |
| 1940. | R. Orio, A. Makarov, J. Ender, S. Fiorentini, W. Goes, S. Selberherr, V. Sverdlov: "A Dynamical Approach to Fast and Reliable External Field Free Perpendicular Magnetization Reversal by Spin-Orbit Torques"; Poster: IEEE International Electron Devices Meeting (IEDM), San Francisco, USA; 07.12.2019 - 11.12.2019; in "Proceedings of the IEEE International Electron Devices Meeting (IEDM) Special Poster Session Dedicated to MRAM", (2019), 1 page(s) . BibTeX |
| 1939. | L. Gnam, P. Manstetten, M. Quell, K. Rupp, S. Selberherr, J. Weinbub: "A Flexible Shared-Memory Parallel Mesh Adaptation Framework"; Talk: International Conference on Computational Science and Its Applications (ICCSA), Saint Petersburg , Russia; 01.07.2019 - 04.07.2019; in "Proceedings of the International Conference on Computational Science and Its Applications (ICCSA)", (2019), ISBN: 978-1-7281-2847-4, 158 - 165 doi:10.1109/ICCSA.2019.00016. BibTeX |
| 1938. | M. Nedjalkov, J. Weinbub, M. Ballicchia, S. Selberherr, I. Dimov, D.K. Ferry, K. Rupp: "A Gauge-Invariant Wigner Equation for General Electromagnetic Fields"; Talk: International Workshop on Computational Nanotechnology (IWCN), Chicago, IL, USA; 20.05.2019 - 24.05.2019; in "Book of Abstracts of the International Workshop on Computational Nanotechnology (IWCN)", (2019), ISBN: 978-3-9504738-0-3, 67 - 68. BibTeX |
| 1937. | L.F. Aguinsky, P. Manstetten, A. Hössinger, S. Selberherr, J. Weinbub: "A Mathematical Extension to Knudsen Diffusion Including Direct Flux and Accurate Geometric Description"; Poster: International Workshop on Computational Nanotechnology (IWCN), Chicago, IL, USA; 20.05.2019 - 24.05.2019; in "Book of Abstracts of the International Workshop on Computational Nanotechnology (IWCN)", (2019), ISBN: 978-3-9504738-0-3, 109 - 110. BibTeX |
| 1936. | V. Sverdlov, S. Selberherr: "A Monte Carlo Evaluation of Current and Low Frequency Current Noise at Spin-Dependent Hopping in Magnetic Tunnel Junctions"; Talk: International Conference on Large-Scale Scientific Computations (LSSC), Sozopol, Bulgaria; 10.06.2019 - 14.06.2019; in "Proceedings of the International Conference on Large-Scale Scientific Computations (LSSC)", (2019), 96. BibTeX |
| 1935. | R. Kosik, H. Kosina: "A Revised Wigner Function Approach for Stationary Quantum Transport"; Talk: International Conference on Large-Scale Scientific Computations (LSSC), Sozopol, Bulgaria; 10.06.2019 - 14.06.2019; in "Proceedings of the International Conference on Large-Scale Scientific Computations (LSSC)", (2019), 70 - 71. BibTeX |
| 1934. | H. Kosina, G. Indalecio: "A Two-Particle Monte Carlo Method for Carrier Transport in the Presence of Electron-Electron Scattering"; Talk: International Workshop on Computational Nanotechnology (IWCN), Chicago, IL, USA; 20.05.2019 - 24.05.2019; in "Book of Abstracts of the International Workshop on Computational Nanotechnology (IWCN)", (2019), ISBN: 978-3-9504738-0-3, 93 - 94. BibTeX |
| 1933. | Z. Wu, J. Franco, D. Claes, G. Rzepa, P. Roussel, N. Collaert, G Groeseneken, D. Linten, T. Grasser, B. Kaczer: "Accelerated Capture and Emission (ACE) Measurement Pattern for Efficient BTI Characterization and Modeling"; Talk: IEEE International Reliability Physics Symposium (IRPS), Monterey, CA, USA; 31.03.2019 - 04.04.2019; in "Proceedings of the IEEE International Reliability Physics Symposium (IRPS)", (2019), ISBN: 978-1-5386-9504-3, 1 - 7 doi:10.1109/IRPS.2019.8720541. BibTeX |
| 1932. | H. Ceric, H. Zahedmanesh: "Advanced Modeling and Simulation of Cu Nano-Interconnects Reliability"; Poster: IEEE International Interconnect Technology Conference (IITC), Brussels, Belgium; 03.06.2019 - 06.06.2019; in "Proceedings of the International Interconnect Technology Conference (IITC)", (2019), . BibTeX |
| 1931. | L.F. Aguinsky, P. Manstetten, A. Hössinger, S. Selberherr, J. Weinbub: "An Extended Knudsen Diffusion Model for Aspect Ratio Dependent Atomic Layer Etching"; Talk: International Workshop on Atomic Layer Etching (ALE), Bellevue, WA, USA; 21.07.2019 - 24.07.2019; in "Abstracts of the International Conference on Atomic Layer Deposition (ALD) Featuring the International Workshop on Atomic Layer Etching (ALE)", (2019), 109. BibTeX |
| 1930. | H. Ceric, H. Zahedmanesh, K. Croes: "Analysis of Electromigration Failure of Nano-Interconnects through a Combination of Modeling and Experimental Methods"; Talk: European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), Toulouse, France; 23.09.2019 - 26.09.2019; . BibTeX |
| 1929. | H. Ceric, S. Selberherr, H. Zahedmanesh, R. Orio, K. Croes: "Assessment of Electromigration in Nano‐Interconnects"; Talk: International Conference on Reliability and Stress-Related Phenomena in Nanoelectronics (IRSP), San Jose, USA; (invited) 04.11.2019 - 06.11.2019; in "Abstracts of the International Conference on Reliability and Stress-Related Phenomena in Nanoelectronics (IRSP)", (2019), 7. BibTeX |
| 1928. | S. Selberherr, L. Filipovic: "CMOS Compatible Gas Sensors"; Talk: International Conference on Materials Science and Engineering, San Francisco, CA, USA; (invited) 18.02.2019 - 20.02.2019; in "Book of Abstracts of the International Conference on Materials Science and Engineering", (2019), 1 page(s) . BibTeX |
| 1927. | V. Sverdlov, S. Selberherr: "CMOS Technology Compatible Magnetic Memories"; Talk: International Symposium on Next-Generation Electronics (ISNE), Zhengzhou, China; (invited) 09.10.2019 - 10.10.2019; in "Proceedings of the International Symposium on Next Generation Electronics (ISNE)", (2019), ISBN: 978-1-7281-2062-1, doi:10.1109/ISNE.2019.8896421. BibTeX |
| 1926. | L. Filipovic, S. Selberherr: "CMOS-Compatible Gas Sensors"; Talk: International Conference on Microelectronics (MIEL), Nis, Serbia; (invited) 16.09.2019 - 18.09.2019; in "Proceedings of the International Conference on Microelectronics (MIEL)", (2019), 9 - 16 doi:10.1109/MIEL.2019.8889585. BibTeX |
| 1925. | Yu. Illarionov, A. Banshchikov, D.K Polyushkin, S. Wachter, M. Vexler, N. S. Sokolov, T. Müller, T. Grasser: "CaF2 Insulators for Ultrascaled 2D Field Effect Transistors"; Talk: Graphene Week, Helsinki, Finland; (invited) 23.09.2019 - 27.09.2019; . BibTeX |
| 1924. | T. Grasser: "CaF2 Insulators for Ultrascaled 2D Field Effect Transistors"; Talk: IEEE EDS Distinguished Lecture at RWTH Aachen, Aachen, Germany; (invited) 26.11.2019. BibTeX |
| 1923. | T. Grasser: "CaF2 Insulators for Ultrascaled 2D Field Effect Transistors"; Talk: Workshop "Wafer-scale Integration of 2D materials", Aachen, Germany; (invited) 13.11.2019. BibTeX |
| 1922. | M. Waltl: "Characterization and Modeling of Single Charge Trapping in MOS Transistors"; Talk: IEEE International Integrated Reliability Workshop (IIRW), South Lake Tahoe, CA, USA; (invited) 13.10.2019 - 17.10.2019; in "Proceedings of the IEEE International Integrated Reliability Workshop (IIRW)", (2019), 1 - 9 doi:10.1109/IIRW47491.2019.8989880. BibTeX |
| 1921. | V. Sverdlov, S. Selberherr: "Combining Perpendicular and Shape Anisotropy for Optimal Switching of Advanced Spin-Orbit Torque Memory Cells"; Talk: IEEE Electron Devices Technology and Manufacturing Conference (EDTM), Singapore; 13.03.2019 - 15.03.2019; in "Proceedings of the IEEE Electron Devices Technology and Manufacturing Conference (EDTM)", (2019), ISBN: 978-1-5386-6508-4, 151 - 153 doi:10.1109/EDTM.2019.8731330. BibTeX |
| 1920. | S. Fiorentini, R. Orio, W. Goes, J. Ender, V. Sverdlov: "Comprehensive Comparison of Switching Models for Perpendicular Spin Transfer Torque MRAM Cells"; Poster: European Materials Research Society (EMRS), Warsaw, Poland; 16.09.2019 - 19.09.2019; . BibTeX |
| 1919. | S. Fiorentini, R. Orio, W. Goes, J. Ender, V. Sverdlov: "Comprehensive Comparison of Switching Models for Perpendicular Spin-Transfer Torque MRAM Cells"; Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Udine, Italy; 04.09.2019 - 06.09.2019; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2019), ISBN: 978-1-7281-0938-1, 57 - 60 doi:10.1109/SISPAD.2019.8870359. BibTeX |
| 1918. | S. Fiorentini, R. Orio, S. Selberherr, J. Ender, W. Goes, V. Sverdlov: "Comprehensive Modeling of Switching in Perpendicular STT-MRAM"; Poster: Workshop on Innovative Nanoscale Devices and Systems (WINDS), Kona, HI, USA; 01.12.2019 - 06.12.2019; in "Abstracts of the Workshop on Innovative Nanoscale Devices and Systems (WINDS)", (2019), ISBN: 978-0-578-61722-0, 107 - 108. BibTeX |
| 1917. | J. Weinbub, M. Nedjalkov: "Computational Strategies for Two-Dimensional Wigner Monte Carlo"; High Performance Computing Conference (HPC), Borovets, Bulgaria; (invited) 02.09.2019 - 06.09.2019; in "Procedings of the High Performance Computing Conference (HPC)", (2019), 55 - 56. BibTeX |
| 1916. | H. Kosina, M. Kampl: "Current Estimation in Backward Monte Carlo Simulations"; Poster: International Workshop on Computational Nanotechnology (IWCN), Chicago, IL, USA; 20.05.2019 - 24.05.2019; in "Book of Abstracts of the International Workshop on Computational Nanotechnology (IWCN)", (2019), ISBN: 978-3-9504738-0-3, 129 - 130. BibTeX |
| 1915. | M. Ballicchia, M. Nedjalkov, J. Weinbub: "Effects of Repulsive Dopants on Quantum Transport in a Nanowire"; Poster: International Workshop on Computational Nanotechnology (IWCN), Chicago, IL, USA; 20.05.2019 - 24.05.2019; in "Book of Abstracts of the International Workshop on Computational Nanotechnology (IWCN)", (2019), ISBN: 978-3-9504738-0-3, 115 - 116. BibTeX |
| 1914. | R. Orio, A. Makarov, S. Selberherr, W. Goes, J. Ender, S. Fiorentini, V. Sverdlov: "Efficient Magnetic Field Free Switching of Symmetric Perpendicular Magnetic Free Layer for Advanced SOT-MRAM"; Talk: Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Grenoble, France; 01.04.2019 - 03.04.2019; in "Proceedings of the Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)", (2019), 152 - 153. BibTeX |
| 1913. | L. Filipovic, R. Orio: "Electromigration in Nano-Interconnects"; Talk: Workshop on High Performance TCAD (WHPTCAD), Chicago, IL, USA; (invited) 24.05.2019 - 25.05.2019; in "Book of Abstracts of the Workshop on High Performance TCAD (WHPTCAD)", (2019), 2. BibTeX |
| 1912. | M. Ballicchia, M. Nedjalkov, J. Weinbub: "Electron Evolution and Boundary Conditions in the Wigner Signed-Particle Approach"; Talk: International Wigner Workshop (IW2), Chicago, IL, USA; 19.05.2019 - 20.05.2019; in "Book of Abstracts of the International Wigner Workshop (IW2)", (2019), ISBN: 978-3-9504738-1-0, 24 - 25. BibTeX |
| 1911. | J. Weinbub, M. Ballicchia, D.K. Ferry, M. Nedjalkov: "Electron Interference and Wigner Function Negativity in Dopant Potential Structures"; Talk: International Wigner Workshop (IW2), Chicago, IL, USA; 19.05.2019 - 20.05.2019; in "Book of Abstracts of the International Wigner Workshop (IW2)", (2019), ISBN: 978-3-9504738-1-0, 14 - 15. BibTeX |
| 1910. | J. Weinbub, M. Ballicchia, M. Nedjalkov: "Electron Interference in Single- and Double-Dopant Potential Structures"; Talk: International Conference on Large-Scale Scientific Computations (LSSC), Sozopol, Bulgaria; 10.06.2019 - 14.06.2019; in "Proceedings of the International Conference on Large-Scale Scientific Computations (LSSC)", (2019), 103 - 104. BibTeX |
| 1909. | Yu. Illarionov, A. Banshchikov, M. Vexler, D.K Polyushkin, S. Wachter, M. Thesberg, N. S. Sokolov, T. Mueller, T. Grasser: "Epitaxial CaF2: a Route towards Scalable 2D Electronics"; Poster: International Conference on Physics of 2D Crystals (ICP2DC4), Hangzhou, China; 10.06.2019 - 15.06.2019; in "Proceedings of the International Conference on Physics of 2D Crystals (ICP2DC4)", (2019), 69. BibTeX |
| 1908. | X. Klemenschits, S. Selberherr, L. Filipovic: "Fast Volume Evaluation on Sparse Level Sets"; Poster: International Workshop on Computational Nanotechnology (IWCN), Chicago, IL, USA; 20.05.2019 - 24.05.2019; in "Book of Abstracts of the International Workshop on Computational Nanotechnology (IWCN)", (2019), ISBN: 978-3-9504738-0-3, 113 - 114. BibTeX |
| 1907. | M. Jech, S. Tyaginov, B. Kaczer, J. Franco, D. Jabs, C. Jungemann, M. Waltl, T. Grasser: "First-Principles Parameter-Free Modeling of n- and p-FET Hot-Carrier Degradation"; Talk: IEEE International Electron Devices Meeting (IEDM), San Francisco , USA; 07.12.2019 - 11.12.2019; in "Proceedings of the IEEE International Electron Devices Meeting (IEDM)", (2019), doi:10.1109/IEDM19573.2019.8993630. BibTeX |
| 1906. | M. Vandemaele, B. Kaczer, S. E. Tyaginov, Z. Stanojevic, A. Makarov, A. Chasin, E. Bury, H. Mertens, D. Linten, G Groeseneken: "Full (Vg, Vd) Bias Space Modeling of Hot-Carrier Degradation in Nanowire FETs"; Talk: IEEE International Reliability Physics Symposium (IRPS), Monterey, CA, USA; 31.03.2019 - 04.04.2019; in "Proceedings of the IEEE International Reliability Physics Symposium (IRPS)", (2019), ISBN: 978-1-5386-9504-3, 1 - 7 doi:10.1109/IRPS.2019.8720406. BibTeX |
| 1905. | B. O´Sullivan, R. Ritzenthaler, G. Rzepa, Z. Wu, E. D. Litta, O. Richard, T. Conard, V. Machkaoutsan, P. Fazan, C. Kim, J. Franco, B. Kaczer, T. Grasser, A. Spessot, D. Linten, N. Horiguchi: "Gate-Stack Engineered NBTI Improvements in Highvoltage Logic-For-Memory High-κ/Metal Gate Devices"; Talk: IEEE International Reliability Physics Symposium (IRPS), Monterey, CA, USA; 31.03.2019 - 04.04.2019; in "Proceedings of the IEEE International Reliability Physics Symposium (IRPS)", (2019), ISBN: 978-1-5386-9504-3, 1 - 8 doi:10.1109/IRPS.2019.8720598. BibTeX |
| 1904. | A. Hössinger, P. Manstetten, G. Diamantopoulos, M. Quell, J. Weinbub: "High Performance Computing Aspects in Semiconductor Process Simulation"; Talk: Workshop on High Performance TCAD (WHPTCAD), Chicago, IL, USA; (invited) 24.05.2019 - 25.05.2019; in "Book of Abstracts of the Workshop on High Performance TCAD (WHPTCAD)", (2019), 3 - 4. BibTeX |
| 1903. | P. Manstetten, G. Diamantopoulos, L. Gnam, L.F. Aguinsky, M. Quell, A. Toifl, A. Scharinger, A. Hössinger, M. Ballicchia, M. Nedjalkov, J. Weinbub: "High Performance TCAD: From Simulating Fabrication Processes to Wigner Quantum Transport"; Talk: Workshop on High Performance TCAD (WHPTCAD), Chicago, IL, USA; 24.05.2019 - 25.05.2019; in "Book of Abstracts of the Workshop on High Performance TCAD (WHPTCAD)", (2019), 13. BibTeX |
| 1902. | P. Manstetten, L.F. Aguinsky, S. Selberherr, J. Weinbub: "High-Performance Ray Tracing for Nonimaging Applications"; Talk: Workshop on High Performance TCAD (WHPTCAD), Chicago, IL, USA; 24.05.2019 - 25.05.2019; in "Book of Abstracts of the Workshop on High Performance TCAD (WHPTCAD)", (2019), 20. BibTeX |
| 1901. | V. Sverdlov, S. Selberherr: "Hopping in a Multiple Ferromagnetic Terminal Configuration"; Talk: International Workshop on Computational Nanotechnology (IWCN), Chicago, IL, USA; 20.05.2019 - 24.05.2019; in "Book of Abstracts of the International Workshop on Computational Nanotechnology (IWCN)", (2019), ISBN: 978-3-9504738-0-3, 75 - 77. BibTeX |
| 1900. | J. Scharlotta, G. Bersuker, S. E. Tyaginov, C. Young, G. Haase, G. Rzepa, M. Waltl, T. Chohan, S. Iyer, A. Kotov, C. Zambelli, F. Guarin, F. M. Puglisi, C. Ostermaier: "IIRW 2019 Discussion Group II: Reliability for Aerospace Applications"; Talk: IEEE International Integrated Reliability Workshop (IIRW), South Lake Tahoe, CA, USA; 13.10.2019 - 17.10.2019; in "Proceedings of the International Integrated Reliability Workshop (IIRW)", (2019), 1 - 4 doi:10.1109/IIRW47491.2019.8989910. BibTeX |
| 1899. | J. Ender, R. Orio, S. Fiorentini, W. Goes, V. Sverdlov: "Large-Scale Finite Element Micromagnetics Simulations using Open Source Software"; Poster: European Materials Research Society (EMRS), Warsaw, Poland; 16.09.2019 - 19.09.2019; . BibTeX |
| 1898. | M. Ballicchia, D.K. Ferry, M. Nedjalkov, J. Weinbub: "Linking Wigner Function Negativity to Quantum Coherence in a Nanowire"; Talk: International Workshop on Computational Nanotechnology (IWCN), Chicago, IL, USA; 20.05.2019 - 24.05.2019; in "Book of Abstracts of the International Workshop on Computational Nanotechnology (IWCN)", (2019), ISBN: 978-3-9504738-0-3, 59 - 60. BibTeX |
| 1897. | A. Shah, M. Waltl: "Low Cost and High Performance Radiation Hardened Latch Design for Reliable Circuits"; Talk: IEEE International Conference on Electronics Circuits and Systems (ICECS), Genova, Italy; 27.11.2019 - 29.11.2019; in "Proceedings of the IEEE International Conference on Electronics Circuits and Systems (ICECS)", (2019), 197 - 200 doi:10.1109/ICECS46596.2019.8964962. BibTeX |
| 1896. | J. Franco, Z. Wu, G. Rzepa, A. Vandooren, H. Arimura, D. Claes, N. Horiguchi, N. Collaert, D. Linten, T. Grasser, B. Kaczer: "Low Thermal Budget Dual-Dipole Gate Stacks Engineered for Sufficient BTI Reliability in Novel Integration Schemes"; Talk: IEEE Electron Devices Technology and Manufacturing Conference (EDTM), Singapore; (invited) 12.03.2019 - 15.03.2019; in "Proceedings of the IEEE Electron Devices Technology and Manufacturing Conference (EDTM)", (2019), ISBN: 978-1-5386-6508-4, 215 - 217 doi:10.1109/EDTM.2019.8731237. BibTeX |
| 1895. | V. Sverdlov: "Magnetic Field Free Switching of a Perpendicular SOT MRAM Cell"; Talk: LETI Innovation days: Advanced Simulation for Non-Volatile Memory Workshop, Grenoble, France; (invited) 28.06.2019. BibTeX |
| 1894. | R. Orio, S. Selberherr, V. Sverdlov: "Magnetic Field-Free Deterministic Switching of a Perpendicular Magnetic Layer by Spin-Orbit Torques"; Talk: SPIE Spintronics, San Diego, CA, USA; (invited) 11.08.2019 - 15.08.2019; in "Proceedings of SPIE Spintronics", (2019), 11090-123. BibTeX |
| 1893. | D. Waldhör, Y. Wimmer, A.-M. El-Sayed, W. Goes, M. Waltl, T. Grasser: "Minimum Energy Paths for Non-Adiabatic Charge Transitions in Oxide Defects"; Talk: IEEE International Integrated Reliability Workshop (IIRW), South Lake Tahoe, CA, USA; 13.10.2019 - 17.10.2019; in "Proceedings of the IEEE International Integrated Reliability Workshop (IIRW)", (2019), 1 - 5 doi:10.1109/IIRW47491.2019.8989889. BibTeX |
| 1892. | L. Filipovic: "Modeling and Simulation of Atomic Layer Deposition"; Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Udine, Italy; 04.09.2019 - 06.09.2019; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2019), ISBN: 978-1-7281-0938-1, 323 - 326 doi:10.1109/SISPAD.2019.8870462. BibTeX |
| 1891. | A. Makarov, B. Kaczer, Ph. Roussel, A. Chasin, A. Grill, M. Vandemaele, G. Hellings, A.-M. El-Sayed, T. Grasser, D. Linten, S. E. Tyaginov: "Modeling the Effect of Random Dopants on Hot-Carrier Degradation in FinFETs"; Talk: IEEE International Reliability Physics Symposium (IRPS), Monterey, CA, USA; 31.03.2019 - 04.04.2019; in "Proceedings of the IEEE International Reliability Physics Symposium (IRPS)", (2019), ISBN: 978-1-5386-9504-3, doi:10.1109/IRPS.2019.8720584. BibTeX |
| 1890. | A. Toifl, M. Quell, A. Hössinger, A. Babayan, S. Selberherr, J. Weinbub: "Novel Numerical Dissipation Scheme for Level-Set Based Anisotropic Etching Simulations"; Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Udine, Italy; 04.09.2019 - 06.09.2019; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2019), ISBN: 978-1-7281-0938-1, 327 - 330 doi:10.1109/SISPAD.2019.8870443. BibTeX |
| 1889. | A. Makarov, Ph. Roussel, E. Bury, M. Vandemaele, A. Spessot, D. Linten, B. Kaczer, S. E. Tyaginov: "On Correlation Between Hot-Carrier Stress Induced Device Parameter Degradation and Time-Zero Variability"; Talk: IEEE International Integrated Reliability Workshop (IIRW), South Lake Tahoe, USA; 13.10.2019 - 17.10.2019; in "Proceedings of the IEEE International Integrated Reliability Workshop (IIRW)", (2019), ISBN: 978-1-7281-2203-8, doi:10.1109/IIRW47491.2019.8989882. BibTeX |
| 1888. | R. Kosik, M. Thesberg, J. Weinbub, H. Kosina: "On the Consistency of the Stationary Wigner Equation"; Talk: International Wigner Workshop (IW2), Chicago, IL, USA; 19.05.2019 - 20.05.2019; in "Book of Abstracts of the International Wigner Workshop (IW2)", (2019), ISBN: 978-3-9504738-1-0, 30 - 31. BibTeX |
| 1887. | M. Quell, G. Diamantopoulos, A. Hössinger, S. Selberherr, J. Weinbub: "Parallelized Bottom-Up Correction in Hierarchical Re-Distancing for Topography Simulation"; Talk: High Performance Computing Conference (HPC), Borovets, Bulgaria; 02.09.2019 - 06.09.2019; in "Procedings of the High Performance Computing Conference (HPC)", (2019), 45. BibTeX |
| 1886. | M. Quell, P. Manstetten, A. Hössinger, S. Selberherr, J. Weinbub: "Parallelized Construction of Extension Velocities for the Level-Set Method"; Talk: International Conference on Parallel Processing and Applied Mathematics (PPAM), Bialystok, Poland; 08.09.2019 - 11.09.2019; in "Proceedings of the International Conference on Parallel Processing and Applied Mathematics (PPAM)", (2019), 42. BibTeX |
| 1885. | M. Quell, A. Toifl, A. Hössinger, S. Selberherr, J. Weinbub: "Parallelized Level-Set Velocity Extension Algorithm for Nanopatterning Applications"; Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Udine, Italy; 04.09.2019 - 06.09.2019; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2019), ISBN: 978-1-7281-0938-1, 335 - 338 doi:10.1109/SISPAD.2019.8870482. BibTeX |
| 1884. | S. Majumdar, M. Soikkeli, W. Kim, Yu. Illarionov, S. Wachter, D.K Polyushkin, S. Arpiainen, M. Prunnila: "Passivation controlled field effect mobility in 2D semiconductor based FET devices for high performance logic circuit development on flexible platform"; Poster: Graphene Week, Helsinki, Finland; 23.09.2019 - 27.09.2019; . BibTeX |
| 1883. | C. Schleich, J. Berens, G. Rzepa, G. Pobegen, G. Rescher, S. E. Tyaginov, T. Grasser, M. Waltl: "Physical Modeling of Bias Temperature Instabilities in SiC MOSFETs"; Talk: IEEE International Electron Devices Meeting (IEDM), San Francisco, USA; 07.12.2019 - 11.12.2019; in "Proceedings of the IEEE International Electron Devices Meeting (IEDM)", (2019), doi:10.1109/IEDM19573.2019.8993446. BibTeX |
| 1882. | S. E. Tyaginov, A. Chasin, A. Makarov, A.-M. El-Sayed, M. Jech, A. De Keersgieter, G. Eneman, M. Vandemaele, J. Franco, D. Linten, B. Kaczer: "Physics-based Modeling of Hot-Carrier Degradation in Ge NWFETs"; Talk: International Conference on Solid State Devices and Materials (SSDM), Nagoya, Japan; 02.09.2019 - 05.09.2019; in "Extended Abstracts of the International Conference on Solid State Devices and Materials (SSDM)", (2019), 565 - 566. BibTeX |
| 1881. | M. Nedjalkov, J. Weinbub, M. Ballicchia, S. Selberherr, I. Dimov, D.K. Ferry, K. Rupp: "Posedness of Stationary Wigner Equation"; Talk: International Wigner Workshop (IW2), Chicago, IL, USA; 19.05.2019 - 20.05.2019; in "Book of Abstracts of the International Wigner Workshop (IW2)", (2019), ISBN: 978-3-9504738-1-0, 32 - 33. BibTeX |
| 1880. | M. Ballicchia, M. Nedjalkov, S. Selberherr, J. Weinbub: "Potentials for Single Electron State Processing"; Poster: Workshop on Innovative Nanoscale Devices and Systems (WINDS), Kona, HI, USA; 01.12.2019 - 06.12.2019; in "Abstracts of the Workshop on Innovative Nanoscale Devices and Systems (WINDS)", (2019), ISBN: 978-0-578-61722-0, 111 - 112. BibTeX |
| 1879. | X. Klemenschits, P. Manstetten, L. Filipovic, S. Selberherr: "Process Simulation in the Browser: Porting ViennaTS using WebAssembly"; Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Udine, Italy; 04.09.2019 - 06.09.2019; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2019), ISBN: 978-1-7281-0938-1, 339 - 342 doi:10.1109/SISPAD.2019.8870374. BibTeX |
| 1878. | G. Diamantopoulos, P. Manstetten, L. Gnam, V. Simonka, L.F. Aguinsky, M. Quell, A. Toifl, A. Hössinger, J. Weinbub: "Recent Advances in High Performance Process TCAD"; Talk: SIAM Conference on Computational Science and Engineering, Spokane, WA, USA; 25.02.2019 - 01.03.2019; in "CSE19 Abstracts", (2019), 335. BibTeX |
| 1877. | Yu. Illarionov, A. Banshchikov, D.K Polyushkin, S. Wachter, M. I. Vexler, N. S. Sokolov, T. Müller, T. Grasser: "Reliability and Thermal Stability of MoS2 FETs with Ultrathin CaF2 Insulator"; Talk: IEEE Nanotechnology Materials and Devices Conference (NMDC), Stockholm, Sweden; (invited) 27.10.2019 - 30.10.2019; . BibTeX |
| 1876. | Yu. Illarionov, T. Grasser: "Reliability of 2D Field-Effect Transistors: from First Prototypes to Scalable Devices"; Talk: IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), Hangzhou, China; (invited) 02.07.2019 - 05.07.2019; in "Proceedings of the International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA)", (2019), 1 - 6 doi:10.1109/IPFA47161.2019.8984799. BibTeX |
| 1875. | R. Orio, A. Makarov, S. Selberherr, W. Gös, J. Ender, S. Fiorentini, V. Sverdlov: "Robust Magnetic Field Free Switching Scheme for Perpendicular Free Layer in Advanced Spin Orbit Torque Magnetoresistive Random Access Memory"; Talk: International Workshop on Computational Nanotechnology (IWCN), Chicago, IL, USA; 20.05.2019 - 24.05.2019; in "Book of Abstracts of the International Workshop on Computational Nanotechnology (IWCN)", (2019), ISBN: 978-3-9504738-0-3, 69 - 71. BibTeX |
| 1874. | R. Orio, S. Selberherr, J. Ender, S. Fiorentini, W. Goes, V. Sverdlov: "Robustness of the Two-Pulse Switching Scheme for SOT-MRAM"; Talk: Workshop on Innovative Nanoscale Devices and Systems (WINDS), Kona, HI, USA; 01.12.2019 - 06.12.2019; in "Abstracts of the Workshop on Innovative Nanoscale Devices and Systems (WINDS)", (2019), ISBN: 978-0-578-61722-0, 54 - 55. BibTeX |
| 1873. | V. Sverdlov, S. Selberherr: "Shot Noise in Magnetic Tunnel Junctions"; Talk: World Multi-Conference on Systemics, Cybernetics and Informatics (WMSCI), Orlando, FL, USA; 06.07.2019 - 09.07.2019; in "Proceedings of the World Multi-Conference on Systemics, Cybernetics and Informatics (WMSCI) Volume II", (2019), ISBN: 978-1-950492-09-1, 19 - 22. BibTeX |
| 1872. | A. Makarov, B. Kaczer, Ph. Roussel, A. Chasin, M. Vandemaele, G. Hellings, A.-M. El-Sayed, M. Jech, T. Grasser, D. Linten, S. E. Tyaginov: "Simulation Study: the Effect of Random Dopants and Random Traps on Hot-Carrier Degradation in nFinFETs"; Talk: International Conference on Solid State Devices and Materials (SSDM), Nagoya, Japan; 02.09.2019 - 05.09.2019; in "Extended Abstracts of the International Conference on Solid State Devices and Materials (SSDM)", (2019), 609 - 610. BibTeX |
| 1871. | V. Sverdlov, S. Selberherr: "Spin-Based CMOS-Compatible Memories"; International Nanoelectronics Conference (INEC), Kuching, Malaysia; (invited) 03.07.2019 - 05.07.2019; in "Proceedings of the International Nanoelectronics Conferences (INEC)", (2019), ISSN: 2159-3531, doi:10.1109/INEC.2019.8853848. BibTeX |
| 1870. | V. Sverdlov: "Spin-based Electronics: Recent Developments and Trends"; Talk: International Conference on Modern Problems in the Physics of Surfaces and Nanostructures (ICMPSN), Yaroslavl, Russia; (invited) 26.08.2019 - 29.08.2019; in "Proceedings of the International Conference on Modern Problems in the Physics of Surfaces and Nanostructures (ICMPSN)", (2019), 7. BibTeX |
| 1869. | V. Sverdlov, S. Selberherr: "Spintronic Memories"; Talk: Energy-Materials-Nanotechnology Fall Meeting (EMN), Chengdu, China; (invited) 16.12.2019 - 19.12.2019; in "Abstracts of the Energy-Materials-Nanotechnology Fall Meeting (EMN)", (2019), 19 - 21. BibTeX |
| 1868. | B. Stampfer, M. Simicic, P. Weckx, A. Abbasi, B. Kaczer, T. Grasser, M. Waltl: "Statistical Characterization of BTI and RTN using Integrated pMOS Arrays"; Talk: IEEE International Integrated Reliability Workshop (IIRW), South Lake Tahoe, CA, USA; 13.10.2019 - 17.10.2019; in "Proceedings of the IEEE International Integrated Reliability Workshop (IIRW)", (2019), 1 - 5 doi:10.1109/IIRW47491.2019.8989904. BibTeX |
| 1867. | S. Selberherr: "Status and Future of Solid-State Non-Volatile Memory"; Talk: International Conference on Frontier Sciences, Beijing, China; (invited) 06.11.2019 - 07.11.2019; in "Book of Abstracts of the International Conference on Frontier Sciences", (2019), 97. BibTeX |
| 1866. | A. Makarov, B. Kaczer, Ph. Roussel, A. Chasin, M. Vandemaele, G. Hellings, A.-M. El-Sayed, M. Jech, T. Grasser, D. Linten, S. E. Tyaginov: "Stochastic Modeling of Hot-Carrier Degradation in nFinFETs Considering the Impact of Random Traps and Random Dopants"; Talk: European Solid-State Device Research Conference (ESSDERC), Krakow, Poland; 23.09.2019 - 26.09.2019; in "Proceedings of the European Solid-State Device Research Conference (ESSDERC)", (2019), ISBN: 978-1-7281-1539-9, 262 - 265 doi:10.1109/ESSDERC.2019.8901721. BibTeX |
| 1865. | J. Cervenka, J. Weinbub: "Superposed States and the Wigner Approach"; Talk: International Conference on Large-Scale Scientific Computations (LSSC), Sozopol, Bulgaria; 10.06.2019 - 14.06.2019; in "Proceedings of the International Conference on Large-Scale Scientific Computations (LSSC)", (2019), 50. BibTeX |
| 1864. | R. Orio, A. Makarov, S. Selberherr, W. Goes, J. Ender, S. Fiorentini, V. Sverdlov: "Switching Speedup of the Magnetic Free Layer of Advanced SOT-MRAM"; Talk: European Solid-State Device Research Conference (ESSDERC), Krakow, Poland; 23.09.2019 - 26.09.2019; in "Proceedings of the European Solid-State Device Research Conference (ESSDERC)", (2019), ISSN: 2378-6558, 146 - 149 doi:10.1109/ESSDERC.2019.8901780. BibTeX |
| 1863. | L.F. Aguinsky, P. Manstetten, A. Hössinger, S. Selberherr, J. Weinbub: "Three-Dimensional TCAD for Atomic Layer Processing"; Talk: Workshop on High Performance TCAD (WHPTCAD), Chicago, IL, USA; 24.05.2019 - 25.05.2019; in "Book of Abstracts of the Workshop on High Performance TCAD (WHPTCAD)", (2019), 5. BibTeX |
| 1862. | R. Orio, A. Makarov, W. Goes, J. Ender, S. Fiorentini, V. Sverdlov: "Two-Pulse Magnetic Field Free Switching Scheme for Advanced Perpendicular SOT-MRAM"; Talk: International Symposium on Hysteresis Modeling and Micromagnetics (HMM), Heraklion, Greece; 19.05.2019 - 22.05.2019; in "Book of Abstracts of the International Symposium on Hysteresis Modeling and Micromagnetics (HMM)", (2019), 34. BibTeX |
| 1861. | S. Tyaginov, A. El-Sayed, A. Makarov, A. Chasin, H. Arimura, M. Vandemaele, M. Jech, E. Capogreco, L. Witters, A. Grill, A. De Keersgieter, G. Eneman, D. Linten, B. Kaczer: "Understanding and Physical Modeling Superior Hot-Carrier Reliability of Ge pNWFETs"; Talk: IEEE International Electron Devices Meeting (IEDM), San Francisco, CA, USA; 07.12.2019 - 11.12.2019; in "Proceedings of the IEEE International Electron Devices Meeting (IEDM)", (2019), ISBN: 978-1-7281-4032-2, 498 - 501 doi:10.1109/IEDM19573.2019.8993644. BibTeX |
| 1860. | G. Diamantopoulos, A. Hössinger, S. Selberherr, J. Weinbub: "A Shared-Memory Parallel Multi-Mesh Fast Marching Method for Full and Narrow Band Re-Distancing"; Talk: European Seminar on Computing (ESCO), Pilsen, Czech Republic; 03.06.2018 - 08.06.2018; in "Proc. 6th European Seminar on Computing", (2018), 1 page(s) . BibTeX |
| 1859. | V. Sverdlov, S. Selberherr: "A Single-Spin Switch"; Talk: International Electron Devices & Materials Symposium (IEDMS), Keelung, Taiwan; (invited) 13.11.2018 - 15.11.2018; in "Conference Abstract Book", (2018), . BibTeX |
| 1858. | M. Benam, M. Nedjalkov, S. Selberherr: "A Wigner Potential Decomposition in the Signed-Particle Monte Carlo Approach"; Talk: Ninth International Conference on Numerical Methods and Applications (NM&A'18), Borovets, Bulgaria; 20.08.2018 - 24.08.2018; in "Book of Abstracts of the Ninth International Conference on Numerical Methods and Applications (NM&A'18)", (2018), 34 - 35. BibTeX |
| 1857. | V. Sverdlov, S. Selberherr: "Actual Problems in the Field of Spintronics"; Talk: Workshop on Applied Mathematics and Simulation for Semiconductors (AMaSIS), Berlin, Germany; (invited) 08.10.2018 - 10.10.2018; in "Proceedings of the Workshop on Applied Mathematics and Simulation for Semiconductors (AMasIS) 2018", (2018), 40. BibTeX |
| 1856. | V. Simonka: "Advancements In Annealing And Oxidation Steps For Compound Semiconductor Power Devices"; Talk: Silvaco Users Global Event (SURGE), Santa Clara, CA, USA; (invited) 09.10.2018. BibTeX |
| 1855. | Yu. Illarionov, K. Smithe, M. Waltl, R. Grady, R.G. Deshmukh, E. Pop, T. Grasser: "Annealing and Encapsulation of CVD-MoS2 FETs with 1010 On/Off Current Ratio"; Poster: Device Research Conference (DRC), Santa-Barbara, CA, USA; 24.06.2018 - 27.06.2018; in "Proceedings of the Device Research Conference (DRC)", (2018), ISBN: 978-1-5386-3028-0, doi:10.1109/DRC.2018.8442242. BibTeX |
