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    Conference Presentations

    TU Home


    Publication Database Home

    Publication list for members of
    E360 - Institute for Microelectronics
    as any persons named in the publication record

    2089 records


    Talks and Poster Presentations (with or without Proceedings-Entry)


    2089. F. Rodrigues, L.F. Aguinsky, A. Hössinger, J. Weinbub:
    "3D Feature-Scale Modeling of Highly Selective Fluorocarbon Plasma Etching";
    Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD 2022), Granada, Spain; 06.09.2022 - 08.09.2022; in "SISPAD 2022: International Conference on Simulation of Semiconductor Processes and Devices - Conference Abstract Booklet", (2022), 32 - 33. BibTeX

    2088. L. Filipovic:
    "A Broadly-Applicable Ensemble Monte Carlo Framework";
    Talk: Workshop Monte Carlo Simulation: Beyond Moore's LAW, International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Spain; (invited) 05.09.2022. BibTeX

    2087. L. Cvitkovich, D. Waldhör, A.-M. El-Sayed, M. Jech, C. Wilhelmer, T. Grasser:
    "Ab-Initio Modeling of the Initial Stages of Si(100) Thermal Oxidation";
    Poster: Psi-K Conference (Psi-K) 2022, Lausanne, Schwitzerland; 22.08.2022 - 25.08.2022; in "PSI-K 2022: abstracts book", (2022), 209. BibTeX

    2086. C. Wilhelmer, D. Waldhör, M. Jech, A.-M. El-Sayed, L. Cvitkovich, M. Waltl, T. Grasser:
    "Ab-Initio Study of Multi-State Defects in Amorphous SiO2";
    Talk: Psi-K Conference (Psi-K) 2022, Lausanne, Schwitzerland; 22.08.2022 - 25.08.2022; in "PSI-K 2022: abstracts book", (2022), 264. BibTeX

    2085. S. Selberherr, V. Sverdlov:
    "About Electron Transport and Spin Control in Semiconductor Devices";
    Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD 2022), Granada, Spain; (invited) 06.09.2022 - 08.09.2022; in "SISPAD 2022: International Conference on Simulation of Semiconductor Processes and Devices - Conference Abstract Booklet", (2022), 1 - 4. BibTeX

    2084. R. Orio, J. Ender, W. Goes, S. Fiorentini, S. Selberherr, V. Sverdlov:
    "About the Switching Energy of a Magnetic Tunnel Junction determined by Spin-Orbit Torque and Voltage-Controlled Magnetic Anisotropy";
    Talk: 2022 IEEE Latin American Electron Devices Conference (LAEDC), Puebla, Mexico; 04.06.2022 - 06.06.2022; in "2022 IEEE Latin American Electron Devices Conference (LAEDC)", (2022), ISBN: 978-1-6654-9768-8, 1 - 4 doi:10.1109/LAEDC54796.2022.9908222. BibTeX

    2083. C. Lenz, P. Manstetten, A. Hössinger, J. Weinbub:
    "Automatic Grid Refinement for Thin Material Layer Etching in Process TCAD Simulations";
    Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD 2022), Granada, Spain; 06.09.2022 - 08.09.2022; in "SISPAD 2022: International Conference on Simulation of Semiconductor Processes and Devices - Conference Abstract Booklet", (2022), 11 - 12. BibTeX

    2082. D. Milardovich, D. Waldhör, M. Jech, A.-M. El-Sayed, T. Grasser:
    "Building Robust Machine Learning Force Fields by Composite Gaussian Approximation Potentials";
    Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD 2022), Granada, Spain; 06.09.2022 - 08.09.2022; in "SISPAD 2022: International Conference on Simulation of Semiconductor Processes and Devices - Conference Abstract Booklet", (2022), 61 - 62. BibTeX

    2081. Yu. Illarionov, B. Uzlu, T. Knobloch, A. Banshchikov, V. Sverdlov, M. Vexler, N. S. Sokolov, M. Waltl, Z. Wang, D. Neumaier, M. Lemme, T. Grasser:
    "CVD-GFETs with Record-small Hysteresis Owing to 2nm Epitaxial CaF2 Insulators";
    Talk: Device Research Conference (DRC), Columbus, OH; 26.06.2022 - 29.06.2022; in "Proceedings of the Device Research Conference (DRC)", (2022), ISBN: 978-1-6654-9883-8, 121 - 122. BibTeX

    2080. S. Fiorentini, J. Ender, R. Orio, S. Selberherr, W. Goes, V. Sverdlov:
    "Comprehensive Evaluation of Torques in Ultra Scaled MRAM Devices";
    Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD 2022), Granada, Spain; 06.09.2022 - 08.09.2022; in "SISPAD 2022: International Conference on Simulation of Semiconductor Processes and Devices - Conference Abstract Booklet", (2022), 11 - 12. BibTeX

    2079. L. Filipovic, O. Baumgartner, J. Piso, J. Bobinac, T. Reiter, G. Strof, G. Rzepa, Z. Stanojevic, M. Karner:
    "DTCO Flow for Air Spacer Generation and its Impact on Power and Performance at N7";
    Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD 2022), Granada, Spain; 06.09.2022 - 08.09.2022; in "SISPAD 2022: International Conference on Simulation of Semiconductor Processes and Devices - Conference Abstract Booklet", (2022), 34 - 35. BibTeX

    2078. S. Fiorentini, W.J. Loch, M. Bendra, N. Jørstad, J. Ender, R. Orio, T. Hadámek, W. Goes, V. Sverdlov, S. Selberherr:
    "Design Analysis of Ultra-Scaled MRAM Cells";
    Talk: 2022 IEEE 16th International Conference on Solid-State and Integrated Circuit Technology, Nanjing, China; (invited) 25.10.2022 - 28.10.2022; in "Proceedings of 2022 IEEE 16th International Conference on Solid-State & Integrated Circuit Technology (ICSICT)", (2022), ISBN: 978-1-6654-6905-0, . BibTeX

    2077. A. Saleh, H. Zahedmanesh, H. Ceric, K. Croes, I. De Wolf:
    "Dynamics of Electromigration Voids in Cu Interconnects: Investigation Using a Physics-Based Model Augmented by Neural Networks";
    Talk: IEEE International Interconnect Technology Conference (IITC), San Jose, USA; 27.06.2022 - 30.06.2022; in "2022 IEEE International Interconnect Technology Conference (IITC)", (2022), ISBN: 978-1-6654-8646-0, 22 - 27 doi:10.1109/IITC52079.2022.9881303. BibTeX

    2076. V. Sverdlov, H. Seiler, A.-M. El-Sayed, Yu. Illarionov, H. Kosina, S. Selberherr:
    "Edge Modes in Narrow Nanoribbons of Transition Metal Dichalcogenides in a Topological 1T";
    Talk: International Conference on Physics and its Application, San Francisco, USA; (invited) 18.07.2022 - 21.07.2022; in "International Conference on Physics and its Application 2022", (2022), 36 - 37. BibTeX

    2075. M. Ballicchia, M. Nedjalkov, J. Weinbub:
    "Electromagnetic Control of Electron Interference";
    Poster: CECAM Flagship Workshop on Quantum Transport Methods and Algorithms: From Particles to Waves Approaches, Zurich; 06.07.2022 - 08.07.2022; in "Book of Abstracts of the CECAM Flagship Workshop on Quantum Transport Methods and Algorithms: From Particles to Waves Approaches", (2022), 15. BibTeX

    2074. H. Ceric, R. Orio, S. Selberherr:
    "Electromigration Degradation of Gold Interconnects: A Statistical Study";
    Talk: IEEE International Interconnect Technology Conference (IITC), San Jose, California,; 27.06.2022 - 30.06.2022; in "2022 IEEE International Interconnect Technology Conference (IITC)", (2022), 102 - 104 doi:10.1109/IITC52079.2022.9881313. BibTeX

    2073. V. Sverdlov, M. Bendra, S. Fiorentini, J. Ender, R. Orio, T. Hadámek, W.J. Loch, N. Jørstad, W. Goes, S. Selberherr:
    "Emerging Devices for Digital Spintronics";
    2nd Global Conference & Expo on Nanotechnology & Nanoscience, online; (invited) 25.05.2022 - 26.05.2022; in "2nd Global Conference & Expo on Nanotechnology & Nanoscience", (2022), 32 - 33. BibTeX

    2072. T. Knobloch:
    "Enhancing the Reliability of 2D Nanoelectronics Guided by Physical Modeling";
    Talk: Workshop Monte Carlo Simulation: Beyond Moore's LAW, International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Spain; 05.09.2022. BibTeX

    2071. T. Knobloch, Yu. Illarionov, T. Grasser:
    "Enhancing the Stability of 2D Material-Based Transistors via Fermi-Level Tuning";
    Talk: Graphene Week 2022, Munich, Germany; (invited) 05.09.2022 - 09.09.2022; in "Abstracts of Graphene Week 2022", (2022), . BibTeX

    2070. T. Knobloch, Yu. Illarionov, T. Grasser:
    "Finding Suitable Gate Insulators for Reliable 2D FETs";
    Talk: International Reliability Physics Symposium (IRPS), Dallas, USA; (invited) 27.03.2022 - 31.03.2022; in "2022 IEEE International Reliability Physics Symposium (IRPS) : proceedings : March 27-31, 2022, Dallas, Texas / IEEE", (2022), ISBN: 978-1-6654-7950-9, 2A.1-1 - 2A.1-10 doi:10.1109/IRPS48227.2022.9764499. BibTeX

    2069. Yu. Illarionov, T. Knobloch, B. Uzlu, N. S. Sokolov, M. Lemme, T. Grasser:
    "Highly stable GFETs with 2nm crystalline CaF2 insulators";
    Talk: 6th International Conference on Physics of 2D materials based electronics and optoelectronics (ICP2DC6, 2022), Yerevan, Armenia; 09.10.2022 - 14.10.2022; . BibTeX

    2068. H. Ceric, R. Orio, S. Selberherr:
    "Impact of Gold Interconnect Microstructure on Electromigration Failure Time Statistics";
    Talk: IEEE European Solid-State Device Research Conference (ESSDERC), Milan, Italy; 20.09.2022 - 22.09.2022; in "Proceedings of the European Solid-State Device Research Conference (ESSDERC)", (2022), ISBN: 978-1-6654-8496-1, 301 - 303. BibTeX

    2067. J. Bobinac, T. Reiter, J. Piso, X. Klemenschits, O. Baumgartner, Z. Stanojevic, G. Strof, M. Karner, L. Filipovic:
    "Impact of Mask Tapering on SF6/O2 Plasma Etching";
    Talk: Fourth International Conference on Microelectronic Devices and Technologies (MicDAT '2022), Corfu, Greece; 21.09.2022 - 23.09.2022; in "Microelectronic Devices and Technologies: Proceedings of the 4rd International Conference on Microelectronic Devices and Technologies (MicDAT '2022)", (2022), ISBN: 978-84-09-43856-3, 90 - 94. BibTeX

    2066. M. Bendra, S. Fiorentini, J. Ender, R. Orio, T. Hadámek, W.J. Loch, N. Jørstad, W. Goes, S. Selberherr:
    "Interface Effects in Ultra-Scaled MRAM Cells";
    Talk: Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Udine, Italy; 18.05.2022 - 20.05.2022; in "Proceedings of the Joint International EuroSOI Workshop and International Conference on Ultimate Integration on Silicon (EuroSOI-ULIS)", (2022), . BibTeX

    2065. D. Milardovich, M. Jech, D. Waldhör, A.-M. El-Sayed, T. Grasser:
    "Machine Learning Prediction of Defect Structures in Amorphous Silicon Dioxide";
    Talk: Psi-K Conference (Psi-K) 2022, Lausanne, Schwitzerland; 22.08.2022 - 25.08.2022; in "PSI-K 2022: abstracts book", (2022), 138. BibTeX

    2064. H. Ceric, R. Orio, S. Selberherr:
    "Microstructural Impact on Electromigration Reliability of Gold Interconnects";
    Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD 2022), Granada, Spain; 06.09.2022 - 08.09.2022; in "SISPAD 2022: International Conference on Simulation of Semiconductor Processes and Devices - Conference Abstract Booklet", (2022), 178 - 179. BibTeX

    2063. V. Sverdlov, M. Bendra, S. Fiorentini, J. Ender, R. Orio, T. Hadámek, W.J. Loch, N. Jørstad, S. Selberherr:
    "Modeling Advanced Magnetoresistive Memory: A Journey from Finite Element Methods to Machine Learning Approaches";
    2 nd Global Webinar on Nanoscience & Nanotechnology, online; (invited) 14.03.2022 - 15.03.2022; in "2nd Global Webinar on Nanoscience & Nanotechnology", (2022), . BibTeX

    2062. V. Sverdlov, M. Bendra, S. Fiorentini, J. Ender, R. Orio, T. Hadámek, W.J. Loch, N. Jørstad, W. Goes, S. Selberherr:
    "Modeling Advanced Spintronic Based Magnetoresistive Memory";
    Talk: International Conference on Microwave & THz Technologies, Wireless Communications and OptoElectronics (IRPhE 2022), Yerevan, Armenia; (invited) 27.09.2022 - 29.09.2022; in "Book of Abstracts of the International Conference on Microwave & THz Technologies and Optoelectronics (IRPhE)", (2022), . BibTeX

    2061. V. Sverdlov, W. Loch, M. Bendra, S. Fiorentini, J. Ender, R. Orio, T. Hadámek, N. Jorstad, W. Goes, S. Selberherr:
    "Modeling Approach to Ultra-Scaled MRAM Cells";
    Talk: ASETMEET2022 International Meet On Applied Science, Engineering and Technology, Taastrup, Copenhagen; (invited) 23.06.2022 - 25.06.2022; in "Book of Abstracts of the International Meet On Applied Science, Engineering and Technology (ASETMEET)", (2022), 7 - 8. BibTeX

    2060. N. Jørstad, S. Fiorentini, S. Selberherr, W. Goes, V. Sverdlov:
    "Modeling Interfacial and Bulk Spin-Orbit torques";
    Talk: 16th International Conference on Nanostructured Materials, Sevilla, Spain; 06.06.2022 - 10.06.2022; in "Book of Abstracts of the International Conference on Nanostructured Materials (NANO)", (2022), . BibTeX

    2059. L.F. Aguinsky, F. Rodrigues, X. Klemenschits, L. Filipovic, A. Hössinger, J. Weinbub:
    "Modeling Non-Ideal Conformality during Atomic Layer Deposition in High Aspect Ratio Structures";
    Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD 2022), Granada, Spain; 06.09.2022 - 08.09.2022; in "SISPAD 2022: International Conference on Simulation of Semiconductor Processes and Devices - Conference Abstract Booklet", (2022), 40 - 41. BibTeX

    2058. T. Hadámek, W. Goes, S. Selberherr, V. Sverdlov:
    "Modeling Thermal Effects in STT-MRAM";
    Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD 2022), Granada, Spain; 06.09.2022 - 08.09.2022; in "SISPAD 2022: International Conference on Simulation of Semiconductor Processes and Devices - Conference Abstract Booklet", (2022), 11 - 12. BibTeX

    2057. V. Sverdlov:
    "Modeling Ultra-Scaled Magnetoresistive Memory Cells";
    3rd Global Webinar on Nanoscience & Nanotechnology, online; (invited) 18.07.2022 in "3rd Global Webinar on Nanoscience & Nanotechnology", (2022), . BibTeX

    2056. M. Ballicchia, M. Nedjalkov, J. Weinbub:
    "Monte Carlo Approach for Solving Integral Equations: From Classical-Boltzmann to Quantum-Wigner Particles";
    Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Spain; (invited) 05.09.2022. BibTeX

    2055. J. Weinbub, M. Ballicchia, M. Nedjalkov:
    "Quantum Transport in Phase Space: Introduction and Applications";
    Talk: Summer School on Methods and Models of Kinetic Theory, Pesaro, Italy; (invited) 12.06.2022 - 18.06.2022; . BibTeX

    2054. H. Kosina:
    "Recent Developments in Semiclassical Transport: Backward Monte Carlo and Electron-Electron Scattering";
    Talk: Workshop Monte Carlo Simulation: Beyond Moore's LAW, International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Spain; 05.09.2022. BibTeX

    2053. T. Knobloch, T. Grasser:
    "Scalable and Reliable Gate Insulators for 2D Material-Based FETs";
    Talk: IEEE Latin America Electron Devices Conference (LAEDC), Puebla, Mexico; (invited) 04.07.2022 - 06.07.2022; . BibTeX

    2052. M. Quell, A. Hössinger, J. Weinbub:
    "Shared-Memory Fast Marching Method for Re-Distancing on Hierarchical Meshes";
    Talk: Austrian-Slovenian HPC Meeting (ASHPC), Grundlsee; 31.05.2022 - 02.06.2022; in "Book of Abstracts of the Austrian-Slovenian HPC Meeting (ASHPC)", (2022), ISBN: 978-3-200-08499-5, 1 page(s) doi:10.25365/phaidra.337. BibTeX

    2051. W.J. Loch, S. Selberherr, V. Sverdlov:
    "Simulation of Novel MRAM Devices with Enhanced Performance";
    Talk: 16th International Conference on Nanostructured Materials, Sevilla, Spain; 06.06.2022 - 10.06.2022; in "Book of Abstracts of the International Conference on Nanostructured Materials (NANO)", (2022), . BibTeX

    2050. S. Fiorentini, M. Bendra, J. Ender, R. Orio, W. Goes, S. Selberherr, V. Sverdlov:
    "Spin Torques in ULTRA-Scaled MRAM Devices";
    Talk: IEEE European Solid-State Device Research Conference (ESSDERC), Mailand; 20.09.2022 - 22.09.2022; in "Proceedings of the European Solid-State Device Research Conference (ESSDERC)", (2022), ISBN: 978-1-6654-8496-1, 348 - 351. BibTeX

    2049. S. Fiorentini, J. Ender, S. Selberherr, W. Goes, V. Sverdlov:
    "Spin Transfer Torque Evaluation Based on Coupled Spin and Charge Transport: A Finite Element Method Approach";
    Talk: 26th World Multi-Conference on Systemics, Cybernetics and Informatics (WMSCI 2022), online; 12.07.2022 - 15.07.2022; in "The 26th World Multi-Conference on Systemics, Cybernetics and Informatics: WMSCI 2022. Proceedings Volume II", (2022), 20, 4, 40 - 44. BibTeX

    2048. M. Bendra, S. Fiorentini, J. Ender, R. Orio, T. Hadámek, W.J. Loch, N. Jørstad, S. Selberherr, W. Goes, V. Sverdlov:
    "Spin Transfer Torques in Ultra-Scaled MRAM Cells";
    Talk: MIPRO 2022, Opatija, Croatia; 23.05.2022 - 27.05.2022; in "2022 45th Jubilee International Convention on Information, Communication and Electronic Technology (MIPRO)", (2022), ISBN: 978-953-233-103-5, 129 - 132. BibTeX

    2047. L. Gollner, R. Steiner, L. Filipovic:
    "Study of Phonon-limited Electron Transport in Monolayer MoS2";
    Talk: Fourth International Conference on Microelectronic Devices and Technologies (MicDAT '2022), Corfu, Greece; 21.09.2022 - 23.09.2022; in "Microelectronic Devices and Technologies Proceedings of the 4rd International Conference on Microelectronic Devices and Technologies (MicDAT 2022)", (2022), ISBN: 978-84-09-43856-3, 74 - 78. BibTeX

    2046. T. Hadámek, S. Fiorentini, M. Bendra, R. Orio, W.J. Loch, N. Jorstad, S. Selberherr, W. Goes, V. Sverdlov:
    "Temperature Modeling in STT-MRAM:A Fully Three-Dimensional Finite Element Approach";
    Talk: 16th International Conference on Nanostructured Materials, Sevilla, Spain; 06.06.2022 - 10.06.2022; in "Book of Abstracts of the International Conference on Nanostructured Materials (NANO)", (2022), . BibTeX

    2045. M. Jech, T. Grasser, M. Waltl:
    "The Importance of Secondary Generated Carriers in Modeling of Full Bias Space";
    Talk: IEEE Electron Devices Technology and Manufacturing Conference (EDTM), online; 06.03.2022 - 09.03.2022; in "2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)", (2022), 265 - 267 doi:10.1109/EDTM53872.2022.9798262. BibTeX

    2044. Yu. Illarionov, T. Knobloch, M. Waltl, Q. Smets, L. Panarella, B. Kaczer, T. Schram, S. Brems, D. Cott, I. Asselberghs, T. Grasser:
    "Top Gate Length Dependence of Hysteresis in 300mm FAB MoS2 FETs";
    Talk: Graphne 2022, Aachen, Germany; 05.07.2022 - 08.07.2022; . BibTeX

    2043. M. Stephanie, M. Waltl, T. Grasser, B. SchrenkSchrenk:
    "WDM-Conscious Synaptic Receptor Assisted by SOA+EAM";
    Talk: 2022 Optical Fiber Communications Conference and Exhibition (OFC), San Diego, California, USA; 05.03.2022 - 09.03.2022; in "2022 Optical Fiber Communications Conference and Exhibition (OFC)", (2022), . BibTeX

    2042. M. Ballicchia, M. Nedjalkov, J. Weinbub:
    "Wigner Dynamics of Electron Quantum Superposition States in a Confined and Opened Quantum Dot";
    Talk: 22nd IEEE International Conference on Nanotechnology, Palma de Mallorca, Sapin; 04.07.2022 - 08.07.2022; in "2022 IEEE 22nd International Conference on Nanotechnology (NANO)", (2022), 565 - 568 doi:10.1109/NANO54668.2022.9928753. BibTeX

    2041. J. Weinbub:
    "Wigner Signed Particles for Electron Quantum Optics";
    Talk: UW-Madison's Grainger Institute Computing in Engineering Forum, USA; (invited) 20.09.2022 - 21.09.2022; . BibTeX

    2040. J. Weinbub:
    "Wigner Signed-Particles: Computational Challenges and Simulation Opportunities";
    Talk: CECAM Flagship Workshop on Quantum Transport Methods and Algorithms: From Particles to Waves Approaches, Zurich; (invited) 06.07.2022 - 08.07.2022; in "Book of Abstracts of the CECAM Flagship Workshop on Quantum Transport Methods and Algorithms: From Particles to Waves Approaches", (2022), 1 page(s) . BibTeX

    2039. A.-M. El-Sayed, H. Seiler, H. Kosina, S. Selberherr, V. Sverdlov:
    "Ab-initio Calculations of Edge States in Topological 1T′ MoS2 Nanoribbons";
    Talk: 2021 Workshop on Innovative Nanoscale Devices and Systems (WINDS2021), Hawaii, USA; 28.11.2021 - 03.12.2021; in "WINDS Book of Abstracts", (2021), ISBN: 978-3-9504738-3-4, 79 - 80. BibTeX

    2038. J. Ender, S. Fiorentini, R. Orio, T. Hadámek, M. Bendra, W. Goes, S. Selberherr, V. Sverdlov:
    "Advanced Modeling of Emerging MRAM: From Finite Element Methods to Machine Learning Approaches";
    Talk: International Conference Micro- and Nanoelectronics (ICMNE), Moscow-Zvenigorod, Russia; (invited) 04.10.2021 - 08.10.2021; in "Proceedings of the International Conference Micro- and Nanoelectronics (ICMNE)", (2021), ISBN: 978-5-317-06675-8, . BibTeX

    2037. J. Ender, S. Fiorentini, S. Selberherr, W. Goes, V. Sverdlov:
    "Advanced Modeling of Emerging Nonvolatile Magnetoresistive Devices";
    Talk: International Workshop on Computational Nanotechnology (IWCN), Daejeon, Korea (Virtual); (invited) 24.05.2021 - 06.06.2021; in "Book of Abstracts of the International Workshop on Computational Nanotechnology (IWCN)", (2021), ISBN: 978-89-89453-30-7, 45 - 46. BibTeX

    2036. T. Hadámek, S. Selberherr, W. Goes, V. Sverdlov:
    "Asymmetry of Current-Induced Heating in Magnetic Tunnel Junctions";
    Talk: International Workshop on Computational Nanotechnology (IWCN), Daejeon, Korea (Virtual); 24.05.2021 - 06.06.2021; in "Book of Abstracts of the International Workshop on Computational Nanotechnology (IWCN)", (2021), ISBN: 978-89-89453-30-7, 49 - 50. BibTeX

    2035. J. Franco, J. Marneffe, A. Vandooren, Y. Kimura, L. Nyns, Z. Wu, A.-M. El-Sayed, M. Jech, D. Waldhör, D. Claes, H. Arimura, L. Ragnarsson, V. Afanas´Ev, N. Horiguchi, D. Linten, T. Grasser, B. Kaczer:
    "Atomic Hydrogen Exposure to Enable High-Quality Low-Temperature SiO2 with Excellent pMOS NBTI Reliability Compatible with 3D Sequential Tier Stacking";
    Talk: IEEE International Electron Devices Meeting (IEDM), San Francisco, CA, USA; 12.12.2021 - 18.12.2021; in "Proceedings of the IEEE International Electron Devices Meeting (IEDM)", (2021), ISBN: 978-1-7281-8888-1, 31.2.1 - 31.2.4 doi:10.1109/IEDM13553.2020.9372054. BibTeX

    2034. V. Sverdlov, A.-M. El-Sayed, H. Kosina, S. Selberherr:
    "Ballistic Conductance, k. p Hamiltonian, Nanoribbons, Subbands, Topological Insulators (TIs), Topologically Protected Edge States";
    Talk: European Solid-State Device Research Conference (ESSDERC), Grenoble, France; 13.09.2021 - 17.09.2021; in "Proceedings of the European Solid-State Device Research Conference (ESSDERC), TEDbrief Special Edition", (2021), . BibTeX

    2033. T. Grasser, B. O´Sullivan, B. Kaczer, J. Franco, B. Stampfer, M. Waltl:
    "CV Stretch-Out Correction after Bias Temperature Stress: Work-function Dependence of Donor-/Acceptor-like Traps, Fixed Charges, and Fast States";
    Talk: IEEE International Reliability Physics Symposium (IRPS), virtual; 21.03.2021 - 24.03.2021; in "Proceedings of the IEEE International Reliability Physics Symposium (IRPS)", (2021), ISBN: 978-1-7281-6893-7, 1 - 6 doi:10.1109/IRPS46558.2021.9405184. BibTeX

    2032. X. Klemenschits, S. Selberherr, L. Filipovic:
    "Combined Process Simulation and Emulation of an SRAM Cell of the 5nm Technology Node";
    Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Dallas, Texas (USA); 27.09.2021 - 29.09.2021; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2021), 23 - 27 doi:10.1109/SISPAD54002.2021.9592605. BibTeX

    2031. V. Sverdlov, H. Seiler, A.-M. El-Sayed, H. Kosina:
    "Conductance of Edge Modes in Nanoribbons of 2D Materials in a Topological Phase";
    Poster: Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Caen, France; 01.09.2021 - 03.09.2021; in "Book of Abstracts of the Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)", (2021), 52 - 53. BibTeX

    2030. Yu. Illarionov, T. Knobloch, T. Grasser:
    "Crystalline Insulators for Scalable 2D Nanoelectronics";
    Talk: International Conference on Insulating Films on Semiconductors (INFOS), Rende (CS), Italy; (invited) 29.06.2021 - 02.07.2021; . BibTeX

    2029. C. Lenz, A. Toifl, A. Hössinger, J. Weinbub:
    "Curvature-Based Feature Detection for Hierarchical Grid Refinement in Epitaxial Growth Simulations";
    Talk: Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Caen, France; 01.09.2021 - 03.09.2021; in "Book of Abstracts of the Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)", (2021), 109 - 110. BibTeX

    2028. S. Fiorentini, M. Bendra, J. Ender, R. Orio, S. Selberherr, W. Goes, V. Sverdlov:
    "Design Support for Ultra-Scaled MRAM Cells";
    Poster: IEEE International Electron Devices Meeting (IEDM), San Francisco, USA; 13.12.2021 - 15.12.2021; in "Proceedings of the IEEE International Electron Devices Meeting (IEDM) Special Poster Session Dedicated to MRAM", (2021), 1 page(s) . BibTeX

    2027. S. Naz, A. Shah, S. Ahmed, G. Patrick, M. Waltl:
    "Design of Fault-Tolerant and Thermally Stable XOR Gate in Quantum dot Cellular Automata";
    Poster: IEEE European Test Symposium (ETS), Bruges, Belgium (Virtual); 24.05.2021 - 28.05.2021; in "Proceedings of the IEEE European Test Symposium (ETS)", (2021), doi:10.1109/ETS50041.2021.9465459. BibTeX

    2026. R. Orio, J. Ender, S. Fiorentini, W. Goes, S. Selberherr, V. Sverdlov:
    "Deterministic Spin-Orbit Switching Scheme for an Array of Perpendicular MRAM Cells Suitable for Large Scale Integration";
    Talk: Trends in Magnetism (TMAG), Cefalù, Italy; 06.09.2021 - 10.09.2021; in "Proceedings of the Trends in Magnetism Conference (TMAG)", (2021), . BibTeX

    2025. N. Jørstad, S. Fiorentini, W. Goes, V. Sverdlov:
    "Efficient Finite Element Method Approach to Model Spin Orbit Torque MRAM";
    Talk: International MOS-AK Workshop, Silicon Valley, USA; 17.12.2021 in "Proceedings of the 14th International MOS-AK Workshop", (2021), 1. BibTeX

    2024. J. Weinbub, M. Ballicchia, M. Nedjalkov, S. Selberherr:
    "Electromagnetic Coherent Electron Control";
    Talk: IEEE Latin America Electron Devices Conference (LAEDC), virtual; (invited) 19.04.2021 - 21.04.2021; in "Proceedings of the IEEE Latin America Electron Devices Conference (LAEDC)", (2021), ISBN: 978-1-6654-1510-1, 1 - 4 doi:10.1109/LAEDC51812.2021.9437949. BibTeX

    2023. J. Weinbub, M. Ballicchia, M. Nedjalkov:
    "Electron Quantum Optics for Quantum Interference Logic Devices";
    Talk: Workshop on Innovative Nanoscale Devices and Systems (WINDS), Hawaii, USA; 28.11.2021 - 03.12.2021; in "WINDS Book of Abstracts", (2021), ISBN: 978-3-9504738-3-4, 58 - 59. BibTeX

    2022. J. Ender, R. Orio, V. Sverdlov:
    "Enhancing SOT-MRAM Switching Using Machine Learning";
    Talk: Silvaco Users Global Event (SURGE), Santa Clara, CA, USA - virtual; (invited) 14.10.2021 in "Proceedings of the Silvaco Users Global Event (SURGE)", (2021), 1. BibTeX

    2021. Yu. Illarionov, A. Banshchikov, N. S. Sokolov, V. V. Fedorov, S. M. Suturin, M. I. Vexler, T. Knobloch, D.K Polyushkin, T. Mueller, T. Grasser:
    "Epitaxial Fluorides as a Universal Platform for More Moore and More than Moore Electronics Based on 2D Materials";
    Talk: Scientific Council Meeting of the Russian Academy of Sciences, Moscow, Russia; (invited) 08.04.2021. BibTeX

    2020. C. Lenz, A. Scharinger, M. Quell, P. Manstetten, A. Hössinger, J. Weinbub:
    "Evaluating Parallel Feature Detection Methods for Implicit Surfaces";
    Talk: Austrian-Slovenian HPC Meeting (ASHPC), Maribor, Slovenia (Virtual); 31.05.2021 - 02.06.2021; in "Book of Abstracts of the Austrian-Slovenian HPC Meeting (ASHPC)", (2021), 31. BibTeX

    2019. J. Michl, A. Grill, D. Waldhör, C. Schleich, T. Knobloch, E. Ioannidis, H. Enichlmair, R. Minixhofer, B. Kaczer, B. Parvais, B. Govoreanu, I. Radu, T. Grasser, M. Waltl:
    "Evidence of Tunneling Driven Random Telegraph Noise in Cryo-CMOS";
    Talk: IEEE International Electron Devices Meeting (IEDM), San Francisco, USA; 11.12.2021 - 15.12.2021; in "2021 IEEE International Electron Devices Meeting (IEDM)", (2021), 31.3.1 - 31.3.3 doi:10.1109/IEDM19574.2021.9720501. BibTeX

    2018. L. Filipovic, X. Klemenschits:
    "Fast Model for Deposition in Trenches using Geometric Advection";
    Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Dallas, Texas (USA); 27.09.2021 - 29.09.2021; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2021), 224 - 228 doi:10.1109/SISPAD54002.2021.9592595. BibTeX

    2017. F. Rodrigues, L.F. Aguinsky, A. Toifl, A. Hössinger, J. Weinbub:
    "Feature Scale Modeling of Fluorocarbon Plasma Etching for Via Structures including Faceting Phenomena";
    Talk: International Workshop on Computational Nanotechnology (IWCN), Daejeon, Korea (Virtual); 24.05.2021 - 06.06.2021; in "Book of Abstracts of the International Workshop on Computational Nanotechnology (IWCN)", (2021), ISBN: 978-89-89453-30-7, 101 - 102. BibTeX

    2016. L.F. Aguinsky, G. Wachter, A. Scharinger, F. Rodrigues, A. Toifl, M. Trupke, U. Schmid, A. Hössinger, J. Weinbub:
    "Feature-Scale Modeling of Isotropic SF6 Plasma Etching of Si";
    Poster: Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Caen, France; 01.09.2021 - 03.09.2021; in "Book of Abstracts of the Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)", (2021), 54 - 55. BibTeX

    2015. M. Bendra, J. Ender, S. Fiorentini, T. Hadámek, R. Orio, W. Goes, S. Selberherr, V. Sverdlov:
    "Finite Element Method Approach to MRAM Modeling";
    Talk: International Convention on Information, Communication and Electronic Technology (MIPRO), Opatija, Croatia; 27.09.2021 - 01.10.2021; in "Proceedings of the International Convention on Information, Communication and Electronic Technology (MIPRO)", (2021), ISBN: 978-953-233-101-1, 70 - 73 doi:10.23919/MIPRO52101.2021.9597194. BibTeX

    2014. A.-M. El-Sayed, H. Seiler, H. Kosina, V. Sverdlov:
    "First Principles Approach to Study Topologically Protected Edge States in 1T′ MoS2 Nanoribbons";
    Talk: Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Caen, France; 01.09.2021 - 03.09.2021; in "Book of Abstracts of the Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)", (2021), 113 - 114. BibTeX

    2013. L. Filipovic, S. Selberherr:
    "Gas Sensing with Two-Dimensional Materials Beyond Graphene";
    Talk: International Conference on Microelectronics (MIEL), Nis, Serbia; (invited) 12.09.2021 - 14.09.2021; in "Proceedings of the International Conference on Microelectronics (MIEL)", (2021), ISBN: 978-1-6654-4526-9, 29 - 36 doi:10.1109/MIEL52794.2021.9569088. BibTeX

    2012. T. Hadámek, S. Selberherr, W. Goes, V. Sverdlov:
    "Heating Asymmetry in Magnetoresistive Random Access Memories";
    Talk: World Multi-Conference on Systemics, Cybernetics and Informatics (WMSCI), Orlando, Florida, USA (Virtual); 18.07.2021 - 21.07.2021; in "Proceedings of the World Multi-Conference on Systemics, Cybernetics and Informatics (WMSCI)", (2021), ISBN: 978-1-950492-55-8, 63 - 66. BibTeX

    2011. M. Waltl:
    "Impact of Defects in Semiconductor Transistors on Devices and Circuits";
    Talk: International Meet on Nanotechnology (NANOMEET), Porto, Portugal; (invited) 13.09.2021 - 15.09.2021; in "Proceedings of the International Meet on Nanotechnology (NANOMEET)", (2021), 93. BibTeX

    2010. T. Reiter, X. Klemenschits, L. Filipovic:
    "Impact of High-Aspect-Ratio Etching Damage on Selective Epitaxial Silicon Growth in 3D NAND Flash Memory";
    Poster: Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Caen, France; 01.09.2021 - 03.09.2021; in "Book of Abstracts of the Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)", (2021), 34 - 35. BibTeX

    2009. M. Kampl, H. Kosina, M. Waltl:
    "Improved Sampling Algorithms for Monte Carlo Device Simulation";
    Talk: International Workshop on Computational Nanotechnology (IWCN), Daejeon, Korea (Virtual); 24.05.2021 - 06.06.2021; in "Book of Abstracts of the International Workshop on Computational Nanotechnology (IWCN)", (2021), ISBN: 978-89-89453-30-7, 53 - 54. BibTeX

    2008. J. Ender, R. Orio, S. Fiorentini, S. Selberherr, W. Gös, V. Sverdlov:
    "Improving Failure Rates in Pulsed SOT-MRAM Switching by Reinforcement Learning";
    Talk: European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), Bordeaux, France; 04.10.2021 - 07.10.2021; in "Proceedings of the 32nd European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis", (2021), ISSN: 0026-2714, 1 - 4 doi:10.1016/j.microrel.2021.114231. BibTeX

    2007. J. Franco, J. Marneffe, A. Vandooren, H. Arimura, L. Ragnarsson, D. Claes, E. D. Litta, N. Horiguchi, K. Croes, D. Linten, T. Grasser, B. Kaczer:
    "Low Temperature Atomic Hydrogen Treatment for Superior NBTI Reliability -- Demonstration and Modeling across SiO2 IL Thicknesses from 1.8 to 0.6 nm for I/O and Core Logic";
    Talk: International Symposium on VLSI Technology, Kyoto, Japan; 13.06.2021 - 19.06.2021; in "2021 Symposium on VLSI Technology (VLSIT)", (2021), ISBN: 978-1-6654-1945-1, 1 - 2. BibTeX

    2006. D. Milardovich, M. Jech, D. Waldhör, A.-M. El-Sayed, T. Grasser:
    "Machine Learning Prediction of Defect Structures in Amorphous Silicon Dioxide";
    Talk: European Solid-State Device Research Conference (ESSDERC), Grenoble, France; 13.09.2021 - 22.09.2021; in "Proceedings of the European Solid-State Device Research Conference (ESSDERC)", (2021), ISBN: 978-1-6654-3748-6, 239 - 242 doi:10.1109/ESSDERC53440.2021.9631837. BibTeX

    2005. M. Ballicchia, M. Benam, M. Nedjalkov, S. Selberherr, J. Weinbub:
    "Modeling Coulomb Interaction with a 'Wigner-Poisson' Coupling Scheme";
    Talk: International Wigner Workshop (IW2), Daejeon, Korea (Virtual); 17.05.2021 - 21.05.2021; in "Book of Abstracts of the International Wigner Workshop (IW2)", (2021), ISBN: 978-3-9504738-2-7, 64 - 65. BibTeX

    2004. L. Filipovic:
    "Modeling and Simulation of ALD in a Level Set Framework";
    Talk: EFDS Workshop on Simulation for ALD, virtual; (invited) 25.03.2021 in "Proceedings of the EFDS Workshop on Simulation for ALD", (2021), 9. BibTeX

    2003. J. Weinbub:
    "Modeling and Simulation of Two-Dimensional Single-Electron Control";
    Talk: International Meet on Nanotechnology (NANOMEET), Porto, Portugal; (invited) 13.09.2021 - 15.09.2021; in "Proceedings of the International Meet on Nanotechnology (NANOMEET)", (2021), . BibTeX

    2002. J. Weinbub:
    "Modeling and Simulation of Two-Dimensional Single-Electron Dynamics";
    Talk: Global Summit on Condensed Matter Physics (CONMAT), Valencia, Spain (virtual); (invited) 18.10.2021 - 20.10.2021; in "Proceedings of the Global Summit on Condensed Matter Physics (CONMAT)", (2021), . BibTeX

    2001. L. Cvitkovich, M. Jech, D. Waldhör, A.-M. El-Sayed, C. Wilhelmer, T. Grasser:
    "Multiscale Modeling Study of Native Oxide Growth on a Si(100) Surface";
    Talk: European Solid-State Device Research Conference (ESSDERC), Grenoble, France; 13.09.2021 - 22.09.2021; in "Proceedings of the European Solid-State Device Research Conference (ESSDERC)", (2021), ISBN: 978-1-6654-3748-6, 235 - 238 doi:10.1109/ESSDERC53440.2021.9631790. BibTeX

    2000. J. Franco, H. Arimura, J. Marneffe, A. Vandooren, L. Ragnarsson, Z. Wu, D. Claes, E. D. Litta, N. Horiguchi, K. Croes, D. Linten, T. Grasser, B. Kaczer:
    "Novel Low Thermal Budget Gate Stack Solutions for BTI Reliability in Future Logic Device Technologies";
    Talk: IEEE International Conference on IC Design and Technology (ICICDT), Dresden, Germany; 15.09.2021 - 17.09.2021; in "Proceedings of IEEE International Conference on IC Design and Technology", (2021), ISBN: 978-1-6654-4998-4, 1 - 4 doi:10.1109/ICICDT51558.2021.9626482. BibTeX

    1999. H. Kosina, H. Seiler, V. Sverdlov:
    "Numerical Calculation of the Transverse Modes in 1T' MoS2 Nanoribbons";
    Talk: International Workshop on Computational Nanotechnology (IWCN), Daejeon, Korea (Virtual); 24.05.2021 - 06.06.2021; in "Book of Abstracts of the International Workshop on Computational Nanotechnology (IWCN)", (2021), ISBN: 978-89-89453-30-7, 2 - 3. BibTeX

    1998. R. Kosik, J. Cervenka, H. Kosina:
    "Open Boundary Conditions for the Wigner and the Characteristic von Neumann Equation";
    Talk: International Wigner Workshop (IW2), Daejeon, Korea (Virtual); 17.05.2021 - 21.05.2021; in "Book of Abstracts of the International Wigner Workshop (IW2)", (2021), ISBN: 978-3-9504738-2-7, 42 - 43. BibTeX

    1997. C. Wen, Yu. Illarionov, W. Frammelsberger, T. Knobloch, T. Grasser, M. Lanza:
    "Outstanding Dielectric Properties of Ultra-thin CaF2 Dielectric Films";
    Talk: APS March Meeting, College Park, MD, USA; 15.03.2021 - 19.03.2021; in "Bulletin of the American Physical Society", (2021), . BibTeX

    1996. F. Ribeiro, K. Rupp, T. Grasser:
    "Parallel Solver Study for Solving the Boltzmann Transport Equation using Spherical Harmonics Expansions on Supercomputers";
    Talk: International Workshop on Computational Nanotechnology (IWCN), Daejeon, Korea (Virtual); 24.05.2021 - 06.06.2021; in "Book of Abstracts of the International Workshop on Computational Nanotechnology (IWCN)", (2021), ISBN: 978-89-89453-30-7, 97 - 98. BibTeX

    1995. J. Ender, S. Fiorentini, V. Sverdlov, W. Goes, R. Orio, S. Selberherr:
    "Reinforcement Learning Approach for Deterministic SOT-MRAM Switching";
    Talk: SPIE Spintronics, San Diego, CA, USA - virtual; (invited) 01.08.2021 - 05.08.2021; in "Proceedings of SPIE Spintronics", (2021), 11805-53. BibTeX

    1994. J. Ender, R. Orio, S. Fiorentini, S. Selberherr, W. Goes, V. Sverdlov:
    "Reinforcement Learning Approach for Sub-Critical Current SOT-MRAM Switching Materials";
    Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Dallas, Texas (USA); 27.09.2021 - 29.09.2021; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2021), 150 - 154 doi:10.1109/SISPAD54002.2021.9592561. BibTeX

    1993. J. Ender, R. Orio, S. Fiorentini, S. Selberherr, W. Goes, V. Sverdlov:
    "Reinforcement Learning to Reduce Failures in SOT-MRAM Switching";
    Talk: IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), Singapore; 15.09.2021 - 15.10.2021; in "Proceedings of the IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)", (2021), ISBN: 978-1-6654-3988-6, doi:10.1109/IPFA53173.2021.9617362. BibTeX

    1992. L. Filipovic:
    "Reliability and Stability of MEMS Microheaters for Gas Sensors";
    Talk: IEEE International Integrated Reliability Workshop (IIRW), online; (invited) 04.10.2021 - 28.10.2021; in "2021 IEEE International Integrated Reliability Workshop (IIRW)", (2021), ISBN: 978-1-6654-1794-5, doi:10.1109/IIRW53245.2021.9635162. BibTeX

    1991. J. Weinbub, M. Ballicchia, M. Nedjalkov:
    "Single Electron Control for Quantum Interference Devices";
    Talk: Summer School on Methods and Models of Kinetic Theory - Winter Prelude, Porto Ercole, Italy - virtual; (invited) 08.02.2021 - 10.02.2021; . BibTeX

    1990. S. Fiorentini, J. Ender, R. Orio, S. Selberherr, W. Goes, V. Sverdlov:
    "Spin Drift-Diffusion Approach for the Computation of Torques in Multi-Layered Structures";
    Talk: International Workshop on Computational Nanotechnology (IWCN), Daejeon, Korea (Virtual); 24.05.2021 - 06.06.2021; in "Book of Abstracts of the International Workshop on Computational Nanotechnology (IWCN)", (2021), ISBN: 978-89-89453-30-7, 51 - 52. BibTeX

    1989. S. Fiorentini, J. Ender, R. Orio, S. Selberherr, W. Goes, V. Sverdlov:
    "Spin and Charge Drift-Diffusion Approach to Torque Computation in Magnetic Tunnel Junctions";
    Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Dallas, Texas (USA); 27.09.2021 - 29.09.2021; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2021), 155 - 158 doi:10.1109/SISPAD54002.2021.9592559. BibTeX

    1988. S. Fiorentini, R. Orio, S. Selberherr, J. Ender, W. Goes, V. Sverdlov:
    "Spin and Charge Drift-Diffusion Approach to Torque Computation in Spintronic Devices";
    Talk: 2021 Workshop on Innovative Nanoscale Devices and Systems (WINDS2021), Kona; 28.11.2021 - 03.12.2021; in "WINDS Book of Abstracts", (2021), ISBN: 978-3-9504738-3-4, 12 - 13. BibTeX

    1987. C. Wilhelmer, M. Jech, D. Waldhör, A.-M. El-Sayed, L. Cvitkovich, T. Grasser:
    "Statistical Ab Initio Analysis of Electron Trapping Oxide Defects in the Si/SiO2 Network";
    Talk: European Solid-State Device Research Conference (ESSDERC), Grenoble, France; 13.09.2021 - 22.09.2021; in "Proceedings of the European Solid-State Device Research Conference (ESSDERC)", (2021), ISBN: 978-1-6654-3748-6, 243 - 246 doi:10.1109/ESSDERC53440.2021.9631833. BibTeX

    1986. F. Rodrigues, L.F. Aguinsky, A. Toifl, A. Scharinger, A. Hössinger, J. Weinbub:
    "Surface Reaction and Topography Modeling of Fluorocarbon Plasma Etching";
    Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Dallas, Texas (USA); 27.09.2021 - 29.09.2021; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2021), 229 - 232 doi:10.1109/SISPAD54002.2021.9592583. BibTeX

    1985. T. Hadámek, M. Bendra, S. Fiorentini, J. Ender, R. Orio, W. Goes, S. Selberherr, V. Sverdlov:
    "Temperature Increase in MRAM at Writing: A Finite Element Approach";
    Talk: Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Caen, France; 01.09.2021 - 03.09.2021; in "Book of Abstracts of the Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)", (2021), 133 - 134. BibTeX