| 1854. | J. Franco, Z. Wu, G. Rzepa, A. Vandooren, H. Arimura, L. Ragnarsson, G. Hellings, S. Brus, D. Cott, V. De Heyn, G. Groeseneken, N. Horiguchi, J. Ryckaert, N. Collaert, D. Linten, T. Grasser, B. Kaczer: "BTI Reliability Improvement Strategies in Low Thermal Budget Gate Stacks for 3D Sequential Integration"; Talk: IEEE International Electron Devices Meeting (IEDM), San Francisco, USA; 01.12.2018 - 05.12.2018; in "Proceedings of the IEEE International Electron Devices Meeting (IEDM)", (2018), ISBN: 978-1-7281-1987-8, 34.2.1 - 34.2.4 doi:10.1109/IEDM.2018.8614559. BibTeX |
| 1853. | S. E. Tyaginov, M. Jech, G. Rzepa, A. Grill, A.-M. El-Sayed, G. Pobegen, A. Makarov, T. Grasser: "Border Trap Based Modeling of SiC Transistor Transfer Characteristics"; Talk: IEEE International Integrated Reliability Workshop (IIRW), South Lake Tahoe, CA, USA; 07.10.2018 - 11.10.2018; in "Proceedings of the IEEE International Integrated Reliability Workshop (IIRW)", (2018), ISBN: 978-1-5386-6039-3, doi:10.1109/IIRW.2018.8727083. BibTeX |
| 1852. | L. Filipovic: "CMOS-Compatible Semiconductor-Based Gas Sensors"; Talk: Emerging Technologies Communication Microsystems Optoelectronics Sensing (ETCMOS), Whistler, British Columbia, Canada; (invited) 09.05.2018 - 11.05.2018; in "Book of Abstracts of Emerging Technologies Communication Microsystems Optoelectronics Sensors", (2018), . BibTeX |
| 1851. | T. Grasser, B. Stampfer, M. Waltl, G. Rzepa, K. Rupp, F. Schanovsky, G. Pobegen, K. Puschkarsky, H. Reisinger, B. O´Sullivan, B. Kaczer: "Characterization and Physical Modeling of the Temporal Evolution of Near-Interfacial States Resulting from NBTI/PBTI Stress in nMOS/pMOS Transistors"; Talk: IEEE International Reliability Physics Symposium (IRPS), Burlingame, CA, USA; 11.03.2018 - 15.03.2018; in "Proceedings of the IEEE International Reliability Physics Symposium (IRPS)", (2018), 2A.2-1 - 2A.2-10. BibTeX |
| 1850. | Yu. Illarionov, B. Stampfer, F. Zhang, T. Knobloch, P. Wu, M. Waltl, A. Grill, J. Appenzeller, T. Grasser: "Characterization of Single Defects: from Si to MoS2 FETs"; Poster: International Conference on Physics of 2D Crystals (ICP2C3), Valetta, Malta; 29.05.2018 - 02.06.2018; . BibTeX |
| 1849. | L. Gnam, P. Manstetten, S. Selberherr, J. Weinbub: "Comparison of High-Performance Graph Coloring Algorithms"; Talk: Vienna Young Scientists Symposium (VSS), Vienna, Austria; 07.06.2018 - 08.06.2018; in "Proceedings of the Vienna Young Scientists Symposium", (2018), ISBN: 978-3-9504017-8-3, 30 - 31. BibTeX |
| 1848. | V. Sverdlov, S. Selberherr: "Current and Shot Noise at Spin-dependent Hopping in Magnetic Tunnel Junctions"; Talk: Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Granada, Spain; 19.03.2018 - 21.03.2018; in "Book of Abstracts of the Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)", (2018), ISBN: 978-1-5386-4810-0, 107 - 108. BibTeX |
| 1847. | M. Vandemaele, B. Kaczer, Z. Stanojevic, S. E. Tyaginov, A. Makarov, A. Chasin, H. Mertens, D. Linten, G Groeseneken: "Distribution Function Based Simulations of Hot-Carrier Degradation in Nanowire FETs"; Talk: IEEE International Integrated Reliability Workshop (IIRW), South Lake Tahoe, CA, USA; 07.10.2018 - 11.10.2018; in "Proceedings of the IEEE International Integrated Reliability Workshop (IIRW)", (2018), ISBN: 978-1-5386-6039-3, doi:10.1109/IIRW.2018.8727081. BibTeX |
| 1846. | H. Kosina, M. Kampl: "Effect of Electron-Electron Scattering on the Carrier Distribution in Semiconductor Devices"; Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Austin, Texas, USA; 24.09.2018 - 26.09.2018; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2018), ISBN: 978-1-5386-6788-0, 18 - 21 doi:10.1109/SISPAD.2018.8551734. BibTeX |
| 1845. | J. Weinbub, M. Ballicchia, M. Nedjalkov: "Electron Interference in a Double-Dopant Potential Structure"; Talk: Workshop on Innovative Nanoscale Devices and Systems (WINDS), Kona, HI, USA; 25.11.2018 - 30.11.2018; in "Abstracts of the Workshop on Innovative Nanoscale Devices and Systems (WINDS)", (2018), ISBN: 978-3-901578-32-8, 52 - 53. BibTeX |
| 1844. | V. Sverdlov, S. Selberherr: "Electron Spin for Modern and Future Microelectronics"; Talk: International Conference Micro- and Nanoelectronics (ICMNE), Moscow-Zvenigorod, Russia; (invited) 01.10.2018 - 05.10.2018; in "Proceedings of the International Conference Micro- and Nanoelectronics (ICMNE) 2018", (2018), ISBN: 978-5-317-05917-0, 7. BibTeX |
| 1843. | S. Foster, M. Thesberg, V. Vargiamidis, N. Neophytou: "Electronic Transport Simulations for Advanced Thermoelectric Materials"; Poster: Thermoelectric Network UK Meeting, Edinburgh, UK; 14.02.2018. BibTeX |
| 1842. | N. Neophytou, S. Foster, V. Vargiamidis, M. Thesberg: "Electronic Transport Simulations in Materials with Embedded Nano-Inclusions for Enhanced Thermoelectric Power Factors"; Talk: Annual March Meeting of the American Physical Society, Los Angeles, USA; 05.03.2018 - 09.03.2018; . BibTeX |
| 1841. | A. Lahlalia, O. Le Neel, R. Shankar, S. Selberherr, L. Filipovic: "Enhanced Sensing Performance of Integrated Gas Sensor Devices"; Poster: EUROSENSORS, Graz, Austria; 09.09.2018 - 12.09.2018; in "Proceedings of EUROSENSORS 2018", (2018), ISBN: 978-3-00-025217-4, 5 page(s) doi:10.3390/proceedings2131508. BibTeX |
| 1840. | L. Gnam, S. Selberherr, J. Weinbub: "Evaluation of Serial and Parallel Shared-Memory Distance-1 Graph Coloring Algorithms"; Talk: Ninth International Conference on Numerical Methods and Applications (NM&A'18), Borovets, Bulgaria; 20.08.2018 - 24.08.2018; in "Book of Abstracts of the Ninth International Conference on Numerical Methods and Applications (NM&A'18)", (2018), 52. BibTeX |
| 1839. | K. Puschkarsky, H. Reisinger, C. Schlünder, W. Gustin, T. Grasser: "Fast Acquisition of Activation Energy Maps Using Temperature Ramps for Lifetime Modeling of BTI"; Talk: European Solid-State Device Research Conference (ESSDERC), Dresden, Germany; 03.09.2018 - 06.09.2018; in "Proceedings of the European Solid-State Device Research Conference (ESSDERC)", (2018), 218 - 221. BibTeX |
| 1838. | V. Sverdlov, A. Makarov, S. Selberherr: "Fast, Reliable, and Field-free Perpendicular Magnetization Reversal in Advanced Spin-Orbit Torque MRAM by Two-pulse Switching"; Poster: Workshop on Innovative Nanoscale Devices and Systems (WINDS), Kona, HI, USA; (invited) 25.11.2018 - 30.11.2018; in "Abstracts of the Workshop on Innovative Nanoscale Devices and Systems (WINDS)", (2018), ISBN: 978-3-901578-32-8, 124 - 125. BibTeX |
| 1837. | K. Rupp, F. Rudolf, J. Weinbub: "Features of ViennaCL in PETSc"; Talk: Austrian HPC Meeting (AHPC), Linz; 19.02.2018 - 21.02.2018; in "Book of Abstracts of the 2018 Austrian HPC Meeting (AHPC)", (2018), 18. BibTeX |
| 1836. | A. Makarov, V. Sverdlov, S. Selberherr: "Field-free Fast Reliable Deterministic Switching in Perpendicular Spin-Orbit Torque MRAM Cells"; Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Austin, Texas, USA; 24.09.2018 - 26.09.2018; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2018), ISBN: 978-1-5386-6788-0, 186 - 189 doi:10.1109/SISPAD.2018.8551716. BibTeX |
| 1835. | L. Filipovic, M. Kampl, T. Knobloch, G. Rzepa, J. Weinbub: "Ihr Smartphone - Ein Supercomputer vor 20 Jahren. Ein Einblick in die Mikro- und Nanoelektronik (mit Virtual Reality)"; Talk: Lange Nacht der Forschung 2018, Wien; 13.04.2018. BibTeX |
| 1834. | C. Medina-Bailón, T. Sadi, M. Nedjalkov, J. Lee, S. Berrada, H. Carillo-Nunez, V. Georgiev, S. Selberherr, A. Asenov: "Impact of the Effective Mass on the Mobility in Si Nanowire Transistors"; Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Austin, Texas, USA; 24.09.2018 - 26.09.2018; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2018), ISBN: 978-1-5386-6788-0, 297 - 300 doi:10.1109/SISPAD.2018.8551630. BibTeX |
| 1833. | V. Simonka, A. Hössinger, S. Selberherr, J. Weinbub: "Investigation of Post-Implantation Annealing for Phosphorus-Implanted 4H-Silicon Carbide"; Talk: International Conference on Microelectronic Devices and Technologies (MicDAT), Barcelona, Spain; 20.06.2018 - 22.06.2018; in "Proceedings of the International Conference on Microelectronic Devices and Technologies (MicDAT)", (2018), 42 - 44. BibTeX |
| 1832. | V. Sverdlov, A. Makarov, S. Selberherr: "Magnetic Field-Free Fast Reliable Switching by Spin-Orbit Torque in Advanced MRAM"; Poster: Micromagnetics: Analysis, Numerics, Applications (MANA), Vienna; 08.11.2018 - 09.11.2018; in "Proceedings of Micromagnetics: Analysis, Numerics, Applications (MANA) 2018", (2018), 32. BibTeX |
| 1831. | L. Filipovic, R. Orio: "Modeling the Influence of Grains and Material Interfaces on Electromigration"; Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Austin, Texas, USA; 24.09.2018 - 26.09.2018; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2018), ISBN: 978-1-5386-6788-0, 83 - 87 doi:10.1109/SISPAD.2018.8551746. BibTeX |
| 1830. | G. Indalecio, H. Kosina: "Monte Carlo Simulation of Electron-electron Interactions in Bulk Silicon"; Poster: The 12th International Conference on Scientific Computing in Electrical Engineering (SCEE 2018), Taormina; 23.09.2018 - 27.09.2018; in "Book of Abstracts of The 12th International Conference on Scientific Computing in Electrical Engineering", (2018), 97 - 98. BibTeX |
| 1829. | J. Lee, C. Medina-Bailón, S. Berrada, H. Carillo-Nunez, T. Sadi, V. Georgiev, M. Nedjalkov, S. Selberherr, A. Asenov: "Multi-Scale Simulation Study of the Strained Si Nanowire FETs"; Talk: IEEE Nanotechnology Materials and Devices Conference (NMDC), Portland, USA; 14.10.2018 - 17.10.2018; in "Proceedings of IEEE Nanotechnology Materials and Devices Conference (NMDC)", (2018), ISBN: 978-1-5386-1016-9, doi:10.1109/NMDC.2018.8605884. BibTeX |
| 1828. | J. Ghosh, D. Osintsev, V. Sverdlov, S. Ganguly: "Multilevel Parallelization Approach to Estimate Spin Lifetime in Silicon: Performance Analysis"; Poster: Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Granada, Spain; 19.03.2018 - 21.03.2018; in "Book of Abstracts of the Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)", (2018), ISBN: 978-1-5386-4810-0, 79 - 80. BibTeX |
| 1827. | T. Grasser: "Multiscale Reliability Modeling"; Talk: IEEE EDS Distinguished Lecture at the SINANO Sommer School 2018, Tarragona, Spain; (invited) 25.09.2018. BibTeX |
| 1826. | J. Franco, Z. Wu, G. Rzepa, L. Ragnarsson, H. Dekkers, A. Vandooren, G. Groeseneken, N. Horiguchi, N. Collaert, D. Linten, T. Grasser, B. Kaczer: "On the Impact of the Gate Metal Work-Function on the Charge Trapping Component of BTI"; Talk: IEEE International Integrated Reliability Workshop (IIRW), South Lake Tahoe, USA; 07.10.2018 - 11.10.2018; in "Proceedings of the IEEE International Integrated Reliability Workshop (IIRW)", (2018), ISBN: 978-1-5386-6039-3, 1 - 4 doi:10.1109/IIRW.2018.8727089. BibTeX |
| 1825. | Yu. Illarionov: "On the Way to Commercial 2D Electronics..."; Talk: 2nd Zhejiang Sci-Tech University Forum for International Young Scholars, Hangzhou, China; (invited) 25.11.2018 - 27.11.2018; . BibTeX |
| 1824. | P. Manstetten: "Performance Improvements For Advanced Physical Etching And Deposition In Memory Technologies"; Talk: Silvaco Users Global Event (SURGE), Santa Clara, CA, USA; (invited) 09.10.2018. BibTeX |
| 1823. | M. Ballicchia, J. Weinbub, I. Dimov, M. Nedjalkov: "Recent Advances of the Wigner Signed-Particle Approach"; Talk: Annual Meeting of the Bulgarian Section of SIAM (BGSIAM), Sofia, Bulgaria; (invited) 18.12.2018 - 20.12.2018; in "Abstracts Annual Meeting of the Bulgarian Section of SIAM (BGSIAM)", (2018), ISSN: 1313-3357, 18 - 19. BibTeX |
| 1822. | Yu. Illarionov, A.J. Molina- Mendoza, M. Waltl, T. Knobloch, M. M. Furchi, T. Mueller, T. Grasser: "Reliability of next-generation field-effect transistors with transition metal dichalcogenides"; Talk: IEEE International Reliability Physics Symposium (IRPS), Burlingame, CA, USA; 11.03.2018 - 15.03.2018; in "Proceedings of the IEEE International Reliability Physics Symposium (IRPS)", (2018), ISBN: 978-1-5386-5479-8, 6 page(s) doi:10.1109/IRPS.2018.8353605. BibTeX |
| 1821. | V. Sverdlov, A. Makarov, S. Selberherr: "Reliable Sub-Nanosecond Switching of a Perpendicular SOT-MRAM Cell Without External Magnetic Field"; Talk: World Multi-Conference on Systemics, Cybernetics and Informatics (WMSCI), Orlando, Florida, USA; 08.07.2018 - 11.07.2018; in "Proceedings of the 22nd World Multi-Conference on Systemics, Cybernetics and Informatics (WMSCI)", (2018), ISBN: 978-1-941763-81-0, 30 - 32. BibTeX |
| 1820. | M. Benam, M. Wołoszyn, S. Selberherr: "Self-consistent Monte Carlo Solution of Wigner and Poisson Equations Using an Efficient Multigrid Approach"; Talk: Annual Meeting of the Bulgarian Section of SIAM (BGSIAM), Sofia, Bulgaria; 18.12.2018 - 20.12.2018; in "Abstracts Annual Meeting of the Bulgarian Section of SIAM (BGSIAM)", (2018), ISSN: 1313-3357, 20 - 21. BibTeX |
| 1819. | V. Sverdlov, S. Selberherr: "Shot Noise Enhancement at Spin-dependent Hopping"; Talk: Workshop on Innovative Nanoscale Devices and Systems (WINDS), Kona, HI, USA; (invited) 25.11.2018 - 30.11.2018; in "Abstracts of the Workshop on Innovative Nanoscale Devices and Systems (WINDS)", (2018), ISBN: 978-3-901578-32-8, 6 - 7. BibTeX |
| 1818. | N. Neophytou, S. Foster, V Vargiamaidis, D. Chakraborty, L Oliveira, C Kumarasinghe, M. Thesberg: "Simulation Studies of Nanostructured Thermoelectric Materials"; Talk: IEEE International Conference on Nanotechnology (NANO), Cork, Ireland; 23.07.2018 - 26.07.2018; in "Proceedings of the IEEE International Conference on Nanotechnology (NANO)", (2018), doi:10.1109/nano.2018.8626378. BibTeX |
| 1817. | V. Sverdlov, S. Selberherr: "Spin Correlations at Hopping in Magnetic Structures: From Tunneling Magnetoresistance to Single-Spin Transistor"; Talk: SPIE Spintronics, San Diego, CA, USA; (invited) 19.08.2018 - 23.08.2018; in "Proceedings of SPIE Spintronics", (2018), 10732-112. BibTeX |
| 1816. | V. Sverdlov, S. Selberherr: "Spin-Dependent Trap-Assisted Tunneling: A Path Towards a Single Spin Switch"; Poster: Advanced Research Workshop on Future Trends in Microelectronics: Vingt Ans Après, Sardinia, Italy; 10.06.2018 - 16.06.2018; in "Abstracts Advanced Research Workshop Future Trends in Microelectronics: Vingt Ans Après", (2018), 49. BibTeX |
| 1815. | A. Toifl, V. Simonka, A. Hössinger, S. Selberherr, J. Weinbub: "Steady-State Empirical Model for Electrical Activation of Silicon-Implanted Gallium Nitride"; Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Austin, Texas, USA; 24.09.2018 - 26.09.2018; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2018), ISBN: 978-1-5386-6788-0, 336 - 339 doi:10.1109/SISPAD.2018.8551728. BibTeX |
| 1814. | C. Medina-Bailón, T. Sadi, M. Nedjalkov, J. Lee, S. Berrada, H. Carillo-Nunez, V. Georgiev, S. Selberherr, A. Asenov: "Study of the 1D Scattering Mechanisms´ Impact on the Mobility in Si Nanowire Transistors"; Talk: Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Granada, Spain; 19.03.2018 - 21.03.2018; in "Book of Abstracts of the Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)", (2018), ISBN: 978-1-5386-4810-0, 15 - 16. BibTeX |
| 1813. | J. Woerle, V. Simonka, E. Müller, A. Hössinger, H. Sigg, S. Selberherr, J. Weinbub, M. Camarda, U. Grossner: "Surface Morphology of 4H-SiC After Thermal Oxidation"; Talk: European Conference on Silicon Carbide and Related Materials (ECSCRM), Birmingham, UK; 02.09.2018 - 06.09.2018; in "Proceedings of the European Conference on Silicon Carbide and Related Materials (ECSCRM)", (2018), . BibTeX |
| 1812. | V. Sverdlov, A. Makarov, S. Selberherr: "Switching Current Reduction in Advanced Spin-Orbit Torque MRAM"; Poster: Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Granada, Spain; 19.03.2018 - 21.03.2018; in "Book of Abstracts of the Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)", (2018), ISBN: 978-1-5386-4810-0, 57 - 58. BibTeX |
| 1811. | L. Filipovic, A. Lahlalia, S. Selberherr: "System-on-Chip Sensor Integration in Advanced CMOS Technology"; Talk: 233rd ECS Meeting (ECS), Seattle, Washington, USA; (invited) 13.05.2018 - 17.05.2018; in "Proceedings of the 233rd ECS Meeting (ECS)", (2018), ISSN: 2151-2043, . BibTeX |
| 1810. | A. Makarov, V. Sverdlov, S. Selberherr: "Two-Pulse Sub-ns Switching of a Perpendicular Spin-Orbit Torque MRAM Cell Without External Magnetic Field"; Poster: Advanced Research Workshop on Future Trends in Microelectronics: Vingt Ans Après, Sardinia, Italy; 10.06.2018 - 16.06.2018; in "Abstracts Advanced Research Workshop Future Trends in Microelectronics: Vingt Ans Après", (2018), 51. BibTeX |
| 1809. | A. Makarov, V. Sverdlov, S. Selberherr: "Ultra-Fast Switching of a Free Magnetic Layer with out-of-Plane Magnetization in Spin-Orbit Torque MRAM Cells"; Talk: 233rd ECS Meeting (ECS), Seattle, Washington, USA; 13.05.2018 - 17.05.2018; in "Proceedings of the 233rd ECS Meeting (ECS)", (2018), 85/213, ISSN: 2151-2043, . BibTeX |
| 1808. | K. Puschkarsky, T. Grasser, T. Aichinger, W. Gustin, H. Reisinger: "Understanding and Modeling Transient Threshold Voltage Instabilities in SiC MOSFETs"; Talk: IEEE International Reliability Physics Symposium (IRPS), Burlingame, CA, USA; (invited) 11.03.2018 - 15.03.2018; in "Proceedings of the IEEE International Reliability Physics Symposium (IRPS)", (2018), 3B.5-1 - 3B.5-10. BibTeX |
| 1807. | X. Klemenschits, S. Selberherr, L. Filipovic: "Unified Feature Scale Model for Etching in SF6 and Cl Plasma Chemistries"; Poster: Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Granada, Spain; 19.03.2018 - 21.03.2018; in "Book of Abstracts of the Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)", (2018), ISBN: 978-1-5386-4810-0, 65 - 66. BibTeX |
| 1806. | V. Sverdlov, S. Selberherr: "A Single-Spin Switch"; Talk: Workshop on Innovative Nanoscale Devices and Systems (WINDS), Kona, HI, USA; (invited) 26.11.2017 - 01.12.2017; in "Abstracts of the Workshop on Innovative Nanoscale Devices and Systems (WINDS)", (2017), ISBN: 978-3-901578-31-1, 93 - 94. BibTeX |
| 1805. | P. Manstetten, A. Hössinger, J. Weinbub, S. Selberherr: "Accelerated Direct Flux Calculations Using an Adaptively Refined Icosahedron"; Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Kamakura, Japan; 07.09.2017 - 09.09.2017; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2017), ISBN: 978-4-86348-612-6, 73 - 76 doi:10.23919/SISPAD.2017.8085267. BibTeX |
| 1804. | Yu. Illarionov, G. Rzepa, M. Waltl, T. Knobloch, J. Kim, D. Akinwande, T. Grasser: "Accurate Mapping of Oxide Traps in Highly-Stable Black Phosphorus FETs"; Talk: IEEE Electron Devices Technology and Manufacturing Conference (EDTM), Toyama, Japan; 28.02.2017 - 02.03.2017; in "Proceedings of the IEEE Electron Devices Technology and Manufacturing Conference (EDTM)", (2017), ISBN: 978-1-5090-4661-4, 114 - 115 doi:10.1109/EDTM.2017.7947532. BibTeX |
| 1803. | T. Windbacher, A. Makarov, V. Sverdlov, S. Selberherr: "Analysis of a Spin-Transfer Torque Based Copy Operation of a Buffered Magnetic Processing Environment"; Talk: World Multi-Conference on Systemics, Cybernetics and Informatics (WMSCI), Orlando, Florida, USA; 08.07.2017 - 11.07.2017; in "Proceedings of the 21st World Multi-Conference on Systemics, Cybernetics and Informatics (WMSCI)", (2017), ISBN: 978-1-941763-59-9, 142 - 146. BibTeX |
| 1802. | A. Chasin, J. Franco, B. Kaczer, V. Putcha, P. Weckx, R. Ritzenthaler, H. Mertens, N. Horiguchi, D. Linten, G. Rzepa: "BTI Reliability and Time-Dependent Variability of Stacked Gate-All-Around Si Nanowire Transistors"; Poster: IEEE International Reliability Physics Symposium (IRPS), Monterey, CA, USA; 02.04.2017 - 06.04.2017; in "Proceedings of the IEEE International Reliability Physics Symposium (IRPS)", (2017), ISBN: 978-1-5090-6641-4, 5C-4.1 - 5C-4.7. BibTeX |
| 1801. | B. Kaczer, G. Rzepa, J. Franco, P. Weckx, A. Chasin, V. Putcha, E. Bury, M. Simicic, Ph. J. Roussel, G. Hellings, A. Veloso, P. Matagne, T. Grasser, D. Linten: "Benchmarking Time-Dependent Variability of Junctionless Nanowire FETs"; Talk: IEEE International Reliability Physics Symposium (IRPS), Monterey, CA, USA; 02.04.2017 - 06.04.2017; in "Proceedings of the IEEE International Reliability Physics Symposium (IRPS)", (2017), ISBN: 978-1-5090-6641-4, 2D-6.1 - 2D-6.7. BibTeX |
| 1800. | A. Grill, B. Stampfer, M. Waltl, K.-S. Im, J. Lee, C. Ostermaier, H. Ceric, T. Grasser: "Characterization and Modeling of Single Defects in GaN/AlGaN Fin-MIS-HEMTs"; Talk: IEEE International Reliability Physics Symposium (IRPS), Monterey, CA, USA; 02.04.2017 - 06.04.2017; in "Proceedings of IEEE International Reliability Physics Symposium (IRPS)", (2017), ISBN: 978-1-5090-6641-4, 3B-5.1 - 3B-5.5 doi:10.1109/IRPS.2017.7936285. BibTeX |
| 1799. | J. Franco, V. Putcha, A. Vais, S. Sioncke, N. Waldron, D. Zhou, G. Rzepa, P. Roussel, G. Groeseneken, M. Heyns, N. Collaert, D. Linten, T. Grasser, B. Kaczer: "Characterization of Oxide Defects in InGaAs MOS Gate Stacks for High-Mobility n-Channel MOSFETs"; Talk: IEEE International Electron Devices Meeting (IEDM), San Francisco, CA, USA; (invited) 02.12.2017 - 06.12.2017; in "Proceedings of the IEEE International Electron Devices Meeting (IEDM)", (2017), 4 page(s) doi:10.1109/IEDM.2017.8268347. BibTeX |
| 1798. | T. Grasser: "Charge Trapping and Time-dependent Variability in CMOS Transistors"; Talk: IEEE EDS Distinguished Lecture, Stuttgart,Germany; (invited) 24.01.2017. BibTeX |
| 1797. | T. Grasser: "Charge Trapping and Time-dependent Variability in Low-Voltage MOS Transistors"; Talk: Short Course at IEEE EDS Electron Devices Technology and Manufacturing Conference, Toyama, Japan; (invited) 28.02.2017. BibTeX |
| 1796. | M. Ballicchia, J. Weinbub, M. Nedjalkov, S. Selberherr: "Classical and Quantum Electron Evolution with a Repulsive Dopant"; Talk: Workshop on Innovative Nanoscale Devices and Systems (WINDS), Kona, HI, USA; (invited) 26.11.2017 - 01.12.2017; in "Abstracts of the Workshop on Innovative Nanoscale Devices and Systems (WINDS)", (2017), ISBN: 978-3-901578-31-1, 105 - 106. BibTeX |
| 1795. | P. Manstetten, V. Simonka, G. Diamantopoulos, L. Gnam, A. Makarov, A. Hössinger, J. Weinbub: "Computational and Numerical Challenges in Semiconductor Process Simulation"; Talk: SIAM Conference on Computational Science and Engineering, Atlanta, GA, USA; 27.02.2017 - 03.03.2017; in "CSE17 Abstracts", (2017), 46. BibTeX |
| 1794. | V. Sverdlov, J. Weinbub, S. Selberherr: "Current in Magnetic Tunnel Junctions at Spin-Dependent Hopping"; Talk: Workshop on Innovative Nanoscale Devices and Systems (WINDS), Kona, HI, USA; (invited) 26.11.2017 - 01.12.2017; in "Abstracts of the Workshop on Innovative Nanoscale Devices and Systems (WINDS)", (2017), ISBN: 978-3-901578-31-1, 87 - 88. BibTeX |
| 1793. | T. Grasser: "Defects in 3D and 2D Field Effect Transistors: Characterization and Modeling"; Talk: IEEE EDS Distinguished Lecture, Aachen, Germany; (invited) 23.11.2017. BibTeX |
| 1792. | G. Rzepa, J. Franco, A. Subirats, M. Jech, A. Chasin, A. Grill, M. Waltl, T. Knobloch, B. Stampfer, T. Chiarella, N. Horiguchi, L. Ragnarsson, D. Linten, B. Kaczer, T. Grasser: "Efficient Physical Defect Model Applied to PBTI in High-κ Stacks"; Poster: IEEE International Reliability Physics Symposium (IRPS), Monterey, CA, USA; 02.04.2017 - 06.04.2017; in "Proceedings of the IEEE International Reliability Physics Symposium (IRPS)", (2017), ISBN: 978-1-5090-6641-4, XT-11.1 - XT-11.6. BibTeX |
| 1791. | V. Sverdlov, J. Weinbub, S. Selberherr: "Electron Spin at Work in Modern and Emerging Devices"; Talk: Energy-Materials-Nanotechnology Meeting on Quantum (EMN), Wien, Austria; (invited) 18.06.2017 - 22.06.2017; in "Abstracts of the Energy-Materials-Nanotechnology Meeting on Quantum (EMN)", (2017), 31 - 33. BibTeX |
| 1790. | N. Neophytou, M. Thesberg: "Electronic Transport Simulations in Nano-Crystalline Materials for Enhanced Thermoelectric Power Factors"; Talk: APS March Meeting, New Orleans, USA; 13.03.2017 - 17.03.2017; . BibTeX |
| 1789. | N. Neophytou, S. Foster, M. Thesberg, H. Kosina: "Electronic Transport Simulations in Nanocomposites - Exploring the Features that Optimize the Thermoelectric Power Factor"; Talk: E-MRS Spring Meeting, Strasburg, France; 22.05.2017 - 26.05.2017; . BibTeX |
| 1788. | N. Neophytou, M. Thesberg: "Electronic Transport Simulations in Nanostructured Materials for Large Thermoelectric Power Factors"; Talk: European Congress and Exhibition on Advanced Materials and Processes (EUROMAT), Thessaloniki, Greece; 18.09.2017 - 22.09.2017; . BibTeX |
| 1787. | Yu. Illarionov, M. Waltl, K. Smithe, E. Pop, T. Grasser: "Encapsulated MoS2 FETs with Improved Performance and Reliability"; Talk: GRAPCHINA, Nanjing, China; 24.09.2017 - 26.09.2017; in "Proceedings of the GRAPCHINA 2017", (2017), 1 page(s) . BibTeX |
| 1786. | V. Sverdlov, J. Weinbub, S. Selberherr: "Enhanced Shot Noise as a Signature of Trap-Assisted Tunneling in Magnetic Tunnel Junctions: a Monte Carlo Approach"; Talk: 25th International Symposium on Nanostructures: Physics and Technology, Sankt Petersburg, Russland; 26.06.2017 - 30.06.2017; in "Proceedings of the 25th International Symposium on Nanostructures: Physics and Technology", (2017), ISBN: 978-5-7422-5779-0, 132 - 133. BibTeX |
| 1785. | G. Diamantopoulos, J. Weinbub, A. Hössinger, S. Selberherr: "Evaluation of the Shared-Memory Parallel Fast Marching Method for Re-Distancing Problems"; Talk: International Conference on Computational Science and Its Applications (ICCSA), Trieste, Italy; 03.07.2017 - 06.07.2017; in "Proceedings of the International Conference on Computational Science and Its Applications (ICCSA)", (2017), ISBN: 978-1-5386-3893-4, 1 - 8 doi:10.1109/ICCSA.2017.7999648. BibTeX |
| 1784. | R. Mills, M. Adams, J. Brown, M. Fabien, T. Isaac, M. Knepley, K. Rupp, B. Smith, H. Zhang: "Experiences, Optimizations, and Future Directions with Petsc on the 2nd Generation ("Knights Landing") Intel Xeon Phi Processor"; Talk: SIAM Conference on Computational Science and Engineering, Atlanta, GA, USA; 27.02.2017 - 03.03.2017; in "CSE17 Abstracts", (2017), 370 - 371. BibTeX |
| 1783. | S. Selberherr, T. Windbacher, A. Makarov, V. Sverdlov: "Exploiting Spin-Transfer Torque for Non-Volatile Computing"; Talk: World Congress of Smart Materials (WCSM), Bangkok; (invited) 16.03.2017 - 18.03.2017; in "Book of Abstracts of BIT's 3rd Annual World Congress of Smart Materials-2017", (2017), 130. BibTeX |
| 1782. | S. Foster, M. Thesberg, N. Neophytou: "Fully Quantum Mechanical Transport Simulations for the Calculation of the Thermoelectric Power Factor in Nanocomposite Materials"; Talk: European Conference on Thermoelectrics (ECT), Padova, Italy; 25.09.2017 - 27.09.2017; in "Book of Abstracts 15th European Conference on Thermoelectrics", (2017), . BibTeX |
| 1781. | M. Kampl, H. Kosina, O. Baumgartner: "Hot Carrier Study Including e-e Scattering Based on a Backward Monte Carlo Method"; Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Kamakura, Japan; 07.09.2017 - 09.09.2017; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2017), ISBN: 978-4-86348-612-6, 293 - 296 doi:10.23919/SISPAD.2017.8085322. BibTeX |
| 1780. | A. Makarov, S. E. Tyaginov, B. Kaczer, M. Jech, A. Chasin, A. Grill, G. Hellings, M. Vexler, D. Linten, T. Grasser: "Hot-Carrier Degradation in FinFETs: Modeling, Peculiarities, and Impact of Device Topology"; Talk: IEEE International Electron Devices Meeting (IEDM), San Francisco, CA, USA; 02.12.2017 - 06.12.2017; in "Proceedings of the IEEE International Electron Devices Meeting (IEDM)", (2017), ISBN: 978-1-5386-3559-9, 310 - 313 doi:10.1109/IEDM.2017.8268381. BibTeX |
| 1779. | T. Knobloch, G. Rzepa, Yu. Illarionov, M. Waltl, D.K Polyushkin, A. Pospischil, M. M. Furchi, T. Müller, T. Grasser: "Impact of Gate Dielectrics on the Threshold Voltage in MoS2 Transistors"; Talk: Meeting of the Electrochemical Society (ECS), National Harbor, Maryland, USA; (invited) 01.10.2017 - 05.10.2017; in "Meeting Abstracts", (2017), MA2017-02(14): 837, 2 page(s) . BibTeX |
| 1778. | T. Grasser, M. Waltl, K. Puschkarsky, B. Stampfer, G. Rzepa, G. Pobegen, H. Reisinger, H. Arimura, B. Kaczer: "Implications of Gate-Sided Hydrogen Release for Post-Stress Degradation Build-Up after BTI Stress"; Talk: IEEE International Reliability Physics Symposium (IRPS), Monterey, CA, USA; 02.04.2017 - 06.04.2017; in "Proceedings of the IEEE International Reliability Physics Symposium (IRPS)", (2017), ISBN: 978-1-5090-6641-4, 6A-2.1 - 6A-2.6. BibTeX |
| 1777. | S. Selberherr: "Integrated Gas Sensors for Wearable Electronics"; Talk: IEEE EDS Distinguished Lecture, The Hong Kong Polytechnic University, Hong Kong; (invited) 12.04.2017. BibTeX |
| 1776. | M. Kampl, H. Kosina: "Investigation of Hot-Carrier Effects Using a Backward Monte Carlo Method and Full Bands"; Poster: International Workshop on Computational Nanotechnology (IWCN), Low Wood Bay, Lake District, UK; 05.06.2017 - 09.06.2017; in "Book of Abstracts of the International Workshop on Computational Nanotechnology (IWCN)", (2017), 147 - 148. BibTeX |
| 1775. | V. Sverdlov, H. Mahmoudi, T. Windbacher, A. Makarov, J. Weinbub, S. Selberherr: "MTJs - Spin-Based Binary Memristors for Non-Volatile Memory and Logic Applications"; Talk: Energy-Materials-Nanotechnology Meeting on Memristive Switching & Network (EMN), Milan, Italy; (invited) 14.08.2017 - 18.08.2017; in "Abstracts of the Energy-Materials-Nanotechnology Meeting on Memristive Switching & Network (EMN)", (2017), 33 - 34. BibTeX |
| 1774. | L. Filipovic, R.L. de Orio, W. H. Zisser, S. Selberherr: "Modeling Electromigration in Nanoscaled Copper Interconnects"; Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Kamakura, Japan; 07.09.2017 - 09.09.2017; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2017), ISBN: 978-4-86348-612-6, 161 - 164 doi:10.23919/SISPAD.2017.8085289. BibTeX |
| 1773. | V. Sverdlov, J. Weinbub, S. Selberherr: "Modeling Spin-Dependent Phenomena for New Device Applications"; Talk: SIAM Conference on Computational Science and Engineering, Atlanta, GA, USA; (invited) 27.02.2017 - 03.03.2017; in "CSE17 Abstracts", (2017), 45 - 46. BibTeX |
| 1772. | V. Simonka, A. Hössinger, J. Weinbub, S. Selberherr: "Modeling and Simulation of Electrical Activation of Acceptor-Type Dopants in Silicon Carbide"; Poster: International Conference on Silicon Carbide and Related Materials (ICSCRM), Washington D.C., USA; 17.09.2017 - 22.09.2017; in "Proceedings of the International Conference on Silicon Carbide and Related Materials (ICSCRM)", (2017), . BibTeX |
| 1771. | V. Simonka, A. Hössinger, J. Weinbub, S. Selberherr: "Modeling of Electrical Activation Ratios of Phosphorus and Nitrogen Doped Silicon Carbide"; Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Kamakura, Japan; 07.09.2017 - 09.09.2017; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2017), ISBN: 978-4-86348-612-6, 125 - 128 doi:10.23919/SISPAD.2017.8085280. BibTeX |
| 1770. | T. Sadi, E. Towie, M. Nedjalkov, A. Asenov, S. Selberherr: "Monte Carlo Particles in Quantum Wires: Effects of the Confinement"; Talk: International Conference on Large-Scale Scientific Computations (LSSC), Sozopol, Bulgaria; 05.06.2017 - 09.06.2017; in "Abstracts International Conference on Large-Scale Scientific Computations (LSSC)", (2017), 89 - 90. BibTeX |
| 1769. | S. Foster, D. Chakraborty, M. Thesberg, H. Kosina, N. Neophytou: "Monte Carlo Simulations for Extracting the Power Factor in 1D Systems"; Talk: EPRSC Thermoelectric Network Meeting, Manchester, UK; 14.02.2017 - 15.02.2017; . BibTeX |
| 1768. | M. Thesberg, H. Kosina: "NEGF Through Finite-Volume Discretization"; Talk: International Workshop on Computational Nanotechnology (IWCN), Low Wood Bay, Lake District, UK; 05.06.2017 - 09.06.2017; in "Book of Abstracts of the International Workshop on Computational Nanotechnology (IWCN)", (2017), 173 - 174. BibTeX |
| 1767. | V. Simonka: "Natancni Fizikalni Modeli 3D Simulatorjev Proizvodnje Mikroelektronskih Naprav"; Talk: Faculty of Natural Sciences and Mathematics, University of Maribor, Slovenia; (invited) 26.01.2017. BibTeX |
| 1766. | V. Sverdlov, A. Makarov, J. Weinbub, S. Selberherr: "Non-Volatility by Spin in Modern Nanoelectronics"; Talk: International Conference on Microelectronics (MIEL), Nis, Serbia; (invited) 09.10.2017 - 11.10.2017; in "Proceedings of the International Conference on Microelectronics (MIEL)", (2017), ISBN: 978-1-5386-2562-0, 7 - 14 doi:10.1109/MIEL.2017.8190061. BibTeX |
| 1765. | J. Cervenka, L. Filipovic: "Numerical Aspects of the Deterministic Solution of the Wigner Equation"; Poster: International Wigner Workshop (IW2), Low Wood Bay, Lake District, UK; 05.06.2017 in "Book of Abstracts of the International Wigner Workshop (IW2)", (2017), ISBN: 978-3-200-05129-4, 42 - 43. BibTeX |
| 1764. | R. Kosik, M. Kampl, H. Kosina: "On the Characteristic Neumann Equation and the Wigner Equation"; Talk: International Wigner Workshop (IW2), Low Wood Bay, Lake District, UK; 05.06.2017 in "Book of Abstracts of the International Wigner Workshop (IW2)", (2017), ISBN: 978-3-200-05129-4, 26 - 27. BibTeX |
| 1763. | T. Knobloch, G. Rzepa, Yu. Illarionov, M. Waltl, F. Schanovsky, M. Jech, B. Stampfer, M. M. Furchi, T. Müller, T. Grasser: "Physical Modeling of the Hysteresis in MoS2 Transistors"; Talk: European Solid-State Device Research Conference (ESSDERC), Leuven, Belgium; 11.09.2017 - 14.09.2017; in "Proceedings of the European Solid-State Device Research Conference (ESSDERC)", (2017), 284 - 287 doi:10.1109/ESSDERC.2017.8066647. BibTeX |
| 1762. | P. Sanan, O. Schenk, M. Bollhoefer, K. Rupp, D. May: "Preconditioners for Stokes Flow with Highly Heterogeneous Viscosity Structure: Saddle-Point Smoothing Via Local Incomplete Factorization"; Talk: SIAM Conference on Computational Science and Engineering, Atlanta, GA, USA; 27.02.2017 - 03.03.2017; in "CSE17 Abstracts", (2017), 258. BibTeX |
| 1761. | Yu. Illarionov, M. Waltl, T. Knobloch, G. Rzepa, T. Grasser: "Reliability Perspective of 2D Electronics"; Talk: International Conference on Physics of 2D Crystals (ICP2C2), Ha Long, Vietnam; 25.04.2017 - 30.04.2017; . BibTeX |
| 1760. | Yu. Illarionov, M. Waltl, M. Jech, J. Kim, D. Akinwande, T. Grasser: "Reliability of Black Phosphorus Field-Effect Transistors with Respect to Bias-Temperature and Hot-Carrier Stress"; Talk: International Reliability Physics Symposium (IRPS), Monterey, CA, USA; 02.04.2017 - 06.04.2017; in "Proceedings of the International Reliability Physics Symposium (IRPS)", (2017), ISBN: 978-1-5090-6642-1, 6A-6.1 - 6A-6.6 doi:10.1109/IRPS.2017.7936338. BibTeX |
| 1759. | C. Ostermaier, P. Lagger, M. Reiner, A. Grill, R. Stradiotto, G. Pobegen, T. Grasser, R. Pietschnig, D. Pogany: "Review of bias-temperature instabilities at the III-N/dielectric interface"; Talk: European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), Bordequx, Frankreich; 25.09.2017 - 28.09.2017; . BibTeX |
| 1758. | K. Rupp: "Semiconductor Device Simulation Approaches for Massively Parallel Computing Architectures"; Talk: SIAM Conference on Computational Science and Engineering, Atlanta, GA, USA; 27.02.2017 - 03.03.2017; . BibTeX |
| 1757. | V. Sverdlov, S. Selberherr: "Shot noise at spin-dependent hopping in tunnel junctions with ferromagnetic electrodes"; Talk: Emerging Technologies Communication Microsystems Optoelectronics Sensing (ETCMOS), Warsaw, Poland; (invited) 28.05.2017 - 30.05.2017; in "Proceedings of the ETCMOS 2017", (2017), ISBN: 1927500869, 57. BibTeX |
| 1756. | V. Sverdlov, S. Selberherr: "Shot noise at spin-dependent hopping in tunnel junctions with ferromagnetic electrodes"; Talk: APS March Meeting, New Orleans, USA; 13.03.2017 - 17.03.2017; in "Bulletin of the APS April Meeting 2017", (2017), ISSN: 0003-0503, . BibTeX |
| 1755. | G. Meller, S. Selberherr: "Simulation of Injection Currents into Disordered Molecular Conductors"; Poster: International Conference on Advanced Nano Materials (ANM), Aveiro, Portugal; 19.07.2017 - 21.07.2017; in "Proceedings of the 9thInternational Conference on Advanced Nano Materials (ANM)", (2017), . BibTeX |
| 1754. | V. Sverdlov, J. Weinbub, S. Selberherr: "Spin-Based Non-Volatile Memory and Logic in Modern Nanoelectronics"; BIT's Annual World Congress of Nano Science & Technology, Fukuoka; (invited) 24.10.2017 - 26.10.2017; in "Abstracts of the BIT's 7th Annual World Congress of Nano Science & Technology-2017", (2017), 343. BibTeX |
| 1753. | V. Sverdlov, J. Weinbub, S. Selberherr: "Spin-Dependent Trap-Assisted Tunneling in Magnetic Tunnel Junctions: A Monte Carlo Study"; Talk: International Workshop on Computational Nanotechnology (IWCN), Low Wood Bay, Lake District, UK; 05.06.2017 - 09.06.2017; in "Book of Abstracts of the International Workshop on Computational Nanotechnology (IWCN)", (2017), 88 - 90. BibTeX |
| 1752. | V. Sverdlov, J. Weinbub, S. Selberherr: "Spintronics as a Non-Volatile Complement to Nanoelectronics"; Talk: International Conference on Microelectronics, Devices and Materials (MIDEM), Ljubljana, Slovenia; (invited) 04.10.2017 - 06.10.2017; in "Proceedings of the 53rd International Conference on Microelectronics, Devices and Materials (MIDEM 2017)", (2017), ISBN: 978-961-92933-7-9, 10 page(s) . BibTeX |
| 1751. | S. Selberherr: "The Evolution and Potential Future of Microelectronics"; Talk: IEEE EDS Distinguished Lecture, The Hong Kong Polytechnic University, Hong Kong; (invited) 12.04.2017. BibTeX |
| 1750. | B. Ullmann, M. Jech, S. E. Tyaginov, M. Waltl, Yu. Illarionov, A. Grill, K. Puschkarsky, H. Reisinger, T. Grasser: "The Impact of Mixed Negative Bias Temperature Instability and Hot Carrier Stress on Single Oxide Defects"; Poster: International Reliability Physics Symposium (IRPS), Monterey, CA, USA; 04.04.2017 - 06.04.2017; in "Proceedings of the International Reliability Physics Symposium (IRPS)", (2017), ISBN: 978-1-5090-6642-1, XT-10.1 - XT-10.6 doi:10.1109/IRPS.2017.7936424. BibTeX |
| 1749. | K. Puschkarsky, H. Reisinger, T. Aichinger, W. Gustin, T. Grasser: "Threshold Voltage Hysteresis in SiC MOSFETs and Its Impact on Circuit Operation"; Talk: IEEE International Integrated Reliability Workshop (IIRW), Fallen Leaf Lake, CA, USA; 08.10.2017 - 12.10.2017; in "Proceedings of the IEEE International Integrated Reliability Workshop (IIRW)", (2017), 1 - 5. BibTeX |
| 1748. | L. Gnam, J. Weinbub, A. Hössinger, S. Selberherr: "Towards a Metric for an Automatic Hull Mesh Coarsening Strategy"; Talk: Vienna Young Scientists Symposium (VSS), Wien, Österreich; 01.06.2017 - 02.06.2017; in "Proceedings of the Vienna Young Scientists Symposium", (2017), ISBN: 978-3-9504017-5-2, 118 - 119. BibTeX |
| 1747. | L. Gnam, J. Weinbub, K. Rupp, F. Rudolf, S. Selberherr: "Using Graph Partitioning and Coloring for Flexible Coarse-Grained Shared-Memory Parallel Mesh Adaptation"; Talk: International Meshing Roundtable (IMR), Barcelona, Spanien; 18.09.2017 - 21.09.2017; in "Proceedings of the 26th International Meshing Roundtable (IMR26)", (2017), 5 page(s) . BibTeX |
| 1746. | F. Rudolf, A. Morhammer, K. Rupp, J. Weinbub: "VSC School Project: Performance Enhancements of Algebraic Multigrid Methods in ViennaCL"; Talk: Austrian HPC Meeting (AHPC), Grundlsee; 01.03.2017 - 03.03.2017; in "Book of Abstracts of the 2017 Austrian HPC Meeting (AHPC)", (2017), 1 page(s) . BibTeX |
| 1745. | P. Ellinghaus, M. Nedjalkov, J. Weinbub, S. Selberherr: "Wigner Analysis of Surface Roughness in Quantum Wires"; Talk: International Wigner Workshop (IW2), Low Wood Bay, Lake District, UK; 05.06.2017 in "Book of Abstracts of the International Wigner Workshop (IW2)", (2017), ISBN: 978-3-200-05129-4, 40 - 41. BibTeX |
| 1744. | P. Ellinghaus, J. Weinbub, M. Nedjalkov, S. Selberherr: "Wigner Modelling of Surface Roughness in Quantum Wires"; Poster: International Workshop on Computational Nanotechnology (IWCN), Low Wood Bay, Lake District, UK; 05.06.2017 - 09.06.2017; in "Book of Abstracts of the International Workshop on Computational Nanotechnology (IWCN)", (2017), 171 - 172. BibTeX |
| 1743. | J. Weinbub, M. Nedjalkov, I. Dimov, S. Selberherr: "Wigner-Signed Particles Study of Double Dopant Quantum Effects"; Poster: International Wigner Workshop (IW2), Low Wood Bay, Lake District, UK; 05.06.2017 in "Book of Abstracts of the International Wigner Workshop (IW2)", (2017), ISBN: 978-3-200-05129-4, 50 - 51. BibTeX |
| 1742. | K. Rupp, J. Weinbub: "A Computational Scientist's Perspective on Current and Future Hardware Architectures"; Talk: Austrian HPC Meeting (AHPC), Grundlsee, Austria; 22.02.2016 - 24.02.2016; in "Book of Abstracts of the 2016 Austrian HPC Meeting (AHPC)", (2016), 24. BibTeX |
| 1741. | P. Sharma, S. E. Tyaginov, S. E. Rauch, J. Franco, B. Kaczer, A. Makarov, M. Vexler, T. Grasser: "A Drift-Diffusion-Based Analytic Description of the Energy Distribution Function for Hot-Carrier Degradation in Decananometer nMOSFETs"; Talk: European Solid-State Device Research Conference (ESSDERC), Lausanne, Switzerland; 12.09.2016 - 15.09.2016; in "Proceedings of the European Solid-State Device Research Conference (ESSDERC)", (2016), ISBN: 978-1-5090-2969-3, 428 - 431 doi:10.1109/ESSDERC.2016.7599677. BibTeX |
| 1740. | S. Papaleo, H. Ceric: "A Finite Element Method Study of Delamination at the Interface of the TSV Interconnects"; Poster: International Reliability Physics Symposium (IRPS), Pasadena, CA USA; 17.04.2016 - 21.04.2016; in "Proceedings of the International Reliability Physics Symposium (IRPS)", (2016), ISBN: 978-1-4673-9136-8, PA-2-1 - PA-2-4 doi:10.1109/IRPS.2016.7574626. BibTeX |
| 1739. | Yu. Illarionov, G. Rzepa, M. Waltl, H. Pandey, S. Kataria, V. Passi, M. Lemme, T. Grasser: "A Systematic Study of Charge Trapping in Single-Layer Double-Gated GFETs"; Talk: Device Research Conference, Newark, Delaware, USA; 19.06.2016 - 22.06.2016; in "74th Device Research Conference Digest", (2016), ISBN: 978-1-5090-2827-6, 89 - 90. BibTeX |
| 1738. | K. Giering, G.A. Rott, G. Rzepa, H. Reisinger, A. Puppala, T. Reich, W. Gustin, T. Grasser, R. Jancke: "Analog-circuit NBTI Degradation and Time-dependent NBTI Variability: An Efficient Physics-Based Compact Model"; Talk: International Reliability Physics Symposium (IRPS), Pasadena, CA, USA; 17.04.2016 - 21.04.2016; in "Proceedings of the International Reliability Physics Symposium (IRPS)", (2016), 4C-4-1 - 4C-4-6 doi:10.1109/IRPS.2016.7574540. BibTeX |
| 1737. | M. Thesberg, N. Neophytou, H. Kosina: "Calculating the Power Factor of Nano-Composite Materials from Fully Quantum-Mechanical Large-Scale Simulations"; Talk: European Conference on Thermoelectrics (ECT), Lisbon, Portugal; 20.09.2016 - 23.09.2016; in "Book of Abstracts 14th European Conference on Thermoelectrics", (2016), . BibTeX |
| 1736. | G. Rzepa, M. Waltl, W. Gös, B. Kaczer, J. Franco, T. Chiarella, N. Horiguchi, T. Grasser: "Complete Extraction of Defect Bands Responsible for Instabilities in n and pFinFETs"; Talk: International Symposium on VLSI Technology, Honolulu, HI, USA; 14.06.2016 - 16.06.2016; in "2016 Symposium on VLSI Technology Digest of Technical Papers", (2016), ISBN: 978-1-5090-0638-0, 208 - 209. BibTeX |
| 1735. | V. Sverdlov, S. Selberherr: "Effects of Spin Relaxation on Trap-Assisted Tunneling Through Ferromagnetic Metal-Oxide-Semiconductor Structures"; Talk: APS March Meeting, Baltimore, USA; 14.03.2016 - 18.03.2016; in "Bulletin of the American Physical Society (APS March Meeting)", (2016), 61/1, ISSN: 0003-0503, 1 page(s) . BibTeX |
| 1734. | L. Filipovic, S. Selberherr: "Effects of the Deposition Process Variation on the Performance of Open TSVs"; Poster: IEEE Electronic Components and Technology Conference (ECTC), Las Vegas, NV, USA; 31.05.2016 - 03.06.2016; in "Proceedings of IEEE Electronic Components and Technology Conference (ECTC)", (2016), ISBN: 978-1-5090-1204-6, 2188 - 2195 doi:10.1109/ECTC.2016.177. BibTeX |
| 1733. | M. Rovitto, H. Ceric: "Electromigration Induced Voiding and Resistance Change in Three-Dimensional Copper Through Silicon Vias"; Talk: IEEE Electronic Components and Technology Conference (ECTC), Las Vegas, NV, USA; 31.05.2016 - 03.06.2016; in "Proceedings of IEEE Electronic Components and Technology Conference (ECTC)", (2016), ISBN: 978-1-5090-1204-6, 550 - 556 doi:10.1109/ECTC.2016.49. BibTeX |
| 1732. | A. Selinger, K. Rupp, S. Selberherr: "Evaluation of Mobile ARM-Based SoCs for High Performance Computing"; Talk: High Performance Computing Symposium (HPC), Pasadena, CA, USA; 03.04.2016 - 06.04.2016; in "Proceedings of the 24th High Performance Computing Symposium", (2016), ISBN: 978-1-5108-2318-1, 21:1 - 21:7 doi:10.22360/SpringSim.2016.HPC.022. BibTeX |
| 1731. | N. Neophytou, M. Thesberg, H. Kosina: "Examining the Effectiveness of Energy-Filtering in 1D vs. 2D Structures Using Quantum Mechanical Transport Simulations"; Talk: European Conference on Thermoelectrics (ECT), Lisbon, Portugal; 20.09.2016 - 23.09.2016; in "Book of Abstracts 14th European Conference on Thermoelectrics", (2016), . BibTeX |
| 1730. | V. Simonka, G. Nawratil, A. Hössinger, J. Weinbub, S. Selberherr: "Geometrical Aspects of Three-Dimensional Silicon Carbide Oxidation Growth Rate Modeling"; Poster: Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Wien; 25.01.2016 - 27.01.2016; in "Book of Abstracts of the Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)", (2016), ISBN: 978-3-901578-29-8, 128 - 129. BibTeX |
| 1729. | T. Windbacher, B. Ullmann, A. Grill, J. Weinbub: "Ihr Smartphone - ein Supercomputer vor 20 Jahren. Ein Einblick in die Mikro- und Nanoelektronik"; Talk: European Researchers' Night: beSCIENCEd 2016, Wien; 30.09.2016. BibTeX |
| 1728. | B. Ullmann, A. Grill, P. Manstetten, M. Jech, M. Kampl, W. H. Zisser, L. Filipovic, M. Thesberg, F. Rudolf, T. Windbacher, J. Cervenka, M. Katterbauer, J. Weinbub: "Ihr Smartphone - ein Supercomputer vor 20 Jahren. Ein Einblick in die Mikro- und Nanoelektronik"; Talk: Lange Nacht der Forschung 2016, Wien; 22.04.2016. BibTeX |
| 1727. | L. Filipovic, A. P. Singulani, F. Roger, S. Carniello, S. Selberherr: "Impact of Across-Wafer Variation on the Electrical Performance of TSVs"; Talk: IEEE International Interconnect Technology Conference (IITC), San Jose, CA, USA; 23.05.2016 - 26.05.2016; in "Proceedings of the IEEE International Interconnect Technology Conference (IITC)", (2016), ISBN: 978-1-5090-0386-0, 130 - 132 doi:10.1109/IITC-AMC.2016.7507707. BibTeX |
| 1726. | T. Windbacher, B.G. Malm, V. Sverdlov, M. Östling, S. Selberherr: "Influence of the Free Layer Alignment on the Reliability of a Non-Volatile Magnetic Shift Register"; Talk: Workshop on Innovative Nanoscale Devices and Systems (WINDS), Kona, HI, USA; (invited) 04.12.2016 - 09.12.2016; in "Abstracts of the Workshop on Innovative Nanoscale Devices and Systems (WINDS)", (2016), ISBN: 978-3-901578-30-4, 43. BibTeX |
| 1725. | T. Windbacher, A. Makarov, V. Sverdlov, S. Selberherr: "Layer Coupling and Read Disturbances in a Buffered Magnetic Logic Environment"; Talk: SPIE Spintronics, San Diego, CA, USA; (invited) 28.08.2016 - 01.09.2016; in "Proceedings of SPIE Spintronics", (2016), 9931-93. BibTeX |
| 1724. | T. Windbacher, H. Mahmoudi, A. Makarov, V. Sverdlov, S. Selberherr: "Logic-in-memory: A Non-Volatile Processing Environment for the Post CMOS Age"; Talk: SISPAD Workshop, Nürnberg, Germany; 05.09.2016 in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2016), . BibTeX |
| 1723. | V. Sverdlov, A. Makarov, T. Windbacher, S. Selberherr: "Magnetic Field Dependent Tunneling Magnetoresistance through a Quantum Well between Ferromagnetic Contacts"; Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Nürnberg, Deutschland; 06.09.2016 - 08.09.2016; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2016), ISBN: 978-1-5090-0817-9, 315 - 318 doi:10.1109/SISPAD.2016.7605210. BibTeX |
| 1722. | T. Windbacher, V. Sverdlov, S. Selberherr: "Magnetic Nonvolatile Processing Environment"; Talk: I International Scientific and Practical Conference Innovation in the Software Systems of Trains, Samara, Russia; (invited) 19.05.2016 - 20.05.2016; in "Program and Abstracts of the I International Scientific and Practical Conference Innovation in the Software Systems of Trains", (2016), 42 - 43. BibTeX |
| 1721. | S. Papaleo, M. Rovitto, H. Ceric: "Mechanical Effects of the Volmer-Weber Growth in the TSV Sidewall"; Talk: IEEE Electronic Components and Technology Conference (ECTC), Las Vegas, NV, USA; 31.05.2016 - 03.06.2016; in "Proceedings of IEEE Electronic Components and Technology Conference (ECTC)", (2016), ISBN: 978-1-5090-1204-6, 1617 - 1622 doi:10.1109/ECTC.2016.19. BibTeX |
| 1720. | M. Nedjalkov, J. Weinbub, S. Selberherr: "Modeling Carrier Transport in Nanoscale Semiconductor Devices"; Talk: BIT's Annual World Congress of Nano Science & Technology, Singapore; (invited) 26.10.2016 - 28.10.2016; in "Abstracts of the BIT's 6th Annual World Congress of Nano Science & Technology-2016", (2016), 377. BibTeX |
| 1719. | P. Manstetten, L. Filipovic, A. Hössinger, J. Weinbub, S. Selberherr: "Modeling Neutral Particle Flux in High Aspect Ratio Holes using a One-Dimensional Radiosity Approach"; Talk: Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Wien; 25.01.2016 - 27.01.2016; in "Book of Abstracts of the Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)", (2016), ISBN: 978-3-901578-29-8, 68 - 69. BibTeX |
| 1718. | L. Filipovic, S. Selberherr: "Modeling the Deposition and Stress Generation in Thin Films for CMOS-Integrated Gas Sensors"; Talk: World Congress of Smart Materials (WCSM), Singapore; (invited) 04.03.2016 - 06.03.2016; in "Proceedings of the BIT's 2nd Annual World Congress of Smart Materials 2016", (2016), 517. BibTeX |
| 1717. | V. Sverdlov, J. Ghosh, A. Makarov, T. Windbacher, S. Selberherr: "Nanoelectronics with Spin"; Talk: World Congress and Expo on Nanotechnology and Materials Science, Dubai, United Arab Emirates; (invited) 04.04.2016 - 06.04.2016; in "Book of Abstracts of the World Congress and Expo on Nanotechnology and Materials Science", (2016), 19 - 20. BibTeX |
| 1716. | M. Waltl, A. Grill, G. Rzepa, W. Gös, J. Franco, B. Kaczer, J. Mitard, T. Grasser: "Nanoscale Evidence for the Superior Reliability of SiGe High-k pMOSFETs"; Poster: International Reliability Physics Symposium (IRPS), Pasadena, CA, USA; 17.04.2016 - 21.04.2016; in "Proceedings of the International Reliability Physics Symposium (IRPS)", (2016), XT-02-1 - XT-02-6 doi:10.1109/IRPS.2016.7574644. BibTeX |
| 1715. | T. Windbacher, A. Makarov, V. Sverdlov, S. Selberherr: "Novel Magnetic Devices for Memory and Non-Volatile Computing Applications"; Talk: Emerging Technologies Communication Microsystems Optoelectronics Sensing (ETCMOS), Montreal, QC, Canada; 25.05.2016 - 27.05.2016; in "2016 Conference Program of the Emerging Technologies Communication Microsystems Optoelectronics Sensing (ETCMOS)", (2016), 14 page(s) . BibTeX |
| 1714. | S. E. Tyaginov, A. Makarov, M. Jech, J. Franco, P. Sharma, B. Kaczer, T. Grasser: "On the Effect of Interface Traps on the Carrier Distribution Function During Hot-Carrier Degradation"; Poster: IEEE International Integrated Reliability Workshop (IIRW), South Lake Tahoe, CA, USA; 09.10.2016 - 13.10.2016; in "Final Report of the IEEE International Integrated Reliability Workshop (IIRW)", (2016), ISBN: 978-1-5090-4193-0, 95 - 98 doi:10.1109/IIRW.2016.7904911. BibTeX |
| 1713. | G. Rescher, G. Pobegen, T. Aichinger, T. Grasser: "On the Subthreshold Drain Current Sweep Hysteresis of 4H-SiC nMOSFETs"; Talk: IEEE International Electron Devices Meeting (IEDM), San Francisco, CA, USA; 03.12.2016 - 07.12.2016; in "Proceedings of the IEEE International Electron Devices Meeting (IEDM)", (2016), ISBN: 978-1-5090-3902-9, 10.8.1 - 10.8.4 doi:10.1109/IEDM.2016.7838392. BibTeX |
| 1712. | B. Kaczer, S. Amoroso, R. Hussin, A. Asenov, J. Franco, P. Weckx, Ph. J. Roussel, G. Rzepa, T. Grasser, N. Horiguchi: "On the distribution of the FET threshold voltage shifts due to individual charged gate oxide defects"; Talk: IEEE International Integrated Reliability Workshop (IIRW), Stanford Sierra Conference Center, S. Lake Tahoe, California, USA; 09.10.2016 - 13.10.2016; in "Proceedings of the IEEE International Integrated Reliability Workshop (IIRW)", (2016), ISBN: 978-1-5090-4192-3, 3 page(s) . BibTeX |
| 1711. | T. Sadi, E. Towie, M. Nedjalkov, C. Riddet, C. Alexander, L. Wang, V. Georgiev, A. Brown, C. Millar, A. Asenov: "One-Dimensional Multi-Subband Monte Carlo Simulation of Charge Transport in Si Nanowire Transistors"; Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Nürnberg, Deutschland; 06.09.2016 - 08.09.2016; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2016), ISBN: 978-1-5090-0817-9, 23 - 26 doi:10.1109/SISPAD.2016.7605139. BibTeX |
| 1710. | A. Morhammer, K. Rupp, F. Rudolf, J. Weinbub: "Optimized Sparse Matrix-Matrix Multilication for Multi-Core CPUs, GPUs and MICs"; Talk: Austrian HPC Meeting (AHPC), Grundlsee, Austria; 22.02.2016 - 24.02.2016; in "Book of Abstracts of the 2016 Austrian HPC Meeting (AHPC)", (2016), 23. BibTeX |
| 1709. | K. Rupp, A. Morhammer, T. Grasser, A. Jüngel: "Parallel Deterministic Solution of the Boltzmann Transport Equation for Semiconductors"; Talk: International Workshop on Finite Elements for Microwave Engineering, Florence, Italy; 16.05.2016 - 18.05.2016; in "Proceedings of the 13th Workshop on Finite Elements for Microwave Engineering", (2016), ISBN: 978-88-6655-967-2, 104. BibTeX |
| 1708. | M. Nedjalkov, P. Ellinghaus, J. Weinbub, S. Selberherr, T. Sadi, A. Asenov, L. Wang, S. Amoroso, E. Towie: "Physical Models for Variation-Aware Device Simulation"; Talk: Workshop on Variability-Aware Design Technology Co-Optimization, Nuremberg, Germany; (invited) 05.09.2016. BibTeX |
| 1707. | M. Thesberg, N. Neophytou, M. Pourfath, H. Kosina: "Power Factor Degradation Mechanisms in Energy-Filtering Thermoelectric Materials"; Talk: Energy-Materials-Nanotechnology Meeting on Thermoelectric Materials (EMN), Orlando, USA; (invited) 22.02.2016 - 25.02.2016; . BibTeX |
| 1706. | Yu. Illarionov, M. Waltl, M. M. Furchi, T. Müller, T. Grasser: "Reliability of Single-Layer MoS2 Field-Effect Transistors with SiO2 and hBN Gate Insulators"; Talk: IEEE International Reliability Physics Symposium (IRPS), Pasadena, CA, USA; 17.04.2016 - 21.04.2016; in "Proceedings of the IEEE International Reliability Physics Symposium (IRPS)", (2016), 5A-1-1 - 5A-1-6 doi:10.1109/IRPS.2016.7574543. BibTeX |
| 1705. | H. Kosina: "Semiconductor Device Modeling at the Nanoscale"; Talk: 42nd International Conference on Nano Engineering, MNE 2016, Wien; (invited) 19.09.2016 - 23.09.2016; . BibTeX |
| 1704. | J. Weinbub, A. Hössinger: "Shared-Memory Parallelization of the Fast Marching Method Using an Overlapping Domain-Decomposition Approach"; Talk: High Performance Computing Symposium (HPC), Pasadena, CA, USA; 03.04.2016 - 06.04.2016; in "Proceedings of the High Performance Computing Symposium (HPC)", (2016), ISBN: 978-1-5108-2318-1, 18:1 - 18:8 doi:10.22360/SpringSim.2016.HPC.052. BibTeX |
| 1703. | M. Nedjalkov, J. Weinbub, I. Dimov, S. Selberherr: "Signed Particle Interpretation for Wigner-Quantum Electron Evolution"; National Congress of Physical Sciences, Sofia, Bulgaria; (invited) 29.09.2016 - 02.10.2016; in "Abstracts Third National Congress of Physical Sciences", (2016), 1. BibTeX |
| 1702. | V. Sverdlov, T. Windbacher, A. Makarov, S. Selberherr: "Silicon Spintronics"; Talk: Energy-Materials-Nanotechnology Meeting on Magnetic Materials (EMN), Kona, USA; (invited) 21.03.2016 - 24.03.2016; in "Abstracts of the Energy-Materials-Nanotechnology Meeting on Magnetic Materials (EMN)", (2016), 37 - 38. BibTeX |
| 1701. | A. Makarov, V. Sverdlov, T. Windbacher, S. Selberherr: "Silicon Spintronics"; Talk: International Conference on Electronic Materials (ICEM), Singapur; (invited) 04.07.2016 - 08.07.2016; in "Proceedings of the ICEM 2016", (2016), 1 page(s) . BibTeX |
| 1700. | L. Wang, T. Sadi, A. Brown, M. Nedjalkov, C. Alexander, B. Cheng, C. Millar, A. Asenov: "Simulation Analysis of the Electro-Thermal Performance of SOI FinFETs"; Talk: Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Wien; 25.01.2016 - 27.01.2016; in "Book of Abstracts of the Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)", (2016), ISBN: 978-3-901578-29-8, 34 - 35. BibTeX |
| 1699. | V. Sverdlov, S. Selberherr: "Spin-dependent Resonant Tunneling in Ferromagnet-Oxide-Silicon Structures"; Poster: Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Vienna, Austria; 25.01.2016 - 27.01.2016; in "Book of Abstracts of the Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)", (2016), ISBN: 978-3-901578-29-8, 116 - 117. BibTeX |
| 1698. | H. Ceric, R. Orio, M. Rovitto: "TCAD Approach for the Assessment of Interconnect Reliability"; Talk: International Conference Reliability and Stress-Related Phenomena in Nanoelectronics - Experiment and Simulation (IRSP), Bad Schandau, Germany; (invited) 30.05.2016 - 01.06.2016; in "Abstracts of the International Conference Reliability and Stress-Related Phenomena in Nanoelectronics - Experiment and Simulation (IRSP)", (2016), T21. BibTeX |
| 1697. | Yu. Illarionov, M. Waltl, J. Kim, D. Akinwande, T. Grasser: "Temperature-dependent Hysteresis in Black Phosphorus FETs"; Poster: Graphene Week, Warsaw, Poland; 13.06.2016 - 17.06.2016; in "Proceedings of the 2016 Graphene Week", (2016), . BibTeX |
| 1696. | T. Grasser, M. Waltl, G. Rzepa, W. Gös, Y. Wimmer, A.-M. El-Sayed, A. Shluger, H. Reisinger, B. Kaczer: "The "Permanent" Component of NBTI Revisited: Saturation, Degradation-Reversal, and Annealing"; Talk: International Reliability Physics Symposium (IRPS), Pasadena, CA, USA; 17.04.2016 - 21.04.2016; in "Proceedings of the International Reliability Physics Symposium (IRPS)", (2016), 5A-2-1 - 5A-2-8 doi:10.1109/IRPS.2016.7574504. BibTeX |
| 1695. | M. Nedjalkov, J. Weinbub, S. Selberherr: "The Description of Carrier Transport for Quantum Systems"; Talk: Energy Materials Nanotechnology Meeting on Quantum, Phuket, Thailand; (invited) 08.04.2016 - 11.04.2016; in "Book of Abstracts of the Energy Materials Nanotechnology Meeting on Quantum", (2016), 41 - 42. BibTeX |
| 1694. | T. Windbacher, A. Makarov, V. Sverdlov, S. Selberherr: "The Exploitation of Magnetization Orientation Encoded Spin-Transfer Torque for an Ultra Dense Non-Volatile Magnetic Shift Register"; Talk: European Solid-State Device Research Conference (ESSDERC), Lausanne, Switzerland; 12.09.2016 - 16.09.2016; in "Proceedings of the European Solid-State Device Research Conference (ESSDERC)", (2016), ISBN: 978-1-5090-2969-3, 311 - 314 doi:10.1109/ESSDERC.2016.7599648. BibTeX |
| 1693. | V. Simonka, A. Hössinger, J. Weinbub, S. Selberherr: "Three-Dimensional Growth Rate Modeling and Simulation of Silicon Carbide Thermal Oxidation"; Poster: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Nürnberg, Deutschland; 06.09.2016 - 08.09.2016; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2016), ISBN: 978-1-5090-0817-9, 233 - 236 doi:10.1109/SISPAD.2016.7605190. BibTeX |
| 1692. | V. Sverdlov, J. Ghosh, S. Selberherr: "Universal Dependence of the Spin Lifetime in Silicon Films on the Spin Injection Direction"; Talk: Workshop on Innovative Nanoscale Devices and Systems (WINDS), Kona, HI, USA; (invited) 04.12.2016 - 09.12.2016; in "Abstracts of the Workshop on Innovative Nanoscale Devices and Systems (WINDS)", (2016), ISBN: 978-3-901578-30-4, 7. BibTeX |
| 1691. | P. Manstetten, L. Filipovic, A. Hössinger, J. Weinbub, S. Selberherr: "Using One-Dimensional Radiosity to Model Neutral Flux in Convex High Aspect Ratio Structures"; Poster: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Nürnberg, Deutschland; 06.09.2016 - 08.09.2016; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2016), ISBN: 978-1-5090-0817-9, 265 - 268 doi:10.1109/SISPAD.2016.7605198. BibTeX |
| 1690. | M. Karner, O. Baumgartner, Z. Stanojevic, F. Schanovsky, G. Strof, Ch. Kernstock, H. W. Karner, G. Rzepa, T. Grasser: "Vertically Stacked Nanowire MOSFETs for Sub-10nm Nodes: Advanced Topography, Device, Variability, and Reliability Simulations"; Talk: IEEE International Electron Devices Meeting (IEDM), San Francisco, CA, USA; 03.12.2016 - 07.12.2016; in "Proceedings of the IEEE International Electron Devices Meeting (IEDM)", (2016), ISBN: 978-1-5090-3902-9, 30.7.1 - 30.7.4 doi:10.1109/IEDM.2016.7838516. BibTeX |
| 1689. | P. Ellinghaus, M. Nedjalkov, J. Weinbub, S. Selberherr: "Wigner Modelling of Quantum Wires"; Talk: Workshop on Innovative Nanoscale Devices and Systems (WINDS), Kona, HI, USA; (invited) 04.12.2016 - 09.12.2016; in "Abstracts of the Workshop on Innovative Nanoscale Devices and Systems (WINDS)", (2016), ISBN: 978-3-901578-30-4, 2. BibTeX |
| 1688. | M. Nedjalkov, J. Weinbub, P. Ellinghaus, S. Selberherr: "Wigner Signed Particles - An Intuitive Alternative of Particle-Wave Duality"; Talk: SEMODAY Meeting, Florence, Italy; (invited) 16.10.2016 - 17.10.2016; . BibTeX |
| 1687. | L. Wang, A. Brown, M. Nedjalkov, C. Alexander, B. Cheng, C. Millar, A. Asenov: "3D Electro-Thermal Simulations of Bulk FinFETs with Statistical Variations"; Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Washington DC, USA; 09.09.2015 - 11.09.2015; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2015), ISBN: 978-1-4673-7858-1, 112 - 115 doi:10.1109/SISPAD.2015.7292271. BibTeX |
| 1686. | Y. Wimmer, W. Gös, A.-M. El-Sayed, A. Shluger, T. Grasser: "A Density-Functional Study of Defect Volatility in Amorphous Silicon Dioxide"; Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Washington DC, USA; 09.09.2015 - 11.09.2015; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2015), ISBN: 978-1-4673-7860-4, 44 - 47 doi:10.1109/SISPAD.2015.7292254. BibTeX |
| 1685. | P. Sharma, S. E. Tyaginov, Y. Wimmer, F. Rudolf, H. Enichlmair, J.M. Park, H. Ceric, T. Grasser: "A Model for Hot-Carrier Degradation in nLDMOS Transistors Based on the Exact Solution of the Boltzmann Transport Equation Versus the Drift-Diffusion Scheme"; Talk: Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Bologna, Italy; 26.01.2015 - 28.01.2015; in "Proceedings of the Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)", (2015), 21 - 24 doi:10.1109/ULIS.2015.7063763. BibTeX |
| 1684. | A. Makarov, T. Windbacher, V. Sverdlov, S. Selberherr: "A Novel Method of SOT-MRAM Switching"; Talk: International Symposium on Advanced Nanostructures and Nano-Devices (ISANN), Waikaloa, Hawaii, USA; 29.11.2015 - 04.12.2015; in "Abstracts International Symposium on Advanced Nanodevices and Nanotechnology (ISANN)", (2015), . BibTeX |
| 1683. | K. Rupp, A. Jüngel, T. Grasser: "A Performance Comparison of Algebraic Multigrid Preconditioners on GPUs and MIC"; Talk: Copper Mountain Conference on Multigrid Methods, Copper Mountain, CO, USA; 22.03.2015 - 27.03.2015; . BibTeX |
| 1682. | A. Kefayati, M. Pourfath, H. Kosina: "A Rigorous Study of Nanoscaled Transistors Based on Single-Layer MoS2"; Poster: International Workshop on Computational Electronics (IWCE), West Lafayette, Indiana, USA; 02.09.2015 - 04.09.2015; in "Book of Abstracts of the International Workshop on Computational Electronics (IWCE)", (2015), ISBN: 978-0-692-50554-0, 7 - 8. BibTeX |
| 1681. | T. Windbacher, A. Makarov, V. Sverdlov, S. Selberherr: "A Universal Nonvolatile Processing Environment"; Poster: Advanced Research Workshop on Future Trends in Microelectronics: Journey into the Unknown, Mallorca, Spain; 21.06.2015 - 26.06.2015; in "Abstracts Advanced Research Workshop on Future Trends in Microelectronics: Journey into the Unknown", (2015), 62. BibTeX |
| 1680. | T. Grasser: "Advanced Modeling and Characterization of Bias Temperature Instabilities and Hot Carrier Degradation"; Talk: D2T Symposium, Tokyo, Japan; (invited) 21.08.2015. BibTeX |
| 1679. | T. Grasser: "Advanced Modeling and Characterization of Bias Temperature Instabilities and Hot Carrier Degradation"; Talk: Kyoto Institute of Technology, Kyoto, Japan; (invited) 24.08.2015. BibTeX |
| 1678. | L. Wang, T. Sadi, M. Nedjalkov, A. Brown, C. Alexander, B. Cheng, C. Millar, A. Asenov: "An Advanced Electro-Thermal Simulation Methodology For Nanoscale Device"; IEEE, in "Proceedings of the International Workshop on Computational Electronics (IWCE)", (2015), ISBN: 978-0-692-51523-5, doi:10.1109/IWCE.2015.7301989. BibTeX |
| 1677. | L. Wang, T. Sadi, M. Nedjalkov, A. Brown, C. Alexander, B. Cheng, C. Millar, A. Asenov: "An Advanced Electro-Thermal Simulation Methodology For Nanoscale Device"; Poster: International Workshop on Computational Electronics (IWCE), West Lafayette, Indiana, USA; 02.09.2015 - 04.09.2015; in "Book of Abstracts of the International Workshop on Computational Electronics (IWCE)", (2015), ISBN: 978-0-692-50554-0, 155 - 156. BibTeX |
| 1676. | M. Rovitto, W. H. Zisser, H. Ceric: "Analysis of Electromigration Void Nucleation Failure Time in Open Copper TSVs"; Poster: IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), Hsinchu, Taiwan; 29.06.2015 - 02.07.2015; in "Proceedings of the IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)", (2015), . BibTeX |