    1984. S. Tyaginov, A. Grill, M. Vandemaele, T. Grasser, G. Hellings, A. Makarov, M. Jech, D. Linten, B. Kaczer:
    "A Compact Physics Analytical Model for Hot-Carrier Degradation";
    Talk: IEEE International Reliability Physics Symposium (IRPS), Dallas, TX, USA - virtual; 28.04.2020 in "Proceedings of the IEEE International Reliability Physics Symposium (IRPS)", (2020), ISBN: 978-1-7281-3199-3, 1 - 7 doi:10.1109/IRPS45951.2020.9128327. BibTeX

    1983. C. Lenz, A. Scharinger, A. Hössinger, J. Weinbub:
    "A Novel Surface Mesh Coarsening Method for Flux-Dependent Topography Simulations of Semiconductor Fabrication Processes";
    Talk: International Conferences on Scientific Computing in Electrical Engineering (SCEE), Eindhoven, The Netherlands; 16.02.2020 - 20.02.2020; in "Book of Abstracts of the International Conferences on Scientific Computing in Electrical Engineering (SCEE)", (2020), 99 - 100. BibTeX

    1982. T. Knobloch, J. Michl, D. Waldhör, Yu. Illarionov, B. Stampfer, A. Grill, R. Zhou, P. Wu, M. Waltl, J. Appenzeller, T. Grasser:
    "Analysis of Single Electron Traps in Nano-scaled MoS2 FETs at Cryogenic Temperatures";
    Talk: Device Research Conference (DRC), Columbus, OH, USA - virtual; 21.06.2020 - 24.06.2020; in "Proceedings of the Device Research Conference (DRC)", (2020), 52 - 53. BibTeX

    1981. H. Kosina, H. Seiler, V. Sverdlov:
    "Analytical Formulae for the Surface Green´s Functions of Graphene and 1T´ MoS2 Nanoribbons";
    Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Kobe, Japan - virtual; 23.09.2020 - 06.10.2020; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2020), 185 - 188 doi:10.23919/SISPAD49475.2020.9241650. BibTeX

    1980. Yu. Illarionov, T. Knobloch, K. Smithe, M. Waltl, R. Grady, D. Waldhör, E. Pop, T. Grasser:
    "Anomalous Instabilities in CVD-MoS2 FETs Suppressed by High-Quality Al2O3 Encapsulation";
    Poster: Device Research Conference (DRC), Columbus, OH, USA - virtual; 21.06.2020 - 24.06.2020; in "Proceedings of the Device Research Conference (DRC)", (2020), 150 - 151. BibTeX

    1979. B. Ruch, M. Jech, G. Pobegen, T. Grasser:
    "Applicability of Shockley-Read-Hall Theory for Interface States";
    Talk: IEEE International Electron Devices Meeting (IEDM), San Francisco, CA, USA - virtual; 12.12.2020 - 18.12.2020; in "Proceedings of the IEEE International Electron Devices Meeting (IEDM)", (2020), 449 - 452 doi:10.1109/IEDM13553.2020.9372032. BibTeX

    1978. V. Sverdlov, A.-M. El-Sayed, H. Kosina, S. Selberherr:
    "Ballistic Conductance in a Topological 1T´-MoS2 Nanoribbon";
    Poster: International Symposium on Nanostructures: Physics and Technology (NANO), Minsk, Belarus - virtual; 28.09.2020 - 02.10.2020; in "Proceedings of the International Symposium on Nanostructures: Physics and Technology (NANO)", (2020), ISBN: 978-5-93634-066-6, 200 - 201. BibTeX

    1977. S. Fiorentini, J. Ender, S. Selberherr, R. Orio, W. Goes, V. Sverdlov:
    "Comprehensive Modeling of Coupled Spin and Charge Transport through Magnetic Tunnel Junctions";
    Talk: Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Caen, France - virtual; 31.03.2020 - 02.04.2020; in "Book of Abstracts of the Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)", (2020), 112 - 113. BibTeX

    1976. S. Fiorentini, J. Ender, M. Mohamedou, V. Sverdlov, W. Goes, R. Orio, S. Selberherr:
    "Comprehensive Modeling of Coupled Spin-Charge Transport and Magnetization Dynamics in STT-MRAM Cells";
    Talk: SPIE Spintronics, San Diego, CA, USA - virtual; (invited) 24.08.2020 - 28.08.2020; in "Proceedings of SPIE Spintronics", (2020), 11470-44. BibTeX

    1975. S. Fiorentini, J. Ender, M. Mohamedou, R. Orio, S. Selberherr, W. Goes, V. Sverdlov:
    "Computation of Torques in Magnetic Tunnel Junctions through Spin and Charge Transport Modeling";
    Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Kobe, Japan - virtual; 23.09.2020 - 06.10.2020; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2020), 209 - 212 doi:10.23919/SISPAD49475.2020.9241657. BibTeX

    1974. Yu. Illarionov, A. Banshchikov, T. Knobloch, D.K Polyushkin, S. Wachter, V. V. Fedorov, S. M. Suturin, M. Stöger-Pollach, M. I. Vexler, N. S. Sokolov, T. Grasser:
    "Crystalline Calcium Fluoride: A Record-Thin Insulator for Nanoscale 2D Electronics";
    Talk: Device Research Conference (DRC), Columbus, OH, USA - virtual; 21.06.2020 - 24.06.2020; in "Proceedings of the Device Research Conference (DRC)", (2020), 1 - 2 doi:10.1109/DRC50226.2020.9135160. BibTeX

    1973. M. Waltl:
    "Defect Spectroscopy in SiC Devices";
    Talk: IEEE International Reliability Physics Symposium (IRPS), Dallas, TX, USA - virtual; (invited) 28.04.2020 in "Proceedings of the IEEE International Reliability Physics Symposium (IRPS)", (2020), 1 - 9 doi:10.1109/IRPS45951.2020.9129539. BibTeX

    1972. K. Tselios, B. Stampfer, J. Michl, E. Ioannidis, H. Enichlmair, M. Waltl:
    "Distribution of Step Heights of Electron and Hole Traps in SiON nMOS Transistors";
    Talk: IEEE International Integrated Reliability Workshop (IIRW), South Lake Tahoe, CA, USA - virtual; 04.10.2020 - 08.10.2020; in "Proceedings of the International Integrated Reliability Workshop (IIRW)", (2020), 1 - 6 doi:10.1109/IIRW49815.2020.9312871. BibTeX

    1971. J. Ender, M. Mohamedou, S. Fiorentini, R. Orio, S. Selberherr, W. Goes, V. Sverdlov:
    "Efficient Demagnetizing Field Calculation for Disconnected Complex Geometries in STT-MRAM Cells";
    Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Kobe, Japan - virtual; 23.09.2020 - 06.10.2020; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2020), 213 - 216 doi:10.23919/SISPAD49475.2020.9241662. BibTeX

    1970. L. Filipovic:
    "Electromigration Model for Platinum Hotplates";
    Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Kobe, Japan - virtual; 23.09.2020 - 06.10.2020; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2020), 315 - 318 doi:10.23919/SISPAD49475.2020.9241645. BibTeX

    1969. V. Sverdlov, S. Fiorentini, J. Ender, W. Goes, R. Orio, S. Selberherr:
    "Emerging CMOS Compatible Magnetic Memories and Logic";
    Talk: IEEE Latin America Electron Devices Conference (LAEDC), San Jose, Costa Rica; (invited) 25.02.2020 - 28.02.2020; in "Proceedings of the IEEE Latin America Electron Devices Conference (LAEDC)", (2020), ISBN: 978-1-7281-1044-8, doi:10.1109/LAEDC49063.2020.9073332. BibTeX

    1968. B. Ruch, G. Pobegen, C. Schleich, T. Grasser:
    "Generation of Hot-Carrier Induced Border and Interface Traps, Investigated by Spectroscopic Charge Pumping";
    Talk: IEEE International Reliability Physics Symposium (IRPS), Dallas, TX, USA - virtual; 28.04.2020 in "Proceedings of the IEEE International Reliability Physics Symposium (IRPS)", (2020), ISBN: 978-1-7281-3200-6, 1 - 6 doi:10.1109/IRPS45951.2020.9129513. BibTeX

    1967. A. Scharinger, P. Manstetten, A. Hössinger, J. Weinbub:
    "Generative Model Based Adaptive Importance Sampling for Flux Calculations in Process TCAD";
    Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Kobe, Japan - virtual; 23.09.2020 - 06.10.2020; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2020), 39 - 42 doi:10.23919/SISPAD49475.2020.9241615. BibTeX

    1966. X. Klemenschits, S. Selberherr, L. Filipovic:
    "Geometric Advection Algorithm for Process Emulation";
    Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Kobe, Japan - virtual; 23.09.2020 - 06.10.2020; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2020), 59 - 62 doi:10.23919/SISPAD49475.2020.9241678. BibTeX

    1965. L. Filipovic, S. Selberherr:
    "Granularity Effects in Electromigration";
    Talk: IEEE Latin America Electron Devices Conference (LAEDC), San Jose, Costa Rica; (invited) 25.02.2020 - 28.02.2020; in "Proceedings of the IEEE Latin America Electron Devices Conference (LAEDC)", (2020), ISBN: 978-1-7281-1044-8, doi:10.1109/LAEDC49063.2020.9072963. BibTeX

    1964. S. Fiorentini, R. Orio, S. Selberherr, J. Ender, W. Goes, V. Sverdlov:
    "Influence of Current Redistribution in Switching Models for Perpendicular STT-MRAM";
    Talk: Meeting of the Electrochemical Society (ECS), Montreal, Canada - virtual; 10.05.2020 - 14.05.2020; in "Abstracts of the Meeting of the Electrochemical Society (ECS)", (2020), MA2020-01/1389, doi:10.1149/MA2020-01241389mtgabs. BibTeX

    1963. L. Filipovic, S. Selberherr:
    "Integration of Gas Sensors with CMOS Technology";
    Talk: IEEE Electron Devices Technology and Manufacturing Conference (EDTM), Penang, Malaysia - virtual; (invited) 16.03.2020 - 18.03.2020; in "Proceedings of the IEEE Electron Devices Technology and Manufacturing Conference (EDTM)", (2020), ISBN: 978-1-7281-2539-8, 294 - 297 doi:10.1109/EDTM47692.2020.9117828. BibTeX

    1962. Yu. Illarionov, T. Knobloch, M. Waltl, S. Majumdar, M. Soikkeli, W. Kim, S. Wachter, D.K Polyushkin, S. Arpiainen, M. Prunnila, A. Mueller, T. Grasser:
    "Low Variability and 1010 On/Off Current Ratio in Flexible MoS2 FETs with Al2O3 Encapsulation Improved by Parylene N";
    Talk: Electronic Materials Conference (EMC), Columbus, OH, USA - virtual; 24.06.2020 - 26.06.2020; in "Proceedings of the Electronic Materials Conference (EMC)", (2020), 25. BibTeX

    1961. D. Milardovich, M. Jech, D. Waldhör, M. Waltl, T. Grasser:
    "Machine Learning Prediction of Formation Energies in a-SiO2";
    Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Kobe, Japan - virtual; 23.09.2020 - 06.10.2020; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2020), 339 - 342 doi:10.23919/SISPAD49475.2020.9241609. BibTeX

    1960. V. Sverdlov:
    "Modeling Spin Transfer Torque Magnetoresistive Memory";
    Talk: Silvaco Users Global Event (SURGE), Santa Clara, CA, USA - virtual; (invited) 20.10.2020 in "Proceedings of the Silvaco Users Global Event (SURGE)", (2020), 1. BibTeX

    1959. A. Vasilev, M. Jech, A. Grill, G. Rzepa, C. Schleich, A. Makarov, G. Pobegen, T. Grasser, M. Waltl, S. E. Tyaginov:
    "Modeling the Hysteresis of Current-Voltage Characteristics in 4H-SiC Transistors";
    Talk: IEEE International Integrated Reliability Workshop (IIRW), South Lake Tahoe, CA, USA - virtual; 04.10.2020 - 08.10.2020; in "Proceedings of the International Integrated Reliability Workshop (IIRW)", (2020), 1 - 4 doi:10.1109/IIRW49815.2020.9312864. BibTeX

    1958. R. Kosik, J. Cervenka, H. Kosina:
    "Numerical Solution of the Constrained Wigner Equation";
    Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Kobe, Japan - virtual; 23.09.2020 - 06.10.2020; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2020), 189 - 191 doi:10.23919/SISPAD49475.2020.9241624. BibTeX

    1957. A. Kruv, B. Kaczer, A. Grill, M. Gonzalez, J. Franco, D. Linten, W. Goes, T. Grasser, I. De Wolf:
    "On the Impact of Mechanical Stress on Gate Oxide Trapping";
    Talk: IEEE International Reliability Physics Symposium (IRPS), Dallas, TX, USA - virtual; 28.04.2020 - 30.04.2020; in "Proceedings of the IEEE International Reliability Physics Symposium (IRPS)", (2020), 1 - 5 doi:10.1109/IRPS45951.2020.9129541. BibTeX

    1956. S. Fiorentini, R. Orio, S. Selberherr, J. Ender, W. Goes, V. Sverdlov:
    "Perpendicular STT-MRAM Switching at Fixed Voltage and at Fixed Current";
    Talk: IEEE Electron Devices Technology and Manufacturing Conference (EDTM), Penang, Malaysia - virtual; 16.03.2020 - 18.03.2020; in "Proceedings of the IEEE Electron Devices Technology and Manufacturing Conference (EDTM)", (2020), ISBN: 978-1-7281-2539-8, 341 - 344 doi:10.1109/EDTM47692.2020.9117985. BibTeX

    1955. A. Toifl:
    "Physical Process TCAD: Victory Process´ Crystal Anisotropy Engine";
    Talk: Silvaco Users Global Event (SURGE), Santa Clara, CA, USA - virtual; (invited) 20.10.2020 in "Proceedings of the Silvaco Users Global Event (SURGE)", (2020), 1. BibTeX

    1954. J. Michl, A. Grill, D. Claes, G. Rzepa, B. Kaczer, D. Linten, I. Radu, T. Grasser, M. Waltl:
    "Quantum Mechanical Charge Trap Modeling to Explain BTI at Cryogenic Temperatures";
    Talk: IEEE International Reliability Physics Symposium (IRPS), Dallas, TX, USA - virtual; 28.04.2020 - 30.05.2020; in "Proceedings of the IEEE International Reliability Physics Symposium (IRPS)", (2020), ISBN: 978-1-7281-3199-3, 1 - 6 doi:10.1109/IRPS45951.2020.9128349. BibTeX

    1953. R. Orio, J. Ender, S. Fiorentini, W. Goes, S. Selberherr, V. Sverdlov:
    "Reduced Current Spin-Orbit Torque Switching of a Perpendicularly Magnetized Free Layer";
    Talk: Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Caen, France - virtual; 01.09.2020 in "Book of Abstracts of the Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)", (2020), 123 - 124. BibTeX

    1952. A. Grill, E. Bury, J. Michl, S. Tyaginov, D. Linten, T. Grasser, B. Parvais, B. Kaczer, M. Waltl, I. Radu:
    "Reliability and Variability of Advanced CMOS Devices at Cryogenic Temperatures";
    Talk: IEEE International Reliability Physics Symposium (IRPS), Dallas, TX, USA - virtual; 28.04.2020 - 30.04.2020; in "Proceedings of the IEEE International Reliability Physics Symposium (IRPS)", (2020), ISBN: 978-1-7281-3199-3, 1 - 6 doi:10.1109/IRPS45951.2020.9128316. BibTeX

    1951. M. Quell, G. Diamantopoulos, A. Hössinger, J. Weinbub:
    "Shared-Memory Block-Based Fast Marching Method for Hierarchical Meshes";
    Talk: European Seminar on Computing (ESCO), Pilsen, Czech Republic - virtual; 08.06.2020 - 11.06.2020; in "Proceedings of the European Seminar on Computing (ESCO)", (2020), 1 page(s) . BibTeX

    1950. J. Berens, M. Weger, G. Pobegen, T. Aichinger, G. Rescher, C. Schleich, T. Grasser:
    "Similarities and Differences of BTI in SiC and Si Power MOSFETs";
    Talk: IEEE International Reliability Physics Symposium (IRPS), Dallas, TX, USA - virtual; 29.03.2020 - 02.04.2020; in "Proceedings of the IEEE International Reliability Physics Symposium (IRPS)", (2020), ISBN: 978-1-7281-3200-6, 1 - 6 doi:10.1109/IRPS45951.2020.9129259. BibTeX

    1949. M. Ballicchia, M. Nedjalkov, J. Weinbub:
    "Single Electron Control by a Uniform Magnetic Field in a Focusing Double-Well Potential Structure";
    Talk: IEEE International Conference on Nanotechnology (NANO), Montreal, Canada - virtual; 29.07.2020 - 31.07.2020; in "Proceedings of the IEEE International Conference on Nanotechnology (NANO)", (2020), ISBN: 978-1-7281-8264-3, 73 - 76 doi:10.1109/NANO47656.2020.9183565. BibTeX

    1948. M. Waltl:
    "Spectroscopy of Single Defects in Semiconductor Transistors";
    Talk: International Conference on Materials Science and Engineering (MatScience), San Francisco, CA, USA - virtual; (invited) 05.11.2020 - 06.11.2020; in "Book of Abstracts of the International Conference on Materials Science and Engineering (MatScience)", (2020), . BibTeX

    1947. V. Sverdlov, A.-M. El-Sayed, S. Selberherr:
    "Subband Structure and Ballistic Conductance of a Molybdenum Disulfide Nanoribbon in Topological 1T´ Phase: A k∙p Study";
    Talk: International Conference on Mixed Design of Integrated Circuits and Systems (MIXDES), Lodz, Poland - virtual; 25.06.2020 - 27.06.2020; in "Book of Abstracts of the International Conference on Mixed Design of Integrated Circuits and Systems (MIXDES)", (2020), 58. BibTeX

    1946. R. Orio, A. Makarov, W. Goes, J. Ender, S. Fiorentini, S. Selberherr, V. Sverdlov:
    "Switching of a Perpendicularly Magnetized Free-Layer by Spin-Orbit-Torques with Reduced Currents";
    Talk: World Multi-Conference on Systemics, Cybernetics and Informatics (WMSCI), Orlando, FL, USA - virtual; 13.09.2020 - 16.09.2020; in "Proceedings of the World Multi-Conference on Systemics, Cybernetics and Informatics (WMSCI)", (2020), ISBN: 978-1-950492-37-4, 58 - 61. BibTeX

    1945. T. Knobloch, Yu. Illarionov, B. Uzlu, M. Waltl, D. Neumaier, M. Lemme, T. Grasser:
    "The Impact of the Graphene Work Function on the Stability of Flexible GFETs";
    Talk: Electronic Materials Conference (EMC), Columbus, OH, USA - virtual; 24.06.2020 - 26.06.2020; in "Proceedings of the Electronic Materials Conference (EMC)", (2020), . BibTeX

    1944. T. Grasser, B. Kaczer, B. O´Sullivan, G. Rzepa, B. Stampfer, M. Waltl:
    "The Mysterious Bipolar Bias Temperature Stress from the Perspective of Gate-Sided Hydrogen Release";
    Talk: IEEE International Reliability Physics Symposium (IRPS), Dallas, TX, USA - virtual; 28.04.2020 - 30.04.2020; in "Proceedings of the IEEE International Reliability Physics Symposium (IRPS)", (2020), ISBN: 978-1-7281-3200-6, 1 - 6 doi:10.1109/IRPS45951.2020.9129198. BibTeX

    1943. V. Sverdlov, H. Kosina:
    "Topologically Protected and Conventional Subbands in a 1T´-MoS2 Nanoribbon Channel";
    Poster: Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Caen, France - virtual; 01.09.2020 in "Book of Abstracts of the Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)", (2020), 68 - 69. BibTeX

    1942. K. Rupp:
    "Vendor-Optimized vs. Portable Performance: Approaches to Get Both";
    Talk: SIAM Conference on Parallel Processing for Scientific Computing (PP), Seattle, WA, USA; 12.02.2020 - 15.02.2020; . BibTeX

    1941. Yu. Illarionov, T. Knobloch, T. Grasser:
    "Where Are the Best Insulators for 2D Field-Effect Transistors?";
    Talk: Meeting of the Electrochemical Society (ECS), Montreal, Canada - virtual; (invited) 10.05.2020 - 14.05.2020; in "Abstracts of the Meeting of the Electrochemical Society (ECS)", (2020), MA2020-01/844, doi:10.1149/MA2020-0110844mtgabs. BibTeX

    1940. R. Orio, A. Makarov, J. Ender, S. Fiorentini, W. Goes, S. Selberherr, V. Sverdlov:
    "A Dynamical Approach to Fast and Reliable External Field Free Perpendicular Magnetization Reversal by Spin-Orbit Torques";
    Poster: IEEE International Electron Devices Meeting (IEDM), San Francisco, USA; 07.12.2019 - 11.12.2019; in "Proceedings of the IEEE International Electron Devices Meeting (IEDM) Special Poster Session Dedicated to MRAM", (2019), 1 page(s) . BibTeX

    1939. L. Gnam, P. Manstetten, M. Quell, K. Rupp, S. Selberherr, J. Weinbub:
    "A Flexible Shared-Memory Parallel Mesh Adaptation Framework";
    Talk: International Conference on Computational Science and Its Applications (ICCSA), Saint Petersburg , Russia; 01.07.2019 - 04.07.2019; in "Proceedings of the International Conference on Computational Science and Its Applications (ICCSA)", (2019), ISBN: 978-1-7281-2847-4, 158 - 165 doi:10.1109/ICCSA.2019.00016. BibTeX

    1938. M. Nedjalkov, J. Weinbub, M. Ballicchia, S. Selberherr, I. Dimov, D.K. Ferry, K. Rupp:
    "A Gauge-Invariant Wigner Equation for General Electromagnetic Fields";
    Talk: International Workshop on Computational Nanotechnology (IWCN), Chicago, IL, USA; 20.05.2019 - 24.05.2019; in "Book of Abstracts of the International Workshop on Computational Nanotechnology (IWCN)", (2019), ISBN: 978-3-9504738-0-3, 67 - 68. BibTeX

    1937. L.F. Aguinsky, P. Manstetten, A. Hössinger, S. Selberherr, J. Weinbub:
    "A Mathematical Extension to Knudsen Diffusion Including Direct Flux and Accurate Geometric Description";
    Poster: International Workshop on Computational Nanotechnology (IWCN), Chicago, IL, USA; 20.05.2019 - 24.05.2019; in "Book of Abstracts of the International Workshop on Computational Nanotechnology (IWCN)", (2019), ISBN: 978-3-9504738-0-3, 109 - 110. BibTeX

    1936. V. Sverdlov, S. Selberherr:
    "A Monte Carlo Evaluation of Current and Low Frequency Current Noise at Spin-Dependent Hopping in Magnetic Tunnel Junctions";
    Talk: International Conference on Large-Scale Scientific Computations (LSSC), Sozopol, Bulgaria; 10.06.2019 - 14.06.2019; in "Proceedings of the International Conference on Large-Scale Scientific Computations (LSSC)", (2019), 96. BibTeX

    1935. R. Kosik, H. Kosina:
    "A Revised Wigner Function Approach for Stationary Quantum Transport";
    Talk: International Conference on Large-Scale Scientific Computations (LSSC), Sozopol, Bulgaria; 10.06.2019 - 14.06.2019; in "Proceedings of the International Conference on Large-Scale Scientific Computations (LSSC)", (2019), 70 - 71. BibTeX

    1934. H. Kosina, G. Indalecio:
    "A Two-Particle Monte Carlo Method for Carrier Transport in the Presence of Electron-Electron Scattering";
    Talk: International Workshop on Computational Nanotechnology (IWCN), Chicago, IL, USA; 20.05.2019 - 24.05.2019; in "Book of Abstracts of the International Workshop on Computational Nanotechnology (IWCN)", (2019), ISBN: 978-3-9504738-0-3, 93 - 94. BibTeX

    1933. Z. Wu, J. Franco, D. Claes, G. Rzepa, P. Roussel, N. Collaert, G Groeseneken, D. Linten, T. Grasser, B. Kaczer:
    "Accelerated Capture and Emission (ACE) Measurement Pattern for Efficient BTI Characterization and Modeling";
    Talk: IEEE International Reliability Physics Symposium (IRPS), Monterey, CA, USA; 31.03.2019 - 04.04.2019; in "Proceedings of the IEEE International Reliability Physics Symposium (IRPS)", (2019), ISBN: 978-1-5386-9504-3, 1 - 7 doi:10.1109/IRPS.2019.8720541. BibTeX

    1932. H. Ceric, H. Zahedmanesh:
    "Advanced Modeling and Simulation of Cu Nano-Interconnects Reliability";
    Poster: IEEE International Interconnect Technology Conference (IITC), Brussels, Belgium; 03.06.2019 - 06.06.2019; in "Proceedings of the International Interconnect Technology Conference (IITC)", (2019), . BibTeX

    1931. L.F. Aguinsky, P. Manstetten, A. Hössinger, S. Selberherr, J. Weinbub:
    "An Extended Knudsen Diffusion Model for Aspect Ratio Dependent Atomic Layer Etching";
    Talk: International Workshop on Atomic Layer Etching (ALE), Bellevue, WA, USA; 21.07.2019 - 24.07.2019; in "Abstracts of the International Conference on Atomic Layer Deposition (ALD) Featuring the International Workshop on Atomic Layer Etching (ALE)", (2019), 109. BibTeX

    1930. H. Ceric, H. Zahedmanesh, K. Croes:
    "Analysis of Electromigration Failure of Nano-Interconnects through a Combination of Modeling and Experimental Methods";
    Talk: European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), Toulouse, France; 23.09.2019 - 26.09.2019; . BibTeX

    1929. H. Ceric, S. Selberherr, H. Zahedmanesh, R. Orio, K. Croes:
    "Assessment of Electromigration in Nano‐Interconnects";
    Talk: International Conference on Reliability and Stress-Related Phenomena in Nanoelectronics (IRSP), San Jose, USA; (invited) 04.11.2019 - 06.11.2019; in "Abstracts of the International Conference on Reliability and Stress-Related Phenomena in Nanoelectronics (IRSP)", (2019), 7. BibTeX

    1928. S. Selberherr, L. Filipovic:
    "CMOS Compatible Gas Sensors";
    Talk: International Conference on Materials Science and Engineering, San Francisco, CA, USA; (invited) 18.02.2019 - 20.02.2019; in "Book of Abstracts of the International Conference on Materials Science and Engineering", (2019), 1 page(s) . BibTeX

    1927. V. Sverdlov, S. Selberherr:
    "CMOS Technology Compatible Magnetic Memories";
    Talk: International Symposium on Next-Generation Electronics (ISNE), Zhengzhou, China; (invited) 09.10.2019 - 10.10.2019; in "Proceedings of the International Symposium on Next Generation Electronics (ISNE)", (2019), ISBN: 978-1-7281-2062-1, doi:10.1109/ISNE.2019.8896421. BibTeX

    1926. L. Filipovic, S. Selberherr:
    "CMOS-Compatible Gas Sensors";
    Talk: International Conference on Microelectronics (MIEL), Nis, Serbia; (invited) 16.09.2019 - 18.09.2019; in "Proceedings of the International Conference on Microelectronics (MIEL)", (2019), 9 - 16 doi:10.1109/MIEL.2019.8889585. BibTeX

    1925. Yu. Illarionov, A. Banshchikov, D.K Polyushkin, S. Wachter, M. Vexler, N. S. Sokolov, T. Müller, T. Grasser:
    "CaF2 Insulators for Ultrascaled 2D Field Effect Transistors";
    Talk: Graphene Week, Helsinki, Finland; (invited) 23.09.2019 - 27.09.2019; . BibTeX

    1924. T. Grasser:
    "CaF2 Insulators for Ultrascaled 2D Field Effect Transistors";
    Talk: IEEE EDS Distinguished Lecture at RWTH Aachen, Aachen, Germany; (invited) 26.11.2019. BibTeX

    1923. T. Grasser:
    "CaF2 Insulators for Ultrascaled 2D Field Effect Transistors";
    Talk: Workshop "Wafer-scale Integration of 2D materials", Aachen, Germany; (invited) 13.11.2019. BibTeX

    1922. M. Waltl:
    "Characterization and Modeling of Single Charge Trapping in MOS Transistors";
    Talk: IEEE International Integrated Reliability Workshop (IIRW), South Lake Tahoe, CA, USA; (invited) 13.10.2019 - 17.10.2019; in "Proceedings of the IEEE International Integrated Reliability Workshop (IIRW)", (2019), 1 - 9 doi:10.1109/IIRW47491.2019.8989880. BibTeX

    1921. V. Sverdlov, S. Selberherr:
    "Combining Perpendicular and Shape Anisotropy for Optimal Switching of Advanced Spin-Orbit Torque Memory Cells";
    Talk: IEEE Electron Devices Technology and Manufacturing Conference (EDTM), Singapore; 13.03.2019 - 15.03.2019; in "Proceedings of the IEEE Electron Devices Technology and Manufacturing Conference (EDTM)", (2019), ISBN: 978-1-5386-6508-4, 151 - 153 doi:10.1109/EDTM.2019.8731330. BibTeX

    1920. S. Fiorentini, R. Orio, W. Goes, J. Ender, V. Sverdlov:
    "Comprehensive Comparison of Switching Models for Perpendicular Spin Transfer Torque MRAM Cells";
    Poster: European Materials Research Society (EMRS), Warsaw, Poland; 16.09.2019 - 19.09.2019; . BibTeX

    1919. S. Fiorentini, R. Orio, W. Goes, J. Ender, V. Sverdlov:
    "Comprehensive Comparison of Switching Models for Perpendicular Spin-Transfer Torque MRAM Cells";
    Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Udine, Italy; 04.09.2019 - 06.09.2019; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2019), ISBN: 978-1-7281-0938-1, 57 - 60 doi:10.1109/SISPAD.2019.8870359. BibTeX

    1918. S. Fiorentini, R. Orio, S. Selberherr, J. Ender, W. Goes, V. Sverdlov:
    "Comprehensive Modeling of Switching in Perpendicular STT-MRAM";
    Poster: Workshop on Innovative Nanoscale Devices and Systems (WINDS), Kona, HI, USA; 01.12.2019 - 06.12.2019; in "Abstracts of the Workshop on Innovative Nanoscale Devices and Systems (WINDS)", (2019), ISBN: 978-0-578-61722-0, 107 - 108. BibTeX

    1917. J. Weinbub, M. Nedjalkov:
    "Computational Strategies for Two-Dimensional Wigner Monte Carlo";
    High Performance Computing Conference (HPC), Borovets, Bulgaria; (invited) 02.09.2019 - 06.09.2019; in "Procedings of the High Performance Computing Conference (HPC)", (2019), 55 - 56. BibTeX

    1916. H. Kosina, M. Kampl:
    "Current Estimation in Backward Monte Carlo Simulations";
    Poster: International Workshop on Computational Nanotechnology (IWCN), Chicago, IL, USA; 20.05.2019 - 24.05.2019; in "Book of Abstracts of the International Workshop on Computational Nanotechnology (IWCN)", (2019), ISBN: 978-3-9504738-0-3, 129 - 130. BibTeX

    1915. M. Ballicchia, M. Nedjalkov, J. Weinbub:
    "Effects of Repulsive Dopants on Quantum Transport in a Nanowire";
    Poster: International Workshop on Computational Nanotechnology (IWCN), Chicago, IL, USA; 20.05.2019 - 24.05.2019; in "Book of Abstracts of the International Workshop on Computational Nanotechnology (IWCN)", (2019), ISBN: 978-3-9504738-0-3, 115 - 116. BibTeX

    1914. R. Orio, A. Makarov, S. Selberherr, W. Goes, J. Ender, S. Fiorentini, V. Sverdlov:
    "Efficient Magnetic Field Free Switching of Symmetric Perpendicular Magnetic Free Layer for Advanced SOT-MRAM";
    Talk: Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Grenoble, France; 01.04.2019 - 03.04.2019; in "Proceedings of the Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)", (2019), 152 - 153. BibTeX

    1913. L. Filipovic, R. Orio:
    "Electromigration in Nano-Interconnects";
    Talk: Workshop on High Performance TCAD (WHPTCAD), Chicago, IL, USA; (invited) 24.05.2019 - 25.05.2019; in "Book of Abstracts of the Workshop on High Performance TCAD (WHPTCAD)", (2019), 2. BibTeX

    1912. M. Ballicchia, M. Nedjalkov, J. Weinbub:
    "Electron Evolution and Boundary Conditions in the Wigner Signed-Particle Approach";
    Talk: International Wigner Workshop (IW2), Chicago, IL, USA; 19.05.2019 - 20.05.2019; in "Book of Abstracts of the International Wigner Workshop (IW2)", (2019), ISBN: 978-3-9504738-1-0, 24 - 25. BibTeX

    1911. J. Weinbub, M. Ballicchia, D.K. Ferry, M. Nedjalkov:
    "Electron Interference and Wigner Function Negativity in Dopant Potential Structures";
    Talk: International Wigner Workshop (IW2), Chicago, IL, USA; 19.05.2019 - 20.05.2019; in "Book of Abstracts of the International Wigner Workshop (IW2)", (2019), ISBN: 978-3-9504738-1-0, 14 - 15. BibTeX

    1910. J. Weinbub, M. Ballicchia, M. Nedjalkov:
    "Electron Interference in Single- and Double-Dopant Potential Structures";
    Talk: International Conference on Large-Scale Scientific Computations (LSSC), Sozopol, Bulgaria; 10.06.2019 - 14.06.2019; in "Proceedings of the International Conference on Large-Scale Scientific Computations (LSSC)", (2019), 103 - 104. BibTeX

    1909. Yu. Illarionov, A. Banshchikov, M. Vexler, D.K Polyushkin, S. Wachter, M. Thesberg, N. S. Sokolov, T. Mueller, T. Grasser:
    "Epitaxial CaF2: a Route towards Scalable 2D Electronics";
    Poster: International Conference on Physics of 2D Crystals (ICP2DC4), Hangzhou, China; 10.06.2019 - 15.06.2019; in "Proceedings of the International Conference on Physics of 2D Crystals (ICP2DC4)", (2019), 69. BibTeX

    1908. X. Klemenschits, S. Selberherr, L. Filipovic:
    "Fast Volume Evaluation on Sparse Level Sets";
    Poster: International Workshop on Computational Nanotechnology (IWCN), Chicago, IL, USA; 20.05.2019 - 24.05.2019; in "Book of Abstracts of the International Workshop on Computational Nanotechnology (IWCN)", (2019), ISBN: 978-3-9504738-0-3, 113 - 114. BibTeX

    1907. M. Jech, S. Tyaginov, B. Kaczer, J. Franco, D. Jabs, C. Jungemann, M. Waltl, T. Grasser:
    "First-Principles Parameter-Free Modeling of n- and p-FET Hot-Carrier Degradation";
    Talk: IEEE International Electron Devices Meeting (IEDM), San Francisco , USA; 07.12.2019 - 11.12.2019; in "Proceedings of the IEEE International Electron Devices Meeting (IEDM)", (2019), doi:10.1109/IEDM19573.2019.8993630. BibTeX

    1906. M. Vandemaele, B. Kaczer, S. E. Tyaginov, Z. Stanojevic, A. Makarov, A. Chasin, E. Bury, H. Mertens, D. Linten, G Groeseneken:
    "Full (Vg, Vd) Bias Space Modeling of Hot-Carrier Degradation in Nanowire FETs";
    Talk: IEEE International Reliability Physics Symposium (IRPS), Monterey, CA, USA; 31.03.2019 - 04.04.2019; in "Proceedings of the IEEE International Reliability Physics Symposium (IRPS)", (2019), ISBN: 978-1-5386-9504-3, 1 - 7 doi:10.1109/IRPS.2019.8720406. BibTeX

    1905. B. O´Sullivan, R. Ritzenthaler, G. Rzepa, Z. Wu, E. D. Litta, O. Richard, T. Conard, V. Machkaoutsan, P. Fazan, C. Kim, J. Franco, B. Kaczer, T. Grasser, A. Spessot, D. Linten, N. Horiguchi:
    "Gate-Stack Engineered NBTI Improvements in Highvoltage Logic-For-Memory High-κ/Metal Gate Devices";
    Talk: IEEE International Reliability Physics Symposium (IRPS), Monterey, CA, USA; 31.03.2019 - 04.04.2019; in "Proceedings of the IEEE International Reliability Physics Symposium (IRPS)", (2019), ISBN: 978-1-5386-9504-3, 1 - 8 doi:10.1109/IRPS.2019.8720598. BibTeX

    1904. A. Hössinger, P. Manstetten, G. Diamantopoulos, M. Quell, J. Weinbub:
    "High Performance Computing Aspects in Semiconductor Process Simulation";
    Talk: Workshop on High Performance TCAD (WHPTCAD), Chicago, IL, USA; (invited) 24.05.2019 - 25.05.2019; in "Book of Abstracts of the Workshop on High Performance TCAD (WHPTCAD)", (2019), 3 - 4. BibTeX

    1903. P. Manstetten, G. Diamantopoulos, L. Gnam, L.F. Aguinsky, M. Quell, A. Toifl, A. Scharinger, A. Hössinger, M. Ballicchia, M. Nedjalkov, J. Weinbub:
    "High Performance TCAD: From Simulating Fabrication Processes to Wigner Quantum Transport";
    Talk: Workshop on High Performance TCAD (WHPTCAD), Chicago, IL, USA; 24.05.2019 - 25.05.2019; in "Book of Abstracts of the Workshop on High Performance TCAD (WHPTCAD)", (2019), 13. BibTeX

    1902. P. Manstetten, L.F. Aguinsky, S. Selberherr, J. Weinbub:
    "High-Performance Ray Tracing for Nonimaging Applications";
    Talk: Workshop on High Performance TCAD (WHPTCAD), Chicago, IL, USA; 24.05.2019 - 25.05.2019; in "Book of Abstracts of the Workshop on High Performance TCAD (WHPTCAD)", (2019), 20. BibTeX

    1901. V. Sverdlov, S. Selberherr:
    "Hopping in a Multiple Ferromagnetic Terminal Configuration";
    Talk: International Workshop on Computational Nanotechnology (IWCN), Chicago, IL, USA; 20.05.2019 - 24.05.2019; in "Book of Abstracts of the International Workshop on Computational Nanotechnology (IWCN)", (2019), ISBN: 978-3-9504738-0-3, 75 - 77. BibTeX

    1900. J. Scharlotta, G. Bersuker, S. E. Tyaginov, C. Young, G. Haase, G. Rzepa, M. Waltl, T. Chohan, S. Iyer, A. Kotov, C. Zambelli, F. Guarin, F. M. Puglisi, C. Ostermaier:
    "IIRW 2019 Discussion Group II: Reliability for Aerospace Applications";
    Talk: IEEE International Integrated Reliability Workshop (IIRW), South Lake Tahoe, CA, USA; 13.10.2019 - 17.10.2019; in "Proceedings of the International Integrated Reliability Workshop (IIRW)", (2019), 1 - 4 doi:10.1109/IIRW47491.2019.8989910. BibTeX

    1899. J. Ender, R. Orio, S. Fiorentini, W. Goes, V. Sverdlov:
    "Large-Scale Finite Element Micromagnetics Simulations using Open Source Software";
    Poster: European Materials Research Society (EMRS), Warsaw, Poland; 16.09.2019 - 19.09.2019; . BibTeX

    1898. M. Ballicchia, D.K. Ferry, M. Nedjalkov, J. Weinbub:
    "Linking Wigner Function Negativity to Quantum Coherence in a Nanowire";
    Talk: International Workshop on Computational Nanotechnology (IWCN), Chicago, IL, USA; 20.05.2019 - 24.05.2019; in "Book of Abstracts of the International Workshop on Computational Nanotechnology (IWCN)", (2019), ISBN: 978-3-9504738-0-3, 59 - 60. BibTeX

    1897. A. Shah, M. Waltl:
    "Low Cost and High Performance Radiation Hardened Latch Design for Reliable Circuits";
    Talk: IEEE International Conference on Electronics Circuits and Systems (ICECS), Genova, Italy; 27.11.2019 - 29.11.2019; in "Proceedings of the IEEE International Conference on Electronics Circuits and Systems (ICECS)", (2019), 197 - 200 doi:10.1109/ICECS46596.2019.8964962. BibTeX

    1896. J. Franco, Z. Wu, G. Rzepa, A. Vandooren, H. Arimura, D. Claes, N. Horiguchi, N. Collaert, D. Linten, T. Grasser, B. Kaczer:
    "Low Thermal Budget Dual-Dipole Gate Stacks Engineered for Sufficient BTI Reliability in Novel Integration Schemes";
    Talk: IEEE Electron Devices Technology and Manufacturing Conference (EDTM), Singapore; (invited) 12.03.2019 - 15.03.2019; in "Proceedings of the IEEE Electron Devices Technology and Manufacturing Conference (EDTM)", (2019), ISBN: 978-1-5386-6508-4, 215 - 217 doi:10.1109/EDTM.2019.8731237. BibTeX

    1895. V. Sverdlov:
    "Magnetic Field Free Switching of a Perpendicular SOT MRAM Cell";
    Talk: LETI Innovation days: Advanced Simulation for Non-Volatile Memory Workshop, Grenoble, France; (invited) 28.06.2019. BibTeX

    1894. R. Orio, S. Selberherr, V. Sverdlov:
    "Magnetic Field-Free Deterministic Switching of a Perpendicular Magnetic Layer by Spin-Orbit Torques";
    Talk: SPIE Spintronics, San Diego, CA, USA; (invited) 11.08.2019 - 15.08.2019; in "Proceedings of SPIE Spintronics", (2019), 11090-123. BibTeX

    1893. D. Waldhör, Y. Wimmer, A.-M. El-Sayed, W. Goes, M. Waltl, T. Grasser:
    "Minimum Energy Paths for Non-Adiabatic Charge Transitions in Oxide Defects";
    Talk: IEEE International Integrated Reliability Workshop (IIRW), South Lake Tahoe, CA, USA; 13.10.2019 - 17.10.2019; in "Proceedings of the IEEE International Integrated Reliability Workshop (IIRW)", (2019), 1 - 5 doi:10.1109/IIRW47491.2019.8989889. BibTeX

    1892. L. Filipovic:
    "Modeling and Simulation of Atomic Layer Deposition";
    Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Udine, Italy; 04.09.2019 - 06.09.2019; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2019), ISBN: 978-1-7281-0938-1, 323 - 326 doi:10.1109/SISPAD.2019.8870462. BibTeX

    1891. A. Makarov, B. Kaczer, Ph. Roussel, A. Chasin, A. Grill, M. Vandemaele, G. Hellings, A.-M. El-Sayed, T. Grasser, D. Linten, S. E. Tyaginov:
    "Modeling the Effect of Random Dopants on Hot-Carrier Degradation in FinFETs";
    Talk: IEEE International Reliability Physics Symposium (IRPS), Monterey, CA, USA; 31.03.2019 - 04.04.2019; in "Proceedings of the IEEE International Reliability Physics Symposium (IRPS)", (2019), ISBN: 978-1-5386-9504-3, doi:10.1109/IRPS.2019.8720584. BibTeX

    1890. A. Toifl, M. Quell, A. Hössinger, A. Babayan, S. Selberherr, J. Weinbub:
    "Novel Numerical Dissipation Scheme for Level-Set Based Anisotropic Etching Simulations";
    Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Udine, Italy; 04.09.2019 - 06.09.2019; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2019), ISBN: 978-1-7281-0938-1, 327 - 330 doi:10.1109/SISPAD.2019.8870443. BibTeX

    1889. A. Makarov, Ph. Roussel, E. Bury, M. Vandemaele, A. Spessot, D. Linten, B. Kaczer, S. E. Tyaginov:
    "On Correlation Between Hot-Carrier Stress Induced Device Parameter Degradation and Time-Zero Variability";
    Talk: IEEE International Integrated Reliability Workshop (IIRW), South Lake Tahoe, USA; 13.10.2019 - 17.10.2019; in "Proceedings of the IEEE International Integrated Reliability Workshop (IIRW)", (2019), ISBN: 978-1-7281-2203-8, doi:10.1109/IIRW47491.2019.8989882. BibTeX

    1888. R. Kosik, M. Thesberg, J. Weinbub, H. Kosina:
    "On the Consistency of the Stationary Wigner Equation";
    Talk: International Wigner Workshop (IW2), Chicago, IL, USA; 19.05.2019 - 20.05.2019; in "Book of Abstracts of the International Wigner Workshop (IW2)", (2019), ISBN: 978-3-9504738-1-0, 30 - 31. BibTeX

    1887. M. Quell, G. Diamantopoulos, A. Hössinger, S. Selberherr, J. Weinbub:
    "Parallelized Bottom-Up Correction in Hierarchical Re-Distancing for Topography Simulation";
    Talk: High Performance Computing Conference (HPC), Borovets, Bulgaria; 02.09.2019 - 06.09.2019; in "Procedings of the High Performance Computing Conference (HPC)", (2019), 45. BibTeX

    1886. M. Quell, P. Manstetten, A. Hössinger, S. Selberherr, J. Weinbub:
    "Parallelized Construction of Extension Velocities for the Level-Set Method";
    Talk: International Conference on Parallel Processing and Applied Mathematics (PPAM), Bialystok, Poland; 08.09.2019 - 11.09.2019; in "Proceedings of the International Conference on Parallel Processing and Applied Mathematics (PPAM)", (2019), 42. BibTeX

    1885. M. Quell, A. Toifl, A. Hössinger, S. Selberherr, J. Weinbub:
    "Parallelized Level-Set Velocity Extension Algorithm for Nanopatterning Applications";
    Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Udine, Italy; 04.09.2019 - 06.09.2019; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2019), ISBN: 978-1-7281-0938-1, 335 - 338 doi:10.1109/SISPAD.2019.8870482. BibTeX

    1884. S. Majumdar, M. Soikkeli, W. Kim, Yu. Illarionov, S. Wachter, D.K Polyushkin, S. Arpiainen, M. Prunnila:
    "Passivation controlled field effect mobility in 2D semiconductor based FET devices for high performance logic circuit development on flexible platform";
    Poster: Graphene Week, Helsinki, Finland; 23.09.2019 - 27.09.2019; . BibTeX

    1883. C. Schleich, J. Berens, G. Rzepa, G. Pobegen, G. Rescher, S. E. Tyaginov, T. Grasser, M. Waltl:
    "Physical Modeling of Bias Temperature Instabilities in SiC MOSFETs";
    Talk: IEEE International Electron Devices Meeting (IEDM), San Francisco, USA; 07.12.2019 - 11.12.2019; in "Proceedings of the IEEE International Electron Devices Meeting (IEDM)", (2019), doi:10.1109/IEDM19573.2019.8993446. BibTeX

    1882. S. E. Tyaginov, A. Chasin, A. Makarov, A.-M. El-Sayed, M. Jech, A. De Keersgieter, G. Eneman, M. Vandemaele, J. Franco, D. Linten, B. Kaczer:
    "Physics-based Modeling of Hot-Carrier Degradation in Ge NWFETs";
    Talk: International Conference on Solid State Devices and Materials (SSDM), Nagoya, Japan; 02.09.2019 - 05.09.2019; in "Extended Abstracts of the International Conference on Solid State Devices and Materials (SSDM)", (2019), 565 - 566. BibTeX

    1881. M. Nedjalkov, J. Weinbub, M. Ballicchia, S. Selberherr, I. Dimov, D.K. Ferry, K. Rupp:
    "Posedness of Stationary Wigner Equation";
    Talk: International Wigner Workshop (IW2), Chicago, IL, USA; 19.05.2019 - 20.05.2019; in "Book of Abstracts of the International Wigner Workshop (IW2)", (2019), ISBN: 978-3-9504738-1-0, 32 - 33. BibTeX

    1880. M. Ballicchia, M. Nedjalkov, S. Selberherr, J. Weinbub:
    "Potentials for Single Electron State Processing";
    Poster: Workshop on Innovative Nanoscale Devices and Systems (WINDS), Kona, HI, USA; 01.12.2019 - 06.12.2019; in "Abstracts of the Workshop on Innovative Nanoscale Devices and Systems (WINDS)", (2019), ISBN: 978-0-578-61722-0, 111 - 112. BibTeX

    1879. X. Klemenschits, P. Manstetten, L. Filipovic, S. Selberherr:
    "Process Simulation in the Browser: Porting ViennaTS using WebAssembly";
    Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Udine, Italy; 04.09.2019 - 06.09.2019; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2019), ISBN: 978-1-7281-0938-1, 339 - 342 doi:10.1109/SISPAD.2019.8870374. BibTeX

    1878. G. Diamantopoulos, P. Manstetten, L. Gnam, V. Simonka, L.F. Aguinsky, M. Quell, A. Toifl, A. Hössinger, J. Weinbub:
    "Recent Advances in High Performance Process TCAD";
    Talk: SIAM Conference on Computational Science and Engineering, Spokane, WA, USA; 25.02.2019 - 01.03.2019; in "CSE19 Abstracts", (2019), 335. BibTeX

    1877. Yu. Illarionov, A. Banshchikov, D.K Polyushkin, S. Wachter, M. I. Vexler, N. S. Sokolov, T. Müller, T. Grasser:
    "Reliability and Thermal Stability of MoS2 FETs with Ultrathin CaF2 Insulator";
    Talk: IEEE Nanotechnology Materials and Devices Conference (NMDC), Stockholm, Sweden; (invited) 27.10.2019 - 30.10.2019; . BibTeX

    1876. Yu. Illarionov, T. Grasser:
    "Reliability of 2D Field-Effect Transistors: from First Prototypes to Scalable Devices";
    Talk: IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), Hangzhou, China; (invited) 02.07.2019 - 05.07.2019; in "Proceedings of the International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA)", (2019), 1 - 6 doi:10.1109/IPFA47161.2019.8984799. BibTeX

    1875. R. Orio, A. Makarov, S. Selberherr, W. Gös, J. Ender, S. Fiorentini, V. Sverdlov:
    "Robust Magnetic Field Free Switching Scheme for Perpendicular Free Layer in Advanced Spin Orbit Torque Magnetoresistive Random Access Memory";
    Talk: International Workshop on Computational Nanotechnology (IWCN), Chicago, IL, USA; 20.05.2019 - 24.05.2019; in "Book of Abstracts of the International Workshop on Computational Nanotechnology (IWCN)", (2019), ISBN: 978-3-9504738-0-3, 69 - 71. BibTeX

    1874. R. Orio, S. Selberherr, J. Ender, S. Fiorentini, W. Goes, V. Sverdlov:
    "Robustness of the Two-Pulse Switching Scheme for SOT-MRAM";
    Talk: Workshop on Innovative Nanoscale Devices and Systems (WINDS), Kona, HI, USA; 01.12.2019 - 06.12.2019; in "Abstracts of the Workshop on Innovative Nanoscale Devices and Systems (WINDS)", (2019), ISBN: 978-0-578-61722-0, 54 - 55. BibTeX

    1873. V. Sverdlov, S. Selberherr:
    "Shot Noise in Magnetic Tunnel Junctions";
    Talk: World Multi-Conference on Systemics, Cybernetics and Informatics (WMSCI), Orlando, FL, USA; 06.07.2019 - 09.07.2019; in "Proceedings of the World Multi-Conference on Systemics, Cybernetics and Informatics (WMSCI) Volume II", (2019), ISBN: 978-1-950492-09-1, 19 - 22. BibTeX

    1872. A. Makarov, B. Kaczer, Ph. Roussel, A. Chasin, M. Vandemaele, G. Hellings, A.-M. El-Sayed, M. Jech, T. Grasser, D. Linten, S. E. Tyaginov:
    "Simulation Study: the Effect of Random Dopants and Random Traps on Hot-Carrier Degradation in nFinFETs";
    Talk: International Conference on Solid State Devices and Materials (SSDM), Nagoya, Japan; 02.09.2019 - 05.09.2019; in "Extended Abstracts of the International Conference on Solid State Devices and Materials (SSDM)", (2019), 609 - 610. BibTeX

    1871. V. Sverdlov, S. Selberherr:
    "Spin-Based CMOS-Compatible Memories";
    International Nanoelectronics Conference (INEC), Kuching, Malaysia; (invited) 03.07.2019 - 05.07.2019; in "Proceedings of the International Nanoelectronics Conferences (INEC)", (2019), ISSN: 2159-3531, doi:10.1109/INEC.2019.8853848. BibTeX

    1870. V. Sverdlov:
    "Spin-based Electronics: Recent Developments and Trends";
    Talk: International Conference on Modern Problems in the Physics of Surfaces and Nanostructures (ICMPSN), Yaroslavl, Russia; (invited) 26.08.2019 - 29.08.2019; in "Proceedings of the International Conference on Modern Problems in the Physics of Surfaces and Nanostructures (ICMPSN)", (2019), 7. BibTeX

    1869. V. Sverdlov, S. Selberherr:
    "Spintronic Memories";
    Talk: Energy-Materials-Nanotechnology Fall Meeting (EMN), Chengdu, China; (invited) 16.12.2019 - 19.12.2019; in "Abstracts of the Energy-Materials-Nanotechnology Fall Meeting (EMN)", (2019), 19 - 21. BibTeX

    1868. B. Stampfer, M. Simicic, P. Weckx, A. Abbasi, B. Kaczer, T. Grasser, M. Waltl:
    "Statistical Characterization of BTI and RTN using Integrated pMOS Arrays";
    Talk: IEEE International Integrated Reliability Workshop (IIRW), South Lake Tahoe, CA, USA; 13.10.2019 - 17.10.2019; in "Proceedings of the IEEE International Integrated Reliability Workshop (IIRW)", (2019), 1 - 5 doi:10.1109/IIRW47491.2019.8989904. BibTeX

    1867. S. Selberherr:
    "Status and Future of Solid-State Non-Volatile Memory";
    Talk: International Conference on Frontier Sciences, Beijing, China; (invited) 06.11.2019 - 07.11.2019; in "Book of Abstracts of the International Conference on Frontier Sciences", (2019), 97. BibTeX

    1866. A. Makarov, B. Kaczer, Ph. Roussel, A. Chasin, M. Vandemaele, G. Hellings, A.-M. El-Sayed, M. Jech, T. Grasser, D. Linten, S. E. Tyaginov:
    "Stochastic Modeling of Hot-Carrier Degradation in nFinFETs Considering the Impact of Random Traps and Random Dopants";
    Talk: European Solid-State Device Research Conference (ESSDERC), Krakow, Poland; 23.09.2019 - 26.09.2019; in "Proceedings of the European Solid-State Device Research Conference (ESSDERC)", (2019), ISBN: 978-1-7281-1539-9, 262 - 265 doi:10.1109/ESSDERC.2019.8901721. BibTeX

    1865. J. Cervenka, J. Weinbub:
    "Superposed States and the Wigner Approach";
    Talk: International Conference on Large-Scale Scientific Computations (LSSC), Sozopol, Bulgaria; 10.06.2019 - 14.06.2019; in "Proceedings of the International Conference on Large-Scale Scientific Computations (LSSC)", (2019), 50. BibTeX

    1864. R. Orio, A. Makarov, S. Selberherr, W. Goes, J. Ender, S. Fiorentini, V. Sverdlov:
    "Switching Speedup of the Magnetic Free Layer of Advanced SOT-MRAM";
    Talk: European Solid-State Device Research Conference (ESSDERC), Krakow, Poland; 23.09.2019 - 26.09.2019; in "Proceedings of the European Solid-State Device Research Conference (ESSDERC)", (2019), ISSN: 2378-6558, 146 - 149 doi:10.1109/ESSDERC.2019.8901780. BibTeX

    1863. L.F. Aguinsky, P. Manstetten, A. Hössinger, S. Selberherr, J. Weinbub:
    "Three-Dimensional TCAD for Atomic Layer Processing";
    Talk: Workshop on High Performance TCAD (WHPTCAD), Chicago, IL, USA; 24.05.2019 - 25.05.2019; in "Book of Abstracts of the Workshop on High Performance TCAD (WHPTCAD)", (2019), 5. BibTeX

    1862. R. Orio, A. Makarov, W. Goes, J. Ender, S. Fiorentini, V. Sverdlov:
    "Two-Pulse Magnetic Field Free Switching Scheme for Advanced Perpendicular SOT-MRAM";
    Talk: International Symposium on Hysteresis Modeling and Micromagnetics (HMM), Heraklion, Greece; 19.05.2019 - 22.05.2019; in "Book of Abstracts of the International Symposium on Hysteresis Modeling and Micromagnetics (HMM)", (2019), 34. BibTeX

    1861. S. Tyaginov, A. El-Sayed, A. Makarov, A. Chasin, H. Arimura, M. Vandemaele, M. Jech, E. Capogreco, L. Witters, A. Grill, A. De Keersgieter, G. Eneman, D. Linten, B. Kaczer:
    "Understanding and Physical Modeling Superior Hot-Carrier Reliability of Ge pNWFETs";
    Talk: IEEE International Electron Devices Meeting (IEDM), San Francisco, CA, USA; 07.12.2019 - 11.12.2019; in "Proceedings of the IEEE International Electron Devices Meeting (IEDM)", (2019), ISBN: 978-1-7281-4032-2, 498 - 501 doi:10.1109/IEDM19573.2019.8993644. BibTeX

    1860. G. Diamantopoulos, A. Hössinger, S. Selberherr, J. Weinbub:
    "A Shared-Memory Parallel Multi-Mesh Fast Marching Method for Full and Narrow Band Re-Distancing";
    Talk: European Seminar on Computing (ESCO), Pilsen, Czech Republic; 03.06.2018 - 08.06.2018; in "Proc. 6th European Seminar on Computing", (2018), 1 page(s) . BibTeX

    1859. V. Sverdlov, S. Selberherr:
    "A Single-Spin Switch";
    Talk: International Electron Devices & Materials Symposium (IEDMS), Keelung, Taiwan; (invited) 13.11.2018 - 15.11.2018; in "Conference Abstract Book", (2018), . BibTeX

    1858. M. Benam, M. Nedjalkov, S. Selberherr:
    "A Wigner Potential Decomposition in the Signed-Particle Monte Carlo Approach";
    Talk: Ninth International Conference on Numerical Methods and Applications (NM&A'18), Borovets, Bulgaria; 20.08.2018 - 24.08.2018; in "Book of Abstracts of the Ninth International Conference on Numerical Methods and Applications (NM&A'18)", (2018), 34 - 35. BibTeX

    1857. V. Sverdlov, S. Selberherr:
    "Actual Problems in the Field of Spintronics";
    Talk: Workshop on Applied Mathematics and Simulation for Semiconductors (AMaSIS), Berlin, Germany; (invited) 08.10.2018 - 10.10.2018; in "Proceedings of the Workshop on Applied Mathematics and Simulation for Semiconductors (AMasIS) 2018", (2018), 40. BibTeX

    1856. V. Simonka:
    "Advancements In Annealing And Oxidation Steps For Compound Semiconductor Power Devices";
    Talk: Silvaco Users Global Event (SURGE), Santa Clara, CA, USA; (invited) 09.10.2018. BibTeX

    1855. Yu. Illarionov, K. Smithe, M. Waltl, R. Grady, R.G. Deshmukh, E. Pop, T. Grasser:
    "Annealing and Encapsulation of CVD-MoS2 FETs with 1010 On/Off Current Ratio";
    Poster: Device Research Conference (DRC), Santa-Barbara, CA, USA; 24.06.2018 - 27.06.2018; in "Proceedings of the Device Research Conference (DRC)", (2018), ISBN: 978-1-5386-3028-0, doi:10.1109/DRC.2018.8442242. BibTeX

    1854. J. Franco, Z. Wu, G. Rzepa, A. Vandooren, H. Arimura, L. Ragnarsson, G. Hellings, S. Brus, D. Cott, V. De Heyn, G. Groeseneken, N. Horiguchi, J. Ryckaert, N. Collaert, D. Linten, T. Grasser, B. Kaczer:
    "BTI Reliability Improvement Strategies in Low Thermal Budget Gate Stacks for 3D Sequential Integration";
    Talk: IEEE International Electron Devices Meeting (IEDM), San Francisco, USA; 01.12.2018 - 05.12.2018; in "Proceedings of the IEEE International Electron Devices Meeting (IEDM)", (2018), ISBN: 978-1-7281-1987-8, 34.2.1 - 34.2.4 doi:10.1109/IEDM.2018.8614559. BibTeX

    1853. S. E. Tyaginov, M. Jech, G. Rzepa, A. Grill, A.-M. El-Sayed, G. Pobegen, A. Makarov, T. Grasser:
    "Border Trap Based Modeling of SiC Transistor Transfer Characteristics";
    Talk: IEEE International Integrated Reliability Workshop (IIRW), South Lake Tahoe, CA, USA; 07.10.2018 - 11.10.2018; in "Proceedings of the IEEE International Integrated Reliability Workshop (IIRW)", (2018), ISBN: 978-1-5386-6039-3, doi:10.1109/IIRW.2018.8727083. BibTeX

    1852. L. Filipovic:
    "CMOS-Compatible Semiconductor-Based Gas Sensors";
    Talk: Emerging Technologies Communication Microsystems Optoelectronics Sensing (ETCMOS), Whistler, British Columbia, Canada; (invited) 09.05.2018 - 11.05.2018; in "Book of Abstracts of Emerging Technologies Communication Microsystems Optoelectronics Sensors", (2018), . BibTeX

    1851. T. Grasser, B. Stampfer, M. Waltl, G. Rzepa, K. Rupp, F. Schanovsky, G. Pobegen, K. Puschkarsky, H. Reisinger, B. O´Sullivan, B. Kaczer:
    "Characterization and Physical Modeling of the Temporal Evolution of Near-Interfacial States Resulting from NBTI/PBTI Stress in nMOS/pMOS Transistors";
    Talk: IEEE International Reliability Physics Symposium (IRPS), Burlingame, CA, USA; 11.03.2018 - 15.03.2018; in "Proceedings of the IEEE International Reliability Physics Symposium (IRPS)", (2018), 2A.2-1 - 2A.2-10. BibTeX

    1850. Yu. Illarionov, B. Stampfer, F. Zhang, T. Knobloch, P. Wu, M. Waltl, A. Grill, J. Appenzeller, T. Grasser:
    "Characterization of Single Defects: from Si to MoS2 FETs";
    Poster: International Conference on Physics of 2D Crystals (ICP2C3), Valetta, Malta; 29.05.2018 - 02.06.2018; . BibTeX

    1849. L. Gnam, P. Manstetten, S. Selberherr, J. Weinbub:
    "Comparison of High-Performance Graph Coloring Algorithms";
    Talk: Vienna Young Scientists Symposium (VSS), Vienna, Austria; 07.06.2018 - 08.06.2018; in "Proceedings of the Vienna Young Scientists Symposium", (2018), ISBN: 978-3-9504017-8-3, 30 - 31. BibTeX

    1848. V. Sverdlov, S. Selberherr:
    "Current and Shot Noise at Spin-dependent Hopping in Magnetic Tunnel Junctions";
    Talk: Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Granada, Spain; 19.03.2018 - 21.03.2018; in "Book of Abstracts of the Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)", (2018), ISBN: 978-1-5386-4810-0, 107 - 108. BibTeX

    1847. M. Vandemaele, B. Kaczer, Z. Stanojevic, S. E. Tyaginov, A. Makarov, A. Chasin, H. Mertens, D. Linten, G Groeseneken:
    "Distribution Function Based Simulations of Hot-Carrier Degradation in Nanowire FETs";
    Talk: IEEE International Integrated Reliability Workshop (IIRW), South Lake Tahoe, CA, USA; 07.10.2018 - 11.10.2018; in "Proceedings of the IEEE International Integrated Reliability Workshop (IIRW)", (2018), ISBN: 978-1-5386-6039-3, doi:10.1109/IIRW.2018.8727081. BibTeX

    1846. H. Kosina, M. Kampl:
    "Effect of Electron-Electron Scattering on the Carrier Distribution in Semiconductor Devices";
    Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Austin, Texas, USA; 24.09.2018 - 26.09.2018; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2018), ISBN: 978-1-5386-6788-0, 18 - 21 doi:10.1109/SISPAD.2018.8551734. BibTeX

    1845. J. Weinbub, M. Ballicchia, M. Nedjalkov:
    "Electron Interference in a Double-Dopant Potential Structure";
    Talk: Workshop on Innovative Nanoscale Devices and Systems (WINDS), Kona, HI, USA; 25.11.2018 - 30.11.2018; in "Abstracts of the Workshop on Innovative Nanoscale Devices and Systems (WINDS)", (2018), ISBN: 978-3-901578-32-8, 52 - 53. BibTeX

    1844. V. Sverdlov, S. Selberherr:
    "Electron Spin for Modern and Future Microelectronics";
    Talk: International Conference Micro- and Nanoelectronics (ICMNE), Moscow-Zvenigorod, Russia; (invited) 01.10.2018 - 05.10.2018; in "Proceedings of the International Conference Micro- and Nanoelectronics (ICMNE) 2018", (2018), ISBN: 978-5-317-05917-0, 7. BibTeX

    1843. S. Foster, M. Thesberg, V. Vargiamidis, N. Neophytou:
    "Electronic Transport Simulations for Advanced Thermoelectric Materials";
    Poster: ​​​​Thermoelectric Network UK Meeting, Edinburgh, UK; 14.02.2018. BibTeX

    1842. N. Neophytou, S. Foster, V. Vargiamidis, M. Thesberg:
    "Electronic Transport Simulations in Materials with Embedded Nano-Inclusions for Enhanced Thermoelectric Power Factors";
    Talk: Annual March Meeting of the American Physical Society, Los Angeles, USA; 05.03.2018 - 09.03.2018; . BibTeX

    1841. A. Lahlalia, O. Le Neel, R. Shankar, S. Selberherr, L. Filipovic:
    "Enhanced Sensing Performance of Integrated Gas Sensor Devices";
    Poster: EUROSENSORS, Graz, Austria; 09.09.2018 - 12.09.2018; in "Proceedings of EUROSENSORS 2018", (2018), ISBN: 978-3-00-025217-4, 5 page(s) doi:10.3390/proceedings2131508. BibTeX

    1840. L. Gnam, S. Selberherr, J. Weinbub:
    "Evaluation of Serial and Parallel Shared-Memory Distance-1 Graph Coloring Algorithms";
    Talk: Ninth International Conference on Numerical Methods and Applications (NM&A'18), Borovets, Bulgaria; 20.08.2018 - 24.08.2018; in "Book of Abstracts of the Ninth International Conference on Numerical Methods and Applications (NM&A'18)", (2018), 52. BibTeX

    1839. K. Puschkarsky, H. Reisinger, C. Schlünder, W. Gustin, T. Grasser:
    "Fast Acquisition of Activation Energy Maps Using Temperature Ramps for Lifetime Modeling of BTI";
    Talk: European Solid-State Device Research Conference (ESSDERC), Dresden, Germany; 03.09.2018 - 06.09.2018; in "Proceedings of the European Solid-State Device Research Conference (ESSDERC)", (2018), 218 - 221. BibTeX

    1838. V. Sverdlov, A. Makarov, S. Selberherr:
    "Fast, Reliable, and Field-free Perpendicular Magnetization Reversal in Advanced Spin-Orbit Torque MRAM by Two-pulse Switching";
    Poster: Workshop on Innovative Nanoscale Devices and Systems (WINDS), Kona, HI, USA; (invited) 25.11.2018 - 30.11.2018; in "Abstracts of the Workshop on Innovative Nanoscale Devices and Systems (WINDS)", (2018), ISBN: 978-3-901578-32-8, 124 - 125. BibTeX

    1837. K. Rupp, F. Rudolf, J. Weinbub:
    "Features of ViennaCL in PETSc";
    Talk: Austrian HPC Meeting (AHPC), Linz; 19.02.2018 - 21.02.2018; in "Book of Abstracts of the 2018 Austrian HPC Meeting (AHPC)", (2018), 18. BibTeX

    1836. A. Makarov, V. Sverdlov, S. Selberherr:
    "Field-free Fast Reliable Deterministic Switching in Perpendicular Spin-Orbit Torque MRAM Cells";
    Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Austin, Texas, USA; 24.09.2018 - 26.09.2018; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2018), ISBN: 978-1-5386-6788-0, 186 - 189 doi:10.1109/SISPAD.2018.8551716. BibTeX

    1835. L. Filipovic, M. Kampl, T. Knobloch, G. Rzepa, J. Weinbub:
    "Ihr Smartphone - Ein Supercomputer vor 20 Jahren. Ein Einblick in die Mikro- und Nanoelektronik (mit Virtual Reality)";
    Talk: Lange Nacht der Forschung 2018, Wien; 13.04.2018. BibTeX

    1834. C. Medina-Bailón, T. Sadi, M. Nedjalkov, J. Lee, S. Berrada, H. Carillo-Nunez, V. Georgiev, S. Selberherr, A. Asenov:
    "Impact of the Effective Mass on the Mobility in Si Nanowire Transistors";
    Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Austin, Texas, USA; 24.09.2018 - 26.09.2018; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2018), ISBN: 978-1-5386-6788-0, 297 - 300 doi:10.1109/SISPAD.2018.8551630. BibTeX

    1833. V. Simonka, A. Hössinger, S. Selberherr, J. Weinbub:
    "Investigation of Post-Implantation Annealing for Phosphorus-Implanted 4H-Silicon Carbide";
    Talk: International Conference on Microelectronic Devices and Technologies (MicDAT), Barcelona, Spain; 20.06.2018 - 22.06.2018; in "Proceedings of the International Conference on Microelectronic Devices and Technologies (MicDAT)", (2018), 42 - 44. BibTeX

    1832. V. Sverdlov, A. Makarov, S. Selberherr:
    "Magnetic Field-Free Fast Reliable Switching by Spin-Orbit Torque in Advanced MRAM";
    Poster: Micromagnetics: Analysis, Numerics, Applications (MANA), Vienna; 08.11.2018 - 09.11.2018; in "Proceedings of Micromagnetics: Analysis, Numerics, Applications (MANA) 2018", (2018), 32. BibTeX

    1831. L. Filipovic, R. Orio:
    "Modeling the Influence of Grains and Material Interfaces on Electromigration";
    Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Austin, Texas, USA; 24.09.2018 - 26.09.2018; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2018), ISBN: 978-1-5386-6788-0, 83 - 87 doi:10.1109/SISPAD.2018.8551746. BibTeX

    1830. G. Indalecio, H. Kosina:
    "Monte Carlo Simulation of Electron-electron Interactions in Bulk Silicon";
    Poster: The 12th International Conference on Scientific Computing in Electrical Engineering (SCEE 2018), Taormina; 23.09.2018 - 27.09.2018; in "Book of Abstracts of The 12th International Conference on Scientific Computing in Electrical Engineering", (2018), 97 - 98. BibTeX

    1829. J. Lee, C. Medina-Bailón, S. Berrada, H. Carillo-Nunez, T. Sadi, V. Georgiev, M. Nedjalkov, S. Selberherr, A. Asenov:
    "Multi-Scale Simulation Study of the Strained Si Nanowire FETs";
    Talk: IEEE Nanotechnology Materials and Devices Conference (NMDC), Portland, USA; 14.10.2018 - 17.10.2018; in "Proceedings of IEEE Nanotechnology Materials and Devices Conference (NMDC)", (2018), ISBN: 978-1-5386-1016-9, doi:10.1109/NMDC.2018.8605884. BibTeX

    1828. J. Ghosh, D. Osintsev, V. Sverdlov, S. Ganguly:
    "Multilevel Parallelization Approach to Estimate Spin Lifetime in Silicon: Performance Analysis";
    Poster: Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Granada, Spain; 19.03.2018 - 21.03.2018; in "Book of Abstracts of the Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)", (2018), ISBN: 978-1-5386-4810-0, 79 - 80. BibTeX

    1827. T. Grasser:
    "Multiscale Reliability Modeling";
    Talk: IEEE EDS Distinguished Lecture at the SINANO Sommer School 2018, Tarragona, Spain; (invited) 25.09.2018. BibTeX

    1826. J. Franco, Z. Wu, G. Rzepa, L. Ragnarsson, H. Dekkers, A. Vandooren, G. Groeseneken, N. Horiguchi, N. Collaert, D. Linten, T. Grasser, B. Kaczer:
    "On the Impact of the Gate Metal Work-Function on the Charge Trapping Component of BTI";
    Talk: IEEE International Integrated Reliability Workshop (IIRW), South Lake Tahoe, USA; 07.10.2018 - 11.10.2018; in "Proceedings of the IEEE International Integrated Reliability Workshop (IIRW)", (2018), ISBN: 978-1-5386-6039-3, 1 - 4 doi:10.1109/IIRW.2018.8727089. BibTeX

    1825. Yu. Illarionov:
    "On the Way to Commercial 2D Electronics...";
    Talk: 2nd Zhejiang Sci-Tech University Forum for International Young Scholars, Hangzhou, China; (invited) 25.11.2018 - 27.11.2018; . BibTeX

    1824. P. Manstetten:
    "Performance Improvements For Advanced Physical Etching And Deposition In Memory Technologies";
    Talk: Silvaco Users Global Event (SURGE), Santa Clara, CA, USA; (invited) 09.10.2018. BibTeX

    1823. M. Ballicchia, J. Weinbub, I. Dimov, M. Nedjalkov:
    "Recent Advances of the Wigner Signed-Particle Approach";
    Talk: Annual Meeting of the Bulgarian Section of SIAM (BGSIAM), Sofia, Bulgaria; (invited) 18.12.2018 - 20.12.2018; in "Abstracts Annual Meeting of the Bulgarian Section of SIAM (BGSIAM)", (2018), ISSN: 1313-3357, 18 - 19. BibTeX

    1822. Yu. Illarionov, A.J. Molina- Mendoza, M. Waltl, T. Knobloch, M. M. Furchi, T. Mueller, T. Grasser:
    "Reliability of next-generation field-effect transistors with transition metal dichalcogenides";
    Talk: IEEE International Reliability Physics Symposium (IRPS), Burlingame, CA, USA; 11.03.2018 - 15.03.2018; in "Proceedings of the IEEE International Reliability Physics Symposium (IRPS)", (2018), ISBN: 978-1-5386-5479-8, 6 page(s) doi:10.1109/IRPS.2018.8353605. BibTeX

    1821. V. Sverdlov, A. Makarov, S. Selberherr:
    "Reliable Sub-Nanosecond Switching of a Perpendicular SOT-MRAM Cell Without External Magnetic Field";
    Talk: World Multi-Conference on Systemics, Cybernetics and Informatics (WMSCI), Orlando, Florida, USA; 08.07.2018 - 11.07.2018; in "Proceedings of the 22nd World Multi-Conference on Systemics, Cybernetics and Informatics (WMSCI)", (2018), ISBN: 978-1-941763-81-0, 30 - 32. BibTeX

    1820. M. Benam, M. Wołoszyn, S. Selberherr:
    "Self-consistent Monte Carlo Solution of Wigner and Poisson Equations Using an Efficient Multigrid Approach";
    Talk: Annual Meeting of the Bulgarian Section of SIAM (BGSIAM), Sofia, Bulgaria; 18.12.2018 - 20.12.2018; in "Abstracts Annual Meeting of the Bulgarian Section of SIAM (BGSIAM)", (2018), ISSN: 1313-3357, 20 - 21. BibTeX

    1819. V. Sverdlov, S. Selberherr:
    "Shot Noise Enhancement at Spin-dependent Hopping";
    Talk: Workshop on Innovative Nanoscale Devices and Systems (WINDS), Kona, HI, USA; (invited) 25.11.2018 - 30.11.2018; in "Abstracts of the Workshop on Innovative Nanoscale Devices and Systems (WINDS)", (2018), ISBN: 978-3-901578-32-8, 6 - 7. BibTeX

    1818. N. Neophytou, S. Foster, V Vargiamaidis, D. Chakraborty, L Oliveira, C Kumarasinghe, M. Thesberg:
    "Simulation Studies of Nanostructured Thermoelectric Materials";
    Talk: IEEE International Conference on Nanotechnology (NANO), Cork, Ireland; 23.07.2018 - 26.07.2018; in "Proceedings of the IEEE International Conference on Nanotechnology (NANO)", (2018), doi:10.1109/nano.2018.8626378. BibTeX

    1817. V. Sverdlov, S. Selberherr:
    "Spin Correlations at Hopping in Magnetic Structures: From Tunneling Magnetoresistance to Single-Spin Transistor";
    Talk: SPIE Spintronics, San Diego, CA, USA; (invited) 19.08.2018 - 23.08.2018; in "Proceedings of SPIE Spintronics", (2018), 10732-112. BibTeX

    1816. V. Sverdlov, S. Selberherr:
    "Spin-Dependent Trap-Assisted Tunneling: A Path Towards a Single Spin Switch";
    Poster: Advanced Research Workshop on Future Trends in Microelectronics: Vingt Ans Après, Sardinia, Italy; 10.06.2018 - 16.06.2018; in "Abstracts Advanced Research Workshop Future Trends in Microelectronics: Vingt Ans Après", (2018), 49. BibTeX

    1815. A. Toifl, V. Simonka, A. Hössinger, S. Selberherr, J. Weinbub:
    "Steady-State Empirical Model for Electrical Activation of Silicon-Implanted Gallium Nitride";
    Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Austin, Texas, USA; 24.09.2018 - 26.09.2018; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2018), ISBN: 978-1-5386-6788-0, 336 - 339 doi:10.1109/SISPAD.2018.8551728. BibTeX

    1814. C. Medina-Bailón, T. Sadi, M. Nedjalkov, J. Lee, S. Berrada, H. Carillo-Nunez, V. Georgiev, S. Selberherr, A. Asenov:
    "Study of the 1D Scattering Mechanisms´ Impact on the Mobility in Si Nanowire Transistors";
    Talk: Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Granada, Spain; 19.03.2018 - 21.03.2018; in "Book of Abstracts of the Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)", (2018), ISBN: 978-1-5386-4810-0, 15 - 16. BibTeX

    1813. J. Woerle, V. Simonka, E. Müller, A. Hössinger, H. Sigg, S. Selberherr, J. Weinbub, M. Camarda, U. Grossner:
    "Surface Morphology of 4H-SiC After Thermal Oxidation";
    Talk: European Conference on Silicon Carbide and Related Materials (ECSCRM), Birmingham, UK; 02.09.2018 - 06.09.2018; in "Proceedings of the European Conference on Silicon Carbide and Related Materials (ECSCRM)", (2018), . BibTeX

    1812. V. Sverdlov, A. Makarov, S. Selberherr:
    "Switching Current Reduction in Advanced Spin-Orbit Torque MRAM";
    Poster: Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Granada, Spain; 19.03.2018 - 21.03.2018; in "Book of Abstracts of the Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)", (2018), ISBN: 978-1-5386-4810-0, 57 - 58. BibTeX

    1811. L. Filipovic, A. Lahlalia, S. Selberherr:
    "System-on-Chip Sensor Integration in Advanced CMOS Technology";
    Talk: 233rd ECS Meeting (ECS), Seattle, Washington, USA; (invited) 13.05.2018 - 17.05.2018; in "Proceedings of the 233rd ECS Meeting (ECS)", (2018), ISSN: 2151-2043, . BibTeX

    1810. A. Makarov, V. Sverdlov, S. Selberherr:
    "Two-Pulse Sub-ns Switching of a Perpendicular Spin-Orbit Torque MRAM Cell Without External Magnetic Field";
    Poster: Advanced Research Workshop on Future Trends in Microelectronics: Vingt Ans Après, Sardinia, Italy; 10.06.2018 - 16.06.2018; in "Abstracts Advanced Research Workshop Future Trends in Microelectronics: Vingt Ans Après", (2018), 51. BibTeX

    1809. A. Makarov, V. Sverdlov, S. Selberherr:
    "Ultra-Fast Switching of a Free Magnetic Layer with out-of-Plane Magnetization in Spin-Orbit Torque MRAM Cells";
    Talk: 233rd ECS Meeting (ECS), Seattle, Washington, USA; 13.05.2018 - 17.05.2018; in "Proceedings of the 233rd ECS Meeting (ECS)", (2018), 85/213, ISSN: 2151-2043, . BibTeX

    1808. K. Puschkarsky, T. Grasser, T. Aichinger, W. Gustin, H. Reisinger:
    "Understanding and Modeling Transient Threshold Voltage Instabilities in SiC MOSFETs";
    Talk: IEEE International Reliability Physics Symposium (IRPS), Burlingame, CA, USA; (invited) 11.03.2018 - 15.03.2018; in "Proceedings of the IEEE International Reliability Physics Symposium (IRPS)", (2018), 3B.5-1 - 3B.5-10. BibTeX

    1807. X. Klemenschits, S. Selberherr, L. Filipovic:
    "Unified Feature Scale Model for Etching in SF6 and Cl Plasma Chemistries";
    Poster: Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Granada, Spain; 19.03.2018 - 21.03.2018; in "Book of Abstracts of the Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)", (2018), ISBN: 978-1-5386-4810-0, 65 - 66. BibTeX

    1806. V. Sverdlov, S. Selberherr:
    "A Single-Spin Switch";
    Talk: Workshop on Innovative Nanoscale Devices and Systems (WINDS), Kona, HI, USA; (invited) 26.11.2017 - 01.12.2017; in "Abstracts of the Workshop on Innovative Nanoscale Devices and Systems (WINDS)", (2017), ISBN: 978-3-901578-31-1, 93 - 94. BibTeX

    1805. P. Manstetten, A. Hössinger, J. Weinbub, S. Selberherr:
    "Accelerated Direct Flux Calculations Using an Adaptively Refined Icosahedron";
    Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Kamakura, Japan; 07.09.2017 - 09.09.2017; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2017), ISBN: 978-4-86348-612-6, 73 - 76 doi:10.23919/SISPAD.2017.8085267. BibTeX

    1804. Yu. Illarionov, G. Rzepa, M. Waltl, T. Knobloch, J. Kim, D. Akinwande, T. Grasser:
    "Accurate Mapping of Oxide Traps in Highly-Stable Black Phosphorus FETs";
    Talk: IEEE Electron Devices Technology and Manufacturing Conference (EDTM), Toyama, Japan; 28.02.2017 - 02.03.2017; in "Proceedings of the IEEE Electron Devices Technology and Manufacturing Conference (EDTM)", (2017), ISBN: 978-1-5090-4661-4, 114 - 115 doi:10.1109/EDTM.2017.7947532. BibTeX

    1803. T. Windbacher, A. Makarov, V. Sverdlov, S. Selberherr:
    "Analysis of a Spin-Transfer Torque Based Copy Operation of a Buffered Magnetic Processing Environment";
    Talk: World Multi-Conference on Systemics, Cybernetics and Informatics (WMSCI), Orlando, Florida, USA; 08.07.2017 - 11.07.2017; in "Proceedings of the 21st World Multi-Conference on Systemics, Cybernetics and Informatics (WMSCI)", (2017), ISBN: 978-1-941763-59-9, 142 - 146. BibTeX

    1802. A. Chasin, J. Franco, B. Kaczer, V. Putcha, P. Weckx, R. Ritzenthaler, H. Mertens, N. Horiguchi, D. Linten, G. Rzepa:
    "BTI Reliability and Time-Dependent Variability of Stacked Gate-All-Around Si Nanowire Transistors";
    Poster: IEEE International Reliability Physics Symposium (IRPS), Monterey, CA, USA; 02.04.2017 - 06.04.2017; in "Proceedings of the IEEE International Reliability Physics Symposium (IRPS)", (2017), ISBN: 978-1-5090-6641-4, 5C-4.1 - 5C-4.7. BibTeX

    1801. B. Kaczer, G. Rzepa, J. Franco, P. Weckx, A. Chasin, V. Putcha, E. Bury, M. Simicic, Ph. J. Roussel, G. Hellings, A. Veloso, P. Matagne, T. Grasser, D. Linten:
    "Benchmarking Time-Dependent Variability of Junctionless Nanowire FETs";
    Talk: IEEE International Reliability Physics Symposium (IRPS), Monterey, CA, USA; 02.04.2017 - 06.04.2017; in "Proceedings of the IEEE International Reliability Physics Symposium (IRPS)", (2017), ISBN: 978-1-5090-6641-4, 2D-6.1 - 2D-6.7. BibTeX

    1800. A. Grill, B. Stampfer, M. Waltl, K.-S. Im, J. Lee, C. Ostermaier, H. Ceric, T. Grasser:
    "Characterization and Modeling of Single Defects in GaN/AlGaN Fin-MIS-HEMTs";
    Talk: IEEE International Reliability Physics Symposium (IRPS), Monterey, CA, USA; 02.04.2017 - 06.04.2017; in "Proceedings of IEEE International Reliability Physics Symposium (IRPS)", (2017), ISBN: 978-1-5090-6641-4, 3B-5.1 - 3B-5.5 doi:10.1109/IRPS.2017.7936285. BibTeX

    1799. J. Franco, V. Putcha, A. Vais, S. Sioncke, N. Waldron, D. Zhou, G. Rzepa, P. Roussel, G. Groeseneken, M. Heyns, N. Collaert, D. Linten, T. Grasser, B. Kaczer:
    "Characterization of Oxide Defects in InGaAs MOS Gate Stacks for High-Mobility n-Channel MOSFETs";
    Talk: IEEE International Electron Devices Meeting (IEDM), San Francisco, CA, USA; (invited) 02.12.2017 - 06.12.2017; in "Proceedings of the IEEE International Electron Devices Meeting (IEDM)", (2017), 4 page(s) doi:10.1109/IEDM.2017.8268347. BibTeX

    1798. T. Grasser:
    "Charge Trapping and Time-dependent Variability in CMOS Transistors";
    Talk: IEEE EDS Distinguished Lecture, Stuttgart,Germany; (invited) 24.01.2017. BibTeX

    1797. T. Grasser:
    "Charge Trapping and Time-dependent Variability in Low-Voltage MOS Transistors";
    Talk: Short Course at IEEE EDS Electron Devices Technology and Manufacturing Conference, Toyama, Japan; (invited) 28.02.2017. BibTeX

    1796. M. Ballicchia, J. Weinbub, M. Nedjalkov, S. Selberherr:
    "Classical and Quantum Electron Evolution with a Repulsive Dopant";
    Talk: Workshop on Innovative Nanoscale Devices and Systems (WINDS), Kona, HI, USA; (invited) 26.11.2017 - 01.12.2017; in "Abstracts of the Workshop on Innovative Nanoscale Devices and Systems (WINDS)", (2017), ISBN: 978-3-901578-31-1, 105 - 106. BibTeX

    1795. P. Manstetten, V. Simonka, G. Diamantopoulos, L. Gnam, A. Makarov, A. Hössinger, J. Weinbub:
    "Computational and Numerical Challenges in Semiconductor Process Simulation";
    Talk: SIAM Conference on Computational Science and Engineering, Atlanta, GA, USA; 27.02.2017 - 03.03.2017; in "CSE17 Abstracts", (2017), 46. BibTeX

    1794. V. Sverdlov, J. Weinbub, S. Selberherr:
    "Current in Magnetic Tunnel Junctions at Spin-Dependent Hopping";
    Talk: Workshop on Innovative Nanoscale Devices and Systems (WINDS), Kona, HI, USA; (invited) 26.11.2017 - 01.12.2017; in "Abstracts of the Workshop on Innovative Nanoscale Devices and Systems (WINDS)", (2017), ISBN: 978-3-901578-31-1, 87 - 88. BibTeX

    1793. T. Grasser:
    "Defects in 3D and 2D Field Effect Transistors: Characterization and Modeling";
    Talk: IEEE EDS Distinguished Lecture, Aachen, Germany; (invited) 23.11.2017. BibTeX

    1792. G. Rzepa, J. Franco, A. Subirats, M. Jech, A. Chasin, A. Grill, M. Waltl, T. Knobloch, B. Stampfer, T. Chiarella, N. Horiguchi, L. Ragnarsson, D. Linten, B. Kaczer, T. Grasser:
    "Efficient Physical Defect Model Applied to PBTI in High-κ Stacks";
    Poster: IEEE International Reliability Physics Symposium (IRPS), Monterey, CA, USA; 02.04.2017 - 06.04.2017; in "Proceedings of the IEEE International Reliability Physics Symposium (IRPS)", (2017), ISBN: 978-1-5090-6641-4, XT-11.1 - XT-11.6. BibTeX

    1791. V. Sverdlov, J. Weinbub, S. Selberherr:
    "Electron Spin at Work in Modern and Emerging Devices";
    Talk: Energy-Materials-Nanotechnology Meeting on Quantum (EMN), Wien, Austria; (invited) 18.06.2017 - 22.06.2017; in "Abstracts of the Energy-Materials-Nanotechnology Meeting on Quantum (EMN)", (2017), 31 - 33. BibTeX

    1790. N. Neophytou, M. Thesberg:
    "Electronic Transport Simulations in Nano-Crystalline Materials for Enhanced Thermoelectric Power Factors";
    Talk: APS March Meeting, New Orleans, USA; 13.03.2017 - 17.03.2017; . BibTeX

    1789. N. Neophytou, S. Foster, M. Thesberg, H. Kosina:
    "Electronic Transport Simulations in Nanocomposites - Exploring the Features that Optimize the Thermoelectric Power Factor";
    Talk: E-MRS Spring Meeting, Strasburg, France; 22.05.2017 - 26.05.2017; . BibTeX

    1788. N. Neophytou, M. Thesberg:
    "Electronic Transport Simulations in Nanostructured Materials for Large Thermoelectric Power Factors";
    Talk: European Congress and Exhibition on Advanced Materials and Processes (EUROMAT), Thessaloniki, Greece; 18.09.2017 - 22.09.2017; . BibTeX

    1787. Yu. Illarionov, M. Waltl, K. Smithe, E. Pop, T. Grasser:
    "Encapsulated MoS2 FETs with Improved Performance and Reliability";
    Talk: GRAPCHINA, Nanjing, China; 24.09.2017 - 26.09.2017; in "Proceedings of the GRAPCHINA 2017", (2017), 1 page(s) . BibTeX

    1786. V. Sverdlov, J. Weinbub, S. Selberherr:
    "Enhanced Shot Noise as a Signature of Trap-Assisted Tunneling in Magnetic Tunnel Junctions: a Monte Carlo Approach";
    Talk: 25th International Symposium on Nanostructures: Physics and Technology, Sankt Petersburg, Russland; 26.06.2017 - 30.06.2017; in "Proceedings of the 25th International Symposium on Nanostructures: Physics and Technology", (2017), ISBN: 978-5-7422-5779-0, 132 - 133. BibTeX

    1785. G. Diamantopoulos, J. Weinbub, A. Hössinger, S. Selberherr:
    "Evaluation of the Shared-Memory Parallel Fast Marching Method for Re-Distancing Problems";
    Talk: International Conference on Computational Science and Its Applications (ICCSA), Trieste, Italy; 03.07.2017 - 06.07.2017; in "Proceedings of the International Conference on Computational Science and Its Applications (ICCSA)", (2017), ISBN: 978-1-5386-3893-4, 1 - 8 doi:10.1109/ICCSA.2017.7999648. BibTeX

    1784. R. Mills, M. Adams, J. Brown, M. Fabien, T. Isaac, M. Knepley, K. Rupp, B. Smith, H. Zhang:
    "Experiences, Optimizations, and Future Directions with Petsc on the 2nd Generation ("Knights Landing") Intel Xeon Phi Processor";
    Talk: SIAM Conference on Computational Science and Engineering, Atlanta, GA, USA; 27.02.2017 - 03.03.2017; in "CSE17 Abstracts", (2017), 370 - 371. BibTeX

    1783. S. Selberherr, T. Windbacher, A. Makarov, V. Sverdlov:
    "Exploiting Spin-Transfer Torque for Non-Volatile Computing";
    Talk: World Congress of Smart Materials (WCSM), Bangkok; (invited) 16.03.2017 - 18.03.2017; in "Book of Abstracts of BIT's 3rd Annual World Congress of Smart Materials-2017", (2017), 130. BibTeX

    1782. S. Foster, M. Thesberg, N. Neophytou:
    "Fully Quantum Mechanical Transport Simulations for the Calculation of the Thermoelectric Power Factor in Nanocomposite Materials";
    Talk: European Conference on Thermoelectrics (ECT), Padova, Italy; 25.09.2017 - 27.09.2017; in "Book of Abstracts 15th European Conference on Thermoelectrics", (2017), . BibTeX

    1781. M. Kampl, H. Kosina, O. Baumgartner:
    "Hot Carrier Study Including e-e Scattering Based on a Backward Monte Carlo Method";
    Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Kamakura, Japan; 07.09.2017 - 09.09.2017; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2017), ISBN: 978-4-86348-612-6, 293 - 296 doi:10.23919/SISPAD.2017.8085322. BibTeX

    1780. A. Makarov, S. E. Tyaginov, B. Kaczer, M. Jech, A. Chasin, A. Grill, G. Hellings, M. Vexler, D. Linten, T. Grasser:
    "Hot-Carrier Degradation in FinFETs: Modeling, Peculiarities, and Impact of Device Topology";
    Talk: IEEE International Electron Devices Meeting (IEDM), San Francisco, CA, USA; 02.12.2017 - 06.12.2017; in "Proceedings of the IEEE International Electron Devices Meeting (IEDM)", (2017), ISBN: 978-1-5386-3559-9, 310 - 313 doi:10.1109/IEDM.2017.8268381. BibTeX

    1779. T. Knobloch, G. Rzepa, Yu. Illarionov, M. Waltl, D.K Polyushkin, A. Pospischil, M. M. Furchi, T. Müller, T. Grasser:
    "Impact of Gate Dielectrics on the Threshold Voltage in MoS2 Transistors";
    Talk: Meeting of the Electrochemical Society (ECS), National Harbor, Maryland, USA; (invited) 01.10.2017 - 05.10.2017; in "Meeting Abstracts", (2017), MA2017-02(14): 837, 2 page(s) . BibTeX

    1778. T. Grasser, M. Waltl, K. Puschkarsky, B. Stampfer, G. Rzepa, G. Pobegen, H. Reisinger, H. Arimura, B. Kaczer:
    "Implications of Gate-Sided Hydrogen Release for Post-Stress Degradation Build-Up after BTI Stress";
    Talk: IEEE International Reliability Physics Symposium (IRPS), Monterey, CA, USA; 02.04.2017 - 06.04.2017; in "Proceedings of the IEEE International Reliability Physics Symposium (IRPS)", (2017), ISBN: 978-1-5090-6641-4, 6A-2.1 - 6A-2.6. BibTeX