| 1675. | Yu. Illarionov, M. Waltl, A. Smith, S. Vaziri, M. Ostling, M. Lemme, T. Grasser: "Back Gate Bias-Temperature Instability in Single-Layer Double-Gated Graphene Field-Effect Transistors"; Talk: International Conference on Solid State Devices and Materials (SSDM), Sapporo, Japan; 27.09.2015 - 30.09.2015; in "Extended Abstracts of the 2015 International Conference on Solid State Devices and Materials (SSDM 2015)", (2015), ISBN: 978-4-86348-514-3, 650 - 651. BibTeX |
| 1674. | H. Kosina: "Blessing or curse: Dissipative quantum transport in nano-scale devices"; Talk: Workshop "From Atom to Transistor" at the 45th European Solid-State Device Research Conference (ESSDERC), Graz; (invited) 18.09.2015. BibTeX |
| 1673. | V. Sverdlov, J. Ghosh, A. Makarov, T. Windbacher, S. Selberherr: "CMOS-Compatible Spintronic Devices"; Talk: International Symposium on Microelectronics Technology and Devices (SBMicro), Salvador, Brazil; (invited) 01.09.2015 - 04.09.2015; in "Proceedings of the 30th Symposium on Microelectronics Technology and Devices (SBMicro)", (2015), ISBN: 978-1-4673-7162-9, 4 page(s) doi:10.1109/SBMicro.2015.7298103. BibTeX |
| 1672. | S. Selberherr: "CMOS-Compatible Spintronic Devices"; Talk: IEEE EDS Mini-Colloquium Distinguished Lecture, Universidade Salvador, Salvador, Brasil; (invited) 01.09.2015. BibTeX |
| 1671. | N. Neophytou, M. Thesberg, M. Pourfath, H. Kosina: "Calculations of the Thermopower in Materials with Nano-Inclusions Using Quantum Mechanical Simulations"; Talk: APS March Meeting, San Antonio, USA; 02.03.2015 - 06.03.2015; in "Bulletin of the American Physical Society (APS March Meeting)", (2015), 60/1, . BibTeX |
| 1670. | G. Rzepa, W. Gös, B. Kaczer, T. Grasser: "Characterization and Modeling of Reliability Issues in Nanoscale Devices"; Talk: IEEE International Symposium on Circuits and Systems (ISCAS), Lisbon, Portugal; (invited) 24.05.2015 - 27.05.2015; in "Proceedings of the IEEE International Symposium on Circuits and Systems (ISCAS) 2015", (2015), ISBN: 978-1-4799-8391-9, 2445 - 2448. BibTeX |
| 1669. | Yu. Illarionov, M. Vexler, V. V. Fedorov, S. M. Suturin, N. S. Sokolov, T. Grasser: "Characterization of Epitaxial Calcium Fluoride as a Dielectric Material for Ultra-Thin Barrier Layers in Silicon Microelectronics"; Poster: International Conference on Solid State Devices and Materials (SSDM), Sapporo, Japan; 27.09.2015 - 30.09.2015; in "Extended Abstracts of the 2015 International Conference on Solid State Devices and Materials (SSDM 2015)", (2015), ISBN: 978-4-86348-514-3, 330 - 331. BibTeX |
| 1668. | B. Ullmann, M. Waltl, T. Grasser: "Characterization of the Permanent Component of MOSFET Degradation Mechanisms"; Talk: Vienna Young Scientists Symposium - VSS 2015, Vienna University of Technology; 25.06.2015 - 26.06.2015; in "Proceedings of the 2015 Vienna Young Scient Symposium", (2015), ISBN: 978-3-9504017-0-7, 36 - 37. BibTeX |
| 1667. | A. Grill, G. Rzepa, P. Lagger, C. Ostermaier, H. Ceric, T. Grasser: "Charge Feedback Mechanisms at Forward Threshold Voltage Stress in GaN/AlGaN HEMTs"; Talk: IEEE International Reliability Workshop (IIRW), South Lake Tahoe, CA, USA; 11.10.2015 - 15.10.2015; in "Proceedings of the IEEE International Integrated Reliability Workshop (IIRW)", (2015), ISBN: 978-1-4673-7395-1, 41 - 45 doi:10.1109/IIRW.2015.7437064. BibTeX |
| 1666. | T. Grasser: "Charge Transfer of Single Holes in Nanoscale MOS Transistors: Linking DFT to Experiment"; Talk: CECAM-Workshop on Structural and Electronic Phenomena at Interfaces of Nanoscale Oxides, Lausanne, Switzerland; (invited) 08.04.2015 - 10.04.2015; . BibTeX |
| 1665. | H. Ceric, S. Selberherr: "Compact Model for Solder Bump Electromigration Failure"; Poster: International Interconnect Technology and Materials for Advanced Metallization Conference (IITC/MAM), Grenoble, France; 18.05.2015 - 21.05.2015; in "Proceedings of the International Interconnect Technology and Materials for Advanced Metallization Conference (IITC/MAM)", (2015), ISBN: 978-1-4673-7355-5, 159 - 161 doi:10.1109/IITC-MAM.2015.7325651. BibTeX |
| 1664. | P. Sharma, S. E. Tyaginov, Y. Wimmer, F. Rudolf, K. Rupp, H. Enichlmair, J.M. Park, H. Ceric, T. Grasser: "Comparison of Analytic Distribution Function Models for Hot-Carrier Degradation in nLDMOSFETs"; Talk: European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), Toulouse, France; 05.10.2015 - 09.10.2015; in "Abstracts of the 26th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis", (2015), 60. BibTeX |
| 1663. | J. Weinbub, P. Ellinghaus, M. Nedjalkov, S. Selberherr: "Comparison of Slab and Block Decomposition Strategies for the Two-Dimensional Wigner Monte Carlo Method"; Talk: International Symposium on Advanced Nanostructures and Nano-Devices (ISANN), Waikaloa, Hawaii, USA; 29.11.2015 - 04.12.2015; in "Abstracts International Symposium on Advanced Nanodevices and Nanotechnology (ISANN)", (2015), . BibTeX |
| 1662. | A. Makarov, T. Windbacher, V. Sverdlov, S. Selberherr: "Concept of a SOT-MRAM based on 1Transistor-1MTJ-Cell Structure"; Poster: International Conference on Solid State Devices and Materials (SSDM), Sapporo, Japan; 27.09.2015 - 30.09.2015; in "Extended Abstracts of the International Conference on Solid State Devices and Materials (SSDM)", (2015), ISBN: 978-4-86348-514-3, 140 - 141. BibTeX |
| 1661. | J. Ghosh, D. Osintsev, V. Sverdlov, S. Selberherr: "Dependence of Spin Lifetime on Spin Injection Orientation in Strained Silicon Films"; Poster: Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Bologna, Italy; 26.01.2015 - 28.01.2015; in "Proceedings of the Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)", (2015), ISBN: 978-1-4799-6910-4, 285 - 288 doi:10.1109/ULIS.2015.7063829. BibTeX |
| 1660. | S. Papaleo, W. H. Zisser, H. Ceric: "Effects of the Initial Stress at the Bottom of Open TSVs"; Poster: IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), Hsinchu, Taiwan; 29.06.2015 - 02.07.2015; in "Proceedings of the IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)", (2015), . BibTeX |
| 1659. | A. Makarov, T. Windbacher, V. Sverdlov, S. Selberherr: "Efficient High-Frequency Spin-Torque Oscillators Composed of Two Three-Layer MgO-MTJs with a Common Free Layer"; Talk: Iberchip Workshop (IWS), Montevideo, Uruguay; (invited) 24.02.2015 - 27.02.2015; in "Proceedings of 21st Iberchip Worshop", (2015), 23, . BibTeX |
| 1658. | O. Baumgartner, L. Filipovic, H. Kosina, M. Karner, Z. Stanojevic, H. W. Cheng-Karner: "Efficient Modeling of Source/Drain Tunneling in Ultra-Scaled Transistors"; Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Washington DC, USA; 09.09.2015 - 11.09.2015; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2015), ISBN: 978-1-4673-7859-8, 202 - 205 doi:10.1109/SISPAD.2015.7292294. BibTeX |
| 1657. | A. Selinger, D. Ojdanic, K. Rupp, E. Langer: "Eigenvalue Computations on Graphics Processing Units"; Talk: Vienna Young Scientists Symposium - VSS 2015, Vienna University of Technology; 25.06.2015 - 26.06.2015; in "Proceedings of the 2015 Vienna Young Scientist Symposium", (2015), Gumpoldskirchen, Austria, ISBN: 978-3-9504017-0-7, 40 - 41. BibTeX |
| 1656. | M. Rovitto, W. H. Zisser, H. Ceric, T. Grasser: "Electromigration Modelling of Void Nucleation in Open Cu-TSVs"; Poster: International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), Budapest, Hungary; 19.04.2015 - 22.04.2015; in "Proceedings of the International Conference on Thermal, Mechanical & Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE)", (2015), ISBN: 978-1-4799-9949-1, 5 page(s) doi:10.1109/EuroSimE.2015.7103100. BibTeX |
| 1655. | V. Sverdlov, J. Ghosh, D. Osintsev, S. Selberherr: "Electron Spin Lifetime Enhancement by Shear Strain in Thin Silicon Films"; Talk: CMOS Emerging Technologies Research (CMOSETR), Vancouver, BC, Canada; (invited) 20.05.2015 - 22.05.2015; in "Book of Abstracts of the 2015 CMOS Emerging Technologies Research Symposium (CMOSETR)", (2015), ISBN: 978-1-927500-70-5, 58. BibTeX |
| 1654. | J. Ghosh, D. Osintsev, V. Sverdlov, S. Selberherr: "Evaluation of Spin Lifetime in Thin Silicon Films by Multilevel Parallelization"; Poster: nanoHUB User Conference, West Lafayette, Indiana, USA; 31.08.2015 - 01.09.2015; in "Proceedings of the nanoHUB User Conference", (2015), 1. BibTeX |
| 1653. | H. Demel, Z. Stanojevic, M. Karner, G. Rzepa, T. Grasser: "Expanding TCAD Simulations from Grid to Cloud"; Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Washington DC, USA; 09.09.2015 - 11.09.2015; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2015), ISBN: 978-1-4673-7860-4, 186 - 189 doi:10.1109/SISPAD.2015.7292290. BibTeX |
| 1652. | L. Gerrer, R. Hussin, S. Amoroso, J. Franco, P. Weckx, N. Simicic, N. Horiguchi, B. Kaczer, T. Grasser, A. Asenov: "Experimental Evidences and Simulations of Trap Generation along a Percolation Path"; Talk: European Solid-State Device Research Conference (ESSDERC), Graz; 14.09.2015 - 18.09.2015; in "Proceedings of the European Solid-State Device Research Conference (ESSDERC)", (2015), ISBN: 978-1-4673-7133-9, 226 - 229 doi:10.1109/ESSDERC.2015.7324755. BibTeX |
| 1651. | M. Knepley, K. Rupp, A. Terrel: "FEM Integration with Quadrature on the GPU"; Talk: SIAM Conference on Computational Science and Engineering, Salt Lake City, Utah, USA; 14.03.2015 - 18.03.2015; . BibTeX |
| 1650. | S. Papaleo, W. H. Zisser, H. Ceric: "Factors that Influence Delamination at the Bottom of Open TSVs"; Poster: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Washington DC, USA; 09.09.2015 - 11.09.2015; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2015), ISBN: 978-1-4673-7858-1, 421 - 424 doi:10.1109/SISPAD.2015.7292350. BibTeX |
| 1649. | T. Grasser, M. Waltl, Y. Wimmer, W. Gös, R. Kosik, G. Rzepa, H. Reisinger, G. Pobegen, A.-M. El-Sayed, A. Shluger, B. Kaczer: "Gate-Sided Hydrogen Release as the Origin of "Permanent" NBTI Degradation: From Single Defects to Lifetimes"; Talk: IEEE International Electron Devices Meeting (IEDM), Washington, DC, USA; 07.12.2015 - 09.12.2015; in "Proceedings of the IEEE International Electron Devices Meeting (IEDM)", (2015), 535 - 538 doi:10.1109/IEDM.2015.7409739. BibTeX |
| 1648. | F. Roger, A. P. Singulani, S. Carniello, L. Filipovic, S. Selberherr: "Global Statistical Methodology for the Analysis of Equipment Parameter Effects on TSV Formation"; Talk: International Workshop on CMOS Variability (VARI), Salvador, Brazil; 01.09.2015 - 04.09.2015; in "Proceedings of the 6th International Workshop on CMOS Variability (VARI)", (2015), ISBN: 978-1-5090-0071-5, 39 - 44 doi:10.1109/VARI.2015.7456561. BibTeX |
| 1647. | M. Karner, Z. Stanojevic, Ch. Kernstock, O. Baumgartner, H. W. Cheng-Karner: "Hierarchical TCAD Device Simulation of FinFETs"; Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Washington DC, USA; 09.09.2015 - 11.09.2015; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2015), ISBN: 978-1-4673-7859-8, 258 - 261 doi:10.1109/SISPAD.2015.7292308. BibTeX |
| 1646. | Yu. Illarionov, M. Waltl, A. Smith, S. Vaziri, M. Ostling, T. Müller, M. Lemme, T. Grasser: "Hot-Carrier Degradation in Single-Layer Double-Gated Graphene Field-Effect Transistors"; Talk: International Reliability Physics Symposium (IRPS), Monterey, CA, USA; 19.04.2015 - 23.04.2015; in "Proceedings of the International Reliability Physics Symposium (IRPS)", (2015), XT.2.1 - XT.2.6 doi:10.1109/IRPS.2015.7112834. BibTeX |
| 1645. | Yu. Illarionov, M. Waltl, A. Smith, S. Vaziri, M. Ostling, M. Lemme, T. Grasser: "Impact of Hot Carrier Stress on the Defect Density and Mobility in Double-Gated Graphene Field-Effect Transistors"; Talk: Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Bologna, Italy; 26.01.2015 - 28.01.2015; in "Proceedings of the Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)", (2015), ISBN: 978-1-4799-6910-4, 81 - 84 doi:10.1109/ULIS.2015.7063778. BibTeX |
| 1644. | H. Ceric, M. Rovitto: "Impact of Microstructure and Current Crowding on Electromigration: A TCAD Study"; Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Washington DC, USA; 09.09.2015 - 11.09.2015; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2015), ISBN: 978-1-4673-7858-1, 194 - 197 doi:10.1109/SISPAD.2015.7292292. BibTeX |
| 1643. | P. Ellinghaus, M. Nedjalkov, S. Selberherr: "Improved Drive-Current into Nanoscaled Channels using Electrostatic Lenses"; Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Washington DC, USA; 09.09.2015 - 11.09.2015; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2015), ISBN: 978-1-4673-7860-4, 24 - 27 doi:10.1109/SISPAD.2015.7292249. BibTeX |
| 1642. | P. Ellinghaus, M. Nedjalkov, S. Selberherr: "Improved Particle Annihilation for Wigner Monte Carlo Simulations on a High-Resolution Mesh"; Talk: International Workshop on Computational Electronics (IWCE), West Lafayette, Indiana, USA; 02.09.2015 - 04.09.2015; in "Book of Abstracts of the International Workshop on Computational Electronics (IWCE)", (2015), ISBN: 978-0-692-50554-0, 93 - 94. BibTeX |
| 1641. | T. Windbacher, A. Makarov, V. Sverdlov, S. Selberherr: "Improving the Performance of a Non-Volatile Magnetic Flip Flop by Exploiting the Spin Hall Effect"; Poster: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Washington DC, USA; 09.09.2015 - 11.09.2015; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2015), ISBN: 978-1-4673-7858-1, 446 - 449 doi:10.1109/SISPAD.2015.7292357. BibTeX |
| 1640. | J. Ghosh, D. Osintsev, V. Sverdlov, S. Selberherr: "Increase of Surface Roughness and Phonon Scattering Mediated Spin Lifetime in Thin Strained SOI Film"; Talk: European Materials Research Society (EMRS), Warsaw, Poland; 15.09.2015 - 18.09.2015; in "Book of Abstracts of the 2015 E-MRS Fall Meeting", (2015), 1 page(s) . BibTeX |
| 1639. | J. Ghosh, V. Sverdlov, S. Selberherr: "Increment of Spin Lifetime by Spin Injection Orientation in Stressed Thin SOI Films"; Poster: International Conference on Spintronics and Quantum Information Technology (SPINTECH), Basel, Switzerland; 10.08.2015 - 13.08.2015; in "Program and Abstract Book of the 8th International School & Conference on Spintronics and Quantum Information Technology", (2015), 130. BibTeX |
| 1638. | J. Ghosh, V. Sverdlov, S. Selberherr: "Influence of Valley Splitting on Spin Relaxation Time in a Strained Thin Silicon Film"; Talk: International Workshop on Computational Electronics (IWCE), West Lafayette, Indiana, USA; 02.09.2015 - 04.09.2015; in "Proceedings of the International Workshop on Computational Electronics (IWCE)", (2015), ISBN: 978-0-692-51523-5, 4 page(s) doi:10.1109/IWCE.2015.7301961. BibTeX |
| 1637. | J. Ghosh, D. Osintsev, V. Sverdlov, S. Selberherr: "Injection Direction Sensitive Spin Lifetime Model in a Strained Thin Silicon Film"; Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Washington DC, USA; 09.09.2015 - 11.09.2015; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2015), ISBN: 978-1-4673-7858-1, 277 - 280 doi:10.1109/SISPAD.2015.7292313. BibTeX |
| 1636. | Yu. Illarionov, M. Waltl, S. Smith, S. Vaziri, M. Ostling, M. Lemme, T. Grasser: "Interplay between Hot Carrier and Bias Stress Components in Single-Layer Double-Gated Graphene Field-Effect Transistors"; Talk: European Solid-State Device Research Conference (ESSDERC), Graz, Austria; 14.09.2015 - 18.09.2015; in "Proceedings of the European Solid-State Device Research Conference (ESSDERC)", (2015), ISBN: 978-1-4673-7133-9, 172 - 175 doi:10.1109/ESSDERC.2015.7324741. BibTeX |
| 1635. | J. Ghosh, D. Osintsev, V. Sverdlov, S. Selberherr: "Intersubband Spin Relaxation Reduction and Spin Lifetime Enhancement by Strain in SOI Structures"; Talk: International Conference on Insulating Films on Semiconductors (INFOS), Udine, Italy; 29.06.2015 - 02.07.2015; in "Book of Abstracts 19th Conference on Insulating Films on Semiconductors", (2015), ISBN: 978-88-9030-695-2, 235 - 236. BibTeX |
| 1634. | L. Filipovic, A. P. Singulani, F. Roger, S. Carniello, S. Selberherr: "Intrinsic Stress Analysis of Tungsten-Lined Open TSVs"; Talk: European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), Toulouse, France; 05.10.2015 - 09.10.2015; in "Abstracts of the 26th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis", (2015), 71. BibTeX |
| 1633. | L. Filipovic, S. Selberherr: "Kinetics of Droplet Motion During Spray Pyrolysis"; Talk: Energy-Materials-Nanotechnology Meeting on Droplets (EMN), Phuket, Thailand; (invited) 08.05.2015 - 11.05.2015; in "Abstracts of the Energy-Materials-Nanotechnology Meeting on Droplets (EMN)", (2015), 127 - 128. BibTeX |
| 1632. | Ch. Kernstock, Z. Stanojevic, O. Baumgartner, M. Karner: "Layout-Based TCAD Device Model Generation"; Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Washington DC, USA; 09.09.2015 - 11.09.2015; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2015), ISBN: 978-1-4673-7859-8, 198 - 201 doi:10.1109/SISPAD.2015.7292293. BibTeX |
| 1631. | P. Ellinghaus, M. Nedjalkov, S. Selberherr: "Memory-efficient Particle Annihilation Algorithm for Wigner Monte Carlo Simulations"; Talk: International Workshop on Computational Electronics (IWCE), West Lafayette, Indiana, USA; 02.09.2015 - 04.09.2015; in "Proceedings of the International Workshop on Computational Electronics (IWCE)", (2015), ISBN: 978-0-692-51523-5, 4 page(s) doi:10.1109/IWCE.2015.7301955. BibTeX |
| 1630. | F. Rudolf, J. Weinbub, K. Rupp, P. Resutik, S. Selberherr: "Mesh Healing for TCAD Simulations"; Talk: International Conference on Large-Scale Scientific Computations (LSSC), Sozopol, Bulgaria; 08.06.2015 - 12.06.2015; in "Abstracts International Conference on Large-Scale Scientific Computations (LSSC)", (2015), 66. BibTeX |
| 1629. | G. Rzepa, M. Waltl, W. Gös, B. Kaczer, T. Grasser: "Microscopic Oxide Defects Causing BTI, RTN, and SILC on High-K FinFETs"; Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Washington DC, USA; 09.09.2015 - 11.09.2015; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2015), ISBN: 978-1-4673-7860-4, 144 - 147 doi:10.1109/SISPAD.2015.7292279. BibTeX |
| 1628. | P. Sharma, M. Jech, S. E. Tyaginov, F. Rudolf, K. Rupp, H. Enichlmair, J.M. Park, T. Grasser: "Modeling of Hot-Carrier Degradation in LDMOS Devices Using a Drift-Diffusion Based Approach"; Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Washington DC, USA; 09.09.2015 - 11.09.2015; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2015), ISBN: 978-1-4673-7858-1, 60 - 63 doi:10.1109/SISPAD.2015.7292258. BibTeX |
| 1627. | J. Franco, B. Kaczer, P. Roussel, E. Bury, H. Mertens, R. Ritzenthaler, T. Grasser, N. Horiguchi, A. Thean, G Groeseneken: "NBTI in Si 0.55 Ge 0.45 Cladding p-FinFETs: Porting the Superior Reliability from Planar to 3D Architectures"; Talk: International Reliability Physics Symposium (IRPS), Monterey, CA, USA; 19.04.2015 - 23.04.2015; in "Proceedings of the International Reliability Physics Symposium (IRPS)", (2015), 2F.4.1 - 2F.4.5 doi:10.1109/IRPS.2015.7112694. BibTeX |
| 1626. | T. Windbacher, A. Makarov, V. Sverdlov, S. Selberherr: "Novel Buffered Magnetic Logic Gate Grid"; Poster: Meeting of the Electrochemical Society (ECS), Chicago, Illinois, USA; 24.05.2015 - 28.05.2015; in "Proceedings of the 227th ECS Meeting (ECS)", (2015), 67, ISSN: 1938-6737, 2 page(s) . BibTeX |
| 1625. | T. Windbacher, A. Makarov, V. Sverdlov, S. Selberherr: "Novel Spintronic Devices for Embedded Spin-Based Memories and Non-Volatile Computing"; Talk: Energy-Materials-Nanotechnology Fall Meeting (EMN), Las Vegas, USA; (invited) 16.11.2015 - 19.11.2015; in "Abstracts of the Energy-Materials-Nanotechnology Fall Meeting (EMN)", (2015), 15 - 16. BibTeX |
| 1624. | K. Rupp, S. Balay, J. Brown, M. Knepley, L. McInnes, B. Smith: "On The Evolution Of User Support Topics in Computational Science and Engineering Software"; Poster: Computational Science & Engineering Software Sustainability and Productivity Challenges (CSESSP Challenges), Rockville, MD, USA; 15.10.2015 - 16.10.2015; in "Computational Science and Engineering Software Sustainability and Productivity Challenges (CSESSP) Workshop", (2015), 1 - 2. BibTeX |
| 1623. | R. Stradiotto, G. Pobegen, C. Ostermaier, T. Grasser: "On The Fly Characterization of Charge Trapping Phenomena at GaN/Dielectric and GaN/AlGaN/Dielectric Interfaces Using Impedance Measurements"; Talk: European Solid-State Device Research Conference (ESSDERC), Graz; 14.09.2015 - 18.09.2015; in "Proceedings of the European Solid-State Device Research Conference (ESSDERC)", (2015), ISBN: 978-1-4673-7860-4, 218 - 225 doi:10.1109/ESSDERC.2015.7324754. BibTeX |
| 1622. | S. E. Tyaginov, M. Jech, P. Sharma, J. Franco, B. Kaczer, T. Grasser: "On the Temperature Behavior of Hot-Carrier Degradation"; Talk: IEEE International Integrated Reliability Workshop (IIRW), South Lake Tahoe, CA, USA; 11.10.2015 - 15.10.2015; in "Proceedings of the IEEE International Integrated Reliability Workshop (IIRW)", (2015), 143 - 146 doi:10.1109/IIRW.2015.7437088. BibTeX |
| 1621. | Y. Wimmer, W. Gös, A.-M. El-Sayed, A. Shluger, T. Grasser: "On the Validity of the Harmonic Potential Energy Surface Approximation for Nonradiative Multiphonon Charge Transitions in Oxide Defects"; Talk: International Workshop on Computational Electronics (IWCE), West Lafayette, Indiana, USA; 02.09.2015 - 04.09.2015; in "Book of Abstracts of the International Workshop on Computational Electronics (IWCE)", (2015), ISBN: 978-0-692-50554-0, 97 - 98. BibTeX |
| 1620. | T. Grasser, M. Waltl, W. Gös, Y. Wimmer, A. El-Sayed, A. Shluger, B. Kaczer: "On the Volatility of Oxide Defects: Activation, Deactivation, and Transformation"; Talk: International Reliability Physics Symposium (IRPS), Monterey, CA, USA; 19.04.2015 - 23.04.2015; in "Proceedings of the International Reliability Physics Symposium (IRPS)", (2015), 5A.3.1 - 5A.3.8 doi:10.1109/IRPS.2015.7112739. BibTeX |
| 1619. | M. Thesberg, M. Pourfath, N. Neophytou, H. Kosina: "Optimization of Energy Filtering for Power Factor Improvements Through Fully Quantum Mechanical Transport Simulations"; Talk: International Conference on Thermoelectrics & European Conference on Thermoelectrics (ICT&ECT), Dresden, Germany; 28.06.2015 - 02.07.2015; in "Proceedings of the 34th Annual International Conference on Thermoelectrics and the 13th European Conference on Thermoelectrics (ICT&ECT)", (2015), 1 page(s) . BibTeX |
| 1618. | M. Thesberg, M. Pourfath, N. Neophytou, H. Kosina: "Optimization of Thermoelectric Properties in Cross-Plane Superlattices - A 1D NEGF Study"; Talk: APS March Meeting, San Antonio, USA; 02.03.2015 - 06.03.2015; in "Bulletin of the American Physical Society (APS March Meeting)", (2015), 60/1, . BibTeX |
| 1617. | B. Kaczer, J. Franco, M. Cho, T. Grasser, P. Roussel, S. E. Tyaginov, M. Bina, Y. Wimmer, L. M. Procel, L. Trojman, F. Crupi, G. Pitner, V. Putcha, P. Weckx, E. Bury, Z. Ji, A. De Keersgieter, T. Chiarella, N. Horiguchi, G Groeseneken, A. Thean: "Origins and Implications of Increased Channel Hot Carrier Variability in nFinFETs"; Talk: International Reliability Physics Symposium (IRPS), Monterey, CA, USA; 19.04.2015 - 23.04.2015; in "Proceedings of the International Reliability Physics Symposium (IRPS)", (2015), 6 page(s) doi:10.1109/IRPS.2015.7112706. BibTeX |
| 1616. | T. Grasser: "Oxide Defects in MOS Transistors: Characterization and Modeling"; Talk: Workshop on Dielectrics in Microelectronics (WODIM), Kinsale, Ireland; (invited) 09.06.2015 - 11.06.2015; . BibTeX |
| 1615. | T. Grasser: "Oxide Defects in MOS Transistors: Characterization and Modeling"; Talk: IEEE EDS Distinguished Lecture, Aranjuez, Spain; (invited) 11.02.2015. BibTeX |
| 1614. | K. Rupp: "PETSc on GPUs and MIC: Current Status and Future Directions"; Talk: Workshop: Celebrating 20 Years of Computational Science with PETSc Tutorial and Conference, Argonne National Laboratory, IL, USA; 15.06.2015 - 18.06.2015; . BibTeX |
| 1613. | J. Weinbub, P. Ellinghaus, S. Selberherr: "Parallelization of the Two-Dimensional Wigner Monte Carlo Method"; Talk: International Conference on Large-Scale Scientific Computations (LSSC), Sozopol, Bulgaria; 08.06.2015 - 12.06.2015; in "Abstracts International Conference on Large-Scale Scientific Computations (LSSC)", (2015), 73. BibTeX |
| 1612. | J. Cervenka, P. Ellinghaus: "Preconditioned Deterministic Solver for the Wigner Equation"; Talk: International Conference on Large-Scale Scientific Computations (LSSC), Sozopol, Bulgaria; 08.06.2015 - 12.06.2015; in "Abstracts International Conference on Large-Scale Scientific Computations (LSSC)", (2015), 31. BibTeX |
| 1611. | P. Sharma, S. E. Tyaginov, Y. Wimmer, F. Rudolf, K. Rupp, M. Bina, H. Enichlmair, J.M. Park, H. Ceric, T. Grasser: "Predictive and Efficient Modeling of Hot-Carrier Degradation in nLDMOS Devices"; Talk: IEEE International Symposium on Power Semiconductor Devices and ICs (ISPSD), Hong Kong, China; 10.05.2015 - 14.05.2015; in "Proceedings of the IEEE International Symposium on Power Semiconductor Devices and ICs (ISPSD)", (2015), ISBN: 978-1-4799-6259-4, 389 - 392 doi:10.1109/ISPSD.2015.7123471. BibTeX |
| 1610. | L. Filipovic, S. Selberherr: "Processing of Integrated Gas Sensor Devices"; Talk: IEEE International Technical Conference of IEEE Region 10 (TENCON), Macau, China; (invited) 01.11.2015 - 04.11.2015; in "Proceedings of the IEEE International Technical Conference of IEEE Region 10 (TENCON)", (2015), ISBN: 978-1-4799-8639-2, 6 page(s) doi:10.1109/TENCON.2015.7372781. BibTeX |
| 1609. | A. Harrer, P. Reininger, R. Gansch, B. Schwarz, D. MacFarland, T. Zederbauer, H. Detz, A. M. Andrews, W. Schrenk, O. Baumgartner, H. Kosina, G. Strasser: "Quantum Cascade Detectors for Sensing Applications"; Talk: ICAVS8, Wien; 12.07.2015 - 17.07.2015; . BibTeX |
| 1608. | T. Grasser: "Recent Progress in Understanding the Bias Temperature Instability: from Single Traps to Distributions"; Talk: IEEE EDS Distinguished Lecture, Hiroshima, Japan; (invited) 26.08.2015. BibTeX |
| 1607. | A. Makarov, T. Windbacher, V. Sverdlov, S. Selberherr: "SOT-MRAM based on 1Transistor-1MTJ-Cell Structure"; IEEE, in "Proceedings of the Non-Volatile Memory Technology Symposium (NVMTS)", (2015), 50 - 53 doi:10.1109/NVMTS.2015.7457479. BibTeX |
| 1606. | A. Makarov, T. Windbacher, V. Sverdlov, S. Selberherr: "SOT-MRAM based on 1Transistor-1MTJ-Cell Structure"; Poster: Non-Volatile Memory Technology Symposium (NVMTS), Beijing, China; 12.10.2015 - 14.10.2015; in "Technical Digest of the Non-Volatile Memory Technology Symposium (NVMTS)", (2015), 105 - 106. BibTeX |
| 1605. | K. Rupp: "Scaling Deterministic Solution of the Boltzmann Transport Equation on Heterogeneous Computing Platforms"; Talk: Scalable Methods for Kinetic Equations, Oak Ridge, TN, USA; (invited) 19.10.2015 - 23.10.2015; in "Scalable Methods for Kinetic Equations - Presentation Titles and Abstracts", (2015), 17. BibTeX |
| 1604. | J. Weinbub, F. Dang, T. Gillberg, S. Selberherr: "Shared-Memory Parallelization of the Semi-Ordered Fast Iterative Method"; Talk: High Performance Computing Symposium (HPC), Alexandria, VA, USA; 12.04.2015 - 15.04.2015; in "Book of Abstracts of the Spring Simulation Multiconference (SpringSim), High Performance Computing Symposium (HPC)", (2015), ISBN: 1-56555-355-1, 74. BibTeX |
| 1603. | J. Weinbub, F. Dang, T. Gillberg, S. Selberherr: "Shared-Memory Parallelization of the Semi-Ordered Fast Iterative Method"; ACM, in "Proceedings of the High Performance Computing Symposium (HPC)", (2015), ISBN: 978-1-5108-0101-1, 217 - 224 doi:10.5555/2872599.2872626. BibTeX |
| 1602. | V. Sverdlov, J. Ghosh, A. Makarov, T. Windbacher, S. Selberherr: "Silicon Spintronics"; NATO Advanced Research Workshop "Functional Nanomaterials and Devices for Electronics, Sensors, Energy Harvesting", Lviv, Ukrain; (invited) 13.04.2015 - 16.04.2015; in "Conference Abstracts, NATO Advanced Research Workshop "Functional Nanomaterials and Devices for Electronics, Sensors, Energy Harvesting"", (2015), ISBN: 978-966-02-7553-9, 44 - 45. BibTeX |
| 1601. | V. Sverdlov, J. Ghosh, A. Makarov, T. Windbacher, S. Selberherr: "Silicon Spintronics: Recent Advances and Challenges"; International Conference and School for Young Scientists Information Technology and Nanotechnology (ITNT), Samara, Russia; (invited) 29.06.2015 - 30.06.2015; in "Proceedings of the 2015 International Conference and School for Young Scientists Information Technology and Nanotechnology (ITNT)", (2015), ISBN: 978-5-93424-739-4, 6 - 7. BibTeX |
| 1600. | V. Sverdlov, J. Ghosh, A. Makarov, T. Windbacher, S. Selberherr: "Silicon and CMOS-Compatible Spintronics"; Talk: International Conference on Applied Physics, Simulation and Computers (APSAC), Vienna, Austria; (invited) 15.03.2015 - 17.03.2015; in "Proceedings of the International Conference on Applied Physics, Simulation and Computers (APSAC 2015)", (2015), 28, ISBN: 978-1-61804-286-6, 17 - 20. BibTeX |
| 1599. | J. Ghosh, D. Osintsev, V. Sverdlov, S. Selberherr: "Spin Lifetime Dependence on Spin Injection Orientation in Strained Silicon Films"; Talk: APS March Meeting, San Antonio, USA; 02.03.2015 - 06.03.2015; in "Bulletin of the American Physical Society (APS March Meeting)", (2015), 60/1, . BibTeX |
| 1598. | J. Ghosh, D. Osintsev, V. Sverdlov, S. Selberherr: "Spin Lifetime Dependence on Valley Splitting in Thin Silicon Films"; Talk: International Workshop on Computational Electronics (IWCE), West Lafayette, Indiana, USA; 02.09.2015 - 04.09.2015; in "Book of Abstracts of the International Workshop on Computational Electronics (IWCE)", (2015), ISBN: 978-0-692-50554-0, 35 - 36. BibTeX |
| 1597. | D. Osintsev, J. Ghosh, V. Sverdlov, J. Weinbub, S. Selberherr: "Spin Lifetime in MOSFETs: A High Performance Computing Approach"; Talk: International Conference on Large-Scale Scientific Computations (LSSC), Sozopol, Bulgaria; 08.06.2015 - 12.06.2015; in "Abstracts International Conference on Large-Scale Scientific Computations (LSSC)", (2015), 60 - 61. BibTeX |
| 1596. | V. Sverdlov, S. Selberherr: "Spin-Based CMOS-Compatible Devices"; Talk: International Conference on Large-Scale Scientific Computations (LSSC), Sozopol, Bulgaria; (invited) 08.06.2015 - 12.06.2015; in "Abstracts International Conference on Large-Scale Scientific Computations (LSSC)", (2015), 69. BibTeX |
| 1595. | V. Sverdlov, S. Selberherr: "Spin-Based Devices for Future Microelectronics"; Talk: International Symposium on Next-Generation Electronics (ISNE), Taipei, Taiwan; (invited) 04.05.2015 - 06.05.2015; in "Proceedings of The 4th International Symposium on Next-Generation Electronics (ISNE 2015)", (2015), 4 page(s) doi:10.1109/ISNE.2015.7132030. BibTeX |
| 1594. | V. Sverdlov, S. Selberherr: "Spin-Based Silicon and CMOS-Compatible Devices"; Talk: Meeting of the Electrochemical Society (ECS), Chicago, Illinois, USA; (invited) 24.05.2015 - 28.05.2015; in "Proceedings of the 227th ECS Meeting (ECS)", (2015), 67, ISSN: 1938-6737, 2 page(s) . BibTeX |
| 1593. | V. Sverdlov, J. Ghosh, A. Makarov, T. Windbacher, S. Selberherr: "Spin-Driven Applications of Silicon and CMOS-Compatible Devices"; Talk: BIT's Annual World Congress of Nano Science & Technology, Xi'an, China; (invited) 24.09.2015 - 26.09.2015; in "Abstracts of the BIT's 5th Annual Congress of Nano Science & Technology-2015", (2015), 175. BibTeX |
| 1592. | V. Sverdlov, S. Selberherr: "Spin-dependent Trap-assisted Tunneling Including Spin Relaxation at Room Temperature"; Poster: International Conference on Spintronics and Quantum Information Technology (SPINTECH), Basel, Switzerland; 10.08.2015 - 13.08.2015; in "Program and Abstract Book of the 8th International School & Conference on Spintronics and Quantum Information Technology", (2015), 114. BibTeX |
| 1591. | V. Sverdlov, S. Selberherr: "Spin-dependent Trap-assisted Tunneling in Ferromagnet-Oxide-Semiconductor Structures"; Talk: International Symposium on Advanced Nanostructures and Nano-Devices (ISANN), Waikaloa, Hawaii, USA; 29.11.2015 - 04.12.2015; in "Abstracts International Symposium on Advanced Nanodevices and Nanotechnology (ISANN)", (2015), . BibTeX |
| 1590. | M. Hosseini, M. Elahi, M. Pourfath, D. Esseni: "Strain Engineering of Single-Layer MoS2"; Talk: European Solid-State Device Research Conference (ESSDERC), Graz, Austria; 14.09.2015 - 18.09.2015; in "Proceedings of the European Solid-State Device Research Conference (ESSDERC)", (2015), ISBN: 978-1-4673-7133-9, 314 - 317 doi:10.1109/ESSDERC.2015.7324777. BibTeX |