    1777. S. Selberherr:
    "Integrated Gas Sensors for Wearable Electronics";
    Talk: IEEE EDS Distinguished Lecture, The Hong Kong Polytechnic University, Hong Kong; (invited) 12.04.2017. BibTeX

    1776. M. Kampl, H. Kosina:
    "Investigation of Hot-Carrier Effects Using a Backward Monte Carlo Method and Full Bands";
    Poster: International Workshop on Computational Nanotechnology (IWCN), Low Wood Bay, Lake District, UK; 05.06.2017 - 09.06.2017; in "Book of Abstracts of the International Workshop on Computational Nanotechnology (IWCN)", (2017), 147 - 148. BibTeX

    1775. V. Sverdlov, H. Mahmoudi, T. Windbacher, A. Makarov, J. Weinbub, S. Selberherr:
    "MTJs - Spin-Based Binary Memristors for Non-Volatile Memory and Logic Applications";
    Talk: Energy-Materials-Nanotechnology Meeting on Memristive Switching & Network (EMN), Milan, Italy; (invited) 14.08.2017 - 18.08.2017; in "Abstracts of the Energy-Materials-Nanotechnology Meeting on Memristive Switching & Network (EMN)", (2017), 33 - 34. BibTeX

    1774. L. Filipovic, R.L. de Orio, W. H. Zisser, S. Selberherr:
    "Modeling Electromigration in Nanoscaled Copper Interconnects";
    Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Kamakura, Japan; 07.09.2017 - 09.09.2017; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2017), ISBN: 978-4-86348-612-6, 161 - 164 doi:10.23919/SISPAD.2017.8085289. BibTeX

    1773. V. Sverdlov, J. Weinbub, S. Selberherr:
    "Modeling Spin-Dependent Phenomena for New Device Applications";
    Talk: SIAM Conference on Computational Science and Engineering, Atlanta, GA, USA; (invited) 27.02.2017 - 03.03.2017; in "CSE17 Abstracts", (2017), 45 - 46. BibTeX

    1772. V. Simonka, A. Hössinger, J. Weinbub, S. Selberherr:
    "Modeling and Simulation of Electrical Activation of Acceptor-Type Dopants in Silicon Carbide";
    Poster: International Conference on Silicon Carbide and Related Materials (ICSCRM), Washington D.C., USA; 17.09.2017 - 22.09.2017; in "Proceedings of the International Conference on Silicon Carbide and Related Materials (ICSCRM)", (2017), . BibTeX

    1771. V. Simonka, A. Hössinger, J. Weinbub, S. Selberherr:
    "Modeling of Electrical Activation Ratios of Phosphorus and Nitrogen Doped Silicon Carbide";
    Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Kamakura, Japan; 07.09.2017 - 09.09.2017; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2017), ISBN: 978-4-86348-612-6, 125 - 128 doi:10.23919/SISPAD.2017.8085280. BibTeX

    1770. T. Sadi, E. Towie, M. Nedjalkov, A. Asenov, S. Selberherr:
    "Monte Carlo Particles in Quantum Wires: Effects of the Confinement";
    Talk: International Conference on Large-Scale Scientific Computations (LSSC), Sozopol, Bulgaria; 05.06.2017 - 09.06.2017; in "Abstracts International Conference on Large-Scale Scientific Computations (LSSC)", (2017), 89 - 90. BibTeX

    1769. S. Foster, D. Chakraborty, M. Thesberg, H. Kosina, N. Neophytou:
    "Monte Carlo Simulations for Extracting the Power Factor in 1D Systems";
    Talk: EPRSC Thermoelectric Network Meeting, Manchester, UK; 14.02.2017 - 15.02.2017; . BibTeX

    1768. M. Thesberg, H. Kosina:
    "NEGF Through Finite-Volume Discretization";
    Talk: International Workshop on Computational Nanotechnology (IWCN), Low Wood Bay, Lake District, UK; 05.06.2017 - 09.06.2017; in "Book of Abstracts of the International Workshop on Computational Nanotechnology (IWCN)", (2017), 173 - 174. BibTeX

    1767. V. Simonka:
    "Natancni Fizikalni Modeli 3D Simulatorjev Proizvodnje Mikroelektronskih Naprav";
    Talk: Faculty of Natural Sciences and Mathematics, University of Maribor, Slovenia; (invited) 26.01.2017. BibTeX

    1766. V. Sverdlov, A. Makarov, J. Weinbub, S. Selberherr:
    "Non-Volatility by Spin in Modern Nanoelectronics";
    Talk: International Conference on Microelectronics (MIEL), Nis, Serbia; (invited) 09.10.2017 - 11.10.2017; in "Proceedings of the International Conference on Microelectronics (MIEL)", (2017), ISBN: 978-1-5386-2562-0, 7 - 14 doi:10.1109/MIEL.2017.8190061. BibTeX

    1765. J. Cervenka, L. Filipovic:
    "Numerical Aspects of the Deterministic Solution of the Wigner Equation";
    Poster: International Wigner Workshop (IW2), Low Wood Bay, Lake District, UK; 05.06.2017 in "Book of Abstracts of the International Wigner Workshop (IW2)", (2017), ISBN: 978-3-200-05129-4, 42 - 43. BibTeX

    1764. R. Kosik, M. Kampl, H. Kosina:
    "On the Characteristic Neumann Equation and the Wigner Equation";
    Talk: International Wigner Workshop (IW2), Low Wood Bay, Lake District, UK; 05.06.2017 in "Book of Abstracts of the International Wigner Workshop (IW2)", (2017), ISBN: 978-3-200-05129-4, 26 - 27. BibTeX

    1763. T. Knobloch, G. Rzepa, Yu. Illarionov, M. Waltl, F. Schanovsky, M. Jech, B. Stampfer, M. M. Furchi, T. Müller, T. Grasser:
    "Physical Modeling of the Hysteresis in MoS2 Transistors";
    Talk: European Solid-State Device Research Conference (ESSDERC), Leuven, Belgium; 11.09.2017 - 14.09.2017; in "Proceedings of the European Solid-State Device Research Conference (ESSDERC)", (2017), 284 - 287 doi:10.1109/ESSDERC.2017.8066647. BibTeX

    1762. P. Sanan, O. Schenk, M. Bollhoefer, K. Rupp, D. May:
    "Preconditioners for Stokes Flow with Highly Heterogeneous Viscosity Structure: Saddle-Point Smoothing Via Local Incomplete Factorization";
    Talk: SIAM Conference on Computational Science and Engineering, Atlanta, GA, USA; 27.02.2017 - 03.03.2017; in "CSE17 Abstracts", (2017), 258. BibTeX

    1761. Yu. Illarionov, M. Waltl, T. Knobloch, G. Rzepa, T. Grasser:
    "Reliability Perspective of 2D Electronics";
    Talk: International Conference on Physics of 2D Crystals (ICP2C2), Ha Long, Vietnam; 25.04.2017 - 30.04.2017; . BibTeX

    1760. Yu. Illarionov, M. Waltl, M. Jech, J. Kim, D. Akinwande, T. Grasser:
    "Reliability of Black Phosphorus Field-Effect Transistors with Respect to Bias-Temperature and Hot-Carrier Stress";
    Talk: International Reliability Physics Symposium (IRPS), Monterey, CA, USA; 02.04.2017 - 06.04.2017; in "Proceedings of the International Reliability Physics Symposium (IRPS)", (2017), ISBN: 978-1-5090-6642-1, 6A-6.1 - 6A-6.6 doi:10.1109/IRPS.2017.7936338. BibTeX

    1759. C. Ostermaier, P. Lagger, M. Reiner, A. Grill, R. Stradiotto, G. Pobegen, T. Grasser, R. Pietschnig, D. Pogany:
    "Review of bias-temperature instabilities at the III-N/dielectric interface";
    Talk: European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), Bordequx, Frankreich; 25.09.2017 - 28.09.2017; . BibTeX

    1758. K. Rupp:
    "Semiconductor Device Simulation Approaches for Massively Parallel Computing Architectures";
    Talk: SIAM Conference on Computational Science and Engineering, Atlanta, GA, USA; 27.02.2017 - 03.03.2017; . BibTeX

    1757. V. Sverdlov, S. Selberherr:
    "Shot noise at spin-dependent hopping in tunnel junctions with ferromagnetic electrodes";
    Talk: Emerging Technologies Communication Microsystems Optoelectronics Sensing (ETCMOS), Warsaw, Poland; (invited) 28.05.2017 - 30.05.2017; in "Proceedings of the ETCMOS 2017", (2017), ISBN: 1927500869, 57. BibTeX

    1756. V. Sverdlov, S. Selberherr:
    "Shot noise at spin-dependent hopping in tunnel junctions with ferromagnetic electrodes";
    Talk: APS March Meeting, New Orleans, USA; 13.03.2017 - 17.03.2017; in "Bulletin of the APS April Meeting 2017", (2017), ISSN: 0003-0503, . BibTeX

    1755. G. Meller, S. Selberherr:
    "Simulation of Injection Currents into Disordered Molecular Conductors";
    Poster: International Conference on Advanced Nano Materials (ANM), Aveiro, Portugal; 19.07.2017 - 21.07.2017; in "Proceedings of the 9thInternational Conference on Advanced Nano Materials (ANM)", (2017), . BibTeX

    1754. V. Sverdlov, J. Weinbub, S. Selberherr:
    "Spin-Based Non-Volatile Memory and Logic in Modern Nanoelectronics";
    BIT's Annual World Congress of Nano Science & Technology, Fukuoka; (invited) 24.10.2017 - 26.10.2017; in "Abstracts of the BIT's 7th Annual World Congress of Nano Science & Technology-2017", (2017), 343. BibTeX

    1753. V. Sverdlov, J. Weinbub, S. Selberherr:
    "Spin-Dependent Trap-Assisted Tunneling in Magnetic Tunnel Junctions: A Monte Carlo Study";
    Talk: International Workshop on Computational Nanotechnology (IWCN), Low Wood Bay, Lake District, UK; 05.06.2017 - 09.06.2017; in "Book of Abstracts of the International Workshop on Computational Nanotechnology (IWCN)", (2017), 88 - 90. BibTeX

    1752. V. Sverdlov, J. Weinbub, S. Selberherr:
    "Spintronics as a Non-Volatile Complement to Nanoelectronics";
    Talk: International Conference on Microelectronics, Devices and Materials (MIDEM), Ljubljana, Slovenia; (invited) 04.10.2017 - 06.10.2017; in "Proceedings of the 53rd International Conference on Microelectronics, Devices and Materials (MIDEM 2017)", (2017), ISBN: 978-961-92933-7-9, 10 page(s) . BibTeX

    1751. S. Selberherr:
    "The Evolution and Potential Future of Microelectronics";
    Talk: IEEE EDS Distinguished Lecture, The Hong Kong Polytechnic University, Hong Kong; (invited) 12.04.2017. BibTeX

    1750. B. Ullmann, M. Jech, S. E. Tyaginov, M. Waltl, Yu. Illarionov, A. Grill, K. Puschkarsky, H. Reisinger, T. Grasser:
    "The Impact of Mixed Negative Bias Temperature Instability and Hot Carrier Stress on Single Oxide Defects";
    Poster: International Reliability Physics Symposium (IRPS), Monterey, CA, USA; 04.04.2017 - 06.04.2017; in "Proceedings of the International Reliability Physics Symposium (IRPS)", (2017), ISBN: 978-1-5090-6642-1, XT-10.1 - XT-10.6 doi:10.1109/IRPS.2017.7936424. BibTeX

    1749. K. Puschkarsky, H. Reisinger, T. Aichinger, W. Gustin, T. Grasser:
    "Threshold Voltage Hysteresis in SiC MOSFETs and Its Impact on Circuit Operation";
    Talk: IEEE International Integrated Reliability Workshop (IIRW), Fallen Leaf Lake, CA, USA; 08.10.2017 - 12.10.2017; in "Proceedings of the IEEE International Integrated Reliability Workshop (IIRW)", (2017), 1 - 5. BibTeX

    1748. L. Gnam, J. Weinbub, A. Hössinger, S. Selberherr:
    "Towards a Metric for an Automatic Hull Mesh Coarsening Strategy";
    Talk: Vienna Young Scientists Symposium (VSS), Wien, Österreich; 01.06.2017 - 02.06.2017; in "Proceedings of the Vienna Young Scientists Symposium", (2017), ISBN: 978-3-9504017-5-2, 118 - 119. BibTeX

    1747. L. Gnam, J. Weinbub, K. Rupp, F. Rudolf, S. Selberherr:
    "Using Graph Partitioning and Coloring for Flexible Coarse-Grained Shared-Memory Parallel Mesh Adaptation";
    Talk: International Meshing Roundtable (IMR), Barcelona, Spanien; 18.09.2017 - 21.09.2017; in "Proceedings of the 26th International Meshing Roundtable (IMR26)", (2017), 5 page(s) . BibTeX

    1746. F. Rudolf, A. Morhammer, K. Rupp, J. Weinbub:
    "VSC School Project: Performance Enhancements of Algebraic Multigrid Methods in ViennaCL";
    Talk: Austrian HPC Meeting (AHPC), Grundlsee; 01.03.2017 - 03.03.2017; in "Book of Abstracts of the 2017 Austrian HPC Meeting (AHPC)", (2017), 1 page(s) . BibTeX

    1745. P. Ellinghaus, M. Nedjalkov, J. Weinbub, S. Selberherr:
    "Wigner Analysis of Surface Roughness in Quantum Wires";
    Talk: International Wigner Workshop (IW2), Low Wood Bay, Lake District, UK; 05.06.2017 in "Book of Abstracts of the International Wigner Workshop (IW2)", (2017), ISBN: 978-3-200-05129-4, 40 - 41. BibTeX

    1744. P. Ellinghaus, J. Weinbub, M. Nedjalkov, S. Selberherr:
    "Wigner Modelling of Surface Roughness in Quantum Wires";
    Poster: International Workshop on Computational Nanotechnology (IWCN), Low Wood Bay, Lake District, UK; 05.06.2017 - 09.06.2017; in "Book of Abstracts of the International Workshop on Computational Nanotechnology (IWCN)", (2017), 171 - 172. BibTeX

    1743. J. Weinbub, M. Nedjalkov, I. Dimov, S. Selberherr:
    "Wigner-Signed Particles Study of Double Dopant Quantum Effects";
    Poster: International Wigner Workshop (IW2), Low Wood Bay, Lake District, UK; 05.06.2017 in "Book of Abstracts of the International Wigner Workshop (IW2)", (2017), ISBN: 978-3-200-05129-4, 50 - 51. BibTeX

    1742. K. Rupp, J. Weinbub:
    "A Computational Scientist's Perspective on Current and Future Hardware Architectures";
    Talk: Austrian HPC Meeting (AHPC), Grundlsee, Austria; 22.02.2016 - 24.02.2016; in "Book of Abstracts of the 2016 Austrian HPC Meeting (AHPC)", (2016), 24. BibTeX

    1741. P. Sharma, S. E. Tyaginov, S. E. Rauch, J. Franco, B. Kaczer, A. Makarov, M. Vexler, T. Grasser:
    "A Drift-Diffusion-Based Analytic Description of the Energy Distribution Function for Hot-Carrier Degradation in Decananometer nMOSFETs";
    Talk: European Solid-State Device Research Conference (ESSDERC), Lausanne, Switzerland; 12.09.2016 - 15.09.2016; in "Proceedings of the European Solid-State Device Research Conference (ESSDERC)", (2016), ISBN: 978-1-5090-2969-3, 428 - 431 doi:10.1109/ESSDERC.2016.7599677. BibTeX

    1740. S. Papaleo, H. Ceric:
    "A Finite Element Method Study of Delamination at the Interface of the TSV Interconnects";
    Poster: International Reliability Physics Symposium (IRPS), Pasadena, CA USA; 17.04.2016 - 21.04.2016; in "Proceedings of the International Reliability Physics Symposium (IRPS)", (2016), ISBN: 978-1-4673-9136-8, PA-2-1 - PA-2-4 doi:10.1109/IRPS.2016.7574626. BibTeX

    1739. Yu. Illarionov, G. Rzepa, M. Waltl, H. Pandey, S. Kataria, V. Passi, M. Lemme, T. Grasser:
    "A Systematic Study of Charge Trapping in Single-Layer Double-Gated GFETs";
    Talk: Device Research Conference, Newark, Delaware, USA; 19.06.2016 - 22.06.2016; in "74th Device Research Conference Digest", (2016), ISBN: 978-1-5090-2827-6, 89 - 90. BibTeX

    1738. K. Giering, G.A. Rott, G. Rzepa, H. Reisinger, A. Puppala, T. Reich, W. Gustin, T. Grasser, R. Jancke:
    "Analog-circuit NBTI Degradation and Time-dependent NBTI Variability: An Efficient Physics-Based Compact Model";
    Talk: International Reliability Physics Symposium (IRPS), Pasadena, CA, USA; 17.04.2016 - 21.04.2016; in "Proceedings of the International Reliability Physics Symposium (IRPS)", (2016), 4C-4-1 - 4C-4-6 doi:10.1109/IRPS.2016.7574540. BibTeX

    1737. M. Thesberg, N. Neophytou, H. Kosina:
    "Calculating the Power Factor of Nano-Composite Materials from Fully Quantum-Mechanical Large-Scale Simulations";
    Talk: European Conference on Thermoelectrics (ECT), Lisbon, Portugal; 20.09.2016 - 23.09.2016; in "Book of Abstracts 14th European Conference on Thermoelectrics", (2016), . BibTeX

    1736. G. Rzepa, M. Waltl, W. Gös, B. Kaczer, J. Franco, T. Chiarella, N. Horiguchi, T. Grasser:
    "Complete Extraction of Defect Bands Responsible for Instabilities in n and pFinFETs";
    Talk: International Symposium on VLSI Technology, Honolulu, HI, USA; 14.06.2016 - 16.06.2016; in "2016 Symposium on VLSI Technology Digest of Technical Papers", (2016), ISBN: 978-1-5090-0638-0, 208 - 209. BibTeX

    1735. V. Sverdlov, S. Selberherr:
    "Effects of Spin Relaxation on Trap-Assisted Tunneling Through Ferromagnetic Metal-Oxide-Semiconductor Structures";
    Talk: APS March Meeting, Baltimore, USA; 14.03.2016 - 18.03.2016; in "Bulletin of the American Physical Society (APS March Meeting)", (2016), 61/1, ISSN: 0003-0503, 1 page(s) . BibTeX

    1734. L. Filipovic, S. Selberherr:
    "Effects of the Deposition Process Variation on the Performance of Open TSVs";
    Poster: IEEE Electronic Components and Technology Conference (ECTC), Las Vegas, NV, USA; 31.05.2016 - 03.06.2016; in "Proceedings of IEEE Electronic Components and Technology Conference (ECTC)", (2016), ISBN: 978-1-5090-1204-6, 2188 - 2195 doi:10.1109/ECTC.2016.177. BibTeX

    1733. M. Rovitto, H. Ceric:
    "Electromigration Induced Voiding and Resistance Change in Three-Dimensional Copper Through Silicon Vias";
    Talk: IEEE Electronic Components and Technology Conference (ECTC), Las Vegas, NV, USA; 31.05.2016 - 03.06.2016; in "Proceedings of IEEE Electronic Components and Technology Conference (ECTC)", (2016), ISBN: 978-1-5090-1204-6, 550 - 556 doi:10.1109/ECTC.2016.49. BibTeX

    1732. A. Selinger, K. Rupp, S. Selberherr:
    "Evaluation of Mobile ARM-Based SoCs for High Performance Computing";
    Talk: High Performance Computing Symposium (HPC), Pasadena, CA, USA; 03.04.2016 - 06.04.2016; in "Proceedings of the 24th High Performance Computing Symposium", (2016), ISBN: 978-1-5108-2318-1, 21:1 - 21:7 doi:10.22360/SpringSim.2016.HPC.022. BibTeX

    1731. N. Neophytou, M. Thesberg, H. Kosina:
    "Examining the Effectiveness of Energy-Filtering in 1D vs. 2D Structures Using Quantum Mechanical Transport Simulations";
    Talk: European Conference on Thermoelectrics (ECT), Lisbon, Portugal; 20.09.2016 - 23.09.2016; in "Book of Abstracts 14th European Conference on Thermoelectrics", (2016), . BibTeX

    1730. V. Simonka, G. Nawratil, A. Hössinger, J. Weinbub, S. Selberherr:
    "Geometrical Aspects of Three-Dimensional Silicon Carbide Oxidation Growth Rate Modeling";
    Poster: Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Wien; 25.01.2016 - 27.01.2016; in "Book of Abstracts of the Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)", (2016), ISBN: 978-3-901578-29-8, 128 - 129. BibTeX

    1729. T. Windbacher, B. Ullmann, A. Grill, J. Weinbub:
    "Ihr Smartphone - ein Supercomputer vor 20 Jahren. Ein Einblick in die Mikro- und Nanoelektronik";
    Talk: European Researchers' Night: beSCIENCEd 2016, Wien; 30.09.2016. BibTeX

    1728. B. Ullmann, A. Grill, P. Manstetten, M. Jech, M. Kampl, W. H. Zisser, L. Filipovic, M. Thesberg, F. Rudolf, T. Windbacher, J. Cervenka, M. Katterbauer, J. Weinbub:
    "Ihr Smartphone - ein Supercomputer vor 20 Jahren. Ein Einblick in die Mikro- und Nanoelektronik";
    Talk: Lange Nacht der Forschung 2016, Wien; 22.04.2016. BibTeX

    1727. L. Filipovic, A. P. Singulani, F. Roger, S. Carniello, S. Selberherr:
    "Impact of Across-Wafer Variation on the Electrical Performance of TSVs";
    Talk: IEEE International Interconnect Technology Conference (IITC), San Jose, CA, USA; 23.05.2016 - 26.05.2016; in "Proceedings of the IEEE International Interconnect Technology Conference (IITC)", (2016), ISBN: 978-1-5090-0386-0, 130 - 132 doi:10.1109/IITC-AMC.2016.7507707. BibTeX

    1726. T. Windbacher, B.G. Malm, V. Sverdlov, M. Östling, S. Selberherr:
    "Influence of the Free Layer Alignment on the Reliability of a Non-Volatile Magnetic Shift Register";
    Talk: Workshop on Innovative Nanoscale Devices and Systems (WINDS), Kona, HI, USA; (invited) 04.12.2016 - 09.12.2016; in "Abstracts of the Workshop on Innovative Nanoscale Devices and Systems (WINDS)", (2016), ISBN: 978-3-901578-30-4, 43. BibTeX

    1725. T. Windbacher, A. Makarov, V. Sverdlov, S. Selberherr:
    "Layer Coupling and Read Disturbances in a Buffered Magnetic Logic Environment";
    Talk: SPIE Spintronics, San Diego, CA, USA; (invited) 28.08.2016 - 01.09.2016; in "Proceedings of SPIE Spintronics", (2016), 9931-93. BibTeX

    1724. T. Windbacher, H. Mahmoudi, A. Makarov, V. Sverdlov, S. Selberherr:
    "Logic-in-memory: A Non-Volatile Processing Environment for the Post CMOS Age";
    Talk: SISPAD Workshop, Nürnberg, Germany; 05.09.2016 in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2016), . BibTeX

    1723. V. Sverdlov, A. Makarov, T. Windbacher, S. Selberherr:
    "Magnetic Field Dependent Tunneling Magnetoresistance through a Quantum Well between Ferromagnetic Contacts";
    Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Nürnberg, Deutschland; 06.09.2016 - 08.09.2016; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2016), ISBN: 978-1-5090-0817-9, 315 - 318 doi:10.1109/SISPAD.2016.7605210. BibTeX

    1722. T. Windbacher, V. Sverdlov, S. Selberherr:
    "Magnetic Nonvolatile Processing Environment";
    Talk: I International Scientific and Practical Conference Innovation in the Software Systems of Trains, Samara, Russia; (invited) 19.05.2016 - 20.05.2016; in "Program and Abstracts of the I International Scientific and Practical Conference Innovation in the Software Systems of Trains", (2016), 42 - 43. BibTeX

    1721. S. Papaleo, M. Rovitto, H. Ceric:
    "Mechanical Effects of the Volmer-Weber Growth in the TSV Sidewall";
    Talk: IEEE Electronic Components and Technology Conference (ECTC), Las Vegas, NV, USA; 31.05.2016 - 03.06.2016; in "Proceedings of IEEE Electronic Components and Technology Conference (ECTC)", (2016), ISBN: 978-1-5090-1204-6, 1617 - 1622 doi:10.1109/ECTC.2016.19. BibTeX

    1720. M. Nedjalkov, J. Weinbub, S. Selberherr:
    "Modeling Carrier Transport in Nanoscale Semiconductor Devices";
    Talk: BIT's Annual World Congress of Nano Science & Technology, Singapore; (invited) 26.10.2016 - 28.10.2016; in "Abstracts of the BIT's 6th Annual World Congress of Nano Science & Technology-2016", (2016), 377. BibTeX

    1719. P. Manstetten, L. Filipovic, A. Hössinger, J. Weinbub, S. Selberherr:
    "Modeling Neutral Particle Flux in High Aspect Ratio Holes using a One-Dimensional Radiosity Approach";
    Talk: Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Wien; 25.01.2016 - 27.01.2016; in "Book of Abstracts of the Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)", (2016), ISBN: 978-3-901578-29-8, 68 - 69. BibTeX

    1718. L. Filipovic, S. Selberherr:
    "Modeling the Deposition and Stress Generation in Thin Films for CMOS-Integrated Gas Sensors";
    Talk: World Congress of Smart Materials (WCSM), Singapore; (invited) 04.03.2016 - 06.03.2016; in "Proceedings of the BIT's 2nd Annual World Congress of Smart Materials 2016", (2016), 517. BibTeX

    1717. V. Sverdlov, J. Ghosh, A. Makarov, T. Windbacher, S. Selberherr:
    "Nanoelectronics with Spin";
    Talk: World Congress and Expo on Nanotechnology and Materials Science, Dubai, United Arab Emirates; (invited) 04.04.2016 - 06.04.2016; in "Book of Abstracts of the World Congress and Expo on Nanotechnology and Materials Science", (2016), 19 - 20. BibTeX

    1716. M. Waltl, A. Grill, G. Rzepa, W. Gös, J. Franco, B. Kaczer, J. Mitard, T. Grasser:
    "Nanoscale Evidence for the Superior Reliability of SiGe High-k pMOSFETs";
    Poster: International Reliability Physics Symposium (IRPS), Pasadena, CA, USA; 17.04.2016 - 21.04.2016; in "Proceedings of the International Reliability Physics Symposium (IRPS)", (2016), XT-02-1 - XT-02-6 doi:10.1109/IRPS.2016.7574644. BibTeX

    1715. T. Windbacher, A. Makarov, V. Sverdlov, S. Selberherr:
    "Novel Magnetic Devices for Memory and Non-Volatile Computing Applications";
    Talk: Emerging Technologies Communication Microsystems Optoelectronics Sensing (ETCMOS), Montreal, QC, Canada; 25.05.2016 - 27.05.2016; in "2016 Conference Program of the Emerging Technologies Communication Microsystems Optoelectronics Sensing (ETCMOS)", (2016), 14 page(s) . BibTeX

    1714. S. E. Tyaginov, A. Makarov, M. Jech, J. Franco, P. Sharma, B. Kaczer, T. Grasser:
    "On the Effect of Interface Traps on the Carrier Distribution Function During Hot-Carrier Degradation";
    Poster: IEEE International Integrated Reliability Workshop (IIRW), South Lake Tahoe, CA, USA; 09.10.2016 - 13.10.2016; in "Final Report of the IEEE International Integrated Reliability Workshop (IIRW)", (2016), ISBN: 978-1-5090-4193-0, 95 - 98 doi:10.1109/IIRW.2016.7904911. BibTeX

    1713. G. Rescher, G. Pobegen, T. Aichinger, T. Grasser:
    "On the Subthreshold Drain Current Sweep Hysteresis of 4H-SiC nMOSFETs";
    Talk: IEEE International Electron Devices Meeting (IEDM), San Francisco, CA, USA; 03.12.2016 - 07.12.2016; in "Proceedings of the IEEE International Electron Devices Meeting (IEDM)", (2016), ISBN: 978-1-5090-3902-9, 10.8.1 - 10.8.4 doi:10.1109/IEDM.2016.7838392. BibTeX

    1712. B. Kaczer, S. Amoroso, R. Hussin, A. Asenov, J. Franco, P. Weckx, Ph. J. Roussel, G. Rzepa, T. Grasser, N. Horiguchi:
    "On the distribution of the FET threshold voltage shifts due to individual charged gate oxide defects";
    Talk: IEEE International Integrated Reliability Workshop (IIRW), Stanford Sierra Conference Center, S. Lake Tahoe, California, USA; 09.10.2016 - 13.10.2016; in "Proceedings of the IEEE International Integrated Reliability Workshop (IIRW)", (2016), ISBN: 978-1-5090-4192-3, 3 page(s) . BibTeX

    1711. T. Sadi, E. Towie, M. Nedjalkov, C. Riddet, C. Alexander, L. Wang, V. Georgiev, A. Brown, C. Millar, A. Asenov:
    "One-Dimensional Multi-Subband Monte Carlo Simulation of Charge Transport in Si Nanowire Transistors";
    Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Nürnberg, Deutschland; 06.09.2016 - 08.09.2016; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2016), ISBN: 978-1-5090-0817-9, 23 - 26 doi:10.1109/SISPAD.2016.7605139. BibTeX

    1710. A. Morhammer, K. Rupp, F. Rudolf, J. Weinbub:
    "Optimized Sparse Matrix-Matrix Multilication for Multi-Core CPUs, GPUs and MICs";
    Talk: Austrian HPC Meeting (AHPC), Grundlsee, Austria; 22.02.2016 - 24.02.2016; in "Book of Abstracts of the 2016 Austrian HPC Meeting (AHPC)", (2016), 23. BibTeX

    1709. K. Rupp, A. Morhammer, T. Grasser, A. Jüngel:
    "Parallel Deterministic Solution of the Boltzmann Transport Equation for Semiconductors";
    Talk: International Workshop on Finite Elements for Microwave Engineering, Florence, Italy; 16.05.2016 - 18.05.2016; in "Proceedings of the 13th Workshop on Finite Elements for Microwave Engineering", (2016), ISBN: 978-88-6655-967-2, 104. BibTeX

    1708. M. Nedjalkov, P. Ellinghaus, J. Weinbub, S. Selberherr, T. Sadi, A. Asenov, L. Wang, S. Amoroso, E. Towie:
    "Physical Models for Variation-Aware Device Simulation";
    Talk: Workshop on Variability-Aware Design Technology Co-Optimization, Nuremberg, Germany; (invited) 05.09.2016. BibTeX

    1707. M. Thesberg, N. Neophytou, M. Pourfath, H. Kosina:
    "Power Factor Degradation Mechanisms in Energy-Filtering Thermoelectric Materials";
    Talk: Energy-Materials-Nanotechnology Meeting on Thermoelectric Materials (EMN), Orlando, USA; (invited) 22.02.2016 - 25.02.2016; . BibTeX

    1706. Yu. Illarionov, M. Waltl, M. M. Furchi, T. Müller, T. Grasser:
    "Reliability of Single-Layer MoS2 Field-Effect Transistors with SiO2 and hBN Gate Insulators";
    Talk: IEEE International Reliability Physics Symposium (IRPS), Pasadena, CA, USA; 17.04.2016 - 21.04.2016; in "Proceedings of the IEEE International Reliability Physics Symposium (IRPS)", (2016), 5A-1-1 - 5A-1-6 doi:10.1109/IRPS.2016.7574543. BibTeX

    1705. H. Kosina:
    "Semiconductor Device Modeling at the Nanoscale";
    Talk: 42nd International Conference on Nano Engineering, MNE 2016, Wien; (invited) 19.09.2016 - 23.09.2016; . BibTeX

    1704. J. Weinbub, A. Hössinger:
    "Shared-Memory Parallelization of the Fast Marching Method Using an Overlapping Domain-Decomposition Approach";
    Talk: High Performance Computing Symposium (HPC), Pasadena, CA, USA; 03.04.2016 - 06.04.2016; in "Proceedings of the High Performance Computing Symposium (HPC)", (2016), ISBN: 978-1-5108-2318-1, 18:1 - 18:8 doi:10.22360/SpringSim.2016.HPC.052. BibTeX

    1703. M. Nedjalkov, J. Weinbub, I. Dimov, S. Selberherr:
    "Signed Particle Interpretation for Wigner-Quantum Electron Evolution";
    National Congress of Physical Sciences, Sofia, Bulgaria; (invited) 29.09.2016 - 02.10.2016; in "Abstracts Third National Congress of Physical Sciences", (2016), 1. BibTeX

    1702. V. Sverdlov, T. Windbacher, A. Makarov, S. Selberherr:
    "Silicon Spintronics";
    Talk: Energy-Materials-Nanotechnology Meeting on Magnetic Materials (EMN), Kona, USA; (invited) 21.03.2016 - 24.03.2016; in "Abstracts of the Energy-Materials-Nanotechnology Meeting on Magnetic Materials (EMN)", (2016), 37 - 38. BibTeX

    1701. A. Makarov, V. Sverdlov, T. Windbacher, S. Selberherr:
    "Silicon Spintronics";
    Talk: International Conference on Electronic Materials (ICEM), Singapur; (invited) 04.07.2016 - 08.07.2016; in "Proceedings of the ICEM 2016", (2016), 1 page(s) . BibTeX

    1700. L. Wang, T. Sadi, A. Brown, M. Nedjalkov, C. Alexander, B. Cheng, C. Millar, A. Asenov:
    "Simulation Analysis of the Electro-Thermal Performance of SOI FinFETs";
    Talk: Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Wien; 25.01.2016 - 27.01.2016; in "Book of Abstracts of the Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)", (2016), ISBN: 978-3-901578-29-8, 34 - 35. BibTeX

    1699. V. Sverdlov, S. Selberherr:
    "Spin-dependent Resonant Tunneling in Ferromagnet-Oxide-Silicon Structures";
    Poster: Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Vienna, Austria; 25.01.2016 - 27.01.2016; in "Book of Abstracts of the Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)", (2016), ISBN: 978-3-901578-29-8, 116 - 117. BibTeX

    1698. H. Ceric, R. Orio, M. Rovitto:
    "TCAD Approach for the Assessment of Interconnect Reliability";
    Talk: International Conference Reliability and Stress-Related Phenomena in Nanoelectronics - Experiment and Simulation (IRSP), Bad Schandau, Germany; (invited) 30.05.2016 - 01.06.2016; in "Abstracts of the International Conference Reliability and Stress-Related Phenomena in Nanoelectronics - Experiment and Simulation (IRSP)", (2016), T21. BibTeX

    1697. Yu. Illarionov, M. Waltl, J. Kim, D. Akinwande, T. Grasser:
    "Temperature-dependent Hysteresis in Black Phosphorus FETs";
    Poster: Graphene Week, Warsaw, Poland; 13.06.2016 - 17.06.2016; in "Proceedings of the 2016 Graphene Week", (2016), . BibTeX

    1696. T. Grasser, M. Waltl, G. Rzepa, W. Gös, Y. Wimmer, A.-M. El-Sayed, A. Shluger, H. Reisinger, B. Kaczer:
    "The "Permanent" Component of NBTI Revisited: Saturation, Degradation-Reversal, and Annealing";
    Talk: International Reliability Physics Symposium (IRPS), Pasadena, CA, USA; 17.04.2016 - 21.04.2016; in "Proceedings of the International Reliability Physics Symposium (IRPS)", (2016), 5A-2-1 - 5A-2-8 doi:10.1109/IRPS.2016.7574504. BibTeX

    1695. M. Nedjalkov, J. Weinbub, S. Selberherr:
    "The Description of Carrier Transport for Quantum Systems";
    Talk: Energy Materials Nanotechnology Meeting on Quantum, Phuket, Thailand; (invited) 08.04.2016 - 11.04.2016; in "Book of Abstracts of the Energy Materials Nanotechnology Meeting on Quantum", (2016), 41 - 42. BibTeX

    1694. T. Windbacher, A. Makarov, V. Sverdlov, S. Selberherr:
    "The Exploitation of Magnetization Orientation Encoded Spin-Transfer Torque for an Ultra Dense Non-Volatile Magnetic Shift Register";
    Talk: European Solid-State Device Research Conference (ESSDERC), Lausanne, Switzerland; 12.09.2016 - 16.09.2016; in "Proceedings of the European Solid-State Device Research Conference (ESSDERC)", (2016), ISBN: 978-1-5090-2969-3, 311 - 314 doi:10.1109/ESSDERC.2016.7599648. BibTeX

    1693. V. Simonka, A. Hössinger, J. Weinbub, S. Selberherr:
    "Three-Dimensional Growth Rate Modeling and Simulation of Silicon Carbide Thermal Oxidation";
    Poster: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Nürnberg, Deutschland; 06.09.2016 - 08.09.2016; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2016), ISBN: 978-1-5090-0817-9, 233 - 236 doi:10.1109/SISPAD.2016.7605190. BibTeX

    1692. V. Sverdlov, J. Ghosh, S. Selberherr:
    "Universal Dependence of the Spin Lifetime in Silicon Films on the Spin Injection Direction";
    Talk: Workshop on Innovative Nanoscale Devices and Systems (WINDS), Kona, HI, USA; (invited) 04.12.2016 - 09.12.2016; in "Abstracts of the Workshop on Innovative Nanoscale Devices and Systems (WINDS)", (2016), ISBN: 978-3-901578-30-4, 7. BibTeX

    1691. P. Manstetten, L. Filipovic, A. Hössinger, J. Weinbub, S. Selberherr:
    "Using One-Dimensional Radiosity to Model Neutral Flux in Convex High Aspect Ratio Structures";
    Poster: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Nürnberg, Deutschland; 06.09.2016 - 08.09.2016; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2016), ISBN: 978-1-5090-0817-9, 265 - 268 doi:10.1109/SISPAD.2016.7605198. BibTeX

    1690. M. Karner, O. Baumgartner, Z. Stanojevic, F. Schanovsky, G. Strof, Ch. Kernstock, H. W. Karner, G. Rzepa, T. Grasser:
    "Vertically Stacked Nanowire MOSFETs for Sub-10nm Nodes: Advanced Topography, Device, Variability, and Reliability Simulations";
    Talk: IEEE International Electron Devices Meeting (IEDM), San Francisco, CA, USA; 03.12.2016 - 07.12.2016; in "Proceedings of the IEEE International Electron Devices Meeting (IEDM)", (2016), ISBN: 978-1-5090-3902-9, 30.7.1 - 30.7.4 doi:10.1109/IEDM.2016.7838516. BibTeX

    1689. P. Ellinghaus, M. Nedjalkov, J. Weinbub, S. Selberherr:
    "Wigner Modelling of Quantum Wires";
    Talk: Workshop on Innovative Nanoscale Devices and Systems (WINDS), Kona, HI, USA; (invited) 04.12.2016 - 09.12.2016; in "Abstracts of the Workshop on Innovative Nanoscale Devices and Systems (WINDS)", (2016), ISBN: 978-3-901578-30-4, 2. BibTeX

    1688. M. Nedjalkov, J. Weinbub, P. Ellinghaus, S. Selberherr:
    "Wigner Signed Particles - An Intuitive Alternative of Particle-Wave Duality";
    Talk: SEMODAY Meeting, Florence, Italy; (invited) 16.10.2016 - 17.10.2016; . BibTeX

    1687. L. Wang, A. Brown, M. Nedjalkov, C. Alexander, B. Cheng, C. Millar, A. Asenov:
    "3D Electro-Thermal Simulations of Bulk FinFETs with Statistical Variations";
    Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Washington DC, USA; 09.09.2015 - 11.09.2015; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2015), ISBN: 978-1-4673-7858-1, 112 - 115 doi:10.1109/SISPAD.2015.7292271. BibTeX

    1686. Y. Wimmer, W. Gös, A.-M. El-Sayed, A. Shluger, T. Grasser:
    "A Density-Functional Study of Defect Volatility in Amorphous Silicon Dioxide";
    Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Washington DC, USA; 09.09.2015 - 11.09.2015; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2015), ISBN: 978-1-4673-7860-4, 44 - 47 doi:10.1109/SISPAD.2015.7292254. BibTeX

    1685. P. Sharma, S. E. Tyaginov, Y. Wimmer, F. Rudolf, H. Enichlmair, J.M. Park, H. Ceric, T. Grasser:
    "A Model for Hot-Carrier Degradation in nLDMOS Transistors Based on the Exact Solution of the Boltzmann Transport Equation Versus the Drift-Diffusion Scheme";
    Talk: Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Bologna, Italy; 26.01.2015 - 28.01.2015; in "Proceedings of the Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)", (2015), 21 - 24 doi:10.1109/ULIS.2015.7063763. BibTeX

    1684. A. Makarov, T. Windbacher, V. Sverdlov, S. Selberherr:
    "A Novel Method of SOT-MRAM Switching";
    Talk: International Symposium on Advanced Nanostructures and Nano-Devices (ISANN), Waikaloa, Hawaii, USA; 29.11.2015 - 04.12.2015; in "Abstracts International Symposium on Advanced Nanodevices and Nanotechnology (ISANN)", (2015), . BibTeX

    1683. K. Rupp, A. Jüngel, T. Grasser:
    "A Performance Comparison of Algebraic Multigrid Preconditioners on GPUs and MIC";
    Talk: Copper Mountain Conference on Multigrid Methods, Copper Mountain, CO, USA; 22.03.2015 - 27.03.2015; . BibTeX

    1682. A. Kefayati, M. Pourfath, H. Kosina:
    "A Rigorous Study of Nanoscaled Transistors Based on Single-Layer MoS2";
    Poster: International Workshop on Computational Electronics (IWCE), West Lafayette, Indiana, USA; 02.09.2015 - 04.09.2015; in "Book of Abstracts of the International Workshop on Computational Electronics (IWCE)", (2015), ISBN: 978-0-692-50554-0, 7 - 8. BibTeX

    1681. T. Windbacher, A. Makarov, V. Sverdlov, S. Selberherr:
    "A Universal Nonvolatile Processing Environment";
    Poster: Advanced Research Workshop on Future Trends in Microelectronics: Journey into the Unknown, Mallorca, Spain; 21.06.2015 - 26.06.2015; in "Abstracts Advanced Research Workshop on Future Trends in Microelectronics: Journey into the Unknown", (2015), 62. BibTeX

    1680. T. Grasser:
    "Advanced Modeling and Characterization of Bias Temperature Instabilities and Hot Carrier Degradation";
    Talk: D2T Symposium, Tokyo, Japan; (invited) 21.08.2015. BibTeX

    1679. T. Grasser:
    "Advanced Modeling and Characterization of Bias Temperature Instabilities and Hot Carrier Degradation";
    Talk: Kyoto Institute of Technology, Kyoto, Japan; (invited) 24.08.2015. BibTeX

    1678. L. Wang, T. Sadi, M. Nedjalkov, A. Brown, C. Alexander, B. Cheng, C. Millar, A. Asenov:
    "An Advanced Electro-Thermal Simulation Methodology For Nanoscale Device";
    IEEE, in "Proceedings of the International Workshop on Computational Electronics (IWCE)", (2015), ISBN: 978-0-692-51523-5, doi:10.1109/IWCE.2015.7301989. BibTeX

    1677. L. Wang, T. Sadi, M. Nedjalkov, A. Brown, C. Alexander, B. Cheng, C. Millar, A. Asenov:
    "An Advanced Electro-Thermal Simulation Methodology For Nanoscale Device";
    Poster: International Workshop on Computational Electronics (IWCE), West Lafayette, Indiana, USA; 02.09.2015 - 04.09.2015; in "Book of Abstracts of the International Workshop on Computational Electronics (IWCE)", (2015), ISBN: 978-0-692-50554-0, 155 - 156. BibTeX

    1676. M. Rovitto, W. H. Zisser, H. Ceric:
    "Analysis of Electromigration Void Nucleation Failure Time in Open Copper TSVs";
    Poster: IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), Hsinchu, Taiwan; 29.06.2015 - 02.07.2015; in "Proceedings of the IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)", (2015), . BibTeX

    1675. Yu. Illarionov, M. Waltl, A. Smith, S. Vaziri, M. Ostling, M. Lemme, T. Grasser:
    "Back Gate Bias-Temperature Instability in Single-Layer Double-Gated Graphene Field-Effect Transistors";
    Talk: International Conference on Solid State Devices and Materials (SSDM), Sapporo, Japan; 27.09.2015 - 30.09.2015; in "Extended Abstracts of the 2015 International Conference on Solid State Devices and Materials (SSDM 2015)", (2015), ISBN: 978-4-86348-514-3, 650 - 651. BibTeX

    1674. H. Kosina:
    "Blessing or curse: Dissipative quantum transport in nano-scale devices";
    Talk: Workshop "From Atom to Transistor" at the 45th European Solid-State Device Research Conference (ESSDERC), Graz; (invited) 18.09.2015. BibTeX

    1673. V. Sverdlov, J. Ghosh, A. Makarov, T. Windbacher, S. Selberherr:
    "CMOS-Compatible Spintronic Devices";
    Talk: International Symposium on Microelectronics Technology and Devices (SBMicro), Salvador, Brazil; (invited) 01.09.2015 - 04.09.2015; in "Proceedings of the 30th Symposium on Microelectronics Technology and Devices (SBMicro)", (2015), ISBN: 978-1-4673-7162-9, 4 page(s) doi:10.1109/SBMicro.2015.7298103. BibTeX

    1672. S. Selberherr:
    "CMOS-Compatible Spintronic Devices";
    Talk: IEEE EDS Mini-Colloquium Distinguished Lecture, Universidade Salvador, Salvador, Brasil; (invited) 01.09.2015. BibTeX

    1671. N. Neophytou, M. Thesberg, M. Pourfath, H. Kosina:
    "Calculations of the Thermopower in Materials with Nano-Inclusions Using Quantum Mechanical Simulations";
    Talk: APS March Meeting, San Antonio, USA; 02.03.2015 - 06.03.2015; in "Bulletin of the American Physical Society (APS March Meeting)", (2015), 60/1, . BibTeX

    1670. G. Rzepa, W. Gös, B. Kaczer, T. Grasser:
    "Characterization and Modeling of Reliability Issues in Nanoscale Devices";
    Talk: IEEE International Symposium on Circuits and Systems (ISCAS), Lisbon, Portugal; (invited) 24.05.2015 - 27.05.2015; in "Proceedings of the IEEE International Symposium on Circuits and Systems (ISCAS) 2015", (2015), ISBN: 978-1-4799-8391-9, 2445 - 2448. BibTeX

    1669. Yu. Illarionov, M. Vexler, V. V. Fedorov, S. M. Suturin, N. S. Sokolov, T. Grasser:
    "Characterization of Epitaxial Calcium Fluoride as a Dielectric Material for Ultra-Thin Barrier Layers in Silicon Microelectronics";
    Poster: International Conference on Solid State Devices and Materials (SSDM), Sapporo, Japan; 27.09.2015 - 30.09.2015; in "Extended Abstracts of the 2015 International Conference on Solid State Devices and Materials (SSDM 2015)", (2015), ISBN: 978-4-86348-514-3, 330 - 331. BibTeX

    1668. B. Ullmann, M. Waltl, T. Grasser:
    "Characterization of the Permanent Component of MOSFET Degradation Mechanisms";
    Talk: Vienna Young Scientists Symposium - VSS 2015, Vienna University of Technology; 25.06.2015 - 26.06.2015; in "Proceedings of the 2015 Vienna Young Scient Symposium", (2015), ISBN: 978-3-9504017-0-7, 36 - 37. BibTeX

    1667. A. Grill, G. Rzepa, P. Lagger, C. Ostermaier, H. Ceric, T. Grasser:
    "Charge Feedback Mechanisms at Forward Threshold Voltage Stress in GaN/AlGaN HEMTs";
    Talk: IEEE International Reliability Workshop (IIRW), South Lake Tahoe, CA, USA; 11.10.2015 - 15.10.2015; in "Proceedings of the IEEE International Integrated Reliability Workshop (IIRW)", (2015), ISBN: 978-1-4673-7395-1, 41 - 45 doi:10.1109/IIRW.2015.7437064. BibTeX

    1666. T. Grasser:
    "Charge Transfer of Single Holes in Nanoscale MOS Transistors: Linking DFT to Experiment";
    Talk: CECAM-Workshop on Structural and Electronic Phenomena at Interfaces of Nanoscale Oxides, Lausanne, Switzerland; (invited) 08.04.2015 - 10.04.2015; . BibTeX

    1665. H. Ceric, S. Selberherr:
    "Compact Model for Solder Bump Electromigration Failure";
    Poster: International Interconnect Technology and Materials for Advanced Metallization Conference (IITC/MAM), Grenoble, France; 18.05.2015 - 21.05.2015; in "Proceedings of the International Interconnect Technology and Materials for Advanced Metallization Conference (IITC/MAM)", (2015), ISBN: 978-1-4673-7355-5, 159 - 161 doi:10.1109/IITC-MAM.2015.7325651. BibTeX

    1664. P. Sharma, S. E. Tyaginov, Y. Wimmer, F. Rudolf, K. Rupp, H. Enichlmair, J.M. Park, H. Ceric, T. Grasser:
    "Comparison of Analytic Distribution Function Models for Hot-Carrier Degradation in nLDMOSFETs";
    Talk: European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), Toulouse, France; 05.10.2015 - 09.10.2015; in "Abstracts of the 26th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis", (2015), 60. BibTeX

    1663. J. Weinbub, P. Ellinghaus, M. Nedjalkov, S. Selberherr:
    "Comparison of Slab and Block Decomposition Strategies for the Two-Dimensional Wigner Monte Carlo Method";
    Talk: International Symposium on Advanced Nanostructures and Nano-Devices (ISANN), Waikaloa, Hawaii, USA; 29.11.2015 - 04.12.2015; in "Abstracts International Symposium on Advanced Nanodevices and Nanotechnology (ISANN)", (2015), . BibTeX

    1662. A. Makarov, T. Windbacher, V. Sverdlov, S. Selberherr:
    "Concept of a SOT-MRAM based on 1Transistor-1MTJ-Cell Structure";
    Poster: International Conference on Solid State Devices and Materials (SSDM), Sapporo, Japan; 27.09.2015 - 30.09.2015; in "Extended Abstracts of the International Conference on Solid State Devices and Materials (SSDM)", (2015), ISBN: 978-4-86348-514-3, 140 - 141. BibTeX

    1661. J. Ghosh, D. Osintsev, V. Sverdlov, S. Selberherr:
    "Dependence of Spin Lifetime on Spin Injection Orientation in Strained Silicon Films";
    Poster: Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Bologna, Italy; 26.01.2015 - 28.01.2015; in "Proceedings of the Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)", (2015), ISBN: 978-1-4799-6910-4, 285 - 288 doi:10.1109/ULIS.2015.7063829. BibTeX

    1660. S. Papaleo, W. H. Zisser, H. Ceric:
    "Effects of the Initial Stress at the Bottom of Open TSVs";
    Poster: IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), Hsinchu, Taiwan; 29.06.2015 - 02.07.2015; in "Proceedings of the IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)", (2015), . BibTeX

    1659. A. Makarov, T. Windbacher, V. Sverdlov, S. Selberherr:
    "Efficient High-Frequency Spin-Torque Oscillators Composed of Two Three-Layer MgO-MTJs with a Common Free Layer";
    Talk: Iberchip Workshop (IWS), Montevideo, Uruguay; (invited) 24.02.2015 - 27.02.2015; in "Proceedings of 21st Iberchip Worshop", (2015), 23, . BibTeX

    1658. O. Baumgartner, L. Filipovic, H. Kosina, M. Karner, Z. Stanojevic, H. W. Cheng-Karner:
    "Efficient Modeling of Source/Drain Tunneling in Ultra-Scaled Transistors";
    Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Washington DC, USA; 09.09.2015 - 11.09.2015; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2015), ISBN: 978-1-4673-7859-8, 202 - 205 doi:10.1109/SISPAD.2015.7292294. BibTeX

    1657. A. Selinger, D. Ojdanic, K. Rupp, E. Langer:
    "Eigenvalue Computations on Graphics Processing Units";
    Talk: Vienna Young Scientists Symposium - VSS 2015, Vienna University of Technology; 25.06.2015 - 26.06.2015; in "Proceedings of the 2015 Vienna Young Scientist Symposium", (2015), Gumpoldskirchen, Austria, ISBN: 978-3-9504017-0-7, 40 - 41. BibTeX

    1656. M. Rovitto, W. H. Zisser, H. Ceric, T. Grasser:
    "Electromigration Modelling of Void Nucleation in Open Cu-TSVs";
    Poster: International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), Budapest, Hungary; 19.04.2015 - 22.04.2015; in "Proceedings of the International Conference on Thermal, Mechanical & Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE)", (2015), ISBN: 978-1-4799-9949-1, 5 page(s) doi:10.1109/EuroSimE.2015.7103100. BibTeX

    1655. V. Sverdlov, J. Ghosh, D. Osintsev, S. Selberherr:
    "Electron Spin Lifetime Enhancement by Shear Strain in Thin Silicon Films";
    Talk: CMOS Emerging Technologies Research (CMOSETR), Vancouver, BC, Canada; (invited) 20.05.2015 - 22.05.2015; in "Book of Abstracts of the 2015 CMOS Emerging Technologies Research Symposium (CMOSETR)", (2015), ISBN: 978-1-927500-70-5, 58. BibTeX

    1654. J. Ghosh, D. Osintsev, V. Sverdlov, S. Selberherr:
    "Evaluation of Spin Lifetime in Thin Silicon Films by Multilevel Parallelization";
    Poster: nanoHUB User Conference, West Lafayette, Indiana, USA; 31.08.2015 - 01.09.2015; in "Proceedings of the nanoHUB User Conference", (2015), 1. BibTeX

    1653. H. Demel, Z. Stanojevic, M. Karner, G. Rzepa, T. Grasser:
    "Expanding TCAD Simulations from Grid to Cloud";
    Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Washington DC, USA; 09.09.2015 - 11.09.2015; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2015), ISBN: 978-1-4673-7860-4, 186 - 189 doi:10.1109/SISPAD.2015.7292290. BibTeX

    1652. L. Gerrer, R. Hussin, S. Amoroso, J. Franco, P. Weckx, N. Simicic, N. Horiguchi, B. Kaczer, T. Grasser, A. Asenov:
    "Experimental Evidences and Simulations of Trap Generation along a Percolation Path";
    Talk: European Solid-State Device Research Conference (ESSDERC), Graz; 14.09.2015 - 18.09.2015; in "Proceedings of the European Solid-State Device Research Conference (ESSDERC)", (2015), ISBN: 978-1-4673-7133-9, 226 - 229 doi:10.1109/ESSDERC.2015.7324755. BibTeX

    1651. M. Knepley, K. Rupp, A. Terrel:
    "FEM Integration with Quadrature on the GPU";
    Talk: SIAM Conference on Computational Science and Engineering, Salt Lake City, Utah, USA; 14.03.2015 - 18.03.2015; . BibTeX

    1650. S. Papaleo, W. H. Zisser, H. Ceric:
    "Factors that Influence Delamination at the Bottom of Open TSVs";
    Poster: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Washington DC, USA; 09.09.2015 - 11.09.2015; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2015), ISBN: 978-1-4673-7858-1, 421 - 424 doi:10.1109/SISPAD.2015.7292350. BibTeX

    1649. T. Grasser, M. Waltl, Y. Wimmer, W. Gös, R. Kosik, G. Rzepa, H. Reisinger, G. Pobegen, A.-M. El-Sayed, A. Shluger, B. Kaczer:
    "Gate-Sided Hydrogen Release as the Origin of "Permanent" NBTI Degradation: From Single Defects to Lifetimes";
    Talk: IEEE International Electron Devices Meeting (IEDM), Washington, DC, USA; 07.12.2015 - 09.12.2015; in "Proceedings of the IEEE International Electron Devices Meeting (IEDM)", (2015), 535 - 538 doi:10.1109/IEDM.2015.7409739. BibTeX

    1648. F. Roger, A. P. Singulani, S. Carniello, L. Filipovic, S. Selberherr:
    "Global Statistical Methodology for the Analysis of Equipment Parameter Effects on TSV Formation";
    Talk: International Workshop on CMOS Variability (VARI), Salvador, Brazil; 01.09.2015 - 04.09.2015; in "Proceedings of the 6th International Workshop on CMOS Variability (VARI)", (2015), ISBN: 978-1-5090-0071-5, 39 - 44 doi:10.1109/VARI.2015.7456561. BibTeX

    1647. M. Karner, Z. Stanojevic, Ch. Kernstock, O. Baumgartner, H. W. Cheng-Karner:
    "Hierarchical TCAD Device Simulation of FinFETs";
    Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Washington DC, USA; 09.09.2015 - 11.09.2015; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2015), ISBN: 978-1-4673-7859-8, 258 - 261 doi:10.1109/SISPAD.2015.7292308. BibTeX

    1646. Yu. Illarionov, M. Waltl, A. Smith, S. Vaziri, M. Ostling, T. Müller, M. Lemme, T. Grasser:
    "Hot-Carrier Degradation in Single-Layer Double-Gated Graphene Field-Effect Transistors";
    Talk: International Reliability Physics Symposium (IRPS), Monterey, CA, USA; 19.04.2015 - 23.04.2015; in "Proceedings of the International Reliability Physics Symposium (IRPS)", (2015), XT.2.1 - XT.2.6 doi:10.1109/IRPS.2015.7112834. BibTeX

    1645. Yu. Illarionov, M. Waltl, A. Smith, S. Vaziri, M. Ostling, M. Lemme, T. Grasser:
    "Impact of Hot Carrier Stress on the Defect Density and Mobility in Double-Gated Graphene Field-Effect Transistors";
    Talk: Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Bologna, Italy; 26.01.2015 - 28.01.2015; in "Proceedings of the Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)", (2015), ISBN: 978-1-4799-6910-4, 81 - 84 doi:10.1109/ULIS.2015.7063778. BibTeX

    1644. H. Ceric, M. Rovitto:
    "Impact of Microstructure and Current Crowding on Electromigration: A TCAD Study";
    Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Washington DC, USA; 09.09.2015 - 11.09.2015; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2015), ISBN: 978-1-4673-7858-1, 194 - 197 doi:10.1109/SISPAD.2015.7292292. BibTeX

    1643. P. Ellinghaus, M. Nedjalkov, S. Selberherr:
    "Improved Drive-Current into Nanoscaled Channels using Electrostatic Lenses";
    Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Washington DC, USA; 09.09.2015 - 11.09.2015; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2015), ISBN: 978-1-4673-7860-4, 24 - 27 doi:10.1109/SISPAD.2015.7292249. BibTeX

    1642. P. Ellinghaus, M. Nedjalkov, S. Selberherr:
    "Improved Particle Annihilation for Wigner Monte Carlo Simulations on a High-Resolution Mesh";
    Talk: International Workshop on Computational Electronics (IWCE), West Lafayette, Indiana, USA; 02.09.2015 - 04.09.2015; in "Book of Abstracts of the International Workshop on Computational Electronics (IWCE)", (2015), ISBN: 978-0-692-50554-0, 93 - 94. BibTeX

    1641. T. Windbacher, A. Makarov, V. Sverdlov, S. Selberherr:
    "Improving the Performance of a Non-Volatile Magnetic Flip Flop by Exploiting the Spin Hall Effect";
    Poster: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Washington DC, USA; 09.09.2015 - 11.09.2015; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2015), ISBN: 978-1-4673-7858-1, 446 - 449 doi:10.1109/SISPAD.2015.7292357. BibTeX

    1640. J. Ghosh, D. Osintsev, V. Sverdlov, S. Selberherr:
    "Increase of Surface Roughness and Phonon Scattering Mediated Spin Lifetime in Thin Strained SOI Film";
    Talk: European Materials Research Society (EMRS), Warsaw, Poland; 15.09.2015 - 18.09.2015; in "Book of Abstracts of the 2015 E-MRS Fall Meeting", (2015), 1 page(s) . BibTeX

    1639. J. Ghosh, V. Sverdlov, S. Selberherr:
    "Increment of Spin Lifetime by Spin Injection Orientation in Stressed Thin SOI Films";
    Poster: International Conference on Spintronics and Quantum Information Technology (SPINTECH), Basel, Switzerland; 10.08.2015 - 13.08.2015; in "Program and Abstract Book of the 8th International School & Conference on Spintronics and Quantum Information Technology", (2015), 130. BibTeX

    1638. J. Ghosh, V. Sverdlov, S. Selberherr:
    "Influence of Valley Splitting on Spin Relaxation Time in a Strained Thin Silicon Film";
    Talk: International Workshop on Computational Electronics (IWCE), West Lafayette, Indiana, USA; 02.09.2015 - 04.09.2015; in "Proceedings of the International Workshop on Computational Electronics (IWCE)", (2015), ISBN: 978-0-692-51523-5, 4 page(s) doi:10.1109/IWCE.2015.7301961. BibTeX

    1637. J. Ghosh, D. Osintsev, V. Sverdlov, S. Selberherr:
    "Injection Direction Sensitive Spin Lifetime Model in a Strained Thin Silicon Film";
    Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Washington DC, USA; 09.09.2015 - 11.09.2015; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2015), ISBN: 978-1-4673-7858-1, 277 - 280 doi:10.1109/SISPAD.2015.7292313. BibTeX

    1636. Yu. Illarionov, M. Waltl, S. Smith, S. Vaziri, M. Ostling, M. Lemme, T. Grasser:
    "Interplay between Hot Carrier and Bias Stress Components in Single-Layer Double-Gated Graphene Field-Effect Transistors";
    Talk: European Solid-State Device Research Conference (ESSDERC), Graz, Austria; 14.09.2015 - 18.09.2015; in "Proceedings of the European Solid-State Device Research Conference (ESSDERC)", (2015), ISBN: 978-1-4673-7133-9, 172 - 175 doi:10.1109/ESSDERC.2015.7324741. BibTeX

    1635. J. Ghosh, D. Osintsev, V. Sverdlov, S. Selberherr:
    "Intersubband Spin Relaxation Reduction and Spin Lifetime Enhancement by Strain in SOI Structures";
    Talk: International Conference on Insulating Films on Semiconductors (INFOS), Udine, Italy; 29.06.2015 - 02.07.2015; in "Book of Abstracts 19th Conference on Insulating Films on Semiconductors", (2015), ISBN: 978-88-9030-695-2, 235 - 236. BibTeX

    1634. L. Filipovic, A. P. Singulani, F. Roger, S. Carniello, S. Selberherr:
    "Intrinsic Stress Analysis of Tungsten-Lined Open TSVs";
    Talk: European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), Toulouse, France; 05.10.2015 - 09.10.2015; in "Abstracts of the 26th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis", (2015), 71. BibTeX

    1633. L. Filipovic, S. Selberherr:
    "Kinetics of Droplet Motion During Spray Pyrolysis";
    Talk: Energy-Materials-Nanotechnology Meeting on Droplets (EMN), Phuket, Thailand; (invited) 08.05.2015 - 11.05.2015; in "Abstracts of the Energy-Materials-Nanotechnology Meeting on Droplets (EMN)", (2015), 127 - 128. BibTeX

    1632. Ch. Kernstock, Z. Stanojevic, O. Baumgartner, M. Karner:
    "Layout-Based TCAD Device Model Generation";
    Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Washington DC, USA; 09.09.2015 - 11.09.2015; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2015), ISBN: 978-1-4673-7859-8, 198 - 201 doi:10.1109/SISPAD.2015.7292293. BibTeX

    1631. P. Ellinghaus, M. Nedjalkov, S. Selberherr:
    "Memory-efficient Particle Annihilation Algorithm for Wigner Monte Carlo Simulations";
    Talk: International Workshop on Computational Electronics (IWCE), West Lafayette, Indiana, USA; 02.09.2015 - 04.09.2015; in "Proceedings of the International Workshop on Computational Electronics (IWCE)", (2015), ISBN: 978-0-692-51523-5, 4 page(s) doi:10.1109/IWCE.2015.7301955. BibTeX

    1630. F. Rudolf, J. Weinbub, K. Rupp, P. Resutik, S. Selberherr:
    "Mesh Healing for TCAD Simulations";
    Talk: International Conference on Large-Scale Scientific Computations (LSSC), Sozopol, Bulgaria; 08.06.2015 - 12.06.2015; in "Abstracts International Conference on Large-Scale Scientific Computations (LSSC)", (2015), 66. BibTeX

    1629. G. Rzepa, M. Waltl, W. Gös, B. Kaczer, T. Grasser:
    "Microscopic Oxide Defects Causing BTI, RTN, and SILC on High-K FinFETs";
    Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Washington DC, USA; 09.09.2015 - 11.09.2015; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2015), ISBN: 978-1-4673-7860-4, 144 - 147 doi:10.1109/SISPAD.2015.7292279. BibTeX

    1628. P. Sharma, M. Jech, S. E. Tyaginov, F. Rudolf, K. Rupp, H. Enichlmair, J.M. Park, T. Grasser:
    "Modeling of Hot-Carrier Degradation in LDMOS Devices Using a Drift-Diffusion Based Approach";
    Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Washington DC, USA; 09.09.2015 - 11.09.2015; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2015), ISBN: 978-1-4673-7858-1, 60 - 63 doi:10.1109/SISPAD.2015.7292258. BibTeX

    1627. J. Franco, B. Kaczer, P. Roussel, E. Bury, H. Mertens, R. Ritzenthaler, T. Grasser, N. Horiguchi, A. Thean, G Groeseneken:
    "NBTI in Si 0.55 Ge 0.45 Cladding p-FinFETs: Porting the Superior Reliability from Planar to 3D Architectures";
    Talk: International Reliability Physics Symposium (IRPS), Monterey, CA, USA; 19.04.2015 - 23.04.2015; in "Proceedings of the International Reliability Physics Symposium (IRPS)", (2015), 2F.4.1 - 2F.4.5 doi:10.1109/IRPS.2015.7112694. BibTeX

    1626. T. Windbacher, A. Makarov, V. Sverdlov, S. Selberherr:
    "Novel Buffered Magnetic Logic Gate Grid";
    Poster: Meeting of the Electrochemical Society (ECS), Chicago, Illinois, USA; 24.05.2015 - 28.05.2015; in "Proceedings of the 227th ECS Meeting (ECS)", (2015), 67, ISSN: 1938-6737, 2 page(s) . BibTeX

    1625. T. Windbacher, A. Makarov, V. Sverdlov, S. Selberherr:
    "Novel Spintronic Devices for Embedded Spin-Based Memories and Non-Volatile Computing";
    Talk: Energy-Materials-Nanotechnology Fall Meeting (EMN), Las Vegas, USA; (invited) 16.11.2015 - 19.11.2015; in "Abstracts of the Energy-Materials-Nanotechnology Fall Meeting (EMN)", (2015), 15 - 16. BibTeX

    1624. K. Rupp, S. Balay, J. Brown, M. Knepley, L. McInnes, B. Smith:
    "On The Evolution Of User Support Topics in Computational Science and Engineering Software";
    Poster: Computational Science & Engineering Software Sustainability and Productivity Challenges (CSESSP Challenges), Rockville, MD, USA; 15.10.2015 - 16.10.2015; in "Computational Science and Engineering Software Sustainability and Productivity Challenges (CSESSP) Workshop", (2015), 1 - 2. BibTeX

    1623. R. Stradiotto, G. Pobegen, C. Ostermaier, T. Grasser:
    "On The Fly Characterization of Charge Trapping Phenomena at GaN/Dielectric and GaN/AlGaN/Dielectric Interfaces Using Impedance Measurements";
    Talk: European Solid-State Device Research Conference (ESSDERC), Graz; 14.09.2015 - 18.09.2015; in "Proceedings of the European Solid-State Device Research Conference (ESSDERC)", (2015), ISBN: 978-1-4673-7860-4, 218 - 225 doi:10.1109/ESSDERC.2015.7324754. BibTeX

    1622. S. E. Tyaginov, M. Jech, P. Sharma, J. Franco, B. Kaczer, T. Grasser:
    "On the Temperature Behavior of Hot-Carrier Degradation";
    Talk: IEEE International Integrated Reliability Workshop (IIRW), South Lake Tahoe, CA, USA; 11.10.2015 - 15.10.2015; in "Proceedings of the IEEE International Integrated Reliability Workshop (IIRW)", (2015), 143 - 146 doi:10.1109/IIRW.2015.7437088. BibTeX

    1621. Y. Wimmer, W. Gös, A.-M. El-Sayed, A. Shluger, T. Grasser:
    "On the Validity of the Harmonic Potential Energy Surface Approximation for Nonradiative Multiphonon Charge Transitions in Oxide Defects";
    Talk: International Workshop on Computational Electronics (IWCE), West Lafayette, Indiana, USA; 02.09.2015 - 04.09.2015; in "Book of Abstracts of the International Workshop on Computational Electronics (IWCE)", (2015), ISBN: 978-0-692-50554-0, 97 - 98. BibTeX

    1620. T. Grasser, M. Waltl, W. Gös, Y. Wimmer, A. El-Sayed, A. Shluger, B. Kaczer:
    "On the Volatility of Oxide Defects: Activation, Deactivation, and Transformation";
    Talk: International Reliability Physics Symposium (IRPS), Monterey, CA, USA; 19.04.2015 - 23.04.2015; in "Proceedings of the International Reliability Physics Symposium (IRPS)", (2015), 5A.3.1 - 5A.3.8 doi:10.1109/IRPS.2015.7112739. BibTeX

    1619. M. Thesberg, M. Pourfath, N. Neophytou, H. Kosina:
    "Optimization of Energy Filtering for Power Factor Improvements Through Fully Quantum Mechanical Transport Simulations";
    Talk: International Conference on Thermoelectrics & European Conference on Thermoelectrics (ICT&ECT), Dresden, Germany; 28.06.2015 - 02.07.2015; in "Proceedings of the 34th Annual International Conference on Thermoelectrics and the 13th European Conference on Thermoelectrics (ICT&ECT)", (2015), 1 page(s) . BibTeX

    1618. M. Thesberg, M. Pourfath, N. Neophytou, H. Kosina:
    "Optimization of Thermoelectric Properties in Cross-Plane Superlattices - A 1D NEGF Study";
    Talk: APS March Meeting, San Antonio, USA; 02.03.2015 - 06.03.2015; in "Bulletin of the American Physical Society (APS March Meeting)", (2015), 60/1, . BibTeX

    1617. B. Kaczer, J. Franco, M. Cho, T. Grasser, P. Roussel, S. E. Tyaginov, M. Bina, Y. Wimmer, L. M. Procel, L. Trojman, F. Crupi, G. Pitner, V. Putcha, P. Weckx, E. Bury, Z. Ji, A. De Keersgieter, T. Chiarella, N. Horiguchi, G Groeseneken, A. Thean:
    "Origins and Implications of Increased Channel Hot Carrier Variability in nFinFETs";
    Talk: International Reliability Physics Symposium (IRPS), Monterey, CA, USA; 19.04.2015 - 23.04.2015; in "Proceedings of the International Reliability Physics Symposium (IRPS)", (2015), 6 page(s) doi:10.1109/IRPS.2015.7112706. BibTeX

    1616. T. Grasser:
    "Oxide Defects in MOS Transistors: Characterization and Modeling";
    Talk: Workshop on Dielectrics in Microelectronics (WODIM), Kinsale, Ireland; (invited) 09.06.2015 - 11.06.2015; . BibTeX

    1615. T. Grasser:
    "Oxide Defects in MOS Transistors: Characterization and Modeling";
    Talk: IEEE EDS Distinguished Lecture, Aranjuez, Spain; (invited) 11.02.2015. BibTeX

    1614. K. Rupp:
    "PETSc on GPUs and MIC: Current Status and Future Directions";
    Talk: Workshop: Celebrating 20 Years of Computational Science with PETSc Tutorial and Conference, Argonne National Laboratory, IL, USA; 15.06.2015 - 18.06.2015; . BibTeX

    1613. J. Weinbub, P. Ellinghaus, S. Selberherr:
    "Parallelization of the Two-Dimensional Wigner Monte Carlo Method";
    Talk: International Conference on Large-Scale Scientific Computations (LSSC), Sozopol, Bulgaria; 08.06.2015 - 12.06.2015; in "Abstracts International Conference on Large-Scale Scientific Computations (LSSC)", (2015), 73. BibTeX

    1612. J. Cervenka, P. Ellinghaus:
    "Preconditioned Deterministic Solver for the Wigner Equation";
    Talk: International Conference on Large-Scale Scientific Computations (LSSC), Sozopol, Bulgaria; 08.06.2015 - 12.06.2015; in "Abstracts International Conference on Large-Scale Scientific Computations (LSSC)", (2015), 31. BibTeX

    1611. P. Sharma, S. E. Tyaginov, Y. Wimmer, F. Rudolf, K. Rupp, M. Bina, H. Enichlmair, J.M. Park, H. Ceric, T. Grasser:
    "Predictive and Efficient Modeling of Hot-Carrier Degradation in nLDMOS Devices";
    Talk: IEEE International Symposium on Power Semiconductor Devices and ICs (ISPSD), Hong Kong, China; 10.05.2015 - 14.05.2015; in "Proceedings of the IEEE International Symposium on Power Semiconductor Devices and ICs (ISPSD)", (2015), ISBN: 978-1-4799-6259-4, 389 - 392 doi:10.1109/ISPSD.2015.7123471. BibTeX

    1610. L. Filipovic, S. Selberherr:
    "Processing of Integrated Gas Sensor Devices";
    Talk: IEEE International Technical Conference of IEEE Region 10 (TENCON), Macau, China; (invited) 01.11.2015 - 04.11.2015; in "Proceedings of the IEEE International Technical Conference of IEEE Region 10 (TENCON)", (2015), ISBN: 978-1-4799-8639-2, 6 page(s) doi:10.1109/TENCON.2015.7372781. BibTeX

    1609. A. Harrer, P. Reininger, R. Gansch, B. Schwarz, D. MacFarland, T. Zederbauer, H. Detz, A. M. Andrews, W. Schrenk, O. Baumgartner, H. Kosina, G. Strasser:
    "Quantum Cascade Detectors for Sensing Applications";
    Talk: ICAVS8, Wien; 12.07.2015 - 17.07.2015; . BibTeX

    1608. T. Grasser:
    "Recent Progress in Understanding the Bias Temperature Instability: from Single Traps to Distributions";
    Talk: IEEE EDS Distinguished Lecture, Hiroshima, Japan; (invited) 26.08.2015. BibTeX

    1607. A. Makarov, T. Windbacher, V. Sverdlov, S. Selberherr:
    "SOT-MRAM based on 1Transistor-1MTJ-Cell Structure";
    IEEE, in "Proceedings of the Non-Volatile Memory Technology Symposium (NVMTS)", (2015), 50 - 53 doi:10.1109/NVMTS.2015.7457479. BibTeX

    1606. A. Makarov, T. Windbacher, V. Sverdlov, S. Selberherr:
    "SOT-MRAM based on 1Transistor-1MTJ-Cell Structure";
    Poster: Non-Volatile Memory Technology Symposium (NVMTS), Beijing, China; 12.10.2015 - 14.10.2015; in "Technical Digest of the Non-Volatile Memory Technology Symposium (NVMTS)", (2015), 105 - 106. BibTeX

    1605. K. Rupp:
    "Scaling Deterministic Solution of the Boltzmann Transport Equation on Heterogeneous Computing Platforms";
    Talk: Scalable Methods for Kinetic Equations, Oak Ridge, TN, USA; (invited) 19.10.2015 - 23.10.2015; in "Scalable Methods for Kinetic Equations - Presentation Titles and Abstracts", (2015), 17. BibTeX

    1604. J. Weinbub, F. Dang, T. Gillberg, S. Selberherr:
    "Shared-Memory Parallelization of the Semi-Ordered Fast Iterative Method";
    Talk: High Performance Computing Symposium (HPC), Alexandria, VA, USA; 12.04.2015 - 15.04.2015; in "Book of Abstracts of the Spring Simulation Multiconference (SpringSim), High Performance Computing Symposium (HPC)", (2015), ISBN: 1-56555-355-1, 74. BibTeX

    1603. J. Weinbub, F. Dang, T. Gillberg, S. Selberherr:
    "Shared-Memory Parallelization of the Semi-Ordered Fast Iterative Method";
    ACM, in "Proceedings of the High Performance Computing Symposium (HPC)", (2015), ISBN: 978-1-5108-0101-1, 217 - 224 doi:10.5555/2872599.2872626. BibTeX

    1602. V. Sverdlov, J. Ghosh, A. Makarov, T. Windbacher, S. Selberherr:
    "Silicon Spintronics";
    NATO Advanced Research Workshop "Functional Nanomaterials and Devices for Electronics, Sensors, Energy Harvesting", Lviv, Ukrain; (invited) 13.04.2015 - 16.04.2015; in "Conference Abstracts, NATO Advanced Research Workshop "Functional Nanomaterials and Devices for Electronics, Sensors, Energy Harvesting"", (2015), ISBN: 978-966-02-7553-9, 44 - 45. BibTeX

    1601. V. Sverdlov, J. Ghosh, A. Makarov, T. Windbacher, S. Selberherr:
    "Silicon Spintronics: Recent Advances and Challenges";
    International Conference and School for Young Scientists Information Technology and Nanotechnology (ITNT), Samara, Russia; (invited) 29.06.2015 - 30.06.2015; in "Proceedings of the 2015 International Conference and School for Young Scientists Information Technology and Nanotechnology (ITNT)", (2015), ISBN: 978-5-93424-739-4, 6 - 7. BibTeX

    1600. V. Sverdlov, J. Ghosh, A. Makarov, T. Windbacher, S. Selberherr:
    "Silicon and CMOS-Compatible Spintronics";
    Talk: International Conference on Applied Physics, Simulation and Computers (APSAC), Vienna, Austria; (invited) 15.03.2015 - 17.03.2015; in "Proceedings of the International Conference on Applied Physics, Simulation and Computers (APSAC 2015)", (2015), 28, ISBN: 978-1-61804-286-6, 17 - 20. BibTeX

    1599. J. Ghosh, D. Osintsev, V. Sverdlov, S. Selberherr:
    "Spin Lifetime Dependence on Spin Injection Orientation in Strained Silicon Films";
    Talk: APS March Meeting, San Antonio, USA; 02.03.2015 - 06.03.2015; in "Bulletin of the American Physical Society (APS March Meeting)", (2015), 60/1, . BibTeX

    1598. J. Ghosh, D. Osintsev, V. Sverdlov, S. Selberherr:
    "Spin Lifetime Dependence on Valley Splitting in Thin Silicon Films";
    Talk: International Workshop on Computational Electronics (IWCE), West Lafayette, Indiana, USA; 02.09.2015 - 04.09.2015; in "Book of Abstracts of the International Workshop on Computational Electronics (IWCE)", (2015), ISBN: 978-0-692-50554-0, 35 - 36. BibTeX

    1597. D. Osintsev, J. Ghosh, V. Sverdlov, J. Weinbub, S. Selberherr:
    "Spin Lifetime in MOSFETs: A High Performance Computing Approach";
    Talk: International Conference on Large-Scale Scientific Computations (LSSC), Sozopol, Bulgaria; 08.06.2015 - 12.06.2015; in "Abstracts International Conference on Large-Scale Scientific Computations (LSSC)", (2015), 60 - 61. BibTeX

    1596. V. Sverdlov, S. Selberherr:
    "Spin-Based CMOS-Compatible Devices";
    Talk: International Conference on Large-Scale Scientific Computations (LSSC), Sozopol, Bulgaria; (invited) 08.06.2015 - 12.06.2015; in "Abstracts International Conference on Large-Scale Scientific Computations (LSSC)", (2015), 69. BibTeX

    1595. V. Sverdlov, S. Selberherr:
    "Spin-Based Devices for Future Microelectronics";
    Talk: International Symposium on Next-Generation Electronics (ISNE), Taipei, Taiwan; (invited) 04.05.2015 - 06.05.2015; in "Proceedings of The 4th International Symposium on Next-Generation Electronics (ISNE 2015)", (2015), 4 page(s) doi:10.1109/ISNE.2015.7132030. BibTeX

    1594. V. Sverdlov, S. Selberherr:
    "Spin-Based Silicon and CMOS-Compatible Devices";
    Talk: Meeting of the Electrochemical Society (ECS), Chicago, Illinois, USA; (invited) 24.05.2015 - 28.05.2015; in "Proceedings of the 227th ECS Meeting (ECS)", (2015), 67, ISSN: 1938-6737, 2 page(s) . BibTeX

    1593. V. Sverdlov, J. Ghosh, A. Makarov, T. Windbacher, S. Selberherr:
    "Spin-Driven Applications of Silicon and CMOS-Compatible Devices";
    Talk: BIT's Annual World Congress of Nano Science & Technology, Xi'an, China; (invited) 24.09.2015 - 26.09.2015; in "Abstracts of the BIT's 5th Annual Congress of Nano Science & Technology-2015", (2015), 175. BibTeX

    1592. V. Sverdlov, S. Selberherr:
    "Spin-dependent Trap-assisted Tunneling Including Spin Relaxation at Room Temperature";
    Poster: International Conference on Spintronics and Quantum Information Technology (SPINTECH), Basel, Switzerland; 10.08.2015 - 13.08.2015; in "Program and Abstract Book of the 8th International School & Conference on Spintronics and Quantum Information Technology", (2015), 114. BibTeX

    1591. V. Sverdlov, S. Selberherr:
    "Spin-dependent Trap-assisted Tunneling in Ferromagnet-Oxide-Semiconductor Structures";
    Talk: International Symposium on Advanced Nanostructures and Nano-Devices (ISANN), Waikaloa, Hawaii, USA; 29.11.2015 - 04.12.2015; in "Abstracts International Symposium on Advanced Nanodevices and Nanotechnology (ISANN)", (2015), . BibTeX

    1590. M. Hosseini, M. Elahi, M. Pourfath, D. Esseni:
    "Strain Engineering of Single-Layer MoS2";
    Talk: European Solid-State Device Research Conference (ESSDERC), Graz, Austria; 14.09.2015 - 18.09.2015; in "Proceedings of the European Solid-State Device Research Conference (ESSDERC)", (2015), ISBN: 978-1-4673-7133-9, 314 - 317 doi:10.1109/ESSDERC.2015.7324777. BibTeX

    1589. V. Sverdlov, D. Osintsev, J. Ghosh, S. Selberherr:
    "Strained Silicon-on-Insulator for Spintronic Applications: Giant Spin Lifetime Enhancement";
    Poster: Advanced Research Workshop on Future Trends in Microelectronics: Journey into the Unknown, Mallorca, Spain; 21.06.2015 - 26.06.2015; in "Abstracts Advanced Research Workshop on Future Trends in Microelectronics: Journey into the Unknown", (2015), 63. BibTeX

    1588. L. Filipovic, S. Selberherr:
    "Stress Considerations in Thin Films for CMOS-Integrated Gas Sensors";
    Talk: Meeting of the Electrochemical Society (ECS), Chicago, Illinois, USA; 24.05.2015 - 28.05.2015; in "Proceedings of the 227th ECS Meeting (ECS)", (2015), 67, ISSN: 1938-6737, 2 page(s) . BibTeX

    1587. L. Filipovic, S. Selberherr:
    "Stress in Three-Dimensionally Integrated Sensor Systems";
    Talk: International Conference on Materials for Advanced Technologies(ICMAT), Singapore; (invited) 28.06.2015 - 03.07.2015; in "Abstracts of the 2015 International Conference on Materials for Advanced Technologies (ICMAT)", (2015), 342. BibTeX

    1586. F. Rudolf, J. Weinbub, K. Rupp, A. Morhammer, S. Selberherr:
    "Symmetry-Aware 3D Volumetric Mesh Generation - An Analysis of Performance and Element Quality";
    Talk: International Meshing Roundtable (IMR), Austin, Texas, USA; 11.10.2015 - 14.10.2015; in "Proceedings of the 24th International Meshing Roundtable (IMR24)", (2015), 5 page(s) . BibTeX

    1585. Yu. Illarionov, M. Waltl, A. Smith, S. Vaziri, M. Ostling, M. Lemme, T. Grasser:
    "Temperature Dependence of Hot Carrier and Positive Bias Stress Degradation in Double-Gated Graphene Field-Effect Transistors";
    Talk: Graphene 2015, Bilbao, Spain; 10.03.2015 - 13.03.2015; in "Abstracts Graphene 2015", (2015), 1 page(s) . BibTeX

    1584. M. Nedjalkov, P. Ellinghaus, S. Selberherr:
    "The Aharanov-Bohm Effect from a Phase Space Perspective";
    Talk: International Conference on Large-Scale Scientific Computations (LSSC), Sozopol, Bulgaria; 08.06.2015 - 12.06.2015; in "Abstracts International Conference on Large-Scale Scientific Computations (LSSC)", (2015), 59 - 60. BibTeX

    1583. B. Kaczer, J. Franco, P. Weckx, P. Roussel, E. Bury, M. Cho, R. Degraeve, D. Linten, G. Groeseneken, H. Kukner, P. Raghavan, F. Catthoor, G. Rzepa, W. Gös, T. Grasser:
    "The Defect-Centric Perspective of Device and Circuit Reliability - From Individual Defects to Circuits";
    Talk: European Solid-State Device Research Conference (ESSDERC), Graz, Austria; (invited) 14.09.2015 - 18.09.2015; in "Proceedings of the European Solid-State Device Research Conference (ESSDERC)", (2015), ISBN: 978-1-4673-7860-4, 218 - 225 doi:10.1109/ESSDERC.2015.7324754. BibTeX

    1582. S. Selberherr:
    "The Evolution and Potential Future of Microelectronics";
    Talk: IEEE EDS Distinguished Lecture, University of Campinas, Campinas, Brasil; (invited) 28.08.2015. BibTeX

    1581. S. Selberherr:
    "The Evolution and Potential Future of Microelectronics";
    Talk: IEEE EDS Distinguished Lecture, City University of Hong Kong, Hong Kong; (invited) 31.03.2015. BibTeX

    1580. P. Ellinghaus, M. Nedjalkov, S. Selberherr:
    "The Influence of Electrostatic Lenses on Wave Packet Dynamics";
    Talk: International Conference on Large-Scale Scientific Computations (LSSC), Sozopol, Bulgaria; 08.06.2015 - 12.06.2015; in "Abstracts International Conference on Large-Scale Scientific Computations (LSSC)", (2015), 39 - 40. BibTeX

    1579. S. Nazemi, E. Soleimani, M. Pourfath, H. Kosina:
    "The Role of Surface Termination Geometry on the Ground-State and Optical Properties of Silicon Nano-Crystals: A Density Functional Theory Study";
    Poster: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Washington DC, USA; 09.09.2015 - 11.09.2015; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2015), ISBN: 978-1-4673-7859-8, 333 - 336. BibTeX

    1578. C. Ostermaier, P. Lagger, G. Prechtl, A. Grill, T. Grasser, D. Pogany:
    "The role of electron transport in the charge trapping at the III-N/dielectric interface in AlGaN/GaN MIS-HEMT structures";
    Talk: Semiconductor Interface Specialists Conference, Arlington, VA, USA; 02.12.2015 - 05.12.2015; . BibTeX

    1577. M. Thesberg, M. Pourfath, N. Neophytou, H. Kosina:
    "Thermoelectric Efficiency Improvements through Grain Shape Optimization: A Non-Equilibrium Green´s Function Study";
    Talk: International Conference on Large-Scale Scientific Computations (LSSC), Sozopol, Bulgaria; 08.06.2015 - 12.06.2015; in "Abstracts International Conference on Large-Scale Scientific Computations (LSSC)", (2015), 70. BibTeX

    1576. M. Thesberg, M. Pourfath, N. Neophytou, H. Kosina:
    "Thermoelectric Power Factor Optimization in Nanocomposites by Energy Filtering Using NEGF";
    Poster: International Workshop on Computational Electronics (IWCE), West Lafayette, Indiana, USA; 02.09.2015 - 04.09.2015; in "Proceedings of the International Workshop on Computational Electronics (IWCE)", (2015), ISBN: 978-0-692-50554-0, 4 page(s) . BibTeX

    1575. J. Ghosh, D. Osintsev, V. Sverdlov, S. Selberherr:
    "Variation of Spin Lifetime with Spin Injection Orientation in Strained Thin Silicon Films";
    Talk: Meeting of the Electrochemical Society (ECS), Chicago, Illinois, USA; 24.05.2015 - 28.05.2015; in "Proceedings of the 227th ECS Meeting (ECS)", (2015), 67, ISSN: 1938-6737, 2 page(s) . BibTeX

    1574. K. Rupp, Ph. Tillet, T. St Clere Smithe, N. Karovic, J. Weinbub, F. Rudolf:
    "ViennaCL - Fast Linear Algebra for Multi and Many-Core Architectures";
    Poster: SIAM Conference on Computational Science and Engineering, Salt Lake City, Utah, USA; 14.03.2015 - 18.03.2015; . BibTeX

    1573. K. Rupp, M. Bina, A. Morhammer, T. Grasser, A. Jüngel:
    "ViennaSHE: A Semiconductor Device Simulator Based on the Spherical Harmonics Expansion Method";
    Talk: Workshop on Applied Mathematics and Simulation for Semiconductors (AMaSIS), Berlin, Germany; (invited) 11.03.2015 - 13.03.2015; . BibTeX

    1572. P. Ellinghaus, J. Weinbub, M. Nedjalkov, S. Selberherr:
    "ViennaWD - Applications";
    Talk: International Wigner Workshop (IW2), Waikoloa, Hawaii, USA; 29.11.2015 in "Booklet of the International Wigner Workshop (IW2)", (2015), 9. BibTeX

    1571. J. Weinbub, P. Ellinghaus, M. Nedjalkov, S. Selberherr:
    "ViennaWD - Status and Outlook";
    Talk: International Wigner Workshop (IW2), Waikoloa, Hawaii, USA; 29.11.2015 in "Booklet of the International Wigner Workshop (IW2)", (2015), 8. BibTeX

    1570. L. Wang, A. Brown, M. Nedjalkov, C. Alexander, B. Cheng, C. Millar, A. Asenov:
    "3D Coupled Electro-Thermal FinFET Simulations Including the Fin Shape Dependence of the Thermal Conductivity";
    Poster: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Yokohama, Japan; 09.09.2014 - 11.09.2014; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2014), ISBN: 978-1-4799-5285-4, 269 - 272 doi:10.1109/SISPAD.2014.6931615. BibTeX

    1569. L. Filipovic, Z. Stanojevic, O. Baumgartner, H. Kosina:
    "3D Modeling of Direct Band-to-Band Tunneling in Nanowire TFETs";
    Talk: Workshop of the Thematic Network on Silicon On Insulator Technology, Devices and Circuits (EUROSOI), Tarragona, Spain; 27.01.2014 - 29.01.2014; in "Conference Proceedings of the Tenth Workshop of the Thematic Network on Silicon on Insulator Technology, Devices and Circuits", (2014), 1 - 2. BibTeX

    1568. H. Ceric, R. Orio, A. P. Singulani, S. Selberherr:
    "3D Technology Interconnect Reliability TCAD";
    Talk: Pan Pacific Microelectronics Symposium, Big Island of Hawaii, USA; 11.02.2014 - 13.02.2014; in "Proceedings of the 2014 Pan Pacific Microelectronics Symposium", (2014), ISBN: 978-0-9888873-3-6, 1 - 8. BibTeX

    1567. J. Weinbub, K. Rupp, F. Rudolf:
    "A Flexible Material Database for Computational Science and Engineering";
    Talk: European Seminar on Computing (ESCO), Pilsen, Czech Republic; 15.06.2014 - 20.06.2014; in "Proc. 4th European Seminar on Computing", (2014), 226. BibTeX

    1566. M. Moradinasab, M. Pourfath, M. Fathipour, H. Kosina:
    "A Numerical Study of Line-Edge Roughness in Graphene Superlattice-Based Photodetectors";
    Talk: International Conference on Numerical Simulation of Optoelectronic Devices (NUSOD), Palma de Mallorca, Spain; 01.09.2014 - 04.09.2014; in "Proceedings of the 14th International Conference on Numerical Simulation of Optoelectronic Devices", (2014), 1 - 2. BibTeX

    1565. S. E. Tyaginov, M. Bina, J. Franco, Y. Wimmer, D. Osintsev, B. Kaczer, T. Grasser:
    "A Predictive Physical Model for Hot-Carrier Degradation in Ultra-Scaled MOSFETs";
    Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Yokohama, Japan; 09.09.2014 - 11.09.2014; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2014), ISBN: 978-1-4799-5285-4, 89 - 92 doi:10.1109/SISPAD.2014.6931570. BibTeX

    1564. Yu. Illarionov, M. Bina, S. E. Tyaginov, K. Rott, H. Reisinger, B. Kaczer, T. Grasser:
    "A Reliable Method for the Extraction of the Lateral Position of Defects in Ultra-scaled MOSFETs";
    Poster: International Reliability Physics Symposium (IRPS), Waikoloa, Hawaii, USA; 01.06.2014 - 05.06.2014; in "Proceedings of the International Reliability Physics Symposium (IRPS)", (2014), ISBN: 978-1-4799-3317-4, XT13.1 - XT13.6. BibTeX

    1563. M. Waltl, W. Gös, K. Rott, H. Reisinger, T. Grasser:
    "A Single-Trap Study of PBTI in SiON nMOS Transistors: Similarities and Differences to the NBTI/pMOS Case";
    Talk: International Reliability Physics Symposium (IRPS), Waikoloa, Hawaii, USA; 01.06.2014 - 05.06.2014; in "Proceedings of the International Reliability Physics Symposium (IRPS)", (2014), ISBN: 978-1-4799-3317-4, XT18.1 - XT18.5. BibTeX

    1562. T. Grasser, K. Rott, H. Reisinger, M. Waltl, J. Franco, B. Kaczer:
    "A unified perspective of RTN and BTI";
    Talk: International Reliability Physics Symposium (IRPS), Waikoloa, Hawaii, USA; 01.06.2014 - 05.06.2014; in "Proceedings of the International Reliability Physics Symposium (IRPS)", (2014), ISBN: 978-1-4799-3317-4, 4A.5.1 - 4A.5.7. BibTeX

    1561. L. Filipovic, S. Selberherr:
    "About Processes and Performance of Integrated Gas Sensor Components";
    Talk: Energy-Materials-Nanotechnology Fall Meeting (EMN), Orlando, USA; (invited) 22.11.2014 - 25.11.2014; in "Abstracts of the Energy-Materials-Nanotechnology Fall Meeting (EMN)", (2014), 96 - 97. BibTeX