| 1589. | V. Sverdlov, D. Osintsev, J. Ghosh, S. Selberherr: "Strained Silicon-on-Insulator for Spintronic Applications: Giant Spin Lifetime Enhancement"; Poster: Advanced Research Workshop on Future Trends in Microelectronics: Journey into the Unknown, Mallorca, Spain; 21.06.2015 - 26.06.2015; in "Abstracts Advanced Research Workshop on Future Trends in Microelectronics: Journey into the Unknown", (2015), 63. BibTeX |
| 1588. | L. Filipovic, S. Selberherr: "Stress Considerations in Thin Films for CMOS-Integrated Gas Sensors"; Talk: Meeting of the Electrochemical Society (ECS), Chicago, Illinois, USA; 24.05.2015 - 28.05.2015; in "Proceedings of the 227th ECS Meeting (ECS)", (2015), 67, ISSN: 1938-6737, 2 page(s) . BibTeX |
| 1587. | L. Filipovic, S. Selberherr: "Stress in Three-Dimensionally Integrated Sensor Systems"; Talk: International Conference on Materials for Advanced Technologies(ICMAT), Singapore; (invited) 28.06.2015 - 03.07.2015; in "Abstracts of the 2015 International Conference on Materials for Advanced Technologies (ICMAT)", (2015), 342. BibTeX |
| 1586. | F. Rudolf, J. Weinbub, K. Rupp, A. Morhammer, S. Selberherr: "Symmetry-Aware 3D Volumetric Mesh Generation - An Analysis of Performance and Element Quality"; Talk: International Meshing Roundtable (IMR), Austin, Texas, USA; 11.10.2015 - 14.10.2015; in "Proceedings of the 24th International Meshing Roundtable (IMR24)", (2015), 5 page(s) . BibTeX |
| 1585. | Yu. Illarionov, M. Waltl, A. Smith, S. Vaziri, M. Ostling, M. Lemme, T. Grasser: "Temperature Dependence of Hot Carrier and Positive Bias Stress Degradation in Double-Gated Graphene Field-Effect Transistors"; Talk: Graphene 2015, Bilbao, Spain; 10.03.2015 - 13.03.2015; in "Abstracts Graphene 2015", (2015), 1 page(s) . BibTeX |
| 1584. | M. Nedjalkov, P. Ellinghaus, S. Selberherr: "The Aharanov-Bohm Effect from a Phase Space Perspective"; Talk: International Conference on Large-Scale Scientific Computations (LSSC), Sozopol, Bulgaria; 08.06.2015 - 12.06.2015; in "Abstracts International Conference on Large-Scale Scientific Computations (LSSC)", (2015), 59 - 60. BibTeX |
| 1583. | B. Kaczer, J. Franco, P. Weckx, P. Roussel, E. Bury, M. Cho, R. Degraeve, D. Linten, G. Groeseneken, H. Kukner, P. Raghavan, F. Catthoor, G. Rzepa, W. Gös, T. Grasser: "The Defect-Centric Perspective of Device and Circuit Reliability - From Individual Defects to Circuits"; Talk: European Solid-State Device Research Conference (ESSDERC), Graz, Austria; (invited) 14.09.2015 - 18.09.2015; in "Proceedings of the European Solid-State Device Research Conference (ESSDERC)", (2015), ISBN: 978-1-4673-7860-4, 218 - 225 doi:10.1109/ESSDERC.2015.7324754. BibTeX |
| 1582. | S. Selberherr: "The Evolution and Potential Future of Microelectronics"; Talk: IEEE EDS Distinguished Lecture, University of Campinas, Campinas, Brasil; (invited) 28.08.2015. BibTeX |
| 1581. | S. Selberherr: "The Evolution and Potential Future of Microelectronics"; Talk: IEEE EDS Distinguished Lecture, City University of Hong Kong, Hong Kong; (invited) 31.03.2015. BibTeX |
| 1580. | P. Ellinghaus, M. Nedjalkov, S. Selberherr: "The Influence of Electrostatic Lenses on Wave Packet Dynamics"; Talk: International Conference on Large-Scale Scientific Computations (LSSC), Sozopol, Bulgaria; 08.06.2015 - 12.06.2015; in "Abstracts International Conference on Large-Scale Scientific Computations (LSSC)", (2015), 39 - 40. BibTeX |
| 1579. | S. Nazemi, E. Soleimani, M. Pourfath, H. Kosina: "The Role of Surface Termination Geometry on the Ground-State and Optical Properties of Silicon Nano-Crystals: A Density Functional Theory Study"; Poster: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Washington DC, USA; 09.09.2015 - 11.09.2015; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2015), ISBN: 978-1-4673-7859-8, 333 - 336. BibTeX |
| 1578. | C. Ostermaier, P. Lagger, G. Prechtl, A. Grill, T. Grasser, D. Pogany: "The role of electron transport in the charge trapping at the III-N/dielectric interface in AlGaN/GaN MIS-HEMT structures"; Talk: Semiconductor Interface Specialists Conference, Arlington, VA, USA; 02.12.2015 - 05.12.2015; . BibTeX |
| 1577. | M. Thesberg, M. Pourfath, N. Neophytou, H. Kosina: "Thermoelectric Efficiency Improvements through Grain Shape Optimization: A Non-Equilibrium Green´s Function Study"; Talk: International Conference on Large-Scale Scientific Computations (LSSC), Sozopol, Bulgaria; 08.06.2015 - 12.06.2015; in "Abstracts International Conference on Large-Scale Scientific Computations (LSSC)", (2015), 70. BibTeX |
| 1576. | M. Thesberg, M. Pourfath, N. Neophytou, H. Kosina: "Thermoelectric Power Factor Optimization in Nanocomposites by Energy Filtering Using NEGF"; Poster: International Workshop on Computational Electronics (IWCE), West Lafayette, Indiana, USA; 02.09.2015 - 04.09.2015; in "Proceedings of the International Workshop on Computational Electronics (IWCE)", (2015), ISBN: 978-0-692-50554-0, 4 page(s) . BibTeX |
| 1575. | J. Ghosh, D. Osintsev, V. Sverdlov, S. Selberherr: "Variation of Spin Lifetime with Spin Injection Orientation in Strained Thin Silicon Films"; Talk: Meeting of the Electrochemical Society (ECS), Chicago, Illinois, USA; 24.05.2015 - 28.05.2015; in "Proceedings of the 227th ECS Meeting (ECS)", (2015), 67, ISSN: 1938-6737, 2 page(s) . BibTeX |
| 1574. | K. Rupp, Ph. Tillet, T. St Clere Smithe, N. Karovic, J. Weinbub, F. Rudolf: "ViennaCL - Fast Linear Algebra for Multi and Many-Core Architectures"; Poster: SIAM Conference on Computational Science and Engineering, Salt Lake City, Utah, USA; 14.03.2015 - 18.03.2015; . BibTeX |
| 1573. | K. Rupp, M. Bina, A. Morhammer, T. Grasser, A. Jüngel: "ViennaSHE: A Semiconductor Device Simulator Based on the Spherical Harmonics Expansion Method"; Talk: Workshop on Applied Mathematics and Simulation for Semiconductors (AMaSIS), Berlin, Germany; (invited) 11.03.2015 - 13.03.2015; . BibTeX |
| 1572. | P. Ellinghaus, J. Weinbub, M. Nedjalkov, S. Selberherr: "ViennaWD - Applications"; Talk: International Wigner Workshop (IW2), Waikoloa, Hawaii, USA; 29.11.2015 in "Booklet of the International Wigner Workshop (IW2)", (2015), 9. BibTeX |
| 1571. | J. Weinbub, P. Ellinghaus, M. Nedjalkov, S. Selberherr: "ViennaWD - Status and Outlook"; Talk: International Wigner Workshop (IW2), Waikoloa, Hawaii, USA; 29.11.2015 in "Booklet of the International Wigner Workshop (IW2)", (2015), 8. BibTeX |
| 1570. | L. Wang, A. Brown, M. Nedjalkov, C. Alexander, B. Cheng, C. Millar, A. Asenov: "3D Coupled Electro-Thermal FinFET Simulations Including the Fin Shape Dependence of the Thermal Conductivity"; Poster: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Yokohama, Japan; 09.09.2014 - 11.09.2014; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2014), ISBN: 978-1-4799-5285-4, 269 - 272 doi:10.1109/SISPAD.2014.6931615. BibTeX |
| 1569. | L. Filipovic, Z. Stanojevic, O. Baumgartner, H. Kosina: "3D Modeling of Direct Band-to-Band Tunneling in Nanowire TFETs"; Talk: Workshop of the Thematic Network on Silicon On Insulator Technology, Devices and Circuits (EUROSOI), Tarragona, Spain; 27.01.2014 - 29.01.2014; in "Conference Proceedings of the Tenth Workshop of the Thematic Network on Silicon on Insulator Technology, Devices and Circuits", (2014), 1 - 2. BibTeX |
| 1568. | H. Ceric, R. Orio, A. P. Singulani, S. Selberherr: "3D Technology Interconnect Reliability TCAD"; Talk: Pan Pacific Microelectronics Symposium, Big Island of Hawaii, USA; 11.02.2014 - 13.02.2014; in "Proceedings of the 2014 Pan Pacific Microelectronics Symposium", (2014), ISBN: 978-0-9888873-3-6, 1 - 8. BibTeX |
| 1567. | J. Weinbub, K. Rupp, F. Rudolf: "A Flexible Material Database for Computational Science and Engineering"; Talk: European Seminar on Computing (ESCO), Pilsen, Czech Republic; 15.06.2014 - 20.06.2014; in "Proc. 4th European Seminar on Computing", (2014), 226. BibTeX |
| 1566. | M. Moradinasab, M. Pourfath, M. Fathipour, H. Kosina: "A Numerical Study of Line-Edge Roughness in Graphene Superlattice-Based Photodetectors"; Talk: International Conference on Numerical Simulation of Optoelectronic Devices (NUSOD), Palma de Mallorca, Spain; 01.09.2014 - 04.09.2014; in "Proceedings of the 14th International Conference on Numerical Simulation of Optoelectronic Devices", (2014), 1 - 2. BibTeX |
| 1565. | S. E. Tyaginov, M. Bina, J. Franco, Y. Wimmer, D. Osintsev, B. Kaczer, T. Grasser: "A Predictive Physical Model for Hot-Carrier Degradation in Ultra-Scaled MOSFETs"; Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Yokohama, Japan; 09.09.2014 - 11.09.2014; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2014), ISBN: 978-1-4799-5285-4, 89 - 92 doi:10.1109/SISPAD.2014.6931570. BibTeX |
| 1564. | Yu. Illarionov, M. Bina, S. E. Tyaginov, K. Rott, H. Reisinger, B. Kaczer, T. Grasser: "A Reliable Method for the Extraction of the Lateral Position of Defects in Ultra-scaled MOSFETs"; Poster: International Reliability Physics Symposium (IRPS), Waikoloa, Hawaii, USA; 01.06.2014 - 05.06.2014; in "Proceedings of the International Reliability Physics Symposium (IRPS)", (2014), ISBN: 978-1-4799-3317-4, XT13.1 - XT13.6. BibTeX |
| 1563. | M. Waltl, W. Gös, K. Rott, H. Reisinger, T. Grasser: "A Single-Trap Study of PBTI in SiON nMOS Transistors: Similarities and Differences to the NBTI/pMOS Case"; Talk: International Reliability Physics Symposium (IRPS), Waikoloa, Hawaii, USA; 01.06.2014 - 05.06.2014; in "Proceedings of the International Reliability Physics Symposium (IRPS)", (2014), ISBN: 978-1-4799-3317-4, XT18.1 - XT18.5. BibTeX |
| 1562. | T. Grasser, K. Rott, H. Reisinger, M. Waltl, J. Franco, B. Kaczer: "A unified perspective of RTN and BTI"; Talk: International Reliability Physics Symposium (IRPS), Waikoloa, Hawaii, USA; 01.06.2014 - 05.06.2014; in "Proceedings of the International Reliability Physics Symposium (IRPS)", (2014), ISBN: 978-1-4799-3317-4, 4A.5.1 - 4A.5.7. BibTeX |
| 1561. | L. Filipovic, S. Selberherr: "About Processes and Performance of Integrated Gas Sensor Components"; Talk: Energy-Materials-Nanotechnology Fall Meeting (EMN), Orlando, USA; (invited) 22.11.2014 - 25.11.2014; in "Abstracts of the Energy-Materials-Nanotechnology Fall Meeting (EMN)", (2014), 96 - 97. BibTeX |
| 1560. | S. Selberherr: "About Voids in Copper Interconnects"; Talk: IEEE EDS Distinguished Lecture, Zhejiang University, Hangzhou, China; (invited) 28.10.2014. BibTeX |
| 1559. | K. Rupp, Ph. Tillet, A. Jungel, T. Grasser: "Achieving Portable High Performance for Iterative Solvers on Accelerators"; Talk: Annual Meeting of the International Association of Applied Mathematics and Mechanics (GAMM), Erlangen, Germany; 10.03.2014 - 14.03.2014; in "Book of Abstracts", (2014), 815. BibTeX |
| 1558. | W. Gös, M. Waltl, Y. Wimmer, G. Rzepa, T. Grasser: "Advanced Modeling of Charge Trapping: RTN, 1/f noise, SILC, and BTI"; Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Yokohama, Japan; (invited) 09.09.2014 - 11.09.2014; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2014), ISBN: 978-1-4799-5285-4, 77 - 80 doi:10.1109/SISPAD.2014.6931567. BibTeX |
| 1557. | Z. Stanojevic, O. Baumgartner, M. Karner, L. Filipovic, C. Kernstock, H. Kosina: "Advanced Numerical Methods for Semi-Classical Transport Simulation in Ultra-Narrow Channels"; Talk: European Conference on Mathematics for Industry (ECMI), Taormina, Italy; (invited) 09.06.2014 - 14.06.2014; in "Abstracts of The 18th European Conference on Mathematics for Industry", (2014), 1. BibTeX |
| 1556. | A. Harrer, P. Reininger, B. Schwarz, R. Gansch, S. Kalchmair, H. Detz, T. Zederbauer, D. MacFarland, A. M. Andrews, W. Schrenk, O. Baumgartner, H. Kosina, G. Strasser: "Advances in Quantum Cascade Detector Design"; Talk: 4th International Nanophotonics Meeting 2014, Igls; 23.10.2014 - 25.10.2014; . BibTeX |
| 1555. | M. Moradinasab, M. Pourfath, H. Kosina: "An Instability Study in Terahertz Quantum Cascade Lasers"; Talk: Int. Conf. on Superlattices, Nanostructures and Nanodevices (ICSNN), Savannah, GA, USA; 03.08.2014 - 08.08.2014; in "Proc.Intl.Conf.on Superlattices, Nanostructures and Nanodevices (ICSNN)", (2014), 10. BibTeX |
| 1554. | K. Rupp, F. Rudolf, J. Weinbub, A. Jungel, T. Grasser: "Automatic Finite Volume Discretizations Through Symbolic Computations"; Talk: European Seminar on Computing (ESCO), Pilsen, Czech Republic; 15.06.2014 - 20.06.2014; in "Proc. 4th European Seminar on Computing", (2014), 192. BibTeX |
| 1553. | L. Filipovic, O. Baumgartner, Z. Stanojevic, H. Kosina: "BTB Tunneling in InAs/Si Heterojunctions"; Poster: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Yokohama, Japan; 09.09.2014 - 11.09.2014; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2014), ISBN: 978-1-4799-5285-4, 245 - 248 doi:10.1109/SISPAD.2014.6931609. BibTeX |
| 1552. | L. Filipovic, O. Baumgartner, Z. Stanojevic, H. Kosina: "Band-to-Band Tunneling in 3D Devices"; Talk: International Workshop on Computational Electronics (IWCE), Paris, France; 03.06.2014 - 06.06.2014; in "Book of Abstracts of the International Workshop on Computational Electronics (IWCE)", (2014), ISBN: 978-2-9547858-0-6, 13 - 14. BibTeX |
| 1551. | T. Grasser: "Bias Temperature Instability in CMOS Nanodevices"; Talk: SINANO Summer School, Bertinoro, Italy; (invited) 25.08.2014 - 29.08.2014; . BibTeX |
| 1550. | Yu. Illarionov, A. Smith, S. Vaziri, M. Ostling, T. Müller, M. Lemme, T. Grasser: "Bias-Temperature Instability in Single-Layer Graphene Field-Effect Transistors: A Reliability Challenge"; Talk: Silicon Nanoelectronics Workshop, Honolulu, Hawaii, USA; 08.06.2014 - 09.06.2014; in "2014 IEEE Silicon Nanoelectronics Workshop", (2014), ISBN: 978-1-4799-5677-7, 29 - 30. BibTeX |
| 1549. | K. Rupp, M. Bina, Y. Wimmer, A. Jungel, T. Grasser: "Cell-Centered Finite Volume Schemes for Semiconductor Device Simulation"; Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Yokohama, Japan; 09.09.2014 - 11.09.2014; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2014), ISBN: 978-1-4799-5285-4, 365 - 368 doi:10.1109/SISPAD.2014.6931639. BibTeX |
| 1548. | T. Grasser: "Characterization and Modeling of Charge Trapping and Hot Carrier Degradation"; Talk: IEEE EDS Distinguished Lecture, Agrate Brianza, Italy; (invited) 11.12.2014. BibTeX |
| 1547. | T. Grasser: "Characterization and Modeling of Charge Trapping in CMOS Transistors"; Talk: International Workshop on Characterization and Modeling of Memory Devices, Agrate Brianza, Italy; (invited) 02.10.2014 - 03.10.2014; . BibTeX |
| 1546. | T. Grasser, G. Rzepa, M. Waltl, W. Gös, K. Rott, G.A. Rott, H. Reisinger, J. Franco, B. Kaczer: "Characterization and Modeling of Charge Trapping: From Single Defects to Devices"; Talk: IEEE International Conference on IC Design and Technology (ICICDT), Austin, TX, USA; (invited) 28.05.2014 - 30.05.2014; in "Proceedings of IEEE International Conference on IC Design and Technology", (2014), ISBN: 978-1-4799-2153-9, 1 - 4 doi:10.1109/ICICDT.2014.6838620. BibTeX |
| 1545. | H. Mahmoudi, T. Windbacher, V. Sverdlov, S. Selberherr: "Compact Modeling of Memristive IMP Gates for Reliable Stateful Logic Design"; Talk: International Conference on Mixed Design of Integrated Circuits and Systems (MIXDES), Lublin, Poland; 19.06.2014 - 21.06.2014; in "Proceedings of the 21st International Conference on Mixed Design of Integrated Circuits and Systems", (2014), 26. BibTeX |
| 1544. | A. Makarov, V. Sverdlov, S. Selberherr: "Composite Magnetic Tunnel Junctions for Fast Memory Devices and Efficient Spin-Torque Nano-Oscillators"; G. Lee (ed); WITPRESS, 1, in "Future Information Engineering", (2014), ISBN: 978-1-84564-855-8, 391 - 398 doi:10.2495/ICIE130451. BibTeX |
| 1543. | Z. Stanojevic, O. Baumgartner, L. Filipovic, H. Kosina: "Comprehensive Low-Field Mobility Modeling in Nano-Scaled SOI Channels"; Talk: Workshop of the Thematic Network on Silicon On Insulator Technology, Devices and Circuits (EUROSOI), Tarragona, Spain; 27.01.2014 - 29.01.2014; in "Conference Proceedings of the Tenth Workshop of the Thematic Network on Silicon on Insulator Technology, Devices and Circuits", (2014), 1 - 2. BibTeX |
| 1542. | E. Baer, P. Evanschitzky, J. Lorenz, F. Roger, R. Minixhofer, L. Filipovic, R. Orio, S. Selberherr: "Coupled Simulation to Determine Across Wafer Variations for Electrical and Reliability Parameters of Through-Silicon VIAs"; Talk: European Workshop on Materials for Advanced Metallization (MAM), Chemnitz, Germany; 02.03.2014 - 05.03.2014; in "Book of Abstracts", (2014), 2 page(s) . BibTeX |
| 1541. | J. Cervenka, P. Ellinghaus, M. Nedjalkov: "Deterministic Solution of the Discrete Wigner Equation"; Talk: International Conference on Numerical Methods and Applications, Borovets, Bulgaria; 20.08.2014 - 24.08.2014; in "Eighth International Conference on Numerical Methods and Applications", (2014), 36. BibTeX |
| 1540. | S. E. Tyaginov, M. Bina, J. Franco, Y. Wimmer, F. Rudolf, H. Enichlmair, J.M. Park, B. Kaczer, H. Ceric, T. Grasser: "Dominant Mechanism of Hot-Carrier Degradation in Short- and Long-Channel Transistors"; Talk: IEEE International Reliability Workshop (IIRW), South Lake Tahoe, CA, USA; 12.10.2014 - 16.10.2014; in "Proceedings of the IEEE International Integrated Reliability Workshop (IIRW)", (2014), ISBN: 978-1-4799-7308-8, 63 - 68 doi:10.1109/IIRW.2014.7049512. BibTeX |
| 1539. | L. Filipovic, R. Orio, S. Selberherr, A. P. Singulani, F. Roger, R. Minixhofer: "Effects of Sidewall Scallops on Open Tungsten TSVs"; Talk: International Reliability Physics Symposium (IRPS), Waikoloa, Hawaii, USA; 01.06.2014 - 05.06.2014; in "Proceedings of the International Reliability Physics Symposium (IRPS)", (2014), ISBN: 978-1-4799-3317-4, 3E.3.1 - 3E.3.6 doi:10.1109/IRPS.2014.6860633. BibTeX |
| 1538. | L. Filipovic, R. Orio, S. Selberherr: "Effects of Sidewall Scallops on the Performance and Reliability of Filled Copper and Open Tungsten TSVs"; Talk: IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), Singapore, Singapore; 30.06.2014 - 04.07.2014; in "Proceedings of the 21st International Symposium on the Physical and Failure Analysis of Integrated Circuits", (2014), ISBN: 978-1-4799-3931-2, 321 - 326 doi:10.1109/IPFA.2014.6898137. BibTeX |
| 1537. | P. Ellinghaus, M. Nedjalkov, S. Selberherr: "Efficient Calculation of the Two-Dimensional Wigner Potential"; Talk: International Workshop on Computational Electronics (IWCE), Paris, France; 03.06.2014 - 06.06.2014; in "Book of Abstracts of the International Workshop on Computational Electronics (IWCE)", (2014), ISBN: 978-2-9547858-0-6, 19 - 20. BibTeX |
| 1536. | H. Ceric, S. Selberherr: "Electromigration Induced Failure of Solder Bumps and the Role of IMC"; Poster: IEEE International Interconnect Technology Conference (IITC), San Jose, USA; 20.05.2014 - 23.05.2014; in "Proceedings of the International Interconnect Technology Conference (IITC)", (2014), ISBN: 978-1-4799-5017-1, 265 - 267 doi:10.1109/IITC.2014.6831891. BibTeX |
| 1535. | W. H. Zisser, H. Ceric, J. Weinbub, S. Selberherr: "Electromigration Induced Resistance Increase in Open TSVs"; Poster: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Yokohama, Japan; 09.09.2014 - 11.09.2014; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2014), ISBN: 978-1-4799-5285-4, 249 - 252 doi:10.1109/SISPAD.2014.6931610. BibTeX |
| 1534. | W. H. Zisser, H. Ceric, J. Weinbub, S. Selberherr: "Electromigration Reliability of Open TSV Structures"; Poster: European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), Berlin, Germany; 29.09.2014 - 02.10.2014; in "Abstracts 25th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF)", (2014), 48. BibTeX |
| 1533. | W. H. Zisser, H. Ceric, J. Weinbub, S. Selberherr: "Electromigration Reliability of Open TSV Structures"; Talk: IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), Singapore, Singapore; 30.06.2014 - 04.07.2014; in "Proceedings of the 21st International Symposium on the Physical and Failure Analysis of Integrated Circuits", (2014), ISBN: 978-1-4799-3931-2, 317 - 320 doi:10.1109/IPFA.2014.6898179. BibTeX |
| 1532. | H. Ceric, S. Selberherr: "Electromigration Reliability of Solder Bumps"; Talk: IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), Singapore, Singapore; 30.06.2014 - 04.07.2014; in "Proceedings of the 21st International Symposium on the Physical and Failure Analysis of Integrated Circuits", (2014), ISBN: 978-1-4799-3931-2, 336 - 339 doi:10.1109/IPFA.2014.6898145. BibTeX |
| 1531. | H. Ceric, W. H. Zisser, M. Rovitto, S. Selberherr: "Electromigration in Solder Bumps: A Mean-Time-to-Failure TCAD Study"; Poster: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Yokohama, Japan; 09.09.2014 - 11.09.2014; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2014), ISBN: 978-1-4799-5285-4, 221 - 224 doi:10.1109/SISPAD.2014.6931603. BibTeX |
| 1530. | V. Sverdlov, D. Osintsev, S. Selberherr: "Electron Momentum and Spin Relaxation in Silicon Films: A Rigorous k p-based Approach"; Talk: European Conference on Mathematics for Industry (ECMI), Taormina, Italy; (invited) 09.06.2014 - 14.06.2014; in "Abstracts of The 18th European Conference on Mathematics for Industry", (2014), 454 - 456. BibTeX |
| 1529. | T. Grasser, K. Rott, H. Reisinger, M. Waltl, W. Gös: "Evidence for Defect Pairs in SiON pMOSFETs"; Talk: IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), Singapore, Singapore; 30.06.2014 - 04.07.2014; in "Proceedings of the 21st International Symposium on the Physical and Failure Analysis of Integrated Circuits", (2014), ISBN: 978-1-4799-3929-9, 228 - 263. BibTeX |
| 1528. | Z. Stanojevic, L. Filipovic, O. Baumgartner, H. Kosina: "Fast Methods for Full-Band Mobility Calculation"; Talk: International Workshop on Computational Electronics (IWCE), Paris, France; 03.06.2014 - 06.06.2014; in "Book of Abstracts of the International Workshop on Computational Electronics (IWCE)", (2014), ISBN: 978-2-9547858-0-6, 51 - 52. BibTeX |
| 1527. | N. Neophytou, H. Kosina: "Field Effect Density Modulation in Nanowires for Large Thermoelectric Power Factors: A Self-Consistent Atomistic Simulation Approach"; Talk: International Conference on Thermoelectrics, Nashville, USA; 06.07.2014 - 10.07.2014; in "Book of Abstracts", (2014), 1 page(s) . BibTeX |
| 1526. | T. Windbacher, D. Osintsev, A. Makarov, H. Mahmoudi, V. Sverdlov, S. Selberherr: "Frequency Dependence Study of a Bias Field-Free Nano-Scale Oscillator"; Poster: International Workshop on Computational Electronics (IWCE), Paris, France; 03.06.2014 - 06.06.2014; in "Book of Abstracts of the International Workshop on Computational Electronics (IWCE)", (2014), ISBN: 978-2-9547858-0-6, 193 - 194. BibTeX |
| 1525. | V. Sverdlov, D. Osintsev, S. Selberherr: "From Strained SOI MOSFET to Spin MOSFET with Strain: a Modeling Approach"; Talk: Workshop of the Thematic Network on Silicon On Insulator Technology, Devices and Circuits (EUROSOI), Tarragona, Spain; (invited) 27.01.2014 - 29.01.2014; . BibTeX |
| 1524. | Z. Stanojevic, O. Baumgartner, M. Karner, L. Filipovic, C. Kernstock, H. Kosina: "Full-Band Modeling of Mobility in p-Type FinFETs"; Poster: Silicon Nanoelectronics Workshop, Honolulu, Hawaii, USA; 08.06.2014 - 09.06.2014; in "2014 IEEE Silicon Nanoelectronics Workshop", (2014), ISBN: 978-1-4799-5676-0, 83 - 84. BibTeX |
| 1523. | N. Neophytou, H. Karamitaheri, H. Kosina: "Full-Band Simulations of Thermoelectric Properties of Si Nanowires and Thin Layers"; Talk: European Conference on Mathematics for Industry (ECMI), Taormina, Italy; (invited) 09.06.2014 - 14.06.2014; in "Abstracts of The 18th European Conference on Mathematics for Industry", (2014), 1. BibTeX |
| 1522. | Z. Stanojevic, L. Filipovic, O. Baumgartner, M. Karner, C. Kernstock, H. Kosina: "Full-Band Transport in Ultra-Narrow p-Type Si Channels: Field, Orientation, Strain"; Poster: International Conference on Ultimate Integration of Silicon (ULIS), Stockholm, Sweden; 07.04.2014 - 09.04.2014; in "Proc.Intl.Conf.on Ultimate Integration on Silicon (ULIS)", (2014), 4 page(s) . BibTeX |
| 1521. | H. Mahmoudi, T. Windbacher, V. Sverdlov, S. Selberherr: "High Performance MRAM-Based Stateful Logic"; Poster: International Conference on Ultimate Integration of Silicon (ULIS), Stockholm, Sweden; 07.04.2014 - 09.04.2014; in "Proc.Intl.Conf.on Ultimate Integration on Silicon (ULIS)", (2014), ISBN: 978-1-4799-3718-9, 117 - 120 doi:10.1109/ULIS.2014.6813912. BibTeX |
| 1520. | P. Ellinghaus, M. Nedjalkov, S. Selberherr: "Implications of the Coherence Length on the Discrete Wigner Potential"; Poster: International Workshop on Computational Electronics (IWCE), Paris, France; 03.06.2014 - 06.06.2014; in "Book of Abstracts of the International Workshop on Computational Electronics (IWCE)", (2014), ISBN: 978-2-9547858-0-6, 155 - 156. BibTeX |
| 1519. | M. Moradinasab, M. Pourfath, H. Kosina: "Improved Active Region Designs for Mode Locking in Quantum Cascade Lasers"; Poster: International Quantum Cascade Lasers School & Workshop, Policoro (Matera), Italy; 07.09.2014 - 12.09.2014; in "International Quantum Cascade Lasers School & Workshop 2014", (2014), 182 - 183. BibTeX |
| 1518. | D. Osintsev, V. Sverdlov, S. Selberherr: "Increasing Mobility and Spin Lifetime with Shear Strain in Thin Silicon Films"; Talk: Workshop of the Thematic Network on Silicon On Insulator Technology, Devices and Circuits (EUROSOI), Tarragona, Spain; 27.01.2014 - 29.01.2014; in "Conference Proceedings of the Tenth Workshop of the Thematic Network on Silicon on Insulator Technology, Devices and Circuits", (2014), 1 - 2. BibTeX |
| 1517. | D. Osintsev, V. Sverdlov, T. Windbacher, S. Selberherr: "Increasing Mobility and Spin Lifetime with Shear Strain in Thin Silicon Films"; Poster: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Yokohama, Japan; 09.09.2014 - 11.09.2014; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2014), ISBN: 978-1-4799-5285-4, 193 - 196 doi:10.1109/SISPAD.2014.6931596. BibTeX |
| 1516. | T. Windbacher, H. Mahmoudi, V. Sverdlov, S. Selberherr: "Influence of Device Geometry on the Non-Volatile Magnetic Flip Flop Characteristics"; Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Yokohama, Japan; 09.09.2014 - 11.09.2014; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2014), ISBN: 978-1-4799-5285-4, 297 - 300 doi:10.1109/SISPAD.2014.6931622. BibTeX |
| 1515. | T. Windbacher, H. Mahmoudi, V. Sverdlov, S. Selberherr: "Influence of Magnetization Variations in the Free Layer on a Non-Volatile Magnetic Flip Flop"; Talk: International Conference on Ultimate Integration of Silicon (ULIS), Stockholm, Sweden; 07.04.2014 - 09.04.2014; in "Proc.Intl.Conf.on Ultimate Integration on Silicon (ULIS)", (2014), ISBN: 978-1-4799-3718-9, 9 - 12 doi:10.1109/ULIS.2014.6813893. BibTeX |
| 1514. | O. Baumgartner, Z. Stanojevic, L. Filipovic, A. Grill, T. Grasser, H. Kosina, M. Karner: "Investigation of Quantum Transport in Nanoscaled GaN High Electron Mobility Transistors"; Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Yokohama, Japan; 09.09.2014 - 11.09.2014; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2014), ISBN: 978-1-4799-5285-4, 117 - 120 doi:10.1109/SISPAD.2014.6931577. BibTeX |
| 1513. | V. Sverdlov, H. Mahmoudi, A. Makarov, T. Windbacher, S. Selberherr: "Magnetic Tunnel Junctions for Future Memory and Logic-in-Memory Applications"; Talk: International Conference on Mixed Design of Integrated Circuits and Systems (MIXDES), Lublin, Poland; (invited) 19.06.2014 - 21.06.2014; in "Proceedings of the 21st International Conference on Mixed Design of Integrated Circuits and Systems", (2014), 17. BibTeX |
| 1512. | M. Schrems, J. Siegert, P. Dorfi, J. Kraft, E. Stueckler, F. Schrank, S. Selberherr: "Manufacturing of 3D Integrated Sensors and Circuits"; Talk: European Solid-State Device Research Conference (ESSDERC), Venice, Italy; (invited) 22.09.2014 - 26.09.2014; in "Proceedings of the European Solid-State Device Research Conference (ESSDERC)", (2014), ISBN: 978-1-4799-4377-7, 162 - 165 doi:10.1109/ESSDERC.2014.6948785. BibTeX |
| 1511. | B. Kaczer, C. Chen, P. Weckx, Ph. J. Roussel, M. Toledano-Luque, M. Cho, J. Watt, K. Chanda, G. Groeseneken, T. Grasser: "Maximizing reliable performance of advanced CMOS circuits-A case study"; Talk: International Reliability Physics Symposium (IRPS), Waikoloa, Hawaii, USA; 01.06.2014 - 05.06.2014; in "Proceedings of the International Reliability Physics Symposium (IRPS)", (2014), ISBN: 978-1-4799-3317-4, 2D.4.1 - 2D.4.6. BibTeX |
| 1510. | F. Rudolf, Y. Wimmer, J. Weinbub, K. Rupp, S. Selberherr: "Mesh Generation Using Dynamic Sizing Functions"; Talk: European Seminar on Computing (ESCO), Pilsen, Czech Republic; 15.06.2014 - 20.06.2014; in "Proc. 4th European Seminar on Computing", (2014), 191. BibTeX |
| 1509. | A. Makarov, T. Windbacher, V. Sverdlov, S. Selberherr: "Micromagnetic Modeling of a Bias-Field-Free Spin-Torque Oscillator Based on Two MgO-MTJs with a Shared Free Layer"; Talk: 10th European Conference on Magnetic Sensors and Actuators (EMSA 2014), Vienna, Austria; 06.07.2014 - 09.07.2014; in "Book of Abstracts", (2014), ISBN: 978-3-85465-021-8, 166. BibTeX |
| 1508. | G.A. Rott, K. Rott, H. Reisinger, W. Gustin, T. Grasser: "Mixture of Negative Bias Temperature Instability and Hot-Carrier Driven Threshold Voltage Degradation of 130 nm Technology p-Channel Transistors"; Talk: European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), Berlin, Germany; 29.09.2014 - 02.10.2014; in "Abstracts 25th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF)", (2014), 40. BibTeX |
| 1507. | D. Osintsev, V. Sverdlov, S. Selberherr: "Mobility and Spin Lifetime Enhancement in Thin Silicon Films by Shear Strain"; Talk: APS March Meeting, Denver, USA; 03.03.2014 - 07.03.2014; in "Bulletin of the American Physical Society (APS March Meeting)", (2014), 59/1, 1 page(s) . BibTeX |
| 1506. | V. Sverdlov, J. Ghosh, D. Osintsev, S. Selberherr: "Modeling Silicon Spintronics"; Talk: International Conference on Mathematical Models and Methods in Applied Sciences (MMMAS), Saint-Petersburg, Russia; (invited) 23.09.2014 - 25.09.2014; in "Abstracts 2014", (2014), 78. BibTeX |
| 1505. | A. Makarov, D. Osintsev, V. Sverdlov, S. Selberherr: "Modeling Spin-Based Electronic Devices"; Talk: Nano and Giga Challenges in Microelectronics (NGCM), Phoenix, USA; (invited) 10.03.2014 - 14.03.2014; in "Book of Abstracts", (2014), 1 page(s) . BibTeX |
| 1504. | S. Selberherr: "Modeling Spin-Based Electronic Devices"; Talk: IEEE EDS Distinguished Lecture, Zhejiang University, Hangzhou, China; (invited) 28.10.2014. BibTeX |
| 1503. | S. Selberherr: "Modeling Spin-Based Electronic Devices"; Talk: IEEE EDS Mini-Colloquium Distinguished Lecture, Serbian Academy of Sciences and Arts, Belgrade, Serbia; (invited) 12.05.2014. BibTeX |
| 1502. | V. Sverdlov, J. Ghosh, H. Mahmoudi, A. Makarov, D. Osintsev, T. Windbacher, S. Selberherr: "Modeling Spin-Based Electronic Devices"; International Conference on Microelectronics (MIEL), Belgrade, Serbia; (invited) 12.05.2014 - 14.05.2014; in "Proceedings of the International Conference on Microelectronics (MIEL)", (2014), ISBN: 978-1-4799-5295-3, 27 - 34 doi:10.1109/MIEL.2014.6842081. BibTeX |
| 1501. | V. Sverdlov, J. Ghosh, H. Mahmoudi, A. Makarov, D. Osintsev, T. Windbacher, S. Selberherr: "Modeling of Spin-Based Silicon Technology"; Talk: International Conference on Ultimate Integration of Silicon (ULIS), Stockholm, Sweden; (invited) 07.04.2014 - 09.04.2014; in "Proc.Intl.Conf.on Ultimate Integration on Silicon (ULIS)", (2014), ISBN: 978-1-4799-3718-9, 1 - 4 doi:10.1109/ULIS.2014.6813891. BibTeX |
| 1500. | K. Giering, C. Sohrmann, G. Rzepa, L. Heiß, T. Grasser, R. Jancke: "NBTI Modeling in Analog Circuits and its Application to Long-Term Aging Simulations"; Talk: IEEE International Reliability Workshop (IIRW), South Lake Tahoe, CA, USA; 12.10.2014 - 16.10.2014; in "Proceedings of the IEEE International Integrated Reliability Workshop (IIRW)", (2014), ISBN: 978-1-4799-7308-8, 29 - 34 doi:10.1109/IIRW.2014.7049501. BibTeX |
| 1499. | I. Dimov, M. Nedjalkov, J. M. Sellier, S. Selberherr: "Neumann Series Analysis of the Wigner Equation Solution"; Talk: European Conference on Mathematics for Industry (ECMI), Taormina, Italy; (invited) 09.06.2014 - 14.06.2014; in "Abstracts of The 18th European Conference on Mathematics for Industry", (2014), 459. BibTeX |