    1560. S. Selberherr:
    "About Voids in Copper Interconnects";
    Talk: IEEE EDS Distinguished Lecture, Zhejiang University, Hangzhou, China; (invited) 28.10.2014. BibTeX

    1559. K. Rupp, Ph. Tillet, A. Jungel, T. Grasser:
    "Achieving Portable High Performance for Iterative Solvers on Accelerators";
    Talk: Annual Meeting of the International Association of Applied Mathematics and Mechanics (GAMM), Erlangen, Germany; 10.03.2014 - 14.03.2014; in "Book of Abstracts", (2014), 815. BibTeX

    1558. W. Gös, M. Waltl, Y. Wimmer, G. Rzepa, T. Grasser:
    "Advanced Modeling of Charge Trapping: RTN, 1/f noise, SILC, and BTI";
    Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Yokohama, Japan; (invited) 09.09.2014 - 11.09.2014; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2014), ISBN: 978-1-4799-5285-4, 77 - 80 doi:10.1109/SISPAD.2014.6931567. BibTeX

    1557. Z. Stanojevic, O. Baumgartner, M. Karner, L. Filipovic, C. Kernstock, H. Kosina:
    "Advanced Numerical Methods for Semi-Classical Transport Simulation in Ultra-Narrow Channels";
    Talk: European Conference on Mathematics for Industry (ECMI), Taormina, Italy; (invited) 09.06.2014 - 14.06.2014; in "Abstracts of The 18th European Conference on Mathematics for Industry", (2014), 1. BibTeX

    1556. A. Harrer, P. Reininger, B. Schwarz, R. Gansch, S. Kalchmair, H. Detz, T. Zederbauer, D. MacFarland, A. M. Andrews, W. Schrenk, O. Baumgartner, H. Kosina, G. Strasser:
    "Advances in Quantum Cascade Detector Design";
    Talk: 4th International Nanophotonics Meeting 2014, Igls; 23.10.2014 - 25.10.2014; . BibTeX

    1555. M. Moradinasab, M. Pourfath, H. Kosina:
    "An Instability Study in Terahertz Quantum Cascade Lasers";
    Talk: Int. Conf. on Superlattices, Nanostructures and Nanodevices (ICSNN), Savannah, GA, USA; 03.08.2014 - 08.08.2014; in "Proc.Intl.Conf.on Superlattices, Nanostructures and Nanodevices (ICSNN)", (2014), 10. BibTeX

    1554. K. Rupp, F. Rudolf, J. Weinbub, A. Jungel, T. Grasser:
    "Automatic Finite Volume Discretizations Through Symbolic Computations";
    Talk: European Seminar on Computing (ESCO), Pilsen, Czech Republic; 15.06.2014 - 20.06.2014; in "Proc. 4th European Seminar on Computing", (2014), 192. BibTeX

    1553. L. Filipovic, O. Baumgartner, Z. Stanojevic, H. Kosina:
    "BTB Tunneling in InAs/Si Heterojunctions";
    Poster: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Yokohama, Japan; 09.09.2014 - 11.09.2014; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2014), ISBN: 978-1-4799-5285-4, 245 - 248 doi:10.1109/SISPAD.2014.6931609. BibTeX

    1552. L. Filipovic, O. Baumgartner, Z. Stanojevic, H. Kosina:
    "Band-to-Band Tunneling in 3D Devices";
    Talk: International Workshop on Computational Electronics (IWCE), Paris, France; 03.06.2014 - 06.06.2014; in "Book of Abstracts of the International Workshop on Computational Electronics (IWCE)", (2014), ISBN: 978-2-9547858-0-6, 13 - 14. BibTeX

    1551. T. Grasser:
    "Bias Temperature Instability in CMOS Nanodevices";
    Talk: SINANO Summer School, Bertinoro, Italy; (invited) 25.08.2014 - 29.08.2014; . BibTeX

    1550. Yu. Illarionov, A. Smith, S. Vaziri, M. Ostling, T. Müller, M. Lemme, T. Grasser:
    "Bias-Temperature Instability in Single-Layer Graphene Field-Effect Transistors: A Reliability Challenge";
    Talk: Silicon Nanoelectronics Workshop, Honolulu, Hawaii, USA; 08.06.2014 - 09.06.2014; in "2014 IEEE Silicon Nanoelectronics Workshop", (2014), ISBN: 978-1-4799-5677-7, 29 - 30. BibTeX

    1549. K. Rupp, M. Bina, Y. Wimmer, A. Jungel, T. Grasser:
    "Cell-Centered Finite Volume Schemes for Semiconductor Device Simulation";
    Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Yokohama, Japan; 09.09.2014 - 11.09.2014; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2014), ISBN: 978-1-4799-5285-4, 365 - 368 doi:10.1109/SISPAD.2014.6931639. BibTeX

    1548. T. Grasser:
    "Characterization and Modeling of Charge Trapping and Hot Carrier Degradation";
    Talk: IEEE EDS Distinguished Lecture, Agrate Brianza, Italy; (invited) 11.12.2014. BibTeX

    1547. T. Grasser:
    "Characterization and Modeling of Charge Trapping in CMOS Transistors";
    Talk: International Workshop on Characterization and Modeling of Memory Devices, Agrate Brianza, Italy; (invited) 02.10.2014 - 03.10.2014; . BibTeX

    1546. T. Grasser, G. Rzepa, M. Waltl, W. Gös, K. Rott, G.A. Rott, H. Reisinger, J. Franco, B. Kaczer:
    "Characterization and Modeling of Charge Trapping: From Single Defects to Devices";
    Talk: IEEE International Conference on IC Design and Technology (ICICDT), Austin, TX, USA; (invited) 28.05.2014 - 30.05.2014; in "Proceedings of IEEE International Conference on IC Design and Technology", (2014), ISBN: 978-1-4799-2153-9, 1 - 4 doi:10.1109/ICICDT.2014.6838620. BibTeX

    1545. H. Mahmoudi, T. Windbacher, V. Sverdlov, S. Selberherr:
    "Compact Modeling of Memristive IMP Gates for Reliable Stateful Logic Design";
    Talk: International Conference on Mixed Design of Integrated Circuits and Systems (MIXDES), Lublin, Poland; 19.06.2014 - 21.06.2014; in "Proceedings of the 21st International Conference on Mixed Design of Integrated Circuits and Systems", (2014), 26. BibTeX

    1544. A. Makarov, V. Sverdlov, S. Selberherr:
    "Composite Magnetic Tunnel Junctions for Fast Memory Devices and Efficient Spin-Torque Nano-Oscillators";
    G. Lee (ed); WITPRESS, 1, in "Future Information Engineering", (2014), ISBN: 978-1-84564-855-8, 391 - 398 doi:10.2495/ICIE130451. BibTeX

    1543. Z. Stanojevic, O. Baumgartner, L. Filipovic, H. Kosina:
    "Comprehensive Low-Field Mobility Modeling in Nano-Scaled SOI Channels";
    Talk: Workshop of the Thematic Network on Silicon On Insulator Technology, Devices and Circuits (EUROSOI), Tarragona, Spain; 27.01.2014 - 29.01.2014; in "Conference Proceedings of the Tenth Workshop of the Thematic Network on Silicon on Insulator Technology, Devices and Circuits", (2014), 1 - 2. BibTeX

    1542. E. Baer, P. Evanschitzky, J. Lorenz, F. Roger, R. Minixhofer, L. Filipovic, R. Orio, S. Selberherr:
    "Coupled Simulation to Determine Across Wafer Variations for Electrical and Reliability Parameters of Through-Silicon VIAs";
    Talk: European Workshop on Materials for Advanced Metallization (MAM), Chemnitz, Germany; 02.03.2014 - 05.03.2014; in "Book of Abstracts", (2014), 2 page(s) . BibTeX

    1541. J. Cervenka, P. Ellinghaus, M. Nedjalkov:
    "Deterministic Solution of the Discrete Wigner Equation";
    Talk: International Conference on Numerical Methods and Applications, Borovets, Bulgaria; 20.08.2014 - 24.08.2014; in "Eighth International Conference on Numerical Methods and Applications", (2014), 36. BibTeX

    1540. S. E. Tyaginov, M. Bina, J. Franco, Y. Wimmer, F. Rudolf, H. Enichlmair, J.M. Park, B. Kaczer, H. Ceric, T. Grasser:
    "Dominant Mechanism of Hot-Carrier Degradation in Short- and Long-Channel Transistors";
    Talk: IEEE International Reliability Workshop (IIRW), South Lake Tahoe, CA, USA; 12.10.2014 - 16.10.2014; in "Proceedings of the IEEE International Integrated Reliability Workshop (IIRW)", (2014), ISBN: 978-1-4799-7308-8, 63 - 68 doi:10.1109/IIRW.2014.7049512. BibTeX

    1539. L. Filipovic, R. Orio, S. Selberherr, A. P. Singulani, F. Roger, R. Minixhofer:
    "Effects of Sidewall Scallops on Open Tungsten TSVs";
    Talk: International Reliability Physics Symposium (IRPS), Waikoloa, Hawaii, USA; 01.06.2014 - 05.06.2014; in "Proceedings of the International Reliability Physics Symposium (IRPS)", (2014), ISBN: 978-1-4799-3317-4, 3E.3.1 - 3E.3.6 doi:10.1109/IRPS.2014.6860633. BibTeX

    1538. L. Filipovic, R. Orio, S. Selberherr:
    "Effects of Sidewall Scallops on the Performance and Reliability of Filled Copper and Open Tungsten TSVs";
    Talk: IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), Singapore, Singapore; 30.06.2014 - 04.07.2014; in "Proceedings of the 21st International Symposium on the Physical and Failure Analysis of Integrated Circuits", (2014), ISBN: 978-1-4799-3931-2, 321 - 326 doi:10.1109/IPFA.2014.6898137. BibTeX

    1537. P. Ellinghaus, M. Nedjalkov, S. Selberherr:
    "Efficient Calculation of the Two-Dimensional Wigner Potential";
    Talk: International Workshop on Computational Electronics (IWCE), Paris, France; 03.06.2014 - 06.06.2014; in "Book of Abstracts of the International Workshop on Computational Electronics (IWCE)", (2014), ISBN: 978-2-9547858-0-6, 19 - 20. BibTeX

    1536. H. Ceric, S. Selberherr:
    "Electromigration Induced Failure of Solder Bumps and the Role of IMC";
    Poster: IEEE International Interconnect Technology Conference (IITC), San Jose, USA; 20.05.2014 - 23.05.2014; in "Proceedings of the International Interconnect Technology Conference (IITC)", (2014), ISBN: 978-1-4799-5017-1, 265 - 267 doi:10.1109/IITC.2014.6831891. BibTeX

    1535. W. H. Zisser, H. Ceric, J. Weinbub, S. Selberherr:
    "Electromigration Induced Resistance Increase in Open TSVs";
    Poster: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Yokohama, Japan; 09.09.2014 - 11.09.2014; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2014), ISBN: 978-1-4799-5285-4, 249 - 252 doi:10.1109/SISPAD.2014.6931610. BibTeX

    1534. W. H. Zisser, H. Ceric, J. Weinbub, S. Selberherr:
    "Electromigration Reliability of Open TSV Structures";
    Poster: European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), Berlin, Germany; 29.09.2014 - 02.10.2014; in "Abstracts 25th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF)", (2014), 48. BibTeX

    1533. W. H. Zisser, H. Ceric, J. Weinbub, S. Selberherr:
    "Electromigration Reliability of Open TSV Structures";
    Talk: IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), Singapore, Singapore; 30.06.2014 - 04.07.2014; in "Proceedings of the 21st International Symposium on the Physical and Failure Analysis of Integrated Circuits", (2014), ISBN: 978-1-4799-3931-2, 317 - 320 doi:10.1109/IPFA.2014.6898179. BibTeX

    1532. H. Ceric, S. Selberherr:
    "Electromigration Reliability of Solder Bumps";
    Talk: IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), Singapore, Singapore; 30.06.2014 - 04.07.2014; in "Proceedings of the 21st International Symposium on the Physical and Failure Analysis of Integrated Circuits", (2014), ISBN: 978-1-4799-3931-2, 336 - 339 doi:10.1109/IPFA.2014.6898145. BibTeX

    1531. H. Ceric, W. H. Zisser, M. Rovitto, S. Selberherr:
    "Electromigration in Solder Bumps: A Mean-Time-to-Failure TCAD Study";
    Poster: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Yokohama, Japan; 09.09.2014 - 11.09.2014; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2014), ISBN: 978-1-4799-5285-4, 221 - 224 doi:10.1109/SISPAD.2014.6931603. BibTeX

    1530. V. Sverdlov, D. Osintsev, S. Selberherr:
    "Electron Momentum and Spin Relaxation in Silicon Films: A Rigorous k p-based Approach";
    Talk: European Conference on Mathematics for Industry (ECMI), Taormina, Italy; (invited) 09.06.2014 - 14.06.2014; in "Abstracts of The 18th European Conference on Mathematics for Industry", (2014), 454 - 456. BibTeX

    1529. T. Grasser, K. Rott, H. Reisinger, M. Waltl, W. Gös:
    "Evidence for Defect Pairs in SiON pMOSFETs";
    Talk: IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), Singapore, Singapore; 30.06.2014 - 04.07.2014; in "Proceedings of the 21st International Symposium on the Physical and Failure Analysis of Integrated Circuits", (2014), ISBN: 978-1-4799-3929-9, 228 - 263. BibTeX

    1528. Z. Stanojevic, L. Filipovic, O. Baumgartner, H. Kosina:
    "Fast Methods for Full-Band Mobility Calculation";
    Talk: International Workshop on Computational Electronics (IWCE), Paris, France; 03.06.2014 - 06.06.2014; in "Book of Abstracts of the International Workshop on Computational Electronics (IWCE)", (2014), ISBN: 978-2-9547858-0-6, 51 - 52. BibTeX

    1527. N. Neophytou, H. Kosina:
    "Field Effect Density Modulation in Nanowires for Large Thermoelectric Power Factors: A Self-Consistent Atomistic Simulation Approach";
    Talk: International Conference on Thermoelectrics, Nashville, USA; 06.07.2014 - 10.07.2014; in "Book of Abstracts", (2014), 1 page(s) . BibTeX

    1526. T. Windbacher, D. Osintsev, A. Makarov, H. Mahmoudi, V. Sverdlov, S. Selberherr:
    "Frequency Dependence Study of a Bias Field-Free Nano-Scale Oscillator";
    Poster: International Workshop on Computational Electronics (IWCE), Paris, France; 03.06.2014 - 06.06.2014; in "Book of Abstracts of the International Workshop on Computational Electronics (IWCE)", (2014), ISBN: 978-2-9547858-0-6, 193 - 194. BibTeX

    1525. V. Sverdlov, D. Osintsev, S. Selberherr:
    "From Strained SOI MOSFET to Spin MOSFET with Strain: a Modeling Approach";
    Talk: Workshop of the Thematic Network on Silicon On Insulator Technology, Devices and Circuits (EUROSOI), Tarragona, Spain; (invited) 27.01.2014 - 29.01.2014; . BibTeX

    1524. Z. Stanojevic, O. Baumgartner, M. Karner, L. Filipovic, C. Kernstock, H. Kosina:
    "Full-Band Modeling of Mobility in p-Type FinFETs";
    Poster: Silicon Nanoelectronics Workshop, Honolulu, Hawaii, USA; 08.06.2014 - 09.06.2014; in "2014 IEEE Silicon Nanoelectronics Workshop", (2014), ISBN: 978-1-4799-5676-0, 83 - 84. BibTeX

    1523. N. Neophytou, H. Karamitaheri, H. Kosina:
    "Full-Band Simulations of Thermoelectric Properties of Si Nanowires and Thin Layers";
    Talk: European Conference on Mathematics for Industry (ECMI), Taormina, Italy; (invited) 09.06.2014 - 14.06.2014; in "Abstracts of The 18th European Conference on Mathematics for Industry", (2014), 1. BibTeX

    1522. Z. Stanojevic, L. Filipovic, O. Baumgartner, M. Karner, C. Kernstock, H. Kosina:
    "Full-Band Transport in Ultra-Narrow p-Type Si Channels: Field, Orientation, Strain";
    Poster: International Conference on Ultimate Integration of Silicon (ULIS), Stockholm, Sweden; 07.04.2014 - 09.04.2014; in "Proc.Intl.Conf.on Ultimate Integration on Silicon (ULIS)", (2014), 4 page(s) . BibTeX

    1521. H. Mahmoudi, T. Windbacher, V. Sverdlov, S. Selberherr:
    "High Performance MRAM-Based Stateful Logic";
    Poster: International Conference on Ultimate Integration of Silicon (ULIS), Stockholm, Sweden; 07.04.2014 - 09.04.2014; in "Proc.Intl.Conf.on Ultimate Integration on Silicon (ULIS)", (2014), ISBN: 978-1-4799-3718-9, 117 - 120 doi:10.1109/ULIS.2014.6813912. BibTeX

    1520. P. Ellinghaus, M. Nedjalkov, S. Selberherr:
    "Implications of the Coherence Length on the Discrete Wigner Potential";
    Poster: International Workshop on Computational Electronics (IWCE), Paris, France; 03.06.2014 - 06.06.2014; in "Book of Abstracts of the International Workshop on Computational Electronics (IWCE)", (2014), ISBN: 978-2-9547858-0-6, 155 - 156. BibTeX

    1519. M. Moradinasab, M. Pourfath, H. Kosina:
    "Improved Active Region Designs for Mode Locking in Quantum Cascade Lasers";
    Poster: International Quantum Cascade Lasers School & Workshop, Policoro (Matera), Italy; 07.09.2014 - 12.09.2014; in "International Quantum Cascade Lasers School & Workshop 2014", (2014), 182 - 183. BibTeX

    1518. D. Osintsev, V. Sverdlov, S. Selberherr:
    "Increasing Mobility and Spin Lifetime with Shear Strain in Thin Silicon Films";
    Talk: Workshop of the Thematic Network on Silicon On Insulator Technology, Devices and Circuits (EUROSOI), Tarragona, Spain; 27.01.2014 - 29.01.2014; in "Conference Proceedings of the Tenth Workshop of the Thematic Network on Silicon on Insulator Technology, Devices and Circuits", (2014), 1 - 2. BibTeX

    1517. D. Osintsev, V. Sverdlov, T. Windbacher, S. Selberherr:
    "Increasing Mobility and Spin Lifetime with Shear Strain in Thin Silicon Films";
    Poster: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Yokohama, Japan; 09.09.2014 - 11.09.2014; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2014), ISBN: 978-1-4799-5285-4, 193 - 196 doi:10.1109/SISPAD.2014.6931596. BibTeX

    1516. T. Windbacher, H. Mahmoudi, V. Sverdlov, S. Selberherr:
    "Influence of Device Geometry on the Non-Volatile Magnetic Flip Flop Characteristics";
    Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Yokohama, Japan; 09.09.2014 - 11.09.2014; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2014), ISBN: 978-1-4799-5285-4, 297 - 300 doi:10.1109/SISPAD.2014.6931622. BibTeX

    1515. T. Windbacher, H. Mahmoudi, V. Sverdlov, S. Selberherr:
    "Influence of Magnetization Variations in the Free Layer on a Non-Volatile Magnetic Flip Flop";
    Talk: International Conference on Ultimate Integration of Silicon (ULIS), Stockholm, Sweden; 07.04.2014 - 09.04.2014; in "Proc.Intl.Conf.on Ultimate Integration on Silicon (ULIS)", (2014), ISBN: 978-1-4799-3718-9, 9 - 12 doi:10.1109/ULIS.2014.6813893. BibTeX

    1514. O. Baumgartner, Z. Stanojevic, L. Filipovic, A. Grill, T. Grasser, H. Kosina, M. Karner:
    "Investigation of Quantum Transport in Nanoscaled GaN High Electron Mobility Transistors";
    Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Yokohama, Japan; 09.09.2014 - 11.09.2014; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2014), ISBN: 978-1-4799-5285-4, 117 - 120 doi:10.1109/SISPAD.2014.6931577. BibTeX

    1513. V. Sverdlov, H. Mahmoudi, A. Makarov, T. Windbacher, S. Selberherr:
    "Magnetic Tunnel Junctions for Future Memory and Logic-in-Memory Applications";
    Talk: International Conference on Mixed Design of Integrated Circuits and Systems (MIXDES), Lublin, Poland; (invited) 19.06.2014 - 21.06.2014; in "Proceedings of the 21st International Conference on Mixed Design of Integrated Circuits and Systems", (2014), 17. BibTeX

    1512. M. Schrems, J. Siegert, P. Dorfi, J. Kraft, E. Stueckler, F. Schrank, S. Selberherr:
    "Manufacturing of 3D Integrated Sensors and Circuits";
    Talk: European Solid-State Device Research Conference (ESSDERC), Venice, Italy; (invited) 22.09.2014 - 26.09.2014; in "Proceedings of the European Solid-State Device Research Conference (ESSDERC)", (2014), ISBN: 978-1-4799-4377-7, 162 - 165 doi:10.1109/ESSDERC.2014.6948785. BibTeX

    1511. B. Kaczer, C. Chen, P. Weckx, Ph. J. Roussel, M. Toledano-Luque, M. Cho, J. Watt, K. Chanda, G. Groeseneken, T. Grasser:
    "Maximizing reliable performance of advanced CMOS circuits-A case study";
    Talk: International Reliability Physics Symposium (IRPS), Waikoloa, Hawaii, USA; 01.06.2014 - 05.06.2014; in "Proceedings of the International Reliability Physics Symposium (IRPS)", (2014), ISBN: 978-1-4799-3317-4, 2D.4.1 - 2D.4.6. BibTeX

    1510. F. Rudolf, Y. Wimmer, J. Weinbub, K. Rupp, S. Selberherr:
    "Mesh Generation Using Dynamic Sizing Functions";
    Talk: European Seminar on Computing (ESCO), Pilsen, Czech Republic; 15.06.2014 - 20.06.2014; in "Proc. 4th European Seminar on Computing", (2014), 191. BibTeX

    1509. A. Makarov, T. Windbacher, V. Sverdlov, S. Selberherr:
    "Micromagnetic Modeling of a Bias-Field-Free Spin-Torque Oscillator Based on Two MgO-MTJs with a Shared Free Layer";
    Talk: 10th European Conference on Magnetic Sensors and Actuators (EMSA 2014), Vienna, Austria; 06.07.2014 - 09.07.2014; in "Book of Abstracts", (2014), ISBN: 978-3-85465-021-8, 166. BibTeX

    1508. G.A. Rott, K. Rott, H. Reisinger, W. Gustin, T. Grasser:
    "Mixture of Negative Bias Temperature Instability and Hot-Carrier Driven Threshold Voltage Degradation of 130 nm Technology p-Channel Transistors";
    Talk: European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), Berlin, Germany; 29.09.2014 - 02.10.2014; in "Abstracts 25th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF)", (2014), 40. BibTeX

    1507. D. Osintsev, V. Sverdlov, S. Selberherr:
    "Mobility and Spin Lifetime Enhancement in Thin Silicon Films by Shear Strain";
    Talk: APS March Meeting, Denver, USA; 03.03.2014 - 07.03.2014; in "Bulletin of the American Physical Society (APS March Meeting)", (2014), 59/1, 1 page(s) . BibTeX

    1506. V. Sverdlov, J. Ghosh, D. Osintsev, S. Selberherr:
    "Modeling Silicon Spintronics";
    Talk: International Conference on Mathematical Models and Methods in Applied Sciences (MMMAS), Saint-Petersburg, Russia; (invited) 23.09.2014 - 25.09.2014; in "Abstracts 2014", (2014), 78. BibTeX

    1505. A. Makarov, D. Osintsev, V. Sverdlov, S. Selberherr:
    "Modeling Spin-Based Electronic Devices";
    Talk: Nano and Giga Challenges in Microelectronics (NGCM), Phoenix, USA; (invited) 10.03.2014 - 14.03.2014; in "Book of Abstracts", (2014), 1 page(s) . BibTeX

    1504. S. Selberherr:
    "Modeling Spin-Based Electronic Devices";
    Talk: IEEE EDS Distinguished Lecture, Zhejiang University, Hangzhou, China; (invited) 28.10.2014. BibTeX

    1503. S. Selberherr:
    "Modeling Spin-Based Electronic Devices";
    Talk: IEEE EDS Mini-Colloquium Distinguished Lecture, Serbian Academy of Sciences and Arts, Belgrade, Serbia; (invited) 12.05.2014. BibTeX

    1502. V. Sverdlov, J. Ghosh, H. Mahmoudi, A. Makarov, D. Osintsev, T. Windbacher, S. Selberherr:
    "Modeling Spin-Based Electronic Devices";
    International Conference on Microelectronics (MIEL), Belgrade, Serbia; (invited) 12.05.2014 - 14.05.2014; in "Proceedings of the International Conference on Microelectronics (MIEL)", (2014), ISBN: 978-1-4799-5295-3, 27 - 34 doi:10.1109/MIEL.2014.6842081. BibTeX

    1501. V. Sverdlov, J. Ghosh, H. Mahmoudi, A. Makarov, D. Osintsev, T. Windbacher, S. Selberherr:
    "Modeling of Spin-Based Silicon Technology";
    Talk: International Conference on Ultimate Integration of Silicon (ULIS), Stockholm, Sweden; (invited) 07.04.2014 - 09.04.2014; in "Proc.Intl.Conf.on Ultimate Integration on Silicon (ULIS)", (2014), ISBN: 978-1-4799-3718-9, 1 - 4 doi:10.1109/ULIS.2014.6813891. BibTeX

    1500. K. Giering, C. Sohrmann, G. Rzepa, L. Heiß, T. Grasser, R. Jancke:
    "NBTI Modeling in Analog Circuits and its Application to Long-Term Aging Simulations";
    Talk: IEEE International Reliability Workshop (IIRW), South Lake Tahoe, CA, USA; 12.10.2014 - 16.10.2014; in "Proceedings of the IEEE International Integrated Reliability Workshop (IIRW)", (2014), ISBN: 978-1-4799-7308-8, 29 - 34 doi:10.1109/IIRW.2014.7049501. BibTeX

    1499. I. Dimov, M. Nedjalkov, J. M. Sellier, S. Selberherr:
    "Neumann Series Analysis of the Wigner Equation Solution";
    Talk: European Conference on Mathematics for Industry (ECMI), Taormina, Italy; (invited) 09.06.2014 - 14.06.2014; in "Abstracts of The 18th European Conference on Mathematics for Industry", (2014), 459. BibTeX

    1498. A. Makarov, T. Windbacher, V. Sverdlov, S. Selberherr:
    "New Design of Spin-Torque Nano-Oscillators";
    Talk: Workshop on Innovative Nanoscale Devices and Systems (WINDS), Kona; (invited) 30.11.2014 - 05.12.2014; in "Abstracts of the Workshop on Innovative Nanoscale Devices and Systems (WINDS)", (2014), ISBN: 978-3-901578-28-1, 63. BibTeX

    1497. S. E. Tyaginov, M. Bina, J. Franco, B. Kaczer, T. Grasser:
    "On the Importance of Electron-electron Scattering for Hot-carrier Degradation";
    Talk: International Conference on Solid State Devices and Materials (SSDM), Tsukuba, Japan; 08.09.2014 - 11.09.2014; in "Extended Abstracts of the 2014 International Conference on Solid State Devices and Materials (SSDM)", (2014), 858 - 859. BibTeX

    1496. R. Orio, S. Gousseau, S. Moreau, H. Ceric, S. Selberherr, A. Farcy, F. Bay, K. Inal, P. Montmitonnet:
    "On the Material Depletion Rate Due to Electromigration in a Copper TSV Structure";
    Poster: IEEE International Reliability Workshop (IIRW), Fallen Leaf Lake, CA, USA; 12.10.2014 - 16.10.2014; in "Proceedings of the IEEE International Integrated Reliability Workshop (IIRW)", (2014), ISBN: 978-1-4799-7274-6, 111 - 114 doi:10.1109/IIRW.2014.7049523. BibTeX

    1495. T. Grasser, W. Gös, Y. Wimmer, F. Schanovsky, G. Rzepa, M. Waltl, K. Rott, H. Reisinger, V. Afanas´Ev, A. Stesmans, A. El-Sayed, A. Shluger:
    "On the Microscopic Structure of Hole Traps in pMOSFETs";
    Talk: IEEE International Electron Devices Meeting (IEDM), San Francisco, CA, USA; 15.12.2014 - 17.12.2014; in "Proceedings of the IEEE International Electron Devices Meeting (IEDM)", (2014), ISBN: 978-1-4799-8001-7, 530 - 533 doi:10.1109/IEDM.2014.7047093. BibTeX

    1494. Z. Stanojevic, O. Baumgartner, M. Karner, L. Filipovic, C. Kernstock, H. Kosina:
    "On the Validity of Momentum Relaxation Time in Low-Dimensional Carrier Gases";
    Poster: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Yokohama, Japan; 09.09.2014 - 11.09.2014; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2014), ISBN: 978-1-4799-5285-4, 181 - 184 doi:10.1109/SISPAD.2014.6931593. BibTeX

    1493. P. Ellinghaus, M. Nedjalkov, S. Selberherr:
    "Optimized Particle Regeneration Scheme for the Wigner Monte Carlo Method";
    Talk: International Conference on Numerical Methods and Applications, Borovets, Bulgaria; 20.08.2014 - 24.08.2014; in "Eighth International Conference on Numerical Methods and Applications", (2014), 19. BibTeX

    1492. K. Rupp, Ph. Tillet, F. Rudolf, J. Weinbub, T. Grasser, A. Jüngel:
    "Performance Portability Study of Linear Algebra Kernels in OpenCL";
    Talk: International Workshop on OpenCL (IWOCL), Bristol, UK; 12.05.2014 - 13.05.2014; in "Proceedings of the International Workshop on OpenCL 2013 & 2014 (IWOCL)", (2014), ISBN: 978-1-4503-3007-7, 11 page(s) doi:10.1145/2664666.2664674. BibTeX

    1491. S. E. Tyaginov, M. Bina, J. Franco, D. Osintsev, O. Triebl, B. Kaczer, T. Grasser:
    "Physical Modeling of Hot-Carrier Degradation for Short- and Long-channel MOSFETs";
    Poster: International Reliability Physics Symposium (IRPS), Waikoloa, Hawaii, USA; 01.06.2014 - 05.06.2014; in "Proceedings of the International Reliability Physics Symposium (IRPS)", (2014), ISBN: 978-1-4799-3317-4, XT16.1 - XT16.8. BibTeX

    1490. Y. Wimmer, S. E. Tyaginov, F. Rudolf, K. Rupp, M. Bina, H. Enichlmair, J.M. Park, R. Minixhofer, H. Ceric, T. Grasser:
    "Physical Modeling of Hot-Carrier Degradation in nLDMOS Transistors";
    Talk: IEEE International Reliability Workshop (IIRW), South Lake Tahoe, CA, USA; 12.10.2014 - 16.10.2014; in "Proceedings of the IEEE International Integrated Reliability Workshop (IIRW)", (2014), ISBN: 978-1-4799-7308-8, 58 - 62 doi:10.1109/IIRW.2014.7049511. BibTeX

    1489. G. Rzepa, W. Gös, G.A. Rott, K. Rott, M. Karner, C. Kernstock, B. Kaczer, H. Reisinger, T. Grasser:
    "Physical Modeling of NBTI: From Individual Defects to Devices";
    Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Yokohama, Japan; 09.09.2014 - 11.09.2014; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2014), ISBN: 978-1-4799-5285-4, 81 - 84 doi:10.1109/SISPAD.2014.6931568. BibTeX

    1488. L. Filipovic, R. Orio, S. Selberherr:
    "Process and Performance of Copper TSVs";
    Talk: Workshop of the Thematic Network on Silicon On Insulator Technology, Devices and Circuits (EUROSOI), Tarragona, Spain; 27.01.2014 - 29.01.2014; in "Conference Proceedings of the Tenth Workshop of the Thematic Network on Silicon on Insulator Technology, Devices and Circuits", (2014), 1 - 2. BibTeX

    1487. L. Filipovic, R. Orio, S. Selberherr:
    "Process and Reliability of SF6/O2 Plasma Etched Copper TSVs";
    Talk: International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), Ghent, Belgium; 07.04.2014 - 09.04.2014; in "Proceedings of the IEEE 15th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE)", (2014), ISBN: 978-1-4799-4791-1, 4 page(s) doi:10.1109/EuroSimE.2014.6813768. BibTeX

    1486. T. Windbacher, A. Makarov, V. Sverdlov, S. Selberherr:
    "Pushing a Non-Volatile Magnetic Device Structure Towards a Universal CMOS Logic Replacement";
    Talk: Workshop on Innovative Nanoscale Devices and Systems (WINDS), Kona; (invited) 30.11.2014 - 05.12.2014; in "Abstracts of the Workshop on Innovative Nanoscale Devices and Systems (WINDS)", (2014), ISBN: 978-3-901578-28-1, 62. BibTeX

    1485. H. Ceric, W. H. Zisser, S. Selberherr:
    "Quantum Mechanical Calculations of Electromigration Characteristics";
    Talk: International Workshop on Stress-Induced Phenomena in Microelectronics, Austin, TX, USA; (invited) 15.10.2014 - 17.10.2014; in "Abstracts of 13th International Workshop on Stress-Induced Phenomena in Microelectronics", (2014), 21. BibTeX

    1484. J. Franco, B. Kaczer, N. Waldron, Ph. J. Roussel, A. Alian, M. Pourghaderi, Z. Ji, T. Grasser, T. Kauerauf, S. Sioncke, N. Collaert, A. Thean, G. Groeseneken:
    "RTN and PBTI-induced Time-Dependent Variability of Replacement Metal-Gate High-k InGaAs FinFETs";
    Talk: IEEE International Electron Devices Meeting (IEDM), San Francisco, CA, USA; 15.12.2014 - 17.12.2014; in "Proceedings of the IEEE International Electron Devices Meeting (IEDM)", (2014), ISBN: 978-1-4799-8001-7, 506 - 509 doi:10.1109/IEDM.2014.7047087. BibTeX

    1483. M. Vexler, Yu. Illarionov, S. E. Tyaginov, N. S. Sokolov, V. V. Fedorov, T. Grasser:
    "Simulation of the Electrical Characteristics of the Devices with Thin Calcium Fluoride Films on Silicon-(111) Using MINIMOS-NT";
    Talk: DIELECTRICS-2014, St-Petersburg, Russia; 02.06.2014 - 06.06.2014; in "Materials of XIII International conference DIELECTRICS", (2014), 159 - 162. BibTeX

    1482. Y. Wang, M. Baboulin, K. Rupp, O. Le Maitre:
    "Solving 3D incompressible Navier-Stokes equations on hybrid CPU/GPU systems";
    Talk: High Performance Computing Symposium (HPC), Tampa, Florida, USA; 13.04.2014 - 16.04.2014; in "HPC '14 Proceedings of the High Performance Computing Symposium", (2014), 1 - 8. BibTeX

    1481. V. Sverdlov, D. Osintsev, S. Selberherr:
    "Spin Behaviour in Strained Silicon Films";
    Talk: European Material Research Society (E-MRS) Fall Meeting, Warsaw, Poland; (invited) 15.09.2014 - 18.09.2014; in "Abstracts of E-MRS Fall Meeting", (2014), 1 page(s) . BibTeX

    1480. J. Ghosh, V. Sverdlov, S. Selberherr:
    "Spin Diffusion in Silicon from a Ferromagnetic Contact";
    Talk: 10th European Conference on Magnetic Sensors and Actuators (EMSA 2014), Vienna, Austria; 06.07.2014 - 09.07.2014; in "Book of Abstracts", (2014), ISBN: 978-3-85465-021-8, 165. BibTeX

    1479. J. Ghosh, V. Sverdlov, S. Selberherr:
    "Spin Injection in Silicon: The Role of Screening Effects";
    Talk: International Workshop on Computational Electronics (IWCE), Paris, France; 03.06.2014 - 06.06.2014; in "Book of Abstracts of the International Workshop on Computational Electronics (IWCE)", (2014), ISBN: 978-2-9547858-0-6, 63 - 64. BibTeX

    1478. S. Touski, Z. Chaghazardi, M. Pourfath, M. Moradinasab, R. Faez, H. Kosina:
    "Spin Transport in Graphene Nanoribbons: The Role of Surface-Corrugation";
    Talk: International Workshop on Computational Electronics (IWCE), Paris, France; 03.06.2014 - 06.06.2014; in "Book of Abstracts of the International Workshop on Computational Electronics (IWCE)", (2014), ISBN: 978-2-9547858-0-6, 101 - 102. BibTeX

    1477. L. Filipovic, S. Selberherr:
    "Spray Pyrolysis Deposition for Gas Sensor Integration in the Backend of Standard CMOS Processes";
    Talk: International Conference on Solid State and Integrated Circuit Technology (ICSICT), Guilin, China; (invited) 28.10.2014 - 31.10.2014; in "Proc.Intl.Conf.on Solid-State and Integrated Circuit Technology (ICSICT)", (2014), ISBN: 978-1-4799-3282-5, 1692 - 1695 doi:10.1109/ICSICT.2014.7021507. BibTeX

    1476. S. Papaleo, W. H. Zisser, A. P. Singulani, H. Ceric, S. Selberherr:
    "Stress Analysis in Open TSVs after Nanoindentation";
    Talk: GDRI CNRS Mecano General Meeting on the Mechanics of Nano-objects, Thun, Switzerland; 04.09.2014 - 05.09.2014; in "Abstracts", (2014), 39 - 40. BibTeX

    1475. L. Filipovic, S. Selberherr:
    "Stress Considerations for System-on-Chip Gas Sensor Integration in CMOS Technology";
    Talk: International Workshop on Stress-Induced Phenomena in Microelectronics, Austin, TX, USA; 15.10.2014 - 17.10.2014; in "Abstracts of 13th International Workshop on Stress-Induced Phenomena in Microelectronics", (2014), 46. BibTeX

    1474. W. H. Zisser, H. Ceric, S. Selberherr:
    "Stress Development and Void Evolution in Open TSVs";
    Talk: GDRI CNRS Mecano General Meeting on the Mechanics of Nano-objects, Thun, Switzerland; 04.09.2014 - 05.09.2014; in "Abstracts", (2014), 38 - 39. BibTeX

    1473. S. Papaleo, W. H. Zisser, A. P. Singulani, H. Ceric, S. Selberherr:
    "Stress Evolution During the Nanoindentation in Open TSVs";
    Poster: International Workshop on Stress-Induced Phenomena in Microelectronics, Austin, TX, USA; 15.10.2014 - 17.10.2014; in "Abstracts of 13th International Workshop on Stress-Induced Phenomena in Microelectronics", (2014), 52. BibTeX

    1472. V. Sverdlov, A. Makarov, S. Selberherr:
    "Structural Optimization of MTJs for STT-MRAM and Oscillator Applications";
    Talk: Symposium on CMOS Emerging Technologies, Grenoble, France; 06.07.2014 - 08.07.2014; in "Abstracts: 2014 CMOS Emerging Technologies Research Symposium", (2014), ISBN: 978-1-927500-45-3, 19. BibTeX

    1471. E. Bury, R. Degraeve, M. Cho, B. Kaczer, W. Gös, T. Grasser, N. Horiguchi, G. Groeseneken:
    "Study of (correlated) trap sites in SILC, BTI and RTN in SiON and HKMG Devices";
    Talk: IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), Singapore, Singapore; 30.06.2014 - 04.07.2014; in "Proceedings of the 21st International Symposium on the Physical and Failure Analysis of Integrated Circuits", (2014), ISBN: 978-1-4799-3929-9, 254 - 257. BibTeX

    1470. F. Rudolf, J. Weinbub, K. Rupp, A. Morhammer, S. Selberherr:
    "Template-Based Mesh Generation for Semiconductor Devices";
    Poster: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Yokohama, Japan; 09.09.2014 - 11.09.2014; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2014), ISBN: 978-1-4799-5285-4, 217 - 220 doi:10.1109/SISPAD.2014.6931602. BibTeX

    1469. L. Filipovic, S. Selberherr:
    "The Effects of Etching and Deposition on the Performance and Stress Evolution of Open Through Silicon Vias";
    Talk: European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), Berlin, Germany; 29.09.2014 - 02.10.2014; in "Abstracts 25th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF)", (2014), 36. BibTeX

    1468. J. M. Sellier, M. Nedjalkov, I. Dimov, S. Selberherr:
    "The Multi-Dimensional Transient Challenge: The Wigner Particle Approach";
    Talk: International Workshop on Computational Electronics (IWCE), Paris, France; (invited) 03.06.2014 - 06.06.2014; in "Book of Abstracts of the International Workshop on Computational Electronics (IWCE)", (2014), ISBN: 978-2-9547858-0-6, 119 - 120. BibTeX

    1467. P. Ellinghaus, M. Nedjalkov, S. Selberherr:
    "The Wigner Monte Carlo Method for Accurate Semiconductor Device Simulation";
    Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Yokohama, Japan; 09.09.2014 - 11.09.2014; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2014), ISBN: 978-1-4799-5285-4, 113 - 116 doi:10.1109/SISPAD.2014.6931576. BibTeX

    1466. N. Neophytou, H. Kosina:
    "Thermoelectric Properties of Gated Silicon Nanowires";
    Talk: APS March Meeting, Denver, USA; 03.03.2014 - 07.03.2014; in "Bulletin of the American Physical Society (APS March Meeting)", (2014), 1 page(s) . BibTeX

    1465. N. Neophytou, H. Kosina:
    "Thermoelectric properties of gated Si nanowires";
    Poster: International Workshop on Computational Electronics (IWCE), Paris, France; 03.06.2014 - 06.06.2014; in "Book of Abstracts of the International Workshop on Computational Electronics (IWCE)", (2014), ISBN: 978-2-9547858-0-6, 197 - 198. BibTeX

    1464. L. Filipovic, F. Rudolf, E. Baer, P. Evanschitzky, J. Lorenz, F. Roger, A. P. Singulani, R. Minixhofer, S. Selberherr:
    "Three-Dimensional Simulation for the Reliability and Electrical Performance of Through-Silicon Vias";
    Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Yokohama, Japan; 09.09.2014 - 11.09.2014; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2014), ISBN: 978-1-4799-5285-4, 341 - 344 doi:10.1109/SISPAD.2014.6931633. BibTeX

    1463. D. Osintsev, V. Sverdlov, S. Selberherr:
    "Valley Degeneracy and Spin Lifetime Enhancement in Stressed Silicon Films";
    Poster: 8th International Conference on Physics and Applications of Spin Phenomena in Solids (PASPS VIII), Washington, D.C., USA; 28.07.2014 - 31.07.2014; in "Book of Abstracts", (2014), 1. BibTeX

    1462. D. Osintsev, V. Sverdlov, N. Neophytou, S. Selberherr:
    "Valley Splitting and Spin Lifetime Enhancement in Strained Silicon Heterostructures";
    Poster: International Winterschool on New Developments in Solid State Physics, Mauterndorf, Austria; 23.02.2014 - 28.02.2014; in "Proceedings of International Winterschool on New Developments in Solid State Physics", (2014), 88 - 89. BibTeX

    1461. D. Osintsev, V. Sverdlov, N. Neophytou, S. Selberherr:
    "Valley Splitting and Spin Lifetime Enhancement in Ultra-Scaled MOSFETs";
    Talk: International Workshop on Computational Electronics (IWCE), Paris, France; 03.06.2014 - 06.06.2014; in "Book of Abstracts of the International Workshop on Computational Electronics (IWCE)", (2014), ISBN: 978-2-9547858-0-6, 59 - 60. BibTeX

    1460. W. H. Zisser, H. Ceric, S. Selberherr:
    "Void Evolution in Open TSVs";
    Poster: International Workshop on Stress-Induced Phenomena in Microelectronics, Austin, TX, USA; 15.10.2014 - 17.10.2014; in "Abstracts of 13th International Workshop on Stress-Induced Phenomena in Microelectronics", (2014), 59. BibTeX

    1459. W. Gös, M. Toledano-Luque, O. Baumgartner, F. Schanovsky, B. Kaczer, T. Grasser:
    "A Comprehensive Model for Correlated Drain and Gate Current Fluctuations";
    Talk: International Workshop on Computational Electronics (IWCE), Nara, Japan; 04.06.2013 - 07.06.2013; in "Book of Abstracts of the International Workshop on Computational Electronics (IWCE)", (2013), ISBN: 978-3-901578-26-7, 46 - 47. BibTeX

    1458. F. Schanovsky, O. Baumgartner, W. Gös, T. Grasser:
    "A Detailed Evaluation of Model Defects as Candidates for the Bias Temperature Instability";
    Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Glasgow, Scotland, United Kingdom; 03.09.2013 - 05.09.2013; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2013), ISBN: 978-1-4673-5733-3, 1 - 4 doi:10.1109/SISPAD.2013.6650559. BibTeX

    1457. K. Rupp, F. Rudolf, J. Weinbub:
    "A Discussion of Selected Vienna-Libraries for Computational Science";
    Talk: C++Now, Aspen, CO, USA; 12.05.2013 - 17.05.2013; in "Proceedings of C++Now (2013)", (2013), 10 page(s) . BibTeX

    1456. K. Rupp, Ph. Tillet, B. Smith, T. Grasser, A. Jungel:
    "A Note on the GPU Acceleration of Eigenvalue Computations";
    Talk: International Conference of Numerical Analysis and Applied Mathematics (ICNAAM), Rhodes, Greece; 21.09.2013 - 27.09.2013; in "AIP Proceedings, volume 1558", (2013), 1536 - 1539. BibTeX

    1455. Yu. Illarionov, S. E. Tyaginov, M. Bina, T. Grasser:
    "A method to determine the lateral trap position in ultra-scaled MOSFETs";
    Talk: Solid State Devices and Materials Conference (SSDM), Fukuoka, Japan; 24.09.2013 - 27.09.2013; in "Extended Abstracts of the 2013 International Conference on Solid State Devices and Materials(SSDM)", (2013), ISBN: 978-4-86348-362-0, 728 - 729. BibTeX

    1454. R. Orio, S. Selberherr:
    "About Voids in Copper Interconnects";
    Talk: International Conference on Materials for Advanced Technologies (ICMAT), Singapore; (invited) 30.06.2013 - 05.07.2013; in "Proceedings of the International Conference on Materials for Advanced Technologies (ICMAT 2013)", (2013), 8. BibTeX

    1453. T. Grasser, K. Rott, H. Reisinger, P.-J. Wagner, W. Gös, F. Schanovsky, M. Waltl, M. Toledano-Luque, B. Kaczer:
    "Advanced Characterization of Oxide Traps: The Dynamic Time-Dependent Defect Spectroscopy";
    Talk: International Reliability Physics Symposium (IRPS), Monterey, CA, USA; 14.04.2013 - 18.04.2013; in "Proceedings of the International Reliability Physics Symposium (IRPS)", (2013), 1 - 6. BibTeX

    1452. F. Schanovsky, W. Gös, T. Grasser:
    "Advanced Modeling of Charge Trapping at Oxide Defects";
    Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Glasgow, Scotland, United Kingdom; (invited) 03.09.2013 - 05.09.2013; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2013), ISBN: 978-1-4673-5733-3, 451 - 458 doi:10.1109/SISPAD.2013.6650671. BibTeX