| 1498. | A. Makarov, T. Windbacher, V. Sverdlov, S. Selberherr: "New Design of Spin-Torque Nano-Oscillators"; Talk: Workshop on Innovative Nanoscale Devices and Systems (WINDS), Kona; (invited) 30.11.2014 - 05.12.2014; in "Abstracts of the Workshop on Innovative Nanoscale Devices and Systems (WINDS)", (2014), ISBN: 978-3-901578-28-1, 63. BibTeX |
| 1497. | S. E. Tyaginov, M. Bina, J. Franco, B. Kaczer, T. Grasser: "On the Importance of Electron-electron Scattering for Hot-carrier Degradation"; Talk: International Conference on Solid State Devices and Materials (SSDM), Tsukuba, Japan; 08.09.2014 - 11.09.2014; in "Extended Abstracts of the 2014 International Conference on Solid State Devices and Materials (SSDM)", (2014), 858 - 859. BibTeX |
| 1496. | R. Orio, S. Gousseau, S. Moreau, H. Ceric, S. Selberherr, A. Farcy, F. Bay, K. Inal, P. Montmitonnet: "On the Material Depletion Rate Due to Electromigration in a Copper TSV Structure"; Poster: IEEE International Reliability Workshop (IIRW), Fallen Leaf Lake, CA, USA; 12.10.2014 - 16.10.2014; in "Proceedings of the IEEE International Integrated Reliability Workshop (IIRW)", (2014), ISBN: 978-1-4799-7274-6, 111 - 114 doi:10.1109/IIRW.2014.7049523. BibTeX |
| 1495. | T. Grasser, W. Gös, Y. Wimmer, F. Schanovsky, G. Rzepa, M. Waltl, K. Rott, H. Reisinger, V. Afanas´Ev, A. Stesmans, A. El-Sayed, A. Shluger: "On the Microscopic Structure of Hole Traps in pMOSFETs"; Talk: IEEE International Electron Devices Meeting (IEDM), San Francisco, CA, USA; 15.12.2014 - 17.12.2014; in "Proceedings of the IEEE International Electron Devices Meeting (IEDM)", (2014), ISBN: 978-1-4799-8001-7, 530 - 533 doi:10.1109/IEDM.2014.7047093. BibTeX |
| 1494. | Z. Stanojevic, O. Baumgartner, M. Karner, L. Filipovic, C. Kernstock, H. Kosina: "On the Validity of Momentum Relaxation Time in Low-Dimensional Carrier Gases"; Poster: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Yokohama, Japan; 09.09.2014 - 11.09.2014; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2014), ISBN: 978-1-4799-5285-4, 181 - 184 doi:10.1109/SISPAD.2014.6931593. BibTeX |
| 1493. | P. Ellinghaus, M. Nedjalkov, S. Selberherr: "Optimized Particle Regeneration Scheme for the Wigner Monte Carlo Method"; Talk: International Conference on Numerical Methods and Applications, Borovets, Bulgaria; 20.08.2014 - 24.08.2014; in "Eighth International Conference on Numerical Methods and Applications", (2014), 19. BibTeX |
| 1492. | K. Rupp, Ph. Tillet, F. Rudolf, J. Weinbub, T. Grasser, A. Jüngel: "Performance Portability Study of Linear Algebra Kernels in OpenCL"; Talk: International Workshop on OpenCL (IWOCL), Bristol, UK; 12.05.2014 - 13.05.2014; in "Proceedings of the International Workshop on OpenCL 2013 & 2014 (IWOCL)", (2014), ISBN: 978-1-4503-3007-7, 11 page(s) doi:10.1145/2664666.2664674. BibTeX |
| 1491. | S. E. Tyaginov, M. Bina, J. Franco, D. Osintsev, O. Triebl, B. Kaczer, T. Grasser: "Physical Modeling of Hot-Carrier Degradation for Short- and Long-channel MOSFETs"; Poster: International Reliability Physics Symposium (IRPS), Waikoloa, Hawaii, USA; 01.06.2014 - 05.06.2014; in "Proceedings of the International Reliability Physics Symposium (IRPS)", (2014), ISBN: 978-1-4799-3317-4, XT16.1 - XT16.8. BibTeX |
| 1490. | Y. Wimmer, S. E. Tyaginov, F. Rudolf, K. Rupp, M. Bina, H. Enichlmair, J.M. Park, R. Minixhofer, H. Ceric, T. Grasser: "Physical Modeling of Hot-Carrier Degradation in nLDMOS Transistors"; Talk: IEEE International Reliability Workshop (IIRW), South Lake Tahoe, CA, USA; 12.10.2014 - 16.10.2014; in "Proceedings of the IEEE International Integrated Reliability Workshop (IIRW)", (2014), ISBN: 978-1-4799-7308-8, 58 - 62 doi:10.1109/IIRW.2014.7049511. BibTeX |
| 1489. | G. Rzepa, W. Gös, G.A. Rott, K. Rott, M. Karner, C. Kernstock, B. Kaczer, H. Reisinger, T. Grasser: "Physical Modeling of NBTI: From Individual Defects to Devices"; Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Yokohama, Japan; 09.09.2014 - 11.09.2014; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2014), ISBN: 978-1-4799-5285-4, 81 - 84 doi:10.1109/SISPAD.2014.6931568. BibTeX |
| 1488. | L. Filipovic, R. Orio, S. Selberherr: "Process and Performance of Copper TSVs"; Talk: Workshop of the Thematic Network on Silicon On Insulator Technology, Devices and Circuits (EUROSOI), Tarragona, Spain; 27.01.2014 - 29.01.2014; in "Conference Proceedings of the Tenth Workshop of the Thematic Network on Silicon on Insulator Technology, Devices and Circuits", (2014), 1 - 2. BibTeX |
| 1487. | L. Filipovic, R. Orio, S. Selberherr: "Process and Reliability of SF6/O2 Plasma Etched Copper TSVs"; Talk: International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), Ghent, Belgium; 07.04.2014 - 09.04.2014; in "Proceedings of the IEEE 15th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE)", (2014), ISBN: 978-1-4799-4791-1, 4 page(s) doi:10.1109/EuroSimE.2014.6813768. BibTeX |
| 1486. | T. Windbacher, A. Makarov, V. Sverdlov, S. Selberherr: "Pushing a Non-Volatile Magnetic Device Structure Towards a Universal CMOS Logic Replacement"; Talk: Workshop on Innovative Nanoscale Devices and Systems (WINDS), Kona; (invited) 30.11.2014 - 05.12.2014; in "Abstracts of the Workshop on Innovative Nanoscale Devices and Systems (WINDS)", (2014), ISBN: 978-3-901578-28-1, 62. BibTeX |
| 1485. | H. Ceric, W. H. Zisser, S. Selberherr: "Quantum Mechanical Calculations of Electromigration Characteristics"; Talk: International Workshop on Stress-Induced Phenomena in Microelectronics, Austin, TX, USA; (invited) 15.10.2014 - 17.10.2014; in "Abstracts of 13th International Workshop on Stress-Induced Phenomena in Microelectronics", (2014), 21. BibTeX |
| 1484. | J. Franco, B. Kaczer, N. Waldron, Ph. J. Roussel, A. Alian, M. Pourghaderi, Z. Ji, T. Grasser, T. Kauerauf, S. Sioncke, N. Collaert, A. Thean, G. Groeseneken: "RTN and PBTI-induced Time-Dependent Variability of Replacement Metal-Gate High-k InGaAs FinFETs"; Talk: IEEE International Electron Devices Meeting (IEDM), San Francisco, CA, USA; 15.12.2014 - 17.12.2014; in "Proceedings of the IEEE International Electron Devices Meeting (IEDM)", (2014), ISBN: 978-1-4799-8001-7, 506 - 509 doi:10.1109/IEDM.2014.7047087. BibTeX |
| 1483. | M. Vexler, Yu. Illarionov, S. E. Tyaginov, N. S. Sokolov, V. V. Fedorov, T. Grasser: "Simulation of the Electrical Characteristics of the Devices with Thin Calcium Fluoride Films on Silicon-(111) Using MINIMOS-NT"; Talk: DIELECTRICS-2014, St-Petersburg, Russia; 02.06.2014 - 06.06.2014; in "Materials of XIII International conference DIELECTRICS", (2014), 159 - 162. BibTeX |
| 1482. | Y. Wang, M. Baboulin, K. Rupp, O. Le Maitre: "Solving 3D incompressible Navier-Stokes equations on hybrid CPU/GPU systems"; Talk: High Performance Computing Symposium (HPC), Tampa, Florida, USA; 13.04.2014 - 16.04.2014; in "HPC '14 Proceedings of the High Performance Computing Symposium", (2014), 1 - 8. BibTeX |
| 1481. | V. Sverdlov, D. Osintsev, S. Selberherr: "Spin Behaviour in Strained Silicon Films"; Talk: European Material Research Society (E-MRS) Fall Meeting, Warsaw, Poland; (invited) 15.09.2014 - 18.09.2014; in "Abstracts of E-MRS Fall Meeting", (2014), 1 page(s) . BibTeX |
| 1480. | J. Ghosh, V. Sverdlov, S. Selberherr: "Spin Diffusion in Silicon from a Ferromagnetic Contact"; Talk: 10th European Conference on Magnetic Sensors and Actuators (EMSA 2014), Vienna, Austria; 06.07.2014 - 09.07.2014; in "Book of Abstracts", (2014), ISBN: 978-3-85465-021-8, 165. BibTeX |
| 1479. | J. Ghosh, V. Sverdlov, S. Selberherr: "Spin Injection in Silicon: The Role of Screening Effects"; Talk: International Workshop on Computational Electronics (IWCE), Paris, France; 03.06.2014 - 06.06.2014; in "Book of Abstracts of the International Workshop on Computational Electronics (IWCE)", (2014), ISBN: 978-2-9547858-0-6, 63 - 64. BibTeX |
| 1478. | S. Touski, Z. Chaghazardi, M. Pourfath, M. Moradinasab, R. Faez, H. Kosina: "Spin Transport in Graphene Nanoribbons: The Role of Surface-Corrugation"; Talk: International Workshop on Computational Electronics (IWCE), Paris, France; 03.06.2014 - 06.06.2014; in "Book of Abstracts of the International Workshop on Computational Electronics (IWCE)", (2014), ISBN: 978-2-9547858-0-6, 101 - 102. BibTeX |
| 1477. | L. Filipovic, S. Selberherr: "Spray Pyrolysis Deposition for Gas Sensor Integration in the Backend of Standard CMOS Processes"; Talk: International Conference on Solid State and Integrated Circuit Technology (ICSICT), Guilin, China; (invited) 28.10.2014 - 31.10.2014; in "Proc.Intl.Conf.on Solid-State and Integrated Circuit Technology (ICSICT)", (2014), ISBN: 978-1-4799-3282-5, 1692 - 1695 doi:10.1109/ICSICT.2014.7021507. BibTeX |
| 1476. | S. Papaleo, W. H. Zisser, A. P. Singulani, H. Ceric, S. Selberherr: "Stress Analysis in Open TSVs after Nanoindentation"; Talk: GDRI CNRS Mecano General Meeting on the Mechanics of Nano-objects, Thun, Switzerland; 04.09.2014 - 05.09.2014; in "Abstracts", (2014), 39 - 40. BibTeX |
| 1475. | L. Filipovic, S. Selberherr: "Stress Considerations for System-on-Chip Gas Sensor Integration in CMOS Technology"; Talk: International Workshop on Stress-Induced Phenomena in Microelectronics, Austin, TX, USA; 15.10.2014 - 17.10.2014; in "Abstracts of 13th International Workshop on Stress-Induced Phenomena in Microelectronics", (2014), 46. BibTeX |
| 1474. | W. H. Zisser, H. Ceric, S. Selberherr: "Stress Development and Void Evolution in Open TSVs"; Talk: GDRI CNRS Mecano General Meeting on the Mechanics of Nano-objects, Thun, Switzerland; 04.09.2014 - 05.09.2014; in "Abstracts", (2014), 38 - 39. BibTeX |
| 1473. | S. Papaleo, W. H. Zisser, A. P. Singulani, H. Ceric, S. Selberherr: "Stress Evolution During the Nanoindentation in Open TSVs"; Poster: International Workshop on Stress-Induced Phenomena in Microelectronics, Austin, TX, USA; 15.10.2014 - 17.10.2014; in "Abstracts of 13th International Workshop on Stress-Induced Phenomena in Microelectronics", (2014), 52. BibTeX |
| 1472. | V. Sverdlov, A. Makarov, S. Selberherr: "Structural Optimization of MTJs for STT-MRAM and Oscillator Applications"; Talk: Symposium on CMOS Emerging Technologies, Grenoble, France; 06.07.2014 - 08.07.2014; in "Abstracts: 2014 CMOS Emerging Technologies Research Symposium", (2014), ISBN: 978-1-927500-45-3, 19. BibTeX |
| 1471. | E. Bury, R. Degraeve, M. Cho, B. Kaczer, W. Gös, T. Grasser, N. Horiguchi, G. Groeseneken: "Study of (correlated) trap sites in SILC, BTI and RTN in SiON and HKMG Devices"; Talk: IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), Singapore, Singapore; 30.06.2014 - 04.07.2014; in "Proceedings of the 21st International Symposium on the Physical and Failure Analysis of Integrated Circuits", (2014), ISBN: 978-1-4799-3929-9, 254 - 257. BibTeX |
| 1470. | F. Rudolf, J. Weinbub, K. Rupp, A. Morhammer, S. Selberherr: "Template-Based Mesh Generation for Semiconductor Devices"; Poster: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Yokohama, Japan; 09.09.2014 - 11.09.2014; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2014), ISBN: 978-1-4799-5285-4, 217 - 220 doi:10.1109/SISPAD.2014.6931602. BibTeX |
| 1469. | L. Filipovic, S. Selberherr: "The Effects of Etching and Deposition on the Performance and Stress Evolution of Open Through Silicon Vias"; Talk: European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), Berlin, Germany; 29.09.2014 - 02.10.2014; in "Abstracts 25th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF)", (2014), 36. BibTeX |
| 1468. | J. M. Sellier, M. Nedjalkov, I. Dimov, S. Selberherr: "The Multi-Dimensional Transient Challenge: The Wigner Particle Approach"; Talk: International Workshop on Computational Electronics (IWCE), Paris, France; (invited) 03.06.2014 - 06.06.2014; in "Book of Abstracts of the International Workshop on Computational Electronics (IWCE)", (2014), ISBN: 978-2-9547858-0-6, 119 - 120. BibTeX |
| 1467. | P. Ellinghaus, M. Nedjalkov, S. Selberherr: "The Wigner Monte Carlo Method for Accurate Semiconductor Device Simulation"; Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Yokohama, Japan; 09.09.2014 - 11.09.2014; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2014), ISBN: 978-1-4799-5285-4, 113 - 116 doi:10.1109/SISPAD.2014.6931576. BibTeX |
| 1466. | N. Neophytou, H. Kosina: "Thermoelectric Properties of Gated Silicon Nanowires"; Talk: APS March Meeting, Denver, USA; 03.03.2014 - 07.03.2014; in "Bulletin of the American Physical Society (APS March Meeting)", (2014), 1 page(s) . BibTeX |
| 1465. | N. Neophytou, H. Kosina: "Thermoelectric properties of gated Si nanowires"; Poster: International Workshop on Computational Electronics (IWCE), Paris, France; 03.06.2014 - 06.06.2014; in "Book of Abstracts of the International Workshop on Computational Electronics (IWCE)", (2014), ISBN: 978-2-9547858-0-6, 197 - 198. BibTeX |
| 1464. | L. Filipovic, F. Rudolf, E. Baer, P. Evanschitzky, J. Lorenz, F. Roger, A. P. Singulani, R. Minixhofer, S. Selberherr: "Three-Dimensional Simulation for the Reliability and Electrical Performance of Through-Silicon Vias"; Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Yokohama, Japan; 09.09.2014 - 11.09.2014; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2014), ISBN: 978-1-4799-5285-4, 341 - 344 doi:10.1109/SISPAD.2014.6931633. BibTeX |
| 1463. | D. Osintsev, V. Sverdlov, S. Selberherr: "Valley Degeneracy and Spin Lifetime Enhancement in Stressed Silicon Films"; Poster: 8th International Conference on Physics and Applications of Spin Phenomena in Solids (PASPS VIII), Washington, D.C., USA; 28.07.2014 - 31.07.2014; in "Book of Abstracts", (2014), 1. BibTeX |
| 1462. | D. Osintsev, V. Sverdlov, N. Neophytou, S. Selberherr: "Valley Splitting and Spin Lifetime Enhancement in Strained Silicon Heterostructures"; Poster: International Winterschool on New Developments in Solid State Physics, Mauterndorf, Austria; 23.02.2014 - 28.02.2014; in "Proceedings of International Winterschool on New Developments in Solid State Physics", (2014), 88 - 89. BibTeX |
| 1461. | D. Osintsev, V. Sverdlov, N. Neophytou, S. Selberherr: "Valley Splitting and Spin Lifetime Enhancement in Ultra-Scaled MOSFETs"; Talk: International Workshop on Computational Electronics (IWCE), Paris, France; 03.06.2014 - 06.06.2014; in "Book of Abstracts of the International Workshop on Computational Electronics (IWCE)", (2014), ISBN: 978-2-9547858-0-6, 59 - 60. BibTeX |
| 1460. | W. H. Zisser, H. Ceric, S. Selberherr: "Void Evolution in Open TSVs"; Poster: International Workshop on Stress-Induced Phenomena in Microelectronics, Austin, TX, USA; 15.10.2014 - 17.10.2014; in "Abstracts of 13th International Workshop on Stress-Induced Phenomena in Microelectronics", (2014), 59. BibTeX |
| 1459. | W. Gös, M. Toledano-Luque, O. Baumgartner, F. Schanovsky, B. Kaczer, T. Grasser: "A Comprehensive Model for Correlated Drain and Gate Current Fluctuations"; Talk: International Workshop on Computational Electronics (IWCE), Nara, Japan; 04.06.2013 - 07.06.2013; in "Book of Abstracts of the International Workshop on Computational Electronics (IWCE)", (2013), ISBN: 978-3-901578-26-7, 46 - 47. BibTeX |
| 1458. | F. Schanovsky, O. Baumgartner, W. Gös, T. Grasser: "A Detailed Evaluation of Model Defects as Candidates for the Bias Temperature Instability"; Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Glasgow, Scotland, United Kingdom; 03.09.2013 - 05.09.2013; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2013), ISBN: 978-1-4673-5733-3, 1 - 4 doi:10.1109/SISPAD.2013.6650559. BibTeX |
| 1457. | K. Rupp, F. Rudolf, J. Weinbub: "A Discussion of Selected Vienna-Libraries for Computational Science"; Talk: C++Now, Aspen, CO, USA; 12.05.2013 - 17.05.2013; in "Proceedings of C++Now (2013)", (2013), 10 page(s) . BibTeX |
| 1456. | K. Rupp, Ph. Tillet, B. Smith, T. Grasser, A. Jungel: "A Note on the GPU Acceleration of Eigenvalue Computations"; Talk: International Conference of Numerical Analysis and Applied Mathematics (ICNAAM), Rhodes, Greece; 21.09.2013 - 27.09.2013; in "AIP Proceedings, volume 1558", (2013), 1536 - 1539. BibTeX |
| 1455. | Yu. Illarionov, S. E. Tyaginov, M. Bina, T. Grasser: "A method to determine the lateral trap position in ultra-scaled MOSFETs"; Talk: Solid State Devices and Materials Conference (SSDM), Fukuoka, Japan; 24.09.2013 - 27.09.2013; in "Extended Abstracts of the 2013 International Conference on Solid State Devices and Materials(SSDM)", (2013), ISBN: 978-4-86348-362-0, 728 - 729. BibTeX |
| 1454. | R. Orio, S. Selberherr: "About Voids in Copper Interconnects"; Talk: International Conference on Materials for Advanced Technologies (ICMAT), Singapore; (invited) 30.06.2013 - 05.07.2013; in "Proceedings of the International Conference on Materials for Advanced Technologies (ICMAT 2013)", (2013), 8. BibTeX |
| 1453. | T. Grasser, K. Rott, H. Reisinger, P.-J. Wagner, W. Gös, F. Schanovsky, M. Waltl, M. Toledano-Luque, B. Kaczer: "Advanced Characterization of Oxide Traps: The Dynamic Time-Dependent Defect Spectroscopy"; Talk: International Reliability Physics Symposium (IRPS), Monterey, CA, USA; 14.04.2013 - 18.04.2013; in "Proceedings of the International Reliability Physics Symposium (IRPS)", (2013), 1 - 6. BibTeX |
| 1452. | F. Schanovsky, W. Gös, T. Grasser: "Advanced Modeling of Charge Trapping at Oxide Defects"; Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Glasgow, Scotland, United Kingdom; (invited) 03.09.2013 - 05.09.2013; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2013), ISBN: 978-1-4673-5733-3, 451 - 458 doi:10.1109/SISPAD.2013.6650671. BibTeX |
| 1451. | H. Ceric, R. Orio, S. Selberherr: "Analysis of Solder Bump Electromigration Reliability"; Poster: IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), Suzhou, China; 15.07.2013 - 19.07.2013; in "Proceedings of the 20th International Symposium on the Physical & Failure Analysis of Integrated Circuits", (2013), ISBN: 978-1-4799-0478-5, 713 - 716 doi:10.1109/IPFA.2013.6599258. BibTeX |
| 1450. | G. Strasser, B. Schwarz, P. Reininger, O. Baumgartner, W. Schrenk, T. Zederbauer, H. Detz, A. M. Andrews, H. Kosina: "Bi-functional Quantum Cascade Laser/Detectors for Integrated Photonics"; Talk: ÖPG-Jahrestagung, Linz; (invited) 02.09.2013 - 06.09.2013; . BibTeX |
| 1449. | A. Makarov, V. Sverdlov, S. Selberherr: "Bias-Field-Free Spin-Torque Oscillator Based on Two MgO-MTJs with a Shared Free Layer: Micromagnetic Modeling"; Poster: International Symposium on Advanced Nanostructures and Nano-Devices (ISANN), Kauai, Hawaii, USA; 08.12.2013 - 13.12.2013; in "Abstracts International Symposium on Advanced Nanodevices and Nanotechnology (ISANN)", (2013), 2 page(s) . BibTeX |
| 1448. | D. Osintsev, V. Sverdlov, S. Selberherr: "Calculation of the Electron Mobility and Spin Lifetime Enhancement by Strain in Thin Silicon Films"; Poster: International Symposium on Nanostructures, St. Petersburg, Russian federation; 24.06.2013 - 28.06.2013; in "Proceedings of the 21st International Symposium Nanostructures", (2013), ISBN: 978-5-4386-0145-6, 69 - 70. BibTeX |
| 1447. | M. Molnar, V. Palankovski, D. Donoval, J. Kuzmik, J. Kovac, A. Chvala, J. Marek, P. Pribytny, S. Selberherr: "Characterization of InAlN/GaN HEMTs at Elevated Temperatures Supported by Numerical Simulation"; Talk: Workshop on Compound Semiconductor Devices and Integrated Circuits (WOCSDICE), Warnemunde, Germany; 26.05.2013 - 29.05.2013; in "Proceedings of the Workshop on Compound Semiconductor Devices and Integrated Circuits", (2013), ISBN: 978-3-00-041435-0, 135 - 136. BibTeX |
| 1446. | A. Makarov, V. Sverdlov, S. Selberherr: "Composite Magnetic Tunnel Junctions for Fast Memory Devices and Efficient Spin-Torque Nano-Oscillators"; Talk: Intl.Conf.on Information Engineering (ICIE), Hong Kong; 01.11.2013 - 02.11.2013; in "Abstracts Intl.Conf.on Information Engineering (ICIE)", (2013), 7. BibTeX |
| 1445. | A. Makarov, V. Sverdlov, S. Selberherr: "Concept of a Bias-Field-Free Spin-Torque Oscillator Based on Two MgO-MTJs"; Talk: Solid State Devices and Materials Conference (SSDM), Fukuoka, Japan; 24.09.2013 - 27.09.2013; in "Extended Abstracts of the 2013 International Conference on Solid State Devices and Materials (SSDM 2013)", (2013), ISBN: 978-4-86348-362-0, 796 - 797. BibTeX |
| 1444. | R. Coppeta, H. Ceric, D. Holec, T. Grasser: "Critical thickness for GaN thin film on AlN substrate"; Talk: IEEE International Reliability Workshop (IIRW), South Lake Tahoe, USA; 13.10.2013 - 17.10.2013; in "Final Report of the IEEE International Integrated Reliability Workshop (IIRW)", (2013), ISBN: 978-1-4799-0350-4, 133 - 136. BibTeX |
| 1443. | P. Weckx, B. Kaczer, M. Toledano-Luque, T. Grasser, Ph. J. Roussel, H. Kukner, P. Raghavan, F. Catthoor, G. Groeseneken: "Defect-based Methodology for Workload-dependent Circuit Lifetime Projections - Application to SRAM"; Talk: International Reliability Physics Symposium (IRPS), Monterey, CA, USA; 14.04.2013 - 18.04.2013; in "Proceedings of the International Reliability Physics Symposium (IRPS)", (2013), 1 - 7. BibTeX |
| 1442. | M. Toledano-Luque, B. Kaczer, J. Franco, P. Roussel, M. Bina, T. Grasser, M. Cho, P. Weckx, G Groeseneken: "Degradation of time dependent variability due to interface state generation"; Talk: International Symposium on VLSI Technology, Kyoto, Japan; 11.06.2013 - 14.06.2013; in "2013 Symposium on VLSI Technology (VLSIT)", (2013), ISBN: 978-1-4673-5226-0, 190 - 191. BibTeX |
| 1441. | H. Mahmoudi, T. Windbacher, V. Sverdlov, S. Selberherr: "Design and Applications of Magnetic Tunnel Junction Based Logic Circuits"; Talk: The 9th Conference on Ph.D. Research in Microelectronics & Electronics- PRIME 2013, Villach, Austria; 24.06.2013 - 27.06.2013; in "Proceedings of the 9th Conference on Ph.D. Research in Microelectronics & Electronics", (2013), ISBN: 978-1-4673-4580-4, 157 - 160 doi:10.1109/PRIME.2013.6603122. BibTeX |
| 1440. | G. Pobegen, M. Nelhiebel, T. Grasser: "Detrimental impact of hydrogen passivation on NBTI and HC degradation"; Poster: International Reliability Physics Symposium (IRPS), Monterey, CA, USA; 14.04.2013 - 18.04.2013; in "Proceedings of the International Reliability Physics Symposium (IRPS)", (2013), 1 - 6. BibTeX |
| 1439. | O. Baumgartner, M. Bina, W. Gös, F. Schanovsky, M. Toledano-Luque, B. Kaczer, H. Kosina, T. Grasser: "Direct Tunneling and Gate Current Fluctuations"; Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Glasgow, Scotland, United Kingdom; 03.09.2013 - 05.09.2013; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2013), ISBN: 978-1-4673-5733-3, 17 - 20 doi:10.1109/SISPAD.2013.6650563. BibTeX |
| 1438. | G.A. Rott, H. Nielen, H. Reisinger, W. Gustin, S. E. Tyaginov, T. Grasser: "Drift Compensating Effect during Hot-Carrier Degradation of 130nm Dual Gate Oxide p-channel Transistors"; Talk: IEEE International Reliability Workshop (IIRW), South Lake Tahoe, USA; 13.10.2013 - 17.10.2013; in "Final Report of the IEEE International Integrated Reliability Workshop (IIRW)", (2013), ISBN: 978-1-4799-0350-4, 73 - 77. BibTeX |
| 1437. | A. P. Singulani, H. Ceric, E. Langer, S. Carniello: "Effects of Bosch scallops on metal layer stress of an open Through Silicon Via technology"; Poster: International Reliability Physics Symposium (IRPS), Monterey, CA, USA; 14.04.2013 - 18.04.2013; in "Proceedings of the International Reliability Physics Symposium (IRPS)", (2013), ISBN: 978-1-4799-0112-8, CP.2.1 - CP.2.5 doi:10.1109/IRPS.2013.6532066. BibTeX |
| 1436. | W. H. Zisser, H. Ceric, R. Orio, S. Selberherr: "Electromigration Analyses of Open TSVs"; Poster: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Glasgow, Scotland, United Kingdom; 03.09.2013 - 05.09.2013; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2013), ISBN: 978-1-4673-5733-3, 244 - 247 doi:10.1109/SISPAD.2013.6650620. BibTeX |
| 1435. | H. Ceric, A. P. Singulani, R. Orio, S. Selberherr: "Electromigration Enhanced Growth of Intermetallic Compound in Solder Bumps"; Talk: IEEE International Reliability Workshop (IIRW), South Lake Tahoe, USA; 13.10.2013 - 17.10.2013; in "Final Report of the IEEE International Integrated Reliability Workshop (IIRW)", (2013), ISBN: 978-1-4799-0350-4, 166 - 169 doi:10.1109/IIRW.2013.6804185. BibTeX |
| 1434. | W. H. Zisser, H. Ceric, R. Orio, S. Selberherr: "Electromigration Induced Stress in Open TSVs"; Talk: IEEE International Reliability Workshop (IIRW), South Lake Tahoe, USA; 13.10.2013 - 17.10.2013; in "Final Report of the IEEE International Integrated Reliability Workshop (IIRW)", (2013), ISBN: 978-1-4799-0350-4, 142 - 145 doi:10.1109/IIRW.2013.6804179. BibTeX |
| 1433. | S. Touski, M. Pourfath, H. Kosina: "Electronic Transport in Graphene Nanoribbons in the Presence of Substrate Surface Corrugation"; Talk: International Workshop on Computational Electronics (IWCE), Nara, Japan; 04.06.2013 - 07.06.2013; in "Book of Abstracts of the International Workshop on Computational Electronics (IWCE)", (2013), ISBN: 978-3-901578-26-7, 108 - 109. BibTeX |
| 1432. | D. Osintsev, V. Sverdlov, S. Selberherr: "Enhanced Intervalley Splitting and Reduced Spin Relaxation in Strained Thin Silicon Films"; Talk: APS March Meeting, Baltimore, Maryland, USA; 18.03.2013 - 22.03.2013; in "Bulletin American Physical Society (APS March Meeting)", (2013), 1 page(s) . BibTeX |
| 1431. | R. Coppeta, H. Ceric, B. Karunamurthy, T. Grasser: "Epitaxial Volmer-Weber Growth Modelling"; Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Glasgow, Scotland, United Kingdom; 03.09.2013 - 05.09.2013; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2013), ISBN: 978-1-4673-5733-3, 45 - 48 doi:10.1109/SISPAD.2013.6650570. BibTeX |
| 1430. | S. E. Tyaginov, M. Bina, J. Franco, D. Osintsev, Y. Wimmer, B. Kaczer, T. Grasser: "Essential Ingredients for Modeling of Hot-Carrier Degradation in Ultra-Scaled MOSFETs"; Talk: IEEE International Reliability Workshop (IIRW), South Lake Tahoe, USA; 13.10.2013 - 17.10.2013; in "Final Report of the IEEE International Integrated Reliability Workshop (IIRW)", (2013), ISBN: 978-1-4799-0350-4, 98 - 101. BibTeX |
| 1429. | D. Osintsev, V. Sverdlov, S. Selberherr: "Evaluation of Spin Lifetime in Strained UT2B Silicon-On-Insulator MOSFETs"; Poster: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Glasgow, Scotland, United Kingdom; 03.09.2013 - 05.09.2013; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2013), ISBN: 978-1-4673-5733-3, 236 - 239 doi:10.1109/SISPAD.2013.6650618. BibTeX |
| 1428. | B. Kaczer, V. Afanas´Ev, K. Rott, F. Cerbu, J. Franco, W. Gös, T. Grasser, O. Madia, D. Nguyen, A. Stesmans, H. Reisinger, M. Toledano-Luque, P. Weckx: "Experimental characterization of BTI defects"; Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Glasgow, Scotland, United Kingdom; (invited) 03.09.2013 - 05.09.2013; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2013), ISBN: 978-1-4673-5733-3, 444 - 450 doi:10.1109/SISPAD.2013.6650670. BibTeX |
| 1427. | Z. Stanojevic, M. Karner, H. Kosina: "Exploring the Design Space of Non-Planar Channels: Shape, Orientation, and Strain"; Talk: IEEE International Electron Devices Meeting (IEDM), Washington, DC, USA; 09.12.2013 - 11.12.2013; in "Proceedings of the IEEE International Electron Devices Meeting (IEDM)", (2013), 332 - 335 doi:10.1109/IEDM.2013.6724618. BibTeX |
| 1426. | A. Makarov, V. Sverdlov, S. Selberherr: "Fast Switching STT-MRAM Cells for Future Universal Memory"; Talk: Advanced Workshop on Frontiers in Electronics (WOFE), San Juan, Puerto Rico; (invited) 17.12.2013 - 20.12.2013; in "Abstracts Advanced Workshop on Frontiers in Electronics (WOFE)", (2013), 1 page(s) . BibTeX |
| 1425. | N. Neophytou, Z. Stanojevic, H. Kosina: "Full Band Calculations of Low-field Mobility in p-type Silicon Nanowire MOSFETs"; Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Glasgow, Scotland, United Kingdom; 03.09.2013 - 05.09.2013; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2013), ISBN: 978-1-4673-5733-3, 81 - 84 doi:10.1109/SISPAD.2013.6650579. BibTeX |
| 1424. | T. Grasser: "Fundamentals of RTN, BTI, and Hot Carrier Degradation: A Matter of Timescales"; Talk: International Reliability Physics Symposium (IRPS), Monterey, CA, USA (Tutorial); (invited) 14.04.2013 - 18.04.2013; in "Proceedings of the International Reliability Physics Symposium (IRPS)", (2013), 1. BibTeX |
| 1423. | A. Makarov, V. Sverdlov, S. Selberherr: "Geometry Optimization of Spin-Torque Oscillators Composed of Two MgO-MTJs with a Shared Free Layer"; Talk: International Conference on Nanoscale Magnetism (ICNM), Istanbul, Turkey; 02.09.2013 - 06.09.2013; in "Proceedings of the International Conference on Nanoscale Magnetism", (2013), 69. BibTeX |
| 1422. | T. Grasser, K. Rott, H. Reisinger, M. Waltl, P.-J. Wagner, F. Schanovsky, W. Gös, G. Pobegen, B. Kaczer: "Hydrogen-Related Volatile Defects as the Possible Cause for the Recoverable Component of NBTI"; Talk: IEEE International Electron Devices Meeting (IEDM), Washington, DC, USA; 09.12.2013 - 11.12.2013; in "Proceedings of the IEEE International Electron Devices Meeting (IEDM)", (2013), 409 - 412 doi:10.1109/IEDM.2013.6724637. BibTeX |
| 1421. | A. P. Singulani, H. Ceric, L. Filipovic, E. Langer: "Impact of Bosch Scallops Dimensions on Stress of an Open Through Silicon Via Technology"; Talk: International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, Poland; 14.04.2013 - 17.04.2013; in "Proceedings of the IEEE 14th International Conference on Thermal, Mechanical & Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EurSimE)", (2013), ISBN: 978-1-4673-6137-8, 6 page(s) doi:10.1109/EuroSimE.2013.6529938. BibTeX |
| 1420. | H. Mahmoudi, T. Windbacher, V. Sverdlov, S. Selberherr: "Impact of Device Parameters on the Reliability of the Magnetic Tunnel Junction Based Implication Logic Gates"; Poster: International Workshop "Functional Nanomaterials and Devices", Kyiv, Ukraine; 08.04.2013 - 11.04.2013; in "Proceedings of the 7th International Workshop "Functional Nanomaterials and Devices"", (2013), ISBN: 978-966-02-6779-4, 68 - 69. BibTeX |
| 1419. | H. Ceric, A. P. Singulani, R. Orio, S. Selberherr: "Impact of Intermetallic Compound on Solder Bump Electromigration Reliability"; Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Glasgow, Scotland, United Kingdom; 03.09.2013 - 05.09.2013; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2013), ISBN: 978-1-4673-5733-3, 73 - 76 doi:10.1109/SISPAD.2013.6650577. BibTeX |
| 1418. | J. Weinbub, K. Rupp, S. Selberherr: "Increasing Flexibility and Reusability of Finite Element Simulations With ViennaX"; Talk: International Congress on Computational Engineering and Sciences (FEMTEC), Las Vegas, USA; 20.05.2013 - 25.05.2013; in "Abstracts 4th International Congress on Computational Engineering and Sciences", (2013), 1 page(s) . BibTeX |
| 1417. | D. Osintsev, V. Sverdlov, S. Selberherr: "Influence of Surface Roughness Scattering on Spin Lifetime in Silicon"; Talk: International Workshop on Computational Electronics (IWCE), Nara, Japan; 04.06.2013 - 07.06.2013; in "Book of Abstracts of the International Workshop on Computational Electronics (IWCE)", (2013), ISBN: 978-3-901578-26-7, 76 - 77. BibTeX |
| 1416. | R. Orio, H. Ceric, S. Selberherr: "Influence of Temperature on the Standard Deviation of Electromigration Lifetimes"; Poster: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Glasgow, Scotland, United Kingdom; 03.09.2013 - 05.09.2013; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2013), ISBN: 978-1-4673-5733-3, 232 - 235 doi:10.1109/SISPAD.2013.6650617. BibTeX |
| 1415. | J. Ghosh, V. Sverdlov, S. Selberherr: "Influence of a Space Charge Region on Spin Transport in Semiconductor"; Talk: International Semiconductor Device Research Symposium (ISDRS), Maryland, USA; 11.12.2013 - 13.12.2013; in "Abstracts International Semiconductor Device Research Symposium (ISDRS)", (2013), ISBN: 978-1-63173-156-3, 27. BibTeX |
| 1414. | D. Osintsev, V. Sverdlov, S. Selberherr: "Influence of the Valley Degeneracy on Spin Relaxation in Thin Silicon Films"; Poster: International Conference on Ultimate Integration of Silicon (ULIS), University of Warwick, UK; 19.03.2013 - 21.03.2013; in "The 14th Edition of the `International Conference on Ultimate Integration on Silicon´ (ULIS 2013)", (2013), ISBN: 978-1-4673-4802-7, 221 - 224 doi:10.1109/ULIS.2013.6523525. BibTeX |
| 1413. | A. Harrer, B. Schwarz, P. Reininger, R. Gansch, T. Zederbauer, A. M. Andrews, S. Kalchmair, W. Schrenk, O. Baumgartner, Z. Stanojevic, H. Kosina, G. Strasser: "Intersubband Detectors"; Talk: 3rd International Nanophotonics Meeting 2013, Salzburg; 01.09.2013 - 03.09.2013; . BibTeX |
| 1412. | N. Neophytou, H. Karamitaheri, H. Kosina: "Low Dimensional Semiconductor Thermoelectric Materials: Design Approaches from Atomistic Calculations for Electrons and Phonons"; Talk: The 32nd International Conference on Thermoelectrics, Kobe, Japan; 30.06.2013 - 04.07.2013; in "Book of Abstracts", (2013), 1 page(s) . BibTeX |
| 1411. | N. Neophytou, Z. Stanojevic, H. Kosina: "Low-Field Mobility of Ultra-Narrow Si Nanowire MOSFETs Using Self-Consistent Full-Band Simulations"; Poster: International Conference on One Dimensional Nanomaterials (ICON), Annecy, France; 23.09.2013 - 26.09.2013; in "Booklet of Abstracts, Fifth International Conference on One Dimensional Nanomaterials", (2013), 142. BibTeX |
| 1410. | H. Mahmoudi, T. Windbacher, V. Sverdlov, S. Selberherr: "MRAM-based Logic Array for Large-Scale Non-Volatile Logic-in-Memory Applications"; Talk: 2013 IEEE/ACM International Symposium on Nanoscale Architectures (NANOARCH), New York City, USA; 15.07.2013 - 17.07.2013; in "Proceedings of the 2013 IEEE/ACM International Symposium on Nanoscale Architectures", (2013), ISBN: 978-1-4799-0873-8, 2 page(s) doi:10.1109/NanoArch.2013.6623033. BibTeX |
| 1409. | A. Makarov, V. Sverdlov, S. Selberherr: "Magnetic oscillation of the transverse domain wall in a penta-layer MgO-MTJ"; Poster: International Symposium on Nanostructures, St. Petersburg, Russian federation; 24.06.2013 - 28.06.2013; in "Proceedings of the 21st International Symposium Nanostructures", (2013), ISBN: 978-5-4386-0145-6, 338 - 339. BibTeX |
| 1408. | M. Schrems, C. Schrank, J. Siegert, J. Kraft, J. Teva, S. Selberherr: "Metrology Requirements for Manufacturing 3D Integrated ICs"; Talk: International Conference on Frontiers of Characterization and Metrology for Nanoelectronics (FCMN), Gaithersburg, USA; (invited) 25.03.2013 - 28.03.2013; in "Proceedings International Conference on Frontiers of Characterization and Metrology for Nanoelectronics (FCMN)", (2013), 137 - 139. BibTeX |
| 1407. | L. Filipovic, O. Baumgartner, H. Kosina: "Modeling Direct Band-to-Band Tunneling using QTBM"; Poster: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Glasgow, Scotland, United Kingdom; 03.09.2013 - 05.09.2013; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2013), ISBN: 978-1-4673-5733-3, 212 - 215 doi:10.1109/SISPAD.2013.6650612. BibTeX |
| 1406. | V. Sverdlov, H. Mahmoudi, A. Makarov, D. Osintsev, J. Weinbub, T. Windbacher, S. Selberherr: "Modeling Spin-Based Devices in Silicon"; Talk: International Workshop on Computational Electronics (IWCE), Nara, Japan; (invited) 04.06.2013 - 07.06.2013; in "Book of Abstracts of the International Workshop on Computational Electronics (IWCE)", (2013), ISBN: 978-3-901578-26-7, 70 - 71. BibTeX |
| 1405. | L. Filipovic, S. Selberherr, G. Mutinati, E. Brunet, S. Steinhauer, A. Köck, J. Teva, J. Kraft, J. Siegert, F. Schrank: "Modeling Spray Pyrolysis Deposition"; Talk: World Congress on Engineering (WCE), London, UK; 03.07.2013 - 05.07.2013; in "Proceedings of the World Congress on Engineering (WCE) Vol II", (2013), ISBN: 978-988-19252-8-2, 987 - 992. BibTeX |
| 1404. | Z. Stanojevic, H. Kosina: "Modeling Surface-Roughness-Induced Scattering in Non-Planar Silicon Nanostructures"; Talk: Silicon Nanoelectronics Workshop, Kyoto, Japan; 09.06.2013 - 10.06.2013; in "The 2013 Silicon Nanoelectronics Workshop (SNW)", (2013), 93 - 94. BibTeX |
| 1403. | M. Molnar, V. Palankovski, D. Donoval, J. Kuzmik, J. Kovac, A. Chvala, J. Marek, P. Pribytny, S. Selberherr: "Modeling and Characterization of InAlN/GaN HEMTs at Elevated Temperatures"; Talk: International Conference on Advances in Electronic and Photonic Technologies, High Tatras, Spa Novy Smokovec, Slovakia; 02.06.2013 - 05.06.2013; in "Proceedings of ADEPT International Conference on Advances in Electronic and Photonic Technologies", (2013), ISBN: 978-80-554-0689-3, 48 - 51. BibTeX |
| 1402. | O. Baumgartner, Z. Stanojevic, H. Kosina: "Modeling of the Effects of Band Structure and Transport in Quantum Cascade Detectors"; Talk: International Workshop on Computational Electronics (IWCE), Nara, Japan; 04.06.2013 - 07.06.2013; in "Book of Abstracts of the International Workshop on Computational Electronics (IWCE)", (2013), ISBN: 978-3-901578-26-7, 86 - 87. BibTeX |
| 1401. | L. Filipovic, S. Selberherr, G. Mutinati, E. Brunet, S. Steinhauer, A. Köck, J. Teva, J. Kraft, J. Siegert, F. Schrank, C. Gspan, W. Grogger: "Modeling the Growth of Thin SnO2 Films using Spray Pyrolysis Deposition"; Poster: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Glasgow, Scotland, United Kingdom; 03.09.2013 - 05.09.2013; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2013), ISBN: 978-1-4673-5733-3, 208 - 211 doi:10.1109/SISPAD.2013.6650611. BibTeX |
| 1400. | B. Schwarz, P. Reininger, W. Schrenk, H. Detz, O. Baumgartner, T. Zederbauer, A. M. Andrews, H. Kosina, G. Strasser: "Monolithically integrated quantum cascade laser and detector"; Talk: CLEO Europe 2013, München, Deutschland; 12.05.2013 - 16.05.2013; . BibTeX |
| 1399. | S. Wolf, N. Neophytou, Z. Stanojevic: "Monte Carlo Simulations Of Thermal Conductivity Nanoporous Si Membranes"; Talk: European Conference on Thermoelectrics (ECT), Noordwijk, The Netherlands; 18.11.2013 - 20.11.2013; in "Book of Abstracts", (2013), 1 - 4. BibTeX |
| 1398. | W. Gös, M. Toledano-Luque, F. Schanovsky, M. Bina, O. Baumgartner, B. Kaczer, T. Grasser: "Multi-Phonon Processes as the Origin of Reliability Issues"; Talk: Meeting of the Electrochemical Society (ECS), San Francisco, USA; (invited) 27.10.2013 - 01.11.2013; in "ECS Transactions 2013 - "Semiconductors, Dielectrics, and Materials for Nanoelectronics 11"", (2013), 58/7/, 31 - 47 doi:10.1149/05807.0031ecst. BibTeX |
| 1397. | T. Windbacher, A. Makarov, H. Mahmoudi, V. Sverdlov, S. Selberherr: "Novel Bias-Field-Free Large Gain Spin-Transfer Oscillator"; Talk: Annual Conference on Magnetism and Magnetic Materials, Denver, USA; 04.11.2013 - 08.11.2013; in "Abstract Book of 58th Annual Conference of Magnetism and Magnetic Materials (MMM)", (2013), 456 - 457. BibTeX |
| 1396. | T. Windbacher, H. Mahmoudi, V. Sverdlov, S. Selberherr: "Novel MTJ-Based Shift Register for Non-Volatile Logic Applications"; Talk: 2013 IEEE/ACM International Symposium on Nanoscale Architectures (NANOARCH), New York City, USA; 15.07.2013 - 17.07.2013; in "Proceedings of the 2013 IEEE/ACM International Symposium on Nanoscale Architectures", (2013), 36 - 37 doi:10.1109/NanoArch.2013.6623038. BibTeX |
| 1395. | T. Windbacher, H. Mahmoudi, V. Sverdlov, S. Selberherr: "Novel Non-Volatile Magnetic Flip Flop"; Poster: International Conference on Spintronics and Quantum Information Technology (SPINTECH), Chicago Illinois USA; 29.07.2013 - 02.08.2013; in "In Proceedings of Seventh International School on Spintronics and Quantum Information Technology", (2013), 1 page(s) . BibTeX |
| 1394. | K. Rupp, B. Smith: "On Level Scheduling for Incomplete LU Factorization Preconditioners on Accelerators"; Talk: International Congress on Computational Engineering and Sciences (FEMTEC), Las Vegas, USA; 19.05.2013 - 24.05.2013; in "Abstracts 4th International Congress on Computational Engineering and Sciences", (2013), 1. BibTeX |
| 1393. | B. Schwarz, P. Reininger, D. Ristanic, O. Baumgartner, H. Detz, T. Zederbauer, D. MacFarland, A. M. Andrews, W. Schrenk, H. Kosina, G. Strasser: "On-Chip mid-infrared light generation and detection"; Talk: ITQW, New York, USA; (invited) 15.09.2013 - 20.09.2013; . BibTeX |
| 1392. | Yu. Illarionov, M. I. Vexler, V. V. Fedorov, S. M. Suturin, D. V. Isakov, I. Grekhov: "Optical characterization of the injection properties of MIS structures with thin CaF2 and HfO2/SiO2 insulating layers on Silicon"; Poster: XI Russian Conference on Semiconductor Physics, St-Petersburg, Russia; 16.09.2013 - 20.09.2013; in "Abstracts of XI Russian Conference on Semiconductor Physics", (2013), ISBN: 978-5-93634-033-3, 229. BibTeX |
| 1391. | H. Mahmoudi, T. Windbacher, V. Sverdlov, S. Selberherr: "Optimization of Spin-Transfer Torque Magnetic Tunnel Junction-Based Logic Gates"; Poster: International Workshop on Computational Electronics (IWCE), Nara, Japan; 04.06.2013 - 07.06.2013; in "Book of Abstracts of the International Workshop on Computational Electronics (IWCE)", (2013), ISBN: 978-3-901578-26-7, 244 - 245. BibTeX |
| 1390. | D. Narducci, B. Lorenzi, R. Tonini, S. Frabboni, G. Gazzadi, G. Ottaviani, N. Neophytou, X. Zianni: "Paradoxical Enhancement of the Power Factor in Polycrystalline Silicon Due to the Formation of Nanovoids"; Talk: European Conference on Thermoelectrics (ECT), Noordwijk, The Netherlands; 18.11.2013 - 20.11.2013; in "Book of Abstracts", (2013), 52. BibTeX |
| 1389. | H. Mahmoudi, T. Windbacher, V. Sverdlov, S. Selberherr: "Performance Analysis and Comparison of Two 1T/1MTJ-based Logic Gates"; Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Glasgow, Scotland, United Kingdom; 03.09.2013 - 05.09.2013; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2013), ISBN: 978-1-4673-5733-3, 163 - 166 doi:10.1109/SISPAD.2013.6650600. BibTeX |
| 1388. | M. Moradinasab, M. Pourfath, O. Baumgartner, H. Kosina: "Performance Optimization and Instability Study in Ring Cavity Quantum Cascade Lasers"; Poster: The 12th International Conference on Intersubband Transitions in Quantum Wells (ITQW), New York, USA; 15.09.2013 - 20.09.2013; . BibTeX |
| 1387. | K. Rupp, Ph. Tillet: "Performance-portable kernels in OpenCL: Lessons learned"; Talk: BLIS Retreat, Austin, USA; (invited) 05.09.2013 - 06.09.2013; . BibTeX |
| 1386. | R. Orio, S. Selberherr: "Physically Based Models of Electromigration"; Talk: Conference on Electron Devices and Solid-State Circuits (EDSSC), Hong Kong; (invited) 03.06.2013 - 05.06.2013; in "Proceedings of the International Conference on Electron Devices and Solid-State Circuits (EDSSC)", (2013), 290, 1 - 2. BibTeX |
| 1385. | S. Amoroso, L. Gerrer, A. Asenov, J. M. Sellier, I. Dimov, M. Nedjalkov, S. Selberherr: "Quantum Insights in Gate Oxide Charge-Trapping Dynamics in Nanoscale MOSFETs"; Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Glasgow, Scotland, United Kingdom; 03.09.2013 - 05.09.2013; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2013), ISBN: 978-1-4673-5733-3, 25 - 28 doi:10.1109/SISPAD.2013.6650565. BibTeX |
| 1384. | T. Grasser, K. Rott, H. Reisinger, M. Waltl, F. Schanovsky, W. Gös, B. Kaczer: "Recent Advances in Understanding Oxide Traps in pMOS Transistors"; Talk: International Workshop on Dielectric Thin Films For Future Electron Devices: Science and Technology, Tokyo, Japan; (invited) 07.11.2013 - 09.11.2013; in "Proceedings of 2013 IWDTF", (2013), ISBN: 978-4-86348-383-5, 95 - 96. BibTeX |
| 1383. | D. Osintsev, V. Sverdlov, S. Selberherr: "Reduction of Momentum and Spin Relaxation Rate in Strained Thin Silicon Films"; Talk: European Solid-State Device Research Conference (ESSDERC), Bucharest, Romania; 16.09.2013 - 20.09.2013; in "Proceedings of the European Solid-State Device Research Conference (ESSDERC)", (2013), ISBN: 978-1-4799-0649-9, 334 - 337 doi:10.1109/ESSDERC.2013.6818886. BibTeX |
| 1382. | J. Franco, B. Kaczer, M. Toledano-Luque, Ph. J. Roussel, G. Groeseneken, B. Schwarz, M. Bina, M. Waltl, P.-J. Wagner, T. Grasser: "Reduction of the BTI Time-Dependent Variability in Nanoscaled MOSFETs by Body Bias"; Talk: International Reliability Physics Symposium (IRPS), Monterey, CA, USA; 14.04.2013 - 18.04.2013; in "Proceedings of the International Reliability Physics Symposium (IRPS)", (2013), 1 - 6. BibTeX |
| 1381. | D. Osintsev, V. Sverdlov, S. Selberherr: "Reduction of the Surface Roughness Induced Spin Relaxation in SOI Structures: An Analytical Approach"; Talk: Workshop of the Thematic Network on Silicon on Insulator Technology, Devices, and Circuits (EUROSOI), Paris, France; 21.01.2013 - 23.01.2013; in "Conference Proceedings of the Ninth Workshop of the Thematic Network on Silicon on Insulator Technology, Devices and Circuits", (2013), 46, 1 page(s) . BibTeX |
| 1380. | J. Franco, B. Kaczer, P. Roussel, M. Toledano-Luque, P. Weckx, T. Grasser: "Relevance of non-exponential single-defect-induced threshold voltage shifts for NBTI Variability"; Talk: IEEE International Reliability Workshop (IIRW), South Lake Tahoe, USA; 13.10.2013 - 17.10.2013; in "Final Report of the IEEE International Integrated Reliability Workshop (IIRW)", (2013), ISBN: 978-1-4799-0350-4, 69 - 72. BibTeX |
| 1379. | B. Kaczer, C. Chen, J. Watt, K. Chanda, P. Weckx, M. Toledano-Luque, G. Groeseneken, T. Grasser: "Reliability and Performance Considerations for NMOSFET Pass Gates in FPGA Applications"; Talk: IEEE International Reliability Workshop (IIRW), South Lake Tahoe, USA; 13.10.2013 - 17.10.2013; in "Final Report of the IEEE International Integrated Reliability Workshop (IIRW)", (2013), ISBN: 978-1-4799-0350-4, 94 - 97. BibTeX |
| 1378. | J. Weinbub: "Research Software Engineering"; Talk: SPOMECH Autumn School, Ostrava, Czech Republic; (invited) 11.11.2013 - 15.11.2013; . BibTeX |
| 1377. | T. Windbacher, H. Mahmoudi, V. Sverdlov, S. Selberherr: "Rigorous Simulation Study of a Novel Non-Volatile Magnetic Flip-Flop"; Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Glasgow, Scotland, United Kingdom; 03.09.2013 - 05.09.2013; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2013), ISBN: 978-1-4673-5733-3, 368 - 371 doi:10.1109/SISPAD.2013.6650651. BibTeX |
| 1376. | H. Mahmoudi, T. Windbacher, V. Sverdlov, S. Selberherr: "STT-MRAM-Based Reprogrammable Logic Gates for Large-Scale Non-Volatile Logic Integration"; Poster: International Conference on Nanoscale Magnetism (ICNM), Istanbul, Turkey; 02.09.2013 - 06.09.2013; in "Proceedings of the International Conference on Nanoscale Magnetism", (2013), 208. BibTeX |
| 1375. | H. Mahmoudi, T. Windbacher, V. Sverdlov, S. Selberherr: "STT-MTJ-Based Implication Logic Circuits for Non-Volatile Logic-in-Memory Applications"; Talk: Symposium on CMOS Emerging Technologies, Whistler, BC, Canada; (invited) 17.07.2013 - 19.07.2013; in "Book of Abstracts of the 2013 Symposium on CMOS Emerging Technologies (CMOS ET 2013)", (2013), ISBN: 978-1-927500-38-5, 1 page(s) . BibTeX |
| 1374. | B. Schwarz, P. Reininger, H. Detz, T. Zederbauer, A. M. Andrews, W. Schrenk, O. Baumgartner, H. Kosina, G. Strasser: "Same-Frequency Detector and Laser Utilizing Bi-Functional Quantum Cascade Active Regions"; Talk: SPIE Photonics West, San Francisco, CA, USA; 02.02.2013 - 07.02.2013; . BibTeX |
| 1373. | D. Osintsev, V. Sverdlov, S. Selberherr: "Shear Strain: An Efficient Spin Lifetime Booster in Advanced UTB2 SOI MOSFETs"; Talk: International Workshop "Functional Nanomaterials and Devices", Kyiv, Ukraine; 08.04.2013 - 11.04.2013; in "Proceedings of the 7th International Workshop "Functional Nanomaterials and Devices"", (2013), ISBN: 978-966-02-6779-4, 64 - 65. BibTeX |
| 1372. | V. Sverdlov, S. Selberherr: "Silicon Spintronics and its Applications"; Talk: International Workshop "Functional Nanomaterials and Devices", Kyiv, Ukraine; (invited) 08.04.2013 - 11.04.2013; in "Proceedings of the 7th International Workshop "Functional Nanomaterials and Devices"", (2013), ISBN: 978-966-02-6779-4, 51 - 52. BibTeX |
| 1371. | A. Makarov, V. Sverdlov, D. Osintsev, S. Selberherr: "Simulation of Magnetic Oscillations in a System of two MTJs with a Shared Free Layer"; Poster: Soft Magnetic Materials Conference (SMM), Budapest, Hungary; 01.09.2013 - 04.09.2013; in "Abstracts Book of The 21st International Conference on Soft Magnetic Materials", (2013), 101. BibTeX |
| 1370. | M. Moradinasab, M. Pourfath, H. Kosina: "Spin Filtering in Zigzag Graphene Nanoribbons Using 7-5 Defects"; Poster: Graphene Week, Chemnitz, Germany; 02.06.2013 - 07.06.2013; in "Book of Abstracts", (2013), 250. BibTeX |
| 1369. | J. Ghosh, T. Windbacher, V. Sverdlov, S. Selberherr: "Spin Injection and Diffusion in Silicon Based Devices from a Space Charge Layer"; Talk: Annual Conference on Magnetism and Magnetic Materials, Denver, USA; 04.11.2013 - 08.11.2013; in "Abstract Book of 58th Annual Conference of Magnetism and Magnetic Materials (MMM)", (2013), 713 - 714. BibTeX |
| 1368. | D. Osintsev, V. Sverdlov, S. Selberherr: "Spin Lifetime Enhancement by Shear Strain in Thin Silicon-On-Insulator Films"; Talk: Meeting of the Electrochemical Society, Advanced Semiconduc-tor-on-Insulator Technology and Related Physics, Toronto, Canada; 12.05.2013 - 16.05.2013; in "223th ECS Meeting", (2013), 894, ISBN: 978-1-56677-866-4, 1. BibTeX |
| 1367. | D. Osintsev, V. Sverdlov, S. Selberherr: "Spin Lifetime Enhancement in Strained Thin Silicon Films"; Talk: International Symposium on Advanced Nanostructures and Nano-Devices (ISANN), Kauai, Hawaii, USA; 08.12.2013 - 13.12.2013; in "Abstracts International Symposium on Advanced Nanodevices and Nanotechnology (ISANN)", (2013), 2 page(s) . BibTeX |
| 1366. | P. Schwaha, M. Nedjalkov, S. Selberherr, I. Dimov, R. Georgieva: "Stochastic Alternative to Newton's Acceleration"; Talk: International Conference on Large-Scale Scientific Computations (LSSC), Sozopol, Bulgaria; 03.06.2013 - 07.06.2013; in "Abstracts International Conference on Large-Scale Scientific Computations (LSSC)", (2013), 77 - 78. BibTeX |
| 1365. | A. P. Singulani, H. Ceric, S. Selberherr: "Stress Estimation in Open Tungsten TSV"; Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Glasgow, Scotland, United Kingdom; 03.09.2013 - 05.09.2013; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2013), ISBN: 978-1-4673-5733-3, 65 - 68 doi:10.1109/SISPAD.2013.6650575. BibTeX |
| 1364. | A. P. Singulani, H. Ceric, S. Selberherr: "Stress Evolution in the Metal Layers of TSVs with Bosch Scallops"; Poster: European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), Arcachon, France; 30.09.2013 - 04.10.2013; . BibTeX |
| 1363. | A. P. Singulani, H. Ceric, E. Langer: "Stress Evolution on Tungsten Thin-Film of an Open Through Silicon Via Technology"; Poster: IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), Suzhou, China; 15.07.2013 - 19.07.2013; in "Proceedings of the 20th International Symposium on the Physical & Failure Analysis of Integrated Circuits", (2013), ISBN: 978-1-4799-0478-5, 216 - 220 doi:10.1109/IPFA.2013.6599155. BibTeX |
| 1362. | A. P. Singulani, H. Ceric, E. Langer: "Stress reduction induced by Bosch scallops on an open TSV technology"; Poster: IEEE International Interconnect Technology Conference (IITC), Kyoto, Japan; 13.06.2013 - 15.06.2013; in "Proceedings of the International Interconnect Techonology Conference (IITC)", (2013), ISBN: 978-1-4799-0438-9, 1 - 2 doi:10.1109/IITC.2013.6615578. BibTeX |
| 1361. | A. Makarov, V. Sverdlov, S. Selberherr: "Structural Optimization of MTJs with a Composite Free Layer"; Talk: SPIE Spintronics, San Diego, CA, USA; (invited) 25.08.2013 - 29.08.2013; in "Proceedings of SPIE Spintronics", (2013), OP108-86. BibTeX |
| 1360. | A. Makarov, V. Sverdlov, S. Selberherr: "Structural Optimization of MTJs with a Composite Free Layer"; Talk: International Workshop on Computational Electronics (IWCE), Nara, Japan; 04.06.2013 - 07.06.2013; in "Book of Abstracts of the International Workshop on Computational Electronics (IWCE)", (2013), ISBN: 978-3-901578-26-7, 74 - 75. BibTeX |
| 1359. | Z. Stanojevic, H. Kosina: "Surface-Roughness-Scattering in Non-Planar Channels - the Role of Band Anisotropy"; Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Glasgow, Scotland, United Kingdom; 03.09.2013 - 05.09.2013; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2013), ISBN: 978-1-4673-5733-3, 352 - 355 doi:10.1109/SISPAD.2013.6650647. BibTeX |
| 1358. | T. Windbacher, O. Triebl, D. Osintsev, A. Makarov, V. Sverdlov, S. Selberherr: "Switching Optimization of an Electrically Read- and Writable Magnetic Logic Gate"; Talk: International Workshop on Computational Electronics (IWCE), Nara, Japan; 04.06.2013 - 07.06.2013; in "Book of Abstracts of the International Workshop on Computational Electronics (IWCE)", (2013), ISBN: 978-3-901578-26-7, 238 - 239. BibTeX |
| 1357. | J. M. Sellier, M. Nedjalkov, I. Dimov, S. Selberherr: "The Role of Annihilation in a Wigner Monte Carlo Approach"; Talk: International Conference on Large-Scale Scientific Computations (LSSC), Sozopol, Bulgaria; 03.06.2013 - 07.06.2013; in "Abstracts International Conference on Large-Scale Scientific Computations (LSSC)", (2013), 78. BibTeX |
| 1356. | P. Schwaha, J. M. Sellier, M. Nedjalkov, I. Dimov, S. Selberherr: "The Ultimate Equivalence Between Coherent Quantum and Classical Regimes"; Poster: International Workshop on Computational Electronics (IWCE), Nara, Japan; 04.06.2013 - 07.06.2013; in "Book of Abstracts of the International Workshop on Computational Electronics (IWCE)", (2013), ISBN: 978-3-901578-26-7, 152 - 153. BibTeX |
| 1355. | H. Karamitaheri, N. Neophytou, H. Kosina: "Thermal Conductivity of Si Nanowires Using Atomistic Phonon Dispersions"; Talk: International Workshop on Computational Electronics (IWCE), Nara, Japan; 04.06.2013 - 07.06.2013; in "Book of Abstracts of the International Workshop on Computational Electronics (IWCE)", (2013), ISBN: 978-3-901578-26-7, 98 - 99. BibTeX |
| 1354. | H. Karamitaheri, N. Neophytou, H. Kosina: "Thermal Conductivity of Si Nanowires and Ultra Thin-Layers Using Atomistic Phonon Dispersions"; Talk: The 32nd International Conference on Thermoelectrics, Kobe, Japan; 30.06.2013 - 04.07.2013; in "Book of Abstracts", (2013), 1 page(s) . BibTeX |
| 1353. | N. Neophytou, H. Kosina: "Thermoelectric Power Factor Engineering of Low-Dimensional and Nanocomposite Si Nanostructures"; Talk: APS March Meeting, Baltimore, Maryland, USA; 18.03.2013 - 22.03.2013; in "Bulletin American Physical Society (APS March Meeting)", (2013), 1 page(s) . BibTeX |
| 1352. | B. Schwarz, P. Reininger, O. Baumgartner, T. Zederbauer, H. Detz, A. M. Andrews, W. Schrenk, H. Kosina, G. Strasser: "Towards Mid-Infrared On-Chip Sensing utilizing a bi-functional Quantum Cascade Laser/Detector"; Talk: Conference on Electronic Properties of Two-Dimensional Systems / Modulated Semiconductor Structures (EP2Ds-MSS), Wroclaw, Polen; 01.07.2013 - 05.07.2013; . BibTeX |
| 1351. | Ph. Tillet, K. Rupp, S. Selberherr, C. Lin: "Towards Performance-Portable, Scalable, and Convenient Linear Algebra"; Talk: USENIX Workshop on Hot Topics in Parallelism, San Jose, CA, USA; 24.06.2013 - 25.06.2013; in "Proceedings of 5th USENIX Workshop on Hot Topics in Parallelism", (2013), 1 - 8. BibTeX |
| 1350. | P. Reininger, B. Schwarz, A. Wirthmüller, A. Harrer, O. Baumgartner, H. Detz, T. Zederbauer, D. MacFarland, A. M. Andrews, W. Schrenk, L. Hvozdara, H. Kosina, G. Strasser: "Towards higher temperature operation of quantum cascade detectors"; Talk: ITQW, New York, USA; 15.09.2013 - 20.09.2013; . BibTeX |
| 1349. | G.G. Kareva, M. I. Vexler, Yu. Illarionov: "Transformation of a Metal-Insulator-Silicon Structure into a Resonant-Tunneling Diode"; Poster: International Conference on Insulating Films on Semiconductors (INFOS), Cracow, Poland; 25.06.2013 - 28.06.2013; in "Book of Abstracts", (2013), ISBN: 978-83-7814-115-0, 246 - 247. BibTeX |
| 1348. | A. Makarov, V. Sverdlov, S. Selberherr: "Transverse Domain Wall Formation in a Free Layer: A Mechanism for Switching Failure in a MTJ-based STT-MRAM"; Talk: IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), Suzhou, China; 15.07.2013 - 19.07.2013; in "Proceedings of the 20th International Symposium on the Physical & Failure Analysis of Integrated Circuits", (2013), ISBN: 978-1-4799-0478-5, 267 - 270 doi:10.1109/IPFA.2013.6599165. BibTeX |
| 1347. | M. I. Vexler, Yu. Illarionov, S. M. Suturin, V. V. Fedorov, N. S. Sokolov: "Tunnel charge transport in Au/CaF2/Si(111) system"; Talk: XI Russian Conference on Semiconductor Physics, St-Petersburg, Russia; 16.09.2013 - 20.09.2013; in "Abstracts of XI Russian Conference on Semiconductor Physics", (2013), ISBN: 978-5-93634-033-3, 74. BibTeX |
| 1346. | S. E. Tyaginov, D. Osintsev, Yu. Illarionov, J.M. Park, H. Enichlmair, M. I. Vexler, T. Grasser: "Tunnelling of strongly non-equilibrium carriers in the transistors of traditional configuration"; Poster: XI Russian Conference on Semiconductor Physics, St-Petersburg, Russia; 16.09.2013 - 20.09.2013; in "Abstracts of XI Russian Conference on Semiconductor Physics", (2013), ISBN: 978-5-93634-033-3, 441. BibTeX |
| 1345. | J. M. Sellier, M. Nedjalkov, I. Dimov, S. Selberherr: "Two-dimensional Transient Wigner Particle Model"; Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Glasgow, Scotland, United Kingdom; 03.09.2013 - 05.09.2013; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2013), ISBN: 978-1-4673-5733-3, 404 - 407 doi:10.1109/SISPAD.2013.6650660. BibTeX |
| 1344. | W. Gös, M. Toledano-Luque, O. Baumgartner, M. Bina, F. Schanovsky, B. Kaczer, T. Grasser: "Understanding Correlated Drain and Gate Current Fluctuations"; Talk: European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), Arcachon, France; (invited) 30.09.2013 - 04.10.2013; in "20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)", (2013), 51 - 56. BibTeX |
| 1343. | W. Gös, M. Toledano-Luque, O. Baumgartner, M. Bina, F. Schanovsky, B. Kaczer, T. Grasser: "Understanding Correlated Drain and Gate Current Fluctuations"; Talk: IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), Suzhou, China; 15.07.2013 - 19.07.2013; in "Proceedings of the 20th International Symposium on the Physical & Failure Analysis of Integrated Circuits", (2013), ISBN: 978-1-4799-0478-5, 51 - 56. BibTeX |
| 1342. | J. Franco, B. Kaczer, Ph. J. Roussel, J. Mitard, S. Sioncke, L. Witters, H. Mertens, T. Grasser, G. Groeseneken: "Understanding the Suppressed Charge Trapping in Relaxed- and Strained Ge/SiO2/HfO2 pMOSFETs and Implications for the Screening of Alternative High-Mobility Substrate/Dielectric CMOS Gate Stacks"; Talk: IEEE International Electron Devices Meeting (IEDM), Washington, DC, USA; 09.12.2013 - 11.12.2013; in "Proceedings of the IEEE International Electron Devices Meeting (IEDM)", (2013), 397 - 400 doi:10.1109/IEDM.2013.6724634. BibTeX |
| 1341. | D. Osintsev, A. Makarov, V. Sverdlov, S. Selberherr: "Using Strain to Increase the Reliability of Scaled Spin MOSFETs"; Poster: IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), Suzhou, China; 15.07.2013 - 19.07.2013; in "Proceedings of the 20th International Symposium on the Physical & Failure Analysis of Integrated Circuits", (2013), ISBN: 978-1-4799-0478-5, 770 - 773 doi:10.1109/IPFA.2013.6599272. BibTeX |
| 1340. | Z. Stanojevic, O. Baumgartner, K. Schnass, M. Karner, H. Kosina: "VSP - a Quantum Simulator for Engineering Applications"; Talk: International Workshop on Computational Electronics (IWCE), Nara, Japan; 04.06.2013 - 07.06.2013; in "Book of Abstracts of the International Workshop on Computational Electronics (IWCE)", (2013), ISBN: 978-3-901578-26-7, 132 - 133. BibTeX |
| 1339. | K. Rupp, Ph. Tillet, F. Rudolf, J. Weinbub: "ViennaCL - Portable High Performance at High Convenience"; Talk: The European Conference on Numerical Mathematics and Advanced Applications (ENUMATH), Lausanne, Switzerland; (invited) 26.08.2013 - 30.08.2013; in "ENUMATH 2013 Proceedings", (2013), 1 - 2. BibTeX |
| 1338. | K. Rupp: "ViennaCL: GPU-accelerated Linear Algebra at the Convenience of the C++ Boost Libraries"; Talk: SIAM Conference on Computational Science and Engineering, Boston, USA; 25.02.2013 - 01.03.2013; . BibTeX |
| 1337. | F. Rudolf, K. Rupp, S. Selberherr: "ViennaMesh - a Highly Flexible Meshing Framework"; Talk: International Congress on Computational Engineering and Sciences (FEMTEC), Las Vegas, USA; 20.05.2013 - 25.05.2013; in "Abstracts 4th International Congress on Computational Engineering and Sciences", (2013), 1 page(s) . BibTeX |
| 1336. | M. Wagner, K. Rupp, J. Weinbub: "A Comparison of Algebraic Multigrid Preconditioners using Graphics Processing Units and Multi-Core Central Processing Units"; Talk: High Performance Computing Symposium (HPC), Orlando, FL, USA; 26.03.2012 - 29.03.2012; in "Proceedings of the High Performance Computing Symposium (HPC)", (2012), ISBN: 978-1-61839-788-1, 7 page(s) doi:10.5555/2338816.2338818. BibTeX |
| 1335. | J. Weinbub, K. Rupp, S. Selberherr: "A Flexible Execution Framework for High-Performance TCAD Applications"; Poster: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Denver, CO, USA; 05.09.2012 - 07.09.2012; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2012), ISBN: 978-0-615-71756-2, 400 - 403. BibTeX |
| 1334. | J. Weinbub, K. Rupp, S. Selberherr: "A Generic Multi-Dimensional Run-Time Data Structure for High-Performance Scientific Computing"; Talk: World Congress on Engineering (WCE), London, UK; 04.07.2012 - 06.07.2012; in "Proceedings of the World Congress on Engineering (WCE)", (2012), ISBN: 978-988-19252-1-3, 1076 - 1081. BibTeX |
| 1333. | J. Weinbub: "A Lightweight Task Graph Scheduler for Distributed High-Performance Scientific Computing"; Talk: Workshop on the State-of-the-Art in Scientific and Parallel Computing (PARA), Helsinki, Finland; 10.06.2012 - 13.06.2012; in "Proceedings of the International Workshop on the State-of-the-Art in Scientific and Parallel Computing", (2012), 1 page(s) . BibTeX |
| 1332. | V. Palankovski, J. Kuzmik: "A Promising New n++-GaN/InAlN/GaN HEMT Concept for High-Frequency Applications"; Talk: Honolulu PRiME 2012, Honolulu, USA; 07.10.2012 - 12.10.2012; in "ECS Meeting Abstracts", (2012), MA2012-02, 1 page(s) . BibTeX |
| 1331. | H. Mahmoudi, V. Sverdlov, S. Selberherr: "A Robust and Efficient MTJ-based Spintronic IMP Gate for New Logic Circuits and Large-Scale Integration"; Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Denver, CO, USA; 05.09.2012 - 07.09.2012; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2012), ISBN: 978-0-615-71756-2, 225 - 228. BibTeX |
| 1330. | A. Semenov, A. I. Dedyk, P. Y. Belavsky, Yu. V. Pavlova, S. Karmanenko, O. Pakhomov, A. Starkov, I. Starkov: "A Study of Ferroelectric Multilayer Structures Based on BST Films Containing High Concentration of Magnetic Ions"; Poster: Workshop on Dielectrics in Microelectronics (WODIM), Dresden, Germany; 25.06.2012 - 27.06.2012; in "Abstract Booklet", (2012), 77. BibTeX |
| 1329. | H. Nematian, M. Moradinasab, M. Noei, M. Pourfath, M. Fathipour, H. Kosina: "A Theoretical Study of BN-Confined Graphene Nanoribbon Based Resonant Tunneling Diodes"; Poster: International Workshop on Computational Electronics (IWCE), Madison, WI, USA; 22.05.2012 - 25.05.2012; in "Book of Abstracts of the International Workshop on Computational Electronics (IWCE)", (2012), 217 - 218. BibTeX |
| 1328. | B. Schwarz, P. Reininger, O. Baumgartner, Z. Stanojevic, H. Kosina, G. Strasser: "A mid-infrared dual wavelenght quantum cascade structure designed for both emission and detection"; Poster: International Conference on Physics of Semiconductor (ICPS), Zürich, Schweiz; 29.07.2012 - 03.08.2012; . BibTeX |
| 1327. | Z. Stanojevic, O. Baumgartner, H. Kosina: "A stable discretization method for "Dirac-like" effective Hamiltonians"; Poster: International Quantum Cascade Lasers School & Workshop 2012 (IQCLSW 2012), Baden near Vienna, Austria; 02.09.2012 - 06.09.2012; in "Proc. International Quantum Cascade Lasers School & Workshop", (2012), 127. BibTeX |
| 1326. | H. Ceric, R. Orio, W. H. Zisser, S. Selberherr: "Ab Initio Method for Electromigration Analysis"; Talk: IEEE Electronics Packaging Technology Conference (EPTC), Singapore; 02.07.2012 - 06.07.2012; in "Proceedings of the 19th IEEE International Symposium on the Physical & Failure Analysis of Integrated Circuits", (2012), ISBN: 978-1-4673-0982-0, 4 page(s) doi:10.1109/IPFA.2012.6306306. BibTeX |
| 1325. | A. Starkov, O. Pakhomov, I. Starkov: "Account for Mutual Influence of Electrical, Elastic and Thermal Phenomena for Ferroelectric Domain Wall Modeling"; Poster: 11th International Symposium on Ferroic Domains and Micro- to Nanoscopic Structures (ISFD), Ekaterinburg, Russia; 20.08.2012 - 24.08.2012; in "Abstract Book", (2012), 238. BibTeX |