    1451. H. Ceric, R. Orio, S. Selberherr:
    "Analysis of Solder Bump Electromigration Reliability";
    Poster: IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), Suzhou, China; 15.07.2013 - 19.07.2013; in "Proceedings of the 20th International Symposium on the Physical & Failure Analysis of Integrated Circuits", (2013), ISBN: 978-1-4799-0478-5, 713 - 716 doi:10.1109/IPFA.2013.6599258. BibTeX

    1450. G. Strasser, B. Schwarz, P. Reininger, O. Baumgartner, W. Schrenk, T. Zederbauer, H. Detz, A. M. Andrews, H. Kosina:
    "Bi-functional Quantum Cascade Laser/Detectors for Integrated Photonics";
    Talk: ÖPG-Jahrestagung, Linz; (invited) 02.09.2013 - 06.09.2013; . BibTeX

    1449. A. Makarov, V. Sverdlov, S. Selberherr:
    "Bias-Field-Free Spin-Torque Oscillator Based on Two MgO-MTJs with a Shared Free Layer: Micromagnetic Modeling";
    Poster: International Symposium on Advanced Nanostructures and Nano-Devices (ISANN), Kauai, Hawaii, USA; 08.12.2013 - 13.12.2013; in "Abstracts International Symposium on Advanced Nanodevices and Nanotechnology (ISANN)", (2013), 2 page(s) . BibTeX

    1448. D. Osintsev, V. Sverdlov, S. Selberherr:
    "Calculation of the Electron Mobility and Spin Lifetime Enhancement by Strain in Thin Silicon Films";
    Poster: International Symposium on Nanostructures, St. Petersburg, Russian federation; 24.06.2013 - 28.06.2013; in "Proceedings of the 21st International Symposium Nanostructures", (2013), ISBN: 978-5-4386-0145-6, 69 - 70. BibTeX

    1447. M. Molnar, V. Palankovski, D. Donoval, J. Kuzmik, J. Kovac, A. Chvala, J. Marek, P. Pribytny, S. Selberherr:
    "Characterization of InAlN/GaN HEMTs at Elevated Temperatures Supported by Numerical Simulation";
    Talk: Workshop on Compound Semiconductor Devices and Integrated Circuits (WOCSDICE), Warnemunde, Germany; 26.05.2013 - 29.05.2013; in "Proceedings of the Workshop on Compound Semiconductor Devices and Integrated Circuits", (2013), ISBN: 978-3-00-041435-0, 135 - 136. BibTeX

    1446. A. Makarov, V. Sverdlov, S. Selberherr:
    "Composite Magnetic Tunnel Junctions for Fast Memory Devices and Efficient Spin-Torque Nano-Oscillators";
    Talk: Intl.Conf.on Information Engineering (ICIE), Hong Kong; 01.11.2013 - 02.11.2013; in "Abstracts Intl.Conf.on Information Engineering (ICIE)", (2013), 7. BibTeX

    1445. A. Makarov, V. Sverdlov, S. Selberherr:
    "Concept of a Bias-Field-Free Spin-Torque Oscillator Based on Two MgO-MTJs";
    Talk: Solid State Devices and Materials Conference (SSDM), Fukuoka, Japan; 24.09.2013 - 27.09.2013; in "Extended Abstracts of the 2013 International Conference on Solid State Devices and Materials (SSDM 2013)", (2013), ISBN: 978-4-86348-362-0, 796 - 797. BibTeX

    1444. R. Coppeta, H. Ceric, D. Holec, T. Grasser:
    "Critical thickness for GaN thin film on AlN substrate";
    Talk: IEEE International Reliability Workshop (IIRW), South Lake Tahoe, USA; 13.10.2013 - 17.10.2013; in "Final Report of the IEEE International Integrated Reliability Workshop (IIRW)", (2013), ISBN: 978-1-4799-0350-4, 133 - 136. BibTeX

    1443. P. Weckx, B. Kaczer, M. Toledano-Luque, T. Grasser, Ph. J. Roussel, H. Kukner, P. Raghavan, F. Catthoor, G. Groeseneken:
    "Defect-based Methodology for Workload-dependent Circuit Lifetime Projections - Application to SRAM";
    Talk: International Reliability Physics Symposium (IRPS), Monterey, CA, USA; 14.04.2013 - 18.04.2013; in "Proceedings of the International Reliability Physics Symposium (IRPS)", (2013), 1 - 7. BibTeX

    1442. M. Toledano-Luque, B. Kaczer, J. Franco, P. Roussel, M. Bina, T. Grasser, M. Cho, P. Weckx, G Groeseneken:
    "Degradation of time dependent variability due to interface state generation";
    Talk: International Symposium on VLSI Technology, Kyoto, Japan; 11.06.2013 - 14.06.2013; in "2013 Symposium on VLSI Technology (VLSIT)", (2013), ISBN: 978-1-4673-5226-0, 190 - 191. BibTeX

    1441. H. Mahmoudi, T. Windbacher, V. Sverdlov, S. Selberherr:
    "Design and Applications of Magnetic Tunnel Junction Based Logic Circuits";
    Talk: The 9th Conference on Ph.D. Research in Microelectronics & Electronics- PRIME 2013, Villach, Austria; 24.06.2013 - 27.06.2013; in "Proceedings of the 9th Conference on Ph.D. Research in Microelectronics & Electronics", (2013), ISBN: 978-1-4673-4580-4, 157 - 160 doi:10.1109/PRIME.2013.6603122. BibTeX

    1440. G. Pobegen, M. Nelhiebel, T. Grasser:
    "Detrimental impact of hydrogen passivation on NBTI and HC degradation";
    Poster: International Reliability Physics Symposium (IRPS), Monterey, CA, USA; 14.04.2013 - 18.04.2013; in "Proceedings of the International Reliability Physics Symposium (IRPS)", (2013), 1 - 6. BibTeX

    1439. O. Baumgartner, M. Bina, W. Gös, F. Schanovsky, M. Toledano-Luque, B. Kaczer, H. Kosina, T. Grasser:
    "Direct Tunneling and Gate Current Fluctuations";
    Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Glasgow, Scotland, United Kingdom; 03.09.2013 - 05.09.2013; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2013), ISBN: 978-1-4673-5733-3, 17 - 20 doi:10.1109/SISPAD.2013.6650563. BibTeX

    1438. G.A. Rott, H. Nielen, H. Reisinger, W. Gustin, S. E. Tyaginov, T. Grasser:
    "Drift Compensating Effect during Hot-Carrier Degradation of 130nm Dual Gate Oxide p-channel Transistors";
    Talk: IEEE International Reliability Workshop (IIRW), South Lake Tahoe, USA; 13.10.2013 - 17.10.2013; in "Final Report of the IEEE International Integrated Reliability Workshop (IIRW)", (2013), ISBN: 978-1-4799-0350-4, 73 - 77. BibTeX

    1437. A. P. Singulani, H. Ceric, E. Langer, S. Carniello:
    "Effects of Bosch scallops on metal layer stress of an open Through Silicon Via technology";
    Poster: International Reliability Physics Symposium (IRPS), Monterey, CA, USA; 14.04.2013 - 18.04.2013; in "Proceedings of the International Reliability Physics Symposium (IRPS)", (2013), ISBN: 978-1-4799-0112-8, CP.2.1 - CP.2.5 doi:10.1109/IRPS.2013.6532066. BibTeX

    1436. W. H. Zisser, H. Ceric, R. Orio, S. Selberherr:
    "Electromigration Analyses of Open TSVs";
    Poster: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Glasgow, Scotland, United Kingdom; 03.09.2013 - 05.09.2013; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2013), ISBN: 978-1-4673-5733-3, 244 - 247 doi:10.1109/SISPAD.2013.6650620. BibTeX

    1435. H. Ceric, A. P. Singulani, R. Orio, S. Selberherr:
    "Electromigration Enhanced Growth of Intermetallic Compound in Solder Bumps";
    Talk: IEEE International Reliability Workshop (IIRW), South Lake Tahoe, USA; 13.10.2013 - 17.10.2013; in "Final Report of the IEEE International Integrated Reliability Workshop (IIRW)", (2013), ISBN: 978-1-4799-0350-4, 166 - 169 doi:10.1109/IIRW.2013.6804185. BibTeX

    1434. W. H. Zisser, H. Ceric, R. Orio, S. Selberherr:
    "Electromigration Induced Stress in Open TSVs";
    Talk: IEEE International Reliability Workshop (IIRW), South Lake Tahoe, USA; 13.10.2013 - 17.10.2013; in "Final Report of the IEEE International Integrated Reliability Workshop (IIRW)", (2013), ISBN: 978-1-4799-0350-4, 142 - 145 doi:10.1109/IIRW.2013.6804179. BibTeX

    1433. S. Touski, M. Pourfath, H. Kosina:
    "Electronic Transport in Graphene Nanoribbons in the Presence of Substrate Surface Corrugation";
    Talk: International Workshop on Computational Electronics (IWCE), Nara, Japan; 04.06.2013 - 07.06.2013; in "Book of Abstracts of the International Workshop on Computational Electronics (IWCE)", (2013), ISBN: 978-3-901578-26-7, 108 - 109. BibTeX

    1432. D. Osintsev, V. Sverdlov, S. Selberherr:
    "Enhanced Intervalley Splitting and Reduced Spin Relaxation in Strained Thin Silicon Films";
    Talk: APS March Meeting, Baltimore, Maryland, USA; 18.03.2013 - 22.03.2013; in "Bulletin American Physical Society (APS March Meeting)", (2013), 1 page(s) . BibTeX

    1431. R. Coppeta, H. Ceric, B. Karunamurthy, T. Grasser:
    "Epitaxial Volmer-Weber Growth Modelling";
    Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Glasgow, Scotland, United Kingdom; 03.09.2013 - 05.09.2013; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2013), ISBN: 978-1-4673-5733-3, 45 - 48 doi:10.1109/SISPAD.2013.6650570. BibTeX

    1430. S. E. Tyaginov, M. Bina, J. Franco, D. Osintsev, Y. Wimmer, B. Kaczer, T. Grasser:
    "Essential Ingredients for Modeling of Hot-Carrier Degradation in Ultra-Scaled MOSFETs";
    Talk: IEEE International Reliability Workshop (IIRW), South Lake Tahoe, USA; 13.10.2013 - 17.10.2013; in "Final Report of the IEEE International Integrated Reliability Workshop (IIRW)", (2013), ISBN: 978-1-4799-0350-4, 98 - 101. BibTeX

    1429. D. Osintsev, V. Sverdlov, S. Selberherr:
    "Evaluation of Spin Lifetime in Strained UT2B Silicon-On-Insulator MOSFETs";
    Poster: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Glasgow, Scotland, United Kingdom; 03.09.2013 - 05.09.2013; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2013), ISBN: 978-1-4673-5733-3, 236 - 239 doi:10.1109/SISPAD.2013.6650618. BibTeX

    1428. B. Kaczer, V. Afanas´Ev, K. Rott, F. Cerbu, J. Franco, W. Gös, T. Grasser, O. Madia, D. Nguyen, A. Stesmans, H. Reisinger, M. Toledano-Luque, P. Weckx:
    "Experimental characterization of BTI defects";
    Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Glasgow, Scotland, United Kingdom; (invited) 03.09.2013 - 05.09.2013; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2013), ISBN: 978-1-4673-5733-3, 444 - 450 doi:10.1109/SISPAD.2013.6650670. BibTeX

    1427. Z. Stanojevic, M. Karner, H. Kosina:
    "Exploring the Design Space of Non-Planar Channels: Shape, Orientation, and Strain";
    Talk: IEEE International Electron Devices Meeting (IEDM), Washington, DC, USA; 09.12.2013 - 11.12.2013; in "Proceedings of the IEEE International Electron Devices Meeting (IEDM)", (2013), 332 - 335 doi:10.1109/IEDM.2013.6724618. BibTeX

    1426. A. Makarov, V. Sverdlov, S. Selberherr:
    "Fast Switching STT-MRAM Cells for Future Universal Memory";
    Talk: Advanced Workshop on Frontiers in Electronics (WOFE), San Juan, Puerto Rico; (invited) 17.12.2013 - 20.12.2013; in "Abstracts Advanced Workshop on Frontiers in Electronics (WOFE)", (2013), 1 page(s) . BibTeX

    1425. N. Neophytou, Z. Stanojevic, H. Kosina:
    "Full Band Calculations of Low-field Mobility in p-type Silicon Nanowire MOSFETs";
    Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Glasgow, Scotland, United Kingdom; 03.09.2013 - 05.09.2013; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2013), ISBN: 978-1-4673-5733-3, 81 - 84 doi:10.1109/SISPAD.2013.6650579. BibTeX

    1424. T. Grasser:
    "Fundamentals of RTN, BTI, and Hot Carrier Degradation: A Matter of Timescales";
    Talk: International Reliability Physics Symposium (IRPS), Monterey, CA, USA (Tutorial); (invited) 14.04.2013 - 18.04.2013; in "Proceedings of the International Reliability Physics Symposium (IRPS)", (2013), 1. BibTeX

    1423. A. Makarov, V. Sverdlov, S. Selberherr:
    "Geometry Optimization of Spin-Torque Oscillators Composed of Two MgO-MTJs with a Shared Free Layer";
    Talk: International Conference on Nanoscale Magnetism (ICNM), Istanbul, Turkey; 02.09.2013 - 06.09.2013; in "Proceedings of the International Conference on Nanoscale Magnetism", (2013), 69. BibTeX

    1422. T. Grasser, K. Rott, H. Reisinger, M. Waltl, P.-J. Wagner, F. Schanovsky, W. Gös, G. Pobegen, B. Kaczer:
    "Hydrogen-Related Volatile Defects as the Possible Cause for the Recoverable Component of NBTI";
    Talk: IEEE International Electron Devices Meeting (IEDM), Washington, DC, USA; 09.12.2013 - 11.12.2013; in "Proceedings of the IEEE International Electron Devices Meeting (IEDM)", (2013), 409 - 412 doi:10.1109/IEDM.2013.6724637. BibTeX

    1421. A. P. Singulani, H. Ceric, L. Filipovic, E. Langer:
    "Impact of Bosch Scallops Dimensions on Stress of an Open Through Silicon Via Technology";
    Talk: International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, Poland; 14.04.2013 - 17.04.2013; in "Proceedings of the IEEE 14th International Conference on Thermal, Mechanical & Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EurSimE)", (2013), ISBN: 978-1-4673-6137-8, 6 page(s) doi:10.1109/EuroSimE.2013.6529938. BibTeX

    1420. H. Mahmoudi, T. Windbacher, V. Sverdlov, S. Selberherr:
    "Impact of Device Parameters on the Reliability of the Magnetic Tunnel Junction Based Implication Logic Gates";
    Poster: International Workshop "Functional Nanomaterials and Devices", Kyiv, Ukraine; 08.04.2013 - 11.04.2013; in "Proceedings of the 7th International Workshop "Functional Nanomaterials and Devices"", (2013), ISBN: 978-966-02-6779-4, 68 - 69. BibTeX

    1419. H. Ceric, A. P. Singulani, R. Orio, S. Selberherr:
    "Impact of Intermetallic Compound on Solder Bump Electromigration Reliability";
    Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Glasgow, Scotland, United Kingdom; 03.09.2013 - 05.09.2013; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2013), ISBN: 978-1-4673-5733-3, 73 - 76 doi:10.1109/SISPAD.2013.6650577. BibTeX

    1418. J. Weinbub, K. Rupp, S. Selberherr:
    "Increasing Flexibility and Reusability of Finite Element Simulations With ViennaX";
    Talk: International Congress on Computational Engineering and Sciences (FEMTEC), Las Vegas, USA; 20.05.2013 - 25.05.2013; in "Abstracts 4th International Congress on Computational Engineering and Sciences", (2013), 1 page(s) . BibTeX

    1417. D. Osintsev, V. Sverdlov, S. Selberherr:
    "Influence of Surface Roughness Scattering on Spin Lifetime in Silicon";
    Talk: International Workshop on Computational Electronics (IWCE), Nara, Japan; 04.06.2013 - 07.06.2013; in "Book of Abstracts of the International Workshop on Computational Electronics (IWCE)", (2013), ISBN: 978-3-901578-26-7, 76 - 77. BibTeX

    1416. R. Orio, H. Ceric, S. Selberherr:
    "Influence of Temperature on the Standard Deviation of Electromigration Lifetimes";
    Poster: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Glasgow, Scotland, United Kingdom; 03.09.2013 - 05.09.2013; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2013), ISBN: 978-1-4673-5733-3, 232 - 235 doi:10.1109/SISPAD.2013.6650617. BibTeX

    1415. J. Ghosh, V. Sverdlov, S. Selberherr:
    "Influence of a Space Charge Region on Spin Transport in Semiconductor";
    Talk: International Semiconductor Device Research Symposium (ISDRS), Maryland, USA; 11.12.2013 - 13.12.2013; in "Abstracts International Semiconductor Device Research Symposium (ISDRS)", (2013), ISBN: 978-1-63173-156-3, 27. BibTeX

    1414. D. Osintsev, V. Sverdlov, S. Selberherr:
    "Influence of the Valley Degeneracy on Spin Relaxation in Thin Silicon Films";
    Poster: International Conference on Ultimate Integration of Silicon (ULIS), University of Warwick, UK; 19.03.2013 - 21.03.2013; in "The 14th Edition of the `International Conference on Ultimate Integration on Silicon´ (ULIS 2013)", (2013), ISBN: 978-1-4673-4802-7, 221 - 224 doi:10.1109/ULIS.2013.6523525. BibTeX

    1413. A. Harrer, B. Schwarz, P. Reininger, R. Gansch, T. Zederbauer, A. M. Andrews, S. Kalchmair, W. Schrenk, O. Baumgartner, Z. Stanojevic, H. Kosina, G. Strasser:
    "Intersubband Detectors";
    Talk: 3rd International Nanophotonics Meeting 2013, Salzburg; 01.09.2013 - 03.09.2013; . BibTeX

    1412. N. Neophytou, H. Karamitaheri, H. Kosina:
    "Low Dimensional Semiconductor Thermoelectric Materials: Design Approaches from Atomistic Calculations for Electrons and Phonons";
    Talk: The 32nd International Conference on Thermoelectrics, Kobe, Japan; 30.06.2013 - 04.07.2013; in "Book of Abstracts", (2013), 1 page(s) . BibTeX

    1411. N. Neophytou, Z. Stanojevic, H. Kosina:
    "Low-Field Mobility of Ultra-Narrow Si Nanowire MOSFETs Using Self-Consistent Full-Band Simulations";
    Poster: International Conference on One Dimensional Nanomaterials (ICON), Annecy, France; 23.09.2013 - 26.09.2013; in "Booklet of Abstracts, Fifth International Conference on One Dimensional Nanomaterials", (2013), 142. BibTeX

    1410. H. Mahmoudi, T. Windbacher, V. Sverdlov, S. Selberherr:
    "MRAM-based Logic Array for Large-Scale Non-Volatile Logic-in-Memory Applications";
    Talk: 2013 IEEE/ACM International Symposium on Nanoscale Architectures (NANOARCH), New York City, USA; 15.07.2013 - 17.07.2013; in "Proceedings of the 2013 IEEE/ACM International Symposium on Nanoscale Architectures", (2013), ISBN: 978-1-4799-0873-8, 2 page(s) doi:10.1109/NanoArch.2013.6623033. BibTeX

    1409. A. Makarov, V. Sverdlov, S. Selberherr:
    "Magnetic oscillation of the transverse domain wall in a penta-layer MgO-MTJ";
    Poster: International Symposium on Nanostructures, St. Petersburg, Russian federation; 24.06.2013 - 28.06.2013; in "Proceedings of the 21st International Symposium Nanostructures", (2013), ISBN: 978-5-4386-0145-6, 338 - 339. BibTeX

    1408. M. Schrems, C. Schrank, J. Siegert, J. Kraft, J. Teva, S. Selberherr:
    "Metrology Requirements for Manufacturing 3D Integrated ICs";
    Talk: International Conference on Frontiers of Characterization and Metrology for Nanoelectronics (FCMN), Gaithersburg, USA; (invited) 25.03.2013 - 28.03.2013; in "Proceedings International Conference on Frontiers of Characterization and Metrology for Nanoelectronics (FCMN)", (2013), 137 - 139. BibTeX

    1407. L. Filipovic, O. Baumgartner, H. Kosina:
    "Modeling Direct Band-to-Band Tunneling using QTBM";
    Poster: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Glasgow, Scotland, United Kingdom; 03.09.2013 - 05.09.2013; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2013), ISBN: 978-1-4673-5733-3, 212 - 215 doi:10.1109/SISPAD.2013.6650612. BibTeX

    1406. V. Sverdlov, H. Mahmoudi, A. Makarov, D. Osintsev, J. Weinbub, T. Windbacher, S. Selberherr:
    "Modeling Spin-Based Devices in Silicon";
    Talk: International Workshop on Computational Electronics (IWCE), Nara, Japan; (invited) 04.06.2013 - 07.06.2013; in "Book of Abstracts of the International Workshop on Computational Electronics (IWCE)", (2013), ISBN: 978-3-901578-26-7, 70 - 71. BibTeX

    1405. L. Filipovic, S. Selberherr, G. Mutinati, E. Brunet, S. Steinhauer, A. Köck, J. Teva, J. Kraft, J. Siegert, F. Schrank:
    "Modeling Spray Pyrolysis Deposition";
    Talk: World Congress on Engineering (WCE), London, UK; 03.07.2013 - 05.07.2013; in "Proceedings of the World Congress on Engineering (WCE) Vol II", (2013), ISBN: 978-988-19252-8-2, 987 - 992. BibTeX

    1404. Z. Stanojevic, H. Kosina:
    "Modeling Surface-Roughness-Induced Scattering in Non-Planar Silicon Nanostructures";
    Talk: Silicon Nanoelectronics Workshop, Kyoto, Japan; 09.06.2013 - 10.06.2013; in "The 2013 Silicon Nanoelectronics Workshop (SNW)", (2013), 93 - 94. BibTeX

    1403. M. Molnar, V. Palankovski, D. Donoval, J. Kuzmik, J. Kovac, A. Chvala, J. Marek, P. Pribytny, S. Selberherr:
    "Modeling and Characterization of InAlN/GaN HEMTs at Elevated Temperatures";
    Talk: International Conference on Advances in Electronic and Photonic Technologies, High Tatras, Spa Novy Smokovec, Slovakia; 02.06.2013 - 05.06.2013; in "Proceedings of ADEPT International Conference on Advances in Electronic and Photonic Technologies", (2013), ISBN: 978-80-554-0689-3, 48 - 51. BibTeX

    1402. O. Baumgartner, Z. Stanojevic, H. Kosina:
    "Modeling of the Effects of Band Structure and Transport in Quantum Cascade Detectors";
    Talk: International Workshop on Computational Electronics (IWCE), Nara, Japan; 04.06.2013 - 07.06.2013; in "Book of Abstracts of the International Workshop on Computational Electronics (IWCE)", (2013), ISBN: 978-3-901578-26-7, 86 - 87. BibTeX

    1401. L. Filipovic, S. Selberherr, G. Mutinati, E. Brunet, S. Steinhauer, A. Köck, J. Teva, J. Kraft, J. Siegert, F. Schrank, C. Gspan, W. Grogger:
    "Modeling the Growth of Thin SnO2 Films using Spray Pyrolysis Deposition";
    Poster: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Glasgow, Scotland, United Kingdom; 03.09.2013 - 05.09.2013; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2013), ISBN: 978-1-4673-5733-3, 208 - 211 doi:10.1109/SISPAD.2013.6650611. BibTeX

    1400. B. Schwarz, P. Reininger, W. Schrenk, H. Detz, O. Baumgartner, T. Zederbauer, A. M. Andrews, H. Kosina, G. Strasser:
    "Monolithically integrated quantum cascade laser and detector";
    Talk: CLEO Europe 2013, München, Deutschland; 12.05.2013 - 16.05.2013; . BibTeX

    1399. S. Wolf, N. Neophytou, Z. Stanojevic:
    "Monte Carlo Simulations Of Thermal Conductivity Nanoporous Si Membranes";
    Talk: European Conference on Thermoelectrics (ECT), Noordwijk, The Netherlands; 18.11.2013 - 20.11.2013; in "Book of Abstracts", (2013), 1 - 4. BibTeX

    1398. W. Gös, M. Toledano-Luque, F. Schanovsky, M. Bina, O. Baumgartner, B. Kaczer, T. Grasser:
    "Multi-Phonon Processes as the Origin of Reliability Issues";
    Talk: Meeting of the Electrochemical Society (ECS), San Francisco, USA; (invited) 27.10.2013 - 01.11.2013; in "ECS Transactions 2013 - "Semiconductors, Dielectrics, and Materials for Nanoelectronics 11"", (2013), 58/7/, 31 - 47 doi:10.1149/05807.0031ecst. BibTeX

    1397. T. Windbacher, A. Makarov, H. Mahmoudi, V. Sverdlov, S. Selberherr:
    "Novel Bias-Field-Free Large Gain Spin-Transfer Oscillator";
    Talk: Annual Conference on Magnetism and Magnetic Materials, Denver, USA; 04.11.2013 - 08.11.2013; in "Abstract Book of 58th Annual Conference of Magnetism and Magnetic Materials (MMM)", (2013), 456 - 457. BibTeX

    1396. T. Windbacher, H. Mahmoudi, V. Sverdlov, S. Selberherr:
    "Novel MTJ-Based Shift Register for Non-Volatile Logic Applications";
    Talk: 2013 IEEE/ACM International Symposium on Nanoscale Architectures (NANOARCH), New York City, USA; 15.07.2013 - 17.07.2013; in "Proceedings of the 2013 IEEE/ACM International Symposium on Nanoscale Architectures", (2013), 36 - 37 doi:10.1109/NanoArch.2013.6623038. BibTeX

    1395. T. Windbacher, H. Mahmoudi, V. Sverdlov, S. Selberherr:
    "Novel Non-Volatile Magnetic Flip Flop";
    Poster: International Conference on Spintronics and Quantum Information Technology (SPINTECH), Chicago Illinois USA; 29.07.2013 - 02.08.2013; in "In Proceedings of Seventh International School on Spintronics and Quantum Information Technology", (2013), 1 page(s) . BibTeX

    1394. K. Rupp, B. Smith:
    "On Level Scheduling for Incomplete LU Factorization Preconditioners on Accelerators";
    Talk: International Congress on Computational Engineering and Sciences (FEMTEC), Las Vegas, USA; 19.05.2013 - 24.05.2013; in "Abstracts 4th International Congress on Computational Engineering and Sciences", (2013), 1. BibTeX

    1393. B. Schwarz, P. Reininger, D. Ristanic, O. Baumgartner, H. Detz, T. Zederbauer, D. MacFarland, A. M. Andrews, W. Schrenk, H. Kosina, G. Strasser:
    "On-Chip mid-infrared light generation and detection";
    Talk: ITQW, New York, USA; (invited) 15.09.2013 - 20.09.2013; . BibTeX

    1392. Yu. Illarionov, M. I. Vexler, V. V. Fedorov, S. M. Suturin, D. V. Isakov, I. Grekhov:
    "Optical characterization of the injection properties of MIS structures with thin CaF2 and HfO2/SiO2 insulating layers on Silicon";
    Poster: XI Russian Conference on Semiconductor Physics, St-Petersburg, Russia; 16.09.2013 - 20.09.2013; in "Abstracts of XI Russian Conference on Semiconductor Physics", (2013), ISBN: 978-5-93634-033-3, 229. BibTeX

    1391. H. Mahmoudi, T. Windbacher, V. Sverdlov, S. Selberherr:
    "Optimization of Spin-Transfer Torque Magnetic Tunnel Junction-Based Logic Gates";
    Poster: International Workshop on Computational Electronics (IWCE), Nara, Japan; 04.06.2013 - 07.06.2013; in "Book of Abstracts of the International Workshop on Computational Electronics (IWCE)", (2013), ISBN: 978-3-901578-26-7, 244 - 245. BibTeX

    1390. D. Narducci, B. Lorenzi, R. Tonini, S. Frabboni, G. Gazzadi, G. Ottaviani, N. Neophytou, X. Zianni:
    "Paradoxical Enhancement of the Power Factor in Polycrystalline Silicon Due to the Formation of Nanovoids";
    Talk: European Conference on Thermoelectrics (ECT), Noordwijk, The Netherlands; 18.11.2013 - 20.11.2013; in "Book of Abstracts", (2013), 52. BibTeX

    1389. H. Mahmoudi, T. Windbacher, V. Sverdlov, S. Selberherr:
    "Performance Analysis and Comparison of Two 1T/1MTJ-based Logic Gates";
    Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Glasgow, Scotland, United Kingdom; 03.09.2013 - 05.09.2013; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2013), ISBN: 978-1-4673-5733-3, 163 - 166 doi:10.1109/SISPAD.2013.6650600. BibTeX

    1388. M. Moradinasab, M. Pourfath, O. Baumgartner, H. Kosina:
    "Performance Optimization and Instability Study in Ring Cavity Quantum Cascade Lasers";
    Poster: The 12th International Conference on Intersubband Transitions in Quantum Wells (ITQW), New York, USA; 15.09.2013 - 20.09.2013; . BibTeX

    1387. K. Rupp, Ph. Tillet:
    "Performance-portable kernels in OpenCL: Lessons learned";
    Talk: BLIS Retreat, Austin, USA; (invited) 05.09.2013 - 06.09.2013; . BibTeX

    1386. R. Orio, S. Selberherr:
    "Physically Based Models of Electromigration";
    Talk: Conference on Electron Devices and Solid-State Circuits (EDSSC), Hong Kong; (invited) 03.06.2013 - 05.06.2013; in "Proceedings of the International Conference on Electron Devices and Solid-State Circuits (EDSSC)", (2013), 290, 1 - 2. BibTeX

    1385. S. Amoroso, L. Gerrer, A. Asenov, J. M. Sellier, I. Dimov, M. Nedjalkov, S. Selberherr:
    "Quantum Insights in Gate Oxide Charge-Trapping Dynamics in Nanoscale MOSFETs";
    Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Glasgow, Scotland, United Kingdom; 03.09.2013 - 05.09.2013; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2013), ISBN: 978-1-4673-5733-3, 25 - 28 doi:10.1109/SISPAD.2013.6650565. BibTeX

    1384. T. Grasser, K. Rott, H. Reisinger, M. Waltl, F. Schanovsky, W. Gös, B. Kaczer:
    "Recent Advances in Understanding Oxide Traps in pMOS Transistors";
    Talk: International Workshop on Dielectric Thin Films For Future Electron Devices: Science and Technology, Tokyo, Japan; (invited) 07.11.2013 - 09.11.2013; in "Proceedings of 2013 IWDTF", (2013), ISBN: 978-4-86348-383-5, 95 - 96. BibTeX

    1383. D. Osintsev, V. Sverdlov, S. Selberherr:
    "Reduction of Momentum and Spin Relaxation Rate in Strained Thin Silicon Films";
    Talk: European Solid-State Device Research Conference (ESSDERC), Bucharest, Romania; 16.09.2013 - 20.09.2013; in "Proceedings of the European Solid-State Device Research Conference (ESSDERC)", (2013), ISBN: 978-1-4799-0649-9, 334 - 337 doi:10.1109/ESSDERC.2013.6818886. BibTeX

    1382. J. Franco, B. Kaczer, M. Toledano-Luque, Ph. J. Roussel, G. Groeseneken, B. Schwarz, M. Bina, M. Waltl, P.-J. Wagner, T. Grasser:
    "Reduction of the BTI Time-Dependent Variability in Nanoscaled MOSFETs by Body Bias";
    Talk: International Reliability Physics Symposium (IRPS), Monterey, CA, USA; 14.04.2013 - 18.04.2013; in "Proceedings of the International Reliability Physics Symposium (IRPS)", (2013), 1 - 6. BibTeX

    1381. D. Osintsev, V. Sverdlov, S. Selberherr:
    "Reduction of the Surface Roughness Induced Spin Relaxation in SOI Structures: An Analytical Approach";
    Talk: Workshop of the Thematic Network on Silicon on Insulator Technology, Devices, and Circuits (EUROSOI), Paris, France; 21.01.2013 - 23.01.2013; in "Conference Proceedings of the Ninth Workshop of the Thematic Network on Silicon on Insulator Technology, Devices and Circuits", (2013), 46, 1 page(s) . BibTeX

    1380. J. Franco, B. Kaczer, P. Roussel, M. Toledano-Luque, P. Weckx, T. Grasser:
    "Relevance of non-exponential single-defect-induced threshold voltage shifts for NBTI Variability";
    Talk: IEEE International Reliability Workshop (IIRW), South Lake Tahoe, USA; 13.10.2013 - 17.10.2013; in "Final Report of the IEEE International Integrated Reliability Workshop (IIRW)", (2013), ISBN: 978-1-4799-0350-4, 69 - 72. BibTeX

    1379. B. Kaczer, C. Chen, J. Watt, K. Chanda, P. Weckx, M. Toledano-Luque, G. Groeseneken, T. Grasser:
    "Reliability and Performance Considerations for NMOSFET Pass Gates in FPGA Applications";
    Talk: IEEE International Reliability Workshop (IIRW), South Lake Tahoe, USA; 13.10.2013 - 17.10.2013; in "Final Report of the IEEE International Integrated Reliability Workshop (IIRW)", (2013), ISBN: 978-1-4799-0350-4, 94 - 97. BibTeX

    1378. J. Weinbub:
    "Research Software Engineering";
    Talk: SPOMECH Autumn School, Ostrava, Czech Republic; (invited) 11.11.2013 - 15.11.2013; . BibTeX

    1377. T. Windbacher, H. Mahmoudi, V. Sverdlov, S. Selberherr:
    "Rigorous Simulation Study of a Novel Non-Volatile Magnetic Flip-Flop";
    Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Glasgow, Scotland, United Kingdom; 03.09.2013 - 05.09.2013; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2013), ISBN: 978-1-4673-5733-3, 368 - 371 doi:10.1109/SISPAD.2013.6650651. BibTeX

    1376. H. Mahmoudi, T. Windbacher, V. Sverdlov, S. Selberherr:
    "STT-MRAM-Based Reprogrammable Logic Gates for Large-Scale Non-Volatile Logic Integration";
    Poster: International Conference on Nanoscale Magnetism (ICNM), Istanbul, Turkey; 02.09.2013 - 06.09.2013; in "Proceedings of the International Conference on Nanoscale Magnetism", (2013), 208. BibTeX

    1375. H. Mahmoudi, T. Windbacher, V. Sverdlov, S. Selberherr:
    "STT-MTJ-Based Implication Logic Circuits for Non-Volatile Logic-in-Memory Applications";
    Talk: Symposium on CMOS Emerging Technologies, Whistler, BC, Canada; (invited) 17.07.2013 - 19.07.2013; in "Book of Abstracts of the 2013 Symposium on CMOS Emerging Technologies (CMOS ET 2013)", (2013), ISBN: 978-1-927500-38-5, 1 page(s) . BibTeX

    1374. B. Schwarz, P. Reininger, H. Detz, T. Zederbauer, A. M. Andrews, W. Schrenk, O. Baumgartner, H. Kosina, G. Strasser:
    "Same-Frequency Detector and Laser Utilizing Bi-Functional Quantum Cascade Active Regions";
    Talk: SPIE Photonics West, San Francisco, CA, USA; 02.02.2013 - 07.02.2013; . BibTeX

    1373. D. Osintsev, V. Sverdlov, S. Selberherr:
    "Shear Strain: An Efficient Spin Lifetime Booster in Advanced UTB2 SOI MOSFETs";
    Talk: International Workshop "Functional Nanomaterials and Devices", Kyiv, Ukraine; 08.04.2013 - 11.04.2013; in "Proceedings of the 7th International Workshop "Functional Nanomaterials and Devices"", (2013), ISBN: 978-966-02-6779-4, 64 - 65. BibTeX

    1372. V. Sverdlov, S. Selberherr:
    "Silicon Spintronics and its Applications";
    Talk: International Workshop "Functional Nanomaterials and Devices", Kyiv, Ukraine; (invited) 08.04.2013 - 11.04.2013; in "Proceedings of the 7th International Workshop "Functional Nanomaterials and Devices"", (2013), ISBN: 978-966-02-6779-4, 51 - 52. BibTeX

    1371. A. Makarov, V. Sverdlov, D. Osintsev, S. Selberherr:
    "Simulation of Magnetic Oscillations in a System of two MTJs with a Shared Free Layer";
    Poster: Soft Magnetic Materials Conference (SMM), Budapest, Hungary; 01.09.2013 - 04.09.2013; in "Abstracts Book of The 21st International Conference on Soft Magnetic Materials", (2013), 101. BibTeX

    1370. M. Moradinasab, M. Pourfath, H. Kosina:
    "Spin Filtering in Zigzag Graphene Nanoribbons Using 7-5 Defects";
    Poster: Graphene Week, Chemnitz, Germany; 02.06.2013 - 07.06.2013; in "Book of Abstracts", (2013), 250. BibTeX

    1369. J. Ghosh, T. Windbacher, V. Sverdlov, S. Selberherr:
    "Spin Injection and Diffusion in Silicon Based Devices from a Space Charge Layer";
    Talk: Annual Conference on Magnetism and Magnetic Materials, Denver, USA; 04.11.2013 - 08.11.2013; in "Abstract Book of 58th Annual Conference of Magnetism and Magnetic Materials (MMM)", (2013), 713 - 714. BibTeX

    1368. D. Osintsev, V. Sverdlov, S. Selberherr:
    "Spin Lifetime Enhancement by Shear Strain in Thin Silicon-On-Insulator Films";
    Talk: Meeting of the Electrochemical Society, Advanced Semiconduc-tor-on-Insulator Technology and Related Physics, Toronto, Canada; 12.05.2013 - 16.05.2013; in "223th ECS Meeting", (2013), 894, ISBN: 978-1-56677-866-4, 1. BibTeX

    1367. D. Osintsev, V. Sverdlov, S. Selberherr:
    "Spin Lifetime Enhancement in Strained Thin Silicon Films";
    Talk: International Symposium on Advanced Nanostructures and Nano-Devices (ISANN), Kauai, Hawaii, USA; 08.12.2013 - 13.12.2013; in "Abstracts International Symposium on Advanced Nanodevices and Nanotechnology (ISANN)", (2013), 2 page(s) . BibTeX

    1366. P. Schwaha, M. Nedjalkov, S. Selberherr, I. Dimov, R. Georgieva:
    "Stochastic Alternative to Newton's Acceleration";
    Talk: International Conference on Large-Scale Scientific Computations (LSSC), Sozopol, Bulgaria; 03.06.2013 - 07.06.2013; in "Abstracts International Conference on Large-Scale Scientific Computations (LSSC)", (2013), 77 - 78. BibTeX

    1365. A. P. Singulani, H. Ceric, S. Selberherr:
    "Stress Estimation in Open Tungsten TSV";
    Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Glasgow, Scotland, United Kingdom; 03.09.2013 - 05.09.2013; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2013), ISBN: 978-1-4673-5733-3, 65 - 68 doi:10.1109/SISPAD.2013.6650575. BibTeX

    1364. A. P. Singulani, H. Ceric, S. Selberherr:
    "Stress Evolution in the Metal Layers of TSVs with Bosch Scallops";
    Poster: European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), Arcachon, France; 30.09.2013 - 04.10.2013; . BibTeX

    1363. A. P. Singulani, H. Ceric, E. Langer:
    "Stress Evolution on Tungsten Thin-Film of an Open Through Silicon Via Technology";
    Poster: IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), Suzhou, China; 15.07.2013 - 19.07.2013; in "Proceedings of the 20th International Symposium on the Physical & Failure Analysis of Integrated Circuits", (2013), ISBN: 978-1-4799-0478-5, 216 - 220 doi:10.1109/IPFA.2013.6599155. BibTeX

    1362. A. P. Singulani, H. Ceric, E. Langer:
    "Stress reduction induced by Bosch scallops on an open TSV technology";
    Poster: IEEE International Interconnect Technology Conference (IITC), Kyoto, Japan; 13.06.2013 - 15.06.2013; in "Proceedings of the International Interconnect Techonology Conference (IITC)", (2013), ISBN: 978-1-4799-0438-9, 1 - 2 doi:10.1109/IITC.2013.6615578. BibTeX

    1361. A. Makarov, V. Sverdlov, S. Selberherr:
    "Structural Optimization of MTJs with a Composite Free Layer";
    Talk: SPIE Spintronics, San Diego, CA, USA; (invited) 25.08.2013 - 29.08.2013; in "Proceedings of SPIE Spintronics", (2013), OP108-86. BibTeX

    1360. A. Makarov, V. Sverdlov, S. Selberherr:
    "Structural Optimization of MTJs with a Composite Free Layer";
    Talk: International Workshop on Computational Electronics (IWCE), Nara, Japan; 04.06.2013 - 07.06.2013; in "Book of Abstracts of the International Workshop on Computational Electronics (IWCE)", (2013), ISBN: 978-3-901578-26-7, 74 - 75. BibTeX

    1359. Z. Stanojevic, H. Kosina:
    "Surface-Roughness-Scattering in Non-Planar Channels - the Role of Band Anisotropy";
    Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Glasgow, Scotland, United Kingdom; 03.09.2013 - 05.09.2013; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2013), ISBN: 978-1-4673-5733-3, 352 - 355 doi:10.1109/SISPAD.2013.6650647. BibTeX

    1358. T. Windbacher, O. Triebl, D. Osintsev, A. Makarov, V. Sverdlov, S. Selberherr:
    "Switching Optimization of an Electrically Read- and Writable Magnetic Logic Gate";
    Talk: International Workshop on Computational Electronics (IWCE), Nara, Japan; 04.06.2013 - 07.06.2013; in "Book of Abstracts of the International Workshop on Computational Electronics (IWCE)", (2013), ISBN: 978-3-901578-26-7, 238 - 239. BibTeX

    1357. J. M. Sellier, M. Nedjalkov, I. Dimov, S. Selberherr:
    "The Role of Annihilation in a Wigner Monte Carlo Approach";
    Talk: International Conference on Large-Scale Scientific Computations (LSSC), Sozopol, Bulgaria; 03.06.2013 - 07.06.2013; in "Abstracts International Conference on Large-Scale Scientific Computations (LSSC)", (2013), 78. BibTeX

    1356. P. Schwaha, J. M. Sellier, M. Nedjalkov, I. Dimov, S. Selberherr:
    "The Ultimate Equivalence Between Coherent Quantum and Classical Regimes";
    Poster: International Workshop on Computational Electronics (IWCE), Nara, Japan; 04.06.2013 - 07.06.2013; in "Book of Abstracts of the International Workshop on Computational Electronics (IWCE)", (2013), ISBN: 978-3-901578-26-7, 152 - 153. BibTeX

    1355. H. Karamitaheri, N. Neophytou, H. Kosina:
    "Thermal Conductivity of Si Nanowires Using Atomistic Phonon Dispersions";
    Talk: International Workshop on Computational Electronics (IWCE), Nara, Japan; 04.06.2013 - 07.06.2013; in "Book of Abstracts of the International Workshop on Computational Electronics (IWCE)", (2013), ISBN: 978-3-901578-26-7, 98 - 99. BibTeX

    1354. H. Karamitaheri, N. Neophytou, H. Kosina:
    "Thermal Conductivity of Si Nanowires and Ultra Thin-Layers Using Atomistic Phonon Dispersions";
    Talk: The 32nd International Conference on Thermoelectrics, Kobe, Japan; 30.06.2013 - 04.07.2013; in "Book of Abstracts", (2013), 1 page(s) . BibTeX

    1353. N. Neophytou, H. Kosina:
    "Thermoelectric Power Factor Engineering of Low-Dimensional and Nanocomposite Si Nanostructures";
    Talk: APS March Meeting, Baltimore, Maryland, USA; 18.03.2013 - 22.03.2013; in "Bulletin American Physical Society (APS March Meeting)", (2013), 1 page(s) . BibTeX

    1352. B. Schwarz, P. Reininger, O. Baumgartner, T. Zederbauer, H. Detz, A. M. Andrews, W. Schrenk, H. Kosina, G. Strasser:
    "Towards Mid-Infrared On-Chip Sensing utilizing a bi-functional Quantum Cascade Laser/Detector";
    Talk: Conference on Electronic Properties of Two-Dimensional Systems / Modulated Semiconductor Structures (EP2Ds-MSS), Wroclaw, Polen; 01.07.2013 - 05.07.2013; . BibTeX

    1351. Ph. Tillet, K. Rupp, S. Selberherr, C. Lin:
    "Towards Performance-Portable, Scalable, and Convenient Linear Algebra";
    Talk: USENIX Workshop on Hot Topics in Parallelism, San Jose, CA, USA; 24.06.2013 - 25.06.2013; in "Proceedings of 5th USENIX Workshop on Hot Topics in Parallelism", (2013), 1 - 8. BibTeX

    1350. P. Reininger, B. Schwarz, A. Wirthmüller, A. Harrer, O. Baumgartner, H. Detz, T. Zederbauer, D. MacFarland, A. M. Andrews, W. Schrenk, L. Hvozdara, H. Kosina, G. Strasser:
    "Towards higher temperature operation of quantum cascade detectors";
    Talk: ITQW, New York, USA; 15.09.2013 - 20.09.2013; . BibTeX

    1349. G.G. Kareva, M. I. Vexler, Yu. Illarionov:
    "Transformation of a Metal-Insulator-Silicon Structure into a Resonant-Tunneling Diode";
    Poster: International Conference on Insulating Films on Semiconductors (INFOS), Cracow, Poland; 25.06.2013 - 28.06.2013; in "Book of Abstracts", (2013), ISBN: 978-83-7814-115-0, 246 - 247. BibTeX

    1348. A. Makarov, V. Sverdlov, S. Selberherr:
    "Transverse Domain Wall Formation in a Free Layer: A Mechanism for Switching Failure in a MTJ-based STT-MRAM";
    Talk: IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), Suzhou, China; 15.07.2013 - 19.07.2013; in "Proceedings of the 20th International Symposium on the Physical & Failure Analysis of Integrated Circuits", (2013), ISBN: 978-1-4799-0478-5, 267 - 270 doi:10.1109/IPFA.2013.6599165. BibTeX

    1347. M. I. Vexler, Yu. Illarionov, S. M. Suturin, V. V. Fedorov, N. S. Sokolov:
    "Tunnel charge transport in Au/CaF2/Si(111) system";
    Talk: XI Russian Conference on Semiconductor Physics, St-Petersburg, Russia; 16.09.2013 - 20.09.2013; in "Abstracts of XI Russian Conference on Semiconductor Physics", (2013), ISBN: 978-5-93634-033-3, 74. BibTeX

    1346. S. E. Tyaginov, D. Osintsev, Yu. Illarionov, J.M. Park, H. Enichlmair, M. I. Vexler, T. Grasser:
    "Tunnelling of strongly non-equilibrium carriers in the transistors of traditional configuration";
    Poster: XI Russian Conference on Semiconductor Physics, St-Petersburg, Russia; 16.09.2013 - 20.09.2013; in "Abstracts of XI Russian Conference on Semiconductor Physics", (2013), ISBN: 978-5-93634-033-3, 441. BibTeX