| 1324. | M. Waltl, P.-J. Wagner, H. Reisinger, K. Rott, T. Grasser: "Advanced Data Analysis Algorithms for the Time-Dependent Defect Spectroscopy of NBTI"; Talk: IEEE International Integrated Reliability Workshop, California; 14.10.2012 - 18.10.2012; in "IEEE International Integrated Reliability Workshop Final Report", (2012), 74 - 79. BibTeX |
| 1323. | T. Grasser: "Aging in CMOS Devices: From Microscopic Physics to Compact Models"; Talk: The 2012 Forum on Specification & Design Languages, Vienna, Austria; (invited) 18.09.2012 - 20.09.2012; . BibTeX |
| 1322. | Ph. Tillet, K. Rupp, S. Selberherr: "An Automatic OpenCL Compute Kernel Generator for Basic Linear Algebra Operations"; Talk: High Performance Computing Symposium (HPC), Orlando, FL, USA; 26.03.2012 - 29.03.2012; in "HPC '12 Proceedings of the 2012 Symposium on High Performance Computing", (2012), ISBN: 978-1-61839-788-1, 7 page(s) . BibTeX |
| 1321. | R. Orio, H. Ceric, S. Selberherr: "Analysis of Resistance Change Development due to Voiding in Copper Interconnects ended by a Through Silicon Via"; Talk: International Symposium on Microelectronics Technology and Devices (SBMicro), Brasilia, Brazil; 30.08.2012 - 02.09.2012; in "ECS Transactions", (2012), 1, ISBN: 978-1-56677-990-6, 273 - 280 doi:10.1149/04901.0273ecst. BibTeX |
| 1320. | I. Starkov, H. Enichlmair, S. E. Tyaginov, T. Grasser: "Analysis of the Threshold Voltage Turn-Around Effect in High-Voltage n-MOSFETs Due to Hot-Carrier Stress"; Poster: International Reliability Physics Symposium (IRPS), Californi, USA; 17.04.2012 - 19.04.2012; in "Proceedings of the International Reliability Physics Symposium (IRPS)", (2012), ISBN: 978-1-4577-1680-5, 6 page(s) . BibTeX |
| 1319. | N. Neophytou, H. Karamitaheri, H. Kosina: "Atomistic Design of Ultra-Narrow Silicon Nanowires for Improved Electronic and Thermoelectric Applications"; Talk: International Conference on Nanosciences and Nanotechnologies, Thessaloniki, Greece; 03.07.2012 - 06.07.2012; in "Abstract Book", (2012), 46. BibTeX |
| 1318. | H. Ceric, R. Orio, S. Selberherr: "Atomistic Method for Analysis of Electromigration"; Poster: IEEE International Interconnect Technology Conference (IITC), San Jose, USA; 04.06.2012 - 06.06.2012; in "Proceedings of the IEEE International Interconnect Technology Conference", (2012), ISBN: 978-1-4673-1137-3, 3 page(s) . BibTeX |
| 1317. | N. Neophytou, H. Kosina: "Atomistic Simulations of the Electronic Properties of Si and Ge Nanowires and Thin-Layers: Bandstructure Effects"; Talk: BIT's Annual World Congress of Nanoscience and Nanotechnology, Qingdao, China; (invited) 26.10.2012 - 28.10.2012; in "Abstracts of BIT's 2nd Annual World Congress of Nanoscience and Nanotechnology 2012", (2012), 488. BibTeX |
| 1316. | F. Schanovsky, T. Grasser: "Bias Temperature Instabilities in highly-scaled MOSFETs"; Talk: 2012 CMOS Emerging Technologies, Vancouver, BC Canada; (invited) 18.07.2012 - 21.07.2012; . BibTeX |
| 1315. | K. Rupp, C. Jungemann, M. Bina, A. Jüngel, T. Grasser: "Bipolar Spherical Harmonics Expansions of the Boltzmann Transport Equation"; Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Denver, CO, USA; 05.09.2012 - 07.09.2012; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2012), ISBN: 978-0-615-71756-2, 19 - 22. BibTeX |
| 1314. | H. Karamitaheri, N. Neophytou, H. Kosina: "Calculations of Confined Phonon Spectrum in Narrow Si Nanowires using the Valence Force Field Method"; Poster: The 31st International & 10th European Conference on Thermoelectrics, Aalborg, Denmark; 09.07.2012 - 12.07.2012; in "Book of Abstracts", (2012), 1 page(s) . BibTeX |
| 1313. | M. Molnar, G. Donnarumma, V. Palankovski, J. Kuzmik, D. Donoval, J. Kovac, S. Selberherr: "Characterization, Modeling and Simulation of In0.12Al0.88N/GaN HEMTs"; Talk: Applied Physics of Condensed Matter (APCOM), High Tatras, Slovakia; 20.06.2012 - 22.06.2012; in "Proceedings of the 18th International Conference in the Series of the Solid State Workshops", (2012), 190 - 194. BibTeX |
| 1312. | I. Starkov, H. Enichlmair, S. E. Tyaginov, T. Grasser: "Charge-Pumping Extraction Techniques for Hot-Carrier Induced Interface and Oxide Trap Spatial Distributions in MOSFETs"; Talk: IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), Singapore; 02.07.2012 - 06.07.2012; in "Proceedings of the 19th International Symposium on the Physical & Failure Analysis of Integrated Circuits", (2012), ISBN: 978-1-4673-0980-6, 1 - 6 doi:10.1109/IPFA.2012.6306266. BibTeX |
| 1311. | M. Toledano-Luque, B. Kaczer, E. Simoen, R. Degraeve, J. Franco, Ph. J. Roussel, T. Grasser, G. Groeseneken: "Correlation of Single Trapping and Detrapping Effects in Drain and Gate Currents of Nanoscaled nFETs and pFETs"; Poster: International Reliability Physics Symposium (IRPS), Californi, USA; 17.04.2012 - 19.04.2012; in "Proceedings of the International Reliability Physics Symposium (IRPS)", (2012), ISBN: 978-1-4577-1680-5, 6 page(s) . BibTeX |
| 1310. | V. Palankovski, J. Kuzmik: "Degradation Study of Single and Double-Heterojunction InAlN/GaN HEMTs by Two-Dimensional Simulation"; Talk: Honolulu PRiME 2012, Honolulu, USA; 07.10.2012 - 12.10.2012; in "ECS Meeting Abstracts", (2012), MA2012-02, 1 page(s) . BibTeX |
| 1309. | J. Weinbub: "Distributed High-Performance Parallel Mesh Generation with ViennaMesh"; Talk: Workshop on the State-of-the-Art in Scientific and Parallel Computing (PARA), Helsinki, Finland; 10.06.2012 - 13.06.2012; in "Proceedings of the International Workshop on the State-of-the-Art in Scientific and Parallel Computing", (2012), 1 page(s) . BibTeX |
| 1308. | A. Starkov, I. Starkov: "Domain-Wall Motion for Slowly Varying Electric Field"; Talk: 11th International Symposium on Ferroic Domains and Micro- to Nanoscopic Structures (ISFD), Ekaterinburg, Russia; 20.08.2012 - 24.08.2012; in "Abstract Book", (2012), 93. BibTeX |
| 1307. | B. Schwarz, P. Reininger, O. Baumgartner, Z. Stanojevic, H. Kosina, G. Strasser: "Dual wavelength quantum cascade structure that can act both as laser and detector"; Talk: MIRTHE-IROn-SensorCAT virtual conference 2012, Princeton; 26.06.2012 - 27.06.2012; . BibTeX |
| 1306. | B. Schwarz, P. Reininger, O. Baumgartner, Z. Stanojevic, H. Kosina, G. Strasser: "Dual-color quantum cascade structure for coherent emission and detection"; Poster: International Quantum Cascade Lasers School & Workshop 2012 (IQCLSW 2012), Baden; 02.09.2012 - 06.09.2012; . BibTeX |
| 1305. | M. Moradinasab, H. Nematian, M. Noei, M. Pourfath, M. Fathipour, H. Kosina: "Edge Roughness Effects on the Optical Properties of Zigzag Graphene Nanoribbons: A First Principles Study"; Poster: International Workshop on Computational Electronics (IWCE), Madison, WI, USA; 22.05.2012 - 25.05.2012; in "Book of Abstracts of the International Workshop on Computational Electronics (IWCE)", (2012), 249 - 250. BibTeX |
| 1304. | Z. Stanojevic, H. Kosina: "Efficient Numerical Analysis of Dielectric Cavities"; Talk: European Semiconductor Laser Workshop (ESLW), Brussels, Belgium; 21.09.2012 - 22.09.2012; . BibTeX |
| 1303. | L. Filipovic, S. Selberherr: "Electric Field Based Simulations of Local Oxidation Nanolithography using Atomic Force Microscopy in a Level Set Environment"; Talk: Intl. Symposium on Microelectronics Technology and Devices (SBMicro), Brasilia, Brazil; 30.08.2012 - 02.09.2012; in "ECS Transactions", (2012), 1, ISBN: 978-1-56677-990-6, 265 - 272 doi:10.1149/04901.0265ecst. BibTeX |
| 1302. | D. Osintsev, O. Baumgartner, Z. Stanojevic, V. Sverdlov, S. Selberherr: "Electric Field and Strain Effects on Surface Roughness Induced Spin Relaxation in Silicon Field-Effect Transistors"; Talk: 24th European Modeling and Simulation Symposium (EMSS2012), Vienna, Austria; 19.09.2012 - 21.09.2012; in "Proceedings of the 24th European Modeling and Simulation Symposium", (2012), ISBN: 978-88-97999-01-0, 156 - 162. BibTeX |
| 1301. | D. Osintsev, O. Baumgartner, Z. Stanojevic, V. Sverdlov, S. Selberherr: "Electric Field and Strain Effects on Surface Roughness Induced Spin Relaxation in Silicon Field-Effect Transistors"; Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Denver, CO, USA; 05.09.2012 - 07.09.2012; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2012), ISBN: 978-0-615-71756-2, 153 - 156. BibTeX |
| 1300. | R. Orio, H. Ceric, S. Selberherr: "Electromigration Failure in a Copper Dual-Damascene Structure with a Through Silicon Via"; Poster: 23rd European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis, Cagliari, Italy; 01.10.2012 - 05.10.2012; in "Proceedings of the 23rd European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis", (2012), 1981 - 1986. BibTeX |
| 1299. | M. Molnar, G. Donnarumma, V. Palankovski, J. Kuzmik, D. Donoval, J. Kovac, S. Selberherr: "Electrothermal Analysis of In0.12Al0.88N/GaN HEMTs"; Talk: International Conference on Advanced Semiconductor Devices and Microsystems (ASDAM), Smolenice, Slovakia; 11.11.2012 - 15.11.2012; in "Proceedings of the 9th International ASDAM", (2012), ISBN: 978-1-4673-1195-3, 55 - 58 doi:10.1109/ASDAM.2012.6418556. BibTeX |
| 1298. | A. Makarov, S. Selberherr, V. Sverdlov: "Emerging Non-Volatile Memories for Ultra-Low Power Applications"; Talk: Informationstagung Mikroelektronik (ME), Vienna, Austria; (invited) 23.04.2012 - 24.04.2012; in "Tagungsband zur Informationstagung Mikroelektronik 12", (2012), ISBN: 978-3-85133-071-7, 21 - 24. BibTeX |
| 1297. | H. Karamitaheri, N. Neophytou, M. Pourfath, H. Kosina: "Engineering the Thermoelectric Power Factor of Metallic Graphene Nanoribbons"; Talk: International Workshop on Computational Electronics (IWCE), Madison, WI, USA; 22.05.2012 - 25.05.2012; in "Book of Abstracts of the International Workshop on Computational Electronics (IWCE)", (2012), 77 - 78. BibTeX |
| 1296. | N. Neophytou, H. Karamitaheri, H. Kosina: "Engineering the Thermoelectric Power Factor of Si and Ge Ultra Narrow 1D Nanowires and 2D Thin Layers Using Atomistic Modeling"; Talk: The 31st International & 10th European Conference on Thermoelectrics, Aalborg, Denmark; 09.07.2012 - 12.07.2012; in "Book of Abstracts", (2012), 1 page(s) . BibTeX |
| 1295. | T. Aichinger, P. Lenahan, T. Grasser, G. Pobegen, M. Nelhiebel: "Evidence for Pb Center-Hydrogen Complexes after Subjecting PMOS Devices to NBTI Stress - a Combined DCIV/SDR Study"; Poster: International Reliability Physics Symposium (IRPS), Californi, USA; 17.04.2012 - 19.04.2012; in "Proceedings of the International Reliability Physics Symposium (IRPS)", (2012), ISBN: 978-1-4577-1680-5, 6 page(s) . BibTeX |
| 1294. | V. Sverdlov, A. Makarov, S. Selberherr: "Fast Switching in MTJs with a Composite Free Layer"; Talk: BIT's Annual World Congress of Nanoscience and Nanotechnology, Qingdao, China; 26.10.2012 - 28.10.2012; in "Abstracts of BIT's 2nd Annual World Congress of Nanoscience and Nanotechnology 2012", (2012), 291. BibTeX |
| 1293. | R. Orio, S. Selberherr: "Formation and Movement of Voids in Copper Interconnect Structures"; Talk: International Conference on Solid State and Integrated Circuit Technology (ICSICT), Xi'an, China; (invited) 29.10.2012 - 01.11.2012; in "Proceedings of the International Conference on Solid-State and Integrated Circuit Technology (ICSICT)", (2012), ISBN: 978-1-4673-2475-5, 378 - 381 doi:10.1109/ICSICT.2012.6467675. BibTeX |
| 1292. | T. Windbacher, D. Osintsev, A. Makarov, V. Sverdlov, S. Selberherr: "Fully Electrically Read- Write Magneto Logic Gates"; Talk: The 5th International Conference on Micro-Nanoelectronics, Nanotechnologies & MEMS, Crete, Greece; 07.10.2012 - 10.10.2012; in "Book of Abstracts", (2012), 1 page(s) . BibTeX |
| 1291. | M. Jurkovic, D. Gregusova, S. Hascik, M. Blaho, M. Molnar, V. Palankovski, D. Donoval, J. Carlin, N. Grandjean, J. Kuzmik: "GaN/InAlN/AlN/GaN Normally-Off HEMT with Etched Access Region"; Talk: Workshop on Compound Semiconductor Devices and Integrated Circuits (WOCSDICE), Porquerolles, France; 30.05.2012 - 01.06.2012; in "Proceedings of the 36th Workshop on Compound Semiconductor Devices and Integrated Circuits", (2012), 2 page(s) . BibTeX |
| 1290. | N. Neophytou, H. Kosina: "Gate Field Induced Bandstructure and Mobility Variations in p-type Silicon Nanowires"; Talk: Workshop of the Thematic Network on Silicon on Insulator Technology, Devices, and Circuits (EUROSOI), Montpellier, France; 23.01.2012 - 25.01.2012; in "Conference Proceedings of the VIII Workshop of the Thematic Network on Silicon-On-Insulator Technology, Devices and Circuits", (2012), 131 - 132. BibTeX |
| 1289. | A. Makarov, V. Sverdlov, S. Selberherr: "Geometry Dependence of the Switching Time in MTJs with a Composite Free Layer"; Talk: Workshop on Innovative Nanoscale Devices and Systems (WINDS), Kona; (invited) 02.12.2012 - 07.12.2012; in "Abstracts of the Workshop on Innovative Nanoscale Devices and Systems (WINDS)", (2012), ISBN: 978-3-901578-25-0, 21. BibTeX |
| 1288. | S. Selberherr: "Giving Silicon a Spin"; Talk: International Conference on Enabling Science and Nanotechnology, Johor Bahru, Malaysia; (invited) 05.01.2012 - 07.01.2012; in "Abstracts International Conference on Enabling Science and Nanotechnology (ESciNano 2012)", (2012), 1 page(s) . BibTeX |
| 1287. | A. Makarov, V. Sverdlov, S. Selberherr: "High Thermal Stability and Low Switching Energy Barrier in Spin-transfer Torque RAM with Composite Free Layer"; Poster: International Conference on Solid State Devices and Materials, Kyoto, Japan; 25.09.2012 - 27.09.2012; in "Extended Abstracts of 2012 International Conference on Solid State Devices and Materials", (2012), 2 page(s) . BibTeX |
| 1286. | K. Rupp, J. Weinbub, F. Rudolf: "Highly Productive Application Development with ViennaCL for Accelerators"; Poster: AGU Fall Meeting, San Francisco, USA; (invited) 03.12.2012 - 07.12.2012; . BibTeX |
| 1285. | H. Karamitaheri, M. Pourfath, H. Kosina: "Highly Sensitive Graphene Antidot Lattice Chemiresitor Sensor"; Poster: Graphene Week, Delft, Netherlands; 04.06.2012 - 08.06.2012; in "Book of Abstracts", (2012), 1 page(s) . BibTeX |
| 1284. | K. Rott, D. Schmitt-Landsiedel, H. Reisinger, G.A. Rott, G. Georgakos, C. Schluender, S. Aresu, W. Gustin, T. Grasser: "Impact and measurement of short term threshold instabilities in MOSFETs of analog circuits"; Talk: IEEE International Integrated Reliability Workshop, California; 14.10.2012 - 18.10.2012; in "IEEE International Integrated Reliability Workshop Final Report", (2012), 31 - 34. BibTeX |
| 1283. | S. E. Tyaginov, I. Starkov, O. Triebl, M. Karner, C. Kernstock, C. Jungemann, H. Enichlmair, J.M. Park, T. Grasser: "Impact of Gate Oxide Thickness Variations on Hot-Carrier Degradation"; Poster: IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), Singapore; 02.07.2012 - 06.07.2012; in "Proceedings of the 19th International Symposium on the Physical & Failure Analysis of Integrated Circuits", (2012), ISBN: 978-1-4673-0980-6, 1 - 5 doi:10.1109/IPFA.2012.6306265. BibTeX |
| 1282. | J. Franco, B. Kaczer, M. Toledano-Luque, Ph. J. Roussel, J. Mitard, L. Ragnarsson, L. Witters, T. Chiarella, M. Togo, N. Horiguchi, G. Groeseneken, M. F. Bukhori, T. Grasser, A. Asenov: "Impact of Single Charged Gate Oxide Defects on the Performance and Scaling of Nanoscaled FETs"; Talk: International Reliability Physics Symposium (IRPS), Californi, USA; 17.04.2012 - 19.04.2012; in "Proceedings of the International Reliability Physics Symposium (IRPS)", (2012), ISBN: 978-1-4577-1680-5, 6 page(s) . BibTeX |
| 1281. | K. Rupp, P. Lagger, T. Grasser: "Inclusion of Carrier-Carrier-Scattering Into Arbitrary-Order Spherical Harmonics Expansions of the Boltzmann Transport Equation"; Talk: International Workshop on Computational Electronics (IWCE), Madison, WI, USA; 22.05.2012 - 25.05.2012; in "Book of Abstracts of the International Workshop on Computational Electronics (IWCE)", (2012), 109 - 110. BibTeX |
| 1280. | G. Donnarumma, V. Palankovski, S. Selberherr: "Influence of Bandgap Narrowing and Carrier Lifetimes on the Forward Current-Voltage Characteristics of a 4H-SiC p-i-n Diode"; Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Denver, CO, USA; 05.09.2012 - 07.09.2012; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2012), ISBN: 978-0-615-71756-2, 125 - 128. BibTeX |
| 1279. | H. Mahmoudi, V. Sverdlov, S. Selberherr: "Influence of Geometry on Memristive Behavior of the Domain Wall Spintronic Memristors and its Applications for Measurements"; Poster: International Conference on Superconductivity and Magnetism, Istanbul, Turkey; 29.04.2012 - 04.05.2012; in "Proceedings of International Conference on Superconductivity and Magnetism (ICSM 2012)", (2012), 1 page(s) . BibTeX |
| 1278. | A. Axelevitch, V. Palankovski, S. Selberherr, G. Golan: "Large Silicon Solar Cells of a Lateral Type"; Poster: 2nd International Conference on Crystalline Silicon Photovoltaics (Silicon PV 2012), Leuven, Belgium; 03.04.2012 - 05.04.2012; . BibTeX |
| 1277. | I. Starkov, H. Enichlmair, T. Grasser: "Local Oxide Capacitance as a Crucial Parameter for Characterization of Hot-Carrier Degradation in High-Voltage n-MOSFET"; Talk: Workshop on Dielectrics in Microelectronics (WODIM), Dresden, Germany; 25.06.2012 - 27.06.2012; in "Abstract Booklet", (2012), 40. BibTeX |
| 1276. | H. Kosina, N. Neophytou: "Low Dimensional Nanostructures as Efficient Thermoelectric Materials for Energy Conversion and Generation"; Talk: BIT's Annual World Congress of Nanoscience and Nanotechnology, Qingdao, China; (invited) 26.10.2012 - 28.10.2012; in "Abstracts of BIT's 2nd Annual World Congress of Nanoscience and Nanotechnology 2012", (2012), 419. BibTeX |
| 1275. | N. Neophytou: "Low Dimensional Si Nanostructures for Efficient Thermoelectric Energy Conversion and Generation"; Talk: Workshop on Nanostructured Materials & Devices (NANOMED), Nicosia, Cyprus; (invited) 17.10.2012. BibTeX |
| 1274. | V. Sverdlov, S. Selberherr: "MOSFET and Spin Transistor Simulations"; Talk: 2012 CMOS Emerging Technologies, Vancouver, BC Canada; (invited) 18.07.2012 - 21.07.2012; in "Abstract of 2012 CMOS Emerging Technologies", (2012), 1 page(s) . BibTeX |
| 1273. | H. Mahmoudi, V. Sverdlov, S. Selberherr: "MTJ-based Implication Logic Gates and Circuit Architecture for Large-Scale Spintronic Stateful Logic Systems"; Talk: European Solid-State Device Research Conference (ESSDERC), Bordeaux, France; 17.09.2012 - 21.09.2012; in "Proceedings of the European Solid-State Device Research Conference (ESSDERC)", (2012), ISBN: 978-1-4673-3086-2, 254 - 257 doi:10.1109/ESSDERC.2012.6343381. BibTeX |
| 1272. | A. Makarov, V. Sverdlov, S. Selberherr: "Micromagnetic Simulations of an MTJ with a Composite Free Layer for High-Speed Spin Transfer Torque RAM"; Poster: International Workshop on Computational Electronics (IWCE), Madison, WI, USA; 22.05.2012 - 25.05.2012; in "Book of Abstracts of the International Workshop on Computational Electronics (IWCE)", (2012), 225 - 226. BibTeX |
| 1271. | A. Makarov, V. Sverdlov, S. Selberherr: "Modeling Emerging Non-Volatile Memories: Current Trends and Challenges"; Talk: International Conference on Solid State Devices and Materials Science (SSDMS), Macao, China; 01.04.2012 - 02.04.2012; in "Physics Procedia", (2012), 99 - 104 doi:10.1016/j.phpro.2012.03.056. BibTeX |
| 1270. | D. Osintsev, V. Sverdlov, S. Selberherr: "Modeling Spintronic Effects in Silicon"; Talk: International Workshop on Mathematics for Semiconductor Heterostructures (MSH), Berlin, Germany; (invited) 24.09.2012 - 28.09.2012; in "Abstracts International Workshop on Mathematics for Semiconductor Heterostructures (MSH)", (2012), 3 page(s) . BibTeX |
| 1269. | R. Orio, H. Ceric, S. Selberherr: "Modeling of Electromigration Induced Resistance Change in Three-Dimensional Interconnects with Through Silicon Vias"; Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Denver, CO, USA; 05.09.2012 - 07.09.2012; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2012), ISBN: 978-0-615-71756-2, 268 - 271. BibTeX |
| 1268. | M. Bina, K. Rupp, S. E. Tyaginov, O. Triebl, T. Grasser: "Modeling of Hot Carrier Degradation Using a Spherical Harmonics Expansion of the Bipolar Boltzmann Transport Equation"; Talk: IEEE International Electron Devices Meeting (IEDM), San Francisco, CA, USA; 10.12.2012 - 12.12.2012; in "Proceedings of the IEEE International Electron Devices Meeting (IEDM)", (2012), 713 - 716 doi:10.1109/IEDM.2012.6479138. BibTeX |
| 1267. | S. E. Tyaginov, T. Grasser: "Modeling of Hot-Carrier Degradation: Physics and Controversial Issues"; Talk: IEEE International Integrated Reliability Workshop, California; 14.10.2012 - 18.10.2012; in "IEEE International Integrated Reliability Workshop Final Report", (2012), 206 - 215. BibTeX |
| 1266. | H. Ceric, R. Orio, W. H. Zisser, V. Schnitzer, S. Selberherr: "Modeling of Microstructural Effects on Electromigration Failure"; Talk: International Workshop on Stress-Induced Phenomena in Microelectronics, Kyoto, Japan; (invited) 28.05.2012 - 30.05.2012; in "Abstracts of 12th International Workshop on Stress-Induced Phenomena in Microelectronics", (2012), 50 - 51. BibTeX |
| 1265. | T. Grasser, B. Kaczer, H. Reisinger, P.-J. Wagner, M. Toledano-Luque: "Modeling of the bias temperature instability under dynamic stress and recovery conditions"; Talk: International Conference on Solid State and Integrated Circuit Technology (ICSICT), Xi'an, China; (invited) 29.10.2012 - 01.11.2012; in "11th International Conference on Solid-State and Integrated Circuit Technology (ICSICT)", (2012), ISBN: 978-1-4673-2474-8, 1 - 4 doi:10.1109/ICSICT.2012.6466737. BibTeX |
| 1264. | X. Zianni, N. Neophytou, M. Ferri, A. Roncaglia, D. Narducci: "Nanograin Effects on the Thermoelectric Properties of Poly-Si Nanowiress"; Talk: The 31st International & 10th European Conference on Thermoelectrics, Aalborg, Denmark; 09.07.2012 - 12.07.2012; in "Book of Abstracts", (2012), 1 page(s) . BibTeX |
| 1263. | A. Makarov, V. Sverdlov, S. Selberherr: "New Trends in Microelectronics: Towards an Ultimate Memory Concept"; Talk: International Caracas Conference on Devices, Circuits and Systems (ICCDCS), Playa del Carmen, Mexico; (invited) 14.03.2012 - 17.03.2012; in "Proceedings of the 8th International Caribbean Conference on Devices, Circuits and Systems", (2012), ISBN:978-1-4566-1117-6, 2 page(s) doi:10.1109/ICCDCS.2012.6188887. BibTeX |
| 1262. | I. Serrano-Lopez, A. Garcia-Barrientos, V. Palankovski, L. del Carmen Cruz-Netro: "Non-Stationary Effects of Space Charge in InN Films"; Talk: International Materials Research Congress, Cancun, Mexico; 12.08.2012 - 17.08.2012; in "XXI International Materials Research Congress", (2012), 1 page(s) . BibTeX |
| 1261. | H. Mahmoudi, V. Sverdlov, S. Selberherr: "Novel Memristive Charge- and Flux-Based Sensors"; Talk: The 8th Conference on Ph.D. Research in Microelectronics & Electronics- PRIME 2012, Aachen, Germany; 12.06.2012 - 15.06.2012; in "Proceedings of the 8th Conference on Ph.D. Research in Microelectronics & Electronics", (2012), ISBN: 978-3-8007-3442-9, 4 page(s) . BibTeX |
| 1260. | P.-J. Wagner, B. Kaczer, A. Scholten, H. Reisinger, S. Bychikhin, D. Pogany, L.K.J. Vandamme, T. Grasser: "On the Correlation Between NBTI, SILC, and Flicker Noise"; Talk: IEEE International Integrated Reliability Workshop, California; 14.10.2012 - 18.10.2012; in "IEEE International Integrated Reliability Workshop Final Report", (2012), 60 - 64. BibTeX |
| 1259. | T. Grasser, B. Kaczer, H. Reisinger, P.-J. Wagner, M. Toledano-Luque: "On the Frequency Dependence of the Bias Temperature Instability"; Poster: International Reliability Physics Symposium (IRPS), Californi, USA; 17.04.2012 - 19.04.2012; in "Proceedings of the International Reliability Physics Symposium (IRPS)", (2012), ISBN: 978-1-4577-1680-5, 6 page(s) . BibTeX |
| 1258. | F. Schanovsky, T. Grasser: "On the Microscopic Limit of the Modified Reaction-Diffusion Model for the Negative Bias Temperature Instability"; Poster: International Reliability Physics Symposium (IRPS), Californi, USA; 17.04.2012 - 19.04.2012; in "Proceedings of the International Reliability Physics Symposium (IRPS)", (2012), ISBN: 978-1-4577-1680-5, 6 page(s) . BibTeX |
| 1257. | T. Grasser, H. Reisinger, K. Rott, M. Toledano-Luque, B. Kaczer: "On the Microscopic Origin of the Frequency Dependence of Hole Trapping in pMOSFETs"; Talk: IEEE International Electron Devices Meeting (IEDM), San Francisco, CA, USA; 10.12.2012 - 12.12.2012; in "Proceedings of the IEEE International Electron Devices Meeting (IEDM)", (2012), 470 - 473 doi:10.1109/IEDM.2012.6479076. BibTeX |
| 1256. | M. Moradinasab, H. Karamitaheri, M. Pourfath, H. Kosina: "On the Role of Stone-Wales Defects on the Performance of Graphene Nanoribbon Photo Detectors"; Poster: Graphene Week, Delft, Netherlands; 04.06.2012 - 08.06.2012; in "Book of Abstracts", (2012), 1 page(s) . BibTeX |
| 1255. | B. Schwarz, P. Reininger, O. Baumgartner, Z. Stanojevic, H. Kosina, G. Strasser: "Optimization of intersubband devices for dual-color emission, absorption and detection"; Talk: ÖPG-Jahrestagung, Graz; 18.09.2012 - 21.09.2012; . BibTeX |
| 1254. | P. Schwaha, M. Nedjalkov, S. Selberherr, I. Dimov: "Particle-Grid Techniques for Semiclassical and Quantum Transport Simulations"; Poster: International Workshop on Computational Electronics (IWCE), Madison, WI, USA; 22.05.2012 - 25.05.2012; in "Book of Abstracts of the International Workshop on Computational Electronics (IWCE)", (2012), 177 - 178. BibTeX |
| 1253. | M. Nedjalkov, P. Schwaha, S. Selberherr, D.K. Ferry: "Phonon Decoherence in Wigner-Boltzmann Transport"; Poster: International Winterschool on New Developments in Solid State Physics, Mauterndorf, Austria; 12.02.2012 - 17.02.2012; in "Proceedings of International Winterschool on New Developments in Solid State Physics", (2012), 61 - 62. BibTeX |
| 1252. | V. Palankovski: "Photovoltaic and Thermoelectric Devices for Renewable Energy Harnessing"; Talk: Electronica, Sofia, Bulgaria; (invited) 14.06.2012 - 15.06.2012; . BibTeX |
| 1251. | M. Jurkovic, D. Gregusova, S. Hascik, M. Blaho, K. Cico, V. Palankovski, J. Carlin, N. Grandjean, J. Kuzmik: "Polarization Engineered Normally-Off GaN/InlN/AlN/GaN HEMT"; Talk: International Workshop on Nitride Semiconductors 2012 (INW), Sapporo, Japan; 14.10.2012 - 19.10.2012; in "International Workshop on Nitride Semiconductors", (2012), 2 page(s) . BibTeX |
| 1250. | A. Starkov, I. Baranov, O. Pakhomov, I. Starkov, A. Zaitsev: "Principles of Solid-State Cooler on Layered Multiferroics"; Poster: 5th IIR/IIF International Conference on Magnetic Refrigeration at Room Temperature (THERMAG V), Grenoble, France; 17.09.2012 - 20.09.2012; in "Conference guide & book of abstracts", (2012), 1 page(s) . BibTeX |
| 1249. | A. Makarov, V. Sverdlov, S. Selberherr: "Recent Developments in Advanced Memory Modeling"; Talk: International Conference on Microelectronics (MIEL), Nis, Serbia; (invited) 13.05.2012 - 16.05.2012; in "Proceedings of the International Conference on Microelectronics (MIEL)", (2012), ISBN: 978-1-4673-0235-7, 49 - 52 doi:10.1109/MIEL.2012.6222795. BibTeX |
| 1248. | S. Selberherr: "Recent Developments in Advanced Memory Modeling"; Talk: IEEE EDS Mini-Colloquium Distinguished Lecture, University of Nis, Nis, Serbia; (invited) 13.05.2012. BibTeX |
| 1247. | T. Grasser: "Recent Developments in Understanding the Bias Temperature Instability"; Talk: International Conference on Microelectronics (MIEL), Nis, Serbia; (invited) 13.05.2012 - 16.05.2012; in "Proceedings of the International Conference on Microelectronics (MIEL)", (2012), ISBN: 978-1-4673-0238-8, 315 - 322 doi:10.1109/MIEL.2012.6222864. BibTeX |
| 1246. | G. Pobegen, M. Nelhiebel, T. Grasser: "Recent Results Concerning the Influence of Hydrogen on the Bias Temperature Instability"; Talk: IEEE International Integrated Reliability Workshop, California; 14.10.2012 - 18.10.2012; in "2012 IEEE International Integrated Reliability Workshop Final Report", (2012), 54 - 59. BibTeX |
| 1245. | K. Rupp, T. Grasser, A. Jüngel: "Recent advances in the spherical harmonics expansion of the Boltzmann transport equation"; Talk: Congresso Nationale Simai 2012, Turin, Italy; 25.06.2012 - 28.06.2012; in "Abstracts of Congresso Nationale Simai 2012", (2012), 183. BibTeX |
| 1244. | D. Osintsev, O. Baumgartner, Z. Stanojevic, V. Sverdlov, S. Selberherr: "Reduction of Surface Roughness Induced Spin Relaxation in MOSFETs by Strain"; Poster: International Workshop on Computational Electronics (IWCE), Madison, WI, USA; 22.05.2012 - 25.05.2012; in "Book of Abstracts of the International Workshop on Computational Electronics (IWCE)", (2012), 229 - 230. BibTeX |
| 1243. | A. Makarov, V. Sverdlov, S. Selberherr: "Reduction of the Switching Current in Spin Transfer Torque Random Access Memory"; Poster: Advanced Research Workshop on Future Trends in Microelectronics: Into the Cross Currents, Corsica, France; 25.06.2012 - 29.06.2012; in "Abstracts Advanced Research Workshop on Future Trends in Microelectronics: Into the Cross Currents", (2012), 49. BibTeX |
| 1242. | J. Franco, B. Kaczer, J. Mitard, M. Toledano-Luque, G. Eneman, Ph. J. Roussel, M. Cho, T. Kauerauf, T. Grasser, L. Witters, G. Hellings, L. Ragnarsson, N. Horiguchi, M. Heyns, G. Groeseneken: "Reliability of SiGe Channel MOS"; Talk: Honolulu PRiME 2012, Honolulu, USA; 07.10.2012 - 12.10.2012; in "ECS Meeting Abstracts", (2012), MA2012-02, 1 page(s) . BibTeX |
| 1241. | M. Nedjalkov, P. Schwaha, S. Selberherr, D.K. Ferry, D. Vasileska, P. Dollfus, D. Querlioz: "Role of the Physical Scales on the Transport Regime"; Talk: International Workshop on Computational Electronics (IWCE), Madison, WI, USA; 22.05.2012 - 25.05.2012; in "Book of Abstracts of the International Workshop on Computational Electronics (IWCE)", (2012), 47 - 48. BibTeX |
| 1240. | A. Makarov, V. Sverdlov, S. Selberherr: "STT-RAM with a Composite Free Layer: High Thermal Stability, Low Switching Barrier, and Sharp Switching Time Distribution"; Talk: Worldwide Universities Network 4th International Conference on Spintronics (WUN-SPIN 2012), Sydney, Australia; 23.07.2012 - 25.07.2012; in "Abstract of Worldwide Universities Network 4th International Conference on Spintronics (WUN-SPIN 2012)", (2012), H4. BibTeX |
| 1239. | P. Reininger, B. Schwarz, O. Baumgartner, Z. Stanojevic, H. Kosina, G. Strasser: "Simulation of Dual Wavelength Photonic Crystal Quantum Cascade Laser"; Poster: International Conference on Physics of Semiconductor (ICPS), Zürich, Schweiz; 29.07.2012 - 03.08.2012; . BibTeX |
| 1238. | M. Bina, O. Triebl, B. Schwarz, M. Karner, B. Kaczer, T. Grasser: "Simulation of Reliability on Nanoscale Devices"; Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Denver, CO, USA; 05.09.2012 - 07.09.2012; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2012), ISBN: 978-0-615-71756-2, 109 - 112. BibTeX |
| 1237. | L. Filipovic, S. Selberherr: "Simulation of Silicon Nanopatterning Using nc-AFM"; Poster: International Conference on non-contact Atomic Force Microscopy, Cesky Krumlov; 01.07.2012 - 05.07.2012; in "Abstracts 15th International Conference on non-contact Atomic Force Microscopy (nc-AFM)", (2012), 108. BibTeX |
| 1236. | P. Reininger, B. Schwarz, S. Kalchmair, R. Gansch, O. Baumgartner, Z. Stanojevic, H. Kosina, W. Schrenk, G. Strasser: "Simulation of a dual wavelength quantum cascade laser in a photonic crystal cavity"; Poster: International Quantum Cascade Lasers School & Workshop 2012 (IQCLSW 2012), Baden; 02.09.2012 - 06.09.2012; . BibTeX |
| 1235. | L. Filipovic, S. Selberherr: "Simulations of Local Oxidation Nanolithography by AFM Based on the Generated Electric Field"; Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Denver, CO, USA; 05.09.2012 - 07.09.2012; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2012), ISBN: 978-0-615-71756-2, 189 - 192. BibTeX |
| 1234. | T. Windbacher, A. Makarov, V. Sverdlov, S. Selberherr: "Simulations of an Electrical Read-Write Operation of a Magnetic XOR Gate"; Talk: Worldwide Universities Network 4th International Conference on Spintronics (WUN-SPIN 2012), Sydney, Australia; 23.07.2012 - 25.07.2012; in "Abstract of Worldwide Universities Network 4th International Conference on Spintronics (WUN-SPIN 2012)", (2012), J3. BibTeX |
| 1233. | M. Lukash, K. Rupp, S. Selberherr: "Sparse Approximate Inverse Preconditioners for Iterative Solvers on GPUs"; Talk: High Performance Computing Symposium (HPC), Orlando, FL, USA; 26.03.2012 - 29.03.2012; in "HPC '12 Proceedings of the 2012 Symposium on High Performance Computing", (2012), ISBN: 978-1-61839-788-1, 7 page(s) . BibTeX |