    1345. J. M. Sellier, M. Nedjalkov, I. Dimov, S. Selberherr:
    "Two-dimensional Transient Wigner Particle Model";
    Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Glasgow, Scotland, United Kingdom; 03.09.2013 - 05.09.2013; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2013), ISBN: 978-1-4673-5733-3, 404 - 407 doi:10.1109/SISPAD.2013.6650660. BibTeX

    1344. W. Gös, M. Toledano-Luque, O. Baumgartner, M. Bina, F. Schanovsky, B. Kaczer, T. Grasser:
    "Understanding Correlated Drain and Gate Current Fluctuations";
    Talk: European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), Arcachon, France; (invited) 30.09.2013 - 04.10.2013; in "20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)", (2013), 51 - 56. BibTeX

    1343. W. Gös, M. Toledano-Luque, O. Baumgartner, M. Bina, F. Schanovsky, B. Kaczer, T. Grasser:
    "Understanding Correlated Drain and Gate Current Fluctuations";
    Talk: IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), Suzhou, China; 15.07.2013 - 19.07.2013; in "Proceedings of the 20th International Symposium on the Physical & Failure Analysis of Integrated Circuits", (2013), ISBN: 978-1-4799-0478-5, 51 - 56. BibTeX

    1342. J. Franco, B. Kaczer, Ph. J. Roussel, J. Mitard, S. Sioncke, L. Witters, H. Mertens, T. Grasser, G. Groeseneken:
    "Understanding the Suppressed Charge Trapping in Relaxed- and Strained Ge/SiO2/HfO2 pMOSFETs and Implications for the Screening of Alternative High-Mobility Substrate/Dielectric CMOS Gate Stacks";
    Talk: IEEE International Electron Devices Meeting (IEDM), Washington, DC, USA; 09.12.2013 - 11.12.2013; in "Proceedings of the IEEE International Electron Devices Meeting (IEDM)", (2013), 397 - 400 doi:10.1109/IEDM.2013.6724634. BibTeX

    1341. D. Osintsev, A. Makarov, V. Sverdlov, S. Selberherr:
    "Using Strain to Increase the Reliability of Scaled Spin MOSFETs";
    Poster: IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), Suzhou, China; 15.07.2013 - 19.07.2013; in "Proceedings of the 20th International Symposium on the Physical & Failure Analysis of Integrated Circuits", (2013), ISBN: 978-1-4799-0478-5, 770 - 773 doi:10.1109/IPFA.2013.6599272. BibTeX

    1340. Z. Stanojevic, O. Baumgartner, K. Schnass, M. Karner, H. Kosina:
    "VSP - a Quantum Simulator for Engineering Applications";
    Talk: International Workshop on Computational Electronics (IWCE), Nara, Japan; 04.06.2013 - 07.06.2013; in "Book of Abstracts of the International Workshop on Computational Electronics (IWCE)", (2013), ISBN: 978-3-901578-26-7, 132 - 133. BibTeX

    1339. K. Rupp, Ph. Tillet, F. Rudolf, J. Weinbub:
    "ViennaCL - Portable High Performance at High Convenience";
    Talk: The European Conference on Numerical Mathematics and Advanced Applications (ENUMATH), Lausanne, Switzerland; (invited) 26.08.2013 - 30.08.2013; in "ENUMATH 2013 Proceedings", (2013), 1 - 2. BibTeX

    1338. K. Rupp:
    "ViennaCL: GPU-accelerated Linear Algebra at the Convenience of the C++ Boost Libraries";
    Talk: SIAM Conference on Computational Science and Engineering, Boston, USA; 25.02.2013 - 01.03.2013; . BibTeX

    1337. F. Rudolf, K. Rupp, S. Selberherr:
    "ViennaMesh - a Highly Flexible Meshing Framework";
    Talk: International Congress on Computational Engineering and Sciences (FEMTEC), Las Vegas, USA; 20.05.2013 - 25.05.2013; in "Abstracts 4th International Congress on Computational Engineering and Sciences", (2013), 1 page(s) . BibTeX

    1336. M. Wagner, K. Rupp, J. Weinbub:
    "A Comparison of Algebraic Multigrid Preconditioners using Graphics Processing Units and Multi-Core Central Processing Units";
    Talk: High Performance Computing Symposium (HPC), Orlando, FL, USA; 26.03.2012 - 29.03.2012; in "Proceedings of the High Performance Computing Symposium (HPC)", (2012), ISBN: 978-1-61839-788-1, 7 page(s) doi:10.5555/2338816.2338818. BibTeX

    1335. J. Weinbub, K. Rupp, S. Selberherr:
    "A Flexible Execution Framework for High-Performance TCAD Applications";
    Poster: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Denver, CO, USA; 05.09.2012 - 07.09.2012; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2012), ISBN: 978-0-615-71756-2, 400 - 403. BibTeX

    1334. J. Weinbub, K. Rupp, S. Selberherr:
    "A Generic Multi-Dimensional Run-Time Data Structure for High-Performance Scientific Computing";
    Talk: World Congress on Engineering (WCE), London, UK; 04.07.2012 - 06.07.2012; in "Proceedings of the World Congress on Engineering (WCE)", (2012), ISBN: 978-988-19252-1-3, 1076 - 1081. BibTeX

    1333. J. Weinbub:
    "A Lightweight Task Graph Scheduler for Distributed High-Performance Scientific Computing";
    Talk: Workshop on the State-of-the-Art in Scientific and Parallel Computing (PARA), Helsinki, Finland; 10.06.2012 - 13.06.2012; in "Proceedings of the International Workshop on the State-of-the-Art in Scientific and Parallel Computing", (2012), 1 page(s) . BibTeX

    1332. V. Palankovski, J. Kuzmik:
    "A Promising New n++-GaN/InAlN/GaN HEMT Concept for High-Frequency Applications";
    Talk: Honolulu PRiME 2012, Honolulu, USA; 07.10.2012 - 12.10.2012; in "ECS Meeting Abstracts", (2012), MA2012-02, 1 page(s) . BibTeX

    1331. H. Mahmoudi, V. Sverdlov, S. Selberherr:
    "A Robust and Efficient MTJ-based Spintronic IMP Gate for New Logic Circuits and Large-Scale Integration";
    Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Denver, CO, USA; 05.09.2012 - 07.09.2012; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2012), ISBN: 978-0-615-71756-2, 225 - 228. BibTeX

    1330. A. Semenov, A. I. Dedyk, P. Y. Belavsky, Yu. V. Pavlova, S. Karmanenko, O. Pakhomov, A. Starkov, I. Starkov:
    "A Study of Ferroelectric Multilayer Structures Based on BST Films Containing High Concentration of Magnetic Ions";
    Poster: Workshop on Dielectrics in Microelectronics (WODIM), Dresden, Germany; 25.06.2012 - 27.06.2012; in "Abstract Booklet", (2012), 77. BibTeX

    1329. H. Nematian, M. Moradinasab, M. Noei, M. Pourfath, M. Fathipour, H. Kosina:
    "A Theoretical Study of BN-Confined Graphene Nanoribbon Based Resonant Tunneling Diodes";
    Poster: International Workshop on Computational Electronics (IWCE), Madison, WI, USA; 22.05.2012 - 25.05.2012; in "Book of Abstracts of the International Workshop on Computational Electronics (IWCE)", (2012), 217 - 218. BibTeX

    1328. B. Schwarz, P. Reininger, O. Baumgartner, Z. Stanojevic, H. Kosina, G. Strasser:
    "A mid-infrared dual wavelenght quantum cascade structure designed for both emission and detection";
    Poster: International Conference on Physics of Semiconductor (ICPS), Zürich, Schweiz; 29.07.2012 - 03.08.2012; . BibTeX

    1327. Z. Stanojevic, O. Baumgartner, H. Kosina:
    "A stable discretization method for "Dirac-like" effective Hamiltonians";
    Poster: International Quantum Cascade Lasers School & Workshop 2012 (IQCLSW 2012), Baden near Vienna, Austria; 02.09.2012 - 06.09.2012; in "Proc. International Quantum Cascade Lasers School & Workshop", (2012), 127. BibTeX

    1326. H. Ceric, R. Orio, W. H. Zisser, S. Selberherr:
    "Ab Initio Method for Electromigration Analysis";
    Talk: IEEE Electronics Packaging Technology Conference (EPTC), Singapore; 02.07.2012 - 06.07.2012; in "Proceedings of the 19th IEEE International Symposium on the Physical & Failure Analysis of Integrated Circuits", (2012), ISBN: 978-1-4673-0982-0, 4 page(s) doi:10.1109/IPFA.2012.6306306. BibTeX

    1325. A. Starkov, O. Pakhomov, I. Starkov:
    "Account for Mutual Influence of Electrical, Elastic and Thermal Phenomena for Ferroelectric Domain Wall Modeling";
    Poster: 11th International Symposium on Ferroic Domains and Micro- to Nanoscopic Structures (ISFD), Ekaterinburg, Russia; 20.08.2012 - 24.08.2012; in "Abstract Book", (2012), 238. BibTeX

    1324. M. Waltl, P.-J. Wagner, H. Reisinger, K. Rott, T. Grasser:
    "Advanced Data Analysis Algorithms for the Time-Dependent Defect Spectroscopy of NBTI";
    Talk: IEEE International Integrated Reliability Workshop, California; 14.10.2012 - 18.10.2012; in "IEEE International Integrated Reliability Workshop Final Report", (2012), 74 - 79. BibTeX

    1323. T. Grasser:
    "Aging in CMOS Devices: From Microscopic Physics to Compact Models";
    Talk: The 2012 Forum on Specification & Design Languages, Vienna, Austria; (invited) 18.09.2012 - 20.09.2012; . BibTeX

    1322. Ph. Tillet, K. Rupp, S. Selberherr:
    "An Automatic OpenCL Compute Kernel Generator for Basic Linear Algebra Operations";
    Talk: High Performance Computing Symposium (HPC), Orlando, FL, USA; 26.03.2012 - 29.03.2012; in "HPC '12 Proceedings of the 2012 Symposium on High Performance Computing", (2012), ISBN: 978-1-61839-788-1, 7 page(s) . BibTeX

    1321. R. Orio, H. Ceric, S. Selberherr:
    "Analysis of Resistance Change Development due to Voiding in Copper Interconnects ended by a Through Silicon Via";
    Talk: International Symposium on Microelectronics Technology and Devices (SBMicro), Brasilia, Brazil; 30.08.2012 - 02.09.2012; in "ECS Transactions", (2012), 1, ISBN: 978-1-56677-990-6, 273 - 280 doi:10.1149/04901.0273ecst. BibTeX

    1320. I. Starkov, H. Enichlmair, S. E. Tyaginov, T. Grasser:
    "Analysis of the Threshold Voltage Turn-Around Effect in High-Voltage n-MOSFETs Due to Hot-Carrier Stress";
    Poster: International Reliability Physics Symposium (IRPS), Californi, USA; 17.04.2012 - 19.04.2012; in "Proceedings of the International Reliability Physics Symposium (IRPS)", (2012), ISBN: 978-1-4577-1680-5, 6 page(s) . BibTeX

    1319. N. Neophytou, H. Karamitaheri, H. Kosina:
    "Atomistic Design of Ultra-Narrow Silicon Nanowires for Improved Electronic and Thermoelectric Applications";
    Talk: International Conference on Nanosciences and Nanotechnologies, Thessaloniki, Greece; 03.07.2012 - 06.07.2012; in "Abstract Book", (2012), 46. BibTeX

    1318. H. Ceric, R. Orio, S. Selberherr:
    "Atomistic Method for Analysis of Electromigration";
    Poster: IEEE International Interconnect Technology Conference (IITC), San Jose, USA; 04.06.2012 - 06.06.2012; in "Proceedings of the IEEE International Interconnect Technology Conference", (2012), ISBN: 978-1-4673-1137-3, 3 page(s) . BibTeX

    1317. N. Neophytou, H. Kosina:
    "Atomistic Simulations of the Electronic Properties of Si and Ge Nanowires and Thin-Layers: Bandstructure Effects";
    Talk: BIT's Annual World Congress of Nanoscience and Nanotechnology, Qingdao, China; (invited) 26.10.2012 - 28.10.2012; in "Abstracts of BIT's 2nd Annual World Congress of Nanoscience and Nanotechnology 2012", (2012), 488. BibTeX

    1316. F. Schanovsky, T. Grasser:
    "Bias Temperature Instabilities in highly-scaled MOSFETs";
    Talk: 2012 CMOS Emerging Technologies, Vancouver, BC Canada; (invited) 18.07.2012 - 21.07.2012; . BibTeX

    1315. K. Rupp, C. Jungemann, M. Bina, A. Jüngel, T. Grasser:
    "Bipolar Spherical Harmonics Expansions of the Boltzmann Transport Equation";
    Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Denver, CO, USA; 05.09.2012 - 07.09.2012; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2012), ISBN: 978-0-615-71756-2, 19 - 22. BibTeX

    1314. H. Karamitaheri, N. Neophytou, H. Kosina:
    "Calculations of Confined Phonon Spectrum in Narrow Si Nanowires using the Valence Force Field Method";
    Poster: The 31st International & 10th European Conference on Thermoelectrics, Aalborg, Denmark; 09.07.2012 - 12.07.2012; in "Book of Abstracts", (2012), 1 page(s) . BibTeX

    1313. M. Molnar, G. Donnarumma, V. Palankovski, J. Kuzmik, D. Donoval, J. Kovac, S. Selberherr:
    "Characterization, Modeling and Simulation of In0.12Al0.88N/GaN HEMTs";
    Talk: Applied Physics of Condensed Matter (APCOM), High Tatras, Slovakia; 20.06.2012 - 22.06.2012; in "Proceedings of the 18th International Conference in the Series of the Solid State Workshops", (2012), 190 - 194. BibTeX

    1312. I. Starkov, H. Enichlmair, S. E. Tyaginov, T. Grasser:
    "Charge-Pumping Extraction Techniques for Hot-Carrier Induced Interface and Oxide Trap Spatial Distributions in MOSFETs";
    Talk: IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), Singapore; 02.07.2012 - 06.07.2012; in "Proceedings of the 19th International Symposium on the Physical & Failure Analysis of Integrated Circuits", (2012), ISBN: 978-1-4673-0980-6, 1 - 6 doi:10.1109/IPFA.2012.6306266. BibTeX

    1311. M. Toledano-Luque, B. Kaczer, E. Simoen, R. Degraeve, J. Franco, Ph. J. Roussel, T. Grasser, G. Groeseneken:
    "Correlation of Single Trapping and Detrapping Effects in Drain and Gate Currents of Nanoscaled nFETs and pFETs";
    Poster: International Reliability Physics Symposium (IRPS), Californi, USA; 17.04.2012 - 19.04.2012; in "Proceedings of the International Reliability Physics Symposium (IRPS)", (2012), ISBN: 978-1-4577-1680-5, 6 page(s) . BibTeX

    1310. V. Palankovski, J. Kuzmik:
    "Degradation Study of Single and Double-Heterojunction InAlN/GaN HEMTs by Two-Dimensional Simulation";
    Talk: Honolulu PRiME 2012, Honolulu, USA; 07.10.2012 - 12.10.2012; in "ECS Meeting Abstracts", (2012), MA2012-02, 1 page(s) . BibTeX

    1309. J. Weinbub:
    "Distributed High-Performance Parallel Mesh Generation with ViennaMesh";
    Talk: Workshop on the State-of-the-Art in Scientific and Parallel Computing (PARA), Helsinki, Finland; 10.06.2012 - 13.06.2012; in "Proceedings of the International Workshop on the State-of-the-Art in Scientific and Parallel Computing", (2012), 1 page(s) . BibTeX

    1308. A. Starkov, I. Starkov:
    "Domain-Wall Motion for Slowly Varying Electric Field";
    Talk: 11th International Symposium on Ferroic Domains and Micro- to Nanoscopic Structures (ISFD), Ekaterinburg, Russia; 20.08.2012 - 24.08.2012; in "Abstract Book", (2012), 93. BibTeX

    1307. B. Schwarz, P. Reininger, O. Baumgartner, Z. Stanojevic, H. Kosina, G. Strasser:
    "Dual wavelength quantum cascade structure that can act both as laser and detector";
    Talk: MIRTHE-IROn-SensorCAT virtual conference 2012, Princeton; 26.06.2012 - 27.06.2012; . BibTeX

    1306. B. Schwarz, P. Reininger, O. Baumgartner, Z. Stanojevic, H. Kosina, G. Strasser:
    "Dual-color quantum cascade structure for coherent emission and detection";
    Poster: International Quantum Cascade Lasers School & Workshop 2012 (IQCLSW 2012), Baden; 02.09.2012 - 06.09.2012; . BibTeX

    1305. M. Moradinasab, H. Nematian, M. Noei, M. Pourfath, M. Fathipour, H. Kosina:
    "Edge Roughness Effects on the Optical Properties of Zigzag Graphene Nanoribbons: A First Principles Study";
    Poster: International Workshop on Computational Electronics (IWCE), Madison, WI, USA; 22.05.2012 - 25.05.2012; in "Book of Abstracts of the International Workshop on Computational Electronics (IWCE)", (2012), 249 - 250. BibTeX

    1304. Z. Stanojevic, H. Kosina:
    "Efficient Numerical Analysis of Dielectric Cavities";
    Talk: European Semiconductor Laser Workshop (ESLW), Brussels, Belgium; 21.09.2012 - 22.09.2012; . BibTeX

    1303. L. Filipovic, S. Selberherr:
    "Electric Field Based Simulations of Local Oxidation Nanolithography using Atomic Force Microscopy in a Level Set Environment";
    Talk: Intl. Symposium on Microelectronics Technology and Devices (SBMicro), Brasilia, Brazil; 30.08.2012 - 02.09.2012; in "ECS Transactions", (2012), 1, ISBN: 978-1-56677-990-6, 265 - 272 doi:10.1149/04901.0265ecst. BibTeX

    1302. D. Osintsev, O. Baumgartner, Z. Stanojevic, V. Sverdlov, S. Selberherr:
    "Electric Field and Strain Effects on Surface Roughness Induced Spin Relaxation in Silicon Field-Effect Transistors";
    Talk: 24th European Modeling and Simulation Symposium (EMSS2012), Vienna, Austria; 19.09.2012 - 21.09.2012; in "Proceedings of the 24th European Modeling and Simulation Symposium", (2012), ISBN: 978-88-97999-01-0, 156 - 162. BibTeX

    1301. D. Osintsev, O. Baumgartner, Z. Stanojevic, V. Sverdlov, S. Selberherr:
    "Electric Field and Strain Effects on Surface Roughness Induced Spin Relaxation in Silicon Field-Effect Transistors";
    Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Denver, CO, USA; 05.09.2012 - 07.09.2012; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2012), ISBN: 978-0-615-71756-2, 153 - 156. BibTeX

    1300. R. Orio, H. Ceric, S. Selberherr:
    "Electromigration Failure in a Copper Dual-Damascene Structure with a Through Silicon Via";
    Poster: 23rd European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis, Cagliari, Italy; 01.10.2012 - 05.10.2012; in "Proceedings of the 23rd European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis", (2012), 1981 - 1986. BibTeX

    1299. M. Molnar, G. Donnarumma, V. Palankovski, J. Kuzmik, D. Donoval, J. Kovac, S. Selberherr:
    "Electrothermal Analysis of In0.12Al0.88N/GaN HEMTs";
    Talk: International Conference on Advanced Semiconductor Devices and Microsystems (ASDAM), Smolenice, Slovakia; 11.11.2012 - 15.11.2012; in "Proceedings of the 9th International ASDAM", (2012), ISBN: 978-1-4673-1195-3, 55 - 58 doi:10.1109/ASDAM.2012.6418556. BibTeX

    1298. A. Makarov, S. Selberherr, V. Sverdlov:
    "Emerging Non-Volatile Memories for Ultra-Low Power Applications";
    Talk: Informationstagung Mikroelektronik (ME), Vienna, Austria; (invited) 23.04.2012 - 24.04.2012; in "Tagungsband zur Informationstagung Mikroelektronik 12", (2012), ISBN: 978-3-85133-071-7, 21 - 24. BibTeX

    1297. H. Karamitaheri, N. Neophytou, M. Pourfath, H. Kosina:
    "Engineering the Thermoelectric Power Factor of Metallic Graphene Nanoribbons";
    Talk: International Workshop on Computational Electronics (IWCE), Madison, WI, USA; 22.05.2012 - 25.05.2012; in "Book of Abstracts of the International Workshop on Computational Electronics (IWCE)", (2012), 77 - 78. BibTeX

    1296. N. Neophytou, H. Karamitaheri, H. Kosina:
    "Engineering the Thermoelectric Power Factor of Si and Ge Ultra Narrow 1D Nanowires and 2D Thin Layers Using Atomistic Modeling";
    Talk: The 31st International & 10th European Conference on Thermoelectrics, Aalborg, Denmark; 09.07.2012 - 12.07.2012; in "Book of Abstracts", (2012), 1 page(s) . BibTeX

    1295. T. Aichinger, P. Lenahan, T. Grasser, G. Pobegen, M. Nelhiebel:
    "Evidence for Pb Center-Hydrogen Complexes after Subjecting PMOS Devices to NBTI Stress - a Combined DCIV/SDR Study";
    Poster: International Reliability Physics Symposium (IRPS), Californi, USA; 17.04.2012 - 19.04.2012; in "Proceedings of the International Reliability Physics Symposium (IRPS)", (2012), ISBN: 978-1-4577-1680-5, 6 page(s) . BibTeX

    1294. V. Sverdlov, A. Makarov, S. Selberherr:
    "Fast Switching in MTJs with a Composite Free Layer";
    Talk: BIT's Annual World Congress of Nanoscience and Nanotechnology, Qingdao, China; 26.10.2012 - 28.10.2012; in "Abstracts of BIT's 2nd Annual World Congress of Nanoscience and Nanotechnology 2012", (2012), 291. BibTeX

    1293. R. Orio, S. Selberherr:
    "Formation and Movement of Voids in Copper Interconnect Structures";
    Talk: International Conference on Solid State and Integrated Circuit Technology (ICSICT), Xi'an, China; (invited) 29.10.2012 - 01.11.2012; in "Proceedings of the International Conference on Solid-State and Integrated Circuit Technology (ICSICT)", (2012), ISBN: 978-1-4673-2475-5, 378 - 381 doi:10.1109/ICSICT.2012.6467675. BibTeX

    1292. T. Windbacher, D. Osintsev, A. Makarov, V. Sverdlov, S. Selberherr:
    "Fully Electrically Read- Write Magneto Logic Gates";
    Talk: The 5th International Conference on Micro-Nanoelectronics, Nanotechnologies & MEMS, Crete, Greece; 07.10.2012 - 10.10.2012; in "Book of Abstracts", (2012), 1 page(s) . BibTeX

    1291. M. Jurkovic, D. Gregusova, S. Hascik, M. Blaho, M. Molnar, V. Palankovski, D. Donoval, J. Carlin, N. Grandjean, J. Kuzmik:
    "GaN/InAlN/AlN/GaN Normally-Off HEMT with Etched Access Region";
    Talk: Workshop on Compound Semiconductor Devices and Integrated Circuits (WOCSDICE), Porquerolles, France; 30.05.2012 - 01.06.2012; in "Proceedings of the 36th Workshop on Compound Semiconductor Devices and Integrated Circuits", (2012), 2 page(s) . BibTeX

    1290. N. Neophytou, H. Kosina:
    "Gate Field Induced Bandstructure and Mobility Variations in p-type Silicon Nanowires";
    Talk: Workshop of the Thematic Network on Silicon on Insulator Technology, Devices, and Circuits (EUROSOI), Montpellier, France; 23.01.2012 - 25.01.2012; in "Conference Proceedings of the VIII Workshop of the Thematic Network on Silicon-On-Insulator Technology, Devices and Circuits", (2012), 131 - 132. BibTeX

    1289. A. Makarov, V. Sverdlov, S. Selberherr:
    "Geometry Dependence of the Switching Time in MTJs with a Composite Free Layer";
    Talk: Workshop on Innovative Nanoscale Devices and Systems (WINDS), Kona; (invited) 02.12.2012 - 07.12.2012; in "Abstracts of the Workshop on Innovative Nanoscale Devices and Systems (WINDS)", (2012), ISBN: 978-3-901578-25-0, 21. BibTeX

    1288. S. Selberherr:
    "Giving Silicon a Spin";
    Talk: International Conference on Enabling Science and Nanotechnology, Johor Bahru, Malaysia; (invited) 05.01.2012 - 07.01.2012; in "Abstracts International Conference on Enabling Science and Nanotechnology (ESciNano 2012)", (2012), 1 page(s) . BibTeX

    1287. A. Makarov, V. Sverdlov, S. Selberherr:
    "High Thermal Stability and Low Switching Energy Barrier in Spin-transfer Torque RAM with Composite Free Layer";
    Poster: International Conference on Solid State Devices and Materials, Kyoto, Japan; 25.09.2012 - 27.09.2012; in "Extended Abstracts of 2012 International Conference on Solid State Devices and Materials", (2012), 2 page(s) . BibTeX

    1286. K. Rupp, J. Weinbub, F. Rudolf:
    "Highly Productive Application Development with ViennaCL for Accelerators";
    Poster: AGU Fall Meeting, San Francisco, USA; (invited) 03.12.2012 - 07.12.2012; . BibTeX

    1285. H. Karamitaheri, M. Pourfath, H. Kosina:
    "Highly Sensitive Graphene Antidot Lattice Chemiresitor Sensor";
    Poster: Graphene Week, Delft, Netherlands; 04.06.2012 - 08.06.2012; in "Book of Abstracts", (2012), 1 page(s) . BibTeX

    1284. K. Rott, D. Schmitt-Landsiedel, H. Reisinger, G.A. Rott, G. Georgakos, C. Schluender, S. Aresu, W. Gustin, T. Grasser:
    "Impact and measurement of short term threshold instabilities in MOSFETs of analog circuits";
    Talk: IEEE International Integrated Reliability Workshop, California; 14.10.2012 - 18.10.2012; in "IEEE International Integrated Reliability Workshop Final Report", (2012), 31 - 34. BibTeX

    1283. S. E. Tyaginov, I. Starkov, O. Triebl, M. Karner, C. Kernstock, C. Jungemann, H. Enichlmair, J.M. Park, T. Grasser:
    "Impact of Gate Oxide Thickness Variations on Hot-Carrier Degradation";
    Poster: IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), Singapore; 02.07.2012 - 06.07.2012; in "Proceedings of the 19th International Symposium on the Physical & Failure Analysis of Integrated Circuits", (2012), ISBN: 978-1-4673-0980-6, 1 - 5 doi:10.1109/IPFA.2012.6306265. BibTeX

    1282. J. Franco, B. Kaczer, M. Toledano-Luque, Ph. J. Roussel, J. Mitard, L. Ragnarsson, L. Witters, T. Chiarella, M. Togo, N. Horiguchi, G. Groeseneken, M. F. Bukhori, T. Grasser, A. Asenov:
    "Impact of Single Charged Gate Oxide Defects on the Performance and Scaling of Nanoscaled FETs";
    Talk: International Reliability Physics Symposium (IRPS), Californi, USA; 17.04.2012 - 19.04.2012; in "Proceedings of the International Reliability Physics Symposium (IRPS)", (2012), ISBN: 978-1-4577-1680-5, 6 page(s) . BibTeX

    1281. K. Rupp, P. Lagger, T. Grasser:
    "Inclusion of Carrier-Carrier-Scattering Into Arbitrary-Order Spherical Harmonics Expansions of the Boltzmann Transport Equation";
    Talk: International Workshop on Computational Electronics (IWCE), Madison, WI, USA; 22.05.2012 - 25.05.2012; in "Book of Abstracts of the International Workshop on Computational Electronics (IWCE)", (2012), 109 - 110. BibTeX

    1280. G. Donnarumma, V. Palankovski, S. Selberherr:
    "Influence of Bandgap Narrowing and Carrier Lifetimes on the Forward Current-Voltage Characteristics of a 4H-SiC p-i-n Diode";
    Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Denver, CO, USA; 05.09.2012 - 07.09.2012; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2012), ISBN: 978-0-615-71756-2, 125 - 128. BibTeX

    1279. H. Mahmoudi, V. Sverdlov, S. Selberherr:
    "Influence of Geometry on Memristive Behavior of the Domain Wall Spintronic Memristors and its Applications for Measurements";
    Poster: International Conference on Superconductivity and Magnetism, Istanbul, Turkey; 29.04.2012 - 04.05.2012; in "Proceedings of International Conference on Superconductivity and Magnetism (ICSM 2012)", (2012), 1 page(s) . BibTeX

    1278. A. Axelevitch, V. Palankovski, S. Selberherr, G. Golan:
    "Large Silicon Solar Cells of a Lateral Type";
    Poster: 2nd International Conference on Crystalline Silicon Photovoltaics (Silicon PV 2012), Leuven, Belgium; 03.04.2012 - 05.04.2012; . BibTeX

    1277. I. Starkov, H. Enichlmair, T. Grasser:
    "Local Oxide Capacitance as a Crucial Parameter for Characterization of Hot-Carrier Degradation in High-Voltage n-MOSFET";
    Talk: Workshop on Dielectrics in Microelectronics (WODIM), Dresden, Germany; 25.06.2012 - 27.06.2012; in "Abstract Booklet", (2012), 40. BibTeX

    1276. H. Kosina, N. Neophytou:
    "Low Dimensional Nanostructures as Efficient Thermoelectric Materials for Energy Conversion and Generation";
    Talk: BIT's Annual World Congress of Nanoscience and Nanotechnology, Qingdao, China; (invited) 26.10.2012 - 28.10.2012; in "Abstracts of BIT's 2nd Annual World Congress of Nanoscience and Nanotechnology 2012", (2012), 419. BibTeX

    1275. N. Neophytou:
    "Low Dimensional Si Nanostructures for Efficient Thermoelectric Energy Conversion and Generation";
    Talk: Workshop on Nanostructured Materials & Devices (NANOMED), Nicosia, Cyprus; (invited) 17.10.2012. BibTeX

    1274. V. Sverdlov, S. Selberherr:
    "MOSFET and Spin Transistor Simulations";
    Talk: 2012 CMOS Emerging Technologies, Vancouver, BC Canada; (invited) 18.07.2012 - 21.07.2012; in "Abstract of 2012 CMOS Emerging Technologies", (2012), 1 page(s) . BibTeX

    1273. H. Mahmoudi, V. Sverdlov, S. Selberherr:
    "MTJ-based Implication Logic Gates and Circuit Architecture for Large-Scale Spintronic Stateful Logic Systems";
    Talk: European Solid-State Device Research Conference (ESSDERC), Bordeaux, France; 17.09.2012 - 21.09.2012; in "Proceedings of the European Solid-State Device Research Conference (ESSDERC)", (2012), ISBN: 978-1-4673-3086-2, 254 - 257 doi:10.1109/ESSDERC.2012.6343381. BibTeX

    1272. A. Makarov, V. Sverdlov, S. Selberherr:
    "Micromagnetic Simulations of an MTJ with a Composite Free Layer for High-Speed Spin Transfer Torque RAM";
    Poster: International Workshop on Computational Electronics (IWCE), Madison, WI, USA; 22.05.2012 - 25.05.2012; in "Book of Abstracts of the International Workshop on Computational Electronics (IWCE)", (2012), 225 - 226. BibTeX

    1271. A. Makarov, V. Sverdlov, S. Selberherr:
    "Modeling Emerging Non-Volatile Memories: Current Trends and Challenges";
    Talk: International Conference on Solid State Devices and Materials Science (SSDMS), Macao, China; 01.04.2012 - 02.04.2012; in "Physics Procedia", (2012), 99 - 104 doi:10.1016/j.phpro.2012.03.056. BibTeX

    1270. D. Osintsev, V. Sverdlov, S. Selberherr:
    "Modeling Spintronic Effects in Silicon";
    Talk: International Workshop on Mathematics for Semiconductor Heterostructures (MSH), Berlin, Germany; (invited) 24.09.2012 - 28.09.2012; in "Abstracts International Workshop on Mathematics for Semiconductor Heterostructures (MSH)", (2012), 3 page(s) . BibTeX

    1269. R. Orio, H. Ceric, S. Selberherr:
    "Modeling of Electromigration Induced Resistance Change in Three-Dimensional Interconnects with Through Silicon Vias";
    Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Denver, CO, USA; 05.09.2012 - 07.09.2012; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2012), ISBN: 978-0-615-71756-2, 268 - 271. BibTeX

    1268. M. Bina, K. Rupp, S. E. Tyaginov, O. Triebl, T. Grasser:
    "Modeling of Hot Carrier Degradation Using a Spherical Harmonics Expansion of the Bipolar Boltzmann Transport Equation";
    Talk: IEEE International Electron Devices Meeting (IEDM), San Francisco, CA, USA; 10.12.2012 - 12.12.2012; in "Proceedings of the IEEE International Electron Devices Meeting (IEDM)", (2012), 713 - 716 doi:10.1109/IEDM.2012.6479138. BibTeX

    1267. S. E. Tyaginov, T. Grasser:
    "Modeling of Hot-Carrier Degradation: Physics and Controversial Issues";
    Talk: IEEE International Integrated Reliability Workshop, California; 14.10.2012 - 18.10.2012; in "IEEE International Integrated Reliability Workshop Final Report", (2012), 206 - 215. BibTeX

    1266. H. Ceric, R. Orio, W. H. Zisser, V. Schnitzer, S. Selberherr:
    "Modeling of Microstructural Effects on Electromigration Failure";
    Talk: International Workshop on Stress-Induced Phenomena in Microelectronics, Kyoto, Japan; (invited) 28.05.2012 - 30.05.2012; in "Abstracts of 12th International Workshop on Stress-Induced Phenomena in Microelectronics", (2012), 50 - 51. BibTeX

    1265. T. Grasser, B. Kaczer, H. Reisinger, P.-J. Wagner, M. Toledano-Luque:
    "Modeling of the bias temperature instability under dynamic stress and recovery conditions";
    Talk: International Conference on Solid State and Integrated Circuit Technology (ICSICT), Xi'an, China; (invited) 29.10.2012 - 01.11.2012; in "11th International Conference on Solid-State and Integrated Circuit Technology (ICSICT)", (2012), ISBN: 978-1-4673-2474-8, 1 - 4 doi:10.1109/ICSICT.2012.6466737. BibTeX

    1264. X. Zianni, N. Neophytou, M. Ferri, A. Roncaglia, D. Narducci:
    "Nanograin Effects on the Thermoelectric Properties of Poly-Si Nanowiress";
    Talk: The 31st International & 10th European Conference on Thermoelectrics, Aalborg, Denmark; 09.07.2012 - 12.07.2012; in "Book of Abstracts", (2012), 1 page(s) . BibTeX

    1263. A. Makarov, V. Sverdlov, S. Selberherr:
    "New Trends in Microelectronics: Towards an Ultimate Memory Concept";
    Talk: International Caracas Conference on Devices, Circuits and Systems (ICCDCS), Playa del Carmen, Mexico; (invited) 14.03.2012 - 17.03.2012; in "Proceedings of the 8th International Caribbean Conference on Devices, Circuits and Systems", (2012), ISBN:978-1-4566-1117-6, 2 page(s) doi:10.1109/ICCDCS.2012.6188887. BibTeX

    1262. I. Serrano-Lopez, A. Garcia-Barrientos, V. Palankovski, L. del Carmen Cruz-Netro:
    "Non-Stationary Effects of Space Charge in InN Films";
    Talk: International Materials Research Congress, Cancun, Mexico; 12.08.2012 - 17.08.2012; in "XXI International Materials Research Congress", (2012), 1 page(s) . BibTeX

    1261. H. Mahmoudi, V. Sverdlov, S. Selberherr:
    "Novel Memristive Charge- and Flux-Based Sensors";
    Talk: The 8th Conference on Ph.D. Research in Microelectronics & Electronics- PRIME 2012, Aachen, Germany; 12.06.2012 - 15.06.2012; in "Proceedings of the 8th Conference on Ph.D. Research in Microelectronics & Electronics", (2012), ISBN: 978-3-8007-3442-9, 4 page(s) . BibTeX

    1260. P.-J. Wagner, B. Kaczer, A. Scholten, H. Reisinger, S. Bychikhin, D. Pogany, L.K.J. Vandamme, T. Grasser:
    "On the Correlation Between NBTI, SILC, and Flicker Noise";
    Talk: IEEE International Integrated Reliability Workshop, California; 14.10.2012 - 18.10.2012; in "IEEE International Integrated Reliability Workshop Final Report", (2012), 60 - 64. BibTeX

    1259. T. Grasser, B. Kaczer, H. Reisinger, P.-J. Wagner, M. Toledano-Luque:
    "On the Frequency Dependence of the Bias Temperature Instability";
    Poster: International Reliability Physics Symposium (IRPS), Californi, USA; 17.04.2012 - 19.04.2012; in "Proceedings of the International Reliability Physics Symposium (IRPS)", (2012), ISBN: 978-1-4577-1680-5, 6 page(s) . BibTeX

    1258. F. Schanovsky, T. Grasser:
    "On the Microscopic Limit of the Modified Reaction-Diffusion Model for the Negative Bias Temperature Instability";
    Poster: International Reliability Physics Symposium (IRPS), Californi, USA; 17.04.2012 - 19.04.2012; in "Proceedings of the International Reliability Physics Symposium (IRPS)", (2012), ISBN: 978-1-4577-1680-5, 6 page(s) . BibTeX

    1257. T. Grasser, H. Reisinger, K. Rott, M. Toledano-Luque, B. Kaczer:
    "On the Microscopic Origin of the Frequency Dependence of Hole Trapping in pMOSFETs";
    Talk: IEEE International Electron Devices Meeting (IEDM), San Francisco, CA, USA; 10.12.2012 - 12.12.2012; in "Proceedings of the IEEE International Electron Devices Meeting (IEDM)", (2012), 470 - 473 doi:10.1109/IEDM.2012.6479076. BibTeX

    1256. M. Moradinasab, H. Karamitaheri, M. Pourfath, H. Kosina:
    "On the Role of Stone-Wales Defects on the Performance of Graphene Nanoribbon Photo Detectors";
    Poster: Graphene Week, Delft, Netherlands; 04.06.2012 - 08.06.2012; in "Book of Abstracts", (2012), 1 page(s) . BibTeX

    1255. B. Schwarz, P. Reininger, O. Baumgartner, Z. Stanojevic, H. Kosina, G. Strasser:
    "Optimization of intersubband devices for dual-color emission, absorption and detection";
    Talk: ÖPG-Jahrestagung, Graz; 18.09.2012 - 21.09.2012; . BibTeX

    1254. P. Schwaha, M. Nedjalkov, S. Selberherr, I. Dimov:
    "Particle-Grid Techniques for Semiclassical and Quantum Transport Simulations";
    Poster: International Workshop on Computational Electronics (IWCE), Madison, WI, USA; 22.05.2012 - 25.05.2012; in "Book of Abstracts of the International Workshop on Computational Electronics (IWCE)", (2012), 177 - 178. BibTeX

    1253. M. Nedjalkov, P. Schwaha, S. Selberherr, D.K. Ferry:
    "Phonon Decoherence in Wigner-Boltzmann Transport";
    Poster: International Winterschool on New Developments in Solid State Physics, Mauterndorf, Austria; 12.02.2012 - 17.02.2012; in "Proceedings of International Winterschool on New Developments in Solid State Physics", (2012), 61 - 62. BibTeX

    1252. V. Palankovski:
    "Photovoltaic and Thermoelectric Devices for Renewable Energy Harnessing";
    Talk: Electronica, Sofia, Bulgaria; (invited) 14.06.2012 - 15.06.2012; . BibTeX

    1251. M. Jurkovic, D. Gregusova, S. Hascik, M. Blaho, K. Cico, V. Palankovski, J. Carlin, N. Grandjean, J. Kuzmik:
    "Polarization Engineered Normally-Off GaN/InlN/AlN/GaN HEMT";
    Talk: International Workshop on Nitride Semiconductors 2012 (INW), Sapporo, Japan; 14.10.2012 - 19.10.2012; in "International Workshop on Nitride Semiconductors", (2012), 2 page(s) . BibTeX

    1250. A. Starkov, I. Baranov, O. Pakhomov, I. Starkov, A. Zaitsev:
    "Principles of Solid-State Cooler on Layered Multiferroics";
    Poster: 5th IIR/IIF International Conference on Magnetic Refrigeration at Room Temperature (THERMAG V), Grenoble, France; 17.09.2012 - 20.09.2012; in "Conference guide & book of abstracts", (2012), 1 page(s) . BibTeX

    1249. A. Makarov, V. Sverdlov, S. Selberherr:
    "Recent Developments in Advanced Memory Modeling";
    Talk: International Conference on Microelectronics (MIEL), Nis, Serbia; (invited) 13.05.2012 - 16.05.2012; in "Proceedings of the International Conference on Microelectronics (MIEL)", (2012), ISBN: 978-1-4673-0235-7, 49 - 52 doi:10.1109/MIEL.2012.6222795. BibTeX

    1248. S. Selberherr:
    "Recent Developments in Advanced Memory Modeling";
    Talk: IEEE EDS Mini-Colloquium Distinguished Lecture, University of Nis, Nis, Serbia; (invited) 13.05.2012. BibTeX

    1247. T. Grasser:
    "Recent Developments in Understanding the Bias Temperature Instability";
    Talk: International Conference on Microelectronics (MIEL), Nis, Serbia; (invited) 13.05.2012 - 16.05.2012; in "Proceedings of the International Conference on Microelectronics (MIEL)", (2012), ISBN: 978-1-4673-0238-8, 315 - 322 doi:10.1109/MIEL.2012.6222864. BibTeX

    1246. G. Pobegen, M. Nelhiebel, T. Grasser:
    "Recent Results Concerning the Influence of Hydrogen on the Bias Temperature Instability";
    Talk: IEEE International Integrated Reliability Workshop, California; 14.10.2012 - 18.10.2012; in "2012 IEEE International Integrated Reliability Workshop Final Report", (2012), 54 - 59. BibTeX

    1245. K. Rupp, T. Grasser, A. Jüngel:
    "Recent advances in the spherical harmonics expansion of the Boltzmann transport equation";
    Talk: Congresso Nationale Simai 2012, Turin, Italy; 25.06.2012 - 28.06.2012; in "Abstracts of Congresso Nationale Simai 2012", (2012), 183. BibTeX

    1244. D. Osintsev, O. Baumgartner, Z. Stanojevic, V. Sverdlov, S. Selberherr:
    "Reduction of Surface Roughness Induced Spin Relaxation in MOSFETs by Strain";
    Poster: International Workshop on Computational Electronics (IWCE), Madison, WI, USA; 22.05.2012 - 25.05.2012; in "Book of Abstracts of the International Workshop on Computational Electronics (IWCE)", (2012), 229 - 230. BibTeX

    1243. A. Makarov, V. Sverdlov, S. Selberherr:
    "Reduction of the Switching Current in Spin Transfer Torque Random Access Memory";
    Poster: Advanced Research Workshop on Future Trends in Microelectronics: Into the Cross Currents, Corsica, France; 25.06.2012 - 29.06.2012; in "Abstracts Advanced Research Workshop on Future Trends in Microelectronics: Into the Cross Currents", (2012), 49. BibTeX

    1242. J. Franco, B. Kaczer, J. Mitard, M. Toledano-Luque, G. Eneman, Ph. J. Roussel, M. Cho, T. Kauerauf, T. Grasser, L. Witters, G. Hellings, L. Ragnarsson, N. Horiguchi, M. Heyns, G. Groeseneken:
    "Reliability of SiGe Channel MOS";
    Talk: Honolulu PRiME 2012, Honolulu, USA; 07.10.2012 - 12.10.2012; in "ECS Meeting Abstracts", (2012), MA2012-02, 1 page(s) . BibTeX

    1241. M. Nedjalkov, P. Schwaha, S. Selberherr, D.K. Ferry, D. Vasileska, P. Dollfus, D. Querlioz:
    "Role of the Physical Scales on the Transport Regime";
    Talk: International Workshop on Computational Electronics (IWCE), Madison, WI, USA; 22.05.2012 - 25.05.2012; in "Book of Abstracts of the International Workshop on Computational Electronics (IWCE)", (2012), 47 - 48. BibTeX

    1240. A. Makarov, V. Sverdlov, S. Selberherr:
    "STT-RAM with a Composite Free Layer: High Thermal Stability, Low Switching Barrier, and Sharp Switching Time Distribution";
    Talk: Worldwide Universities Network 4th International Conference on Spintronics (WUN-SPIN 2012), Sydney, Australia; 23.07.2012 - 25.07.2012; in "Abstract of Worldwide Universities Network 4th International Conference on Spintronics (WUN-SPIN 2012)", (2012), H4. BibTeX

    1239. P. Reininger, B. Schwarz, O. Baumgartner, Z. Stanojevic, H. Kosina, G. Strasser:
    "Simulation of Dual Wavelength Photonic Crystal Quantum Cascade Laser";
    Poster: International Conference on Physics of Semiconductor (ICPS), Zürich, Schweiz; 29.07.2012 - 03.08.2012; . BibTeX

    1238. M. Bina, O. Triebl, B. Schwarz, M. Karner, B. Kaczer, T. Grasser:
    "Simulation of Reliability on Nanoscale Devices";
    Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Denver, CO, USA; 05.09.2012 - 07.09.2012; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2012), ISBN: 978-0-615-71756-2, 109 - 112. BibTeX

    1237. L. Filipovic, S. Selberherr:
    "Simulation of Silicon Nanopatterning Using nc-AFM";
    Poster: International Conference on non-contact Atomic Force Microscopy, Cesky Krumlov; 01.07.2012 - 05.07.2012; in "Abstracts 15th International Conference on non-contact Atomic Force Microscopy (nc-AFM)", (2012), 108. BibTeX

    1236. P. Reininger, B. Schwarz, S. Kalchmair, R. Gansch, O. Baumgartner, Z. Stanojevic, H. Kosina, W. Schrenk, G. Strasser:
    "Simulation of a dual wavelength quantum cascade laser in a photonic crystal cavity";
    Poster: International Quantum Cascade Lasers School & Workshop 2012 (IQCLSW 2012), Baden; 02.09.2012 - 06.09.2012; . BibTeX

    1235. L. Filipovic, S. Selberherr:
    "Simulations of Local Oxidation Nanolithography by AFM Based on the Generated Electric Field";
    Talk: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Denver, CO, USA; 05.09.2012 - 07.09.2012; in "Proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)", (2012), ISBN: 978-0-615-71756-2, 189 - 192. BibTeX

    1234. T. Windbacher, A. Makarov, V. Sverdlov, S. Selberherr:
    "Simulations of an Electrical Read-Write Operation of a Magnetic XOR Gate";
    Talk: Worldwide Universities Network 4th International Conference on Spintronics (WUN-SPIN 2012), Sydney, Australia; 23.07.2012 - 25.07.2012; in "Abstract of Worldwide Universities Network 4th International Conference on Spintronics (WUN-SPIN 2012)", (2012), J3. BibTeX

    1233. M. Lukash, K. Rupp, S. Selberherr:
    "Sparse Approximate Inverse Preconditioners for Iterative Solvers on GPUs";
    Talk: High Performance Computing Symposium (HPC), Orlando, FL, USA; 26.03.2012 - 29.03.2012; in "HPC '12 Proceedings of the 2012 Symposium on High Performance Computing", (2012), ISBN: 978-1-61839-788-1, 7 page(s) . BibTeX